CN109218718B - Automatic focusing debugging method, device, equipment and storage medium - Google Patents
Automatic focusing debugging method, device, equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the invention discloses an automatic focusing debugging method, an automatic focusing debugging device, automatic focusing debugging equipment and a storage medium, wherein the method comprises the following steps: obtaining an average position corresponding to a definition peak point of a sample product; determining a target test distance of a target product according to the average position and the standard value of the process capability index; and debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product. According to the embodiment of the invention, the specification range of the product meeting the quality standard is determined through the process capability index standard value related to the product quality in the production process, and the specification range is taken as the test distance of the product, so that the rapid and accurate positioning is realized, the time for automatically focusing and debugging the product is shortened, and the debugging efficiency is improved.
Description
Technical Field
The embodiment of the invention relates to the technical field of optics, in particular to an automatic focusing debugging method, device, equipment and storage medium.
Background
With the wide application of the photographing function of smart devices such as mobile phones, tablet computers, smart watches and the like, in order to meet market requirements, different functions of the camera module need to be tested, such as automatic focusing detection.
The automatic focusing is a technology for automatically focusing a shot object and acquiring a clear image through an electronic device, a mechanical device and an image processing means. The camera module makes the data within the specification required by the customer through automatic focusing detection and debugging, so that the mobile phone camera module drives the lens by rapidly pushing a Voice Coil Motor (VCM) to find the position of the corresponding lens when the image is clearest when focusing at different distances. However, the existing automatic focusing test time is long, and the production efficiency is influenced.
Disclosure of Invention
The embodiment of the invention provides an automatic focusing debugging method, device, equipment and storage medium, aiming at solving the problem of long debugging time in the prior art.
In a first aspect, an embodiment of the present invention provides an auto-focus debugging method, including:
obtaining an average position corresponding to a definition peak point of a sample product;
determining a target test distance of a target product according to the average position and the standard value of the process capability index;
and debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product.
In a second aspect, an embodiment of the present invention further provides an auto-focus adjusting apparatus, where the apparatus includes:
the averaging module is used for acquiring an average position corresponding to a definition peak point of a sample product;
the distance module is used for determining the target test distance of the target product according to the average position and the standard value of the process capability index;
and the debugging module is used for debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product.
In a third aspect, an embodiment of the present invention further provides an apparatus, where the apparatus includes:
one or more processors;
storage means for storing one or more programs;
when executed by the one or more processors, cause the one or more processors to implement an auto-focus debugging method as described above.
In a fourth aspect, the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the auto-focus debugging method as described above.
According to the embodiment of the invention, the average position corresponding to the definition peak point of the sample product is obtained, the target test distance of the target product is determined according to the average position and the standard value of the process capability index, and the target product is debugged based on the target test distance to obtain the position corresponding to the definition peak point of the target product. According to the embodiment of the invention, the specification range of the product meeting the quality standard is determined through the process capability index standard value related to the product quality in the production process, and the specification range is used as the test distance of the product, so that the test distance is omitted outside the specification upper and lower limit ranges compared with the complete test distance in the prior art, the rapid and accurate positioning is realized, the time for automatic focusing and debugging of the product is shortened, and the debugging efficiency is improved.
Drawings
FIG. 1 is a flowchart illustrating an auto-focus adjusting method according to a first embodiment of the present invention;
FIG. 2 is a flowchart illustrating an auto-focus adjusting method according to a second embodiment of the present invention;
FIG. 3 is a schematic diagram of fitting a coarse resolution curve according to a second embodiment of the present invention;
FIG. 4 is a diagram illustrating fine-tuning sharpness curve fitting according to a second embodiment of the present invention;
fig. 5 is a schematic structural diagram of an auto-focus adjustment apparatus according to a third embodiment of the present invention;
fig. 6 is a schematic structural diagram of an apparatus according to a fourth embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a flowchart of an auto-focus debugging method according to a first embodiment of the present invention, where the present embodiment is applicable to a case of implementing auto-focus debugging, the method may be executed by an auto-focus debugging apparatus, and the apparatus may be implemented in software and/or hardware, for example, the apparatus may be configured in a device. In this embodiment, the automatic focus adjustment of the camera module is taken as an example for explanation. The method specifically comprises the following steps:
and S110, obtaining the average position corresponding to the definition peak point of the sample product.
The sample product may be a product that needs to be automatically focused, and the specific type is not limited in this embodiment, and may be, for example, a camera module. The specific number of sample products is not limited, but in this embodiment may be at least 2000, with more being preferred. The sharpness peak point is the highest sharpness of an image obtained by using the sample product, and the sharpness may be represented by a Modulation Transfer Function (MTF) or a Spatial Frequency Response (SFR), which is exemplified by SFR in this embodiment.
The camera module comprises at least one lens and a Voice Coil Motor, the lens can be driven by pushing the Voice Coil Motor to realize focusing, the Voice Coil Motor (Voice Coil Motor) is a device for converting electric energy into mechanical energy, a control module in the camera module can send a Digital signal to a Digital-to-Analog converter (DAC), the DAC can output a corresponding Analog signal to the Voice Coil Motor, and the Analog signal can be current applied to the Voice Coil Motor so as to push the Voice Coil Motor to realize adjustment of the position of the lens. Since the position of the lens in the camera module can be converted by the DAC into the current value required to drive the voice coil motor, the position of the lens in this embodiment can be the DAC value. The average position is the average value of the DAC values corresponding to the sharpness peak points of each sample product.
Optionally, obtaining an average position corresponding to a sharpness peak point of the sample product includes: debugging each sample product based on the complete testing distance of the sample product to obtain the corresponding position of the definition peak point of each sample product, and calculating according to the corresponding position of the definition peak point of each sample product to obtain the average position. Where the full test distance is the range of movement of the lens in the camera module, i.e. the full range corresponding to the DAC value, the DAC in this example employs a 10-bit converter, i.e. 210Corresponding to the range "0-1023", but not limited by the above examples. Specifically, a debugging method in the prior art may be adopted to debug each sample product to obtain a DAC value corresponding to a definition peak point of each sample product, and the average position is obtained by dividing the sum of the DAC values corresponding to the definition peak points of each sample product by the number of sample products.
And S120, determining the target test distance of the target product according to the average position and the standard value of the process capability index.
Wherein, the Process capability index (CPK) is the degree of Process capability meeting the product quality standard requirements (specification range, etc.), the larger the value of the Process capability index is, the smaller the tolerance range of the product dispersion degree relative to the technical standard is, and the reject ratio which does not meet the specification is above the required level when the value of the Process capability index is larger than 1.33. In this embodiment, the standard value of the process capability index is any one of values between 1.33 and 1.5, and the specific value may be set according to an actual situation, for example, if the capability of the current production line is high, the standard value of the process capability index may be 1.5, and if the capability of the current production line is low, the standard value of the process capability index may be 1.33.
Optionally, determining a target test distance for the target product based on the average position and the standard value of the process capability index comprises: determining an upper limit value and a lower limit value of the target test distance according to the following formula:
CPK＝MIN((X-LSL/3σ)，(USL-X/3σ))，
wherein CPK is a process capability index, X is an average position corresponding to a sharpness peak point of the sample product, lsl (lower Specification limit) is a lower limit value of the target test distance, usl (upper Specification limit) is an upper limit value of the target test distance, and σ is a standard deviation value of the sample product. MIN in the above equation represents CPK equal to the minimum between X-LSL/3 σ and USL-X/3 σ. The target test distance is a fraction of the complete test distance, specifically a range between an upper limit value and a lower limit value.
