CN109342840A - Common mode test fixture and common mode test method with stitch contact detection function - Google Patents

Common mode test fixture and common mode test method with stitch contact detection function Download PDF

Info

Publication number
CN109342840A
CN109342840A CN201811368046.3A CN201811368046A CN109342840A CN 109342840 A CN109342840 A CN 109342840A CN 201811368046 A CN201811368046 A CN 201811368046A CN 109342840 A CN109342840 A CN 109342840A
Authority
CN
China
Prior art keywords
common mode
test
mode test
interface
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811368046.3A
Other languages
Chinese (zh)
Inventor
邓庆传
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DONGGUAN BO EXHIBITION MACHINERY TECHNOLOGY Co Ltd
Original Assignee
DONGGUAN BO EXHIBITION MACHINERY TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DONGGUAN BO EXHIBITION MACHINERY TECHNOLOGY Co Ltd filed Critical DONGGUAN BO EXHIBITION MACHINERY TECHNOLOGY Co Ltd
Priority to CN201811368046.3A priority Critical patent/CN109342840A/en
Publication of CN109342840A publication Critical patent/CN109342840A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26Measuring noise figure; Measuring signal-to-noise ratio
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The present invention relates to testing equipment fields, more particularly to the common mode test fixture with stitch contact detection function, including shell, it is arranged in the intracorporal circuit board of shell, it is connected at least four signaling interfaces of circuit board and is mounted on the test position fix plate of circuit board, the shell side is additionally provided with a system control interface, at least three test probes are additionally provided on the circuit board, a relay is connected with below the circuit board, cover lid is provided with outside the shell, the test method is by loading input voltage and working frequency to tested product simulation, test product primary and secondary coupled interference noise, in the form of numerical value precisely display and automatically according to setting differentiate it is qualified with it is unqualified.The present invention provides a kind of high common mode test fixture with stitch contact detection function of detection accuracy and the common mode test method for effectively reducing erroneous judgement, not influencing production efficiency.

