CN109164399B - Power supply test system and test method - Google Patents
Power supply test system and test method Download PDFInfo
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- CN109164399B CN109164399B CN201811049144.0A CN201811049144A CN109164399B CN 109164399 B CN109164399 B CN 109164399B CN 201811049144 A CN201811049144 A CN 201811049144A CN 109164399 B CN109164399 B CN 109164399B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
- G01R31/42—AC power supplies
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Abstract
The invention relates to a power supply test system, comprising: a main processor; the alternating current electrifying module is connected between the main processor and the power supply to be tested and is used for receiving the control signal of the main processor and providing preset voltage for the power supply to be tested; the sampling control module is connected between the main processor and the output end of the power supply to be tested, is controlled by the main processor, and is used for receiving a control signal of the main processor and sequentially switching on each power supply to be tested; and the load module is connected with the main processor, is used for being connected to the output end of each power supply to be tested, and is used for providing a preset load for each power supply to be tested. The test system completes the test of a plurality of power supplies in one test period, and the test efficiency is improved. The invention also relates to a power supply testing method, which comprises the steps of providing preset voltage for each power supply to be tested; sequentially connecting the main processor with the output end of the power supply to be tested, providing a preset load, and sequentially sampling the output voltage of the power supply to be tested; and adjusting the preset voltage or the preset load, and repeating the steps.
Description
Technical Field
The invention relates to the field of power supply testing, in particular to a direct-current power supply testing system and a direct-current power supply testing method.
Background
In the manufacturing process of the power supply, the performance of the power supply is usually required to be tested, and the index parameters of the power supply performance are a source regulation rate and a load regulation rate, wherein the source regulation rate is the condition that the load connected with the power supply output is full load, the output voltage fluctuates along with the change of the input voltage, and the load regulation rate is the fluctuation of the output voltage along with the change of the load when the input is rated voltage. The power supply test is an important process in a power supply production system, and has important influence on the production efficiency and the product quality of the power supply. At present, the power supply is tested by connecting a power supply product into a test system one by one after being assembled, the test system needs to be restarted once when testing one power supply, and when a manufacturer needs to test a large batch of power supplies, the whole test time is prolonged, the test efficiency of the power supplies is reduced, and the whole production efficiency is influenced.
Disclosure of Invention
Therefore, a new power supply testing system and a testing method are provided for solving the problem of low testing efficiency of the power supply testing system.
A power supply test system is used for carrying out power-on test on M power supplies to be tested, wherein M is more than or equal to 2, and the power supply test system comprises:
the main processor is used for outputting a plurality of paths of control signals and sampling the output voltage of each power supply to be tested in sequence;
the alternating current electrifying module is connected with the main processor at one end, connected with the input end of each power source to be tested at the other end, and used for receiving a first control signal of the main processor and providing preset voltage for each power source to be tested;
the sampling control module comprises a first control end, a first output end and M first input ends, wherein each first input end is used for being connected with the output end of a power supply to be tested, the first output end is connected with the main processor, and the first control end is connected with the main processor and used for receiving a second control signal of the main processor and sequentially connecting each first input end with the first output end; and
and the load module is connected with the main processor, is used for being connected to the output end of each power supply to be tested, and is used for receiving the third control signal of the main processor and providing a preset load for each power supply to be tested.
According to the power supply test system, when the test system is started once, a plurality of power supplies can be tested, and the main processor can be sequentially connected with the output ends of the plurality of power supplies according to a certain sequence through the sampling control module so as to sequentially sample the output voltage of the power supplies. Meanwhile, the test system also comprises an alternating current power-on module and a load module, the alternating current power-on module can input preset voltage to the power supply, the load module can be connected with a preset load for the power supply, the alternating current power-on module and the load module can be adjusted, the preset voltage can be changed, namely the input voltage of the power supply is changed, the output voltage of each power supply is sampled in sequence, the source regulation rate of each power supply can be calculated, the load connected with the power supply can be changed by adjusting the load module, the output voltage of each power supply is sampled in sequence, the load regulation rate of each power supply can be calculated, and therefore the test of a plurality of power supplies is completed in one starting period of the system. Compared with a method for testing only one power supply by starting a test system once, the test system can test a plurality of power supplies once, greatly saves test time and improves test efficiency. When M power supplies need to be tested, the system is used for testing, corresponding output voltages of all power supplies can be sampled by changing the preset voltage and the preset load once, namely the times of changing the preset voltage and the preset load in one starting period are irrelevant to the number of the connected power supplies, the change time is set to be N, when only one power supply can be tested in one starting period of the testing system, the change times of the preset voltage and the preset load are M x N, the more the change times of related modules are, the higher the change frequency of the modules is, the higher the working temperature of the modules is, the worse the performance of the modules is, and the final testing precision is influenced.
In one embodiment, the AC power-on module includes a slave processor, a programmable AC power source, and an AC power-on control module, the first control signal comprises a first voltage regulating signal and a first switching signal, the slave processor is respectively connected with the master processor and the programmable alternating current power supply in a communication way, for receiving a first voltage adjustment signal of the main processor and controlling the programmable ac power supply to generate a preset voltage, the alternating current power-on control module comprises a second input end, a second control end and a second output end, the second input end is connected with the programmable alternating current power output end, the second output end is used for being connected with the input end of each power supply to be tested, the second control end is connected with the main processor, and the alternating current power supply control module is used for receiving a first switching signal of the main processor and controlling the on-off of the alternating current power supply control module.
