CN108983057B - External insulation delay coefficient test device and method under VFTO and atmospheric overvoltage - Google Patents

External insulation delay coefficient test device and method under VFTO and atmospheric overvoltage Download PDF

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CN108983057B
CN108983057B CN201810980266.5A CN201810980266A CN108983057B CN 108983057 B CN108983057 B CN 108983057B CN 201810980266 A CN201810980266 A CN 201810980266A CN 108983057 B CN108983057 B CN 108983057B
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capacitor
pulse
insulation
resistor
external insulation
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CN108983057A (en
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谭向宇
周利军
王科
彭晶
赵现平
马仪
周年荣
张文斌
黄星
程志万
马国明
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Electric Power Research Institute of Yunnan Power Grid Co Ltd
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Electric Power Research Institute of Yunnan Power Grid Co Ltd
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

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Abstract

The embodiment of the application discloses a device and a method for testing the external insulation delay coefficient under VFTO and atmospheric overvoltage, wherein the signal input end of a pulse generating unit of a double-pulse generating device is electrically connected with a trigger control module of a signal generating controller, the signal output end of the pulse generating unit is respectively electrically connected with a first high-voltage pulse cable and a first high-voltage pulse cable, and the second ends of the first high-voltage pulse cable and the second high-voltage pulse cable are connected with an external insulation testing device; the insulation information acquisition and processing device is connected with the outer insulation testing device. The signal generation controller controls the double-pulse generation device to generate VFTO and atmospheric overvoltage signals, the generated VFTO and atmospheric overvoltage signals act on an external insulation sample in the external insulation testing device, the insulation information acquisition processing device acquires external insulation delay coefficients after the action, and the influence of the external insulation sample on the external insulation strength in the VFTO and the atmospheric overvoltage is acquired.

Description

External insulation delay coefficient test device and method under VFTO and atmospheric overvoltage
Technical Field
The application relates to the technical field of external insulation testing of an electrical system, in particular to a VFTO and atmospheric overvoltage external insulation delay coefficient testing device and method.
Background
The high-voltage gas-filled line is an important component of a power system in various extra-high voltage power transmission projects such as 'West-electric-east-transmission' and the like, which are widely applied in China due to the characteristics of good insulating property, low line loss, large transmission capacity and the like. In the operation process of the high-voltage gas-filled circuit, the high-voltage gas-filled circuit is seriously influenced by the lightning stroke discharge phenomenon in the external environment, and the external insulation of various high-voltage equipment connected with the high-voltage gas-filled circuit is subjected to the action of atmospheric overvoltage for a long time. The atmospheric overvoltage means that direct lightning or lightning induction is suddenly added to a power system, so that the voltage borne by electrical equipment far exceeds the rated value of the electrical equipment.
In order to prevent the atmospheric overvoltage, measures such as installing a lightning rod, a lightning conductor and a lightning arrester, reasonably improving the insulation level of a line, and adopting an automatic reclosing device are generally adopted. In the process of switching on and off of the isolation switch in the high-voltage gas-filled circuit and the process of generating a ground fault, the external insulation of the high-voltage equipment is Very easily impacted by Very Fast Transient Overvoltage (VFTO), so that the external insulation performance of the high-voltage equipment is seriously damaged.
However, in practical engineering, only the power frequency voltage withstand test is performed on the external insulation of the electrical equipment before commissioning, the performance of the external insulation of the high-voltage equipment under the conditions of VFTO and atmospheric overvoltage cannot be checked, and in addition, due to the fact that the VFTO and the atmospheric overvoltage happen accidentally, the duration is short, and capturing is difficult, the influence of the effect on the external insulation cannot be accurately known when the VFTO and the atmospheric overvoltage are combined.
Disclosure of Invention
The application provides a VFTO and atmospheric overvoltage external insulation delay coefficient test device and method, and aims to solve the problems in the traditional technology.
In order to solve the technical problem, the embodiment of the application discloses the following technical scheme:
a VFTO and external insulation delay coefficient test device under atmospheric overvoltage comprises: the insulation testing device comprises a signal generating controller, a double-pulse generating device, an outer insulation testing device and an insulation information collecting and processing device, wherein a signal output end of the signal generating controller is connected with an input end of the double-pulse generating device, an output voltage of the double-pulse generating device is loaded to the outer insulation testing device, and the insulation information collecting and processing device is used for collecting information; wherein: the signal generation controller comprises a master console, a pulse amplitude control channel and a trigger control module, wherein the pulse amplitude control channel is electrically connected with the master console and the trigger control module respectively; the double-pulse generating device comprises a high-voltage insulating box and a pulse generating unit, the pulse generating unit is arranged in the high-voltage insulating box, a signal input end of the pulse generating unit is electrically connected with the trigger control module, a signal output end of the pulse generating unit is electrically connected with one end of a first high-voltage pulse cable and one end of a second high-voltage pulse cable respectively, the other end of the first high-voltage pulse cable is connected with the trigger control module and the outer insulation testing device respectively, and the other end of the second high-voltage pulse cable is connected with the outer insulation testing device; the insulation information acquisition and processing device comprises a pulse waveform acquisition tester, an alternating current power supply and processing equipment, wherein the pulse waveform acquisition tester is respectively connected with the alternating current power supply, the processing equipment and the outer insulation testing device.
