CN109212340B - Accelerated life test method and device for charging equipment - Google Patents

Accelerated life test method and device for charging equipment Download PDF

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CN109212340B
CN109212340B CN201710525931.7A CN201710525931A CN109212340B CN 109212340 B CN109212340 B CN 109212340B CN 201710525931 A CN201710525931 A CN 201710525931A CN 109212340 B CN109212340 B CN 109212340B
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charging equipment
charging
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temperature
test time
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杨敏骅
黄建
方朋威
纪秉男
杨国森
候雅静
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Yutong Bus Co Ltd
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Zhengzhou Yutong Bus Co Ltd
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    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

The invention provides a method and a device for testing the accelerated life of charging equipment, wherein the method for testing the accelerated life calculates the conventional test time of a single charging equipment according to the relation among the design life time, the reliability and the allowable failure number of the charging equipment; selecting the temperature which affects the service life of the charging equipment as acceleration stress, calculating the magnitude of a temperature acceleration factor, and calculating the acceleration service life test time of the single charging equipment according to the temperature acceleration factor and the conventional test time of the single charging equipment; and carrying out a cycle test on the charging equipment according to a set temperature change curve until the accelerated life time is reached, and judging whether the charging equipment fails. The method provided by the invention can greatly shorten the service life test time of the charging equipment, improve the service life test efficiency, improve the reliability of service life detection of the charging equipment, confirm the service life of the charging equipment and provide a theoretical basis for the design of the charging equipment.

Description

Accelerated life test method and device for charging equipment
Technical Field
The invention belongs to the field of electric vehicle charging equipment, and particularly relates to a charging equipment accelerated life test method and device.
Background
With the gradual deepening of the national policy, the market share of the new energy electric vehicle increases year by year, the electric vehicle has greater and greater demand on the charging equipment, and the charging equipment with better performance influences the endurance mileage of the whole vehicle to a great extent, so that the demand on the charging equipment is higher and higher, the service life of the charging equipment is necessary to be verified, and a charging equipment manufacturer verifies the service life of the charging equipment through tests so as to ensure the product competitiveness of the charging equipment; in the prior art, the service life of the charging equipment is monitored through a conventional service life test, the conventional service life test is completely simulated according to the real actual operation condition of the charging equipment, the result has higher accuracy, but the test time is longer, and a large amount of manpower, financial resources and material resources are consumed, so that an accelerated service life test method is often adopted to detect the service life of the charging equipment.
The accelerated life test is an important branch of a reliability test technology, and the main theory is that on the premise of not changing a product failure mechanism, the main material and chemical process of product failure is strengthened, namely a stress factor is increased, so that the purpose of the accelerated test is achieved, and the reliability and the service life of a product under a normal working condition are predicted.
Disclosure of Invention
The invention aims to provide a method and a device for testing the accelerated service life of charging equipment, which are used for solving the problems of long service life detection period and low detection reliability of the charging equipment in the prior art.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a charging equipment accelerated life test method comprises the following steps:
1) calculating the conventional test time of a single charging device according to the relation among the design life time, the reliability and the allowable failure number of the charging device;
2) selecting the temperature which affects the service life of the charging equipment as acceleration stress, calculating the magnitude of a temperature acceleration factor, and calculating the acceleration service life test time of the single charging equipment according to the temperature acceleration factor and the conventional test time of the single charging equipment;
3) and carrying out a cycle test on the charging equipment according to a set temperature change curve until the accelerated life test time is reached, and judging whether the charging equipment fails.
Further, after the accelerated life test is finished, if the charging equipment does not fail, the load program control function of the charging equipment is detected, and the load is increased to 100% and then decreased to 0% in an ON state through an ON/OFF load jump test for setting the cycle number of the charging equipment, so that whether the charging equipment fails or not is judged.
Further, still carry out the plug test to battery charging outfit's rifle that charges, through continuously letting in the rifle rated current that charges to the rifle that charges, carry out the plug test of setting for the number of times, judge whether battery charging outfit's rifle that charges is inefficacy.
Further, plug test is carried out simultaneously to a plurality of guns that charge through the mode that preceding socket and the rifle end to end that charges of back.
