CN109029740A - A kind of device and method measuring atomic hyperfine - Google Patents
A kind of device and method measuring atomic hyperfine Download PDFInfo
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- CN109029740A CN109029740A CN201810359977.0A CN201810359977A CN109029740A CN 109029740 A CN109029740 A CN 109029740A CN 201810359977 A CN201810359977 A CN 201810359977A CN 109029740 A CN109029740 A CN 109029740A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0249—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods with modulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer
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Abstract
The invention belongs to optical frequency fields of measurement, the device and method that a kind of structure simply measures atomic hyperfine is proposed.Device includes: first laser device, atomic sample pond, magnetic shielding cover, light splitting plain film, photodetector, RF driving source, plane mirror, acousto-optic modulator system and second laser.The laser that first laser device issues, by being received by a photoelectric detector after atomic sample pond, light splitting plain film, the laser that second laser issues is incident on atomic sample pond after passing sequentially through acousto-optic modulator system, plane mirror, light splitting plain film and reversely coincides with atomic sample pond with the laser of first laser device；The laser frequency of first laser device and the ground state level of atom to be measured | 1 > to excited level | 2 > resonance, the laser frequency of second laser are located at excited of atoms energy level | 2 > to excited level to be measured | near 3 > resonant transitions；Acousto-optic modulator system is connect with RF driving source.The precise measurement of atomic hyperfine may be implemented in the present invention.
Description
Technical field
The invention belongs to optical frequency field of measuring technique, and in particular to it is a kind of measure atomic hyperfine device and
Method.
Background technique
The measurement of atomic hyperfine is in charge interaction, the nonconservation of parity of atom, the essence of physics constant
Close measurement, high-resolution spectroscopy and optical frequency standard etc. tool play a very important role.Knot hyperfine for spectrum at present
The method that the measurement of structure is more commonly used has Fabry-Perot-type cavity, electrooptic modulator, optical frequency com etc..Using Fabry-Perot
When interference cavity measurement frequency, heat fluctuation and mechanical oscillation due to itself cause its precision limited, so measurement result will appear
Large error, common precision is 10-4；When using electrooptic modulator measurement frequency, due to needing Fabry-Perot interference chamber to make
For auxiliary tool, the complexity of system is increased；Using the measurement method measurement accuracy with higher based on optical frequency com,
And its spectral range is wide, but the equipment price is expensive, systematic comparison is complicated.
Summary of the invention
The present invention is not high in order to solve atomic hyperfine measurement accuracy in the prior art, and measuring system is complicated, measurement
Problem at high cost provides the device that a kind of precision is high, structure simply measures atomic hyperfine.
In order to solve the above-mentioned technical problem, a kind of the technical solution adopted by the present invention are as follows: measurement atomic hyperfine
Device, including first laser device, atomic sample pond, magnetic shielding cover, light splitting plain film, photodetector, RF driving source, plane are anti-
Penetrate mirror, acousto-optic modulator system and second laser；The laser that first laser device issues is passed sequentially through by magnetic shielding cover package
Atomic sample pond is received by a photoelectric detector after being divided plain film, and the laser that second laser issues passes sequentially through acousto-optic modulator
The atomic sample pond is incident on after system, plane mirror, light splitting plain film and is reversely coincided with the laser of first laser device
Atomic sample pond；Ground state of the laser frequency lock that the first laser device issues in atom | 1 > arrive excitation state | 2 > it is hyperfine
In structure transition, the laser frequency lock that the second laser issues is in excited of atoms | 2 > arrive excitation state | 3 > resonant transition
Near；The acousto-optic modulator system includes the acousto-optic modulator being electrically connected with RF driving source, and the RF driving source is used for
Acousto-optic modulator is driven, to realize the frequency scanning of second laser output laser.
The acousto-optic modulator system further include 45 ° of reflecting mirrors, 0 ° of reflecting mirror, half wave plate, polarization beam splitter prism,
Quarter-wave plate, the first lens, the second lens and collecting pit, the laser that second laser issues, pass sequentially through half
It is incident in acousto-optic modulator after wave plate, polarization beam splitter prism, quarter-wave plate, the first lens, it is primary by acousto-optic modulator
The zero order light of outgoing is collected by collecting pit, the level-one light being once emitted reflected by 0 ° of reflecting mirror after along backtracking acousto-optic modulation
Device, by the level-one light of the secondary outgoing of acousto-optic modulator through along the first lens of backtracking, and through quarter-wave plate, polarization beam splitting
Plane mirror is emitted to after prism, 45 ° of reflecting mirrors.
A kind of device of measurement atomic hyperfine further includes saturation-absorption spectrum locking device and FP chamber lock
Determine device, the saturation-absorption spectrum locking device is used to lock the laser frequency of first laser device sending, the FP chamber locking
Device is used to lock the laser frequency of second laser sending.
The present invention also provides a kind of methods for measuring atomic hyperfine, comprising the following steps:
Step 1: selecting the laser of relative frequency according to the fine-structure energy levels of atom, the laser lock-on of first laser device is existed
The ground state of atom to be measured | 1 > arrive excitation state | 2 > hyperfine structure transition on, the laser lock-on of second laser is swashed in atom
Send out state | 2 > arrive excited level to be measured | near 3 > resonant transition；
Step 2: building optical path, the laser for issuing first laser device is by being incident on photoelectricity after atomic sample pond, light splitting plain film
Detector, while after the laser for issuing second laser is by the acousto-optic modulator in acousto-optic modulator system, it passes sequentially through
The atomic sample pond is incident on after plane mirror, light splitting plain film and coincides with atomic sample with the laser of first laser device
Pond；
Step 3: by RF driving source continuous scanning acousto-optic modulator system, making acousto-optic modulator system in different scanning electricity
Pressure generates different frequency shift (FS)s to the laser that second laser issues, and detects to obtain transition light by photodetector
Spectrum, the last corresponding frequency values of corresponding relationship and scanning voltage according to transition peak and scanning voltage spectrally, calculates
To the precise frequency interval between corresponding energy level.
In the step 2, acousto-optic modulator system further includes 45 ° of reflecting mirrors, 0 ° of reflecting mirror, half wave plate, polarization
Beam splitter prism, quarter-wave plate, the first lens, the second lens and collecting pit, the laser that second laser issues, pass sequentially through
It is incident in acousto-optic modulator after half wave plate, polarization beam splitter prism, quarter-wave plate, the first lens, by acousto-optic tune
The zero order light that device processed is once emitted is collected by collecting pit, the level-one light being once emitted reflected by 0 ° of reflecting mirror after along backtracking sound
Optical modulator, by the level-one light of the secondary outgoing of acousto-optic modulator through along the first lens of backtracking, and through quarter-wave plate, partially
Plane mirror is emitted to after vibration beam splitter prism, 45 ° of reflecting mirrors.
In the step 1, first laser device is made to be locked in ground state by saturation-absorption spectrum | 1 > to excitation state | 2 > it is super
In fine structure transition, make second laser issue laser separate it is a branch of be incident on FP chamber, when second laser issue swash
Light frequency be tuned to be located at excited of atoms | 2 > arrive excitation state to be measured | when near 3 > resonant transition, by the frequency of second laser
It is locked on FP chamber.
