CN109001615B - Automatic test system for active implantation type medical instrument detection - Google Patents
Automatic test system for active implantation type medical instrument detection Download PDFInfo
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- CN109001615B CN109001615B CN201810813336.8A CN201810813336A CN109001615B CN 109001615 B CN109001615 B CN 109001615B CN 201810813336 A CN201810813336 A CN 201810813336A CN 109001615 B CN109001615 B CN 109001615B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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Abstract
The invention provides an automatic test system for active implantation type medical instrument detection, which comprises: the device comprises a shifting tool, a power supply and a computer; the shifting tool is provided with a charging programmer, an induction coil and a test board, and is used for changing the relative position of the charging programmer and the induction coil; the test board is provided with an element for providing load for the tested circuit board and an interface for connecting the tested circuit board and the induction coil; the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the circuit board to be tested, controlling the charging programmer to charge the power supply through the induction coil and the circuit board to be tested, and obtaining working parameters of the circuit board to be tested through the charging programmer.
Description
Technical Field
The invention relates to the technical field of medical equipment detection, in particular to an automatic test system for active implantable medical instrument detection.
Background
An Implantable Medical Device (IMD) is a Medical apparatus installed inside the body of a user, and the IMD has a battery, a circuit board (provided with sensors, chips, etc.), and implements corresponding therapy depending on a set program and operating parameters, which may be set differently according to the condition of the user. Because the causes and conditions of the users are different, different implantable medical devices installed in the bodies of the users generally have different operating states, and the operating states are represented in various aspects of the battery voltage, the operating time, the power, the current magnitude, the frequency and the like of the implantable medical devices.
In order to ensure the stability and safety of the implanted part, the implanted part generally needs to be detected comprehensively, the existing scheme adopts manual detection on the whole machine, the detection mode has low efficiency, and the whole machine comprises a circuit board, a battery, an electrode and other parts, so that the pertinence of the detection process needs to be improved.
Disclosure of Invention
The invention provides an automatic test system for active implantation type medical instrument detection, which comprises: the device comprises a shifting tool, a power supply and a computer; the shifting tool is provided with a charging programmer, an induction coil and a test board, and is used for changing the relative position of the charging programmer and the induction coil; the test board is provided with an element for providing load for the tested circuit board and an interface for connecting the tested circuit board and the induction coil; the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the circuit board to be tested, controlling the charging programmer to charge the power supply through the induction coil and the circuit board to be tested, and obtaining working parameters of the circuit board to be tested through the charging programmer.
Preferably, the power supply is further used for supplying power to the charging programmer, the test board and the circuit board to be tested, so that the circuit to be tested outputs a waveform signal according to the load board supplied by the test board.
Preferably, the system further comprises an acquisition card for acquiring the waveform signal output by the circuit board to be tested; and the computer acquires the waveform signal output by the tested circuit board through the acquisition card.
Preferably, the charging programmer is also used for reading the inherent information of the circuit board to be tested through the induction coil; the computer determines signals for controlling elements on the test board from the intrinsic information.
Preferably, the computer is further configured to control the displacement tool to change a relative position of the induction coil and the charging programmer during a charging process.
Preferably, a magnet is further arranged on the displacement tool; the computer is also used for controlling the displacement tool to change the relative position of the magnet and the circuit board to be tested and detecting the working state of the electromagnetic switch on the circuit board to be tested.
Preferably, the interface on the test board for connecting the circuit board to be tested is a gold finger interface.
Preferably, the operating parameters include charging current, charging voltage, and temperature.
Preferably, the computer is further configured to read the operating parameters of the charging programmer and calculate the charging efficiency according to the operating parameters of the circuit board to be tested and the operating parameters of the charging programmer.
Preferably, the computer is further used for setting the output parameters of the tested circuit board through the charging programmer and the induction coil.
The test system provided by the invention simulates a battery of an implant device by using a power supply, simulates an external charging device by using a charging programmer, simulates a coil of the implant device by using an induction coil, simulates a peripheral circuit of a tested circuit board by using a test board, so that the tested circuit board is in an actual working environment, and simultaneously changes the relative position of the coil of the charging programmer and the induction coil by using a shifting tool to simulate the charging operation which possibly occurs in the actual use process of a user.
Drawings
The features and advantages of the present invention will be more clearly understood by reference to the accompanying drawings, which are illustrative and not to be construed as limiting the invention in any way, and in which:
FIG. 1 is a schematic diagram of an automatic test system for active implantable medical device detection according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram illustrating a shift tool for automatic testing of a circuit board of an implanted medical instrument according to an embodiment of the invention;
FIG. 3 is a schematic structural diagram illustrating another view of a shift tool for automatic testing of a circuit board of an implanted medical instrument according to an embodiment of the invention;
FIG. 4 is a schematic structural diagram illustrating a shift tool for automatic testing of a circuit board of an implanted medical instrument according to another embodiment of the invention;
FIG. 5 is a schematic structural diagram illustrating another view of a shift tool for automatic testing of circuit boards of implanted medical instruments according to another embodiment of the present invention;
FIG. 6 is a flow chart of a circuit board inspection method according to an embodiment of the present invention;
FIG. 7 is a flow chart of another method for inspecting a circuit board according to an embodiment of the present invention;
FIG. 8 is a schematic structural diagram of a circuit board according to an embodiment of the present invention;
FIG. 9 is a schematic structural diagram of a test board according to an embodiment of the present invention;
FIG. 10 is a schematic diagram of a test board according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The implanted device communicates wirelessly and charges/powers the implanted battery/capacitor. The implanted device generally includes a circuit board, charging and communication coils, a battery, an output electrode, and a number of sampling resistors. The tested circuit board in the embodiment of the invention is a circuit board implanted in equipment, and the circuit board is provided with various electrical components which are core components of the implanted equipment and used for controlling the working state of the implanted equipment.
Embodiments of the present invention provide an automatic test system for active implantable medical device detection, which may be used to detect charged and non-charged products such as DBS (deep brain stimulation), VNS (vagal stimulation), SCS (Spinal cord stimulation), and SNM (Sacral neurostimulation). As shown in fig. 1, the system includes: a shift tool 11, a power supply 12 and a computer 13. The shifting tool 11 is provided with a charging programmer 14, an induction coil 15 and a test board 16, and the shifting tool 11 is used for changing the relative position of the charging programmer 14 and the induction coil 15.
The specific structure of the displacement tool 11 can be chosen from various options, for example, it can be an electric device with one or more guide rails, and the charging programmer 14 and the induction coil 15 can be respectively placed on two platforms capable of realizing relative movement, so that the position change between the two platforms can be realized. The tested object in the embodiment of the invention is only the tested circuit board 10, the induction coil 15 is a part of the test system, and the simulation is the charging and communication coil of the implanted device; the charging programmer 14 simulates an external charging device, and the charging programmer 14 also has an induction coil inside. The relative position may be a relative distance, and may also include a relative angle, etc. depending on the structure of the shift tool 11, the present invention provides a preferred structure, which will be described in detail in the following embodiments.
The test board 16 is provided with elements for supplying a load to the circuit board 10 under test, peripheral circuits of the circuit board 10 under test, and an interface for connecting the circuit board 10 under test and the induction coil 15, and the induction coil 15 is connected to the circuit board 10 under test through the test board 16. The components on the test board 16 may include, for example, several load simulating components, relays, analog switches, electrodes, resistors, etc. for simulating the components, such as output electrodes, sampling resistors, etc., connected in the actual product by the circuit board 10 under test and simulating the actual load condition of the circuit board 10 under test.
The computer 13 is respectively connected with the test board 16, the charging programmer 14 and the power supply 12, and is used for controlling elements on the test board 16 to provide loads to the circuit board 10 to be tested, controlling the coil of the charging programmer 14 to charge the power supply 12 (the power supply is a battery simulator and is set as a rechargeable battery during the charging test) through the induction coil 15 and the circuit board 10 to be tested, and acquiring the working parameters of the circuit board 10 to be tested through the charging programmer 14. These operating parameters may be collected by peripheral circuitry (e.g., temperature sampling resistors) on test board 16 and communicated to charge programmer 14 via induction coil 15.
During the charging process of the power supply 12, the shift tool 11 can change the relative position of the coil of the charging programmer 14 and the induction coil 15, and the change of the distance or the angle between the two will affect the operating parameters of the circuit board 10 under test, such as the charging current, the charging voltage, the temperature, and the like. The coil of the charge programmer 14 will communicate with the induction coil 15 by wireless communication to read these parameters. For collecting the charging current, an ammeter 17 can be disposed between the power source 12 and the testing board 16 to measure the charging current, and then the computer 13 can compare the data with the charging current of the current sensor of the circuit board 10 under test transmitted by wireless communication, and these operating parameters will be used as the testing result to determine whether the circuit board 10 under test is qualified or not. In the non-charging state, i.e., during the period when the circuit board 10 under test is performing the therapy test, the ammeter 17 may be used for reading the power supply power consumption test data.
The test system provided by the embodiment of the invention simulates the battery of the implantation equipment by using the power supply (battery simulator), simulates the external charging equipment by using the charging programmer, simulates the coil of the implantation equipment by using the induction coil, simulates the peripheral circuit of the tested circuit board by using the test board, enables the tested circuit board to be in an actual working environment, simultaneously changes the relative position of the coil of the charging programmer and the induction coil by using the shifting tool so as to simulate the charging operation which is possibly generated in the actual use process of a user, controls the charging process by using the computer and reads the working parameters of the tested circuit board, carries out a relatively strong test on the circuit board of the implantation equipment, realizes automatic operation in the whole test process, and has relatively high working efficiency.
As a preferred embodiment, the computer 13 in this embodiment can also read the operating parameters of the charging programmer 14, and calculate the charging efficiency according to the operating parameters of the circuit board 10 under test and the operating parameters of the charging programmer 14. Charging efficiency is the charging current of the circuit board 10 under test and the voltage of the circuit board 10 under test/(charging programmer voltage charging programmer current).
The charging current and voltage of the circuit board 10 to be tested can be sampled by the circuit board 10 itself, the voltage and current of the charging programmer 14 can be sampled by the charging programmer, and the charging efficiency can also be calculated by the charging programmer 14 and then sent to the computer 13.
In another embodiment of the present invention, a system for detecting a circuit board of an implanted medical instrument is provided, and on the basis of the previous embodiment, a magnet is further disposed on the displacement tool 11 of this embodiment. The implanted device is usually provided with an electromagnetic switch for resetting, a user can trigger the switch through a magnet to realize corresponding control, the magnet in the embodiment is used for detecting the resetting function of the circuit board 10 to be tested, and the computer 13 can control the displacement tool 11 to change the relative position of the magnet and the circuit board 10 to be tested and detect the working state of the electromagnetic switch on the circuit board 10 to be tested.
The displacement tool 11 of the present embodiment controls the position change of two sets of devices, i.e. the relative position of the magnet and the circuit board 10 to be tested, and the relative position of the coil of the charging programmer 14 and the induction coil 15. For this reason, the present embodiment provides a preferred structure of the shift tool 11, and as shown in fig. 2 and 3, the shift tool 11 includes: the device comprises a Y-axis guide rail A, an X-axis guide rail B, a translation table 111, an induction coil tool 112, a charging programmer coil tool 113, a magnet tool 114 and a test board platform 115. The X-axis guide rail B is movably arranged on the Y-axis guide rail A and driven by the Y-axis guide rail A, the X-axis guide rail B and the Y-axis guide rail A are arranged in a crossed and vertical mode, the translation table 111 is movably arranged on the X-axis guide rail B and driven by the X-axis guide rail B, the induction coil tool 112 and the magnet tool 114 are fixedly arranged on the translation table 111, and the induction coil tool 112 and the magnet tool 114 are arranged on the translation table 111 in an orthogonal mode. The charging programmer coil tooling 113 is positioned at one end of the X-axis guide rail B and is relatively fixedly arranged with the X-axis guide rail B; the test board platform 115 is located at one end of the Y-axis guide rail a and is relatively fixedly arranged with the Y-axis guide rail a.
In the displacement tool 11 of the present embodiment, the coil of the charge programmer 14 is installed in the charge programmer coil tool 113, and the induction coil 15 is installed in the induction coil tool 112. In order to adapt to the tests of different types of products and enhance the universality of the shifting tool 11, the charging programmer coil tool and the induction coil tool 1 adopt a uniform fixing and wiring mode, and only the charging programmer coil tool and the induction coil tool need to be replaced when different products are tested.
In the displacement tool 11 of the present embodiment, the coil tool 113 of the charging programmer and the coil of the charging programmer 14 are fixedly installed at one end of the X-axis guide rail B; the translation stage 111 is movably arranged on the X-axis guide rail B and corresponds to a coil of the charging programmer 14, an induction coil tool 112 aligned with the coil of the charging programmer 14 is arranged on the translation stage 111, the induction coil 15 is installed on the induction coil tool 112, the translation stage 111 is further provided with a magnet tool 114 arranged orthogonally to the induction coil tool and a magnet installed on the magnet tool 114, the translation stage 111 is controlled by the X-axis guide rail B to move, and the translation stage 111 drives the induction coil and the magnet to move together when moving. In the shift tooling 11 of this embodiment, a test board platform 115 is disposed at one end of the Y-axis guide rail a, and a test board 16 is disposed on the test platform; the X-axis guide rail B is vertically arranged on the Y-axis guide rail A, and the X-axis guide rail B and all structures arranged on the X-axis guide rail B are controlled by the Y-axis guide rail A to move. In the shift tool 11 of the present embodiment, the movement control of the Y-axis guide rail a and the X-axis guide rail B can be performed independently.
In order to meet the requirement of communication test and ensure stable communication in the test process, in the shift tool 11 of the embodiment, the alignment condition of the induction coil 15 and the coil of the charging programmer 14 is not affected by the movement of the translation stage 111; the relative distance between the induction coil 15 and the coil of the charging programmer 14 is controlled by the X-axis guide B and varies with the movement of the translation stage 111.
Alternatively, as shown in fig. 4, the charging programmer coil fixture may be further disposed on the translation stage and moves along with the translation stage, and the induction coil fixture is fixedly disposed at one end of the X-axis guide rail, that is, the induction coil fixture and the charging programmer fixture are switched to the lower position in this embodiment.
In order to meet the requirement of detecting the reset function of the circuit board 10 to be tested and enhance the universality of the shift tool 11, the shift tool 11 in the embodiment can realize the relative position adjustment of the magnet and the circuit board 10 to be tested. In the displacement tool 11 of the present embodiment, the magnet is mounted on the magnet tool 114, and the position of the magnet on the magnet tool 114 is adjustable. One end of the Y-axis guide rail A is provided with a test board platform 115, the test board 16 is arranged on the test platform, and the tested circuit board 10 is arranged on the test board 16. In the shifting platform 11, the magnet tool 114 and the X-axis guide rail B can adjust the alignment condition of the magnet and the electromagnetic switch on the circuit board 10 to be tested, and the Y-axis guide rail a controls the movement of the X-axis guide rail B to realize the adjustment of the relative distance between the magnet and the circuit board 10 to be tested.
The translation stage 111 of the displacement tool of this embodiment is provided with a second mounting rack 1111 and a first mounting rack 1112 which are orthogonally arranged, the induction coil tool 112 is detachably mounted on the second mounting rack 1111, the magnet tool 114 is detachably mounted on the first mounting rack 1112, in order to ensure that the magnet on the X-axis guide rail B can be aligned with the electromagnetic switch on the circuit board 10 under test during the magnet function test, the magnet tool 114 includes a sliding frame 1141 and a sliding block 1142, the sliding frame 1141 is slidably mounted on the first mounting frame 1112 up and down by a vertical sliding rail arranged on the first mounting frame 1112, the sliding frame 1141 is provided with a horizontal sliding rail along the X-axis direction, the sliding block 1142 is slidably mounted on the sliding frame 1141 horizontally left and right by a horizontal sliding rail, the sliding block 1142 is provided with a magnet mounting portion 1142a for mounting the magnet, thus, during the magnet function test, the magnet can be adjusted up, down, left and right relative to the circuit board to be tested so as to ensure the alignment of the electromagnetic switch on the circuit board to be tested. Since the induction coil tooling 112 and the magnet tooling 114 are both disposed on the translation stage 111, in order to avoid the induction coil from being interfered by the magnet tooling 114, the distance from the center of the induction coil tooling 112 to the center of the magnet mounting portion 1142a on the magnet tooling 114 is not less than 5 cm.
In addition, the shift tool of this embodiment further includes a first locking structure for locking the sliding frame 1141 on the first mounting frame 1112 and a second locking structure for locking the slider on the sliding frame 1141, and after the magnet is aligned with the electromagnetic switch of the circuit board to be tested, the position of the magnet is locked by the first locking structure and the second locking structure, which are preferably fasteners.
The displacement tool of the embodiment comprises the above components, and further comprises a tool base 116, wherein the X-axis guide rail B, the Y-axis guide rail a, the charging programmer coil tool 113 and the test board platform 115 are all fixedly arranged on the tool base 116.
The test functions involved in using the shifting tool of the present embodiment are described below with reference to the accompanying drawings, as shown in fig. 2 and 3:
firstly, a communication function:
and controlling the translation table 111 to move along the X-axis guide rail B, adjusting the distance between the charging programmer coil and the induction coil, and performing communication distance test.
II, magnet control function:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform a magnet control test;
b, controlling the translation stage 111 to move along the X-axis guide rail B, so that the magnet on the translation stage 111 is aligned to the electromagnetic switch on the circuit board to be tested; controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to an electromagnetic switch on the circuit board to be tested;
c, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is far away from the electromagnetic switch on the circuit board to be tested;
d, the charging programmer coil is communicated with the induction coil, and the test result is read.
Thirdly, hardware reset function:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform hardware reset test;
b, controlling the translation stage 111 to move along an X-axis guide rail B, enabling the induction coil to be close to the coil of the charging programmer, and enabling the magnet to be aligned with the electromagnetic switch on the circuit board to be tested;
c, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to an electromagnetic switch on the circuit board to be tested;
d, waiting for a period of time;
e, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is far away from the electromagnetic switch on the circuit board to be tested; the translation stage 111 is controlled to move along the X-axis guide rails B, moving the induction coil away from the charge programmer coil, back to the initial position.
f, the charging programmer coil is communicated with the induction coil, and a test result is read.
Fourthly, charging distance:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform a magnet control test;
b, controlling the translation table 111 to move along the X-axis guide rail B according to the test requirement, so that the distances between the charging programmer coil and the induction coil reach 0cm,1cm and 2cm respectively until the distances reach 10 cm;
and c, charging and returning a test result under the condition of different distances.
The control of the relative position by the shift tool 11 may be performed independently, and may be performed by a controller provided in the shift tool 11 alone, for example. In order to improve the overall convenience, the computer 13 is used to control the shift tool 11 in this embodiment, that is, the computer 13 in this embodiment is also used to control the shift tool 11 to change the relative position of the induction coil 15 and the coil of the charging programmer 14 during the charging or communication process.