Further, the temperature acceleration factor is expressed as:
Figure BDA0001338489970000021
wherein TEAFAs temperature acceleration factor, Δ TstressTo accelerate the rate of change of temperature under stress, Δ TnormalIs the rate of temperature change under normal stress.
Further, the accelerated life test time is expressed as:
Figure BDA0001338489970000022
wherein T' is the accelerated life test time of a single device, T is the test time of a single charging device, TEAFIs a temperature acceleration factor.
The invention also provides a charging equipment accelerated life test device, which comprises a power supply, a load program control box and a temperature box, wherein the power supply and the load of the load program control box are used for forming a test loop with the charging equipment, the temperature box is used for arranging at least one charging equipment to be tested and carrying out temperature cycle change according to a temperature change curve in accelerated life test time, and the calculation process of the accelerated life test time is as follows: calculating the conventional test time of a single charging device according to the relation among the design life time, the reliability and the allowable failure number of the charging device; and selecting the temperature influencing the service life of the charging equipment as an acceleration stress, calculating the temperature acceleration factor, and calculating the accelerated service life test time of the single charging equipment according to the acceleration factor and the conventional test time of the single charging equipment.
Further, after the accelerated life test is finished, the load program control function of the charging equipment is detected, the ON/OFF load jump test of the set cycle number is carried out ON the charging equipment, the load is increased to 100% and then decreased to 0% in the ON state, and whether the charging equipment fails or not is judged.
Further, still carry out the plug test to battery charging outfit's rifle that charges, through continuously letting in the rifle rated current that charges to the rifle that charges, carry out the plug test of setting for the number of times, judge whether battery charging outfit's rifle that charges is inefficacy.
Further, plug test is carried out simultaneously to a plurality of guns that charge through the mode that preceding socket and the rifle end to end that charges of back.
The invention has the beneficial effects that:
the accelerated life test method calculates the conventional test time of a single charging device according to the relation among the design life time, the reliability and the allowable failure number of the charging device; selecting the temperature which affects the service life of the charging equipment as acceleration stress, calculating the magnitude of a temperature acceleration factor, and calculating the acceleration service life test time of the single charging equipment according to the temperature acceleration factor and the conventional test time of the single charging equipment; and carrying out a cycle test on the charging equipment according to a set temperature change curve until the accelerated life test time is reached, and judging whether the charging equipment fails. The method provided by the invention can greatly shorten the service life test time of the charging equipment, improve the service life test efficiency, improve the reliability of service life detection of the charging equipment, confirm the service life of the charging equipment and provide a theoretical basis for the design of the charging equipment.
The accelerated life test device comprises a power supply, a load program control box and a temperature box, wherein the power supply and a load of the load program control box are used for forming a test loop with charging equipment, the temperature box is used for arranging at least one charging equipment to be tested and carrying out temperature cycle change according to a temperature change curve in accelerated life test time.
Drawings
FIG. 1 is a schematic view of the test apparatus and sample connection under temperature accelerated stress according to the present invention;
FIG. 2 is a temperature profile of the present invention;
FIG. 3 is a schematic view of the testing apparatus and sample connection under load control of the present invention;
FIG. 4 is a load jump graph of the present invention;
fig. 5 is a connection diagram of the plugging and unplugging experiment of the charging gun.
Detailed Description
The following further describes embodiments of the present invention with reference to the drawings:
the embodiment of the accelerated life test method of the charging equipment comprises the following steps:
a charging equipment accelerated life test method comprises the following steps:
1. randomly selecting n1An AC/DC power module, n2And (3) carrying out a routine test on the charging gun wire according to the requirements of GB/T18487.1-2015 and GB/T20234.3-2015 to confirm that the sample has a normal use function and good performance. In order to save cost and not cause waste of resources, n1、n2The number of (a) is determined by the sample product sales usage experience.
2. Determining the design life time of the charging equipment, wherein the design life time can be directly obtained according to the functional characteristics of the charging equipment as the life time is distributed to the charging equipment before the charging equipment leaves a factory; and then, the reliability of the charging equipment is obtained by carrying out conventional tests on the charging equipment for many times, the reliability is less than or equal to 0.99 under the normal condition, the reliability can be selected according to actual requirements, and the higher the reliability is, the more reliable the obtained service life test result is. Calculating the failure rate of the charging equipment according to the design life time and the reliability of the charging equipment, wherein the failure rate is expressed as:
Figure BDA0001338489970000041
whereinλ is the failure rate of the charging device, tpρ is the reliability of the charging device for the design life time of the charging device.
