CN109406443A - Composite insulator void defects method of discrimination, detection method, device and storage medium - Google Patents
Composite insulator void defects method of discrimination, detection method, device and storage medium Download PDFInfo
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- 239000002131 composite material Substances 0.000 title claims abstract description 99
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
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Abstract
The invention discloses a kind of composite insulator void defects method of discrimination, detection method, device and storage medium, the void defects method of discrimination includes: the surface reflection Terahertz echo and internal reflection Terahertz echo for acquiring composite insulator；The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；Calculate the Amplitude Ration of internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element；Internal air gap defect estimation is carried out to the composite insulator in conjunction with preset void defects criterion according to the phase difference, Amplitude Ration.Composite insulator void defects method of discrimination, detection method, device and storage medium provided by the invention, it is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, it can accurately identify internal air gap defect, help to safeguard safe operation of electric network.
Description
Technical field
The present invention relates to Terahertz technical field of nondestructive testing more particularly to a kind of composite insulator void defects differentiation sides
Method, detection method, device and storage medium.
Background technique
Existing electric power composite insulator generally includes external jacket and internal core rod.External jacket generally uses silicon rubber
Material is mainly used for insulation, environmental resistance；Internal core rod is set in external jacket, and generally cylindric solid construction is generally adopted
With the epoxy resin composite material of glass fiber reinforcement, it is mainly used for bearing pulling force, while also has insulation performance.
In composite insulator manufacturing process and operational process, the interface of external jacket and internal core rod may occur point
Layer is to form void defects, and this void defects can generate shelf depreciation, prolonged office under the action of high voltage electric field
Portion's electric discharge will lead to the problems such as fracture or breakdown occur for composite insulator, influence safe operation of electric network.Therefore in composite insulator
Before coming into operation, it is necessary to internal air gap defects detection is carried out to it, to exclude security risk.
Existing defect detecting technique includes ultrasonic detection technology and X-ray Testing Technology in the prior art, but due to multiple
The epoxy resin composite material that interior insulator plug is glass fiber reinforcement is closed, there are the interfaces of a variety of high molecular materials, pass
The detection techniques such as ultrasonic wave, the ray of system decay and interfere it is excessive due to, in detection composite insulator internal air gap etc.
There are precision when defect it is low, discrimination is poor the problems such as.
Summary of the invention
It is an object of the invention to overcome deficiency in the prior art, a kind of composite insulator void defects differentiation side is provided
Method, detection method, device and storage medium can significantly improve the void defects accuracy of identification of composite insulator.
In order to achieve the above objectives, the present invention adopts the following technical solutions realization:
In a first aspect, the present invention provides a kind of composite insulator void defects method of discrimination, which comprises
Acquire the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；
Calculate internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element
Amplitude Ration；
According to the phase difference, Amplitude Ration in conjunction with preset void defects criterion in composite insulator progress
Portion's void defects differentiate.
Second aspect, the present invention provides a kind of composite insulator void defects discriminating gears, comprising:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo
Difference；
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element
The Amplitude Ration of internal reflection Terahertz echo；
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple
It closes insulator and carries out internal air gap defect estimation.
The third aspect the present invention also provides a kind of composite insulator void defects discriminating gear, including processor and is deposited
Storage media；
The storage medium is for storing instruction；
The processor according to described instruction for being operated to execute the step of method according to claim 1 or claim 2
Suddenly.
Fourth aspect, the present invention provides a kind of computer readable storage mediums, are stored thereon with computer program, the journey
The step of first aspect the method is realized when sequence is executed by processor.
5th aspect, the present invention provides a kind of composite insulator void defects detection methods, which comprises
Tested composite insulator void defects are differentiated using method described in first aspect；
When differentiation result is to calculate the time required to being incident to void defects according to THz wave there are when internal air gap defect
Depth locating for void defects；
The height of void defects is calculated the time required to passing through void defects according to THz wave；
According to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, there are void defects
The internal reflection Terahertz echo curve in region, determines the circumferential direction and axial dimension of void defects.
6th aspect, the present invention provides a kind of composite insulator void defects detection devices, comprising: described in second aspect
Discriminating gear, further includes:
Depth calculation module: when differentiation result is to be incident to air gap there are when internal air gap defect according to THz wave and lack
Depth locating for void defects is calculated the time required to falling into；
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave；
Scale determining module: for being returned according to the internal reflection Terahertz for the air-gap-free defect area for being tested composite insulator
Wave profile, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
7th aspect the present invention also provides a kind of composite insulator void defects detection device, including processor and is deposited
Storage media；
The storage medium is for storing instruction；
The processor is used for the step of being operated according to described instruction to execute according to first aspect the method.
Eighth aspect, the present invention provides a kind of computer readable storage mediums, are stored thereon with computer program, special
The step of sign is, first aspect the method is realized when which is executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects method of discrimination provided by the invention, detection method, device
And storage medium, it is calculated by the Terahertz echo analysis to composite insulator and realizes that composite insulator internal air gap defect is sentenced
Not；And by further can accurately detect void defects present position, week to the analytical calculation of Terahertz echo curve
To and axial dimension, the spatial distribution of defect area can be accurately obtained and to defective locations and size with the shape of space curve figure
Formula is intuitively shown, is facilitated equipment operation maintenance personnel and is judged whether defect severity, assessment equipment under test performance meet the requirements.
Detailed description of the invention
Fig. 1 is the signal for generating Terahertz echo in the embodiment of the present invention using the THz wave scanning compound inslation period of the day from 11 p.m. to 1 a.m
Figure；
Fig. 2 is the cross-sectional view that compound inslation subsample is detected in the embodiment of the present invention；
Fig. 3 is that composite insulator sample defects position and the echo ratio without defective locations are detected in the embodiment of the present invention
Compared with figure；
Fig. 4 is that composite insulator sample defects ranged space curve is detected in the embodiment of the present invention；
In figure: 1, external jacket；2, internal core rod；3, void defects.
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.Following embodiment is only used for clearly illustrating the present invention
Technical solution, it is clear that the described embodiments are merely a part of the embodiments of the present invention, rather than whole embodiments, cannot
It is limited the scope of the invention with this.
It should be appreciated that THz wave, which enters another medium from a kind of medium, necessarily leads to Terahertz echo.The present invention is real
Vertical incidence scanning acquisition can be carried out to composite insulator by THz wave by applying the Terahertz echo in example, and terahertz is used in scanning
Hereby wave waveform has 2 wave crests and 2 troughs, and frequency range is 0.1~2THz, spectral resolution 0.357GHz.This field
Technical staff is it is to be understood that the penetration power of the scanning THz wave can pass through in the entrance of external jacket 1 of composite insulator
Portion's plug 2, but it is not enough to penetrate the entire internal core rod 2 of composite insulator, it is specific as shown in Figure 1, scanning THz wave A0
When carrying out vertical circumferential scanning to composite insulator, air-gap-free defect area only generates two kinds of Terahertz echoes, specifically includes: by
The surface reflection Terahertz echo A that external jacket 1 reflectsr1With the internal reflection Terahertz echo reflected by internal core rod 2
Ar2；There is void defects region then can and to be merely able to generate three kinds of Terahertz echoes, specifically includes: being reflected by external jacket 1
Surface reflection Terahertz echo Ar1, the internal reflection Terahertz echo A that is reflected by 3 outer surface of void defectsr3(i.e. terahertz
Generated internal reflection Terahertz echo when hereby wave injects void defects 3 from external jacket 1) and by 3 inner surface of void defects
The internal reflection Terahertz echo A reflectedr4(i.e. THz wave is injected internal anti-caused by internal core rod 2 from void defects 3
Penetrate Terahertz echo).
Composite insulator void defects method of discrimination provided in an embodiment of the present invention, includes the following steps:
Step 101: acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Step 102: the phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；
For there are the region of internal air gap defect, void defects surfaces externally and internally will generate a kind of internal reflection terahertz respectively
Hereby echo should calculate separately the phase difference of surface reflection Terahertz echo and two kinds of internal reflection Terahertz echoes；
Step 103: calculating internal reflection caused by previous THz wave scanning element and current THz wave scanning element too
The Amplitude Ration of hertz echo.
Since the refractive index of air and the refractive index of silastic material are different, so THz wave is injected from silastic material
The internal reflection Terahertz echo that void defects generate injects epoxy resin composite wood from silastic material compared to THz wave
Expect that the amplitude of the internal reflection Terahertz echo generated can mutate.
Step 104: according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to the compound inslation
Son carries out internal air gap defect estimation.
As shown in Figure 1, THz wave generates echo, the reflection coefficient of echo in the meeting of heterogeneous interface(n′1Refractive index, n' for the 1st kind of material2For the refractive index of the 2nd kind of material, A0For incident Terahertz
Wave amplitude, Ar1For the Terahertz echo amplitude of the 1st kind of material).When composite insulator is there are when internal air gap defect, due to air
Refractive index be less than the refractive index of silastic material, therefore in air-silicon rubber interface echo Ar1With silicon rubber-air gap interface
Echo Ar2It will appear 180 ° of phase of reversion.