The implementation of the present invention is not limited to the above preferred embodiment, but also includes other embodiments, for example, as shown in fig. 4 and 5, the difference between the shifting tool and the shifting tool of the above preferred embodiment is that: the test board and the tested circuit board of the shifting tool are fixedly arranged on one side of the induction coil 112 of the translation table, and the magnet tool is fixedly arranged at one end of the Y-axis guide rail and opposite to the Y-axis guide rail. The advantage of arranging the test board and the induction coil on the translation table is that the connecting line between the test board and the induction coil cannot move along with the movement of the translation table, so that the stability and the accuracy of the test are further ensured.
Specifically, the test board and the tested circuit board of the shifting tool are also arranged on the translation stage, the test board is positioned on one side of a coil or an induction coil of the charging programmer which is positioned on the translation stage, and the tested circuit board and the coil or the induction coil of the charging programmer are arranged in an orthogonal mode; the magnet tool comprises a second fixing table 118 and a magnet position adjusting mechanism, wherein the second fixing table 118 is arranged at one end of the Y-axis guide rail and is opposite to the Y-axis guide rail, the magnet position adjusting mechanism is movably arranged on the second fixing table 118, and a magnet is arranged on the magnet adjusting mechanism, so that the position of the magnet can be adjusted through the magnet adjusting mechanism to enable the magnet to be aligned with the circuit board to be tested and to adjust the distance between the magnet and the circuit board to be tested.
Further, magnet position control mechanism includes slide table 119, first mounting bracket and carriage, and wherein slide table 119 can set up along X axle direction with sliding on second fixed station 118, first mounting bracket is fixed slide table 119 and set up towards circuit board one side by the circuit board, the carriage can be installed with sliding from top to bottom first mounting bracket orientation on the face of circuit board one side by the circuit board, magnet fixed mounting is in first carriage is kept away from charge one end of programmer's coil or induction coil. Through the arrangement of the magnet position adjusting mechanism, the magnet can be subjected to position adjustment in the X-axis direction, the Y-axis direction and the vertical height direction relative to the tested circuit board, so that the alignment or the remote operation required during the test is realized.
Still further, still be equipped with on the carriage and follow X axle direction gliding ground slider, be equipped with on the slider and be used for the installation the magnet installation department of magnet. The position of the magnet in the X-axis direction can be adjusted by the slider.
The test functions involved in using the displacement tool of this alternative embodiment are described below with reference to the accompanying drawings, as shown in fig. 4 and 5:
firstly, a communication function:
and controlling the translation table 111 to move along the X-axis guide rail B, adjusting the distance between the charging programmer coil and the induction coil, and performing communication distance test.
II, magnet control function:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform a magnet control test;
b, controlling the sliding table 119 to move on the second fixed table 118 along the X-axis direction, and enabling the magnet to be aligned with the electromagnetic switch on the circuit board to be tested on the translation table; controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that an electromagnetic switch of the circuit board to be tested is close to the magnet;
c, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that an electromagnetic switch of the circuit board to be tested is far away from the magnet;
d, the charging programmer coil is communicated with the induction coil, and the test result is read.
Thirdly, hardware reset function:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform hardware reset test;
b, controlling the translation stage 111 to move along an X-axis guide rail B to enable the induction coil to be close to the coil of the charging programmer, and controlling the sliding stage 119 to move on the second fixed stage 118 along the X-axis direction to enable the magnet to be aligned with the electromagnetic switch on the circuit board to be tested;
c, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to an electromagnetic switch on the circuit board to be tested;
d, waiting for a period of time;
e, controlling the X-axis guide rail B to move along the Y-axis guide rail A, so that an electromagnetic switch on the circuit board to be tested is far away from the magnet; the translation stage 111 is controlled to move along the X-axis guide rails B, moving the induction coil away from the charge programmer coil, back to the initial position.
f, the charging programmer coil is communicated with the induction coil, and a test result is read.
Fourthly, charging distance:
a, controlling the translation table 111 to move along an X-axis guide rail B, adjusting the distance between a charging programmer coil and an induction coil, realizing communication, and confirming to perform a magnet control test;
b, controlling the translation table 111 to move along the X-axis guide rail B according to the test requirement, so that the distances between the charging programmer coil and the induction coil reach 0cm,1cm, and 2cm … … to 10cm respectively;
and c, charging and returning a test result under the condition of different distances.
The control of the relative position by the shift tool 11 may be performed independently, and may be performed by a controller provided in the shift tool 11 alone, for example. In order to improve the overall convenience, the computer 13 is used to control the shift tool 11 in this embodiment, that is, the computer 13 in this embodiment is also used to control the shift tool 11 to change the relative position of the induction coil 15 and the coil of the charging programmer 14 during the charging or communication process.
It should be noted that, by using the shifting tool of this embodiment, the relative position between the circuit board 10 to be tested and the operator is convenient for the operator to insert and remove the circuit board to be tested from the gold finger socket with both hands. The magnet is placed in the magnet frock on the translation platform, and the translation platform is along the adjustable circuit board under test of Y axle and the distance of magnet, and magnet is close to magnet when testing hardware reset function at 0-2cm, keeps the distance above 8cm when testing other projects to avoid magnet to produce unexpected effect to the dry reed switch on the circuit board under test. A coil of the charging programmer is placed in a charging programmer coil tool on a translation table, an induction coil is arranged at the tail fixed end of an X-axis guide rail, and the translation table can adjust the distance between the coil of the charging programmer and the induction coil along the X axis so as to meet the testing requirements of communication distance (0-5cm) and charging distance (0-2 cm). The hardware reset function needs the matching of an X axis and a Y axis, when the hardware reset function is tested, the distance between a tested circuit board and a magnet is adjusted to 0-2cm, and the distance between a coil of a charging programmer and an induction coil is adjusted to 0-5 cm. The magnet and the charging programmer coil are both positioned on a tool arranged on the translation table 99, and the distance between the magnet and the charging programmer coil is not less than 5 cm. The coil and induction coil of the charge programmer must move synchronously, always keeping the central axis centered. The tested circuit board and the magnet always keep a distance of more than 8cm and are close to each other only when the hardware is reset and the magnet is tested.