In one embodiment, the sampling control module comprises:
the input end of the decoder is used as the control end of the sampling control module and connected with the main processor, and the decoder is used for receiving a second control signal of the main processor and comprises M output ends, and each output end of the decoder is respectively used for outputting a corresponding level signal;
the input end of each first switch unit is used as a first input end of the sampling control module and is used for being connected with the output end of a power supply to be tested, the output end of each first switch unit is connected as a first output end of the sampling control module and is connected with the main processor, and the control end of each first switch unit is respectively connected with one output end of the decoder and is used for controlling the on-off of each first switch unit according to a level signal at the output end of the decoder.
In one embodiment, the first switching unit includes:
the control end of the first switch tube is connected with one output end of the decoder and used for receiving the level signal output by the decoder to control the on-off of the first switch tube;
the input end of the first relay serves as the input end of the first switch unit and is used for being connected with the output end of a power supply to be tested, the output end of the first relay serves as the output end of the first switch unit and is connected with the main processor, and the control end of the first relay is connected with the first switch tube and is used for controlling the on-off of the first relay according to the on-off of the first switch tube.
In one embodiment, the load module includes an arbitration voltage generation module and a current regulation module, the arbitration voltage generation module is connected to the main processor and configured to receive a third control signal of the main processor and output an appropriate arbitration voltage, the current regulation module includes a first operational amplifier, a sampling resistor, and a second switching tube, a non-inverting input terminal of the first operational amplifier is connected to the arbitration voltage generation module and configured to obtain the arbitration voltage, one end of the sampling resistor is connected to a first output terminal of the sampling control module through the second switching tube and is connected to an inverting input terminal of the first operational amplifier, the other end of the sampling resistor is grounded, and a control terminal of the second switching tube is connected to an output terminal of the first operational amplifier.
In one embodiment, the decision voltage generating module includes a second operational amplifier, a voltage regulator diode, an adjustable resistor module, and first to fifth resistors, a positive input terminal of the second operational amplifier is connected to the first output terminal of the sampling control module through a first resistor, a negative input terminal of the second operational amplifier is connected to ground through a third resistor, and is connected to an output terminal of the second operational amplifier through a second resistor, negative terminals of the voltage regulator diode are respectively connected to the positive input terminal of the second operational amplifier, the output terminal of the second operational amplifier through a fourth resistor, and one terminal of the adjustable resistor module through a fifth resistor, the other terminal of the adjustable resistor module is connected to ground, a control terminal of the adjustable resistor module is connected to the main processor to receive a third control signal of the main processor, and the adjustable resistor module is configured to generate an appropriate adjustable resistor according to the third control signal, and the connecting end of the fifth resistor and the adjustable resistor module is used as the output end of the judgment voltage generation module to output the judgment voltage.
In one embodiment, the power supply test system further includes a ripple processing module, where the ripple processing module includes a filtering unit and a subtraction unit, an input end of the filtering unit is connected to the first output end of the sampling control module and is configured to acquire and filter a ripple of the output voltage of the power supply to be tested, one input end of the subtraction unit is connected to an output end of the filtering unit, another input end of the subtraction unit is connected to the first output end of the sampling control module, the subtraction unit is configured to acquire a ripple in the output voltage of the power supply to be tested, and an output end of the subtraction circuit is connected to the main processor.
In one embodiment, the power supply test system further comprises an upper computer, wherein the upper computer is in communication connection with the main processor and is used for issuing a test instruction to the main processor and acquiring sampling data of the main processor.
A power supply test method is used for carrying out power-on test on M power supplies to be tested, wherein M is more than or equal to 2, and the power supply test method comprises the following steps:
step A: providing preset voltage for each power supply to be tested;
and B: sequentially connecting a main processor with the output end of the power supply to be tested, providing a preset load for the connected power supply to be tested, and sequentially sampling the output voltage of the connected power supply to be tested;
and C: and C, adjusting the preset voltage or the preset load, and repeating the step B.
According to the power supply testing method, in a one-time starting period of a system, a plurality of power supplies can be tested, compared with the method that only one power supply is tested at one time when the system is started, the testing time is greatly reduced, the testing efficiency is improved, the preset voltage or the preset load changes once, the corresponding output voltages of all the power supplies can be sampled, the change times of the preset voltage or the preset load in the whole testing process are relatively reduced, the change frequency is reduced, the heat generation in the testing process is reduced, the working state of each working module is better, and the finally obtained testing result is higher in precision.
In one embodiment, the power supply testing method further comprises a ripple testing method, and the ripple testing method comprises:
acquiring the output voltage of the power supply to be tested and filtering the ripple waves of the output voltage to obtain a direct current component;
and subtracting the direct current component from the output voltage to obtain the ripple of the output voltage.
Drawings
FIG. 1 is a block diagram of a power supply test system;
FIG. 2 is a block diagram of a power supply test system according to an embodiment;
FIG. 3a is a block diagram of a sampling control module according to an embodiment;
FIG. 3b is a schematic diagram of an embodiment of a decoder;
FIG. 3c is a schematic diagram illustrating the connection of M first switch units according to an embodiment;
FIG. 4a is a circuit diagram of a load module according to an embodiment;
FIG. 4b is a circuit diagram of a load module in another embodiment;
FIG. 5a is a circuit diagram of a filter unit according to an embodiment;
FIG. 5b is a circuit diagram of a subtraction unit in an embodiment;
FIG. 6 is a diagram of host processor connections in one embodiment;
FIG. 7 is a diagram of a slave processor connection in one embodiment;
FIG. 8 is a flowchart illustrating the steps of a power testing method according to an embodiment.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
As shown in fig. 1, the power supply test system is used for performing power-on test on M power supplies to be tested, and includes a main processor, and an ac power-on module, a sampling control module, and a load module connected to the main processor. The main processor is used for outputting a plurality of paths of control signals to control the alternating current electrifying module, the sampling control module and the load module so as to be sequentially connected with the output end of each power supply to be tested, and therefore the output voltage of each power supply to be tested is sequentially sampled. The alternating current power-on module is connected between the main processor and the power source to be tested, and is used for receiving a first control signal of the main processor and providing preset voltage for each power source to be tested. The sampling control module comprises a first control end, a first output end and M first input ends, each first input end is used for being connected with the output end of a power supply to be tested, that is, M first input ends are correspondingly connected with the output ends of M power supplies to be tested one by one, the first output end of the sampling control module is connected with the main processor, the first control end of the sampling control module is connected with the main processor, the second control signal is used for receiving the main processor and can be selected to switch on the connection of the first output end and one of the first input ends according to the difference of the second control signal, therefore, after the output end of one power supply to be tested is connected with the main processor, the first input end is connected with the first output end, and the output voltage signal sequentially flows through the first input end and the first output end of the sampling control module from the output end of the power supply to be detected and is input into the main processor, so that the main processor samples the output voltage of the switched-on power supply to be detected. It should be noted that the main processor only receives one voltage signal at a time at a sampling port, i.e. the first output terminal can only be connected to one first input terminal at a time. And sequentially switching on all the power supplies to be tested by changing the second control signal, and sequentially completing sampling of output voltages of all the power supplies to be tested. The load module is connected with the main processor and connected to the output end of each power supply to be tested, and is used for receiving a third control signal of the main processor and providing a preset load for each power supply to be tested, and the preset load can be adjusted according to different third control signals. In an embodiment, the load module is specifically connected to the first output terminal of the sampling control module, and when the main processor is connected to an output terminal of a power supply to be tested through the sampling control module, the load module is also connected to the output terminal of the power supply to be tested through the sampling control module and provides a preset load for the connected power supply to be tested.
According to the power supply testing system, the main processor can be sequentially connected with the output ends of the M power supplies to be tested through the sampling control module, after the preset voltage is set through the alternating current electrifying module and the preset load is set through the load module, the main processor can sequentially sample the output voltage of each power supply to be tested, and after the preset voltage or the preset load is changed, the output voltage of each power supply to be tested is continuously and sequentially sampled, so that the source regulation rate and the load regulation rate of each power supply to be tested are calculated, and the testing of the performance of the power supplies is completed. The power supply testing system can test the power supplies in batches once started, namely, the power supplies can be tested in batches at the stage that the power supply splicing plates are not separated, and compared with the mode that the system is started once after the power supplies are assembled, the power supply testing system can only test one power supply, the whole testing time is greatly reduced, and therefore the testing efficiency is improved. In the test system, the preset voltage or the preset load is adjusted once, all power supplies can be sampled, and compared with the situation that the preset voltage and the preset load need to be adjusted again when one power supply is tested, the preset voltage and the preset load of the test system are greatly reduced in adjusting frequency, the stability of the working state of a system module is facilitated, and the test result precision is higher.
In one embodiment, as shown in fig. 2, the ac power-on module (not shown) includes a slave processor, a programmable ac power source, and an ac power-on control module, wherein the slave processor and the programmable ac power source constitute an ac power adjusting module, and different preset voltages are generated by the ac power adjusting module. Specifically, the first control signal output by the master processor may include a first voltage adjustment signal and a first switching signal, the slave processor is respectively in communication connection with the master processor and the programmable ac power supply, and the slave processor receives the first voltage adjustment signal of the master processor and controls the programmable ac power supply to generate a corresponding preset voltage. The alternating current power-on control module comprises a second input end, a second output end and a second control end, wherein the second input end is connected with the output end of the programmable alternating current power supply and used for receiving the preset voltage generated by the programmable alternating current power supply, the second output end is connected with the input end of each power supply to be detected and used for inputting the preset voltage to each power supply, and the second control end is connected with the main processor and used for receiving a first switching signal of the main processor and controlling the on-off of the alternating current power-on control module, namely controlling the on-off of the connection of the second input end and the second output end. When the second input end is connected and conducted with the second output end, the input end of each power supply to be tested is connected with a preset voltage; when the second input end is disconnected with the second output end, no input voltage exists at the input end of each power supply to be tested. When the test is started, the alternating current power-on control module needs to be switched on, and when the test is finished, the alternating current power-on control module needs to be switched off. In this embodiment, the preset load is set to be in a full-load state, the preset voltage is changed through the alternating current adjusting module, and the output voltages of the power supply to be measured corresponding to different preset voltages are sampled, so that the source regulation rate of the power supply to be measured can be obtained.