Therefore, void defects criterion described in step 104 include:
Phase difference=± 180 ° and there are Amplitude Rations if it existsThen determine current THz wave
Scanning element is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refraction for being tested composite insulator external jacket
Rate, n3For the refractive index for being tested composite insulator internal core rod；Otherwise, it is determined that internal gas is not present in current THz wave scanning element
Gap defect.
Specifically, being 1 according to air refraction, silicon rubber refractive index is 1.886, epoxy resin refractive index is 2.289, meter
Calculation obtains Amplitude Ration=3.65.
Composite insulator void defects discriminating gear provided in an embodiment of the present invention, can be used for executing compound inslation above-mentioned
Sub- void defects method of discrimination, comprising:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo
Difference；
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element
The Amplitude Ration of internal reflection Terahertz echo；
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple
It closes insulator and carries out internal air gap defect estimation.
The embodiment of the invention also provides a kind of composite insulator void defects discriminating gears, including processor and storage to be situated between
Matter；
The storage medium is for storing instruction；
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects differentiation side
The step of method.
The embodiment of the invention also provides a kind of computer readable storage mediums, are stored thereon with computer program, the journey
The step of aforementioned composite insulator void defects method of discrimination is realized when sequence is executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects method of discrimination provided by the invention, device and storage are situated between
Matter is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, Neng Goujing
True ground identifies internal air gap defect, helps to safeguard safe operation of electric network.
Composite insulator void defects detection method provided in an embodiment of the present invention can use composite insulator above-mentioned
Void defects method of discrimination carries out void defects differentiation, specifically comprises the following steps:
Step 201: acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Step 202: the phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；
Step 203: calculating internal reflection caused by previous THz wave scanning element and current THz wave scanning element too
The Amplitude Ration of hertz echo.
Step 204: according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to the compound inslation
Son carries out internal air gap defect estimation.
Void defects criterion includes:
Phase difference=± 180 ° and there are Amplitude Rations if it existsThen determine current THz wave
Scanning element is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refraction for being tested composite insulator external jacket
Rate, n3For the refractive index for being tested composite insulator internal core rod；Otherwise, it is determined that internal gas is not present in current THz wave scanning element
Gap defect.
Step 205: when differentiating that result is there are when internal air gap defect, needed for being incident to void defects according to THz wave
Time calculates depth locating for void defects, specific as follows:
In formula: L indicates depth locating for void defects；0.5·△t1Indicate that THz wave is incident to void defects and is taken
Between；Δt1=t1-t0, t0Expression collect tested surface of composite insulator reflected terahertz hereby echo at the time of, t1Expression collects
At the time of THz wave injects the internal reflection Terahertz echo generated when void defects；C indicates that THz wave is aerial
Spread speed.
Step 206: the height of void defects is calculated the time required to passing through void defects according to THz wave, specific as follows:
H=0.5* Δ t2*c (2)
In formula: h indicates the height of void defects, 0.5* Δ t2The time required to indicating that THz wave passes through void defects；Δt2
=t2-t1, t1At the time of indicating that collecting THz wave injects the internal reflection Terahertz echo generated when void defects；t2Table
At the time of showing that collecting THz wave projects the internal reflection Terahertz echo generated when void defects, c indicates that THz wave exists
Spread speed in air.
Step 207: according to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, having
The internal reflection Terahertz echo curve in void defects region, determines the circumferential direction and axial dimension of void defects.
Wherein determine that the circumferential direction of void defects and the method for axial dimension specifically include:
S207a: the circumferential THz wave scanning of tested composite insulator progress is obtained according to default axial scan step-length and is produced
Raw total internal reflection Terahertz echo curve group；
S207b: it is calculated in same scanning circumference in air-gap-free defect area according to internal reflection Terahertz echo curve
The average value of portion's reflected terahertz hereby echo amplitude, and datum curve is generated according to average value；
S207c: the internal reflection Terahertz echo of each air-gap-free defect area scanning element in same scanning circumference is calculated
The 2- norm of curve and datum curve, is denoted as set X；
S207d: with maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new datum curve, is calculated same
The internal reflection Terahertz echo curve of each void defects sector scanning point and the 2- of new datum curve in one scanning circumference
Norm is denoted as set Y；
S207e: by the element of the element of set X in same scanning circumference and set Y according to the scanning space of THz wave
Sequence is ranked up, and the number of circumferentially continuous void defects sector scanning point and the product of default circumferential scanning step-length are that this is swept
Retouch the circumferential scale that circumference corresponds to void defects；
Assuming that X={ x1,x2,……,xn, wherein xnIndicate the internal reflection of n-th of air-gap-free defect area scanning element too
The 2- norm of hertz echo curve and the datum curve difference value vector in entire wavelength band, n are equal to nothing in same scanning circumference
The total number of void defects sector scanning point；Y={ y1,y2,……,ym, wherein ymIndicate m-th of void defects sector scanning
The reflection echo of external jacket (silastic material) and internal core rod (epoxide resin material) void defects interface is injected at point.