In order to more fully detect the performance of the circuit board, the present embodiment also collects the output signals of the circuit board 10 under test. The power supply 12 in this embodiment is also used to provide power to the charging programmer 14, the test board 16, and the circuit board under test 10, so that the circuit under test outputs a waveform signal, such as an electrical pulse stimulation signal, according to the load board provided by the test board 16.
Correspondingly, the system further comprises an acquisition card 18 for acquiring the waveform signal output by the circuit board 10 to be tested, and the computer 13 acquires the waveform signal output by the circuit board 10 to be tested through the acquisition card.
The computer 13 can also set the output parameters of the tested circuit board through the charging programmer 14 and the induction coil 15. The computer 13 controls the charging programmer to program the circuit board 10 by wireless communication, and for example, the pulse output amplitude and frequency of the circuit board 10 may be set according to the test requirement.
The test of the output waveform, the test of the charging process, and the test of the reset function may be performed in any order, and these detection operations do not conflict.
Those skilled in the art will appreciate that manufacturers also typically provide a variety of types and models of implant devices, such as brain pacemakers, spinal cord stimulators, and the like. In order to enable the detection system provided by the present invention to detect circuit boards from different implanted devices, as a preferred embodiment, the charging programmer 14 in this embodiment is further configured to read the intrinsic information of the circuit board 10 under test through the induction coil 15, and the computer 13 can determine the signals for controlling the components on the test board 16 according to the intrinsic information. Therefore, the system can provide proper load signals for circuit boards of different models, and has better expansibility.
The above-mentioned process of reading the inherent information should be performed before the detection is started, and in combination with the above-mentioned detection function, the embodiment of the present invention further provides a detection method, which is executed by the above-mentioned computer 13, as shown in fig. 6, and the method includes the following steps:
s1, the inherent information of the tested circuit board 10 of the implanted device is obtained through the charging programmer 14, and the information can be recorded in the tested circuit board 10 or the charging programmer 14, and specifically can be type information, model information and the like;
S2A, determining a distance value and a charging parameter according to the inherent information, wherein the distance value represents the distance between the coil and the induction coil 15 of the charging programmer 14; the charging parameter may be, for example, a charging current. Before testing, each inherent information and its corresponding test scheme (including distance value and charging parameter) may be stored in the computer 13, and when the test board 16 is connected to the circuit board 10 after the start of detection, the computer 13 may obtain the inherent information and query the test scheme (including distance value and charging parameter) corresponding thereto.
S3A, sending the charging parameters to the charging programmer 14 and the circuit board under test 10. The charging parameters in this embodiment include power output parameters suitable for charging programmer 14 and power receiving parameters suitable for circuit board 10 under test. These charging parameters may, for example, specify that charging programmer 14 output power at one or more charging currents, and accordingly, may also specify that circuit board 10 under test switch appropriate resistance parameters to accommodate the magnitude of the charging current. As mentioned above, the computer 13 is connected to the test board 16, and the charging parameter can be transmitted to the circuit board 10 through the test board 16.
And S4A, controlling the movable tool 11 to adjust the distance between the coil of the charging programmer 14 and the induction coil 15 according to the distance value, setting the power supply 12 to be in a charged state by the computer 13, and controlling the charging programmer 14 to charge the power supply 12 in an incoming line based on the charging parameters through the induction coil 15 and the circuit board 10 to be tested. For example, the distance value can be set to be one or more, that is, the distance value and the distance value can be wirelessly charged at a fixed distance or at a plurality of different distances; at each distance, one or more corresponding charging parameters can be set, and the charging effect can be flexibly and comprehensively detected according to the requirements of products and users.
S5A, receiving the working parameters fed back by the circuit board 10 according to the charging parameters, specifically, reading the working parameters recorded by the sensors on the circuit board 10 through the test board 16, where the working parameters may include, for example, a charging voltage, a charging current, a temperature value, etc.;
for some working parameters, such as temperature values, the test board 16 also has some peripheral circuits, and the peripheral circuits may include temperature sampling resistors, that is, the test board 16 may also simultaneously acquire working parameters such as temperature generated during the charging process, so the working parameters may also include parameters detected by the test board 16.
S6A, determining whether the circuit board 10 is normal according to the operating parameters, for example, determining whether the charging voltage, the charging current, the temperature value, etc. of the circuit board 10 meet the expectations, respectively, so as to determine whether the state is normal.
The detection method provided by the embodiment of the invention determines corresponding test parameters by automatically acquiring the inherent information of the tested circuit board, and sends appropriate charging parameters to the charging programmer and the tested circuit board, so that the tested circuit board is in an actual working environment, and simultaneously, the relative position of the coil of the charging programmer and the induction coil is changed by using the shifting tool to simulate the charging operation which possibly occurs in the actual use process of a user.
In order to improve convenience and accuracy, the intrinsic information is preferably stored in the circuit board 10 under test, and the step S1 may specifically include the following steps:
s11, sending an activation signal to the charging programmer 14, and waiting for the charging programmer 14 to communicate with the circuit board under test 10 via the induction coil 15 to obtain the intrinsic information.
S12, the intrinsic information fed back by the charging programmer 14 is received.
The starting signal may be a simple digital signal, and after receiving the starting signal, the charging programmer 14 may wirelessly send a handshake signal, which may be a waveform signal, to the circuit board 10 under test; circuit board under test 10 may interpret the handshake signal and respond by sending the intrinsic information to charge programmer 14 and then to computer 13.
As a preferred implementation, the charging parameters in this embodiment include a charging time and a charging current, wherein each distance value corresponds to the same charging time and charging currents, respectively. For example, four distance values X1 … … X4, charging time t, and charging current a1 … … a4 may be preset, and these parameters may form various combinations, and S4A may include the following steps:
S4A1, controlling the movable tool 11 to set the charging programmer 14 and the induction coil 15 at each distance respectively and stay for corresponding charging time;
s4a2, the charging programmer 14 is controlled to charge the power source 12 based on a plurality of charging currents through the induction coil 15 and the circuit board 10 under test respectively during the stay.
For example, the charging operation corresponding to X1 can be completed by stopping at least 4 × t (four time periods with the same length) at the distance X1 and respectively charging the time periods by using a1 … … a 4; and then adjusting the distance to X2, similarly stopping for four time periods with the same length, respectively charging by adopting A1 … … A4 in each time period, and then completing the charging action corresponding to X1 … … X4 by adopting the same operation mode at the distances of X3 and X4.