Compared with the prior art, the invention has the following beneficial effects: the device of measurement atomic hyperfine of the invention
And method excites atom by two beam laser, the ground state of the Frequency Locking of beam of laser in atom | 1 > arrive excitation state | 2 >
Hyperfine structure transition on, the Frequency Locking of another beam of laser is in excited of atoms | 2 > arrive excitation state to be measured | 3 > resonant transition
Near, and realize that second laser issues the scanning of laser frequency using acousto-optic modulator system, not only realize atom superfinishing
The detection of thin spectrum utilizes difference in the deviation frequency of acousto-optic modulator and the corresponding relationship of scanning voltage and scanning process
Scanning voltage, which corresponds to different transition peaks, can also obtain corresponding hyperfine level spacing, it can realize the hyperfine knot of atom
The measurement of structure has easy to operate, the advantages such as precision height, when using acousto-optic modulator method measurement frequency, can be used and is easy to
The radio frequency source of measurement drives acousto-optic modulator, and precision is relatively high, can achieve 10-6, measuring system is relatively simple, measurement cost
It is low；In addition, the technical solution that the present invention uses acousto-optic modulator to pass twice through, in the process of acousto-optic modulator system continuous scanning
Middle optical path can't because of laser frequency variation and be affected, to make the two beam laser light incidents for being incident on atomic sample pond
Direction keeps stablizing, and measuring system simply can easily be accommodated.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of the device for measurement atomic hyperfine that the embodiment of the present invention proposes；
Fig. 2 is the stepped atomic energy level figure of measurement of the embodiment of the present invention；
Fig. 3 is in the present invention, and the light that second laser issues passes through the light path schematic diagram of acousto-optic modulator system；
Fig. 4 is to obtain spectrogram using present invention measurement；
In figure: 1 first laser device, 2 atomic sample ponds, 3 magnetic shielding covers, 4 light splitting plain films, 5 photodetectors, 6 RF driving sources,
7 plane mirrors, 8 acousto-optic modulator systems, 9- second laser, 801-45 ° of reflecting mirror, 802-0 ° of reflecting mirror, 803- bis- divide
One of wave plate, 804- polarization beam splitter prism, the first lens of 805-, 806- acousto-optic modulator, the second lens of 807-, 808- collect
Pond, 809- quarter-wave plate.
Specific embodiment
It in order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below will be in the embodiment of the present invention
Technical solution be clearly and completely described, it is clear that described embodiment is a part of the embodiments of the present invention, without
It is whole embodiments；Based on the embodiments of the present invention, those of ordinary skill in the art are not before making creative work
Every other embodiment obtained is put, shall fall within the protection scope of the present invention.
As shown in Figure 1, the embodiment of the invention provides a kind of device for measuring atomic hyperfine, including first laser
Device 1, atomic sample pond 2, magnetic shielding cover 3, light splitting plain film 4, photodetector 5, RF driving source 6, plane mirror 7, acousto-optic
Modulator 8 and second laser 9；The laser that first laser device 1 issues, passes sequentially through the atom wrapped up by magnetic shielding cover 3
Sample cell 2 is received after being divided plain film 4 by photodetector 5, and the laser that second laser 9 issues passes sequentially through acousto-optic modulator
The atomic sample pond 2 is incident on after system 8, plane mirror 7, light splitting plain film 4 and is reversely weighed with the laser of first laser device 1
Together in atomic sample pond 2；As shown in Fig. 2, ground state of the laser frequency lock of the sending of first laser device 1 in atom to be measured | 1
> arrive excitation state | 2 > hyperfine structure transition on, the laser frequency lock that the second laser issues is in excited of atoms energy
Grade | 2 > arrive excited level to be measured | near 3 > resonant transition；Wherein, the acousto-optic modulator system 8 includes and RF driving source
The acousto-optic modulator 806 of 6 electrical connections, the RF driving source 6 is for driving acousto-optic modulator 806, to realize second laser 9
Export the frequency scanning of laser.RF driving source by turntable driving voltage, sweep by the frequency that acousto-optic modulator 806 may be implemented
It retouches, and then realizes the scanning for being incident on the laser frequency of second laser in atomic sample pond 2.Moreover, what second laser 9 issued
The frequency displacement frequency of the locking frequency harmony optical modulator system of laser can be set as needed, but should meet the following conditions:
Dual-laser device 9 issue laser through acousto-optic modulator system 8 scanning after, frequency range should cover excited of atoms | 2 > to
Survey excitation state | 3 > all resonant transitions.
