CN109444794B - Transient state checking method and system - Google Patents
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- CN109444794B CN109444794B CN201811426106.2A CN201811426106A CN109444794B CN 109444794 B CN109444794 B CN 109444794B CN 201811426106 A CN201811426106 A CN 201811426106A CN 109444794 B CN109444794 B CN 109444794B
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- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses a transient verification method and a transient verification system, wherein the method comprises the following steps: generating first standard transient waveform data and second standard transient waveform data according to preset transient parameters; converting the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through AD conversion; sampling and converting the second standard analog transient waveform according to a preset frequency to generate a standard digital transient waveform of an FT3 protocol; inputting the first standard analog transient waveform, the second standard analog transient waveform and the standard digital transient waveform into a transient calibrator of the direct current transformer to be tested; and judging the verification evaluation result of the transient state calibrator of the direct current transformer to be tested according to the transient state parameters, output by the transient state calibrator of the direct current transformer to be tested, of the corresponding three sets of transient state waveforms.
Description
Technical Field
The invention relates to the field of mutual inductor verification, in particular to a transient verification method and a transient verification system.
Background
The direct current transformer is used as important primary equipment for construction and operation of a direct current power transmission system, accurate and reliable measurement information is provided for control protection and stable operation of the system, and the operation reliability and the measurement accuracy of the direct current transformer are directly related to safe and stable operation of the direct current power transmission system. The direct current transmission system has the requirements of higher sampling speed, wider frequency bandwidth and the like on control protection signals, and particularly in a flexible direct current transmission system and a flexible direct current transmission system, in order to improve the response speed of the flexible direct current system, inhibit fault current and improve the safety and stability of a power system, higher requirements are provided for the transient characteristics of a direct current transformer, and clear test requirements are provided for the transient characteristics of the direct current transformer by related national standards;
in recent years, the application of the direct current transformer is more and more extensive, the requirement of field test is more and more obvious, the direct current transformer calibrator is also applied in a large quantity as important equipment for calibration and test of the direct current transformer, the direct current transformer transient calibrator with the direct current transformer transient characteristic calibration function is also successively released, the direct current transformer transient characteristic calibrator technology is still in a primary stage, the product quality and function difference on the market are large, the test of all performance indexes related to transient state on the national standard cannot be met, most of the direct current transformer calibrator is software upgrading on the basis of the conventional direct current transformer calibrator, and the transient state calibration function is compatible. The direct current transformer transient state calibrator and the alternating current transformer calibrator are greatly different in the aspects of implementation principles and magnitude tracing methods. At present, no related detection device and test method are available for evaluating the performance of the transient state calibrator of the direct current transformer. The transient state check meter of the direct current transformer developed by some manufacturers can carry out detection service of the transient state characteristic of the direct current transformer without a calibration detection test, and measured transient state characteristic data are not subjected to complete magnitude traceability, so that threats and hidden dangers are brought to safe and stable operation of a direct current transmission system.
Disclosure of Invention
In order to solve the problems of incomplete calibration and no complete magnitude tracing of a transient calibrator of the direct current transformer in the background art, the invention provides a transient calibration method and a transient calibration system, wherein the method and the system generate a plurality of groups of transient waveforms according to preset transient parameters, respectively input the waveforms into the transient calibrator of the direct current transformer to be tested, and judge the calibration effect according to the output result of the calibrator; the method for transient verification comprises the following steps:
generating first standard transient waveform data and second standard transient waveform data according to preset transient parameters;
converting the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through AD conversion;
sampling and converting the second standard analog transient waveform according to a preset frequency to generate a standard digital transient waveform of an FT3 protocol;
inputting the first standard analog transient waveform, the second standard analog transient waveform and the standard digital transient waveform into a transient calibrator of the direct current transformer to be tested;
and judging the verification evaluation result of the transient state calibrator of the direct current transformer to be tested according to the transient state parameters, output by the transient state calibrator of the direct current transformer to be tested, of the corresponding three sets of transient state waveforms.