In this embodiment, X-LSL/3 σ is equal to USL-X/3 σ to determine the upper limit value and the lower limit value of the target test distance, and at this time, the CPK takes the value CPK-X-LSL/3 σ -USL-X/3 σ. Calculating the standard deviation value sigma of the sample product according to the DAC value corresponding to the definition peak point of each sample product and the average value of the DAC value through a standard deviation formula, wherein the standard deviation formula can be
Wherein XiAnd the DAC value corresponding to the definition peak point of the ith sample product is represented, X represents the average value of the DAC value, and N represents the number of sample products. Substituting the average value X of the DAC value, the standard deviation value sigma and the CPK into a formula of CPK-X-LSL/3 sigma-USL-X/3 sigma to obtain a specification lower limit value LSL and a specification upper limit value USL, setting the specification lower limit value LSL as a lower limit value of the target test distance, and setting the specification upper limit value USL as an upper limit value of the target test distance. It is understood that the upper and lower limits of the target test distance may also be calculated by the above formula by making X-LSL/3 sigma unequal to USL-X/3 sigma.
In the embodiment, the upper limit value and the lower limit value of the specification meeting the product performance parameters are obtained by back-pushing the process capability index formula related to the product quality in the production process, the upper limit value of the specification is used as the upper limit value of the testing distance in the automatic focusing debugging of the product, and the lower limit value of the specification is used as the lower limit value of the testing distance in the automatic focusing debugging of the product, so that the testing distance is compared with the complete testing distance in the prior art, the testing outside the range of the upper limit value and the lower limit value of the specification is omitted, the detection time is greatly shortened, and the rapid and accurate positioning.
S130, debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product.
After the target test distance of the target product is determined, the first definition position of the target product can be determined on a large scale based on the target test distance, then the second definition position is determined by fine debugging in a small range with the first definition position as a center, and the second definition position is used as a position corresponding to the definition peak point of the target product.
It should be noted that, after the definition peak point (i.e., the SFR value) of the target product and the corresponding position (DAC value) thereof are determined, if the definition peak point exceeds the specification range of the product, the target product is a defective product, and after the specification range of the product needs to be reset, the detection is performed.
According to the technical scheme, the average position corresponding to the definition peak point of the sample product is obtained, the target testing distance of the target product is determined according to the average position and the standard value of the process capability index, and the target product is debugged based on the target testing distance to obtain the position corresponding to the definition peak point of the target product. According to the embodiment, the specification range of the product meeting the quality standard is determined through the process capability index standard value related to the product quality in the production process, and the specification range is used as the test distance of the product, so that the test distance is compared with the complete test distance in the prior art, the test beyond the specification upper and lower limit ranges is omitted, the rapid and accurate positioning is realized, the automatic focusing and debugging time of the product is shortened, and the debugging efficiency is improved.
Example two
Fig. 2 is a flowchart of an auto-focus adjusting method according to a second embodiment of the present invention. On the basis of the above embodiments, the present embodiment further optimizes the auto-focus debugging method. Correspondingly, the method of the embodiment specifically includes:
s210, obtaining an average position corresponding to the definition peak point of the sample product.
Optionally, obtaining an average position corresponding to a sharpness peak point of the sample product includes: debugging each sample product based on the complete test distance of the sample product to obtain the position corresponding to the definition peak point of each sample product; and obtaining an average position according to the position corresponding to the definition peak point of each sample product.
And S220, determining the target test distance of the target product according to the average position and the standard value of the process capability index.
Optionally, determining a target test distance for the target product based on the average position and the standard value of the process capability index comprises: determining an upper limit value and a lower limit value of the target test distance according to the following formula:
CPK＝MIN((X-LSL/3σ)，(USL-X/3σ))，
wherein, CPK is a process capability index, X is an average position corresponding to a definition peak point of a sample product, LSL is a lower limit value of a target testing distance, USL is an upper limit value of the target testing distance, and sigma is a standard deviation value of the sample product. MIN in the above formula means solving the minimum between X-LSL/3 σ and USL-X/3 σ as CPK. The target test distance is a fraction of the complete test distance, specifically a range between an upper limit value and a lower limit value.
