CN109188117A - A kind of Meter Test system and test method based on Labview - Google Patents

A kind of Meter Test system and test method based on Labview Download PDF

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Publication number
CN109188117A
CN109188117A CN201810836247.5A CN201810836247A CN109188117A CN 109188117 A CN109188117 A CN 109188117A CN 201810836247 A CN201810836247 A CN 201810836247A CN 109188117 A CN109188117 A CN 109188117A
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test
message
labview
instrument
module
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CN201810836247.5A
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Chinese (zh)
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王宁
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Navigator's Automotive Electronics Co Ltd Of Section In Zhejiang
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Navigator's Automotive Electronics Co Ltd Of Section In Zhejiang
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Priority to CN201810836247.5A priority Critical patent/CN109188117A/en
Publication of CN109188117A publication Critical patent/CN109188117A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005Testing of electric installations on transport means
    • G01R31/006Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
    • G01R31/007Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks using microprocessors or computers

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

The invention belongs to Meter Test technical fields, and in particular to a kind of Meter Test system and test method based on Labview.Wherein, the Meter Test system based on Labview, including Labview test platform and meters under test, Labview test platform include: message configuration module, for by test parameter editor into configuration file or manual editing's test packet;Configuration file read module, for reading configuration file to export test packet;Bus configuration module, the switch for control bus;The bus is for connecting Labview test platform and meters under test;Message sending module, for the transmission parameter of test packet to be arranged;Comparison module, for the outgoing message of contrastive test message and meters under test, to export test report.The Meter Test system based on Labview realizes automatic test, substantially reduces test period, reduce the error of manual testing.

Description

Labview-based instrument testing system and testing method
Technical Field
The invention belongs to the technical field of instrument testing, and particularly relates to an instrument testing system and method based on Labview.
Background
As a communication protocol with advanced technology, strong real-time and high reliability, a CAN (Controller Area Network) bus protocol has been widely applied to various automatic control systems, and has a good application prospect in the field of automotive electronics, especially in automotive electronic control modules and instruments. The CAN bus is introduced into the automobile instrument system, so that the automobile instrument system has an open and easily-expanded structure, and CAN digitally and uniformly manage all the separated instruments of the former analog combination, thereby not only reducing the wiring harness of the automobile system, simplifying the interface of the instrument system, improving the anti-interference performance of the system, but also improving the stability, the precision and the service life of the instrument, and greatly increasing the data flow of the system.
The CAN bus automobile instrument is designed based on the concept, CAN receive various running condition parameters of a vehicle from an automobile internal CAN network, and displays the running condition parameters to a driver in a pointer mode or a digital mode in real time. The existing automobile instrument is a purely mechanical type mechanical instrument with a liquid crystal display at local part, the purely mechanical type automobile instrument adopts a mechanical pointer to display information, and the mechanical instrument with the liquid crystal display at local part adopts the mechanical pointer and an LED as an information presentation mode, so that the instrument is more superior than the mechanical instrument. The current mechanical instrument with liquid crystal display has a small liquid crystal display area, and the whole function requirement can be fulfilled by using a single controller. However, with the diversified demands of customers, the popularization of electric vehicles, and partial intelligent applications, the development of liquid crystal instruments has been promoted.
At present, the function test of the vehicle-mounted liquid crystal instrument needs to be carried out step by step according to the required items on the specification, CAN messages of the instrument and high and low level or voltage signals of part of pins of the instrument need to be received and sent in the test process, and finally the obtained actual phenomenon is compared with the required function of the specification, so that the test result is obtained. The method obviously has the following disadvantages and shortcomings:
1. the test is carried out manually according to the specification items, and the test omission condition is easy to occur;
2. when a switch button or an instrument pin is abnormal in the test process, a tester cannot find the abnormal condition in time;
3. after the test is finished, the omission is worried about, the inspection and the confirmation are carried out again, and the test period is prolonged;
4. the test result is judged manually, the requirement on testers is high, and misjudgment can be caused by the fact that attention is not focused sometimes.
Based on this, an automated testing scheme improved for manual testing has appeared in the prior art, and for example, patent document with publication number CN101509948A discloses an automotive electronic testing system, which includes a PXI hardware platform device responsible for testing a device under test; an information processing device for automatically testing and analyzing the product; the interface box is used for realizing signal introduction; the power supply system is responsible for providing power supply for the PXI hardware platform device and the piece to be tested; a remote database server for storing test data and providing remote test data query, and any computer capable of connecting to the remote database server via the Internet for test data query. The automatic test scheme can only complete general tests of automobile electronic products, but can not perform professional tests aiming at the characteristics and test conditions of the automobile instruments.
Therefore, there is a need in the art to develop a special test system for the automobile instrument.
Disclosure of Invention
Based on the defects in the prior art, the invention provides an instrument testing system and a testing method based on Labview.
In order to achieve the purpose, the invention adopts the following technical scheme:
the Labview-based instrument testing system comprises a Labview testing platform and an instrument to be tested, wherein the Labview testing platform comprises:
the message configuration module is used for editing the test parameters into a configuration file or manually editing the test message;
the configuration file reading module is used for reading the configuration file to output a test message;
the bus configuration module is used for controlling the switch of the bus; the bus is used for connecting the Labview test platform and the instrument to be tested;
the message sending module is used for setting the sending parameters of the test message;
and the comparison module is used for comparing the test message with the outgoing message of the instrument to be tested so as to output a test report.
As a preferred scheme, the Labview test platform further comprises a message display module, and the message display module is used for displaying the sent test message and the received outgoing message.
As a preferred scheme, the Labview test platform further comprises a message storage module, and the message storage module is used for setting a storage path for the sent and received messages.
Preferably, the test parameters are compiled by sub-VI of Labview.
As a preferred scheme, the test parameters are edited into a configuration file, and the test parameters comprise the message type, the message ID, the enabled bit and a corresponding calculation formula, and finally the configuration file capable of being imported into a Labview test platform is output.
As a preferred scheme, the manually editing the test message includes: and manually editing the ID, the length and the beta data of the message.
As a preferred scheme, the bus configuration module is further configured to configure the number of bus channels and the baud rate.
As a preferred scheme, the transmission parameters of the test packet include interval time of packet transmission, single transmission and continuous transmission.
Preferably, the test system further comprises an indicator light for feeding back the connection state of the bus.
The invention also provides an instrument testing method based on Labview, which is applied to a Labview testing platform and an instrument to be tested which are connected by a bus, and the testing method comprises the following steps:
editing the test parameters into a configuration file or manually editing a test message; if the configuration file is selected to be imported, reading the configuration file to output a test message;
setting a sending parameter of the test message;
and comparing the test message with the outgoing message of the instrument to be tested to output a test report.
Compared with the prior art, the invention has the beneficial effects that:
the Labview-based instrument testing system and the Labview-based instrument testing method realize automatic testing, greatly shorten the testing period and reduce errors in manual testing.
Drawings
FIG. 1 is a schematic structural diagram of a Labview-based meter testing system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a Labview test platform according to an embodiment of the present invention;
FIG. 3 is a flow chart of a Labview-based meter testing method according to an embodiment of the invention.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention, the following description will explain the embodiments of the present invention with reference to the accompanying drawings. It is obvious that the drawings in the following description are only some examples of the invention, and that for a person skilled in the art, other drawings and embodiments can be derived from them without inventive effort.
As shown in fig. 1, the Labview-based instrument testing system according to the embodiment of the present invention includes a Labview testing platform and an instrument to be tested, where the Labview testing platform and the instrument to be tested are connected by a bus, and the bus is preferably a CAN bus or a Kvaser line. In addition, the meter to be tested is preferably a liquid crystal meter and has the function of sending out messages.
As shown in fig. 2, the Labview test platform includes a message configuration module, a bus configuration module, a configuration file reading module, a message sending module, and a comparison module; wherein,
the message configuration module is used for editing the test parameters into a configuration file or manually editing the test message; namely, the Labview test platform provides two test modes, one is to use the existing configuration file template to configure the test parameters so as to carry out the test, and the other is to directly and manually edit the test message; specifically, the test parameters are edited through a sub-VI of the Labview, the test parameters are edited, the test parameters comprise the message type, the message ID, the enabled bit and a corresponding calculation formula, and finally, a configuration file which can be imported into a Labview test platform is output, so that the function test of the instrument can be performed through the Labview test platform. For the manual editing test message, the test message is generated by performing manual editing on the test message, including the message ID, the length, the specific beta data and the like.
The configuration file reading module is used for reading the edited configuration file and outputting the read test message to be imported; importing the configuration file further comprises: and when the driving message is input, the driving state is simulated and displayed in a chart form.
And the bus configuration module is used for controlling the switch of the bus so as to establish communication connection between the Labview test platform and the instrument to be tested. In addition, the bus configuration module can also be used for configuring the number of bus channels and the baud rate so as to freely set communication parameters between the Labview test platform and the instrument to be tested.
The message sending module is used for setting the sending parameters of the test message; the sending parameters of the test message comprise the interval time of message sending, single sending and continuous sending, and can be freely selected and set according to the requirements of users; the time interval of message sending is set, and overtime processing of the message can be realized. The message sending module defaults to include 10 pieces of message information, the message information can control a specific message imported from the configuration file area, the specific message can be visually divided into a sending button, a message type and a message ID, meanwhile, the message sending module includes specific bit control and a sub-interface related to message data calculation, and certainly, the message information can be continuously increased or reduced on the basis of 10 pieces of message information according to test requirements. The single sending is that 10 pieces of message information are sent in sequence once, and the sending is finished; the continuous sending is that 10 message messages are sent in sequence once and then are sent circularly continuously until the test message is stopped being sent.
And the comparison module is used for comparing the test message with the outgoing message of the instrument to be tested so as to output a test report. Specifically, the comparison module receives the test message sent by the message sending module and the outgoing message of the instrument to be tested, and compares the test message with the outgoing message, so as to output a test report and realize the automation of the instrument test.
By adopting the technical scheme, the Labview-based instrument testing system greatly shortens the testing period and reduces the error in manual testing.
As a preferred embodiment, the Labview test platform may further include a message display module, where the message display module is configured to display the sent test message and the received outgoing message, and compared with a conventional instrument test platform or tool, a user may visually find a record of a recently sent message on an interface, so as to more visually represent a current state of the instrument.
As a preferred embodiment, the Labview test platform may further include a packet storage module, where the packet storage module is configured to set a storage path for a transmitted and received packet, and the function of automatically storing a packet also provides a guarantee for tracing problems in the future.
As a preferred embodiment, the test system further comprises an indicator light, and the indicator light is used for feeding back the connection state of the bus, namely, the type and the state of the bus frame are directly fed back to a user in the form of the indicator light, so that the abnormality can be found in time.
Corresponding to the Labview-based instrument testing system of the embodiment, the embodiment of the invention also provides a Labview-based instrument testing method, which is applied to a bus-connected Labview testing platform and an instrument to be tested, wherein the instrument to be tested is preferably a liquid crystal instrument and has a message outgoing function. Specifically, as shown in fig. 3, the test method includes the following steps:
editing the test parameters into a configuration file or manually editing a test message; if the configuration file is selected to be imported, reading the configuration file to output a test message; the Labview test platform provides two test modes, one is to use the existing configuration file template to configure the test parameters so as to test, and the other is to directly and manually edit the test message; specifically, the test parameters are edited through a sub-VI of the Labview, the test parameters are edited, the test parameters comprise the message type, the message ID, the enabled bit and a corresponding calculation formula, and finally, a configuration file which can be imported into a Labview test platform is output, so that the function test of the instrument can be performed through the Labview test platform. For the manual editing test message, the test message is generated by performing manual editing on the test message, including the message ID, the length, the specific beta data and the like. In addition, the test parameters are edited and stored through an edit message sub VI in the Labview test platform.
In addition, the above steps can also be carried out with bus configuration, message receiving and transmitting storage paths are set, when carrying out bus configuration, a user selects the number of bus channels and baud rate according to the needs, mode selection is carried out to determine whether to manually input test messages (manual) or import configuration files (automatic), the storage paths for receiving and sending messages are determined, and whether the test is started or not is controlled; if the configuration file is selected to be imported, reading the configuration file to output a test message; the method for manually inputting the test message is characterized in that the ID, the length and the beta data of the message are edited and selected to be sent for a user interaction interface; importing the configuration file further comprises: and when the driving message is input, the driving state is simulated and displayed in a chart form.
Then, setting the sending parameters of the test message; specifically, the bus is opened, and the setting of the sending parameters of the test message includes setting of the interval time of message sending, selection of single sending or continuous sending, and can be freely selected and set according to the needs of the user; the time interval of message sending is set, and overtime processing of the message can be realized. The message sending module defaults to include 10 pieces of message information, the message information can control a specific message imported from the configuration file area, the specific message can be visually divided into a sending button, a message type and a message ID, meanwhile, the message sending module includes specific bit control and a sub-interface related to message data calculation, and certainly, the message information can be continuously increased or reduced on the basis of 10 pieces of message information according to test requirements. The single sending is that 10 pieces of message information are sent in sequence once, and the sending is finished; the continuous sending is that 10 message messages are sent in sequence once and then are sent circularly continuously until the test message is stopped being sent. The message can be sent from any combination of 10.
And finally, comparing the test message with the outgoing message of the instrument to be tested to output a test report. Specifically, the comparison module receives the test message sent by the message sending module and the outgoing message of the instrument to be tested, and compares the test message with the outgoing message, so as to output a test report and realize the automation of the instrument test.
In addition, the user selects to send or stop the test message according to the requirement, and simultaneously records and stores the message; the automatic message storage function also provides guarantee for problem tracing in the future. And the type and the state of the bus frame can be directly fed back to a user in an indicator lamp mode, so that the abnormity can be found in time. And the transmitted test message and the received outgoing message are displayed, and compared with a traditional instrument test platform or tool, a user can visually check the record of the recently transmitted message on an interface, so that the current state of the instrument is more visually embodied.
By adopting the technical scheme, the Labview-based instrument testing method greatly shortens the testing period and reduces the error in manual testing; the automatic message storage function also provides guarantee for problem tracing in the future.
It should be noted that the above embodiments can be freely combined as necessary. The foregoing has outlined rather broadly the preferred embodiments and principles of the present invention and it will be appreciated that those skilled in the art may devise variations of the present invention that are within the spirit and scope of the appended claims.

Claims (10)

1. The Labview-based instrument testing system comprises a Labview testing platform and an instrument to be tested, and is characterized in that the Labview testing platform comprises:
the message configuration module is used for editing the test parameters into a configuration file or manually editing the test message;
the configuration file reading module is used for reading the configuration file to output a test message;
the bus configuration module is used for controlling the switch of the bus; the bus is used for connecting the Labview test platform and the instrument to be tested;
the message sending module is used for setting the sending parameters of the test message;
and the comparison module is used for comparing the test message with the outgoing message of the instrument to be tested so as to output a test report.
2. The Labview-based meter testing system of claim 1, wherein the Labview testing platform further comprises a message display module, and the message display module is configured to display the sent test message and the received outgoing message.
3. The Labview-based meter testing system of claim 2, wherein the Labview testing platform further comprises a packet storage module, and the packet storage module is configured to set a storage path for the transmitted and received packets.
4. The Labview-based meter testing system of claim 1, wherein the test parameters are compiled by a sub-VI of Labview.
5. The Labview-based meter testing system of claim 4, wherein the test parameters are edited into a configuration file, including editing the packet type, the packet ID, the enabled bit and the corresponding calculation formula, and finally outputting the configuration file capable of being imported into a Labview testing platform.
6. The Labview-based meter test system according to claim 1, wherein the manually editing the test message comprises: and manually editing the ID, the length and the beta data of the message.
7. The Labview-based meter testing system of claim 1, wherein the bus configuration module is further configured to configure the number of bus channels and the baud rate.
8. The Labview-based meter test system according to claim 1, wherein the parameters for sending the test message include interval time of message sending, single sending and continuous sending.
9. The Labview-based meter testing system of any one of claims 1-8, further comprising an indicator light for feedback of the connection status of the bus.
10. A Labview-based instrument testing method is applied to a Labview testing platform and a to-be-tested instrument which are connected through a bus, and is characterized by comprising the following steps of:
editing the test parameters into a configuration file or manually editing a test message; if the configuration file is selected to be imported, reading the configuration file to output a test message;
setting a sending parameter of the test message;
and comparing the test message with the outgoing message of the instrument to be tested to output a test report.
CN201810836247.5A 2018-07-26 2018-07-26 A kind of Meter Test system and test method based on Labview Pending CN109188117A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109946264A (en) * 2019-02-27 2019-06-28 昆明理工大学 A kind of spectrum analysis autocontrol method based on LabVIEW and Principal Component Analysis
CN111597105A (en) * 2020-04-03 2020-08-28 欧拓飞科技(珠海)有限公司 Automatic test system and method based on LV environment
CN112462727A (en) * 2019-09-09 2021-03-09 广州汽车集团股份有限公司 Vehicle-mounted part testing method and device
CN112763028A (en) * 2020-12-23 2021-05-07 宁波泽联科技有限公司 Intelligent meter calibration system and method for ultrasonic water meter
CN115599699A (en) * 2022-11-30 2023-01-13 合肥康芯威存储技术有限公司(Cn) BIT automatic testing method based on Jenkins

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130120001A1 (en) * 2011-11-11 2013-05-16 Hon Hai Precision Industry Co., Ltd. Voltage-drop testing system, voltage-drop control apparatus, and method thereof
CN103234572A (en) * 2013-05-11 2013-08-07 安徽工程大学 Check system for LabVIEW-based automobile instrument
CN103399568A (en) * 2013-07-12 2013-11-20 延锋伟世通电子科技(上海)有限公司 Automobile instrument durability test testing system with CAN (controller area network) bus
CN103812726A (en) * 2014-01-26 2014-05-21 烽火通信科技股份有限公司 Automated testing method and device for data communication equipment
CN106649099A (en) * 2016-11-15 2017-05-10 中国互联网络信息中心 Automatic testing method and system for DNS monitoring service

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130120001A1 (en) * 2011-11-11 2013-05-16 Hon Hai Precision Industry Co., Ltd. Voltage-drop testing system, voltage-drop control apparatus, and method thereof
CN103234572A (en) * 2013-05-11 2013-08-07 安徽工程大学 Check system for LabVIEW-based automobile instrument
CN103399568A (en) * 2013-07-12 2013-11-20 延锋伟世通电子科技(上海)有限公司 Automobile instrument durability test testing system with CAN (controller area network) bus
CN103812726A (en) * 2014-01-26 2014-05-21 烽火通信科技股份有限公司 Automated testing method and device for data communication equipment
CN106649099A (en) * 2016-11-15 2017-05-10 中国互联网络信息中心 Automatic testing method and system for DNS monitoring service

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109946264A (en) * 2019-02-27 2019-06-28 昆明理工大学 A kind of spectrum analysis autocontrol method based on LabVIEW and Principal Component Analysis
CN112462727A (en) * 2019-09-09 2021-03-09 广州汽车集团股份有限公司 Vehicle-mounted part testing method and device
CN111597105A (en) * 2020-04-03 2020-08-28 欧拓飞科技(珠海)有限公司 Automatic test system and method based on LV environment
CN112763028A (en) * 2020-12-23 2021-05-07 宁波泽联科技有限公司 Intelligent meter calibration system and method for ultrasonic water meter
CN115599699A (en) * 2022-11-30 2023-01-13 合肥康芯威存储技术有限公司(Cn) BIT automatic testing method based on Jenkins

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Application publication date: 20190111