Further, the first standard analog transient waveform, the second standard analog transient waveform and the standard digital transient waveform are input to a transient calibrator of the dc transformer to be tested, which includes:
inputting the first standard simulation transient waveform to a standard analog quantity input end of the transient calibrator of the direct current transformer to be tested;
inputting the second standard simulation transient waveform to a measured analog quantity input end of the transient calibrator of the direct current transformer to be measured;
and inputting the standard digital transient waveform to a measured digital quantity input end of the transient calibrator for the direct current transformer to be tested.
Further, the transient parameters include a transient step response time, a transient step rise or fall time, a settling time, and an overshoot.
Further, the first standard transient waveform data and the second standard transient waveform data are set separately according to the transient parameters; generating standard transient waveform data according to preset transient parameters, comprising:
generating an ideal step waveform digital sequence from 0 to 1 with the starting time, the stability approaching time and the overshoot all being 0;
generating a transfer function according to the transient parameters;
converting the parameters of the transfer function into two groups of coefficient sequences of a forward coefficient and a reverse coefficient by a bilinear variation method;
and performing convolution operation on the two groups of coefficient sequences and the ideal step waveform digital sequence to obtain standard transient waveform data corresponding to the transient parameters.
Further, before the first standard transient waveform data and the second standard transient waveform data are converted, the first standard transient waveform data and the second standard transient waveform data are transmitted in an excel file form and in a GPIB bus manner.
Further, the first standard analog transient waveform and the second standard analog transient waveform are output through two sets of analog waveform output channels which are independent and isolated from each other.
Further, the synchronism of the second standard analog transient waveform and the standard digital transient waveform is ensured by setting a synchronous clock; the delay time of the synchronicity is less than 1 mus and the uncertainty of the conversion delay is less than 0.01 mus.
Further, the initial standard digital transient waveform is converted into a standard digital transient waveform of the FT3 protocol by FPGA technology with a certain delay.
The system for transient verification, the system comprising:
the transient data generation module is used for generating first standard transient waveform data and second standard transient waveform data by preset transient parameters;
a signal conversion module for converting the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through AD conversion; a first output end of the signal conversion module, which outputs the first standard simulation transient waveform, is connected with a standard analog quantity input end of the transient calibrator for the direct current transformer to be tested; a second output end of the signal conversion module, which outputs a second standard analog transient waveform, is connected with a measured analog quantity input end of the transient calibrator for the direct current transformer to be measured;
the standard digital source module comprises an AD sampling unit and an encoding unit; the AD sampling unit is used for sampling the second standard analog transient waveform according to a preset frequency to obtain an initial standard digital transient waveform; the encoding unit is used for converting the initial standard digital transient waveform into a standard digital transient waveform of an FT3 protocol according to a preset rule; and the output end of the coding unit is connected with the input end of the measured digital quantity of the transient state calibrator of the direct current transformer to be tested.
Further, the transient parameters include a transient step response time, a transient step rise or fall time, a settling time, and an overshoot.
Further, the manner in which the transient data generation module sends the first standard transient waveform data and the second standard transient waveform data to the signal conversion module includes: the transmission is carried out in an excel file form and a GPIB bus mode; the first standard transient waveform data and the second standard transient waveform data may be individually set according to a transient parameter.
Furthermore, the signal conversion module comprises two groups of analog waveform output channels which are independent and isolated from each other.
Furthermore, the standard digital source module also comprises an acquisition control unit and a synchronous clock unit;
the acquisition control unit is used for transmitting the initial standard digital transient waveform output by the AD sampling unit to the coding unit;
the synchronous clock unit is used for providing a synchronous clock for the AD sampling unit and the coding unit.
Further, the encoding unit converts the initial standard digital transient waveform into a standard digital transient waveform of the FT3 protocol by FPGA technology with a certain delay.