And S230, setting coarse adjustment parameters and fine adjustment parameters of the target test distance, wherein the coarse adjustment parameters comprise coarse adjustment step length, and the fine adjustment parameters comprise fine adjustment step length.
The rough adjustment parameters also comprise a rough adjustment test distance, and after the target test distance of the target product is determined, the rough adjustment test distance is set as the target test distance to serve as a large-range test distance. The coarse adjustment step size and the fine adjustment step size are intervals (namely interval DAC values) in which the voice coil motor is pushed in the camera module to drive the lens to move, the coarse adjustment step size is larger than the fine adjustment step size, and the setting of the specific DAC values of the coarse adjustment step size and the fine adjustment step size is not limited in this embodiment and can be set according to actual conditions, for example, the coarse adjustment step size can be set to 15, and the fine adjustment step size can be set to 8.
And S240, performing coarse adjustment on the target product according to the coarse adjustment parameters to obtain the position corresponding to the peak value of the coarse adjustment definition.
In this embodiment, the process of auto-focus debugging may be: the method comprises the steps of arranging an object to be detected on a bearing platform, obtaining an image of the object to be detected through a target product, analyzing the definition of the image by using a definition analysis function, further analyzing the definition of the image, and obtaining a DAC value and an SFR value corresponding to a definition peak point of the target product.
Optionally, the step of performing coarse adjustment on the target product according to the coarse adjustment parameters to obtain a position corresponding to the peak value of the coarse adjustment definition includes: acquiring an image of a target product at a target test distance according to a coarse adjustment step; and calculating the definition of the image acquired in each step, and taking the position corresponding to the maximum definition as the position corresponding to the peak value of the coarse-adjustment definition. Specifically, the voice coil motor pushes a lens in the camera module to move according to the coarse adjustment step length, an image of each step can be obtained by using a dynamic analysis (Read On Fly, ROF) technology, the definition of the image obtained by each step is calculated, and a DAC value corresponding to the maximum definition value is used as a DAC value corresponding to the peak value of the coarse adjustment definition.
Fig. 3 is a schematic diagram of fitting a curve of coarse-tuning definition according to a second embodiment of the present invention, in which the horizontal axis represents a DAC value, the vertical axis represents a Spatial Frequency Response (SFR) representing definition, and the range of the horizontal axis represents a coarse-tuning test distance, i.e., a target test distance. The upper limit value of the coarse tuning test distance is 395, the lower limit value is 135, the point in the dashed line box in the figure is the coarse tuning definition peak point, and the corresponding DAC value is 242.
And S250, fine adjustment is carried out on the target product according to the position corresponding to the coarse definition peak point and the fine adjustment parameters to obtain the position corresponding to the definition peak point of the target product.
Wherein the fine tuning is the same as the coarse tuning in the specific tuning process. Optionally, fine-tuning the target product according to the position corresponding to the coarse-tuning definition peak point and the fine-tuning parameter to obtain the position corresponding to the definition peak point of the target product, including: determining a fine adjustment test distance according to the position corresponding to the coarse adjustment definition peak point; acquiring an image of a target product at a fine testing distance according to a fine step length; and calculating the definition of the image acquired in each step, and taking the position corresponding to the maximum definition value as the position corresponding to the definition peak point. After determining the DAC value corresponding to the coarse resolution peak point, the fine-tuning test distance may be determined with the DAC value as the center, and for example, if the DAC value corresponding to the coarse resolution peak point is 242, the upper limit value of the fine-tuning test distance may be set to 242+ 30-272, and the lower limit value may be set to 242-30-212. And obtaining the position corresponding to the definition peak point after the target product is subjected to coarse adjustment and fine adjustment tests.
Exemplarily, fig. 4 is a schematic diagram of fitting a fine-tuning definition curve in a second embodiment of the present invention, where the abscissa in the diagram is a DAC value, the ordinate is an SFR, and the range of the abscissa is a fine-tuning test distance. The upper limit value of the fine adjustment test distance in the figure is 272, the lower limit value is 212, the point in the dashed line frame in the figure is a fine adjustment definition peak point, the DAC value corresponding to the point is 252, and the position corresponding to the definition peak point of the finally determined target product is obtained.
According to the technical scheme of the embodiment, the average position corresponding to the definition peak point of the sample product is obtained, the target test distance of the target product is determined according to the average position and the standard value of the process capability index, and the target product is debugged in a coarse adjustment and fine adjustment mode based on the target test distance, so that the position corresponding to the definition peak point of the target product is obtained. In the embodiment, the specification range of the product meeting the quality standard is determined through the process capability index standard value related to the product quality in the production process, and the specification range is used as the test distance of the product, so that the rapid and accurate positioning is realized, the test distance is compared with the complete test distance in the prior art, the test outside the specification upper and lower limit ranges is omitted, the automatic focusing and debugging time of the product is shortened, and the debugging efficiency is improved; and the accuracy is ensured by adopting a mode of coarse adjustment and fine adjustment.
EXAMPLE III
Fig. 5 is a schematic structural diagram of an autofocus debugging apparatus according to a third embodiment of the present invention, which is applicable to a case of implementing autofocus debugging. The automatic focusing debugging device provided by the embodiment of the invention can execute the automatic focusing debugging method provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the execution method. The apparatus specifically includes an averaging module 310, a distance module 320, and a debugging module 330, wherein:
an averaging module 310, configured to obtain an average position corresponding to a sharpness peak point of the sample product;
a distance module 320 for determining a target test distance of the target product based on the average position and the standard value of the process capability index;
and the debugging module 330 is configured to debug the target product based on the target test distance to obtain a position corresponding to the definition peak point of the target product.
According to the technical scheme, the average position corresponding to the definition peak point of the sample product is obtained, the target testing distance of the target product is determined according to the average position and the standard value of the process capability index, and the target product is debugged based on the target testing distance to obtain the position corresponding to the definition peak point of the target product. According to the embodiment, the specification range of the product meeting the quality standard is determined through the process capability index standard value related to the product quality in the production process, and the specification range is used as the test distance of the product, so that the rapid and accurate positioning is realized, the automatic focusing debugging time of the product is shortened, and the debugging efficiency is improved.
Optionally, the distance module 320 is specifically configured to:
determining an upper limit value and a lower limit value of the target test distance according to the following formula:
CPK＝MIN((X-LSL/3σ)，(USL-X/3σ))，
wherein, CPK is a process capability index, X is an average position corresponding to a definition peak point of a sample product, LSL is a lower limit value of a target testing distance, USL is an upper limit value of the target testing distance, and sigma is a standard deviation value of the sample product.
Optionally, the averaging module 310 specifically includes:
the first debugging unit is used for debugging each sample product based on the complete testing distance of the sample product to obtain the position corresponding to the definition peak point of each sample product;
and the averaging unit is used for obtaining an average position according to the position corresponding to the definition peak point of each sample product.
Optionally, the apparatus further comprises:
and the setting module is used for setting coarse adjustment parameters and fine adjustment parameters of the target test distance, wherein the coarse adjustment parameters comprise coarse adjustment step length, and the fine adjustment parameters comprise fine adjustment step length.
Optionally, the debugging module 330 specifically includes:
the coarse adjustment unit is specifically used for performing coarse adjustment on the target product according to the coarse adjustment parameters to obtain a position corresponding to a peak value of coarse adjustment definition;
and the fine adjustment unit is used for finely adjusting the target product according to the position corresponding to the coarse definition peak point and the fine adjustment parameters to obtain the position corresponding to the definition peak point of the target product.
Optionally, the coarse tuning unit specifically includes:
the first image subunit is used for acquiring an image of a target product at a target test distance in a coarse adjustment step size;
and the coarse adjustment position subunit is used for calculating the definition of the image acquired in each step, and taking the position corresponding to the maximum definition value as the position corresponding to the peak value of the coarse adjustment definition.
