CN108950482A - A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof - Google Patents
A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof Download PDFInfo
- Publication number
- CN108950482A CN108950482A CN201810965660.1A CN201810965660A CN108950482A CN 108950482 A CN108950482 A CN 108950482A CN 201810965660 A CN201810965660 A CN 201810965660A CN 108950482 A CN108950482 A CN 108950482A
- Authority
- CN
- China
- Prior art keywords
- conductive film
- copper
- ultraviolet
- semi
- preparation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/26—Vacuum evaporation by resistance or inductive heating of the source
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
- C23C14/5806—Thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
- H01B13/0026—Apparatus for manufacturing conducting or semi-conducting layers, e.g. deposition of metal
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
Abstract
The invention discloses a kind of ultraviolet 300nm it is semi-transparent-preparation method of copper and indium doped transparent conductive film, include the following steps: to take a circular mount disk, dig one 10 × 10cm therebetween2Square hole, be that a length of 100mm metal strip of 1mm is being fixed on the turntable of DM450A type coating machine in circular mount disk away from three holes are made a call at outer edge 5mm from a width is fastened at square hole edge 10.5mm;Two filaments are put on quartz boat to be fastened on heating electrode, by 12 × 12 clean × 0.15cm3Quartz glass be placed in above square hole, take 1000mg tin and 100mg copper, 100mg indium to be put into crucible, put down bell jar, open mechanical pump and carry out coating operation, after the completion, take out, be put into annealing furnace, anneal 25 minutes and take out at 450 DEG C.Conductive film of the invention is the semi-permeable membrane of a 300nm ultraviolet light, the light splitting for the ultraviolet instrumentation that can be used under this wavelength.
Description
Technical field
The present invention relates to electronic component preparation fields, and in particular to and a kind of ultraviolet 300nm is semi-transparent-and copper and indium doping transparent is conductive
Film and preparation method thereof.
Background technique
Transparent conductive film is a kind of widely used photoelectron material, such as solar battery, liquid crystal display device, electromagnetic wave
Light transmission shielding, the electrode etc. of phosphor.It has high transparency, and high conductivity is corrosion-resistant to wait excellent properties.It is general
Transparent conductive film hardly has transmitance in ultraviolet light spectral coverage, this for photovoltaic device application be it is unfavorable, because of the sun
Big energy photon (such as ultraviolet light) in light can be fallen by this membrane filtration, to be unfavorable for the raising of photoelectric conversion efficiency.
Summary of the invention
To solve the above problems, the present invention provides a kind of ultraviolet 300nm it is semi-transparent-copper and indium doped transparent conductive film and its system
Preparation Method.
To achieve the above object, the technical scheme adopted by the invention is as follows:
A kind of ultraviolet 300nm is semi-transparent-preparation method of copper and indium doped transparent conductive film, include the following steps:
S1,12 × 12 × 0.15cm is taken3Quartz glass, cleaned up in the sink with detergent, with cold and hot deionization
Water rinses after five minutes, is put into spare in baking oven;
S2, the tungsten wire for being 0.8mm with diameter heat the circle of coiling filament 13 on the rod iron that diameter is 3mm, and both ends are respectively stayed
5cm, it is totally two, spare;
S3, the quartz ampoule for taking long 5cm diameter 1.5cm fire a pit in the middle and make load source crucible;
S4, a circular mount disk is taken, digs one 10 × 10cm therebetween2Square hole, then from square hole edge 10.5mm
Place's one width of fastening is a length of 100mm metal strip of 1mm, in circular mount disk away from making a call to three holes, central angle every 120 at outer edge 5mm
Degree one, is then screwed on the turntable of DM450A type coating machine;
S5, two filaments are put on quartz boat be fastened on heating electrode on, open power supply, press lower inverted bell liter button, to clock
Clean quartz glass is placed in above the square hole of the circular mount disk when rising to the upper limit by cover, take 1000mg tin (Sn) and
100mg copper (Cu), 100mg indium (In) are put into silica crucible, put down bell jar, open mechanical pump, open diffusion pump after 20 points, and 30
High threshold is opened after minute, taking out bell jar vacuum degree is 3 × 10-3Pa is then turned on silicon power supply and maintains the temperature at 400 DEG C of left sides
Needle-valve is unscrewed on the right side, is passed through high pure oxygen, and monitoring high vacuum meter gauge outfit is allowed to be maintained at 8.5-8.8 × 10-2Pa or so is opened
Workpiece rotation controller and revolving speed is adjusted at 11 revs/min;Evaporation source current is opened, turn pressure regulator turntable makes heating power
Baffle is opened after 165W or so, 1 minute, the growth rate control of film terminates after 10-12nm/min or so, 40 points, will add
Thermoelectricity source power is reduced to 0, closes baffle, closes silicon power supply, closes substrate rotating disk power supply, closes oxygen, closes high
Vacuum valve, after 15 minutes give bell jar inflation, after can't hear the hiss of inflation, take out plated film after glass, be put into annealing furnace,
It anneals 25 minutes and takes out at 450 DEG C.
Further, when resulting conductive film 300nm transmitance be greater than 50% when, then should extend plated film time;When
Resulting conductive film 300nm transmitance less than 50%, then should shorten plated film time or be appropriately extended annealing time.
The present invention also provides a kind of ultraviolet 300nm it is semi-transparent-copper and indium doped transparent conductive film, by above-mentioned preparation method system
Standby gained.
The invention has the following advantages:
Conductive film of the invention is the semi-permeable membrane of a 300nm ultraviolet light, the ultraviolet instrumentation that can be used under this wavelength
Light splitting.
Preparation process of the present invention is simple, using cheap Sn and Cu, it is only necessary to which prepared by the In of 100mg, at low cost.
Detailed description of the invention
Fig. 1 is the Transmissivity measurement result of each sample in the embodiment of the present invention.
Fig. 2 is the relationship of sample resistivity and temperature in the embodiment of the present invention.
Specific embodiment
In order to which objects and advantages of the present invention are more clearly understood, the present invention is carried out with reference to embodiments further
It is described in detail.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to limit this hair
It is bright.
Embodiment
A kind of ultraviolet 300nm is semi-transparent-preparation method of copper and indium doped transparent conductive film, include the following steps:
S1,12 × 12 × 0.15cm is taken3Quartz glass, 12 × 12 × 0.3cm3Corning7059 glass and same sample ruler
Very little simple glass is cleaned up in the sink with detergent, is rinsed after five minutes, is put into standby in baking oven with cold and hot deionized water
With;
S2, the tungsten wire for being 0.8mm with diameter heat the circle of coiling filament 13 on the rod iron that diameter is 3mm, and both ends are respectively stayed
5cm, it is totally two, spare;
S3, the quartz ampoule for taking long 5cm diameter 1.5cm fire a pit in the middle and make load source crucible;
S4, a circular mount disk is taken, digs one 10 × 10cm therebetween2Square hole, then from square hole edge 10.5mm
Place's one width of fastening is a length of 100mm metal strip of 1mm, in circular mount disk away from making a call to three holes, central angle every 120 at outer edge 5mm
Degree one, is then screwed on the turntable of DM450A type coating machine;
S5, two filaments are put on quartz boat be fastened on heating electrode on, open power supply, press lower inverted bell liter button, to clock
Clean quartz glass is placed in above the square hole of the circular mount disk when rising to the upper limit by cover, take 1000mg tin (Sn) and
100mg copper (Cu), 100mg indium (In) are put into silica crucible, put down bell jar, open mechanical pump, open diffusion pump after 20 points, and 30
High threshold is opened after minute, taking out bell jar vacuum degree is 3 × 10-3Pa is then turned on silicon power supply and maintains the temperature at 400 DEG C of left sides
Needle-valve is unscrewed on the right side, is passed through high pure oxygen, and monitoring high vacuum meter gauge outfit is allowed to be maintained at 8.5-8.8 × 10-2Pa or so is opened
Workpiece rotation controller and revolving speed is adjusted at 11 revs/min;Evaporation source current is opened, turn pressure regulator turntable makes heating power
Baffle is opened after 165W or so, 1 minute, the growth rate control of film terminates after 10-12nm/min or so, 40 points, will add
Thermoelectricity source power is reduced to 0, closes baffle, closes silicon power supply, closes substrate rotating disk power supply, closes oxygen, closes high
Vacuum valve, after 15 minutes give bell jar inflation, after can't hear the hiss of inflation, take out plated film after glass, be put into annealing furnace,
It anneals 25 minutes and takes out at 450 DEG C, measure its square resistance, transmitance, film thickness, film thickness about 500nm or so.If film
Deviate 50% in the transmitance of 300nm, then its transmitance of adjustable plastics thickness control.For example it can be appropriately extended greater than 50%
Plated film time can shorten plated film time, or proper extension annealing time etc. if it is less than 50% and solve.
