CN109357624B - Strain measurement method and device based on absolute phase - Google Patents

Strain measurement method and device based on absolute phase Download PDF

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CN109357624B
CN109357624B CN201811148215.2A CN201811148215A CN109357624B CN 109357624 B CN109357624 B CN 109357624B CN 201811148215 A CN201811148215 A CN 201811148215A CN 109357624 B CN109357624 B CN 109357624B
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shearing
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displacement
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CN109357624A (en
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董明利
刘承运
吴思进
杨连祥
李伟仙
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Beijing Information Science and Technology University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry

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Abstract

The embodiment of the application discloses a strain measurement method and device based on absolute phase, wherein the method comprises the following steps: building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths; synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path; synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values; and synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients. According to the embodiment of the application, the strain condition of the object can be truly reflected according to the strain obtained by the absolute phase.

Description

Strain measurement method and device based on absolute phase
Technical Field
The application relates to the technical field of full-field optical measurement, in particular to a strain measurement method and device based on an absolute phase.
Background
Strain measurement is an important means of analyzing the stress distribution under material loading. Reliable strain measurement can provide parameters such as mechanical property indexes, defect positions, deformation conditions under load conditions, risk values and the like of the material. Therefore, strain measurement is very important in engineering mechanics.
At present, strain measurement is carried out by adopting the traditional shearing speckle interference technology, and the displacement space gradient can be determined only according to the relative phase of a measured object in the deformation process. Because the displacement space gradient is the first derivative of displacement, the positive and negative magnitudes of the displacement space gradient represent the increase and decrease of deformation and the deformation rate, and the displacement space gradient determined according to the relative phase cannot truly reflect the strain condition of the measured object.
Disclosure of Invention
The embodiment of the application provides a strain measurement method and device based on an absolute phase, which are used for solving the problem that the strain condition of a measured object cannot be truly reflected in the conventional strain measurement.
The embodiment of the application provides a strain measurement method based on an absolute phase, which comprises the following steps:
building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths;
synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values;
and synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
Optionally, the shearing speckle interference optical path includes: a first shear module, wherein the shear volume of the first shear module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure BDA0001817309410000021
and
Figure BDA0001817309410000022
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the three displacement spatial gradients:
Figure BDA0001817309410000023
and
Figure BDA0001817309410000024
synchronously determining a first principal dependent variable epsilon of the object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Optionally, the shearing speckle interference optical path includes: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure BDA0001817309410000025
and
Figure BDA0001817309410000026
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the three displacement spatial gradients:
Figure BDA0001817309410000027
and
Figure BDA0001817309410000028
synchronously determining a second principal dependent variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Optionally, the shearing speckle interference optical path includes: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure BDA0001817309410000031
and
Figure BDA0001817309410000032
according toThe second shearing module synchronously determines three displacement space gradients of the displacement of the measured object in the y-axis direction:
Figure BDA0001817309410000033
and
Figure BDA0001817309410000034
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the six displacement spatial gradients:
Figure BDA0001817309410000035
and
Figure BDA0001817309410000036
synchronously determining a first principal dependent variable epsilon of the object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
The embodiment of the present application further provides a strain measurement device based on absolute phase, including:
the device comprises a building module, a processing module and a control module, wherein the building module is used for building a shearing speckle interference light path based on a space carrier, and the shearing speckle interference light path comprises four lasers with different wavelengths;
the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
the first determining module is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
and the second determination module is used for synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects:
in the embodiment of the application, a shearing speckle interference optical path based on a space carrier is built, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths; according to the shearing speckle interference optical path, synchronously determining a plurality of absolute phase values of the measured object after deformation, so that a plurality of displacement space gradients of the measured object are synchronously determined according to the plurality of absolute phase values; and then according to a plurality of displacement space gradients, the multidimensional dependent variable of the measured object is synchronously determined, so that the dependent variable obtained according to the absolute phase can truly reflect the strain condition of the object.
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The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
fig. 1 is a schematic flowchart of a strain measurement method based on absolute phase according to an embodiment of the present disclosure;
fig. 2 is a schematic diagram of a shearing speckle interference optical path according to an embodiment of the present disclosure;
FIG. 3 is a schematic diagram of a rectangular distribution of four lasers according to an embodiment of the present application;
FIG. 4 is a schematic diagram of another shearing speckle interference optical path provided in the embodiments of the present application;
FIG. 5 is a schematic diagram of another shearing speckle interference optical path provided in the embodiments of the present application;
fig. 6 is a schematic structural diagram of a strain measurement apparatus based on absolute phase according to an embodiment of the present disclosure.