With the 2- norm of new datum curve difference value vector in entire wavelength band；According to the scanning space of THz wave
Sequence after sequence sorts is { x1,x2,…xi,y1,y2... ym,xi+1…,xn, then the circumferential scale of void defects is m △
R, △ r are circumferential scanning step-length.
S207f: by the element of the element of the corresponding set X of all scanning circumference and set Y according to the scanning of THz wave
Spatial order is ranked up, and the product of the number and default axial scan step-length of axially consecutive void defects sector scanning point is
Void defects axial dimension.
The method of the circumferential direction and axial dimension that determine void defects is done further specifically combined with specific embodiments below
It is bright.
As shown in Fig. 2, being the cross-sectional view for being detected compound inslation subsample, along the circumferential direction using THz wave
It is scanned detection, each detection interval is 18 °, 20 points of detection in one week.It has detected after a week, has been axially moveable compound inslation
Son, step-length 0.5mm, scanning area axial overall length are 8mm.
As shown in figure 3, being THz wave is vertically injected to composite insulator to be scanned according to default circumferential step-length to be obtained
The Terahertz reflectogram taken, waveform indicated by a is to have Terahertz echo caused by void defects region in figure, indicated by b
Waveform be Terahertz echo caused by air-gap-free defect area, the wave crest that " ☆ " is marked is that corresponding scanning element surface is anti-
Terahertz echo is penetrated, the wave crest that " " is marked is that THz wave is injected inside caused by void defects too as external jacket
Hertz echo, the wave crest that "○" is marked are THz wave internal Terahertz as caused by void defects injection internal core rod
Echo, remaining wave crest are then reflection at peak of the THz wave inside composite insulator after multiple catadioptric.
According to Fig. 3, the time delay at the peak " ☆ " and the peak " " is 23.74ps, according to formula (1), it is contemplated that external jacket uses
Silastic material, refractive index 1.6, is calculated as follows:
The depth that can get void defects is 2.2mm.
The time delay at the peak " " and "○" peak is that 9.8ps is calculated as follows according to formula (2):
H=0.5* Δ t2* c=0.5*9.8*3*10-4=0.00147mm
Can get void defects height is 1.47mm.
As shown in figure 4, the 2- norm of the Terahertz echo curve of zero defect each point and datum curve is most in a circumferential direction
Big value is 0.30, and the 2- norm maximum value of the Terahertz echo curve of void defects position and datum curve is 0.80.Air gap
Defect in circumferential range for the π of 1.10 π~1.45 between, i.e., 198 °~261 ° ranges since starting point, defect maximum time
Wave position passes through void defects region in 2- norm image axial direction continuity from above at 225 °, it is known that the axial length of defect
For 8mm.
Composite insulator void defects detection device provided in an embodiment of the present invention can be used for executing above-mentioned compound exhausted
Edge void defects detection method, specifically includes:
Discriminating gear: for differentiating composite insulator with the presence or absence of internal air gap defect；
Depth calculation module: when differentiation result is to be incident to air gap there are when internal air gap defect according to THz wave and lack
Depth locating for void defects is calculated the time required to falling into；
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave；
Scale determining module: for being returned according to the internal reflection Terahertz for the air-gap-free defect area for being tested composite insulator
Wave profile, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
Wherein, discriminating gear can carry out void defects differentiation using aforementioned composite insulator void defects method of discrimination,
It can specifically include following module structure:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo
Difference；
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element
The Amplitude Ration of internal reflection Terahertz echo；
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple
It closes insulator and carries out internal air gap defect estimation.
Discriminating gear can also use such as flowering structure, specifically:
Including processor and storage medium；
The storage medium is for storing instruction；
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects differentiation side
The step of method.