As seen from Figure 1, it should it is attracting great attention the result is that 5-5# film sample, at 900nm infrared light district
Transmitance be about 95%, wavelength be 900nm~300nm in the range of, transmitance is slowly reduced with the reduction of wavelength,
Transmitance at a length of 300nm of light wave is 52.5%, this is unique one sample for having high transmittance to ultraviolet light, simultaneously
It is also a good semi-permeable membrane.The results show that using different substrates, its transmitance is slightly different, the 5#-8 in Fig. 1,
5#-9 is the measurement result of quartz glass substrate, and 5#-6 is the measurement result of corning7059 glass substrate, and 5#-5 is common glass
The measurement result of glass substrate.Technology controlling and process error should be regarded as the transmitance difference of substrate of the same race.
Resistance-temperature characteristic is an important index, and after entering film for understanding copper atom, material is at a lower temperature
Resistivity-temperature characteristic, the resistance-temperature characteristic for preparing film sample is tested, using two-probe method, is being reequiped
HT-288 type high Tc superconducting material resistance afterwards-square resistance of temperature characteristic measuring instrument measurement sample and the relationship of temperature.Choosing
Selecting temperature range is 77.4K~280K.See there is satisfied low resistance in wider temperature range by the measurement result of sample
The case where rate, sees Fig. 2.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the principle of the present invention, it can also make several improvements and retouch, these improvements and modifications are also answered
It is considered as protection scope of the present invention.
Claims (4)
1. a kind of ultraviolet 300nm is semi-transparent-preparation method of copper and indium doped transparent conductive film, which comprises the steps of:
S1,12 × 12 × 0.15cm is taken3Quartz glass, cleaned up in the sink with detergent, with cold and hot deionized water rinse
After five minutes, it is put into spare in baking oven;
S2, the tungsten wire for being 0.8mm with diameter heat the circle of coiling filament 13 on the rod iron that diameter is 3mm, and 5cm is respectively stayed at both ends, altogether
It is two, spare;
S3, the quartz ampoule for taking long 5cm diameter 1.5cm fire a pit in the middle and make load source crucible;
S4, a circular mount disk is taken, digs one 10 × 10cm therebetween2Square hole, then from square hole edge 10.5mm fasten
One width is a length of 100mm metal strip of 1mm, in circular mount disk away from making a call to three holes at outer edge 5mm, every 120 degree one, central angle,
Then it is screwed on the turntable of DM450A type coating machine;
S5, two filaments are put on quartz boat be fastened on heating electrode on, open power supply, press lower inverted bell liter button, to bell jar liter
Supreme to prescribe a time limit, four tenons clean quartz glass being placed in above the square hole of the circular mount disk take 1000mg tin
It is put into silica crucible with 100mg copper, 100mg indium, puts down bell jar, opened mechanical pump, diffusion pump is opened after 20 points, after 30 minutes
High threshold is opened, taking out bell jar vacuum degree is 3 × 10-3Pa is then turned on silicon power supply and maintains the temperature at 400 DEG C, unscrewing needle
Valve, is passed through high pure oxygen, and monitoring high vacuum meter gauge outfit is allowed to be maintained at 8.5-8.8 × 10-2Pa opens workpiece rotation controller
And revolving speed is adjusted at 11 revs/min;Evaporation source current is opened, turn pressure regulator turntable makes heating power after 165W, 1 minute
Baffle is opened, the growth rate control of film terminates after 10-12nm/min, 40 points, heating power supply power is reduced to 0, closes gear
Plate closes silicon power supply, closes substrate rotating disk power supply, closes oxygen, closes high vacuum valve, fills after 15 minutes to bell jar
Gas, after can't hear the hiss of inflation, take out plated film after glass, be put into annealing furnace, 450 DEG C anneal 25 minutes take out.
2. a kind of ultraviolet 300nm as described in claim 1 is semi-transparent-and the preparation method of copper and indium doped transparent conductive film, feature
Be, when resulting conductive film 300nm transmitance be greater than 50% when, then should extend plated film time.
3. a kind of ultraviolet 300nm as described in claim 1 is semi-transparent-preparation method of copper and indium doped transparent conductive film, feature
Be, when resulting conductive film 300nm transmitance less than 50%, then should shorten plated film time or be appropriately extended annealing when
Between.