Furthermore, the synchronous clock unit is used for monitoring that the delay time of the second standard analog transient waveform input by the AD sampling unit and the standard digital transient waveform output by the coding unit is less than 1 μ s, and the uncertainty of the conversion delay is less than 0.01 μ s.
The invention has the beneficial effects that: the technical scheme of the invention provides a transient verification method and a transient verification system, wherein the method and the system generate a plurality of groups of transient waveforms according to preset transient parameters, and obtain a standard transient signal source with adjustable transient parameters according to a resolution D/A technology; obtaining a standard transient digital source with low time delay and fast response according to the A/D sampling and data coding technology with high real-time performance; respectively inputting each transient signal into a transient calibrator of the direct current transformer to be tested, and judging the calibration effect according to the output result of the calibrator; the method and the system improve the quantity value tracing system of the direct current transformer and the calibrator, and improve the calibration accuracy of the transient calibrator of the direct current transformer.
Drawings
A more complete understanding of exemplary embodiments of the present invention may be had by reference to the following drawings in which:
FIG. 1 is a flow chart of a method of transient verification according to an embodiment of the present invention;
fig. 2 is a block diagram of a transient verification system according to an embodiment of the invention.
Detailed Description
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.
Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
FIG. 1 is a flow chart of a method of transient verification according to an embodiment of the present invention; as shown in fig. 1, the method includes:
further, the first standard transient waveform data and the second standard transient waveform data are set separately according to the transient parameters; the transient parameters include transient step response time, transient step rise or fall time, settling time, overshoot, etc.
For a method of generating first or second standard transient waveform data according to preset transient parameters, comprising:
generating an ideal step waveform digital sequence from 0 to 1 with the starting time, the stability approaching time and the overshoot all being 0;
generating a transfer function according to the transient parameters;
converting the parameters of the transfer function into two groups of coefficient sequences of a forward coefficient and a reverse coefficient by a bilinear variation method;
and performing convolution operation on the two groups of coefficient sequences and the ideal step waveform digital sequence to obtain standard transient waveform data corresponding to the transient parameters.
In this embodiment, the transient waveform is generated by using programming software that can implement the above-described principle; the system can be a notebook, an industrial personal computer or an embedded controller loaded with programming software; transient step waveform data is generated by a numerical formula.
in this embodiment, the signal conversion module may be implemented by a function generator or other device with a D/a conversion function; converting two groups of standard transient waveform data derived by a programming software platform into standard analog transient waveforms, namely a first standard analog transient waveform and a second standard analog transient waveform, by a D/A conversion technology;
the first standard transient waveform data and the second standard transient waveform data are transmitted in an excel file form and transmitted to the signal conversion module in a GPIB bus mode to generate a standard analog transient waveform.
The signal conversion module is provided with at least two groups of mutually independent and mutually isolated analog waveform output channels, so that the first standard analog transient waveform and the second standard analog transient waveform are output through the two groups of mutually independent and mutually isolated analog waveform output channels.
in this embodiment, the second standard analog transient waveform is sampled by an AD sampling unit; for example, a high speed digitizer such as PXI-5922 available from NI corporation; sampling to obtain an initial standard digital transient waveform; in order to adapt to the transient calibrator of the direct current transformer, the initial standard digital transient waveform needs to be further converted; in this embodiment, the conversion is performed by the encoding unit, that is, the initial standard digital transient waveform is converted into a standard digital transient waveform of the FT3 protocol; the conversion is a conversion of the initial standard digital transient waveform to a standard digital transient waveform of the FT3 protocol by FPGA technology with a determined delay.
Further, the synchronism of the second standard analog transient waveform and the standard digital transient waveform is ensured by setting a synchronous clock; the delay time of the synchronicity is less than 1 mus and the uncertainty of the conversion delay is less than 0.01 mus.