Further, as shown in figure 3, in the embodiment of the present invention, acousto-optic modulator system includes 801,0 ° of 45 ° of reflecting mirrors anti-
Penetrate mirror 802, half wave plate 803, polarization beam splitter prism 804, quarter-wave plate 809, the first lens 805, acousto-optic modulation
Device 806, the second lens 807 and collecting pit 808, second laser 9 issue laser, pass sequentially through half wave plate 803, partially
It is incident in acousto-optic modulator 806 after vibration beam splitter prism 804, quarter-wave plate 809, the first lens 805, by acousto-optic modulator
806 zero order lights being once emitted are collected by collecting pit 808, and the level-one light being once emitted reflects the road Hou Yanyuan by 0 ° of reflecting mirror 802
Acousto-optic modulator 806 is returned to, the level-one light being emitted by acousto-optic modulator 806 2 times is passed through through along the first lens of backtracking 805
It is emitted to plane mirror 7 after 804,45 ° of quarter-wave plate 809, polarization beam splitter prism reflecting mirrors 801, passes twice through acousto-optic
The laser of modulator 8 is incident on the atomic sample pond 2 after plane mirror 7, light splitting plain film 4.Laser first passage
Level-one offset frequency light beam can be generated when acousto-optic modulator, this light beam and input laser have determining difference on the frequency and has fixation with elementary beam
Angle, when this light beam passes through acousto-optic modulator along original route again after reflecting mirror reflects, the primary offset frequency light beam that is emitted leads to again
After crossing acousto-optic modulator, the level-one offset frequency beam direction that secondary outgoing generates can be with the light beam that is initially incident on acousto-optic modulator
Direction it is identical, but inputting light beam and output beam has determining difference on the frequency, since input laser passes through a quarter twice
Wave plate 809, polarization change 90 degree, therefore pass twice through exported after acousto-optic modulator laser return polarization beam splitter prism 804 when
It can be exported from the reflection end of polarization beam splitter prism 804, advantage is that optical path can't be because of frequency when scanning acousto-optic modulator
Change and is affected.From figure 3, it can be seen that after laser passes twice through acousto-optic modulator system, emitting light path and former light
Road is overlapped, even if changing acousto-optic modulator system when voltage scanning to the deviation frequency of laser, but is ultimately incident upon atom sample
The optical path in product pond 2 will not change, and ensure that the stability of detecting light spectrum.
Further, the device of a kind of measurement atomic hyperfine of the present embodiment further includes saturation-absorption spectrum lock
Determine device and FP chamber locking device, the saturation-absorption spectrum locking device is used to lock the laser frequency of the sending of first laser device 1
Rate, the FP chamber locking device are used to lock the laser frequency of the sending of second laser 9.It, only need to be in instrument such as wavemeters when measurement
Under the auxiliary of device, by the wavelength tuning of second laser to excited of atoms energy level | 2 > arrive excited level to be measured | 3 > resonance
Near transition (theoretical value), it can locked by optical maser wavelength of the FP chamber to second laser, second laser swashs
Optical wavelength locking after, pass through the frequency scanning of acousto-optic modulator system, it can cover excited level to be measured | 3 > superfinishing
Fine texture frequency range.
Correspondingly, the embodiment of the invention also provides a kind of methods for measuring atomic hyperfine, comprising the following steps:
Step 1: the laser of corresponding frequencies is selected according to the fine-structure energy levels of atom, by the laser frequency of first laser device 1
Be locked in the ground state of atom to be measured | 1 > to excitation state | 2 > hyperfine structure transition on, by the laser frequency of second laser 9
Be locked in excited of atoms | 2 > to excitation state | 3 > resonant transition near.
Wherein, first laser device 1 is locked in ground state by saturation-absorption spectrum | 1 > arrive excitation state | 2 > hyperfine structure
In transition, the more commonly used technology that Frequency Locking is this field is carried out by the saturation-absorption spectrum of atom, is not done herein superfluous
It states.Second laser can use ti sapphire laser, and the method for laser frequency lock is as follows: second laser is issued
Laser separate it is a branch of be incident on FP chamber, to second laser issue laser carry out frequency tuning, and by wavemeter detect second
The optical maser wavelength or frequency of laser, when the laser frequency tuning that second laser 9 issues is to positioned at excited of atoms | 2 > arrive and swash
Send out state | when near 3 > resonant transition, the transmission peaks of FP chamber are detected, by the Frequency Locking of second laser on FP chamber.
Step 2: building optical path, the first laser beam for issuing first laser device 1 passes through atomic sample pond 2, light splitting plain film 4
After be incident on photodetector, while make second laser 9 issue second laser beam pass twice through in acousto-optic modulator system 8
Acousto-optic modulator (806) after, pass sequentially through plane mirror 7, light splitting plain film 4 after be incident on the atomic sample pond 2 and with
The laser that first laser device 1 is incident on atomic sample pond 2 is reversely overlapped.
Step 3: by 6 continuous scanning acousto-optic modulator system 8 of RF driving source, making acousto-optic modulator system 8 in difference
Scanning voltage under laser that second laser 9 is issued generate different frequency shift (FS)s, and detected by photodetector 5
To Transition Spectra, the continuous variation of the second laser beam frequency due to being incident on atomic sample pond is available as shown in Figure 4
Spectrum；Different scanning voltages can correspond to different transition peak A, B, C, last transition peak and scanning voltage according to spectrally
Corresponding relationship and the corresponding frequency values of scanning voltage, are calculated the precise frequency interval between corresponding energy level, that is, atom
Hyperfine structure.
The hyperfine structure for passing through double-photon optical spectrometry atom in the present invention, is excited using two steps, is swashed first by first
Light beam is locked in atomic ground state | 1 > arrive excitation state | 2 > hyperfine transition structure transition on, the laser frequency of second laser beam is locked
It is scheduled on excited of atoms | 2 > arrive excitation state | near 3 > resonant transition, when the frequency by acousto-optic modulator system to second laser beam
When rate is scanned, the frequency of second laser beam can be with excited of atoms energy level | 2 > arrive excited level to be measured | 3 > it is each super
Fine-structure levels A, B, C generate energy level resonance, to generate hyperfine transition spectrum.Accurate lock first as needed is sharp in experiment
Shine and the frequency of the second exciting light, then using driving source and acousto-optic modulator system can the advantage of continuous accurate scan sweep
The second exciting light is retouched, since that acousto-optic modulator system can be made to generate different frequencies to the second exciting light is inclined for different scanning voltages
It moves, using the corresponding relationship between frequency shift (FS) and scanning voltage, then transition different according to corresponding to different scanning voltage
Peak, available excited level to be measured | 3 > accurate hyperfine energy level.
Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention., rather than its limitations；To the greatest extent
Pipe present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that: its according to
So be possible to modify the technical solutions described in the foregoing embodiments, or to some or all of the technical features into
Row equivalent replacement；And these are modified or replaceed, various embodiments of the present invention technology that it does not separate the essence of the corresponding technical solution
The range of scheme.
Claims (6)
1. a kind of device for measuring atomic hyperfine, which is characterized in that including first laser device (1), atomic sample pond
(2), magnetic shielding cover (3), light splitting plain film (4), photodetector (5), RF driving source (6), plane mirror (7), acousto-optic tune
Device system (8) processed and second laser (9)；
The laser that first laser device (1) issues passes sequentially through the atomic sample pond (2) wrapped up by magnetic shielding cover (3), is divided plain film
(4) it is received after by photodetector (5), the laser that second laser (9) issues, passes sequentially through acousto-optic modulator system (8), puts down
The atomic sample pond (2) is incident on after face reflecting mirror (7), light splitting plain film (4) and is reversely weighed with the laser of first laser device (1)
Together in atomic sample pond (2)；
Ground state of the laser frequency lock that the first laser device (1) issues in atom | 1 > arrive excitation state | 2 > hyperfine structure
In transition, the laser frequency lock that the second laser (9) issues is in excited of atoms | 2 > arrive excitation state | 3 > resonant transition
Near；
The acousto-optic modulator system (8) includes the acousto-optic modulator (806) being electrically connected with RF driving source (6), the radio frequency
Driving source (6) is for driving acousto-optic modulator (806), to realize the frequency scanning of second laser (9) output laser.
2. a kind of device for measuring atomic hyperfine according to claim 1, which is characterized in that the acousto-optic modulation
Device system (8) further includes 45 ° of reflecting mirrors (801), 0 ° of reflecting mirror (802), half wave plate (803), polarization beam splitter prism
(804), quarter-wave plate (809), the first lens (805), the second lens (807) and collecting pit (808), second laser
(9) issue laser, pass sequentially through half wave plate (803), polarization beam splitter prism (804), quarter-wave plate (809),
It is incident on after first lens (805) in acousto-optic modulator (806), the zero order light being once emitted by acousto-optic modulator (806) is by receiving
Ji Chi (808) is collected, the level-one light being once emitted reflected by 0 ° of reflecting mirror (802) after along backtracking acousto-optic modulator (806),
By the level-one light of acousto-optic modulator (806) secondary outgoing through along the first lens of backtracking (805), and through quarter-wave plate
(809), plane mirror (7) are emitted to after polarization beam splitter prism (804), 45 ° of reflecting mirrors (801).
3. a kind of device for measuring atomic hyperfine according to claim 1, which is characterized in that further include that saturation is inhaled
Spectrum locking device and FP chamber locking device are received, the saturation-absorption spectrum locking device is for locking first laser device (1) hair
Laser frequency out, the FP chamber locking device are used to lock the laser frequency of second laser (9) sending.
4. a kind of method for measuring atomic hyperfine, which comprises the following steps:
Step 1: the laser of relative frequency is selected according to the fine-structure energy levels of atom, by the laser lock of first laser device (1)
Be scheduled on the ground state of atom to be measured | 1 > to excitation state | 2 > hyperfine structure transition on, the laser lock-on of second laser (9)
In excited of atoms | 2 > arrive excited level to be measured | near 3 > resonant transition；
Step 2: building optical path, the laser for issuing first laser device (1) after atomic sample pond (2), light splitting plain film (4) by entering
The laser for being mapped to photodetector, while issuing second laser (9) passes through the acousto-optic modulation in acousto-optic modulator system (8)
The atomic sample pond (2) is incident on after device (806), after passing sequentially through plane mirror (7), light splitting plain film (4) and with first
The laser of laser (1) coincides with atomic sample pond (2)；
Step 3: by RF driving source (6) continuous scanning acousto-optic modulator system (8), making acousto-optic modulator system (8) not
The laser issued under same scanning voltage to second laser (9) generates different frequency shift (FS)s, and passes through photodetector (5)
Detection obtains Transition Spectra, and last corresponding relationship and scanning voltage according to transition peak and scanning voltage spectrally is corresponding
Frequency values, the precise frequency interval between corresponding energy level is calculated.
5. a kind of method for measuring atomic hyperfine according to claim 4, which is characterized in that in the step 2,
Acousto-optic modulator system (8) further includes 45 ° of reflecting mirrors (801), 0 ° of reflecting mirror (802), half wave plate (803), polarization point
Beam prism (804), quarter-wave plate (809), the first lens (805), the second lens (807) and collecting pit (808), second swashs
The laser that light device (9) issues, passes sequentially through half wave plate (803), polarization beam splitter prism (804), quarter-wave plate
(809), it is incident in acousto-optic modulator (806) after the first lens (805), the zero level being once emitted by acousto-optic modulator (806)
Light is collected by collecting pit (808), the level-one light being once emitted reflected by 0 ° of reflecting mirror (802) after along backtracking acousto-optic modulator
(806), by the level-one light of acousto-optic modulator (806) secondary outgoing through along the first lens of backtracking (805), and through a quarter
Plane mirror (7) are emitted to after wave plate (809), polarization beam splitter prism (804), 45 ° of reflecting mirrors (801).
6. a kind of method for measuring atomic hyperfine according to claim 4, which is characterized in that in the step 1,
So that first laser device is locked in ground state by saturation-absorption spectrum | 1 > to excitation state | 2 > hyperfine structure transition on, make second
The laser that laser issues separate it is a branch of be incident on FP chamber, when the laser frequency tuning that second laser issues arrive it is sharp positioned at atom
Send out state | 2 > arrive excitation state to be measured | when near 3 > resonant transition, by the Frequency Locking of second laser on FP chamber.
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| CN110837109A (en) * | 2019-10-22 | 2020-02-25 | 山西大学 | Atomic excited state spectrum obtaining method and hyperfine energy level measuring method and device |
| CN111912338A (en) * | 2020-06-29 | 2020-11-10 | 山西大学 | Displacement measurement device and method based on electromagnetic induction transparent atomic grating |
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