3. According to the calculated failure rate of the charging equipment, in combination with a failure rate test sampling table with a confidence coefficient of 90% in table 1, selecting a proper allowable failure number of the charging equipment to determine the total test hours T, and then according to the number of the selected charging equipment, obtaining a test time T of a single charging equipment sample, wherein the specific content in table 1 is as follows:
table 1 failure rate test sampling table with 90% confidence (index distribution)
Figure BDA0001338489970000042
How the total number of test hours is determined is described below by way of an example, assuming that the failure rate calculated in step 2 is 3 × 10-5If the allowable number of failures of the charging device is 1, which is required for the test, the total number of test hours is 0.13h as can be directly obtained from table 1. In fact, the failure rate of the charging device obtained at the time of calculation is not necessarily exactly the failure rate given in table 1, but the closest failure rate in table 1 may be selected according to the calculated failure rate.
After the parameters are obtained by table look-up, the test time t can be calculated, and the test time t is expressed as:
Figure BDA0001338489970000051
wherein T is the conventional test time of a single charging device, T is the total test hours, n1The number of charging devices.
4. The acceleration stress affecting the charging device is selected, the temperature is selected as the acceleration stress in the embodiment, and the temperature change rate of the acceleration test and the temperature change rate under the normal stress are selected, wherein the temperature change rate under the acceleration test is determined by the capability of the testing device and the predicted testing time. Calculating a temperature acceleration factor by using a Coffin-Masson formula, wherein the temperature acceleration factor is expressed as:
Figure BDA0001338489970000052
wherein TEAFAs temperature acceleration factor, Δ TstressTo accelerate the rate of change of temperature under stress, Δ TnormalIs the rate of temperature change under normal stress.
5. Calculating the accelerated life test time of the single sample by combining the conventional test time and the temperature acceleration factor of the single sample, wherein the accelerated life test time is expressed as:
Figure BDA0001338489970000053
wherein T' is the accelerated life test time of a single device, T is the test time of a single charging device, TEAFIs a temperature acceleration factor.
6. According to the connection mode shown in fig. 1, n1 power modules which are tested and qualified by the integrity verification test are connected in parallel and then are placed in a temperature box, and the temperature box is connected with an input alternating current power supply and a program control load box. Setting a temperature box program according to a curve chart of fig. 2, enabling a power module to bear high-temperature and low-temperature environments, accelerating the damage progress of charging equipment, reducing the service life test time of the charging equipment, applying rated voltage and current to a sample, continuously performing a cycle test until T' test time is reached, performing a conventional test on the sample according to the requirements of GB/T18487.1-2015 and GB/T20234.3-2015 after a temperature change test is completed, verifying the voltage stabilization precision and the current stabilization precision of the sample, and if the voltage stabilization precision and the current stabilization precision are consistent with the design requirements, determining that the charging equipment does not fail, wherein the charging equipment has a normal use function and is complete in performance; if the voltage and current stabilization precision test methods are inconsistent, the charging equipment is considered to be invalid, the charging equipment is determined to be not in accordance with the design life requirement, and the charging equipment is an unqualified product, wherein the voltage stabilization precision test method and the current stabilization precision test method can be carried out by referring to relevant national standards.
7. After the sample accelerated life test is completed, if the charging equipment does not fail, the load program control capability of the sample is also detected, and the specific detection process is as follows: the temperature load test samples are connected in parallel according to the connection mode shown in figure 3 and then are placed in a temperature box, and an input alternating current power supply, a program-controlled high-voltage switch and a program-controlled load box are connected. And setting a program-controlled load box program according to a load jump curve chart shown in fig. 4, starting to perform an ON/OFF & load jump test after the sample temperature is consistent with the ambient temperature, circularly inputting the power supply ON/OFF, and increasing the load to 100% and then decreasing the load to 0% (ON18s, OFF 6s) in an ON state. The total number of test cycles is obtained according to the use experience of the previous product, after the program-controlled load capacity test of the sample is completed, the sample is subjected to a conventional test according to the requirements of GB/T18487.1-2015 and GB/T20234.3-2015, the voltage stabilization precision and the current stabilization precision of the sample are verified, if the voltage stabilization precision and the current stabilization precision are consistent with the design requirements, the charging equipment is considered to be not failed, the charging equipment has a normal use function, and the performance is good; if the voltage and current stabilizing precision of the charger at the present stage is less than or equal to 0.5 percent, the current stabilizing precision is less than or equal to 1 percent, and if the product technology is upgraded at the later stage, the voltage and current stabilizing precision requirements are possibly higher.
8. Still detect the rifle that charges, specific testing process is: take n2A standard charging gun, 2n2A standard socket. With n2For example, the charging guns are numbered a1, a2, A3 and a4, and the charging sockets are numbered B1, B2 … … B7 and B8. According to the figure 5, a direct current power supply, a program control load box, a charging gun and a socket are connected, wherein the front socket is connected with the rear charging gun end to end, and the length of the gun line is 1 m. According to the connection diagram of the plugging test of the charging gun shown in fig. 5, the charging gun a1 is first plugged into the B1 socket 100 times, after the completion, the charging gun a1 is connected with the charging gun B1 and the rated current of the charging gun is continuously supplied, and after the temperature rise of the charging gun is stable, the plugging test of the charging gun a1 and the socket B2 is performed 100 times, that is, a plugging and electrifying cycle is completed. The total cycle number is confirmed according to the actual condition of the product.
The A2, A3 and A4 charging guns respectively perform plugging and unplugging tests on the B3 socket, the B4 socket, the B5 socket, the B6 socket and the B7 socket and the B8 socket according to the test method of the A1 charging gun. The pull-plug test of 4 charging guns can be performed simultaneously. After the test is finished, the direct-current power supply, the charging gun, the charging socket and the load box are connected under the condition that the environmental temperature is 40 ℃, the rated current of the charging gun is continuously introduced, and the temperature rise of the charging gun is stable. And testing the temperature of the terminal by using a handheld thermal imager, wherein the temperature rise of the terminal does not exceed 80K, and judging that the charging gun does not fail. Wherein, the temperature rise value of 3 continuous readings at an interval of not less than 10 minutes is lower than 2K, the temperature steady state can be considered to be reached.
After the plugging test is finished, if the charging gun has obvious ablation traces, the charging gun part deforms, and partial functions cannot be normally used, the charging gun is judged to be not in accordance with the design requirements.
The specific embodiments are given above, but the present invention is not limited to the above-described embodiments. The basic idea of the present invention lies in the above basic scheme, and it is obvious to those skilled in the art that no creative effort is needed to design various modified models, formulas and parameters according to the teaching of the present invention. Variations, modifications, substitutions and alterations may be made to the embodiments without departing from the principles and spirit of the invention, and still fall within the scope of the invention.

Claims (10)

1. A charging equipment accelerated life test method is characterized by comprising the following steps:
1) calculating the conventional test time of a single charging device according to the relation among the design life time, the reliability and the allowable failure number of the charging device;
2) selecting the temperature which affects the service life of the charging equipment as acceleration stress, calculating the magnitude of a temperature acceleration factor, and calculating the acceleration service life test time of the single charging equipment according to the temperature acceleration factor and the conventional test time of the single charging equipment;
3) carrying out a cycle test on the charging equipment according to a set temperature change curve until the accelerated life test time is reached, and judging whether the charging equipment fails;
the specific calculation method of the conventional test time of the single charging device comprises the following steps:
calculating the failure rate of the charging equipment according to the design life time and the reliability of the charging equipment, wherein the failure rate is expressed as:
Figure FDA0003272926030000011
where λ is the failure rate of the charging device, tpDesigning the service life of the charging equipment, wherein rho is the reliability of the charging equipment;
selecting a proper allowable failure number of the charging equipment according to the calculated failure rate of the charging equipment, and determining the total test hours T by looking up a table, wherein the table is a failure rate test sampling table with the confidence coefficient of 90%;
after the total test hours T is obtained by table lookup, the conventional test time T of a single charging device can be calculated, and the conventional test time T of the single charging device is represented as:
Figure FDA0003272926030000012
wherein T is the conventional test time of a single charging device, T is the total test hours, n1The number of charging devices.