Optionally, the pulse generating unit comprises: a first high-voltage silicon stack, a second high-voltage silicon stack, a first resistor, a second resistor, a third resistor, a fourth resistor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor, a fifth capacitor, a sixth capacitor, a first spark ball gap, a second spark ball gap, a third spark ball gap, a fourth spark ball gap, a first charging resistor, a second charging resistor, a first wave modulation module, a second wave modulation module and an anti-reverse string isolation spark ball gap, the signal output end of the trigger control module is respectively connected with the first ends of the first high-voltage silicon stack and the second high-voltage silicon stack, the second end of the first high-voltage silicon stack is respectively connected with the first resistor, the first capacitor and the first end of the first spark ball gap, the second end of the second high-voltage silicon stack is respectively connected with the third resistor, the fourth capacitor and the first end of the third spark ball gap; the first resistor, the second resistor, and the first waveform modulating module are connected in series, the third resistor, the fourth resistor, and the second waveform modulating module are connected in series, the first capacitor, the second capacitor, and the third capacitor are connected in parallel, the fourth capacitor, the fifth capacitor, and the sixth capacitor are connected in parallel, the first capacitor, the fourth capacitor, the second capacitor, the fifth capacitor, the third capacitor, and the sixth capacitor are respectively connected in series, the first charging resistor, and the second charging resistor are connected in series, a first end of the first charging resistor is connected to a first series point and a zero potential point of the first capacitor, and the fourth capacitor, and the third capacitor, and the sixth capacitor are respectively connected in series, a second series point of the second capacitor, and the fifth capacitor is connected to a second end of the first charging resistor, and a first end of the second charging resistor, respectively, a second end of the second charging resistor is connected to a third series point of the third capacitor and the sixth capacitor, a first end of the first spark bulb gap is further connected to first ends of the first resistor and the first capacitor, a first end of the third spark bulb gap is further connected to first ends of the third resistor and the fourth capacitor, and second ends of the first spark bulb gap and the third spark bulb gap are connected to the second series point; a first end of the second spark bulb gap is connected to a fourth series point of the first and second resistors and a first end of the second capacitor, respectively, a first end of the fourth spark bulb gap is connected to a fifth series point of the third and second resistors and a first end of the fifth capacitor, respectively, a second end of the second spark bulb gap and a second end of the fourth spark bulb gap are connected to the third series point; a first end of the third capacitor is connected with the second resistor and a sixth series point of the first wave modulation module, and a second end of the sixth capacitor is connected with the fourth resistor and a seventh series point of the second wave modulation module; the anti-reverse-string isolation spark ball gap is respectively connected with the second end of the first wave modulation module and the first end of the first high-voltage pulse cable.
Optionally, a sharpening gap is disposed outside the high-voltage insulating box, and the sharpening gap is respectively connected to the second end of the second wave modulation module and the first end of the second high-voltage pulse cable.
Optionally, a feedback trigger cable is arranged between the first high-voltage pulse cable and the trigger control module, and the feedback trigger cable is connected to the second end of the first high-voltage pulse cable and the trigger control module respectively.
Optionally, a first wall bushing, a second wall bushing, a third wall bushing, a fourth wall bushing and a fifth wall bushing are arranged on the high-voltage insulation box, the trigger control module is provided with a first trigger signal channel and a second trigger signal channel, two ends of the first wall bushing are respectively connected with the second trigger signal channel and the first end of the first high-voltage silicon stack, two ends of the second wall bushing are respectively connected with the first trigger signal channel and the first end of the second high-voltage silicon stack, the first end of the third wall bushing is connected with the first end of the first charging resistor, the first charging resistor is grounded through the second end of the third wall bushing, two ends of the fourth wall bushing are respectively connected with the first end of the first high-voltage pulse cable for preventing the reverse-string isolated spark ball gap, and two ends of the fifth wall bushing are respectively connected with the second end of the second wave modulation module and the sharpening gap.
Optionally, the general control console comprises a pulse trigger control button, a charging trigger control button, an emergency brake button and a charging time sequence setting button, and the pulse trigger control button, the charging trigger control button, the emergency brake button and the charging time sequence setting button are respectively electrically connected with the processor of the general control console.
Optionally, the trigger control module includes a switch state display and a dual-power automatic transfer switch, the switch state display is electrically connected to the dual-power automatic transfer switch, and the dual-power automatic transfer switch is movably connected to the first trigger signal channel and the second trigger signal channel, respectively.
Optionally, a first insulating baffle is disposed between the sharpening gap and the fifth wall bushing, one end of the fifth wall bushing is fixedly disposed on the first insulating baffle, a second insulating baffle is disposed between the second high-voltage pulse cable and the sharpening gap, and a first end of the second high-voltage pulse cable is connected to the second insulating baffle.
A VFTO and atmospheric overvoltage external insulation delay coefficient test method is utilized, and the VFTO and atmospheric overvoltage external insulation delay coefficient test device is utilized, and the method comprises the following steps: checking whether a dual-power automatic transfer switch in the control system is in a neutral position; if the dual-power automatic transfer switch is in a neutral position, adjusting a charging time sequence setting button in a master console in the control system, and setting the charging time and sequence of a first trigger signal channel and a second trigger signal channel of the trigger control module; starting a charging trigger control button in a master console, controlling a dual-power automatic transfer switch to communicate with a corresponding trigger signal channel, charging a capacitor in a pulse generation system according to charging time and sequence, and setting the dual-power automatic transfer switch to be in a neutral position after charging is finished; starting a pulse trigger control button in a master control console until pulse output is stable, starting an alternating current power supply, measuring the dual action of VFTO and atmospheric overvoltage through a pulse waveform acquisition tester, and obtaining an external insulation delay coefficient, wherein the external insulation delay coefficient is used for determining the external insulation strength of an external insulation sample; and repeatedly obtaining a plurality of groups of test results according to the method, and completing the analysis of the insulation strength of the external insulation sample under the dual actions of VFTO and atmospheric overvoltage.
According to the technical scheme, the device and the method for testing the external insulation delay coefficient under the VFTO and the atmospheric overvoltage provided by the embodiment of the application comprise the following steps: the insulation device comprises a signal generation controller, a double-pulse generation device, an outer insulation testing device and an insulation information acquisition processing device, wherein a signal output end of the signal generation controller is connected with an input end of the double-pulse generation device, an output voltage of the double-pulse generation device is loaded to the outer insulation testing device, and the insulation information acquisition processing device is used for collecting information. Wherein: the signal generation controller comprises a master console, a pulse amplitude control channel and a trigger control module, wherein the pulse amplitude control channel is electrically connected with the master console and the trigger control module respectively; the double-pulse generating device comprises a high-voltage insulating box and a pulse generating unit, the pulse generating unit is arranged in the high-voltage insulating box, a signal input end of the pulse generating unit is electrically connected with the trigger control module, a signal output end of the pulse generating unit is electrically connected with first ends of a first high-voltage pulse cable and a second high-voltage pulse cable respectively, a second end of the first high-voltage pulse cable is connected with the trigger control module and the outer insulation testing device respectively, and a second end of the second high-voltage pulse cable is connected with the outer insulation testing device; the insulation information acquisition and processing device comprises a pulse waveform acquisition tester, an alternating current power supply and processing equipment, wherein the pulse waveform acquisition tester is respectively connected with the alternating current power supply, the processing equipment and the outer insulation testing device. The signal generation controller controls the double-pulse generation device to generate VFTO and atmospheric overvoltage signals, the generated VFTO and atmospheric overvoltage signals act on the external insulation sample in the external insulation testing device, the insulation information acquisition processing device acquires the external insulation delay coefficient of the external insulation sample after the action, and the influence of the external insulation sample on the external insulation strength in the VFTO and the atmospheric overvoltage is obtained.
Drawings
In order to more clearly explain the technical solution of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious to those skilled in the art that other drawings can be obtained according to the drawings without any creative effort.
Fig. 1 is a schematic structural diagram of an external insulation delay coefficient test device under VFTO and atmospheric overvoltage according to an embodiment of the present disclosure;
FIG. 2 is a schematic flowchart of a method for testing the external insulation delay coefficient under VFTO and atmospheric overvoltage according to an embodiment of the present disclosure;
in fig. 1-2, the symbols are represented as: 1-a signal generation controller, 2-a double pulse generation device, 3-an external insulation test device, 4-an insulation information acquisition and processing device, 5-a master console, 6-a pulse amplitude control channel, 7-a trigger control module, 8-a high-voltage insulation box, 9-a pulse generation unit, 10-a first high-voltage pulse cable, 11-a second high-voltage pulse cable, 12-a pulse waveform acquisition tester, 13-an alternating current power supply, 14-a processing device, 15-a first high-voltage silicon stack, 16-a second high-voltage silicon stack, 17-a first resistor, 18-a second resistor, 19-a third resistor, 20-a fourth resistor, 21-a first capacitor, 22-a second capacitor, 23-a third capacitor and 24-a fourth capacitor, 25-a fifth capacitor, 26-a sixth capacitor, 27-a first spark ball gap, 28-a second spark ball gap, 29-a third spark ball gap, 30-a fourth spark ball gap, 31-a first charging resistor, 32-a second charging resistor, 33-a first wave modulation module, 34-a second wave modulation module, 35-an anti-reverse string isolation spark ball gap, 36-a sharpening gap, 37-a feedback trigger cable, 38-a first wall bushing, 39-a second wall bushing, 40-a third wall bushing, 41-a fourth wall bushing, 42-a fifth wall bushing, 43-a pulse trigger control button, 44-a charging trigger control button, 45-an emergency brake button, 46-a charging time sequence setting button, 47-a switch state display, 48-double power supply automatic change-over switch, 49-first insulating baffle, 50-second insulating baffle, 51-test bench, 52-external insulating sample.
Detailed Description
The present application will be described in detail below with reference to the accompanying drawings.
As shown in fig. 1, the VFTO and atmospheric overvoltage external insulation delay coefficient test device provided by the present application is provided. Referring to fig. 1, the VFTO external insulation delay factor test device under atmospheric overvoltage comprises: the insulation device comprises a signal generation controller 1, a double-pulse generation device 2, an outer insulation testing device 3 and an insulation information acquisition processing device 4, wherein a signal output end of the signal generation controller 1 is connected with an input end of the double-pulse generation device 2, output voltage of the double-pulse generation device 2 is loaded to the outer insulation testing device 3, and the insulation information acquisition processing device 4 is used for collecting information.
The signal generation controller 1 comprises a master console 5, a pulse amplitude control channel 6 and a trigger control module 7, wherein the pulse amplitude control channel 6 is electrically connected with the master console 5 and the trigger control module 7 respectively;
the console 5 comprises a pulse trigger control button 43, a charging trigger control button 44, an emergency brake button 45 and a charging time sequence setting button 46, wherein the pulse trigger control button 43, the charging trigger control button 44, the emergency brake button 45 and the charging time sequence setting button 46 are respectively and electrically connected with a processor of the console 5. The pulse trigger control button 43 controls the sending of pulse signals, the charging trigger control button 44 is used for controlling the charging of the double pulse generating device 2, the emergency brake button 45 is used for controlling the signals in emergency, and the charging time sequence setting button 46 is used for controlling the charging sequence. The trigger control module 7 comprises a switch state display 47 and a dual-power automatic transfer switch 48, the switch state display 47 is electrically connected with the dual-power automatic transfer switch 48, and the dual-power automatic transfer switch 48 is respectively movably connected with a first trigger signal channel and a second trigger signal channel.
The double-pulse generating device 2 comprises a high-voltage insulating box 8 and a pulse generating unit 9, the pulse generating unit 9 is arranged in the high-voltage insulating box 8, a signal input end of the pulse generating unit 9 is electrically connected with the trigger control module 7, a signal output end of the pulse generating unit 9 is electrically connected with first ends of a first high-voltage pulse cable 10 and a second high-voltage pulse cable 11 respectively, a second end of the first high-voltage pulse cable 10 is connected with the trigger control module 7 and the outer insulation testing device 3 respectively, and a second end of the second high-voltage pulse cable 11 is connected with the outer insulation testing device 3. A feedback trigger cable 37 is arranged between the first high-voltage pulse cable 10 and the trigger control module 7, and the feedback trigger cable 37 is respectively connected with the second end of the first high-voltage pulse cable 10 and the trigger control module 7. The feedback trigger cable 37 is used for sending the first high-voltage pulse signal to the trigger control module 7 as a new trigger signal, and controlling the pulse generation unit 9 to generate a second high-voltage pulse signal.
The pulse generating unit 9 includes: the first high-voltage silicon stack 15, the second high-voltage silicon stack 16, the first resistor 17, the second resistor 18, the third resistor 19, the fourth resistor 20, the first capacitor 21, the second capacitor 22, the third capacitor 23, the fourth capacitor 24, the fifth capacitor 25, the sixth capacitor 26, the first spark ball gap 27, the second spark ball gap 28, the third spark ball gap 29, the fourth spark ball gap 30, the first charging resistor 31, the second charging resistor 32, the first wave modulation module 33, the second wave modulation module 34 and the anti-reverse-string isolation spark ball gap 35.