In one embodiment, as shown in fig. 3a, the sampling control module includes a decoder and M first switch units connected to the decoder, each of the M first switch units includes an input terminal DC, an output terminal and a control terminal. The decoder comprises M output ends, generates M level signals at the M output ends according to the first control signal of the main processor, and outputs a corresponding level signal at each output end. Each input end of the M first switch units is used as one input end of the sampling control module and is used for being connected with the output end of one power supply to be tested to obtain the output voltage of the corresponding power supply to be tested, namely the input ends of the M first switch units are correspondingly connected with the output ends of the M power supplies to be tested one by one; the output ends of the M first switch units are connected and used as first output ends DC _ IN of the sampling control module to be connected with the main processor; the control end of each first switch unit is respectively connected with one output end of the decoder to obtain a level signal of the output end of the decoder, and the control end of each first switch unit is used for controlling the on-off of the corresponding first switch unit according to the level signal. In one embodiment, when the receiving level of the control terminal of the first switch unit is high level, the first switch unit is turned on, when the receiving level of the control end of the first switch unit is low level, the first switch unit is disconnected, the main processor sends a second control signal to the decoder, the second control signal can be binary code, and is decoded by a decoder to generate M level signals, wherein, the level signal of only one output end is high level, the level signals of the other output ends are low level, the control end is connected with the first switch unit with high level to be conducted, the power supply to be tested connected with the first switch unit transmits the output voltage to the main processor through the first switch unit, thereby realizing the sampling of the main processor on the output voltage of the power supply to be tested, and the first switch units with the control ends connected to the low level are all disconnected, so that the main processor only samples the output voltage of one power supply to be tested at one time. By changing the second control signal, other output ends of the decoder can be controlled to output high level signals in turn, namely, sampling of other power supplies to be tested is completed in turn.
In one embodiment, the sampling control module comprises M first switch units, each of which comprises a first switch tube and a first relay connected with each other. The control end of the first switch tube is used as the control end of the first switch unit and connected with the output end of the decoder, the input end of the first relay is used as the input end of the first switch unit and connected with the output end of the power source to be tested, the output end of the first relay is used as the output end of the first switch unit and connected with the main processor, and the control end of the first relay is connected with the first switch tube and used for controlling the on-off of the first relay according to the on-off of the first switch tube. In an embodiment, as shown in fig. 3c, the first relay is a normally open relay, the first switch tube may be an NPN transistor, one end of the first relay coil may be connected to a power supply VCC2, the other end of the first relay coil is connected to a collector of the NPN transistor, a base of the NPN transistor serves as a control end of the first switch unit and is connected to a level signal of the decoder, an emitter of the NPN transistor is grounded through a resistor, one contact of the relay serves as an input end of the first switch module and is connected to an output end of the power supply to be tested, and the other contact of the relay serves as an output end of the first switch unit and is connected to the main processor.
In one embodiment, M ═ 16, i.e., the test system can test 16 power supplies to be tested at a time, and the decoder is a 4-line to 16-line decoder, such as a 74LS154 decoder. As shown in fig. 3b, the 4-line-16-line decoder includes 4 input terminals, which are A, B, C, D four ports respectively, the four input terminals are connected to the main processor as a first control terminal DK1 of the sampling control module, and are configured to receive a second control signal of the main processor, in this embodiment, the second control signal is a four-bit binary code, the 4-line-16-line decoder further includes 16 output terminals, which are 0 to 15 ports respectively, and correspondingly output level signals are JQC0 to JQC15 respectively. As shown IN fig. 3c, the sampling control module includes 16 first switch units, that is, 16 first relays, which are J0 to J15, and 16 triodes, which are Q0 to Q15, bases of the triodes Q0 to Q15 are respectively connected to level signals JQC0 to JQC15, input ends DC0 to DC15 of the first relays J0 to J15 are respectively connected to output ends of the 16 power supplies to be tested to respectively obtain output voltages of the power supplies to be tested, and output ends of the first relays J0 to J15 are connected to serve as a first output end DC _ IN of the sampling control module and to be connected to the main processor. In this embodiment, the turned-on first switch unit is controlled by changing the second control signal, so as to select the power source to be tested for sampling, for example, when the second control signal is the binary code 0000, the port 0 of the decoder outputs a high level, that is, JQC0 is a high level, the transistor Q0 is turned on, the first relay J0 is turned on, and the output voltage of the power source to be tested connected to the input terminal DC0 is sampled, and similarly, when the second control signal is changed, the binary code is 1111, the corresponding decimal number is 15, the output voltage of the power source to be tested connected to the input terminal DC15 is sampled, that is, when the decimal number corresponding to the binary code is K, the output voltage of the corresponding power source to be tested connected to the input terminal DCK is sampled, thereby sequentially completing the sampling of 16 power sources to be tested.