Description

Common mode test fixture and common mode test method with stitch contact detection function
Technical field
The present invention relates to testing equipment field, more particularly to the common mode test fixture with stitch contact detection function and Common mode test method.
Background technique
For the common-mode noise of high frequency transformer, it seriously affects the use of mobile phone and tablet computer, and existing common mode is surveyed The method of examination is the signal by directly loading specific frequency, waveform in tested primary, then uses dual channel oscilloscope The voltage amplitude of secondary induction is detected as judgment basis.
A kind of high frequency transformer common-mode noise test method is disclosed in documents (CN201610458721), specifically It is: transformer is individually splitted out, the size of the common-mode noise of high frequency transformer is judged by common-mode noise test circuit, The square-wave generator and transformer and the transformer is believed that the test circuit is made of the main circuit of NEC555 and external circuit Number driving and detection circuit composition, the problem of this method maximum is: when stitch and the tester probe appearance of tested transformer When poor contact, test device cannot be identified and judgeed effectively, it is easy to cause defective products fail to judge erroneous judgement, non-defective unit misjudgement etc. Problem is badly in need of a kind of high-precision method now to test the noise, while to engineering staff with practical advice.
Summary of the invention
In order to solve the above technical problems, the present invention provides a kind of detection accuracy the high common mode with stitch contact detection function Test fixture and the common mode test method for effectively reducing erroneous judgement, not influencing production efficiency.
The present invention adopts the following technical scheme:
With stitch contact detection function common mode test fixture, including shell, be arranged in the intracorporal circuit board of shell, be connected to At least four signaling interfaces of circuit board and the test position fix plate for being mounted on circuit board, the shell side are additionally provided with One system control interface is additionally provided at least three test probes on the circuit board, is connected with one below the circuit board Relay, the shell are provided with cover lid outside.
Further improvement to above-mentioned technical proposal is that four signaling interfaces are set as input interface, armature winding Interface, secondary windings interface, feedback winding interface.
Further improvement to above-mentioned technical proposal is that the circuit board is connected to by least four first support copper posts Bottom in the shell.
Further improvement to above-mentioned technical proposal is that the test position fix plate is connected by least four second support copper posts It is connected to the circuit board.
Further improvement to above-mentioned technical proposal is that at least three are offered on the test position fix plate for the survey Try the probe aperture of probe face.
Further improvement to above-mentioned technical proposal is that cover lid center is provided with one for testing probe and test The aperture of positioning plate connection.
A kind of common mode test method, includes the following steps
(1) setup test device and system: the system including transformer to be measured, signal generator, common mode test host connects Connect end, first passage, second channel and third channel, common mode test fixture, wherein common mode test fixture be equipped with input interface, Armature winding interface, secondary windings interface, feedback winding interface, system control interface.
(2) wiring:
A) input interface of common mode test fixture connects with the output end of signal generator;
B) the armature winding interface of common mode test fixture connects with the first passage of common mode test host, for monitoring test When signal generator output it is whether abnormal;
C) the secondary windings interface of common mode test fixture connects with the second channel of common mode test host, by test result number It is shown according to quantization, common mode tests host by the maximum value and minimum value in reading waveform each period, then calculates average value, obtains To stable numerical value;
D) the feedback winding interface of common mode test fixture connects with the third channel of common mode test host, before official testing System first detects feedback winding coupled voltages whether in the range of setting;
E) the system connecting pin of common mode test host is connected with the system control interface of common mode test fixture.
(3) when test starts:
A) the test probe being connected to the stitch of transformer to be measured in common mode test fixture;
B) common mode test host receives from third channel and detects feedback winding coupled voltages whether in the range of setting, Illustrate that primary or feedback winding stitch has poor contact when coupled voltages are not in setting range;
C) common mode test host is monitored the signal of the output of signal generator, whether judges signal generator output It is abnormal;
D) common mode tests host and issues the second channel of signal for the waveform of test result from secondary windings interface is received It is converted into digital display, personnel convenient to use explicitly define desired parameter area;
(4) data are analyzed: by loading input voltage and working frequency to tested product simulation, at the beginning of test product Grade and secondary coupled interference noise, in the form of numerical value precisely display and automatically according to setting differentiate qualification with it is unqualified and have Auditory tone cues output.
Beneficial effects of the present invention:
1, at least four signaling interfaces that the present invention includes shell, the intracorporal circuit board of shell is arranged in, is connected to circuit board And it is mounted on the test position fix plate of circuit board, shell side is additionally provided with a system control interface, also sets on circuit board At least three test probes are equipped with, reasonable integral structure is simple, small volume, and it is easy to detect, one is connected with below circuit board Relay, can be used for detecting secondary windings whether poor contact, by the input signal ground terminal of tested primary be added after The on-off logic of electric appliance, this relay is controlled by test macro, secondary according to transformer when signal input grounding end is opened a way The feature that will appear significantly induced voltage, system control is first passed through before official testing disconnects relay, is at this moment Whether system detection secondary occurs significantly that induced voltage judges whether stitch and tester probe normally contact connection circuit, by It in whole process is controlled by system, judges that the time is less than 100ms, production efficiency will not be impacted, and effectively improve Detection accuracy is provided with cover lid outside shell, practical convenient for protection internal circuit board and wiring.
2, four signaling interfaces are set as input interface, armature winding interface, secondary windings interface, feedback winding interface, Convenient for signaling interface and common mode test host connects, artificial reading judgement is substituted by system, reduction defective products fail to judge erroneous judgement, The problems such as non-defective unit is misjudged, effectively improves detection accuracy.
3, circuit board is connected to bottom in shell by least four first support copper posts, stably and firmly pacifies circuit board In shell, prevents circuit board from causing testing result inaccurate because of unstable installation, further increase detection accuracy, improve Detection efficiency.
4, test position fix plate is connected to circuit board by least four second support copper posts, stably and firmly will test Positioning plate is mounted on circuit board, prevents test position fix plate from causing testing result inaccurate because of unstable installation, further Detection accuracy is improved, detection efficiency is improved.
5, at least three are offered on test position fix plate for testing the probe aperture of probe face, are convenient for transformer to be measured Stitch connect with probe, guarantee detection process operate normally, effectively avoid influence detection efficiency.