The signal output end of the trigger control module 7 is respectively connected to the first ends of the first high-voltage silicon stack 15 and the second high-voltage silicon stack 16, the second end of the first high-voltage silicon stack 15 is respectively connected to the first ends of the first resistor 17, the first capacitor 21 and the first spark ball gap 27, and the second end of the second high-voltage silicon stack 16 is respectively connected to the first ends of the third resistor 19, the fourth capacitor 24 and the third spark ball gap 29; the first resistor 17, the second resistor 18 and the first waveform modulating module 33 are connected in series, the third resistor 19, the fourth resistor 20 and the second waveform modulating module 34 are connected in series, the first capacitor 21, the second capacitor 22 and the third capacitor 23 are connected in parallel, the fourth capacitor 24, the fifth capacitor 25 and the sixth capacitor 26 are connected in parallel, the first capacitor 21 and the fourth capacitor 24, the second capacitor 22 and the fifth capacitor 25, the third capacitor 23 and the sixth capacitor 26 are connected in series, respectively, the first charging resistor 31 and the second charging resistor 32 are connected in series, a first end of the first charging resistor 31 is connected to a first series point and a zero potential point of the first capacitor 21 and the fourth capacitor 24, respectively, and a second series point of the second capacitor 22 and the fifth capacitor 25 is connected to the first charging resistor 32, respectively 31 and a first end of the second charging resistor 32, a second end of the second charging resistor 32 being connected to a third series point of the third capacitor 23 and the sixth capacitor 26, a first end of the first spark bulb gap 27 being further connected to a first end of the first resistor 17 and the first capacitor 21, a first end of the third spark bulb gap 29 being further connected to a first end of the third resistor 19 and the fourth capacitor 24, a second end of the first spark bulb gap 27 and the third spark bulb gap 29 being connected to the second series point; a first end of the second spark bulb 28 is connected to a fourth series point of the first and second resistors 17, 18, respectively, and a first end of the second capacitor 22, a first end of the fourth spark bulb 30 is connected to a fifth series point of the third and second resistors 19, 18, respectively, and a first end of the fifth capacitor 25, and a second end of the second spark bulb 28 and a second end of the fourth spark bulb 30 are connected to the third series point. A first end of the third capacitor 23 is connected to the sixth series point of the second resistor 18 and the first wave modulation module 33, and a second end of the sixth capacitor 26 is connected to the seventh series point of the fourth resistor 20 and the second wave modulation module 34. The anti-reverse-string isolation spark ball gap 35 is respectively connected with the second end of the first wave modulation module 33 and the first end of the first high-voltage pulse cable 10.
The outer insulation test device 3 comprises a test bed 51 and an outer insulation sample 52, wherein the outer insulation sample 52 is placed on the test bed 51, and the second end of the first high-voltage pulse cable 10 and the second end of the second high-voltage pulse cable 11 are both connected with the outer insulation sample 52.
The insulation information acquisition and processing device 4 comprises a pulse waveform acquisition tester 12, an alternating current power supply 13 and a processing device 14, wherein the pulse waveform acquisition tester 12 is respectively connected with the alternating current power supply 13, the processing device 14 and an outer insulation sample 52 in the outer insulation testing device 3.
A first wall bushing 38, a second wall bushing 39, a third wall bushing 40, a fourth wall bushing 41 and a fifth wall bushing 42 are arranged on the high-voltage insulation box 8, the trigger control module 7 is provided with a first trigger signal channel and a second trigger signal channel, two ends of the first wall bushing 38 are respectively connected with the second trigger signal channel and the first end of the first high-voltage silicon stack 15, two ends of the second wall bushing 39 are respectively connected with the first trigger signal channel and the first end of the second high-voltage silicon stack 16, a first end of the third wall bushing 40 is connected with a first end of the first charging resistor 31, the first charging resistor 31 is grounded through a second end of the third wall bushing 40, two ends of the fourth wall bushing 41 are respectively connected with a first end of the first high-voltage pulse cable 10 of the anti-reverse string isolation spark ball gap 35, the two ends of the fifth wall bushing 42 are respectively connected to the second end of the second wave modulation module 34 and the sharpening gap 36.
A sharpening gap 36 is arranged outside the high-voltage insulating box 8, and the sharpening gap 36 is respectively connected with the second end of the second wave modulation module 34 and the first end of the second high-voltage pulse cable 11. A first insulating baffle 49 is arranged between the sharpening gap and the fifth wall bushing 42, one end of the fifth wall bushing 42 is fixedly arranged on the first insulating baffle 49, a second insulating baffle 50 is arranged between the second high-voltage pulse cable 11 and the sharpening gap 36, and the first end of the second high-voltage pulse cable 11 is connected with the second insulating baffle 50.
It can be known from the foregoing embodiments that, the signal generation controller 1, the double-pulse generating device 2, the external insulation testing device 3, and the insulation information collecting and processing device 4 of the external insulation delay coefficient testing device under VFTO and atmospheric overvoltage provided in this embodiment, wherein: the signal output end of the signal generation controller 1 is connected with the input end of the double-pulse generation device 2, the output voltage of the double-pulse generation device 2 is loaded to the outer insulation testing device 3, and the insulation information acquisition processing device 4 is used for collecting information. Wherein: the signal generation controller 1 comprises a master console 5, a pulse amplitude control channel 6 and a trigger control module 7, wherein the pulse amplitude control channel 6 is electrically connected with the master console 5 and the trigger control module 7 respectively; the double-pulse generating device 2 comprises a high-voltage insulating box 8 and a pulse generating unit 9, the pulse generating unit 9 is arranged in the high-voltage insulating box 8, a signal input end of the pulse generating unit 9 is electrically connected with the trigger control module 7, a signal output end of the pulse generating unit 9 is respectively and electrically connected with first ends of a first high-voltage pulse cable 10 and a second high-voltage pulse cable 11, a second end of the first high-voltage pulse cable 10 is respectively connected with the trigger control module 7 and the outer insulation testing device 3, and a second end of the second high-voltage pulse cable 11 is connected with the outer insulation testing device 3; the insulation information acquisition and processing device 4 comprises a pulse waveform acquisition tester 12, an alternating current power supply 13 and processing equipment 14, wherein the pulse waveform acquisition tester 12 is respectively connected with the alternating current power supply 13, the processing equipment 14 and the outer insulation testing device 3. The signal generation controller 1 controls the double-pulse generation device 2 to generate VFTO and atmospheric overvoltage signals, the generated VFTO and atmospheric overvoltage signals act on the external insulation sample 52 in the external insulation testing device 3, the insulation information acquisition processing device 4 acquires the external insulation delay coefficient of the external insulation sample 52 after the action, and the influence of the VFTO and atmospheric overvoltage of the external insulation sample 52 on the external insulation strength is acquired
Referring to fig. 2, an embodiment of the present application further provides a VFTO external insulation delay factor test method under an over-atmospheric voltage, where the method includes:
s101, checking whether a dual-power automatic transfer switch in the control system is in a neutral position.
S102, if the dual-power automatic transfer switch is located at the neutral position, adjusting a charging time sequence setting button in a master console in the control system, and setting the charging time and sequence of a first trigger signal channel and a second trigger signal channel of the trigger control module.
S103, starting a charging trigger control button in the master console, controlling the dual-power automatic transfer switch to communicate with a corresponding trigger signal channel, charging a capacitor in the pulse generation system according to the charging time and sequence, and setting the dual-power automatic transfer switch to be in a neutral position after the charging is finished.
And S104, starting a pulse trigger control button in the master control console until pulse output is stable, starting an alternating current power supply, measuring the dual action of VFTO and atmospheric overvoltage through a pulse waveform acquisition tester, and acquiring an external insulation delay coefficient, wherein the external insulation delay coefficient is used for determining the external insulation strength of an external insulation sample.
Specifically, the discharge pulse waveform when the flashover discharge occurs on the external insulation surface passes through the shock wave coefficient T of the pulse waveformfObtaining the insulation strength characterization quantity-the external insulation delay coefficient C of the external insulation sample in the external insulation testing devicetSize of (2), external insulation delay coefficient CtIs calculated as follows:
Figure GDA0002552791480000071
in the formula, TfCan be obtained by collecting waveforms in a pulse waveform tester, is the time interval between a VFTO pulse peak value and an atmospheric overvoltage pulse peak value, and is generally 20 ms-500 ms, RfTaking R in this apparatus as wavefront resistancef=2000Ω,CtThe larger the value of the external insulation sample as a characterization quantity for characterizing the insulation strength of the external insulation sample, the stronger the capability of the external insulation to resist external impact overvoltage, the larger the insulation strength is, otherwise, the lower the insulation strength is, when C istWhen the value is not less than 4.3e-6, the strength of the external insulation is considered to be kept in a good state.
And S105, repeatedly obtaining a plurality of groups of test results according to the method, and completing the analysis of the insulation strength of the external insulation sample under the dual functions of VFTO and atmospheric overvoltage.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The above-described embodiments of the present application do not limit the scope of the present application.