Wherein, the scale determining module includes:
It obtains module: being swept for obtaining the tested circumferential THz wave of composite insulator progress according to default axial scan step-length
Total internal reflection Terahertz echo curve group caused by retouching；
Datum curve generation module: for being calculated in same scanning circumference according to internal reflection Terahertz echo curve without gas
The average value of the internal reflection Terahertz echo amplitude of gap defect area, and datum curve is generated according to average value；
First 2- norm calculation module: for calculating in same scanning circumference in each air-gap-free defect area scanning element
The 2- norm of portion's reflected terahertz hereby echo curve and datum curve, is denoted as set X；
2nd 2- norm calculation module: for maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new
Datum curve, calculate it is same scanning circumference in each void defects sector scanning point internal reflection Terahertz echo curve with
The 2- norm of new datum curve, is denoted as set Y；
Circumferential scale determining module: for by it is same scanning circumference in set X element and set Y element according to terahertz
Hereby the scanning space sequence of wave is ranked up, the number and default circumferential scanning step-length of circumferentially continuous void defects sector scanning point
Product be circumferential scale that the scanning circumference corresponds to void defects；
Axial dimension determining module: for by the element of the elements of the corresponding set X of all scanning circumference and set Y according to
The scanning space sequence of THz wave is ranked up, the number of axially consecutive void defects sector scanning point and default axial scan
The product of step-length is void defects axial dimension.
The embodiment of the invention also provides a kind of composite insulator void defects detection devices, including processor and storage to be situated between
Matter；
The storage medium is for storing instruction；
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects detection side
The step of method.
The embodiment of the invention also provides a kind of computer readable storage mediums, are stored thereon with computer program, special
The step of sign is, which realizes aforementioned composite insulator void defects detection method when being executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects detection method provided by the invention, device and storage are situated between
Matter is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, can not only
It is enough accurately to identify internal air gap defect, the spatial distribution of defect area can also be accurately obtained and to defective locations and size
It is shown with the formal intuition of space curve figure, facilitates equipment operation maintenance personnel and judge defect severity, assess equipment under test
Whether can meet the requirements.
It should be understood by those skilled in the art that, embodiments herein can provide as method, system or computer program
Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the application
Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the application, which can be used in one or more,
The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces
The form of product.
The application is referring to method, the process of equipment (system) and computer program product according to the embodiment of the present application
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the technical principles of the invention, several improvement and deformations can also be made, these improvement and deformations
Also it should be regarded as protection scope of the present invention.
Claims (13)
1. composite insulator void defects method of discrimination, which is characterized in that the described method includes:
Acquire the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；
Calculate the width of internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element
Value ratio；
Internal gas is carried out to the composite insulator in conjunction with preset void defects criterion according to the phase difference, Amplitude Ration
Gap defect estimation.
2. composite insulator void defects method of discrimination according to claim 1, which is characterized in that the void defects are sentenced
Other condition includes:
If it exists phase difference=± 180 ° andThen determine current THz wave scanning
Point is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refractive index for being tested composite insulator external jacket, n3
For the refractive index for being tested composite insulator internal core rod；
Otherwise, it is determined that internal air gap defect is not present in current THz wave scanning element.
3. composite insulator void defects discriminating gear characterized by comprising
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator；
Phase difference calculating module: the phase difference for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo；
Amplitude Ration computing module: internal caused by previous THz wave scanning element and current THz wave scanning element for calculating
The Amplitude Ration of reflected terahertz hereby echo；
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described compound exhausted
Edge carries out internal air gap defect estimation.
4. composite insulator void defects discriminating gear, which is characterized in that including processor and storage medium；
The storage medium is for storing instruction；
The processor is for the step of being operated according to described instruction to execute method according to claim 1 or claim 2.
5. computer readable storage medium is stored thereon with computer program, which is characterized in that when the program is executed by processor
The step of realizing method as claimed in claim 1 or 2.
6. composite insulator void defects detection method, which is characterized in that the described method includes:
Tested composite insulator void defects are differentiated using method of any of claims 1 or 2；
When differentiation result is to calculate air gap the time required to being incident to void defects according to THz wave there are when internal air gap defect
Depth locating for defect；
The height of void defects is calculated the time required to passing through void defects according to THz wave；
According to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, there is void defects region
Internal reflection Terahertz echo curve, determine the circumferential direction and axial dimension of void defects.