In this embodiment, the AD sampling unit implements synchronous sampling by receiving a synchronous pulse trigger signal and an acquisition control signal of a synchronous clock unit (synchronous clock) to ensure synchronization with conversion of the encoding unit.
specifically, the first standard analog transient waveform is input to a standard analog quantity input end of the transient calibrator for the dc transformer to be tested;
inputting the second standard simulation transient waveform to a measured analog quantity input end of the transient calibrator of the direct current transformer to be measured;
and inputting the standard digital transient waveform to a measured digital quantity input end of the transient calibrator for the direct current transformer to be tested.
And 150, judging a verification evaluation result of the transient state calibrator of the direct current transformer to be tested according to the transient state parameters, output by the transient state calibrator of the direct current transformer to be tested, of the corresponding three sets of transient state waveforms.
According to the transient parameters of the three groups of transient waveforms and the original transient parameters, a verification evaluation result can be obtained according to a preset judgment rule, wherein the judgment rule can be determined according to actual requirements;
the first standard analog transient waveform and the second standard analog transient waveform can simulate a certain error value when being generated so as to simulate a real situation, and the second standard analog transient waveform is almost the same as the waveform shape of the standard digital transient waveform digitized according to the second standard analog transient waveform; in practical situations, the verification result of the transient calibrator for the dc transformer to be tested for the analog transient waveform and the digital transient waveform can be confirmed according to the comparison between the output result of the first standard analog transient waveform (analog measured waveform) and the second standard analog transient waveform (analog standard waveform) or according to the comparison between the output result of the standard digital transient waveform (analog measured waveform) and the second standard analog transient waveform (analog standard waveform).
Fig. 2 is a block diagram of a transient verification system according to an embodiment of the invention. As shown in fig. 2, the system includes:
a transient data generation module 210, configured to generate first standard transient waveform data and second standard transient waveform data according to a preset transient parameter;
further, the transient data generating module 210 includes a controller capable of running a preset programming software program, and obtains first standard transient waveform data and second standard transient waveform data by inputting the transient parameters into the preset programming software; the transient parameters include a transient step response time, a transient step rise or fall time, a settling time, and an overshoot.
Further, the manner in which the transient data generation module 210 sends the first standard transient waveform data and the second standard transient waveform data to the signal conversion module 220 includes: the transmission is carried out in an excel file form and a GPIB bus mode; the first standard transient waveform data and the second standard transient waveform data may be individually set according to a transient parameter.
A signal conversion module 220, wherein the signal conversion module 220 is configured to convert the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through AD conversion; a first output end of the signal conversion module 220, which outputs the first standard analog transient waveform, is connected with a standard analog input end of the transient calibrator for the dc transformer to be tested; a second output end of the signal conversion module 220, which outputs the second standard analog transient waveform, is connected to a measured analog input end of the transient calibrator for the dc transformer to be measured;
further, the signal conversion module 220 may be a function generator or a device with D/a conversion function; the system is used for converting two groups of standard transient waveform data derived by a programming software platform into standard analog transient waveforms by a D/A conversion technology, and comprises two groups of analog waveform output channels which are independent and isolated from each other.
A standard digital source module 230, wherein the standard digital source module 230 comprises an AD sampling unit 231 and an encoding unit 232; the AD sampling unit 231 is configured to sample the second standard analog transient waveform according to a preset frequency to obtain an initial standard digital transient waveform; the encoding unit 232 is configured to convert the initial standard digital transient waveform into a standard digital transient waveform of the FT3 protocol according to a preset rule; the output end of the coding unit 232 is connected with the input end of the measured digital quantity of the transient state calibrator for the direct current transformer to be tested.
Furthermore, the standard digital source module also comprises an acquisition control unit and a synchronous clock unit;
the acquisition control unit is used for transmitting the initial standard digital transient waveform output by the AD sampling unit 231 to the encoding unit 232;
the synchronous clock unit is used for providing a synchronous clock for the AD sampling unit 231 and the encoding unit 232.
Further, the encoding unit 232 converts the initial standard digital transient waveform into a standard digital transient waveform of the FT3 protocol by FPGA technology with certain delay.