S5A is synchronized with S4A, and the computer 13 collects the working parameters of the circuit board 10 during the charging process in real time, so that four sets of parameters, i.e., working parameters corresponding to four different distances, can be obtained, where each set of parameters includes working parameters corresponding to four charging currents.
The preferable detection scheme can accurately detect the working state of the circuit board to be detected under different distances and different charging parameters, so that the reliability of the detection result is improved.
In order to further improve the reliability and convenience of the detection operation, after the step S1, the method may further include:
S1A, determining the criterion parameter according to the inherent information, and the step can be performed synchronously with S2A. The criterion parameters should correspond to the operating parameters collected in step S5A, and may include, for example, a standard charging voltage, a standard charging current, a temperature upper limit value, and the like.
In case the criterion parameter is available, step S6A may comprise the following steps:
S6A1, comparing the working parameters with the criterion parameters;
and S6A2, judging whether the circuit board 10 to be tested is normal according to the comparison result, for example, judging whether the working parameter is consistent with the criterion parameter or whether the error of the working parameter and the criterion parameter is within an acceptable range, thereby determining whether the circuit board 10 to be tested is normal.
The detection operation of the output waveform will be described below. After step S1, the computer 13 may control the charging programmer 14 to set the circuit board 10 under test by wireless communication, for example, the output amplitude and frequency, etc. may be set, and then perform the detection process of the output signal, specifically, as shown in fig. 7, the method may further include the following steps:
S2B, determining the load parameter and the power supply parameter according to the intrinsic information, wherein the load parameter and the power supply parameter may be part of the test scheme, and this step may be performed in synchronization with the step S2A. The load parameters and power supply parameters of various types or models of products are different, and the load parameters are 1k resistance for a nerve stimulator and 500 ohm resistance for a spinal cord stimulator, for example; the power supply parameter is, for example, a power supply voltage.
S3B, controlling the power supply 12 to supply power to the circuit board 10 according to the power supply parameters, setting the power supply 12 to be in an output power state by the computer 13, and supplying power to the circuit board 10 to simulate the actual working state;
S4B, sending the load parameters to the test board 16 connected to the circuit board 10 to be tested, wherein the test board 16 will adjust its own element state according to the received load parameters to simulate the load of the circuit board 10 to make the circuit board 10 to be tested output waveform signals under the influence of the load parameters;
S5B, acquiring the waveform signal output by the circuit board 10 to be tested by the acquisition card 18;
and S6B, judging whether the circuit board 10 to be tested is normal according to the waveform signal.
The steps S3B-S6B and the steps S3A-S6A are isolated from each other and do not interfere with each other, the method carries out full-automatic detection on the output signal of the circuit board 10 to be detected, and the comprehensiveness and convenience of the detection operation are further improved.
The judgment of the output waveform may further include, after step S1, similarly to step S1A:
S1B, determining a criterion signal according to the inherent information;
in this case, step S6B may include:
S6B1, comparing the waveform signal with the criterion signal;
and S6B2, judging whether the circuit board 10 to be tested is normal according to the comparison result, wherein the signal comparison method has various specific modes, and the invention is not repeated.
Besides the detection of the charging function and the output signal, a step of detecting the reset function of the circuit board 10 to be tested can be added, the step is carried out under the condition that the power supply 12 supplies power to the circuit board 10 to be tested, the computer 13 controls the magnet on the movable tool 11 to be close to the circuit board 10 to be tested, and meanwhile, the charging programmer 14 is used for detecting whether the circuit board 10 to be tested is reset (various parameters are restored to initial values).
An embodiment of the present invention provides a computer device, including: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor, so that the at least one processor executes the method for detecting the circuit board of the implanted medical instrument.
Referring to fig. 8 and 9, the test board 16 and the circuit board 10 under test according to the embodiment of the present invention will be described in detail.
The embodiment of the invention provides a circuit board 10 to be tested, which comprises a base part 101 and a part 102 to be tested, wherein the part 102 to be tested is a circuit board of an implanted device.
The base 101 is provided with a through hole for accommodating the measured portion 102. In the present embodiment, the measured portion 102 is an approximately arc-shaped structure, and accordingly, the middle portion of the base portion 101 is hollowed out with a suitable shape to form a through hole.
The edge of the measured part 102 is connected with the edge of the through hole through a plurality of cuttable parts 103, and the measured part 102 and the base part 101 are in the same plane. In order to connect the two parts stably, the present embodiment is provided with a plurality of cuttable parts 103, and a gap is left at a position other than the cuttable part 103.
One end of the base 101, i.e. the upper position in fig. 8, is provided with a plurality of conductive contacts 104 for connection to external test equipment, such as the test board 16 in the above-described embodiment, which contacts 104 form gold finger plugs (corresponding gold finger sockets are provided on the test board 16) laid out at the end of the base 101. The conductive contact piece 104 is connected to each connection point on the measured portion 102 through a conductive wire provided in the base portion 101 and the measured portion 102, respectively, and the conductive wire can pass through a gap between the base portion 101 and the measured portion 102 through the adjacent cuttable portion 103.
With this arrangement, when the circuit board 10 under test is inserted into the test board 16, the components (peripheral circuits, such as sampling resistors and output electrodes) on the test board 16 are electrically connected to the connection points on the portion under test 102, the test board 16 provides an analog load, supplies power, provides a charging coil and a communication coil, provides a titanium case temperature sampling analog resistor and a battery temperature sampling analog resistor to the portion under test 102, and enables the portion under test 102 to respond.
According to the circuit board to be detected provided by the embodiment of the invention, the periphery of the base part of the circuit board to be detected surrounds the base part, when the detection is required, an operator or a mechanical arm and other equipment can clamp the base part to be inserted into the testing equipment, the base part is used as an actual stressed object, the base part can play a good protection role on the part to be detected, the part to be detected can be cut off from the base part after the detection is finished, and the whole detection process is safe and convenient.
The tested part 102 of the tested circuit board provided by the embodiment of the invention is provided with a charging coil connection point 105 and a communication antenna connection point 106, both of which extend to the outer side of the tested part 102, and in the embodiment, both of which are distributed on both sides of the tested part 102 and extend outwards from the linear end. In order to effectively protect the coil connection point, the area of the through hole needs to be enough to accommodate the measured portion, the charging coil connection point 105 and the communication coil connection point 106, and the shape of the through hole is also set according to the extending length of the antenna connection point. Further, the charging antenna connection point 105 and the communication antenna connection point 106 are connected with the edge of the through hole through several cuttable portions 103, respectively.
In order to perform the detection of the charging function, the connection points on the circuit board 10 under test related to the charging function need to be connected to the test board 16, and for this purpose the conductive contacts 104 in this embodiment comprise first conductive contacts for connecting the charging coil connection point 105 and the communication coil connection point 106 on the part under test. In connection with the system of fig. 1, when the charging programmer 14 is charged by the induction coil 15, the charging antenna and the communication antenna connected to the test board 16 are activated, so that the charging coil connection point 105 and the communication coil connection point 106 receive signals.
The conductive pads 104 also include a third conductive pad for connecting to a power supply connection point 108 on the portion under test to allow the portion under test 102 to be connected to the power source 12 for power or charging operations.
To enable detection of the output waveform, the conductive contacts 104 further include a fourth conductive contact for connection to a signal output electrode connection point 109 on the portion under test. In this embodiment, sixteen signal output electrode connection points are provided on the portion under test 102, and conductive contact pieces corresponding to each electrode connection point are provided on the base 101, and are connected to a plurality of loads on the test board 16. With reference to the system shown in fig. 1, when the power source 12 starts to supply power, the signal output electrode connection point 109 outputs a waveform signal, and the waveform signal is transmitted to the signal output electrode on the test board 16, and finally transmitted to the computer 13 through the acquisition card 18.
The conductive contact 104 further includes a fifth conductive contact for writing a program, and is mainly used for writing a program into a single chip on the circuit board 10 to be tested, when the circuit board is welded and tested in reliability, automatic test programs possibly written into the single chip are different, and the program writing efficiency can be improved by arranging the fifth conductive contact.
The specification of the base part 101 of the tested circuit board provided by the embodiment of the invention can be fixed, namely, one base part 101 can be suitable for tested parts 102 of different products, and the types of the connecting points arranged on the tested parts 102 of different products are possibly different; the number may be different, for example the number of output electrode connection points. Therefore, enough conductive contact pieces need to be arranged on the base part 101 to correspond to different parts to be measured 102, the number of the conductive contact pieces 104 needs to be larger than or equal to the number of the connection points on the parts to be measured 102 to improve the universality, so that different base parts 101 do not need to be produced for each kind of parts to be measured 102, and the production cost can be reduced.
The golden finger tube legs of the circuit boards of different implanted products are defined the same, and the test board 16 can be universal, that is, one test board 16 can be used for both charging and non-charging products such as DBS (deep brain stimulation), VNS (vagnosine stimulation), SCS (Spinal cord stimulation), and SNM (Sacral nerve stimulation), etc., and has good universality and high test efficiency.
Accordingly, an embodiment of the present invention provides a detection circuit board for an implanted medical instrument, which is used as the test board 16, and as shown in fig. 9, the test board 16 includes:
the circuit board connecting portion 161 is used to connect the circuit board 10, and in this embodiment, a gold finger socket is used to connect with a gold finger plug (conductive strips arranged at the end) of the circuit board 10, and the gold finger socket can accommodate circuit boards with different thicknesses.
The peripheral circuit 162 of the circuit board under test includes various electrical components, all of which are required for the implanted device to work with the circuit board under test 10, such as sampling resistors, communication antennas, output electrodes, and so on. The components are connected with the connection points on the circuit board 10 through the circuit board connection part 161 to simulate the actual working condition of the circuit board 10, thereby ensuring the normal operation of the circuit board 10.
And the load unit 163 is used for simulating the load of the circuit board to be tested. The implanted device will bear certain load in human body, the load of different kinds and uses of implanted device is different, the unit can be provided with various load elements to simulate the load borne by different tested circuit boards 10, such as 1k resistor for nerve stimulator, 500 ohm resistor for spinal cord stimulator, etc.
A selection unit 164 and an acquisition device connection section 165. The collecting device connecting portion 165 is connected to the electric elements in the circuit board peripheral circuit 162 to be tested through the selecting unit 164, and may be connected to the output electrode, for example. The selecting unit 164 controls the connection relationship between the collecting device connecting portion 165 and the electrical component connected thereto, the collecting device connecting portion 165 is connected to an external collecting device, that is, the collecting card 18, and the collecting card 18 can obtain a signal sent by the connected electrical component under the influence of a load.
In practice, the peripheral circuit usually includes more electrical components, for example, the output electrodes, and the cerebral pacemaker may have more than ten output electrodes, each of which can individually send out stimulation signals. For accurate detection, the detection program may control only some of the output electrodes to emit signals at the same time, accordingly, the collecting device connecting portion 165 may connect all of the output electrodes through the selecting unit 164, and the selecting unit 164 may switch on only some of the electrodes from which signals are being output at the same time.
According to the detection circuit board for the implanted medical instrument, provided by the embodiment of the invention, the detected circuit board and the external detection equipment can be connected, the actual working state of the detected circuit board is simulated through the peripheral circuit and the load unit, and meanwhile, the communication state of the external equipment and the detected element is controlled by the selection unit, so that a signal sent by the detected element controlled by the detected circuit board is obtained.
As a preferred embodiment, as shown in fig. 10, the circuit board peripheral circuit 162 under test includes a plurality of output electrodes 1621 of the implanted medical instrument and a metal case interface 1622 of the implanted medical instrument.
The selection unit 164 includes a plurality of analog switches, each of which is connected to the corresponding output electrode 1621 and the metal housing interface 1622 in a one-to-one correspondence manner, wherein one end of the metal housing interface 1622 is connected to the metal housing (not shown in fig. 10, the metal housing may serve as an anode of the pulse output), and the other end of the metal housing interface 1622 is connected to one of the analog switches of the selection unit 164, so that the connection relationship between the output electrode and the collection device connection portion 165 and the connection relationship between the collection device connection portion 165 and the metal housing are controlled by the open and closed states of the analog switches. The collecting device connecting portion 165 outputs a waveform signal emitted by the electrode under the influence of a load to an external collecting device.
In this embodiment, the selection unit 164 is provided with two switch sets, the acquisition device connection portion 165 is provided with two corresponding access ports Out1 and Out2, and each access port is connected to an electrical component on the peripheral circuit, that is, an output electrode and a metal shell interface, through a different switch set. In this embodiment, the port Out1 is connected to one end of the first switch set 1641, and the other end of the first switch set 1641 is connected to all output electrodes and the metal shell interface; the port Out2 is connected to one end of the second switch set 1642, and the other end of the second switch set 1642 is connected to all output electrodes and the metal housing interface.