Claims (8)

1. The utility model provides a VFTO and external insulation delay coefficient test device under atmospheric overvoltage which characterized in that includes: the insulation testing device comprises a signal generation controller (1), a double-pulse generation device (2), an outer insulation testing device (3) and an insulation information acquisition processing device (4), wherein a signal output end of the signal generation controller (1) is connected with an input end of the double-pulse generation device (2), an output voltage of the double-pulse generation device (2) is loaded to the outer insulation testing device (3), and the insulation information acquisition processing device (4) is used for collecting information;
the signal generation controller (1) comprises a master control console (5), a pulse amplitude control channel (6) and a trigger control module (7), wherein the pulse amplitude control channel (6) is electrically connected with the master control console (5) and the trigger control module (7) respectively;
the double-pulse generating device (2) comprises a high-voltage insulating box (8) and a pulse generating unit (9), the pulse generating unit (9) is arranged in the high-voltage insulating box (8), the signal input end of the pulse generating unit (9) is electrically connected with the trigger control module (7), the signal output end of the pulse generating unit (9) is respectively and electrically connected with the first ends of a first high-voltage pulse cable (10) and a second high-voltage pulse cable (11), the second end of the first high-voltage pulse cable (10) is respectively connected with the trigger control module (7) and the outer insulation testing device (3), and the second end of the second high-voltage pulse cable (11) is connected with the outer insulation testing device (3);
the insulation information acquisition and processing device (4) comprises a pulse waveform acquisition tester (12), an alternating current power supply (13) and processing equipment (14), wherein the pulse waveform acquisition tester (12) is respectively connected with the alternating current power supply (13), the processing equipment (14) and the outer insulation testing device (3);
the pulse generation unit (9) comprises: a first high-voltage silicon stack (15), a second high-voltage silicon stack (16), a first resistor (17), a second resistor (18), a third resistor (19), a fourth resistor (20), a first capacitor (21), a second capacitor (22), a third capacitor (23), a fourth capacitor (24), a fifth capacitor (25), a sixth capacitor (26), a first spark ball gap (27), a second spark ball gap (28), a third spark ball gap (29), a fourth spark ball gap (30), a first charging resistor (31), a second charging resistor (32), a first wave modulation module (33), a second wave modulation module (34) and an anti-reverse series isolation spark ball gap (35),
the signal output end of the trigger control module (7) is respectively connected with the first ends of the first high-voltage silicon stack (15) and the second high-voltage silicon stack (16), the second end of the first high-voltage silicon stack (15) is respectively connected with the first resistor (17), the first capacitor (21) and the first end of the first spark ball gap (27), and the second end of the second high-voltage silicon stack (16) is respectively connected with the first ends of the third resistor (19), the fourth capacitor (24) and the third spark ball gap (29); the first resistor (17), the second resistor (18) and the first wave-modulating module (33) are connected in series, the third resistor (19), the fourth resistor (20) and the second wave-modulating module (34) are connected in series, the first capacitor (21), the second capacitor (22) and the third capacitor (23) are connected in parallel, the fourth capacitor (24), the fifth capacitor (25) and the sixth capacitor (26) are connected in parallel, the first capacitor (21) and the fourth capacitor (24), the second capacitor (22) and the fifth capacitor (25), the third capacitor (23) and the sixth capacitor (26) are connected in series, respectively, the first charging resistor (31) and the second charging resistor (32) are connected in series, a first end of the first charging resistor (31) is connected to a first end of the first capacitor (21) and the fourth capacitor (24), respectively -a first series point and a zero potential point, a second series point of said second capacitor (22) and said fifth capacitor (25) being connected to a second terminal of said first charging resistor (31) and a first terminal of said second charging resistor (32), respectively, a second terminal of said second charging resistor (32) being connected to a third series point of said third capacitor (23) and said sixth capacitor (26), a first terminal of said first spark bulb (27) being further connected to a first terminal of said first resistor (17) and said first capacitor (21), a first terminal of said third spark bulb (29) being further connected to a first terminal of said third resistor (19) and said fourth capacitor (24), a second terminal of said first spark bulb (27) and said third spark bulb (29) being connected to said second series point; a first end of the second spark bulb gap (28) is connected to a fourth series point of the first resistor (17) and the second resistor (18), respectively, and to a first end of the second capacitor (22), a first end of the fourth spark bulb gap (30) is connected to a fifth series point of the third resistor (19) and the second resistor (18), respectively, and to a first end of the fifth capacitor (25), a second end of the second spark bulb gap (28) and a second end of the fourth spark bulb gap (30) are connected to the third series point; a first end of the third capacitor (23) is connected with the second resistor (18) and a sixth series point of the first wave modulation module (33), and a second end of the sixth capacitor (26) is connected with the fourth resistor (20) and a seventh series point of the second wave modulation module (34); the anti-series isolation spark ball gap (35) is respectively connected with the second end of the first wave modulation module (33) and the first end of the first high-voltage pulse cable (10).
2. A VFTO and atmospheric overvoltage external insulation delay coefficient test device according to claim 1, characterized in that a sharpening gap (36) is arranged outside the high voltage insulation box (8), and the sharpening gap (36) is respectively connected with the second end of the second wave modulation module (34) and the first end of the second high voltage pulse cable (11).
3. A VFTO and atmospheric overvoltage external insulation delay coefficient test device as claimed in claim 2, wherein a feedback trigger cable (37) is arranged between the first high voltage pulse cable (10) and the trigger control module (7), and the feedback trigger cable (37) is respectively connected with the second end of the first high voltage pulse cable (10) and the trigger control module (7).
