CN109085585A - The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system - Google Patents
The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system Download PDFInfo
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- CN109085585A CN109085585A CN201811147092.0A CN201811147092A CN109085585A CN 109085585 A CN109085585 A CN 109085585A CN 201811147092 A CN201811147092 A CN 201811147092A CN 109085585 A CN109085585 A CN 109085585A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/88—Radar or analogous systems specially adapted for specific applications
- G01S13/89—Radar or analogous systems specially adapted for specific applications for mapping or imaging
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Abstract
The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system, belong to electromagnetic field measurements technical field.Equipped with control computer, test probe, tri-axial motion controller, linear translation platform, vector network analyzer, metallic support and sample stage；The control computer is connected with tri-axial motion controller and vector network analyzer respectively, and tri-axial motion controller is connected with linear translation platform；Sample stage is fixed on linear translation platform, and metallic support is located above linear translation platform；Test probe is fixed on metallic support and is connected on vector network analyzer together with the Single port of sample.Using high-performance long-stroke linear mobile platform and coaxially test probe, it may be implemented to carry out point by point scanning to the electric field or magnetic field specified around sample under the different frequency of region, related amplitude value and phase information data are obtained, and field distribution data can be analyzed and processed and be imaged with display by computer.
Description
Technical field
The invention belongs to electromagnetic field measurements technical field, more particularly, to microwave and millimeter wave three-dimensional near-field data acquire at
As system.
Background technique
Electromagnetism Meta Materials are the composite materials for having period or quasi-periodic structure by engineer.This composite material
There is special physical property compared with traditional materials, and this special physical property depends not only on the intrinsic of composition material
Property additionally depends on its sub-wavelength structure dimensional parameters.Studies have shown that electromagnetism Meta Materials have negative index, super-absorbent, optically-active
Property, a variety of novel physics properties such as class electromagnetic induced transparency, and can design regulate and control these characteristics by structure size.Closely
Nian Lai carries out two-dimentional artificial electromagnetic Meta Materials, the especially super table of artificial electromagnetic for the ease of the integrated application of device and circuit
The research in face, artificial surface phasmon (spoof surface plasmons, SSPs) gets more and more people's extensive concerning.Due to
Artificial surface phasmon can be realized in the case where microwave, millimeter involve THz wave frequency range is similar to optical frequencies surface phasmon
The characteristics such as near field constraint, local enhancing, therefore passed based on artificial surface phasmon device and system in signal transmission, biology
The fields such as sense, high-resolution imaging show great application prospect.Currently, how to electromagnetism Meta Materials, super surface, labor statement
Face phasmon device carries out efficient, accurate Experimental Characterization, the information such as near field amplitude phase of acquisition device, to the area research
It is particularly critical.However, there are mainly two types of existing fairly perfect near-field scan systems: photoelectric type translational scanning system and be based on day
The translational scanning system of line, however both systems build complexity because there are higher costs, in measuring speed, precision or detection
Physical quantity etc. problem is unable to satisfy the application requirement of the near-field test of electromagnet Meta Materials.
Summary of the invention
It is an object of the invention to overcome in existing near-field scan technology precision is not high, it is complicated to build, measurement pattern is single,
Single pass can only obtain the problems such as field distribution under single frequency, provide be suitable for open waveguide, integrated circuit, Meta Materials,
Super surface and other devices and the acquisition of the microwave and millimeter wave three-dimensional near-field data of circuit and imaging system.
The present invention be equipped with control computer, test probe, tri-axial motion controller, linear translation platform, vector network analyzer,
Metallic support and sample stage；The control computer is connected with tri-axial motion controller and vector network analyzer respectively, three axis fortune
Movement controller is connected with linear translation platform；Sample stage is fixed on linear translation platform, and metallic support is located at linear translation platform
Top；Test probe is fixed on metallic support and is connected to vector network analyzer together with the Single port of sample
On.
The tri-axial motion controller can be connected by USB line with control computer, and tri-axial motion controller can pass through cable
It is connected with linear translation platform.Sample is fixed on sample stage, settable surface sweeping range, stepping and speed on control computer
It is mobile to accurately control sample for parameter.Meanwhile controlling the current shift position of the available sample of computer, scanning
The parameters such as progress and estimated scanning time.
The vector network analyzer can be connected with test probe and sample and to tested respectively by flexible cable
Sample is motivated and is tested.In addition, vector network analyzer can be connected by USB-GPIB line with control computer, it to be used for data
Communication, and under the control of control computer, when sample is moved to determining scan position, acquire field around sample
Amplitude and phase, show and save on control computer.The present invention can use different fixation bracket and test probe, real
When the acquisition electric field of sample, Distribution of Magnetic Field.
In the present invention, the control computer is connected with tri-axial motion controller and vector network analyzer simultaneously, and setting is swept
The parameters such as region, stepping, frequency point are retouched, sample is accurately controlled and is moved to specific scanning element, then control vector network point
The amplitude and phase of the different mode of analyzer acquisition scans point, different frequent points end, and data are read from Network Analyzer, it is right
Data are handled, and are shown and are saved on control computer, and the acquisition of three-dimensional near-field data and imaging to sample are completed.
The present invention provides it is a kind of be easy to build, the acquisition of microwave and millimeter wave three-dimensional near-field data that scanning accuracy is high and imaging
System using high-performance long-stroke linear mobile platform and coaxially tests probe, may be implemented to specifying area around sample
Electric field or magnetic field under the different frequency of domain carry out point by point scanning, obtain related amplitude value and phase information data, and can pass through electricity
Brain is analyzed and processed and is imaged display to field distribution data.In a near-field scan, by the way that scanning band, sampled point is arranged
Etc. parameters, the field distribution that can be acquired and be stored under different frequent points.The present invention can be used for open waveguide, integrated circuit, surpass
The imaging of the near-field scan of material, super surface and other devices and circuit, be widely used prospect.
Scheme is imaged relative to existing near-field scan, protrusion technical effect of the invention is as follows:
1) present invention can be obtained by sample in difference by setting scanning band and sampled point, single pass
Field distribution under Frequency point, and existing near-field scan scheme can only only once scan a Frequency point, with scanning different frequency point
The case where needing to design and replace different test probes is compared, and greatly reduces sweep time, improves Efficiency.
2) present invention uses high-performance long-stroke linear translation stage, not only realizes that three-dimensional of the sample in space is mobile,
The field distribution at any point can be tested, and the mobile accuracy of linear translation platform is only 6 μm, improves whole system significantly
Measure scanning accuracy.In addition, the present invention is fixed using probe and sample reduces biography as mobile platform is mobile and moves
The mobile measurement error introduced of near-field scan middle probe of uniting, ensure that the stability and accuracy of test.
3) present invention may be implemented using coaxial test probe and fixed bracket to the electricity for specifying region around sample
Field or magnetic field carry out point by point scanning, in addition, can be according to needs such as sample feature, working frequency, modes, using other forms
Probe, such as rectangular waveguide, ridge waveguide, electromagnetic horn.
4) present system is simple, builds conveniently, and the microwave and millimeter wave three-dimensional near-field to sample can be rapidly completed
Data acquisition and imaging；If the present invention can using THz wave vector network analyzer and other terahertz time-domain spectroscopy systems
With expanded application in the three-dimensional near-field acquisition and imaging of THz wave.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the embodiment of the present invention.
Fig. 2 is microwave near-field scanning imagery result example of the present invention.
Specific embodiment
In the following with reference to the drawings and specific embodiments, it is further described and illustrates the present invention.
One embodiment of the present of invention is as shown in Figure 1, sample is a kind of plane artificial surface phasmon waveguide.
The present invention is mainly made of seven parts, is respectively as follows: control computer 1, test probe 2, tri-axial motion controller 3, linear translation platform
4, vector network analyzer 5, metallic support 6 and sample stage 7；
The control computer 1 is respectively by USB line and USB-GPIB patchcord, with three-axis controller 3 and vector network point
Analyzer 5 is connected, and realizes data communication using the VISA of LabVIEW, tri-axial motion controller 3 is further through cable and linear translation platform
4 are connected；Vector network analyzer 5 is connected by flexible cable with the one end for testing probe 2 and sample 8 respectively, for surveying
Measure the amplitude and phase of 8 surrounding field of sample.Test probe 2 is fixed on the surface plate center of metallic support 6, and lower section is fixed
Sample 8 on sample stage 7.Sample stage 7 is also secured on linear translation platform 4, as linear translation platform 4 accurately moves
Dynamic movement.