2. The accelerated life test method of the charging equipment according to claim 1, wherein after the accelerated life test is finished, if the charging equipment does not fail, the load program control function of the charging equipment is detected, and by performing an ON/OFF load jump test ON the charging equipment for a set number of cycles, the load is increased to 100% and then decreased to 0% in an ON state, and whether the charging equipment fails or not is judged.
3. The accelerated life test method of the charging equipment according to claim 2, wherein a plugging test is further performed on a charging gun of the charging equipment, and the plugging test is performed for a set number of times by continuously supplying a rated current of the charging gun to the charging gun, so as to determine whether the charging gun of the charging equipment fails.
4. The accelerated life test method of a charging device according to claim 3, wherein the plugging and unplugging tests are performed on a plurality of charging guns simultaneously in a way that a former socket is connected end to end with a latter charging gun.
5. The accelerated lifetime test method of a charging device according to claim 1, wherein the temperature acceleration factor is expressed as:
Figure FDA0003272926030000021
wherein TEAFAs temperature acceleration factor, Δ TstressTo accelerate the rate of change of temperature under stress, Δ TnormalIs the rate of temperature change under normal stress.
6. The accelerated life test method of a charging device according to claim 1, wherein the accelerated life test time is expressed as:
Figure FDA0003272926030000022
wherein T' is the accelerated life test time of a single device, T is the test time of a single charging device, TEAFIs a temperature acceleration factor.
7. The utility model provides a charging equipment life test device with higher speed which characterized in that, includes power, load program control case and temperature case, the load of power and load program control case is used for forming test circuit with charging equipment, the temperature case is used for setting up at least one charging equipment that awaits measuring to carry out temperature cycle change according to the temperature variation curve in life test time with higher speed, life test time's the calculation process with higher speed is: calculating the conventional test time of a single charging device according to the relation among the design life time, the reliability and the allowable failure number of the charging device; selecting the temperature influencing the service life of the charging equipment as acceleration stress, calculating the magnitude of a temperature acceleration factor, and calculating the acceleration service life test time of the single charging equipment according to the acceleration factor and the conventional test time of the single charging equipment;
the specific calculation method of the conventional test time of the single charging device comprises the following steps:
calculating the failure rate of the charging equipment according to the design life time and the reliability of the charging equipment, wherein the failure rate is expressed as:
Figure FDA0003272926030000023
where λ is the failure rate of the charging device, tpDesigning the service life of the charging equipment, wherein rho is the reliability of the charging equipment;
selecting a proper allowable failure number of the charging equipment according to the calculated failure rate of the charging equipment, and determining the total test hours T by looking up a table, wherein the table is a failure rate test sampling table with the confidence coefficient of 90%;
after the total test hours T is obtained by table lookup, the conventional test time T of a single charging device can be calculated, and the conventional test time T of the single charging device is represented as:
Figure FDA0003272926030000031
wherein T is the conventional test time of a single charging device, T is the total test hours, n1The number of charging devices.
8. The accelerated life test device of claim 7, wherein after the accelerated life test is finished, the load program control function of the charging device is detected, and by performing an ON/OFF load jump test ON the charging device for a set number of cycles, when the load is increased to 100% and then decreased to 0% in the ON state, whether the charging device fails or not is determined.
9. The accelerated life test device of the charging equipment according to claim 8, wherein a plugging test is further performed on a charging gun of the charging equipment, and the plugging test is performed for a set number of times by continuously supplying a rated current of the charging gun to the charging gun, so as to determine whether the charging gun of the charging equipment fails.
10. The accelerated life test device of claim 9, wherein the plugging and unplugging tests are performed on a plurality of charging guns simultaneously in an end-to-end connection manner between a previous socket and a next charging gun.
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CN110133407B (en) * 2019-05-21 2022-01-18 出门问问信息科技有限公司 Charging contact testing method and testing device for wearable equipment
CN111208364B (en) * 2019-12-17 2022-05-03 中国人民解放军92942部队 Comprehensive stress reliability accelerated test method based on multiple models

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