7. composite insulator void defects detection method according to claim 6, which is characterized in that counted using formula (1)
Calculate depth locating for void defects:
In formula: L indicates depth locating for void defects；0.5·Δt1The time required to indicating that THz wave is incident to void defects；Δ
t1=t1-t0, t0Expression collect tested surface of composite insulator reflected terahertz hereby echo at the time of, t1Expression collects Terahertz
At the time of wave injects the internal reflection Terahertz echo generated when void defects；C indicates the aerial propagation speed of THz wave
Degree；n2Indicate the refractive index of tested composite insulator external jacket.
8. composite insulator void defects detection method according to claim 6, which is characterized in that counted using formula (2)
Calculate the height of void defects:
H=0.5* Δ t2*c (2)
In formula: h indicates the height of void defects, 0.5* Δ t2The time required to indicating that THz wave passes through void defects；Δt2=
t2-t1, t1At the time of indicating that collecting THz wave injects the internal reflection Terahertz echo generated when void defects；t2It indicates
At the time of the internal reflection Terahertz echo generated when collecting THz wave injection void defects, c indicates THz wave in sky
Spread speed in gas.
9. composite insulator void defects detection method according to claim 6, which is characterized in that determine void defects
Circumferential direction and the method for axial dimension include:
Tested composite insulator is obtained according to default axial scan step-length to carry out in whole caused by circumferential THz wave scanning
Portion's reflected terahertz hereby echo curve group；
The internal reflection terahertz of air-gap-free defect area in same scanning circumference is calculated according to internal reflection Terahertz echo curve
The hereby average value of echo amplitude, and datum curve is generated according to average value；
Calculate the internal reflection Terahertz echo curve and benchmark of each air-gap-free defect area scanning element in same scanning circumference
The 2- norm of curve, is denoted as set X；
With maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new datum curve, calculates same scanning circumference
The 2- norm of the internal reflection Terahertz echo curve of interior each void defects sector scanning point and new datum curve, is denoted as collection
Close Y；
The element of set X in same scanning circumference and the element of set Y are arranged according to the scanning space sequence of THz wave
Sequence, the number of circumferentially continuous void defects sector scanning point are that the scanning circumference is corresponding with the product of default circumferential scanning step-length
The circumferential scale of void defects；
By the element of the elements of the corresponding set X of all scanning circumference and set Y according to THz wave scanning space sequentially into
Row sequence, the number of axially consecutive void defects sector scanning point and the product of default axial scan step-length are void defects axis
To scale.
10. composite insulator void defects detection device characterized by comprising discriminating gear described in claim 3 or 4,
Further include:
Depth calculation module: when differentiation result is to be incident to void defects institute according to THz wave there are when internal air gap defect
It takes time and calculates depth locating for void defects；
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave；
Scale determining module: for bent according to the internal reflection Terahertz echo for the air-gap-free defect area for being tested composite insulator
Line, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
11. composite insulator void defects detection device according to claim 10, which is characterized in that the scale determines
Module includes:
It obtains module: scanning institute for obtaining the tested circumferential THz wave of composite insulator progress according to default axial scan step-length
The total internal reflection Terahertz echo curve group of generation；
Datum curve generation module: it is lacked for calculating air-gap-free in same scanning circumference according to internal reflection Terahertz echo curve
The average value of the internal reflection Terahertz echo amplitude in region is fallen into, and datum curve is generated according to average value；
First 2- norm calculation module: the inside for calculating each air-gap-free defect area scanning element in same scanning circumference is anti-
The 2- norm for penetrating Terahertz echo curve and datum curve, is denoted as set X；
2nd 2- norm calculation module: for maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new base
Directrix curve calculates the internal reflection Terahertz echo curve of each void defects sector scanning point in same scanning circumference and new
The 2- norm of datum curve, is denoted as set Y；
Circumferential scale determining module: for by it is same scanning circumference in set X element and set Y element according to THz wave
Scanning space sequence be ranked up, the number of circumferentially continuous void defects sector scanning point and multiplying for default circumferential scanning step-length
Product is the circumferential scale that the scanning circumference corresponds to void defects；
Axial dimension determining module: for by the element of the elements of the corresponding set X of all scanning circumference and set Y according to terahertz
Hereby the scanning space sequence of wave is ranked up, the number and default axial scan step-length of axially consecutive void defects sector scanning point
Product be void defects axial dimension.
12. composite insulator void defects detection device, which is characterized in that including processor and storage medium；
The storage medium is for storing instruction；
The processor is used to operated according to described instruction to execute according to any one of claim 6~9 the method
Step.
13. computer readable storage medium is stored thereon with computer program, which is characterized in that the program is executed by processor
The step of any one of Shi Shixian claim 6~9 the method.
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