Optionally, the fine adjustment unit specifically includes:
the distance subunit is used for determining the fine tuning test distance according to the position corresponding to the peak value of the coarse tuning definition;
the second image subunit is used for acquiring the image of the target product at the fine adjustment test distance according to the fine adjustment step length;
a fine-adjustment position subunit for calculating the definition of the image obtained in each step, and taking the maximum definition value as the corresponding position as the position corresponding to the definition peak point
The automatic focusing debugging device provided by the embodiment of the invention can execute the automatic focusing debugging method provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the execution method.
Example four
Fig. 6 is a schematic structural diagram of an apparatus according to a fourth embodiment of the present invention. FIG. 6 illustrates a block diagram of an exemplary device 412 suitable for use in implementing embodiments of the present invention. The device 412 shown in fig. 6 is only an example and should not impose any limitation on the functionality or scope of use of embodiments of the present invention.
As shown in fig. 6, the device 412 is in the form of a general purpose device. The components of device 412 may include, but are not limited to: one or more processors 416, a storage device 428, and a bus 418 that couples the various system components including the storage device 428 and the processors 416.
A program/utility 440 having a set (at least one) of program modules 442 may be stored, for instance, in storage 428, such program modules 442 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each of which examples or some combination thereof may comprise an implementation of a network environment. The program modules 442 generally perform the functions and/or methodologies of the described embodiments of the invention.
The device 412 may also communicate with one or more external devices 414 (e.g., keyboard, pointing terminal, display 424, etc.), with one or more terminals that enable a user to interact with the device 412, and/or with any terminals (e.g., network card, modem, etc.) that enable the device 412 to communicate with one or more other computing terminals. Such communication may occur via input/output (I/O) interfaces 422. Further, the device 412 may also communicate with one or more networks (e.g., a Local Area Network (LAN), Wide Area Network (WAN), and/or a public Network, such as the internet) via the Network adapter 420. As shown in FIG. 6, network adapter 420 communicates with the other modules of device 412 via bus 418. It should be appreciated that although not shown in the figures, other hardware and/or software modules may be used in conjunction with the device 412, including but not limited to: microcode, end drives, Redundant processors, external disk drive Arrays, RAID (Redundant Arrays of Independent Disks) systems, tape drives, and data backup storage systems, among others.
The processor 416 executes various functional applications and data processing by running programs stored in the storage device 428, for example, implementing an auto-focus debugging method provided by an embodiment of the present invention, the method includes:
obtaining an average position corresponding to a definition peak point of a sample product;
determining a target test distance of a target product according to the average position and the standard value of the process capability index;
and debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product.
EXAMPLE five
The fifth embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the auto-focus debugging method provided in the fifth embodiment of the present invention, where the method includes:
obtaining an average position corresponding to a definition peak point of a sample product;
determining a target test distance of a target product according to the average position and the standard value of the process capability index;
and debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product.
Computer storage media for embodiments of the invention may employ any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or terminal. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (9)
1. An auto-focus debugging method, comprising:
obtaining an average position corresponding to a definition peak point of a sample product;
determining a target test distance of a target product according to the average position and the standard value of the process capability index;
debugging the target product based on the target test distance to obtain a position corresponding to a definition peak point of the target product,
wherein determining a target test distance for the target product based on the average position and the normalized value of the process capability index comprises:
determining an upper limit value and a lower limit value of the target test distance according to the following formula:
CPK=MIN（（X-LSL/3σ），（USL-X/3σ）），
wherein CPK is a process capability index, X is an average position corresponding to a sharpness peak point of the sample product, LSL is a lower limit value of the target test distance, USL is an upper limit value of the target test distance, and σ is a standard deviation value of the sample product.
2. The method of claim 1, wherein obtaining the average position corresponding to the sharpness peak of the sample product comprises:
debugging each sample product based on the complete testing distance of the sample product to obtain the position corresponding to the definition peak point of each sample product;
and obtaining the average position according to the position corresponding to the definition peak point of each sample product.