Detailed Description
The technical solutions of the present application will be described clearly and completely below with reference to the specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic flowchart of a strain measurement method based on absolute phase according to an embodiment of the present disclosure. The method may be as follows.
102, constructing a shearing speckle interference light path based on the space carrier, wherein the shearing speckle interference light path comprises four lasers with different wavelengths.
And step 104, synchronously determining a plurality of absolute phase values of the deformed measured object according to the sheared speckle interference light path.
And step 106, synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values.
And step 108, synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein, at least one shear module is used for introducing shear quantity and introducing space carrier quantity.
Optionally, the image sensor is a color camera.
When the image sensor is a color camera, the light path adjustment process only needs to ensure that the high-frequency spectrum corresponding to the same laser and containing the phase information of the measured object is completely separated from the low-frequency spectrum corresponding to the background light.
Because the wavelengths of the four lasers are different, namely the colors of the laser emitted by the four lasers are different, the frequency spectrums corresponding to the different lasers fall in different color sensitive areas of the color camera to realize collection, and finally the frequency spectrums corresponding to the different lasers are separated, so that the difficulty of realizing frequency spectrum separation by adjusting a light path can be reduced, and phase extraction can be respectively carried out on the frequency spectrums corresponding to the different lasers.
It should be noted that, in the shearing interference optical path, the image sensor may adopt a black and white camera in addition to a color camera, and is not limited specifically here.
If a black-and-white camera is used, during the optical path adjustment process, a plurality of optical path parameters (e.g., spatial carrier amount, etc.) need to be adjusted to ensure complete separation between the frequency spectrums corresponding to the four finally obtained lasers.
Compared with a time phase shift method, the interference phase can be solved only by three speckle patterns, and the interference phase can be solved only by one speckle pattern in a space carrier method, so that the shearing speckle interference light path based on the space carrier can realize synchronous measurement of multi-dimensional strain in the dynamic deformation process of the measured object.
According to the number and the shearing direction of the shearing modules, different multidimensional dependent variables of the measured object can be synchronously determined.
The following describes the process of synchronously determining the multidimensional dependent variable of the measured object according to different shearing modules.
First, the shearing speckle interference optical path includes: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure BDA0001817309410000061
and
Figure BDA0001817309410000062
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
according to three displacement spatial gradients:
Figure BDA0001817309410000063
and
Figure BDA0001817309410000064
synchronous determination of a first principal variable epsilon of an object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Fig. 2 is a schematic diagram of a shearing speckle interference optical path according to an embodiment of the present disclosure.
As shown in fig. 2, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4, the first shearing module with the shearing amount in the x-axis direction, the imaging lens, the image sensor and the measured object.
In the shearing speckle interference optical path shown in fig. 2, the placement of the four lasers can be determined according to actual conditions, and not only a right-angle distribution mode can be adopted, but also a distribution mode with any included angle can be adopted, and no specific limitation is made here.
The following description will be made in detail by taking the layout in which four lasers are distributed at right angles as an example.
Fig. 3 is a schematic diagram of a right-angle distribution of four lasers according to an embodiment of the present application.
As shown in fig. 3, laser 1 and laser 3 lie in the xoz plane, and laser 2 and laser 4 lie in the yoz plane. The included angle between the laser emitted by the laser 1 and the yoz plane is alpha, the included angle between the laser emitted by the laser 3 and the yoz plane is-alpha, the included angle between the laser emitted by the laser 2 and the xoz plane is alpha, and the included angle between the laser emitted by the laser 4 and the xoz plane is-alpha.
It should be noted that the laser 1, the laser 2, the laser 3, and the laser 4 may be interchanged in position according to actual situations, and strain measurement is not affected.
In the sheared speckle interference optical path shown in fig. 2, the dotted line portion is a first shearing module, and the first shearing module includes: a first beam splitter prism, a first plane mirror M1, and a second plane mirror M2.
By adjusting the first plane mirror M1 in the first shearing module, the amount of spatial carrier and the amount of shear in the x-axis direction are introduced.
In the shearing speckle interferometry, when the shearing quantity is on the x axis, the relationship between the phase variation quantity and the displacement space gradient of the measured object is as follows:
Figure BDA0001817309410000071
wherein u, v and w are displacement components of the displacement of the measured object in the directions of the x axis, the y axis and the z axis respectively;
Figure BDA0001817309410000072
respectively the partial derivatives of the displacement components u, v and w in the direction of the x axis; alpha is the included angle between the illumination direction and the yoz plane, beta is the included angle between the illumination direction and the xoz plane, and gamma is the included angle between the illumination direction and the z axis.
Still taking the shearing speckle interference optical path shown in fig. 2 as an example, the laser 1, the laser 2, the laser 3, and the laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light, the second object light, the third object light, and the fourth object light are obtained by reflection of the object to be measured, and then the first object light, the second object light, the third object light, and the fourth object light respectively pass through the imaging lens and the first shearing module with the shearing amount in the x-axis direction, and then form shearing interference on the surface of the image sensor.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then four absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
Figure BDA0001817309410000073
wherein,
Figure BDA0001817309410000081
is the initial phase of the object before deformationA bit value.
Solving an equation to obtain an initial phase value of the measured object before deformation and three displacement space gradients of the measured object on an x axis:
Figure BDA0001817309410000082
wherein, three displacement spatial gradients:
Figure BDA0001817309410000083
and
Figure BDA0001817309410000084
the absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to three displacement spatial gradients:
Figure BDA0001817309410000085
and
Figure BDA0001817309410000086
synchronously determining the first principal dependent variable of the measured object
Figure BDA0001817309410000087
First amount of shear strain
Figure BDA0001817309410000088
And a second amount of shear strain
Figure BDA0001817309410000089
Second, the shearing speckle interference optical path includes: the second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure BDA00018173094100000810
and
Figure BDA00018173094100000811
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
according to three displacement spatial gradients:
Figure BDA00018173094100000812
and
Figure BDA00018173094100000813
synchronous determination of the second principal variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Fig. 4 is a schematic diagram of another shearing speckle interference optical path provided in the embodiment of the present application.
As shown in fig. 4, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4, a second shearing module with the shearing amount in the y-axis direction, an imaging lens, an image sensor and a measured object.
In the shearing speckle interference optical path shown in fig. 4, the placement of the four lasers can be determined according to the actual situation, and may be in a right-angle distribution manner or in an arbitrary included angle distribution manner, which is not specifically limited herein.
The following description will be made in detail by taking the layout of four lasers in a right angle distribution as shown in fig. 3 as an example.
In the shearing speckle interference optical path shown in fig. 4, the second shearing module includes: a second beam splitter prism, a third plane mirror M3 and a fourth plane mirror M4.
By adjusting the third plane mirror M3 in the second shearing module, the amount of space carrier and the shearing amount in the y-axis direction are introduced.
In the shearing speckle interferometry, when the shearing quantity is on the y axis, the relationship between the phase variation quantity and the displacement space gradient of the measured object is as follows:
Figure BDA0001817309410000091
wherein u, v and w are displacement components of the displacement of the measured object in the directions of the x axis, the y axis and the z axis respectively;
Figure BDA0001817309410000092
respectively the partial derivatives of the displacement components u, v and w in the y-axis direction; alpha is the included angle between the illumination direction and the yoz plane, beta is the included angle between the illumination direction and the xoz plane, and gamma is the included angle between the illumination direction and the z axis.
Still taking the shearing speckle interference optical path shown in fig. 4 as an example, the laser 1, the laser 2, the laser 3, and the laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light, the second object light, the third object light, and the fourth object light are obtained by reflection of the object to be measured, and then the first object light, the second object light, the third object light, and the fourth object light form shearing interference on the surface of the image sensor after passing through the imaging lens and the second shearing module with the shearing amount in the y-axis direction, respectively.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then four absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
Figure BDA0001817309410000101
wherein,
Figure BDA0001817309410000102
is the initial phase value of the measured object before deformation.
Solving an equation to obtain an initial phase value of the measured object before deformation and three displacement space gradients of the measured object on the y axis:
Figure BDA0001817309410000103
wherein, three displacement spatial gradients:
Figure BDA0001817309410000104
and
Figure BDA0001817309410000105
the absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to three displacement spatial gradients:
Figure BDA0001817309410000106
and
Figure BDA0001817309410000107
synchronously determining the second principal dependent variable of the measured object
Figure BDA0001817309410000108
Third amount of shear strain
Figure BDA0001817309410000109
And fourth amount of shear strain
Figure BDA00018173094100001010
Third, the shearing speckle interference optical path includes: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure BDA00018173094100001011
and
Figure BDA00018173094100001012
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure BDA0001817309410000111
and
Figure BDA0001817309410000112
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
from six displacement spatial gradients:
Figure BDA0001817309410000113
and
Figure BDA0001817309410000114
synchronous determination of a first principal variable epsilon of an object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Fig. 5 is a schematic diagram of another shearing speckle interference optical path provided in the embodiment of the present application.
