CN108931189A - Double vision field interferometer - Google Patents

Double vision field interferometer Download PDF

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Publication number
CN108931189A
CN108931189A CN201811182159.4A CN201811182159A CN108931189A CN 108931189 A CN108931189 A CN 108931189A CN 201811182159 A CN201811182159 A CN 201811182159A CN 108931189 A CN108931189 A CN 108931189A
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CN
China
Prior art keywords
amici prism
mirror
spectroscope
collimating mirror
double vision
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Pending
Application number
CN201811182159.4A
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Chinese (zh)
Inventor
祝沛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Qian Yao Optics Science And Technology Ltd
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Shanghai Qian Yao Optics Science And Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Qian Yao Optics Science And Technology Ltd filed Critical Shanghai Qian Yao Optics Science And Technology Ltd
Priority to CN201811182159.4A priority Critical patent/CN108931189A/en
Publication of CN108931189A publication Critical patent/CN108931189A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

The present invention proposes a kind of double vision field interferometer, comprising: laser point light source;Amici prism, the Amici prism are located at below the laser point light source;Spectroscope, the spectroscope are located at below the Amici prism;Collimating mirror, the collimating mirror are located at spectroscopical right side;Reflectance standard mirror, the reflectance standard mirror are located at the right side of the collimating mirror;Camera is tested, the test camera is located at the left side of the Amici prism;Alignment cameras is assisted, the auxiliary alignment cameras is located at spectroscopical left side.Double vision field interferometer according to an embodiment of the present invention can guarantee the precision that null field is adjusted in the case where big visual field assists alignment pattern, while can guarantee the testing range and precision of super large under small field of view high-resolution test pattern.

Description

Double vision field interferometer
Technical field
The present invention relates to a kind of double vision field interferometers.
Background technique
Using cell-phone camera hole detector test camera shooting bore region the depth of parallelism when, need transmission criteria mirror and anti-first The standard mirror of penetrating strictly levels row.The method of use is not place sample to be tested, and transmission criteria mirror and reflectance standard mirror are formed Interference fringe is adjusted to null field.
Summary of the invention
The present inventor first recognizes that, since the detection bore of instrument is 5mm, visual field is too small.When in 5mm visual field When internal interference striped number is less than 1, there is no strictly parallel with reflectance standard mirror for transmission criteria mirror.This is because if will Visual field amplification, then can be appreciated that in original 5mm visual field there are a plurality of interference fringes.For example, in 5mm visual field internal interference fringe number When mesh is less than 1, when in 30mm visual field, 5 interference fringes of physical presence.This indicates transmission criteria mirror and reflectance standard mirror The depth of parallelism not debugging strictly.
The present invention is directed to solve at least some of the technical problems in related technologies.
For this purpose, can be assisted in big visual field to quasi-mode an object of the present invention is to provide a kind of double vision field interferometer Guarantee the precision that null field is adjusted under formula, while can guarantee the testing range of super large under small field of view high-resolution test pattern And precision.
A kind of double vision field interferometer according to an embodiment of the present invention, comprising:
Laser point light source;
Amici prism, the Amici prism are located at below the laser point light source;
Spectroscope, the spectroscope are located at below the Amici prism;
Collimating mirror, the collimating mirror are located at spectroscopical right side;
Reflectance standard mirror, the reflectance standard mirror are located at the right side of the collimating mirror;
Camera is tested, the test camera is located at the left side of the Amici prism;
Alignment cameras is assisted, the auxiliary alignment cameras is located at spectroscopical left side.
Advantageously, the laser spherical wave of laser point light source output, through the Amici prism, spectroscope, described It exports, is transmitted with after reflectance standard mirror reflection, the optical path of return is divided into two-way, is the full view of 30mm all the way after collimating mirror Field light beam, is received by the auxiliary alignment cameras, forms the interference fringe of full filed;It is the small field of view light beam of 5m all the way, by institute Test camera is stated to receive.
Additional aspect and advantage of the invention will be set forth in part in the description, and will partially become from the following description Obviously, or practice through the invention is recognized.
Detailed description of the invention
Fig. 1 is the schematic diagram of double vision field interferometer according to an embodiment of the invention.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached The embodiment of figure description is exemplary, it is intended to is used to explain the present invention, and is not considered as limiting the invention.
Below with reference to the accompanying drawings it is described in detail double vision field interferometer according to an embodiment of the present invention.
As shown in Figure 1, a kind of double vision field interferometer according to an embodiment of the present invention, comprising: laser point light source 1 is divided rib Mirror 2, spectroscope 3, collimating mirror 4, reflectance standard mirror 5 test camera 6, assist alignment cameras 7.
Specifically, Amici prism 2 is located at below laser point light source 1.
Spectroscope 3 is located at below Amici prism 2.
Collimating mirror 4 is located at the right side of spectroscope 3.
Reflectance standard mirror 5 is located at the right side of collimating mirror 4.
Test camera 6 is located at the left side of Amici prism 2.
Auxiliary alignment cameras 7 is located at the left side of spectroscope 3.
Advantageously, the laser spherical wave that laser point light source 1 exports, exports after Amici prism 2, spectroscope 3, collimating mirror 4, After transmiting and reflecting with reflectance standard mirror 5, the optical path of return is divided into two-way, is the full filed light beam 101 of 30mm all the way, by assisting Alignment cameras 7 receives, and forms the interference fringe of full filed;It is the small field of view light beam 102 of 5mm all the way, is received by test camera 6.
It when adjusting cavity interference fringe, adjusts in the case where assisting alignment pattern, when fringe number is adjusted to less than 1, cuts Change to the test pattern of 5mm.The test pattern of 5mm is ideal null field at this time.
Using double-view field light channel structure, it can guarantee the precision that null field is adjusted in the case where big visual field assists alignment pattern, simultaneously It can guarantee the testing range and precision of super large under small field of view high-resolution test pattern.
In the description of the present invention, it is to be understood that, term " center ", " longitudinal direction ", " transverse direction ", " length ", " width ", " thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom" "inner", "outside", " up time The orientation or positional relationship of the instructions such as needle ", " counterclockwise ", " axial direction ", " radial direction ", " circumferential direction " be orientation based on the figure or Positional relationship is merely for convenience of description of the present invention and simplification of the description, rather than the device or element of indication or suggestion meaning must There must be specific orientation, be constructed and operated in a specific orientation, therefore be not considered as limiting the invention.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more, unless separately There is clearly specific restriction.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc. Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integral;It can be mechanical connect It connects, is also possible to be electrically connected;It can be directly connected, can also can be in two elements indirectly connected through an intermediary The interaction relationship of the connection in portion or two elements.It for the ordinary skill in the art, can be according to specific feelings Condition understands the concrete meaning of above-mentioned term in the present invention.
In the present invention unless specifically defined or limited otherwise, fisrt feature in the second feature " on " or " down " can be with It is that the first and second features directly contact or the first and second features pass through intermediary mediate contact.Moreover, fisrt feature exists Second feature " on ", " top " and " above " but fisrt feature be directly above or diagonally above the second feature, or be merely representative of First feature horizontal height is higher than second feature.Fisrt feature can be under the second feature " below ", " below " and " below " One feature is directly under or diagonally below the second feature, or is merely representative of first feature horizontal height less than second feature.
In the description of this specification, reference term " one embodiment ", " some embodiments ", " example ", " specifically show The description of example " or " some examples " etc. means specific features, structure, material or spy described in conjunction with this embodiment or example Point is included at least one embodiment or example of the invention.In the present specification, schematic expression of the above terms are not It must be directed to identical embodiment or example.Moreover, particular features, structures, materials, or characteristics described can be in office It can be combined in any suitable manner in one or more embodiment or examples.In addition, without conflicting with each other, the skill of this field Art personnel can tie the feature of different embodiments or examples described in this specification and different embodiments or examples It closes and combines.
Although the embodiments of the present invention has been shown and described above, it is to be understood that above-described embodiment is example Property, it is not considered as limiting the invention, those skilled in the art are within the scope of the invention to above-mentioned implementation Example be changed, modify, replacement and variant, each fall within protection scope of the present invention.

