CN108918589A - 运用红外热成像显微镜侦测芯片失效的除错方法 - Google Patents
运用红外热成像显微镜侦测芯片失效的除错方法 Download PDFInfo
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109596222A (zh) * | 2018-12-06 | 2019-04-09 | 广东金鉴实验室科技有限公司 | 一种显微热分布测试方法及*** |
CN109813435A (zh) * | 2018-12-29 | 2019-05-28 | 中国电子科技集团公司第十三研究所 | 静态光反射显微热成像方法、装置及终端设备 |
CN110797274A (zh) * | 2019-10-21 | 2020-02-14 | 大同新成新材料股份有限公司 | 一种堆栈式芯片硅基质量智能检测方法 |
CN111239590A (zh) * | 2020-02-24 | 2020-06-05 | 珠海格力电器股份有限公司 | 一种芯片静电损伤的定位方法及装置 |
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US20070023610A1 (en) * | 2005-07-29 | 2007-02-01 | Dae-Jong Kim | Method of testing a semiconductor chip and jig used in the method |
US20090167331A1 (en) * | 2006-06-02 | 2009-07-02 | Airbus Deutschland Gmbh | Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection |
CN101832950A (zh) * | 2010-04-28 | 2010-09-15 | 深圳创维-Rgb电子有限公司 | 一种pcb板质量检测方法、***及装置 |
CN103557943A (zh) * | 2013-11-05 | 2014-02-05 | 北京仿真中心 | 一种红外场景模拟装置 |
CN105158678A (zh) * | 2015-10-23 | 2015-12-16 | 湖北三江航天万峰科技发展有限公司 | 一种印制电路板短路故障点快速检测装置 |
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CN107238796A (zh) * | 2017-06-06 | 2017-10-10 | 苏州胜科设备技术有限公司 | 一种用于线路板的维修测试设备 |
CN107544014A (zh) * | 2016-06-24 | 2018-01-05 | 上海北京大学微电子研究院 | 一种功率器件的失效定位方法 |
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2018
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Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
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US20070023610A1 (en) * | 2005-07-29 | 2007-02-01 | Dae-Jong Kim | Method of testing a semiconductor chip and jig used in the method |
US20090167331A1 (en) * | 2006-06-02 | 2009-07-02 | Airbus Deutschland Gmbh | Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection |
CN101832950A (zh) * | 2010-04-28 | 2010-09-15 | 深圳创维-Rgb电子有限公司 | 一种pcb板质量检测方法、***及装置 |
CN103557943A (zh) * | 2013-11-05 | 2014-02-05 | 北京仿真中心 | 一种红外场景模拟装置 |
CN105158678A (zh) * | 2015-10-23 | 2015-12-16 | 湖北三江航天万峰科技发展有限公司 | 一种印制电路板短路故障点快速检测装置 |
CN205453900U (zh) * | 2016-03-23 | 2016-08-10 | 湖南信息职业技术学院 | 红外线无干扰图像采集装置 |
CN107544014A (zh) * | 2016-06-24 | 2018-01-05 | 上海北京大学微电子研究院 | 一种功率器件的失效定位方法 |
CN107179494A (zh) * | 2017-05-27 | 2017-09-19 | 浙江万里学院 | 一种通用电路板板上器件故障检测方法及*** |
CN107238796A (zh) * | 2017-06-06 | 2017-10-10 | 苏州胜科设备技术有限公司 | 一种用于线路板的维修测试设备 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109596222A (zh) * | 2018-12-06 | 2019-04-09 | 广东金鉴实验室科技有限公司 | 一种显微热分布测试方法及*** |
CN109813435A (zh) * | 2018-12-29 | 2019-05-28 | 中国电子科技集团公司第十三研究所 | 静态光反射显微热成像方法、装置及终端设备 |
CN109813435B (zh) * | 2018-12-29 | 2020-07-07 | 中国电子科技集团公司第十三研究所 | 静态光反射显微热成像方法、装置及终端设备 |
CN110797274A (zh) * | 2019-10-21 | 2020-02-14 | 大同新成新材料股份有限公司 | 一种堆栈式芯片硅基质量智能检测方法 |
CN111239590A (zh) * | 2020-02-24 | 2020-06-05 | 珠海格力电器股份有限公司 | 一种芯片静电损伤的定位方法及装置 |
CN111239590B (zh) * | 2020-02-24 | 2020-12-04 | 珠海格力电器股份有限公司 | 一种芯片静电损伤的定位方法及装置 |
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Address after: Room C101, Building 8, 1618 Yishan Road, Minhang District, Shanghai, 201100 Applicant after: Suzhou Yite (Shanghai) Testing Technology Co., Ltd Address before: 201103 C101 room 8, building 1618, Yishan Road, Shanghai, Minhang District, China Applicant before: INTEGRA TED SERVICE TECHNOLOGY (SHANGHAI) Co.,Ltd. |
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Address after: 201100 room C101, building 8, No. 1618, Yishan Road, Xuhui District, Shanghai Patentee after: Su shiyite (Shanghai) Testing Technology Co.,Ltd. Address before: Room C101, building 8, 1618 Yishan Road, Minhang District, Shanghai 201100 Patentee before: Suzhou Yite (Shanghai) Testing Technology Co.,Ltd. |