6, cover lid center is provided with one for testing the aperture that probe is connect with test position fix plate, convenient for that will test probe It stretches out, is connect with transformer to be measured, simplify detecting step, while testing probe to be stably connected with test position fix plate.
7, a kind of common mode test method is surveyed by loading input voltage and working frequency to tested product simulation The coupled interference noise of trial product primary and secondary is precisely shown in the form of numerical value and automatically according to setting differentiation qualification and not It is qualified simultaneously to have auditory tone cues output, in order to which tester more intuitively judges and foolproof function, effectively reduce artificial The erroneous judgement problem of reading improves detection efficiency.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of test fixture of the present invention;
Fig. 2 is the structural schematic diagram that test fixture of the present invention removes cover lid;
Fig. 3 is the wiring diagram of common mode test method of the invention;
Fig. 4 is the schematic diagram of common mode test method of the invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description.
As shown in Figs. 1-2, the common mode test fixture of stitch contact detection function, including shell 110, setting are in shell 110 Interior circuit board 120, the survey for being connected at least four signaling interfaces 130 of circuit board 120 and being mounted on 120 top of circuit board Positioning plate 140 is tried, 110 side of shell is additionally provided with a system control interface 150, is additionally provided on the circuit board 120 At least three test probes 121, and a relay 160 is connected with below the circuit board 120, is provided with outside the shell 110 Cover lid 170.
Four signaling interfaces 130 are set as input interface 131, armature winding interface 132, secondary windings interface 133, feedback Around group interface 134, convenient for signaling interface 130 to be connect with common mode test host, artificial reading judgement is substituted by system, is reduced Defective products fail to judge erroneous judgement, non-defective unit misjudgement the problems such as, effectively improve detection accuracy.
Circuit board 120 is connected to bottom in shell 110 by least four first support copper posts 122, stably and firmly will Circuit board 120 is mounted in shell 110, prevents circuit board 120 from causing testing result inaccurate because of unstable installation, further Detection accuracy is improved, detection efficiency is improved.
Test position fix plate 140 is connected to 120 top of circuit board by least four second support copper posts 141, stable and firm Test position fix plate 140 is mounted on 120 top of circuit board by ground, prevents test position fix plate 140 from causing to detect because of unstable installation As a result inaccurate, detection accuracy is further increased, detection efficiency is improved.
At least three are offered on test position fix plate 140 for testing the probe apertures 142 of the work of probe 121, convenient for will be to The stitch for surveying transformer is connect with test probe 121, guarantees that detection process operates normally, and effectively avoids influencing detection efficiency.
170 center of cover lid is provided with one for testing the aperture 171 that probe 121 is connect with test position fix plate 140, is convenient for Test probe 121 is stretched out, is connect with transformer to be measured, simplifies detecting step, while testing probe 121 can also be fixed with test Position plate 140 is stably connected with.
As shown in Figure 3-4, a kind of common mode test method, includes the following steps
(1) setup test device and system: the system including transformer to be measured, signal generator, common mode test host connects Connect end, first passage, second channel and third channel, common mode test fixture, wherein common mode test fixture be equipped with input interface, Armature winding interface, secondary windings interface, feedback winding interface, system control interface.
(2) wiring:
A) input interface of common mode test fixture connects with the output end of signal generator;
B) the armature winding interface of common mode test fixture connects with the first passage of common mode test host, for monitoring test When signal generator output it is whether abnormal;
C) the secondary windings interface of common mode test fixture connects with the second channel of common mode test host, by test result number It is shown according to quantization, common mode tests host by the maximum value and minimum value in reading waveform each period, then calculates average value, obtains To stable numerical value;
D) the feedback winding interface of common mode test fixture connects with the third channel of common mode test host, before official testing System first detects feedback winding coupled voltages whether in the range of setting;
E) the system connecting pin of common mode test host is connected with the system control interface of common mode test fixture.
(3) when test starts:
A) the test probe being connected to the stitch of transformer to be measured in common mode test fixture;
B) common mode test host receives from third channel and detects feedback winding coupled voltages whether in the range of setting, Illustrate that primary or feedback winding stitch has poor contact when coupled voltages are not in setting range;
C) common mode test host is monitored the signal of the output of signal generator, whether judges signal generator output It is abnormal;
D) common mode tests host and issues the second channel of signal for the waveform of test result from secondary windings interface is received It is converted into digital display, personnel convenient to use explicitly define desired parameter area;
(4) data are analyzed: by loading input voltage and working frequency to tested product simulation, at the beginning of test product Grade and secondary coupled interference noise, in the form of numerical value precisely display and automatically according to setting differentiate qualification with it is unqualified and have Auditory tone cues output.
As shown in Figs. 1-2, the present invention includes shell 110, the circuit board being arranged in shell 110 120, is connected to circuit board 120 at least four signaling interfaces 130 and the test position fix plate 140 for being mounted on 120 top of circuit board, 110 side of shell is also It is provided with a system control interface 150, at least three test probes 121, reasonable integral structure letter are additionally provided on circuit board 120 Single, small volume is easy to detect, and a relay 160 is connected with below circuit board 120, can be used for whether detecting secondary windings Relay 160, the on-off logic of this relay 160 is added in the input signal ground terminal of tested primary by poor contact It is controlled by test macro, according to transformer when signal input grounding end is opened a way, secondary will appear significantly induced voltage Feature, system control is first passed through before official testing disconnects relay 160, and at this moment whether system detection secondary occurs greatly The induced voltage of amplitude judges whether stitch and tester probe normally contact connection circuit, since whole process is to pass through system Control judges that the time is less than 100ms, will not impact to production efficiency, and effectively increase detection accuracy, outside shell 110 It is provided with cover lid 170, it is practical convenient for protection internal circuit board 120 and wiring.
The principle of the present invention are as follows:
By loading input voltage and working frequency, test product primary and secondary coupling to tested product simulation Close interference noise, in the form of numerical value precisely display and automatically according to setting differentiate it is qualified with it is unqualified and have auditory tone cues defeated Out, in order to which tester more intuitively judges and foolproof function, the erroneous judgement problem manually read is effectively reduced, is improved Detection efficiency.
Only several embodiments of the present invention are expressed for above-described embodiment, and the description thereof is more specific and detailed, but can not Therefore limitations on the scope of the patent of the present invention are interpreted as.It should be pointed out that for those of ordinary skill in the art, Without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection model of the invention It encloses.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.