The two ports Out1 and Out2 of the acquisition device connection section 165 are connected to any two of sixteen output electrodes 1621 and metal case interfaces 1622 in the circuit board peripheral circuit 162 under test. The states of the first switch group 1641 and the second switch group 1642 can be controlled by a single chip microcomputer. Specifically, any two output electrodes are connected with a computer through an interface, a serial port chip and a single chip microcomputer, and the computer controls corresponding analog switches in the first switch group 1641 and the second switch group 1642 according to test requirements, so that the connection between the acquisition card and the electrode output end is realized.
In practical application, more access ports and more switch groups can be arranged to collect more output signals at the same time.
In a preferred embodiment, the load unit 163 may include:
a plurality of sets of load elements 1631 for simulating loads of different types of implant devices, respectively;
and a plurality of analog switches constituting a third switch group 1632 for controlling connection states of the plurality of groups of load elements 1631 with the collecting device connecting portion 165 and the output electrode 1621. Two ports Out1 and Out2 are connected to both ends of the load. Through the interface connected with the computer, the serial port chip and the single chip microcomputer, the computer controls the corresponding analog switches in the third switch group 1632 according to the test requirements, so that the connection between the two ports Out1 and Out2 and different loads is realized. Optional loads include DBS loads, SCS loads, VNS loads, and SNM (Sacral neurostimulation system) loads, among others.
Therefore, loads of different product types are connected with any two output electrodes, and output waveforms of the tested circuit board 10 are connected to the Out1 and Out2 and fed back to the acquisition card 18 for processing.
With regard to the supply of power and the acquisition of the charging current of the test board 16, the power source 12 and the ammeter 17 can be connected to the test board 16. The power supply 12 can provide two paths of power supply, one path is a variable voltage power supply 10 (the range is 4.1V-2V), a battery simulation power supply (a charging product is used for charging function test) is adopted, and the gold finger socket on the test board 16 is connected with the circuit board 10 to be tested for power supply; the other is a constant voltage, and the electrical elements on the test board 16 are powered through the voltage chip.
Specifically, the peripheral circuit 162 of the circuit board under test includes a power supply circuit, one end of which is connected in series with the external power source 12 and the ammeter 17, and the other end of which is connected to a corresponding power supply connection point on the circuit board under test 10.
In a charge detection application, the power supply circuit may be used to receive power input by an external charge programmer through the circuit board 10 under test and charge the external power source 12, and the ammeter 17 may indicate the charging current.
In other performance testing applications, such as signal output, the power supply circuit may be used to receive power from the external power source 12 and supply power to the circuit board 10 under test.
For different products, the circuit board under test 10 may be selected to access different charging and communication antennas, such as an SCS charging and communication antenna and a DBS charging and communication antenna. In a preferred embodiment, the circuit board peripheral circuitry 162 under test may include multiple communication antennas and/or multiple charging antennas. Specifically, a computer can be used to control a single chip on the detection circuit board, and the detected circuit board 10 is connected with a communication antenna and/or a charging antenna through the single chip.
The peripheral circuits of the circuit board under test may further include temperature sampling resistors, such as a battery temperature sampling resistor and a metal casing temperature sampling resistor, which are connected to corresponding connection points on the circuit board under test 10 through the circuit board under test connection portion 161. For the acquisition of the temperature parameters, the temperature parameters can be acquired through the wireless communication between the external charging programmer and the circuit board 10 to be tested, and no additional port or device connecting temperature sampling resistor is needed.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. An automated test system for active implantable medical device detection, comprising:
the device comprises a shifting tool, a power supply and a computer;
the displacement tool is provided with a charging programmer, an induction coil and a test board, the displacement tool is used for changing the relative position of the charging programmer and the induction coil, the displacement tool is an electric device provided with one or more guide rails, the charging programmer and the induction coil are respectively placed on two platforms capable of realizing relative motion, and the charging programmer is provided with the induction coil;
the test board is provided with an element for providing load for the tested circuit board, a peripheral circuit of the tested circuit board and an interface for connecting the tested circuit board and the induction coil;
the computer is respectively connected with the test board, the charging programmer and the power supply and is used for controlling elements on the test board to provide loads for the circuit board to be tested, controlling the peripheral circuit to cooperate with the circuit board to be tested to perform actions, controlling the charging programmer to charge the power supply through the induction coil and the circuit board to be tested, and acquiring working parameters of the circuit board to be tested through the charging programmer.
2. The system of claim 1, wherein the power supply is further configured to provide power to the charge programmer, the test board, and the circuit board under test to cause the circuit under test to output the waveform signal according to a load board provided by the test board.
3. The system of claim 2, further comprising an acquisition card for acquiring the waveform signal output by the circuit board under test; and the computer acquires the waveform signal output by the tested circuit board through the acquisition card.
4. The system of claim 1, wherein the charging programmer is further configured to read intrinsic information of a circuit board under test via the inductive coil; the computer determines signals for controlling the test board and the components on the circuit board under test based on the intrinsic information.
5. The system of claim 1, wherein the computer is further configured to control the displacement tool to vary a relative position of the induction coil and the charging programmer during charging.
6. The system of claim 1, wherein the displacement tool is further provided with a magnet; the computer is also used for controlling the displacement tool to change the relative position of the magnet and the circuit board to be tested and detecting the working state of the electromagnetic switch on the circuit board to be tested.
7. The system of claim 1, wherein the interface on the test board for connecting to the circuit board under test is a gold finger interface.
8. The system of claim 1, wherein the operating parameters include charging current, charging voltage, temperature.
9. The system of claim 1, wherein the computer is further configured to read the operating parameters of the charging programmer and calculate the charging efficiency according to the operating parameters of the circuit board under test and the operating parameters of the charging programmer.
10. The system of claim 1, wherein the computer is further configured to set an output parameter of the circuit board under test via the charging programmer and the induction coil.
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| CN112394276B (en) * | 2019-08-19 | 2022-12-30 | Oppo广东移动通信有限公司 | Wireless charging test method, device, system, electronic equipment and storage medium |
| CN112987698B (en) * | 2021-03-31 | 2024-04-30 | 北京品驰医疗设备有限公司 | Charging test method and device of external control device for implantable medical device |
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| CN113204224B (en) * | 2021-03-31 | 2024-03-05 | 北京品驰医疗设备有限公司 | Instruction testing system of external control equipment for implantable medical device |
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