CN109187418A - Terahertz imaging instrument - Google Patents
Terahertz imaging instrument Download PDFInfo
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- CN109187418A CN109187418A CN201811193566.5A CN201811193566A CN109187418A CN 109187418 A CN109187418 A CN 109187418A CN 201811193566 A CN201811193566 A CN 201811193566A CN 109187418 A CN109187418 A CN 109187418A
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- thz
- liquid crystal
- crystal display
- thz wave
- under test
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- 238000003384 imaging method Methods 0.000 title claims abstract description 30
- 239000004973 liquid crystal related substance Substances 0.000 claims abstract description 73
- 238000005315 distribution function Methods 0.000 claims abstract description 14
- 239000013078 crystal Substances 0.000 claims 1
- 239000007788 liquid Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000005314 correlation function Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical compound O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 208000019155 Radiation injury Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a kind of THz imagers, comprising: the source THz, for generating the THz wave of predeterminated frequency；Liquid crystal display, the direction emitted towards THz wave are arranged, and are arranged with the source THz in predetermined angle, the THz wave reflection that liquid crystal display emits the source THz to object under test；At least one THz intensitometer is arranged parallel with object under test, for receiving the THz wave for having passed through object under test；Imaging device, it is connect respectively with liquid crystal display and THz intensitometer, it is reconstructed for involving liquid crystal molecular orientation distribution function measuring targets in liquid crystal display according to the THz received, or is reconstructed according to the THz wave distribution function measuring targets that the THz received involves liquid crystal display reflection.It, which need to only be used to THz intensitometer, can be achieved with the imaging of measuring targets without using THz imaging array, and can use mature liquid crystal display panel growth manufacturing technology, and structure is simple, small in size, at low cost.
Description
Technical field
The present invention relates to technical field of semiconductors more particularly to a kind of terahertz imaging instrument.
Background technique
THz (Terahertz) radiation is the electromagnetic radiation of 0.1~10THz of frequency.THz wave wavelength is much smaller than microwave and millimeter wave
Wavelength, can be used for detecting smaller target and more accurate positioning；In addition, THz wave wavelength is much larger than the wavelength of visible light, it can
To penetrate dense smoke, Sand Dust Environment, wall can also be penetrated, house inside is scanned, it is small to human body radiation injury, it is complicated
Ideal imaging technique in environment, physics, life science, national security and anti-terrorism, etc. key areas all have application prospect.
But THz wave detector sensitivity is not high, usually requires low temperature environment, and THz wave detector to reduce noise
Integrated level is not high, expensive, volume is big, image quality is not high, has seriously affected the application of THz imaging.
Summary of the invention
The object of the present invention is to provide a kind of terahertz imaging instrument, efficiently solve existing terahertz imaging instrument integrated level not
High, expensive, volume is big, the not high technical problem of image quality.
Technical solution provided by the invention is as follows:
A kind of THz imager, comprising:
The source THz, for generating the THz wave of predeterminated frequency；
Liquid crystal display, the direction emitted towards THz wave are arranged, and are arranged with the source THz in predetermined angle, the liquid crystal display
Shield the THz wave reflection that emits the source THz to object under test；
At least one THz intensitometer is arranged parallel with object under test, for receiving the THz wave for having passed through object under test；
Imaging device is connect with liquid crystal display and THz intensitometer respectively, for involving liquid crystal according to the THz received
Liquid crystal molecular orientation distribution function measuring targets are reconstructed in display screen, or involve liquid crystal display according to the THz received
The THz wave distribution function measuring targets of screen reflection are reconstructed.
It is further preferred that the liquid crystal display is IPS (In-Plane Switching, plane conversion) liquid crystal surface
Plate.
It is further preferred that the point of the liquid crystal display is away from greater than 0.3mm.
It is further preferred that including a polarizing film in the THz imager, it is set between the source THz and liquid crystal display.
THz imager provided by the invention, beneficial effect are:
1. in the present invention, THz imager reflects THz wave using liquid crystal display, irradiate on object under test, and
The THz wave and liquid crystal for being received using THz intensitometer and having passed through the THz wave of object under test, and then received using THz intensitometer
The picture that object under test is calculated in association, or the THz wave received using THz intensitometer are done in liquid crystal molecular orientation distribution in display screen
It is associated with the picture that object under test is calculated with the THz wave distribution function of liquid crystal display reflection, need to only use and arrive THz intensity
Meter, without using THz imaging array, can be achieved with the imaging of measuring targets, and can use mature liquid crystal display panel growth
Manufacturing technology, structure is simple, small in size, at low cost.
2. in the present invention, liquid crystal display is IPS liquid crystal display panel, compared to traditional liquid crystal display panel, IPS liquid crystal display panel
Planar, upper layer will not absorb THz without ITO (tin indium oxide) transparent electrode electrode；In addition, in IPS liquid crystal display panel
Electrode and bottom plate there is stronger reflex to THz, constitute optics cavity configuration, significantly enhance the liquid crystal point of polarization
Son overcomes liquid crystal molecule this birefringent smaller disadvantage in THz frequency range to the regulating and controlling effect of THz wave.Further more, THz
Polarizing film between source and liquid crystal display strengthens regulation of the LCD screen to THz wave, improves image quality.
3. in the present invention, select low resolution high point away from liquid crystal display, be conducive to the diffraction for avoiding THz wave, mention
High imaging quality.
Detailed description of the invention
Below by clearly understandable mode, preferred embodiment is described with reference to the drawings, to above-mentioned characteristic, technical characteristic,
Advantage and implementation are further described.
Fig. 1 is a kind of embodiment schematic diagram of THz imager in the present invention.
Description of symbols:
The source 1-THz, 2- liquid crystal display, 3- object under test, 4-THz intensitometer, 5- imaging device.
Specific embodiment
Substantive content of the invention is further illustrated with example with reference to the accompanying drawing, but the contents of the present invention are not limited to
This.
It is as shown in Figure 1 a kind of embodiment schematic diagram of THz imager provided by the invention, it can be seen from the figure that
It include: the source THz 1, liquid crystal display 2, at least one THz intensitometer 4 and imaging device 5 in the THz imager, wherein liquid crystal
Display screen 2 is arranged towards the direction that THz wave emits, and is arranged with the source THz 1 in predetermined angle；THz intensitometer 4 and object under test 3 are simultaneously
Row setting, imaging device 5 are connect with liquid crystal display and THz intensitometer respectively.
During the work time, firstly, the source THz 1 generates the THz wave of predeterminated frequency according to demand, and by THz wave towards liquid crystal
The direction of display screen 2 is emitted；Later, position and angle, the THz wave that the source THz 1 is emitted for adjusting liquid crystal display 2 are anti-
It is incident upon object under test surface 3, shows that image carries out spatial modulation to THz wave by control liquid crystal display 2；THz wave passes through
After object under test, absorbed by the THz intensitometer 4 of setting parallel with it.Imaging device 5 obtains the THz wave that THz intensitometer absorbs
Signal n1, THz wave after liquid crystal molecular orientation distribution function is p (x, y) and liquid crystal display reflection in liquid crystal display point
Cloth is e (x, y), and then involves the pass in liquid crystal display between liquid crystal molecular orientation distribution function p (x, y) by calculating THz
Join relationship delta G1 (x, y)=< (n1-<n1>) [(p (x, y)-<p ( x,y )>] >, and pass through the secondorder correlation function Δ G1 (x, y)
Measuring targets are reconstructed using compressed sensing algorithm, obtain the picture of object under test；Or involve liquid crystal display by calculating THz
Shield incidence relation Δ G2 (x, y)=< (n between the THz wave distribution function e (x, y) of reflection1-<n1>)[(e(x,y)-<e(x,y)
>] >, and reconstructed by the secondorder correlation function Δ G2 (x, y) using compressed sensing algorithm, obtain the picture of object under test.Both
Utilizing liquid crystal molecular orientation distribution function p (x, y) to be associated in method, calculating is more simple, and processing speed faster, is suitable for
Fast imaging；Two using THz wave distribution function e (x, y) be associated calculate it is more accurate, it is relatively lower speed, be suitable for height
Precision imaging.
In this embodiment, different by reflectivity of the liquid crystal molecule of different orientation to THz wave, terahertz imaging instrument
Liquid crystal molecular orientation in liquid crystal display can be regulated and controled by extra electric field according to demand, when THz wave is by liquid crystal
When display screen reflects, the THz wave of reflection has certain spatial distribution.In instances, liquid crystal display is IPS liquid crystal display panel, and
Point is away from greater than 0.3mm (millimeter).As for the predetermined angle between the source THz and liquid crystal display, can carry out according to the actual situation
Setting, such as 30 °, 45 °, 60 °.
In another embodiment, in addition to including: the source THz, liquid crystal display, at least one THz intensity in THz imager
Except meter and imaging device, further includes a polarizing film, be set between the source THz and liquid crystal display.
During the work time, firstly, the source THz generates the THz wave of predeterminated frequency according to demand, and by THz wave towards liquid crystal
The direction of display screen is emitted；The THz wave of transmitting exposes to liquid crystal display screen surfaces by polarizing film；Later, liquid crystal display
Shield the THz wave reflection for emitting the source THz to object under test surface, shows that image carries out THz wave by control liquid crystal display
Spatial modulation；After THz wave has passed through object under test, absorbed by the THz intensitometer of setting parallel with it.Imaging device obtains
The THz wave signal n that THz intensitometer absorbs1, liquid crystal molecular orientation distribution function is p (x, y) and liquid crystal display in liquid crystal display
Shield being distributed as e (x, y) for the THz wave after reflecting, and then involves liquid crystal molecular orientation distribution in liquid crystal display by calculating THz
Incidence relation Δ G1 (x, y) between function p (x, y)], and by secondorder correlation function Δ G1 (x, the y) measuring targets into
Row reconstruct, obtains the picture of object under test；Or involve the THz wave distribution function e (x, y) of liquid crystal display reflection by calculating THz
Between incidence relation Δ G2 (x, y)], and be reconstructed by secondorder correlation function Δ G2 (x, the y) measuring targets, obtained
The picture of object under test.
It should be noted that above-described embodiment can be freely combined as needed.The above is only of the invention preferred
Embodiment, it is noted that for those skilled in the art, in the premise for not departing from the principle of the invention
Under, several improvements and modifications can also be made, these modifications and embellishments should also be considered as the scope of protection of the present invention.
Claims (4)
1. a kind of terahertz imaging instrument, which is characterized in that include: in the terahertz imaging instrument
THz source, for generating the THz wave of predeterminated frequency；
Liquid crystal display, the direction emitted towards THz wave are arranged, and are arranged with THz source in predetermined angle, the liquid crystal
The THz wave that THz source emits is reflexed to object under test by display screen；
At least one Terahertz intensitometer is arranged, parallel for receiving the THz wave for having passed through object under test with object under test；
Imaging device is connect with liquid crystal display and Terahertz intensitometer respectively, for involving liquid according to the Terahertz received
Liquid crystal molecular orientation distribution function measuring targets are reconstructed in crystal display screen, or involve liquid crystal according to the Terahertz received
The THz wave distribution function measuring targets of display screen reflection are reconstructed.
2. terahertz imaging instrument as described in claim 1, which is characterized in that the liquid crystal display is IPS liquid crystal display panel.
3. terahertz imaging instrument as claimed in claim 2, which is characterized in that the point of the liquid crystal display is away from greater than 0.3
mm。
4. terahertz imaging instrument as claimed in any one of claims 1-3, which is characterized in that wrapped in the terahertz imaging instrument
A polarizing film is included, is set between THz source and liquid crystal display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811193566.5A CN109187418B (en) | 2018-10-12 | 2018-10-12 | Terahertz imager |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811193566.5A CN109187418B (en) | 2018-10-12 | 2018-10-12 | Terahertz imager |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109187418A true CN109187418A (en) | 2019-01-11 |
| CN109187418B CN109187418B (en) | 2021-10-26 |
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ID=64944751
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811193566.5A Active CN109187418B (en) | 2018-10-12 | 2018-10-12 | Terahertz imager |
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|---|---|---|---|---|
| CN105158893A (en) * | 2015-09-29 | 2015-12-16 | 南京理工大学 | Light-field imaging method for programmable aperture microscope system based on LCD panel |
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| CN106353834A (en) * | 2016-09-09 | 2017-01-25 | 深圳市太赫兹***设备有限公司 | Terahertz imaging system and terahertz security device |
| CN106404171A (en) * | 2016-10-21 | 2017-02-15 | 北京理工大学 | Liquid crystal hyperspectral calculation imaging measurement device and method of three-dimensional encoding |
| CN207264069U (en) * | 2017-07-28 | 2018-04-20 | 广西天山电子股份有限公司 | A kind of cholesteric liquid crystal device and beam control system |
-
2018
- 2018-10-12 CN CN201811193566.5A patent/CN109187418B/en active Active
Patent Citations (6)
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|---|---|---|---|---|
| CN105158893A (en) * | 2015-09-29 | 2015-12-16 | 南京理工大学 | Light-field imaging method for programmable aperture microscope system based on LCD panel |
| CN105158887A (en) * | 2015-09-29 | 2015-12-16 | 南京理工大学 | Multi-mode microimaging method based on programmable LED array illumination |
| CN106053433A (en) * | 2016-06-17 | 2016-10-26 | 中国科学院光电研究院 | Laser-induced spectrum analysis method and laser-induced spectrum analysis device based on optical modulation compression dimension reduction perception |
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| CN207264069U (en) * | 2017-07-28 | 2018-04-20 | 广西天山电子股份有限公司 | A kind of cholesteric liquid crystal device and beam control system |
Non-Patent Citations (1)
| Title |
|---|
| RYOTA ITO 等: "Introduction of Liquid Crystal device into THz phase imaging", 《PROCEEDINGS OF SPIE》 * |
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| CN109187418B (en) | 2021-10-26 |
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