4. A VFTO and atmospheric overvoltage external insulation delay coefficient test device according to claim 3, wherein a first wall bushing (38), a second wall bushing (39), a third wall bushing (40), a fourth wall bushing (41) and a fifth wall bushing (42) are arranged on the high voltage insulation box (8), the trigger control module (7) is provided with a first trigger signal channel and a second trigger signal channel, two ends of the first wall bushing (38) are respectively connected with the second trigger signal channel and the first end of the first high voltage silicon stack (15), two ends of the second wall bushing (39) are respectively connected with the first trigger signal channel and the first end of the second high voltage silicon stack (16), a first end of the third wall bushing (40) is connected with a first end of the first charging resistor (31), the second end of the first charging resistor (31) is grounded through the third wall bushing (40), the two ends of the fourth wall bushing (41) are respectively connected with the first end of the first high-voltage pulse cable (10) for preventing the reverse-serial isolation spark ball gap (35), and the two ends of the fifth wall bushing (42) are respectively connected with the second end of the second wave modulation module (34) and the sharpening gap (36).
5. A VFTO and atmospheric overvoltage external insulation delay coefficient test device according to claim 1, characterized in that the master control console (5) comprises a pulse trigger control button (43), a charging trigger control button (44), an emergency brake button (45) and a charging time sequence setting button (46), and the pulse trigger control button (43), the charging trigger control button (44), the emergency brake button (45) and the charging time sequence setting button (46) are respectively electrically connected with a processor of the master control console (5).
6. A VFTO and over-atmospheric voltage external insulation delay coefficient test device according to claim 4, wherein the trigger control module (7) comprises a switch state display (47) and a dual power supply automatic transfer switch (48), the switch state display (47) and the dual power supply automatic transfer switch (48) are electrically connected, and the dual power supply automatic transfer switch (48) is respectively and movably connected with the first trigger signal channel and the second trigger signal channel.
7. A VFTO and atmospheric overvoltage external insulation delay coefficient test device according to claim 6, characterized in that a first insulation baffle (49) is arranged between the sharpening gap and the fifth wall bushing (42), one end of the fifth wall bushing (42) is fixedly arranged on the first insulation baffle (49), a second insulation baffle (50) is arranged between the second high voltage pulse cable (11) and the sharpening gap (36), and the first end of the second high voltage pulse cable (11) is connected with the second insulation baffle (50).
8. A VFTO and atmospheric overvoltage external insulation delay coefficient test method, which is characterized in that the VFTO and atmospheric overvoltage external insulation delay coefficient test device of any one of claims 1 to 7 is used, and the method comprises the following steps:
checking whether a dual-power automatic transfer switch in the control system is in a neutral position;
if the dual-power automatic transfer switch is in a neutral position, adjusting a charging time sequence setting button in a master console in the control system, and setting the charging time and sequence of a first trigger signal channel and a second trigger signal channel of the trigger control module;
starting a charging trigger control button in a master console, controlling a dual-power automatic transfer switch to communicate with a corresponding trigger signal channel, charging a capacitor in a pulse generation system according to charging time and sequence, and setting the dual-power automatic transfer switch to be in a neutral position after charging is finished;
starting a pulse trigger control button in a master control console until pulse output is stable, starting an alternating current power supply, measuring the dual action of VFTO and atmospheric overvoltage through a pulse waveform acquisition tester, and obtaining an external insulation delay coefficient, wherein the external insulation delay coefficient is used for determining the external insulation strength of an external insulation sample;
wherein, the discharge pulse waveform when the flashover discharge occurs on the external insulation surface passes through the shock wave coefficient T of the pulse waveformfObtaining the insulation strength characterization quantity-the external insulation delay coefficient C of the external insulation sample in the external insulation testing devicetSize of (2), external insulation delay coefficient CtIs calculated as follows:
Figure FDA0002552791470000031
in the formula, TfCan be obtained by collecting waveforms in a pulse waveform tester, is the time interval between a VFTO pulse peak value and an atmospheric overvoltage pulse peak value, and is generally 20 ms-500 ms, RfTaking R in this apparatus as wavefront resistancef=2000Ω,CtThe larger the value of the external insulation sample as a characterization quantity for characterizing the insulation strength of the external insulation sample, the stronger the capability of the external insulation to resist external impact overvoltage, the larger the insulation strength is, otherwise, the lower the insulation strength is, when C istWhen the strength of the external insulation is more than or equal to 4.3e-6, the strength of the external insulation can be considered to be kept in a good state;
and repeatedly obtaining a plurality of groups of test results according to the method, and completing the analysis of the insulation strength of the external insulation sample under the dual actions of VFTO and atmospheric overvoltage.
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