In one embodiment, as shown in fig. 4a, the load module includes an arbitration voltage generation module and a current regulation module. The arbitration voltage generation module is connected with the main processor and used for receiving a third control signal of the main processor and generating an appropriate arbitration voltage V0 according to the third control signal. The current regulation module comprises a first operational amplifier UA, a sampling resistor R9 and a second switching tube, wherein the positive phase input end of the first operational amplifier UA is connected with the judgment voltage generation module and used for obtaining the judgment voltage, one end of the sampling resistor R9 is connected to the first output end DC _ IN of the sampling control module through the second switching tube and is connected with the reverse phase input end of the first operational amplifier UA, the other end of the sampling resistor R9 is grounded, and the output end of the first operational amplifier UA is connected with the control end of the second switching tube. In an embodiment, the second switch tube is an NPN-type transistor, which may be a single transistor or a cascade of multiple transistors. IN this embodiment, a transistor Q16 and a transistor Q17 are selected to be cascaded to form a second switching tube, wherein collectors of the transistor Q16 and the transistor Q17 are connected to a first output terminal DC _ IN of the sampling control module, a base of the transistor Q16 is connected to an output terminal of the first operational amplifier UA, an emitter of the transistor Q16 is connected to a base of the transistor Q17, and an emitter of the transistor Q17 is connected to the sampling resistor R9. IN this embodiment, under a stable condition, the voltage V9 across the sampling resistor R9 is equal to the decision voltage V0, and when the power output current fluctuates, if the current of the first output terminal DC _ IN of the sampling control module increases, the current flowing through the sampling resistor R9 increases, and V9 increases, that is, when the voltage at the inverting input terminal of the first operational amplifier UA is greater than the decision voltage V0, the second operational amplifier UA outputs a low level to control the voltage drop of the base of the transistor Q16, so that the voltage of the base of the transistor Q17 decreases, the current of the emitter of the transistor Q17 decreases, and the current flowing through the sampling resistor R9 decreases; when the current of the first output terminal DC _ IN port of the sampling control module decreases, the current flowing through the sampling resistor R9 decreases, and V9 decreases, that is, when the voltage of the inverting input terminal of the first operational amplifier UA is less than the arbitration voltage V0, the second operational amplifier UA outputs a high level, and controls the base voltage of the triode Q16 to increase, so that the base voltage of the triode Q17 increases, the emitter current of the triode Q17 increases, and the current flowing through the sampling resistor R9 increases, so that the output current of the power supply to be tested is maintained IN a stable state, that is, the load module is actually a passive constant-current electronic load, and the arbitration voltage is adjusted, so that the voltage of the sampling resistor R9 can be changed, so that the current of the sampling resistor R9 is changed, thereby adjusting the output current of the power supply to be tested, and changing the preset load. In this embodiment, the output current of the power source to be measured is adjusted through the load module, so as to adjust the load state of the power source to be measured, the preset voltage can be controlled to be the rated voltage, that is, the input voltage of the power source to be measured is the rated voltage, the load state is adjusted, the output voltages of the power sources to be measured in different load states are sampled, and the load adjustment rate of each power source to be measured can be calculated.
IN one embodiment, as shown IN fig. 4a, the arbitration voltage generation module includes a second operational amplifier UA, a voltage regulator diode D1, an adjustable resistance module and first to fifth resistors R1 to R5, a positive phase input terminal of the second operational amplifier UB is connected to the first output terminal DC _ IN of the sampling control module through the first resistor R1, an inverting input terminal of the second operational amplifier UB is grounded through the third resistor R3 and is connected to an output terminal of the second operational amplifier U2 through the second resistor R2, inverting terminals of the voltage regulator diode D1 are respectively connected to the positive phase input terminal of the second operational amplifier UB, the output terminal of the second operational amplifier UB is connected to the fourth resistor R4 and is connected to one end of the adjustable resistance module through the fifth resistor R5, the other end of the adjustable resistance module is grounded, a control terminal of the adjustable resistance module is connected to the main processor as a control terminal DK2 of the load module for receiving a third control signal of the main processor, the adjustable resistance module generates a proper adjustable resistance according to the third control signal, and the connection end of the fifth resistance and the adjustable resistance module is used as the output end of the arbitration voltage generation module to output the arbitration voltage V0. In this embodiment, the voltage of the zener diode is constant, and the voltage division between the fifth resistor and the adjustable resistor module can be changed by adjusting the adjustable resistor module, so as to change the arbitration voltage V0.