Further, the synchronous clock unit is configured to monitor that the delay time between the second standard analog transient waveform input by the AD sampling unit 231 and the standard digital transient waveform output by the encoding unit 232 is less than 1 μ s, and the uncertainty of the conversion delay is less than 0.01 μ s.
The AD sampling unit 231 may adopt a high-speed digitizer of the NI corporation, model PXI-5922; the standard analog transient waveform acquisition control device has the main functions of receiving a control signal output by an acquisition control unit of a standard digital source module and a synchronous pulse trigger signal of a synchronous clock unit, carrying out AD synchronous trigger sampling on the standard analog transient waveform, converting the standard analog transient waveform into a digital signal and outputting the digital signal to the standard digital source module. The conversion accuracy of the AD sampling unit 231 can be ensured by metrology calibration.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the disclosure may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Those skilled in the art will appreciate that the modules in the device in an embodiment may be adaptively changed and disposed in one or more devices different from the embodiment. The modules or units or components of the embodiments may be combined into one module or unit or component, and furthermore they may be divided into a plurality of sub-modules or sub-units or sub-components. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where at least some of such features and/or processes or elements are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Reference to step numbers in this specification is only for distinguishing between steps and is not intended to limit the temporal or logical relationship between steps, which includes all possible scenarios unless the context clearly dictates otherwise.
Moreover, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the disclosure and form different embodiments. For example, any of the embodiments claimed in the claims can be used in any combination.
Various component embodiments of the disclosure may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. The present disclosure may also be embodied as device or system programs (e.g., computer programs and computer program products) for performing a portion or all of the methods described herein. Such programs implementing the present disclosure may be stored on a computer-readable medium or may be in the form of one or more signals. Such a signal may be downloaded from an internet website or provided on a carrier signal or in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the disclosure, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The disclosure may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several systems, several of these systems may be embodied by one and the same item of hardware.
The foregoing is directed to embodiments of the present disclosure, and it is noted that numerous improvements, modifications, and variations may be made by those skilled in the art without departing from the spirit of the disclosure, and that such improvements, modifications, and variations are considered to be within the scope of the present disclosure.
Claims (14)
1. A method of transient verification, the method comprising:
generating first standard transient waveform data and second standard transient waveform data according to preset transient parameters;
converting the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through DA conversion;
sampling and converting the second standard analog transient waveform according to a preset frequency to generate a standard digital transient waveform of an FT3 protocol;
inputting the first standard analog transient waveform, the second standard analog transient waveform and the standard digital transient waveform into a transient calibrator of the direct current transformer to be tested;
and judging the verification evaluation result of the transient state calibrator of the direct current transformer to be tested according to the transient state parameters, output by the transient state calibrator of the direct current transformer to be tested, of the corresponding three sets of transient state waveforms.
2. The method of claim 1, wherein inputting the first standard analog transient waveform, the second standard analog transient waveform, and the standard digital transient waveform to a dc transformer transient calibrator under test comprises:
inputting the first standard simulation transient waveform to a standard analog quantity input end of the transient calibrator of the direct current transformer to be tested;
inputting the second standard simulation transient waveform to a measured analog quantity input end of the transient calibrator of the direct current transformer to be measured;
and inputting the standard digital transient waveform to a measured digital quantity input end of the transient calibrator for the direct current transformer to be tested.
3. The method of claim 1, wherein: the transient parameters include a transient step response time, a transient step rise or fall time, a settling time, and an overshoot.
4. The method of claim 3, wherein the first standard transient waveform data and the second standard transient waveform data are set individually according to transient parameters; generating standard transient waveform data according to preset transient parameters, comprising:
generating an ideal step waveform digital sequence from 0 to 1 with the starting time, the stability approaching time and the overshoot all being 0;
generating a transfer function according to the transient parameters;
converting the parameters of the transfer function into two groups of coefficient sequences of a forward coefficient and a reverse coefficient by a bilinear variation method;
and performing convolution operation on the two groups of coefficient sequences and the ideal step waveform digital sequence to obtain standard transient waveform data corresponding to the transient parameters.