In the present embodiment, sample 8 is among metallic support 6 and sample stage 7, and metallic support 6 and sample
Platform 7 is the metal plate of two pieces very big area (relative to sample), and the field distribution of the TE mould of sample is tested with this.
The present embodiment is that the program write using LabVIEW completes control computer 1 to tri-axial motion controller 3 and vector net
The control of network analyzer 5 sets the parameters such as scanning range, stepping, scanning speed and scanning band and sampled point.Click starts
Afterwards, sample 8 will move point by point in scanning area, meanwhile, vector network analyzer 5 can count each scanning element
According to acquisition, and the S21 on control computer 1 on each scanning element of real-time display, the image of S11, and data are saved.
After the completion of entire scanning process, control computer 1 can handle data, show specific frequency, AD HOC and specific
The field pattern picture of scanning area.If Fig. 2 is in the present embodiment above super surface duct, frequency is the field distribution of 4GHz
Figure.
Claims (9)
1. the acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system, it is characterised in that be equipped with control computer, test probe, three
Axle motion controller, linear translation platform, vector network analyzer, metallic support and sample stage；The control computer is respectively with three
Axle motion controller is connected with vector network analyzer, and tri-axial motion controller is connected with linear translation platform；Sample stage installation is solid
It is scheduled on linear translation platform, metallic support is located above linear translation platform；Test probe be fixed on metallic support and with quilt
The Single port of sample is connected on vector network analyzer together.
2. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that three axis
Motion controller is connected by USB line with control computer.
3. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that three axis
Motion controller is connected by cable with linear translation platform.
4. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that described tested
Sample is fixed on sample stage, and surface sweeping range, stepping and speed parameter are arranged on control computer, and control sample is mobile.
5. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that the control
Computer obtains current shift position, scan progress and the estimated scanning time parameter of sample.
6. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that the vector
Network Analyzer is connected respectively with test probe and sample by flexible cable and is motivated and tested to sample.
7. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that the vector
Network Analyzer is connected by USB-GPIB line with control computer, is used for data communication, and under the control of control computer, when
When sample is moved to determining scan position, the amplitude and phase of field around sample are acquired, is shown on control computer
And it saves.
8. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that utilize difference
Fixation bracket and test probe, in real time acquire sample electric and magnetic fields distribution.
9. microwave and millimeter wave three-dimensional near-field data acquisition as described in claim 1 and imaging system, it is characterised in that the control
Computer is connected with tri-axial motion controller and vector network analyzer simultaneously, and scanning area, stepping, frequency point parameters, control is arranged
Sample is moved to specific scanning element, then controls different mode, the different frequent points of vector network analyzer acquisition scans point
The amplitude and phase of end, and data are read from Network Analyzer, data are handled, shows and protects on control computer
It deposits, completes the acquisition of three-dimensional near-field data and imaging to sample.
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| CN201811147092.0A CN109085585A (en) | 2018-09-29 | 2018-09-29 | The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system |
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Cited By (4)
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| CN110031484A (en) * | 2019-03-05 | 2019-07-19 | 四川大学 | A kind of separation field reconstruct test platform |
| CN112098732A (en) * | 2020-09-21 | 2020-12-18 | 深圳市环波科技有限责任公司 | Microwave electromagnetic parameter three-dimensional test system and method thereof |
| CN114935756A (en) * | 2022-04-06 | 2022-08-23 | 电子科技大学 | Near-field millimeter wave synthetic aperture scanning imaging system and imaging method based on vector network analyzer |
| CN116539966A (en) * | 2023-04-14 | 2023-08-04 | 深圳大学 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
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| CN116539966A (en) * | 2023-04-14 | 2023-08-04 | 深圳大学 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
| CN116539966B (en) * | 2023-04-14 | 2024-02-27 | 深圳大学 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
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