4. a kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film, which is characterized in that by preparation side described in claim 1
Method preparation gained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810965660.1A CN108950482A (en) | 2018-08-23 | 2018-08-23 | A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810965660.1A CN108950482A (en) | 2018-08-23 | 2018-08-23 | A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
CN108950482A true CN108950482A (en) | 2018-12-07 |
Family
ID=64473669
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810965660.1A Pending CN108950482A (en) | 2018-08-23 | 2018-08-23 | A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108950482A (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101841003A (en) * | 2010-03-30 | 2010-09-22 | 鲁东大学 | Double-layer structure deep-ultraviolet transparent conductive film and preparation method thereof |
CN103993261A (en) * | 2014-05-29 | 2014-08-20 | 江苏大学 | Preparation method of transparent conductive thin film with grating structure |
CN103993282A (en) * | 2014-05-30 | 2014-08-20 | 天津大学 | Double-layer transparent conducting thin film and preparation method thereof |
JP2017137572A (en) * | 2016-01-28 | 2017-08-10 | 三菱マテリアル株式会社 | Laminate transparent conductive film, laminate wiring film, and production method of laminate wiring film |
CN108220886A (en) * | 2018-02-28 | 2018-06-29 | 张治国 | A kind of preparation method of ITO texture transparent conductive film |
-
2018
- 2018-08-23 CN CN201810965660.1A patent/CN108950482A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101841003A (en) * | 2010-03-30 | 2010-09-22 | 鲁东大学 | Double-layer structure deep-ultraviolet transparent conductive film and preparation method thereof |
CN103993261A (en) * | 2014-05-29 | 2014-08-20 | 江苏大学 | Preparation method of transparent conductive thin film with grating structure |
CN103993282A (en) * | 2014-05-30 | 2014-08-20 | 天津大学 | Double-layer transparent conducting thin film and preparation method thereof |
JP2017137572A (en) * | 2016-01-28 | 2017-08-10 | 三菱マテリアル株式会社 | Laminate transparent conductive film, laminate wiring film, and production method of laminate wiring film |
CN108220886A (en) * | 2018-02-28 | 2018-06-29 | 张治国 | A kind of preparation method of ITO texture transparent conductive film |
Non-Patent Citations (1)
Title |
---|
张治国: "紫外波段高透过率铜铟掺杂SnO2薄膜的研究", 《物理学报》 * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Zhang et al. | Self‐polarized BaTiO3 for greatly enhanced performance of ZnO UV photodetector by regulating the distribution of electron concentration | |
CA2271412C (en) | Photovoltaic device and its method of preparation | |
CN106191775A (en) | A kind of transparent conductive film and its preparation method and application | |
CN101622721B (en) | Transparent electrode for solar cell and method for manufacturing same | |
CN102544216B (en) | Method for preparing BiFeO3 ferroelectric thin film photovoltaic battery on glass substrate | |
Richards | Novel uses of titanium dioxide for silicon solar cells | |
CN102576920A (en) | Dye-sensitized solar cell and method for manufacturing the same | |
TWI558830B (en) | Method of making a transparent conductive oxide layer | |
CN104916785A (en) | CH3NH3PbI3 thin-film solar cell preparation method | |
Hishida et al. | Designing band offset of a-SiO: H solar cells for very high open-circuit voltage (1.06 V) by adjusting band gap of p–i–n junction | |
CN107217232A (en) | A kind of method for improving zinc oxide transparent conductive film chemical stability | |
Peng et al. | Excellent properties of Ga‐doped ZnO film as an alternative transparent electrode for thin‐film solar cells | |
CN108950482A (en) | A kind of ultraviolet 300nm is semi-transparent-copper and indium doped transparent conductive film and preparation method thereof | |
Patel et al. | Preparation and characterization of SnO2 thin film coating using rf-plasma enhanced reactive thermal evaporation | |
Liu et al. | Structural and optical properties of ZnO thin films prepared by different sol-gel processes | |
Li et al. | Intensive light soaking improves electricity generation of silicon heterojunction solar cells by the anomalous Staebler–Wronski effect | |
Kobayashi et al. | Effects of post-deposition treatments on transparent conducting ZnO: B thin films grown by MOCVD | |
CN110318035A (en) | The more hot filament deposit method and devices of the discrete of alloy cpd film | |
CN105154841B (en) | The preparation method of bismuth doped stannum oxide film | |
Fu et al. | Electrochemical Properties of Solid–Liquid Interface of CuIn1− x Ga x Se2 Prepared by Electrodeposition with Various Gallium Concentrations | |
CN106637204A (en) | Depositing method for Ag/ZnO/Mg photoelectric transparent conducting thin film | |
CN108220886A (en) | A kind of preparation method of ITO texture transparent conductive film | |
Rafique et al. | Study on the effect of varying film thickness on the transparent conductive nature of aluminum doped zinc oxide deposited by dip coating | |
CN208157419U (en) | A kind of thin-film solar cells | |
Ramya et al. | The consequence of immersion time in chemical bath deposition on the properties of CuO thin films |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181207 |
|
RJ01 | Rejection of invention patent application after publication |