5. The method of claim 1, wherein: and before the first standard transient waveform data and the second standard transient waveform data are converted, the first standard transient waveform data and the second standard transient waveform data are transmitted in an excel file mode and a GPIB bus mode.
6. The method of claim 1, wherein: the first standard analog transient waveform and the second standard analog transient waveform are output through two groups of analog waveform output channels which are independent and isolated from each other.
7. The method of claim 1, wherein: the synchronism of the second standard analog transient waveform and the standard digital transient waveform is ensured by setting a synchronous clock; the delay time of the synchronicity is less than 1 mus and the uncertainty of the conversion delay is less than 0.01 mus.
8. A system for transient verification, the system comprising:
the transient data generation module is used for generating first standard transient waveform data and second standard transient waveform data by preset transient parameters;
a signal conversion module for converting the first standard transient waveform data and the second standard transient waveform data into a first standard analog transient waveform and a second standard analog transient waveform through AD conversion; a first output end of the signal conversion module, which outputs the first standard simulation transient waveform, is connected with a standard analog quantity input end of the transient calibrator for the direct current transformer to be tested; a second output end of the signal conversion module, which outputs a second standard analog transient waveform, is connected with a measured analog quantity input end of the transient calibrator for the direct current transformer to be measured;
the standard digital source module comprises an AD sampling unit and an encoding unit; the AD sampling unit is used for sampling the second standard analog transient waveform according to a preset frequency to obtain an initial standard digital transient waveform; the encoding unit is used for converting the initial standard digital transient waveform into a standard digital transient waveform of an FT3 protocol according to a preset rule; and the output end of the coding unit is connected with the input end of the measured digital quantity of the transient state calibrator of the direct current transformer to be tested.
9. The system of claim 8, wherein: the transient parameters include a transient step response time, a transient step rise or fall time, a settling time, and an overshoot.
10. The system of claim 8, wherein: the manner in which the transient data generation module sends the first standard transient waveform data and the second standard transient waveform data to the signal conversion module includes: the transmission is carried out in an excel file form and a GPIB bus mode; the first standard transient waveform data and the second standard transient waveform data are set individually according to transient parameters.
11. The system of claim 8, wherein: the signal conversion module comprises two groups of analog waveform output channels which are independent and isolated from each other.
12. The system of claim 8, wherein: the standard digital module also comprises an acquisition control unit and a synchronous clock unit;
the acquisition control unit is used for transmitting the initial standard digital transient waveform output by the AD sampling unit to the coding unit;
the synchronous clock unit is used for providing a synchronous clock for the AD sampling unit and the coding unit.
13. The system of claim 8, wherein: the encoding unit converts the initial standard digital transient waveform into a standard digital transient waveform of the FT3 protocol by FPGA technology with a determined delay.
14. The system of claim 12, wherein: the synchronous clock unit is used for monitoring that the delay time of the second standard analog transient waveform input by the AD sampling unit and the standard digital transient waveform output by the coding unit is less than 1 mu s, and the uncertainty of the conversion delay is less than 0.01 mu s.
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Inventor after: Nie Qi Inventor after: Huang Junchang Inventor after: Wan Peng Inventor after: Xiong Qianzhu Inventor after: Guo Xianshan Inventor after: Zhang Min Inventor after: Chen Zhengguang Inventor after: Zhou Feng Inventor after: Hu Haoliang Inventor after: Yang Chunyan Inventor after: Li He Inventor after: Liu Boyang Inventor before: Nie Qi Inventor before: Hu Haoliang Inventor before: Yang Chunyan Inventor before: Li He Inventor before: Liu Boyang Inventor before: Huang Junchang Inventor before: Wan Peng Inventor before: Xiong Qianzhu |