CN108982555A - 一种用于无损检测铸铁件内部缺陷的检测设备 - Google Patents
一种用于无损检测铸铁件内部缺陷的检测设备 Download PDFInfo
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- CN108982555A CN108982555A CN201810746001.9A CN201810746001A CN108982555A CN 108982555 A CN108982555 A CN 108982555A CN 201810746001 A CN201810746001 A CN 201810746001A CN 108982555 A CN108982555 A CN 108982555A
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- 238000001514 detection method Methods 0.000 title claims abstract description 138
- 238000009659 non-destructive testing Methods 0.000 title claims abstract description 16
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 51
- 238000000034 method Methods 0.000 claims abstract description 28
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- 230000007246 mechanism Effects 0.000 claims abstract description 16
- 238000003384 imaging method Methods 0.000 claims abstract description 15
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 22
- 229910052802 copper Inorganic materials 0.000 claims description 22
- 239000010949 copper Substances 0.000 claims description 22
- 229910052721 tungsten Inorganic materials 0.000 claims description 19
- 239000010937 tungsten Substances 0.000 claims description 19
- 239000010409 thin film Substances 0.000 claims description 18
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 17
- 210000002421 cell wall Anatomy 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 14
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 13
- 239000010408 film Substances 0.000 claims description 13
- 239000011669 selenium Substances 0.000 claims description 13
- 229910052711 selenium Inorganic materials 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 238000003860 storage Methods 0.000 claims description 13
- 230000005540 biological transmission Effects 0.000 claims description 9
- 230000004888 barrier function Effects 0.000 claims description 7
- 239000011159 matrix material Substances 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 claims description 3
- 239000004411 aluminium Substances 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 150000001768 cations Chemical class 0.000 claims description 3
- 239000005297 pyrex Substances 0.000 claims description 3
- 238000007738 vacuum evaporation Methods 0.000 claims description 3
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- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
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- 229910003978 SiClx Inorganic materials 0.000 description 1
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- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910001338 liquidmetal Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
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CN201810746001.9A CN108982555B (zh) | 2018-07-09 | 2018-07-09 | 一种用于无损检测铸铁件内部缺陷的检测设备 |
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CN201810746001.9A CN108982555B (zh) | 2018-07-09 | 2018-07-09 | 一种用于无损检测铸铁件内部缺陷的检测设备 |
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CN108982555A true CN108982555A (zh) | 2018-12-11 |
CN108982555B CN108982555B (zh) | 2021-03-16 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110333293A (zh) * | 2019-08-12 | 2019-10-15 | 河海大学常州校区 | 一种正方网格相控超声阵列激发与检测混凝土缺陷的方法 |
CN113363024A (zh) * | 2021-06-02 | 2021-09-07 | 广州市广惠通线缆有限公司 | 一种线缆发泡层充氮控制方法及*** |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1485610A (zh) * | 2002-09-26 | 2004-03-31 | 株式会社岛津制作所 | X射线透视装置 |
US20060038133A1 (en) * | 2003-05-12 | 2006-02-23 | Jeol Ltd. | Rotating specimen holder |
CN102023169A (zh) * | 2009-09-09 | 2011-04-20 | 西门子公司 | 用于借助x射线检验对象的材料缺陷的装置和方法 |
CN107505341A (zh) * | 2017-09-14 | 2017-12-22 | 中国科学院苏州生物医学工程技术研究所 | 一种基于x射线的led芯片缺陷自动检测设备及方法 |
CN108095748A (zh) * | 2018-01-31 | 2018-06-01 | 邦盛医疗装备(天津)股份有限公司 | X射线dr机器人***及其检测方法 |
-
2018
- 2018-07-09 CN CN201810746001.9A patent/CN108982555B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1485610A (zh) * | 2002-09-26 | 2004-03-31 | 株式会社岛津制作所 | X射线透视装置 |
US20060038133A1 (en) * | 2003-05-12 | 2006-02-23 | Jeol Ltd. | Rotating specimen holder |
CN102023169A (zh) * | 2009-09-09 | 2011-04-20 | 西门子公司 | 用于借助x射线检验对象的材料缺陷的装置和方法 |
CN107505341A (zh) * | 2017-09-14 | 2017-12-22 | 中国科学院苏州生物医学工程技术研究所 | 一种基于x射线的led芯片缺陷自动检测设备及方法 |
CN108095748A (zh) * | 2018-01-31 | 2018-06-01 | 邦盛医疗装备(天津)股份有限公司 | X射线dr机器人***及其检测方法 |
Non-Patent Citations (5)
Title |
---|
R.A.HARDING: "钢铁工厂迎接20世纪90年代挑战的研究与开发", 《现代铸铁》 * |
余建明 等: "《CR、DR成像技术学》", 30 September 2009, 中国医药科技出版社 * |
叶志镇 等: "《半导体薄膜技术与物理 第2版》", 31 December 2014 * |
吴杰 等: "《医学电子学基础与医学影像物理学》", 31 March 2014 * |
戚长政: "《轻工自动机与生产线》", 31 July 2006, 中国轻工业出版社 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110333293A (zh) * | 2019-08-12 | 2019-10-15 | 河海大学常州校区 | 一种正方网格相控超声阵列激发与检测混凝土缺陷的方法 |
CN113363024A (zh) * | 2021-06-02 | 2021-09-07 | 广州市广惠通线缆有限公司 | 一种线缆发泡层充氮控制方法及*** |
CN113363024B (zh) * | 2021-06-02 | 2021-11-16 | 广州市广惠通线缆有限公司 | 一种线缆发泡层充氮控制方法及*** |
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Inventor after: Xu Kangping Inventor after: Other inventor requests not to publish the name Inventor before: Request for anonymity |
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Effective date of registration: 20210210 Address after: 332000 room 901, unit 1, 109 Dutian lane, Xunyang District, Jiujiang City, Jiangxi Province Applicant after: Xu Kangping Address before: No.013, Fenshui formation, Zishu village, Toutuo Town, Yuexi County, Anqing City, Anhui Province 246600 Applicant before: Wang Peng |
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Effective date of registration: 20210412 Address after: No. 121, Changcheng Road, Jiujiang Development Zone, Jiangxi Province Patentee after: Jiujiang Hengyuan Construction Engineering Quality Inspection Co.,Ltd. Address before: 332000 room 901, unit 1, 109 Dutian lane, Xunyang District, Jiujiang City, Jiangxi Province Patentee before: Xu Kangping |
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