3. The method of claim 1, wherein before debugging the target product based on the target test distance, further comprising:
and setting coarse adjustment parameters and fine adjustment parameters of the target test distance, wherein the coarse adjustment parameters comprise coarse adjustment step length, and the fine adjustment parameters comprise fine adjustment step length.
4. The method according to claim 3, wherein debugging the target product based on the target test distance to obtain a position corresponding to a definition peak point of the target product comprises:
carrying out coarse adjustment on the target product according to the coarse adjustment parameters to obtain a position corresponding to a peak value of coarse adjustment definition;
and finely adjusting the target product according to the position corresponding to the coarse definition peak point and the fine adjustment parameters to obtain the position corresponding to the definition peak point of the target product.
5. The method of claim 4, wherein coarsely adjusting the target product according to the coarse adjustment parameters to obtain a location corresponding to a peak point of coarse resolution, comprises:
acquiring an image of the target product at the target test distance according to the coarse adjustment step length;
and calculating the definition of the image acquired in each step, and taking the position corresponding to the maximum definition as the position corresponding to the peak value of the coarse-adjustment definition.
6. The method according to claim 4, wherein fine-tuning the target product according to the position corresponding to the coarse definition peak point and the fine-tuning parameter to obtain the position corresponding to the definition peak point of the target product comprises:
determining a fine adjustment test distance according to the position corresponding to the coarse adjustment definition peak point;
acquiring an image of the target product at the fine adjustment test distance according to the fine adjustment step length;
and calculating the definition of the image acquired in each step, and taking the position corresponding to the maximum definition value as the position corresponding to the definition peak point.
7. An auto-focus adjustment device, comprising:
the averaging module is used for acquiring an average position corresponding to a definition peak point of a sample product;
the distance module is used for determining the target test distance of the target product according to the average position and the standard value of the process capability index;
a debugging module for debugging the target product based on the target test distance to obtain the position corresponding to the definition peak point of the target product,
the distance module determines an upper limit value and a lower limit value of the target test distance according to the following formula:
CPK=MIN（（X-LSL/3σ），（USL-X/3σ）），
wherein CPK is a process capability index, X is an average position corresponding to a sharpness peak point of the sample product, LSL is a lower limit value of the target test distance, USL is an upper limit value of the target test distance, and σ is a standard deviation value of the sample product.
8. An electronic device, characterized in that the electronic device comprises:
one or more processors;
storage means for storing one or more programs;
when executed by the one or more processors, cause the one or more processors to implement the auto-focus debugging method of any one of claims 1-6.
9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the auto-focus debugging method according to one of claims 1 to 6.
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| CN110244444B (en) * | 2019-05-21 | 2021-09-03 | 深圳市智影医疗科技有限公司 | Microscope focusing method and device, terminal equipment and storage medium |
| CN110365971B (en) * | 2019-07-17 | 2021-05-18 | 上海集成电路研发中心有限公司 | Test system and method for automatically positioning optimal fixed focus |
| CN112866689B (en) * | 2021-02-18 | 2023-12-26 | 歌尔科技有限公司 | SFR algorithm-based optical focusing method |
| TWI780665B (en) * | 2021-04-16 | 2022-10-11 | 大陸商廣州立景創新科技有限公司 | Camera module, focus adjustment system, and focusing method |
| CN113163122B (en) * | 2021-04-30 | 2023-05-16 | 珠海广浩捷科技股份有限公司 | Focusing method |
| CN113452991B (en) * | 2021-08-31 | 2021-11-23 | 南昌龙旗信息技术有限公司 | Lens focusing state determining method, device, equipment and storage medium |
| CN114007016A (en) * | 2021-10-29 | 2022-02-01 | 江西盛泰精密光学有限公司 | Camera module rapid automatic focusing system and method |
| CN115379201A (en) * | 2022-08-16 | 2022-11-22 | Oppo广东移动通信有限公司 | Test method and device, electronic equipment and readable storage medium |
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