In one embodiment, as shown in fig. 4b, the first operational amplifier and the second operational amplifier are specifically integrated into a dual operational amplifier device U1, such as an ST358 dual operational amplifier device. The main processor can change the resistance of the adjustable resistance module by adjusting the third control signal, and in an embodiment, the adjustable resistance module includes a plurality of resistances and a plurality of second switch units, and the second switch unit controls the resistance to be connected to the circuit. In one embodiment, the adjustable resistance module comprises sixth to eighth resistors R6 to R8, and further comprises two second switch units which respectively control the seventh resistor R7 and the eighth resistor R8 to be connected into the circuit, each second switch unit comprises a third switch tube and a second relay, each second relay is a double-contact relay, each double-contact relay comprises a normally open contact, a normally closed contact and a common contact, each common contact and the normally open contact form a normally open triggering function, and each common contact and the normally closed contact form a normally closed triggering function. In this embodiment, as shown in fig. 4b, the third switching tube may be a transistor, and specifically may be an NPN-type transistor, the transistor Q18 and the relay JQ1 are used to control the connection of the eighth resistor R8, and the transistor Q19 and the relay JQ2 control the connection of the seventh resistor R7. An eighth resistor R8 is connected between a normally closed contact OUT11 and a normally open contact OUT12 of the relay JQI, a normally closed contact OUT11 of the relay is grounded after being shorted with a common contact IN1, a seventh resistor R7 is connected between a normally closed contact OUT21 and a normally open contact OUT22 of the relay JQ2, the common contact of the relay JQ2 is connected with a normally open contact OUT2 of the relay JQ1, one end of a sixth resistor R6 is connected with a normally open contact OUT22 of the relay JQ2, the other end serves as a connecting end of an adjustable resistor module and is connected with a fifth resistor R5, one end S12 of a coil of the relay JQ1 is connected with a first output end DC _ IN of a sampling control module, the output voltage of a power supply to be tested can be obtained through the sampling control module, the other end S9 is connected with a collector of a triode Q18, an emitter of a triode Q18 is grounded through a resistor, a base of a triode Q18 is connected with the main processor through a resistor for obtaining a third control signal of, the third control signal can be a high level signal or a low level signal, when the base of the transistor Q18 is a high level signal, the transistor Q18 is turned on, the coil of the relay JQ1 is energized, the normally closed contact is opened, the normally open contact is closed, namely, the connection between the common contact IN1 and the normally closed contact OUT11 is opened, the common contact IN1 and the normally open contact OUT12 are closed, at the moment, the eighth resistor R8 is short-circuited by the relay JQ1, otherwise, when the base of the transistor Q18 is a low level signal, the eighth resistor R8 is connected IN series with the circuit. One end S22 of the coil of the relay JQ2 is connected to the first output terminal DC _ IN of the sampling control module, the output voltage of the power supply to be tested can be obtained through the sampling control module, the other end S21 is connected with the collector of the triode Q19, the emitter of the triode Q19 is grounded through a resistor, the base of the triode Q19 is connected with the main processor through a resistor, and is used for obtaining the third control signal of the main processor and controlling the on-off of the transistor Q19. similarly, when the input signal to the base of the transistor Q19 is a high level signal, then the transistor Q19 is conducted, the coil of the relay JQ2 is electrified, the normally closed contact is opened, the normally open contact is closed, that is, the connection between the common contact IN2 and the normally closed contact OUT21 is broken, the common contact IN2 and the normally open contact OUT22 are closed, the seventh resistor R7 is short-circuited by the relay JQ2, and vice versa, when the signal inputted to the base of the transistor Q19 is a low level signal, the seventh resistor R7 is connected in series to the circuit. The resistance value of the adjustable resistance module can be changed by changing the third control signal, namely changing the level signal of the control end of the third switching tube, so that the judgment voltage is adjusted, and different loads are provided for the power supply to be tested.
In an embodiment, as shown in fig. 2, the power supply testing system further includes a ripple processing module, and the ripple processing module is configured to obtain a ripple content in the output voltage of the power supply. IN an embodiment, the ripple processing module includes a filtering unit and a subtraction unit, wherein an input end of the filtering unit is connected to a first output end DC _ IN of the sampling control module, and is configured to obtain an output voltage of the power supply to be measured and filter the output voltage, so as to filter out ripples therein to obtain a direct current component, and then output the direct current component, one input end of the subtraction unit is connected to the first output end DC _ IN of the sampling control module, and the other input end of the subtraction unit is connected to an output end of the filtering unit, and is configured to subtract a tributary component from the output voltage of the power supply to be measured to obtain a ripple component, an output end of the subtraction unit is connected to the main processor.
In an embodiment, as shown in fig. 5a, the filter unit circuit is connected to achieve filtering by a parallel capacitor and a series inductor, and outputs a DC component at the output terminal DC _ COM. IN one embodiment, as shown IN fig. 5b, the subtracting unit includes a subtracting circuit formed by an operational amplifier U2, wherein a non-inverting input terminal of the operational amplifier U2 is connected to the first output terminal DC _ IN of the sampling control module through a resistor R53 and is connected to ground through a resistor R54, an inverting input terminal of the operational amplifier U2 is connected to the output terminal DC _ COM of the filtering power supply through a resistor R52 and is connected to the output terminal of the operational amplifier U2 through a resistor R51, and an output terminal of the operational amplifier U2 is connected to the main processor through a filtering capacitor C5. The operational amplifier U2 may perform a subtraction operation on the two input voltages to obtain a ripple component and input the ripple component to the main processor. IN one embodiment, R54/R53 may be R51/R52, and if the power output voltage input to the DC _ IN terminal is Vdc and the DC component input to the DC _ COM terminal is Va, the output result of the operational amplifier U2 is Vb — R51(Vdc-Va)/R52, and the result is connected to the main processor, so that the ripple content may be calculated.
In an embodiment, as shown in fig. 2, the power supply testing system further includes an upper computer, which is in communication connection with the main processor, and is configured to send a test instruction to the main processor and obtain sampling data of the main processor. In this embodiment, a test instruction is specifically issued by the upper computer, for example, working parameters of each module are set and a test process is controlled, output voltage and ripple waves sampled by the main processor are sent to the upper computer, and the upper computer processes data and displays a test result.
In one embodiment, as shown in fig. 6, the main processor includes a main control chip and a peripheral circuit connected to the main control chip. The peripheral circuit 1 is a crystal oscillator circuit and is used for providing time pulses for the main control chip. The peripheral circuit 2 is a RESET circuit, and when the switch S1 is closed and the time for the RESET pin of the main control chip to access the low level is longer than the time pulse of the main control chip, the main control chip RESETs. The peripheral circuit 3 is a start circuit, when the switch S2 is closed, the PD2 pin of the main control chip is at a low level, and the main control chip queries whether the PD2 pin is at a low level in an interrupt manner to start operation. The peripheral circuit 4 is an acousto-optic prompt circuit, specifically, a PD6 pin of the main control chip is connected with an LED lamp, and the LED lamp is used for indicating the working state of the main control chip. The main control chip is in communication connection with an upper computer through a UART interface. In one embodiment, as shown in fig. 7, the slave processor includes an auxiliary chip and a peripheral circuit connected to the auxiliary chip, wherein the peripheral circuit 5 is a crystal oscillator circuit for providing a clock pulse to the auxiliary chip, the peripheral chip 6 is a RESET circuit, and the auxiliary chip is RESET when the low level time of the RESET pin of the auxiliary chip is judged to exceed the time pulse of the auxiliary chip. The main control chip is in communication connection with the auxiliary chip through an SPI (serial peripheral interface) and is used for sending a first voltage adjusting signal to the auxiliary chip, and the auxiliary chip is in serial communication with the programmable alternating current power supply through an UART (universal asynchronous receiver/transmitter) interface and is used for controlling the programmable alternating current power supply to generate a preset voltage after receiving the first voltage adjusting signal.
The scheme also relates to a power supply testing method, which is used for carrying out power-on testing on M power supplies to be tested, wherein M is more than or equal to 2, and as shown in figure 8, the testing method comprises the following steps:
step S100: and providing preset voltage for each power supply to be tested.
When a power supply to be tested is subjected to power-on test, a preset alternating current voltage is required to be connected to the input end of the power supply to be tested, the alternating current voltage is converted into a direct current voltage by the power supply to be tested and is output, and the output voltage of the output end of the power supply to be tested is sampled to complete the test.
Step S200: and sequentially connecting the main processor with the output end of the power supply to be tested, providing a preset load for the connected power supply to be tested, and sampling the output voltage of the connected power supply to be tested.
In the scheme, the main processor is utilized to complete the test of a plurality of power supplies to be tested in one test period, and the main processor can only sample the output voltage of one power supply to be tested at one time, so that the connection between the main processor and the output end of the power supply to be tested needs to be sequentially switched on, a preset load is provided for the switched-on power supply to be tested, and the output voltage of each power supply to be tested is sequentially sampled.
Step S300: adjusting the preset voltage or the preset load, and repeating the step S200.
Sampling the output voltage of the power supply to be tested, finally calculating the source regulation rate and the load regulation rate of the power supply to be tested, and judging whether the power supply to be tested is qualified or not according to the source regulation rate and the load regulation rate. In an embodiment, the preset load in step S200 may be set to be in a full-load state, the preset voltage is adjusted to be a rated voltage, a maximum variation voltage and a minimum variation voltage, and the output voltages of the power source to be tested under different preset voltages are respectively sampled, so as to calculate the source regulation rate of the power source to be tested. In another embodiment, the preset voltage in step S100 may be set as a rated voltage, the preset load is adjusted to be a full load and a minimum load, the output voltages of the power source to be tested under different loads are respectively sampled, the load regulation rate of the power source to be tested may be calculated, and whether the power source to be tested is qualified or not may be determined according to the source regulation rate and the load regulation rate.
In an embodiment, the power supply testing method further includes a ripple test, and the ripple test method specifically includes obtaining an output voltage of the power supply to be tested, filtering out a ripple in the output voltage to obtain a dc component, and subtracting the dc component from the output voltage of the power supply to be tested to obtain a ripple in the output voltage, so as to obtain a ripple content of the output voltage.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A power supply test system is used for carrying out power-on test on M power supplies to be tested, wherein M is more than or equal to 2, and the power supply test system is characterized by comprising the following components:
the main processor is used for outputting a plurality of paths of control signals and sampling the output voltage of each power supply to be tested in sequence;
the alternating current electrifying module is connected with the main processor at one end, connected with the input end of each power source to be tested at the other end, and used for receiving a first control signal of the main processor and providing preset voltage for each power source to be tested;
the sampling control module comprises a first control end, a first output end and M first input ends, wherein each first input end is used for being connected with the output end of a power supply to be tested, the first output end is connected with the main processor, and the first control end is connected with the main processor and used for receiving a second control signal of the main processor and sequentially connecting each first input end with the first output end; and
a load module connected to the main processor and configured to be connected to output terminals of the power supplies to be tested, the load module being configured to receive a third control signal of the main processor and provide a preset load for each power supply to be tested, the load module including a decision voltage generation module and a current adjustment module, the decision voltage generation module being connected to the main processor and configured to receive the third control signal of the main processor and output a suitable decision voltage, the current adjustment module including a first operational amplifier, a sampling resistor and a second switching tube, a positive-phase input terminal of the first operational amplifier being connected to the decision voltage generation module and configured to obtain the decision voltage, one end of the sampling resistor being connected to a first output terminal of the sampling control module through the second switching tube and being connected to an inverted-phase input terminal of the first operational amplifier, and the other end of the sampling resistor being grounded, and the control end of the second switching tube is connected with the output end of the first operational amplifier.
2. The test system of claim 1, wherein the AC power-up module includes a slave processor, a programmable AC power source, and an AC power-up control module, the first control signal comprises a first voltage regulating signal and a first switching signal, the slave processor is respectively connected with the master processor and the programmable alternating current power supply in a communication way, for receiving a first voltage adjustment signal of the main processor and controlling the programmable ac power supply to generate a preset voltage, the alternating current power-on control module comprises a second input end, a second control end and a second output end, the second input end is connected with the programmable alternating current power output end, the second output end is used for being connected with the input end of each power supply to be tested, the second control end is connected with the main processor, and the alternating current power supply control module is used for receiving a first switching signal of the main processor and controlling the on-off of the alternating current power supply control module.
3. The test system of claim 1, wherein the sampling control module comprises:
the input end of the decoder is used as the control end of the sampling control module and connected with the main processor, and the decoder is used for receiving a second control signal of the main processor and comprises M output ends, and each output end of the decoder is respectively used for outputting a corresponding level signal;
the input end of each first switch unit is used as a first input end of the sampling control module and is used for being connected with the output end of a power supply to be tested, the output end of each first switch unit is connected as a first output end of the sampling control module and is connected with the main processor, and the control end of each first switch unit is respectively connected with one output end of the decoder and is used for controlling the on-off of each first switch unit according to a level signal at the output end of the decoder.
4. The test system of claim 3, wherein the first switching unit comprises:
the control end of the first switch tube is connected with one output end of the decoder and used for receiving the level signal output by the decoder to control the on-off of the first switch tube;
the input end of the first relay serves as the input end of the first switch unit and is used for being connected with the output end of a power supply to be tested, the output end of the first relay serves as the output end of the first switch unit and is connected with the main processor, and the control end of the first relay is connected with the first switch tube and is used for controlling the on-off of the first relay according to the on-off of the first switch tube.
5. The test system of claim 1, wherein the second switch comprises a first transistor and a second transistor, wherein collectors of the first transistor and the second transistor are connected to the first output terminal of the sampling control module, a base of the first transistor is connected to the output terminal of the first operational amplifier, an emitter of the first transistor is connected to a base of the second transistor, and an emitter of the second transistor is connected to one end of the sampling resistor.
6. The test system of claim 1, wherein the arbitration voltage generation module comprises a second operational amplifier, a voltage regulator diode, an adjustable resistor module, and first to fifth resistors, a positive input terminal of the second operational amplifier is connected to the first output terminal of the sampling control module through the first resistor, a negative input terminal of the second operational amplifier is connected to ground through a third resistor, and is connected to an output terminal of the second operational amplifier through the second resistor, negative terminals of the voltage regulator diode are respectively connected to the positive input terminal of the second operational amplifier, the output terminal of the second operational amplifier through the fourth resistor, and one terminal of the adjustable resistor module through the fifth resistor, the other terminal of the adjustable resistor module is connected to ground, and a control terminal of the adjustable resistor module is connected to the main processor to receive a third control signal of the main processor, the adjustable resistance module is used for generating a proper adjustable resistance according to the third control signal, and a connection end of the fifth resistance and the adjustable resistance module is used as an output end of the judgment voltage generation module to output the judgment voltage.
7. The test system according to claim 1, wherein the power supply test system further comprises a ripple processing module, the ripple processing module comprises a filtering unit and a subtracting unit, an input terminal of the filtering unit is connected to the first output terminal of the sampling control module for obtaining and filtering the ripple of the power supply output voltage to be tested, an input terminal of the subtracting unit is connected to the output terminal of the filtering unit, another input terminal of the subtracting unit is connected to the first output terminal of the sampling control module, the subtracting unit is used for obtaining the ripple of the power supply output voltage to be tested, and an output terminal of the subtracting circuit is connected to the main processor.
8. The test system of claim 1, wherein the power supply test system further comprises an upper computer, the upper computer is in communication connection with the main processor and is used for issuing a test instruction to the main processor and acquiring sampling data of the main processor.
9. A power supply test method is used for carrying out power-on test on M power supplies to be tested, wherein M is more than or equal to 2, and the power supply test method is characterized by comprising the following steps:
step A: providing preset voltage for each power supply to be tested;
and B: sequentially connecting a main processor with the output end of the power supply to be tested, providing a preset load for the connected power supply to be tested, and sequentially sampling the output voltage of the connected power supply to be tested;
and C: adjusting a preset voltage or a preset load, and repeating the step B;
wherein the providing of the preset load is performed through a load module, the load module is connected with the main processor and is configured to be connected to output terminals of the power supplies to be tested and is configured to receive a third control signal of the main processor and provide the preset load for the power supplies to be tested, the load module includes a decision voltage generation module and a current regulation module, the decision voltage generation module is connected with the main processor and is configured to receive the third control signal of the main processor and output a suitable decision voltage, the current regulation module includes a first operational amplifier, a sampling resistor and a second switching tube, a positive-phase input terminal of the first operational amplifier is connected with the decision voltage generation module and is configured to obtain the decision voltage, one end of the sampling resistor is connected to a first output terminal of the sampling control module through the second switching tube and is connected with an inverted-phase input terminal of the first operational amplifier, the other end of the sampling resistor is grounded, and the control end of the second switch tube is connected with the output end of the first operational amplifier.
10. The power supply test method of claim 9, further comprising a ripple test method, the ripple test method comprising:
acquiring the output voltage of the power supply to be tested and filtering the ripple waves of the output voltage to obtain a direct current component;
and subtracting the direct current component from the output voltage to obtain the ripple of the output voltage.
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