As shown in fig. 5, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The device comprises a laser 4, a first polarization beam splitter prism, a second polarization beam splitter prism, a first shearing module with shearing amount in the x-axis direction, a second shearing module with shearing amount in the y-axis direction, an imaging lens, an image sensor and a measured object.
In the shearing speckle interference optical path shown in fig. 5, the placement of the four lasers can be determined according to the actual situation, and may be in a right-angle distribution manner or in an arbitrary included angle distribution manner, which is not specifically limited herein.
The following description will be made in detail by taking the layout of four lasers in a right angle distribution as shown in fig. 3 as an example.
In the shearing speckle interference optical path shown in fig. 5, the first shearing module includes: the first beam splitter prism, the first plane mirror M1 and the second plane mirror M2; the second cutting module comprises: a second beam splitter prism, a third plane mirror M3 and a fourth plane mirror M4.
Introducing the space carrier amount and the shearing amount in the x-axis direction by adjusting a first plane mirror M1 in a first shearing module; by adjusting the third plane mirror M3 in the second shearing module, the amount of space carrier and the shearing amount in the y-axis direction are introduced.
The laser 1, the laser 2, the laser 3 and the laser 4 respectively emit laser to illuminate a measured object, and a first object light, a second object light, a third object light and a fourth object light are obtained by reflection of the measured object; the first object light, the second object light, the third object light and the fourth object light respectively pass through the imaging lens and the first polarization beam splitter prism, the first object light is divided into first p light and first s light, the second object light is divided into second p light and second s light, the third object light is divided into third p light and third s light, and the fourth object light is divided into fourth p light and fourth s light; then the first p light, the second p light, the third p light and the fourth p light form shearing interference on the surface of the image sensor after passing through the first shearing module and the second polarization splitting prism respectively; the first s light, the second s light, the third s light and the fourth s light form shearing interference on the surface of the image sensor after passing through the second shearing module and the second polarization splitting prism respectively.
The first polarization beam splitter prism and the second polarization beam splitter prism enable shearing speckle interference obtained according to the first shearing module and the second shearing module not to mutually interfere.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then eight absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
Figure BDA0001817309410000121
Figure BDA0001817309410000122
solving an equation to obtain an initial phase value of the measured object before deformation, three displacement space gradients of the measured object on an x axis and three displacement space gradients of the measured object on a y axis:
Figure BDA0001817309410000131
Figure BDA0001817309410000132
wherein, six displacement spatial gradients:
Figure BDA0001817309410000133
and
Figure BDA0001817309410000134
the absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to six displacement spatial gradients:
Figure BDA0001817309410000135
Figure BDA0001817309410000136
and
Figure BDA0001817309410000137
synchronously determining the first principal dependent variable of the measured object
Figure BDA0001817309410000138
Second principal dependent variable
Figure BDA0001817309410000139
First amount of shear strain
Figure BDA00018173094100001310
Second amount of shear strain
Figure BDA00018173094100001311
Third amount of shear strain
Figure BDA00018173094100001312
And fourth amount of shear strain
Figure BDA00018173094100001313
According to the technical scheme recorded in the embodiment of the application, a shearing speckle interference light path based on a space carrier is built, wherein the shearing speckle interference light path comprises four lasers with different wavelengths; according to the shearing speckle interference optical path, synchronously determining a plurality of absolute phase values of the measured object after deformation, so that a plurality of displacement space gradients of the measured object are synchronously determined according to the plurality of absolute phase values; and then according to a plurality of displacement space gradients, the multidimensional dependent variable of the measured object is synchronously determined, so that the dependent variable obtained according to the absolute phase can truly reflect the strain condition of the object.
Fig. 6 is a schematic structural diagram of a strain measurement apparatus based on absolute phase according to an embodiment of the present disclosure. The apparatus shown in fig. 6 comprises:
the building module 601 is used for building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths;
the first determining module 602 is configured to synchronously determine a plurality of absolute phase values of the deformed measured object according to the sheared speckle interference optical path;
the first determining module 602 is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
the second determining module 603 is configured to synchronously determine the multidimensional strain of the measured object according to the plurality of displacement spatial gradients.
Optionally, the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein, at least one shear module is used for introducing shear quantity and introducing space carrier quantity.
Optionally, the shearing speckle interference optical path comprises: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;
the first determining module 602 is specifically configured to:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure BDA0001817309410000141
and
Figure BDA0001817309410000142
the second determining module 603 is specifically configured to:
according to three displacement spatial gradients:
Figure BDA0001817309410000143
and
Figure BDA0001817309410000144
synchronous determination of a first principal variable epsilon of an object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Optionally, the shearing speckle interference optical path comprises: the second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
the first determining module 602 is specifically configured to:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure BDA0001817309410000151
and
Figure BDA0001817309410000152
optionally, the second determining module 603 is specifically configured to:
according to three displacement spatial gradients:
Figure BDA0001817309410000153
and
Figure BDA0001817309410000154
synchronous determination of the second principal variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Optionally, the shearing speckle interference optical path comprises: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
the first determining module 602 further includes:
the first determining unit is used for synchronously determining three displacement space gradients of the displacement of the measured object in the x-axis direction according to the first shearing module:
Figure BDA0001817309410000155
and
Figure BDA0001817309410000156
the second determining unit is used for synchronously determining three displacement space gradients of the displacement of the measured object in the y-axis direction according to the second shearing module:
Figure BDA0001817309410000157
and
Figure BDA0001817309410000158
optionally, the second determining module 603 is specifically configured to:
from six displacement spatial gradients:
Figure BDA0001817309410000159
and
Figure BDA00018173094100001510
synchronization systemDetermining a first principal dependent variable ε of the object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
According to the strain measurement device based on the absolute phase, the building module is used for building a shearing speckle interference optical path based on the space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths; the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference light path; the first determination module is further used for synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values; the second determination module is used for synchronously determining the multidimensional strain of the measured object according to the plurality of displacement space gradients, so that the strain obtained according to the absolute phase can truly reflect the strain condition of the object.
In the 90 s of the 20 th century, improvements in a technology could clearly distinguish between improvements in hardware (e.g., improvements in circuit structures such as diodes, transistors, switches, etc.) and improvements in software (improvements in process flow). However, as technology advances, many of today's process flow improvements have been seen as direct improvements in hardware circuit architecture. Designers almost always obtain the corresponding hardware circuit structure by programming an improved method flow into the hardware circuit. Thus, it cannot be said that an improvement in the process flow cannot be realized by hardware physical modules. For example, a Programmable Logic Device (PLD), such as a Field Programmable Gate Array (FPGA), is an integrated circuit whose Logic functions are determined by programming the Device by a user. A digital system is "integrated" on a PLD by the designer's own programming without requiring the chip manufacturer to design and fabricate application-specific integrated circuit chips. Furthermore, nowadays, instead of manually making an Integrated Circuit chip, such Programming is often implemented by "logic compiler" software, which is similar to a software compiler used in program development and writing, but the original code before compiling is also written by a specific Programming Language, which is called Hardware Description Language (HDL), and HDL is not only one but many, such as abel (advanced Boolean Expression Language), ahdl (alternate Hardware Description Language), traffic, pl (core universal Programming Language), HDCal (jhdware Description Language), lang, Lola, HDL, laspam, hardward Description Language (vhr Description Language), vhal (Hardware Description Language), and vhigh-Language, which are currently used in most common. It will also be apparent to those skilled in the art that hardware circuitry that implements the logical method flows can be readily obtained by merely slightly programming the method flows into an integrated circuit using the hardware description languages described above.
The controller may be implemented in any suitable manner, for example, the controller may take the form of, for example, a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro) processor, logic gates, switches, an Application Specific Integrated Circuit (ASIC), a programmable logic controller, and an embedded microcontroller, examples of which include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicone Labs C8051F320, the memory controller may also be implemented as part of the control logic for the memory. Those skilled in the art will also appreciate that, in addition to implementing the controller as pure computer readable program code, the same functionality can be implemented by logically programming method steps such that the controller is in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers and the like. Such a controller may thus be considered a hardware component, and the means included therein for performing the various functions may also be considered as a structure within the hardware component. Or even means for performing the functions may be regarded as being both a software module for performing the method and a structure within a hardware component.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functionality of the units may be implemented in one or more software and/or hardware when implementing the present application.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The application may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The application may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims (10)

1. A method of strain measurement based on absolute phase, comprising:
building a shearing speckle interference optical path based on a spatial carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths, at least one shearing module, an imaging lens and an image sensor;
synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values;
synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients;
wherein, according to cut speckle interference light path, confirm a plurality of absolute phase values after the measured object warp in step, include:
wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4 respectively emits laser to illuminate a measured object, first object light, second object light, third object light and fourth object light are obtained through reflection of the measured object, the first object light, the second object light, the third object light and the fourth object light form shearing interference on the surface of the image sensor after passing through the imaging lens and the at least one shearing module respectively, and a plurality of absolute phase values of the measured object after deformation are obtained according to a shearing speckle interference pattern acquired by the image sensor; wherein, adopt the mode overall arrangement that the right angle distributes between four lasers, at least one shearing module includes: the first cutting module, the second cutting module, or both the first cutting module and the second cutting module; the obtained plurality of absolute phase values of the deformed measured object are as follows:
Figure FDA0002640228740000011
and/or the presence of a gas in the gas,
Figure FDA0002640228740000021
wherein,
Figure FDA0002640228740000022
the initial phase value of the measured object before deformation, and u, v and w are displacement components of the measured object in the directions of the x axis, the y axis and the z axis respectively;
Figure FDA0002640228740000023
and
Figure FDA0002640228740000024
respectively the partial derivatives of the displacement components u, v and w in the direction of the x axis;
Figure FDA0002640228740000025
and
Figure FDA0002640228740000026
respectively the partial derivatives of the displacement components u, v and w in the y-axis direction; alpha is the angle between the illumination direction and the yoz plane.
2. The method of claim 1, wherein the at least one shear module is configured to introduce a shear amount and to introduce a spatial carrier amount.
3. The method of claim 2, wherein shearing the speckle interference optical path comprises: a first shear module, wherein the shear volume of the first shear module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure FDA0002640228740000027
and
Figure FDA0002640228740000028
4. the method of claim 3, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
according to the three displacement spatial gradients:
Figure FDA0002640228740000029
and
Figure FDA00026402287400000210
synchronously determining a first principal dependent variable epsilon of the object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
5. The method of claim 2, wherein shearing the speckle interference optical path comprises: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure FDA0002640228740000031
and
Figure FDA0002640228740000032
6. the method of claim 5, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
according to the three displacement spatial gradients:
Figure FDA0002640228740000033
and
Figure FDA0002640228740000034
synchronously determining a second principal dependent variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
7. The method of claim 2, wherein shearing the speckle interference optical path comprises: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
according to the shearing speckle interference light path, synchronously determining a plurality of displacement space gradients of the measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:
Figure FDA0002640228740000035
and
Figure FDA0002640228740000036
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:
Figure FDA0002640228740000037
and
Figure FDA0002640228740000038
8. the method of claim 7, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
from six displacement spatial gradients:
Figure FDA0002640228740000039
and
Figure FDA00026402287400000310
synchronously determining a first principal dependent variable epsilon of the object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
9. An absolute phase based strain gauge comprising:
the device comprises a building module, a processing module and a control module, wherein the building module is used for building a shearing speckle interference light path based on a space carrier, and the shearing speckle interference light path comprises four lasers with different wavelengths, at least one shearing module, an imaging lens and an image sensor;
the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
the first determining module is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
the second determination module is used for synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients;
wherein the first determining module is specifically configured to: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4 respectively emits laser to illuminate a measured object, first object light, second object light, third object light and fourth object light are obtained through reflection of the measured object, the first object light, the second object light, the third object light and the fourth object light form shearing interference on the surface of the image sensor after passing through the imaging lens and the at least one shearing module respectively, and a plurality of absolute phase values of the measured object after deformation are obtained according to a shearing speckle interference pattern acquired by the image sensor; wherein, adopt the mode overall arrangement that the right angle distributes between four lasers, at least one shearing module includes: first shearing module, or second shearingA cutting module, or a first cutting module and a second cutting module; the obtained plurality of absolute phase values of the deformed measured object are as follows:
Figure FDA0002640228740000051
and/or the presence of a gas in the gas,
Figure FDA0002640228740000052
wherein,
Figure FDA0002640228740000053
the initial phase value of the measured object before deformation, and u, v and w are displacement components of the measured object in the directions of the x axis, the y axis and the z axis respectively;
Figure FDA0002640228740000054
and
Figure FDA0002640228740000055
respectively the partial derivatives of the displacement components u, v and w in the direction of the x axis;
Figure FDA0002640228740000056
and
Figure FDA0002640228740000057
respectively the partial derivatives of the displacement components u, v and w in the y-axis direction; alpha is the angle between the illumination direction and the yoz plane.
10. The apparatus of claim 9, wherein the at least one shear module is configured to introduce a shear amount and to introduce a spatial carrier amount.
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