Claims (2)

1. a kind of double vision field interferometer characterized by comprising
Laser point light source;
Amici prism, the Amici prism are located at below the laser point light source;
Spectroscope, the spectroscope are located at below the Amici prism;
Collimating mirror, the collimating mirror are located at spectroscopical right side;
Reflectance standard mirror, the reflectance standard mirror are located at the right side of the collimating mirror;
Camera is tested, the test camera is located at the left side of the Amici prism;
Alignment cameras is assisted, the auxiliary alignment cameras is located at spectroscopical left side.
2. double vision field interferometer according to claim 1, which is characterized in that the laser spherical surface of the laser point light source output Wave exports after the Amici prism, the spectroscope, the collimating mirror, is transmitted with after reflectance standard mirror reflection, is returned The optical path returned is divided into two-way, is the full filed light beam of 30mm all the way, is received by the auxiliary alignment cameras, forms the dry of full filed Relate to striped;It is the small field of view light beam of 5mm all the way, is received by the test camera.
CN201811182159.4A 2018-10-09 2018-10-09 Double vision field interferometer Pending CN108931189A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811182159.4A CN108931189A (en) 2018-10-09 2018-10-09 Double vision field interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811182159.4A CN108931189A (en) 2018-10-09 2018-10-09 Double vision field interferometer

Publications (1)

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CN108931189A true CN108931189A (en) 2018-12-04

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CN (1) CN108931189A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130286404A1 (en) * 2010-11-16 2013-10-31 Thunder Bay Regional Research Institute Methods and apparatus for alignment of interferometer
CN104034421A (en) * 2014-05-21 2014-09-10 中国科学院西安光学精密机械研究所 Double-view-field Doppler heterodyne ineterferometer
CN104296676A (en) * 2014-09-29 2015-01-21 中国科学院光电研究院 Heterodyne point diffraction interferometer based on phase shift of low-frequency-difference acousto-optic frequency shifter
CN204758259U (en) * 2015-04-20 2015-11-11 成都太科光电技术有限责任公司 Testing arrangement is interfered to striking cable in horizontal dual -port plane
CN105675262A (en) * 2016-01-14 2016-06-15 中国科学院上海光学精密机械研究所 Wavefront detection device for large-diameter high-parallelism optical element
CN208720999U (en) * 2018-10-09 2019-04-09 上海乾曜光学科技有限公司 Double vision field interferometer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130286404A1 (en) * 2010-11-16 2013-10-31 Thunder Bay Regional Research Institute Methods and apparatus for alignment of interferometer
CN104034421A (en) * 2014-05-21 2014-09-10 中国科学院西安光学精密机械研究所 Double-view-field Doppler heterodyne ineterferometer
CN104296676A (en) * 2014-09-29 2015-01-21 中国科学院光电研究院 Heterodyne point diffraction interferometer based on phase shift of low-frequency-difference acousto-optic frequency shifter
CN204758259U (en) * 2015-04-20 2015-11-11 成都太科光电技术有限责任公司 Testing arrangement is interfered to striking cable in horizontal dual -port plane
CN105675262A (en) * 2016-01-14 2016-06-15 中国科学院上海光学精密机械研究所 Wavefront detection device for large-diameter high-parallelism optical element
CN208720999U (en) * 2018-10-09 2019-04-09 上海乾曜光学科技有限公司 Double vision field interferometer

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