Claims (7)

1. the common mode test fixture with stitch contact detection function, it is characterised in that: including shell, be arranged in the intracorporal circuit of shell Plate, at least four signaling interfaces for being connected to circuit board and the test position fix plate for being mounted on circuit board, the shell one Side is additionally provided with a system control interface, and at least three test probes, the circuit board lower section are additionally provided on the circuit board It is connected with a relay.
2. the common mode test fixture according to claim 1 with stitch contact detection function, it is characterised in that: described in four Signaling interface is set as input interface, armature winding interface, secondary windings interface, feedback winding interface.
3. the common mode test fixture according to claim 1 with stitch contact detection function, it is characterised in that: the circuit Plate is connected to bottom in the shell by least four first support copper posts.
4. the common mode test fixture according to claim 1 with stitch contact detection function, it is characterised in that: the test Positioning plate is connected to the circuit board by least four second support copper posts.
5. the common mode test fixture according to claim 1 with stitch contact detection function, it is characterised in that: the test At least three probe apertures for the test probe face is offered on positioning plate.
6. the common mode test fixture according to claim 1 with stitch contact detection function, it is characterised in that: the shell It is provided with cover lid outside, cover lid center is provided with one for testing the aperture that probe is connect with test position fix plate.
7. a kind of common mode test method, it is characterised in that: include the following steps
(1) setup test device and system: including transformer to be measured, signal generator, common mode test host system connecting pin, First passage, second channel and third channel, common mode test fixture, wherein common mode test fixture is equipped with input interface, primary Around group interface, secondary windings interface, feedback winding interface, system control interface.
(2) wiring:
A) input interface of common mode test fixture connects with the output end of signal generator;
B) the armature winding interface of common mode test fixture connects with the first passage of common mode test host, believes when for monitoring test Whether the output of number generator is abnormal;
C) the secondary windings interface of common mode test fixture connects with the second channel of common mode test host, by test result data amount Change display, common mode tests host by the maximum value and minimum value in reading waveform each period, then calculates average value, obtains steady Fixed numerical value;
D) the feedback winding interface of common mode test fixture connects with the third channel of common mode test host, the system before official testing First whether detection feedback winding coupled voltages are in the range of setting;
E) the system connecting pin of common mode test host is connected with the system control interface of common mode test fixture.
(3) when test starts:
A) the test probe being connected to the stitch of transformer to be measured in common mode test fixture;
B) common mode test host receives from third channel and detects feedback winding coupled voltages whether in the range of setting, works as coupling It closes voltage and does not illustrate that primary or feedback winding stitch has poor contact in setting range;
C) common mode test host is monitored the signal of the output of signal generator, judges whether signal generator output is different Often;
D) common mode tests host and converts the waveform of test result from the second channel for receiving secondary windings interface sending signal It is shown at number, personnel convenient to use explicitly define desired parameter area;
(4) data are analyzed: by loading input voltage and working frequency to tested product simulation, test product primary with The coupled interference noise of secondary is precisely shown in the form of numerical value and differentiates qualified and unqualified automatically according to setting and have sound Prompt output.
CN201811368046.3A 2018-11-16 2018-11-16 Common mode test fixture and common mode test method with stitch contact detection function Pending CN109342840A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811368046.3A CN109342840A (en) 2018-11-16 2018-11-16 Common mode test fixture and common mode test method with stitch contact detection function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811368046.3A CN109342840A (en) 2018-11-16 2018-11-16 Common mode test fixture and common mode test method with stitch contact detection function

Publications (1)

Publication Number Publication Date
CN109342840A true CN109342840A (en) 2019-02-15

Family

ID=65315704

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811368046.3A Pending CN109342840A (en) 2018-11-16 2018-11-16 Common mode test fixture and common mode test method with stitch contact detection function

Country Status (1)

Country Link
CN (1) CN109342840A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110133469A (en) * 2019-05-31 2019-08-16 德淮半导体有限公司 Semiconductor testing apparatus and its working method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200611226A (en) * 2004-09-30 2006-04-01 De&T Co Ltd Contact error testing apparatus and method for tcp output pin of flat panel display, and error testing system for flat panel display
CN104133174A (en) * 2014-08-15 2014-11-05 成都理工大学 FPGA development board test method based on SignaltapII
CN105334450A (en) * 2015-11-30 2016-02-17 英业达科技有限公司 Signal detection device and method
CN106059582A (en) * 2016-04-28 2016-10-26 芯海科技(深圳)股份有限公司 System and method for testing digital-analog mixed signal chip
CN106154064A (en) * 2016-06-22 2016-11-23 武汉理工大学 A kind of high frequency transformer common-mode noise method of testing
CN107677897A (en) * 2017-08-14 2018-02-09 东莞市嘉龙海杰电子科技有限公司 A kind of high frequency transformer common-mode noise and conduct radiation method of testing
CN207742289U (en) * 2017-12-28 2018-08-17 罗定市嘉裕电子有限公司 A kind of transformer high-voltage measurement jig
CN209372981U (en) * 2018-11-16 2019-09-10 东莞市博展机械科技有限公司 Common mode test fixture with stitch contact detection function

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200611226A (en) * 2004-09-30 2006-04-01 De&T Co Ltd Contact error testing apparatus and method for tcp output pin of flat panel display, and error testing system for flat panel display
CN104133174A (en) * 2014-08-15 2014-11-05 成都理工大学 FPGA development board test method based on SignaltapII
CN105334450A (en) * 2015-11-30 2016-02-17 英业达科技有限公司 Signal detection device and method
CN106059582A (en) * 2016-04-28 2016-10-26 芯海科技(深圳)股份有限公司 System and method for testing digital-analog mixed signal chip
CN106154064A (en) * 2016-06-22 2016-11-23 武汉理工大学 A kind of high frequency transformer common-mode noise method of testing
CN107677897A (en) * 2017-08-14 2018-02-09 东莞市嘉龙海杰电子科技有限公司 A kind of high frequency transformer common-mode noise and conduct radiation method of testing
CN207742289U (en) * 2017-12-28 2018-08-17 罗定市嘉裕电子有限公司 A kind of transformer high-voltage measurement jig
CN209372981U (en) * 2018-11-16 2019-09-10 东莞市博展机械科技有限公司 Common mode test fixture with stitch contact detection function

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
佚名: "独家发售博展机械专利产品:高频变压器共模噪声测试***", 百度, pages 1 - 5 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110133469A (en) * 2019-05-31 2019-08-16 德淮半导体有限公司 Semiconductor testing apparatus and its working method

Similar Documents

Publication Publication Date Title
CN103985299B (en) A kind of cable fault simulation and fault location system
CN101782622A (en) Partial discharge on-line monitoring device of power cable and joint
CN103954890A (en) DC partial discharge detection device and method for converter transformer
CN105911499A (en) Ultrasonically local discharging metering system under onsite environment and method
CN201600803U (en) Fault location device for cable fault simulation system
CN103076560B (en) Electrical test equipment non-contact measurement combination unit and application thereof
CN105137258A (en) Intelligent early-warning control device for high-voltage test grounding
CN209372981U (en) Common mode test fixture with stitch contact detection function
CN109342840A (en) Common mode test fixture and common mode test method with stitch contact detection function
CN208433982U (en) A kind of 1553B bus network test macro
CN113433453A (en) Generator rotor turn-to-turn short circuit diagnosis method based on RSO method
CN107121657A (en) A kind of integrated live testing apparatus for local discharge check system and method
CN109459623A (en) High frequency transformer common-mode noise digital detecting system
CN103985297B (en) A kind of cable fault simulation and alignment system
CN206161829U (en) Capacitance type potential transformer's status monitoring device and system
CN109001578A (en) A kind of test device and method detecting CELL panel signal generator
CN206132970U (en) Ultrasonic wave partial discharge measurement system under site environment
CN205450243U (en) Fault indicator coil tester
CN209182427U (en) A kind of cable fault light beam synchronous locating device
CN212321760U (en) Distribution network fault location instrument
CN103985298B (en) A kind of cable fault simulation, alignment system
CN206863197U (en) A kind of verifying attachment of the extra-high video sensor based on GHz transverse electro-magnetic wave signal
CN219915766U (en) Pulse current monitoring system
CN106526303B (en) A kind of the C-V characteristic test device and method of solid decoupling device
CN205333788U (en) Insulator running state monitoring devices

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination