CN109143020B - 一种pcb板测试方法、装置及测试设备 - Google Patents
一种pcb板测试方法、装置及测试设备 Download PDFInfo
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- CN109143020B CN109143020B CN201710512212.1A CN201710512212A CN109143020B CN 109143020 B CN109143020 B CN 109143020B CN 201710512212 A CN201710512212 A CN 201710512212A CN 109143020 B CN109143020 B CN 109143020B
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- 238000012360 testing method Methods 0.000 title claims abstract description 240
- 239000000523 sample Substances 0.000 claims abstract description 160
- 238000013507 mapping Methods 0.000 claims description 25
- 238000010998 test method Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 26
- 230000008569 process Effects 0.000 abstract description 16
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 8
- 230000006870 function Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
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- 230000003287 optical effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
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- Tests Of Electronic Circuits (AREA)
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CN201710512212.1A CN109143020B (zh) | 2017-06-28 | 2017-06-28 | 一种pcb板测试方法、装置及测试设备 |
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CN201710512212.1A CN109143020B (zh) | 2017-06-28 | 2017-06-28 | 一种pcb板测试方法、装置及测试设备 |
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CN109143020A CN109143020A (zh) | 2019-01-04 |
CN109143020B true CN109143020B (zh) | 2020-10-16 |
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CN112468024A (zh) * | 2020-10-28 | 2021-03-09 | 深圳市兆威机电股份有限公司 | 一种电机抖动控制方法、控制装置、终端设备及存储介质 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7091730B1 (en) * | 2005-07-15 | 2006-08-15 | Huntron, Inc. | Dual probe assembly for a printed circuit board test apparatus |
CN201983801U (zh) * | 2011-03-14 | 2011-09-21 | 深圳市嘉之宏电子有限公司 | 一种柔性电路板检测装置 |
CN105527464B (zh) * | 2014-09-28 | 2018-10-30 | 深圳市诚信佳美科技有限公司 | 一种面板测试点定位方法、装置和测试面板的方法、*** |
CN104457539B (zh) * | 2014-11-05 | 2017-06-06 | 大族激光科技产业集团股份有限公司 | 一种飞针测试机测试探针抬针高度的计算方法 |
CN106558513B (zh) * | 2015-09-25 | 2021-03-30 | 矽品精密工业股份有限公司 | 检测设备及其检测方法 |
CN105785257B (zh) * | 2016-04-13 | 2019-06-14 | 大族激光科技产业集团股份有限公司 | 一种飞针测试机的校正方法 |
CN106019122B (zh) * | 2016-05-13 | 2019-06-14 | 大族激光科技产业集团股份有限公司 | 基于测点距离的飞针测试机运动的控制方法及装置 |
CN205910220U (zh) * | 2016-06-30 | 2017-01-25 | 大族激光科技产业集团股份有限公司 | 一种平面式飞针测试机侧面夹具 |
CN106771979B (zh) * | 2016-12-30 | 2019-07-02 | 南京协辰电子科技有限公司 | 一种双探针飞针测试装置的校准方法 |
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Address after: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |