CN108917547B - Contact type inductive probe assembling structure and inspection robot - Google Patents
Contact type inductive probe assembling structure and inspection robot Download PDFInfo
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- CN108917547B CN108917547B CN201810307787.4A CN201810307787A CN108917547B CN 108917547 B CN108917547 B CN 108917547B CN 201810307787 A CN201810307787 A CN 201810307787A CN 108917547 B CN108917547 B CN 108917547B
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- 239000000523 sample Substances 0.000 title claims abstract description 144
- 238000007689 inspection Methods 0.000 title abstract description 15
- 230000001939 inductive effect Effects 0.000 title description 4
- 238000001514 detection method Methods 0.000 claims abstract description 32
- 230000006698 induction Effects 0.000 claims abstract description 19
- 230000000903 blocking effect Effects 0.000 claims description 26
- 230000013011 mating Effects 0.000 claims description 9
- 230000008093 supporting effect Effects 0.000 claims description 7
- 230000001737 promoting effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 4
- 230000001976 improved effect Effects 0.000 description 3
- 238000003475 lamination Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000010687 lubricating oil Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
The invention discloses a contact type induction probe assembly structure and a patrol robot. The contact type induction probe assembly structure comprises a fixing piece, a probe assembly, a rotating assembly and an elastic return piece; the rotating assembly comprises a rotating connecting piece and a fixed connecting piece, the fixed connecting piece is fixed with the fixed piece, a containing cavity is arranged on the rotating connecting piece, the containing cavity is provided with a detection opening, and the rotating connecting piece is connected with the fixed connecting piece in a rotating way; the probe assembly is arranged in the accommodating cavity and is provided with a first position extending out of the detection opening and a second position retracting into the detection cavity along the axis relative to the first position; a resilient return member is disposed within the receiving cavity and is capable of applying a force to the probe assembly that urges it back to the first position. The inspection robot comprises the contact type induction probe assembling structure. The contact type induction probe assembly structure disclosed by the embodiment of the invention can still keep close fit with the detection surface when the detection surface is a curved surface.
Description
Technical Field
The invention relates to the field of intelligent inspection equipment, in particular to a contact type induction probe assembly structure and an inspection robot.
Background
In recent years, with the advancement of smart grids, inspection robots have been widely used. The inspection robot can collect the conditions of ultrasonic waves, ground electric waves and the like generated by the operation of equipment through the contact type inductive probe, so that the internal operation condition of the equipment is judged.
In the related art, the conventional contact type induction probe assembly structure can only enable the probe assembly to axially stretch and retract, so that the detection surface of the probe assembly is tightly attached to the parallel detected surface. However, in the robot inspection process, the detected devices are various, and there are no devices with curved appearance surfaces. Because of the structural limitation of the contact type induction probe assembly structure in the related art, if the telescopic axis of the probe assembly does not pass through the center of the curved surface, the detection surface is difficult to be closely attached to the detected surface.
Failure of the probe surface to closely conform to the surface being inspected can result in accurate or unusable measurement data. There are great limitations in the application environments of the touch sensing probe in the related art.
Disclosure of Invention
The embodiment of the invention provides a contact type induction probe assembly structure and a patrol robot, which are used for solving the problems.
The embodiment of the invention adopts the following technical scheme:
a first aspect of an embodiment of the present invention provides a contact-type sensing probe assembly structure, including a fixing member, a probe assembly, a rotating assembly, and an elastic return member;
the rotating assembly comprises a rotating connecting piece and a fixed connecting piece, the fixed connecting piece is fixed with the fixed piece, a containing cavity is arranged on the rotating connecting piece, the containing cavity is provided with a detection opening, the rotating connecting piece is rotationally connected with the fixed connecting piece, and after rotation, the axis of the detection opening and the axis of the detection opening form a non-zero included angle;
the probe assembly is arranged in the accommodating cavity, the probe assembly is provided with a first position extending out of the detection opening and a second position which is retracted into the accommodating cavity along the axis relative to the first position, and the probe assembly can move between the first position and the second position;
The elastic return piece is arranged in the accommodating cavity, one end of the elastic return piece is fixed with the probe assembly, the other end of the elastic return piece is fixed with the accommodating cavity, and when the probe assembly is positioned between the first position and the second position or is positioned at the second position, the elastic return piece can apply acting force for promoting the probe assembly to return to the first position.
Preferably, in the above-mentioned touch sensing probe assembly structure, the rotary connector rotates relative to the fixed connector in at least one dimension perpendicular to the axis.
Preferably, in the above-mentioned contact-type inductive probe assembly structure, the rotating connecting piece is provided with a first connecting surface, the fixed connecting piece is provided with a second connecting surface, the first connecting surface and the second connecting surface are both part of a spherical surface, the first connecting surface is connected with the second connecting surface in a matched manner and has the same spherical center, and the rotating connecting piece and the fixed connecting piece can rotate in a spherical surface relative to the spherical center.
Preferably, in the above-mentioned contact-type sensing probe assembling structure, the axis passes through the center of sphere.
Preferably, in the above contact-type sensing probe assembly structure, the first connection surface faces away from the center of sphere, and the second connection surface faces toward the center of sphere.
Preferably, in the above-mentioned contact-type sensing probe assembling structure, the probe assembly is slidably connected with the accommodating cavity.
Preferably, in the above contact type sensing probe assembly structure, a blocking portion is disposed in the accommodating cavity, and a blocking matching portion is disposed on the probe assembly, and when the probe assembly is in the first position, the blocking portion abuts against the blocking matching portion and prevents the probe assembly from continuously extending out of the detection opening.
Preferably, in the above-mentioned contact-type sensing probe assembly structure, the blocking portion is annular and is disposed around the detection opening, and the blocking mating portion is annular and is matched with the blocking portion.
Preferably, in the above-mentioned contact-type sensing probe assembly structure, the contact-type sensing probe assembly structure further includes a supporting member, the accommodating cavity is penetrated through by the rotating connecting member along the axis, the supporting member is fixed at one end of the accommodating cavity facing away from the detection opening, the elastic return member is located between the probe assembly and the supporting member, and when the probe assembly is located at the first position, the elastic return member is located in a natural state or a compressed state.
A second aspect of the embodiment of the invention provides a patrol robot, which comprises the contact type induction probe assembly structure.
The above at least one technical scheme adopted by the embodiment of the invention can achieve the following beneficial effects:
According to the contact type induction probe assembly structure and the inspection robot disclosed by the embodiment of the invention, through the cooperation of the fixing piece, the rotating component and the elastic return piece, the probe component can move along the axis of the detection opening and can change the direction of the axis, so that when the detected surface is a curved surface, the contact type induction probe assembly structure can still keep close contact with the detected surface through the rotation of the probe component and the thrust of the elastic return piece, the measurement precision for the curved surface is greatly improved, and the application environment of the contact type induction probe is enlarged.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and do not constitute a limitation on the invention. In the drawings:
FIG. 1 is a schematic view of a contact sensing probe assembly according to an embodiment of the present invention, wherein a probe assembly is in a first position;
FIG. 2 is a schematic view of a structure of a contact sensing probe assembly according to an embodiment of the present invention, wherein the probe assembly is in a second position;
fig. 3 is a schematic structural diagram of a touch sensing probe assembly structure according to an embodiment of the present invention when detecting a curved surface.
Reference numerals illustrate:
1-mount, 2-probe assembly, 20-probe cover, 22-probe body, 24-fixed mount, 26-stop mating portion, 3-rotation assembly, 30-rotation connector, 30 a-first connection face, 300-receiving cavity, 300 a-detection opening, 300 b-stop portion, 32-fixed connector, 32 a-second connection face, 4-elastic return, 5-support, 6-curved face.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to specific embodiments of the present invention and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The following describes in detail the technical solutions provided by the embodiments of the present invention with reference to the accompanying drawings.
The embodiment of the invention discloses a patrol robot which comprises a contact type induction probe assembly structure. Specifically, referring to fig. 1 to 3, the touch sensing probe assembly structure includes a fixing member 1, a probe assembly 2, a rotating assembly 3, and an elastic return member 4. The fixing member 1 may be formed by extending a housing of the inspection robot, or may be formed by a bracket. The probe assembly 2 may include a probe cover 20, a probe body 22, and a fixed mount 24. The probe body 22 is a main probing functional part of the probe assembly 2, the fixing mounting part 24 is used for fixing the probe body 22 and protecting the rear part of the probe assembly 2, and the probe cover 20 covers the front and the side surfaces of the probe body 22 and the fixing mounting part 24 and is used for protecting the front part of the probe body 22.
The rotating assembly 3 comprises a rotating connecting piece 30 and a fixed connecting piece 32, the fixed connecting piece 32 is fixed with the fixed piece 1, a containing cavity 300 is arranged on the rotating connecting piece 30, the containing cavity 300 is provided with a detecting opening 300a, the detecting opening 300a is provided with an axis, a is indicated by a in fig. 1 and 2, the rotating connecting piece 30 is connected with the fixed connecting piece 32 in a rotating mode, and the rotating connecting piece 30 can drive the detecting opening 300a to rotate together. In fig. 3, the axis of the post-rotation detection opening 300a is denoted by a2, the axis of the pre-rotation detection opening 300a is denoted by a1, and a non-zero angle can be formed between a1 and a2 by comparing the axis before rotation with the axis after rotation.
The probe assembly 2 is disposed within the receiving cavity 300, and the probe assembly 3 has a first position (see fig. 1) in which it protrudes through the probe opening 300a and a second position (see fig. 2) in which it is retracted into the receiving cavity 300 along the axis a relative to the first position, the probe assembly 2 being movable between the first position and the second position to extend and retract the probe assembly 2 relative to the probe opening 300 a.
The elastic return member 4 is also disposed in the accommodating chamber 300, and one end of the elastic return member 4 is fixed to the probe assembly 2, and the other end of the elastic return member 4 is fixed to the accommodating chamber 300. The resilient return 4 is capable of exerting a force on the probe assembly 2 urging it back to the first position when the probe assembly 2 is between the first and second positions or in the second position, i.e. when the probe assembly 2 is in an inwardly retracted state.
To enable smooth movement of the probe assembly 2 between the first and second positions, a sliding connection between the probe assembly 2 and the receiving cavity 300 is preferred. In particular, it is possible to provide a number of sliding grooves extending along the axis a of the detection opening in the housing chamber 300, while a slider is provided on the probe assembly 2, cooperating with the sliding grooves. Or the peripheral wall of the accommodating chamber 300 is finished smooth and flat and parallel to the axis a, and the probe assembly 2 is directly in sliding fit with the peripheral wall of the accommodating chamber 300.
In order to prevent the probe assembly 2 from continuing to extend beyond the first position and even directly out of the receiving cavity 300a through the detection opening 300a, the present embodiment further provides a blocking portion 300b within the receiving cavity 300, and simultaneously provides a blocking mating portion 26 on the probe assembly 2, where the blocking mating portion 26 may be provided on the probe cover 20 or the fixed mounting portion 24. When the probe assembly 2 is in the first position, the blocking portion 300b abuts against the blocking engagement portion 26 and prevents the probe assembly 2 from continuing to extend out of the probe opening 300a.
The blocking portion 300b may be in the form of a stopper, and a plurality of blocking portions may be disposed in the accommodating cavity 300 along the circumferential direction, or may be directly disposed in a ring around the detecting opening 300a, and the blocking mating portion 26 may be in the same annular structure as the blocking portion 300b, or may be in a manner that a plurality of small mating portions are circumferentially combined.
When the blocking portion 300b is provided in the accommodating chamber 300, it is difficult for the probe assembly 2 to be fitted into the interior of the accommodating chamber 300 through the probe opening 300a due to the blocking of the blocking portion 300b, and at this time, it may be necessary to manufacture the rotary joint 30 into several pieces and then splice-mold it by some means, for example. This approach may lead to a complicated structure and lower assembly efficiency.
For ease of assembly, as shown in fig. 1 and 2, the receiving chamber 300 may be disposed through the rotary connector 30 along the axis a, the probe assembly 2 and the elastic return member 4 may be placed from an end of the receiving chamber 300 facing away from the detection opening 300a, and then a support member 5 may be fixed to an end of the receiving chamber 300 facing away from the detection opening 300a, the elastic return member 4 being disposed between the probe assembly 2 and the support member 5, the elastic return member 4 being in a natural state or a compressed state when the probe assembly 2 is in the first position, that is, the elastic return member 4 being sandwiched between the probe assembly 2 and the elastic return member 4, and the elastic return member 4 being in a compressed state when the probe assembly 2 is in the inwardly retracted state, so that the elastic return member 4 can exert a force urging the probe assembly 2 to return to the first position.
The elastic return element 4 may be a spring, a shrapnel or other similar structures, and may also be an elastomer made of a high polymer material, such as rubber. The number of the elastic return pieces 4 is not particularly limited, and a single elastic return piece 4 with high elasticity may be used, or a plurality of elastic return pieces 4 with low elasticity may be used to form an array. The force provided by the resilient return member 4 is preferably uniformly applied to the probe assembly 2. The elastic return member 4 may be fixedly connected to both ends of the contacted member (the probe assembly 2 and the support member 5), or may be fixedly connected to only one end of the contacted member, or may be limited in position by only elastic force and frictional force without being fixedly connected when the elastic return member 4 is always in a large compressed state.
When the curved surface is detected, the inspection robot drives the contact type induction probe assembly structure to be integrally close to the curved surface 6, after the probe assembly 2 contacts with the curved surface 6, an interaction force is formed between the probe assembly 2 and the curved surface 6, and the interaction force can be decomposed into two component forces, wherein one component force extends along the axis and forces the probe assembly 2 to retract towards the inside of the accommodating cavity 300 along the axis, the other component force extends along the rotation circumferential direction of the rotating assembly 3 and forces the rotating connecting piece 30 and the fixed connecting piece 32 to rotate relatively along the direction b. The overall orientation of the probe opening 300a and the probe assembly 2 can be changed by rotation, so that the axis a2 after rotation can pass through the center of the curved surface. Because the probe assembly 2 and the elastic return piece 4 always rotate along with the rotating connecting piece 30, the acting force of the elastic return piece 4 always keeps consistent with the axis, and the probe assembly 2 can be clung to the curved surface 6 under the thrust of the elastic return piece 4, so that the measurement precision for the curved surface 6 is greatly improved, and the application environment of the contact type induction probe is enlarged.
In this embodiment, the rotary link 30 needs to be rotatable relative to the fixed link in at least one dimension perpendicular to the axis a, such as in a direction up and down the page as shown in fig. 3, or in a direction perpendicular to the page. However, for the grid, the surface to be inspected may extend horizontally, or may extend vertically or diagonally. However, if the rotary joint 30 can be rotated in only a single dimension, only one of them can be handled, and thus there is still a limitation.
It is preferred that the rotational coupling 30 and the fixed coupling 32 are simultaneously rotatable in two dimensions perpendicular to the axis a, i.e. along a sphere. Specifically, to achieve this, as shown in fig. 1 to 3, the rotary connecting member 30 of the present embodiment has a first connecting surface 30a and a second connecting surface 32a on the fixed connecting member 32, where the first connecting surface 30a and the second connecting surface 32a are all part of a complete spherical surface, the first connecting surface 30a and the second connecting surface 32a are cooperatively connected and have the same spherical center, and the rotary connecting member 30 and the fixed connecting member 32 can perform spherical rotation relative to the spherical center.
The first connecting surface 30a and the second connecting surface 32a can be directly attached together, so that the two can realize spherical rotation, and only the friction force is high. Friction may be reduced between the first connection surface 30a and the second connection surface 32a by filling with lubricating oil or by embedding balls or the like. Typically, the second connecting surface 32a faces the center of the sphere, and the first connecting surface 30a faces away from the center of the sphere, i.e. the rotating connecting member 30 is wrapped with the fixed connecting member 32. However, in some special cases, a structure in which the first connection surface 30a faces the center of the sphere and the second connection surface 32a faces away from the center of the sphere is adopted, and in this case, the first connection surface 30a wraps the second connection surface 32a in the spherical rotation structure portion, the fixing connection member 32 is connected with the fixing member 1 in a region other than the second connection surface 32a, and the rotation connection member 30 is also provided with the accommodating cavity 300 in a region other than the first connection surface 30a, which still can satisfy the requirement, but the structure is relatively complex.
In theory, the purpose of rotating the probe assembly 2 can be achieved by only installing the probe assembly 2 on the rotating connector 30 so that the probe assembly rotates along with the rotating connector 30, however, if the axis a of the detection opening 300a does not pass through the center of sphere, that is, the detection opening 300a is arranged at an eccentric position, the rotation angle of the probe assembly 2 is linked with the position (the height or the left and right) of the spherical surface, so that the adjustment and lamination process of the detection surface and the curved surface is complicated, and the lamination efficiency and the lamination effect of the inspection robot are reduced. The axis a of the detection opening 300a passes through the center of the sphere, so that the above problems can be effectively avoided. Therefore, in order for the inspection robot to efficiently perform posture adjustment of the probe assembly 2, the axis a of the probe opening 300a preferably passes through the center of the sphere.
According to the contact type induction probe assembly structure and the inspection robot provided by the embodiment of the invention, when the surface to be inspected is a curved surface, the contact type induction probe assembly structure and the inspection robot can still keep close fit with the surface to be inspected through the rotation of the probe assembly 2 and the thrust of the elastic return piece 4, so that the measurement precision for the curved surface can be greatly improved, and the application environment of the contact type induction probe is enlarged.
The foregoing embodiments of the present invention mainly describe differences between the embodiments, and as long as there is no contradiction between different optimization features of the embodiments, the embodiments may be combined to form a better embodiment, and in view of brevity of line text, no further description is provided herein.
The foregoing is merely exemplary of the present invention and is not intended to limit the present invention. Various modifications and variations of the present invention will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the invention are to be included in the scope of the claims of the present invention.
Claims (9)
1. The contact type induction probe assembling structure is characterized by comprising a fixing piece, a probe assembly, a rotating assembly, a supporting piece and an elastic return piece;
the rotating assembly comprises a rotating connecting piece and a fixed connecting piece, the fixed connecting piece is fixed with the fixed piece, a containing cavity is arranged on the rotating connecting piece, the containing cavity is provided with a detection opening, the rotating connecting piece is rotationally connected with the fixed connecting piece, and after rotation, the axis of the detection opening and the axis of the detection opening form a non-zero included angle;
The probe assembly is arranged in the accommodating cavity, the probe assembly is connected with the accommodating cavity in a sliding way, the probe assembly is provided with a first position extending out of the detection opening and a second position retracting into the accommodating cavity along the axis relative to the first position, and the probe assembly can move between the first position and the second position;
The accommodating cavity penetrates through the rotating connecting piece along the axis, the supporting piece is fixed at one end, away from the detection opening, in the accommodating cavity, the elastic return piece is positioned between the probe assembly and the supporting piece, the elastic return piece is arranged in the accommodating cavity, one end of the elastic return piece is fixed with the probe assembly, the other end of the elastic return piece is fixed with the accommodating cavity supporting piece, and when the probe assembly is positioned between the first position and the second position or is positioned at the second position, the elastic return piece can apply a force for promoting the probe assembly to return to the first position; the probe assembly and the elastic return piece always rotate along with the rotating connecting piece, and the acting force of the elastic return piece is consistent with the axis.
2. The touch sensitive probe mounting structure of claim 1, wherein the rotational connector rotates relative to the fixed connector in at least one dimension perpendicular to the axis.
3. The touch sensor probe assembly structure of claim 2, wherein the rotational connector has a first connection surface, the fixed connector has a second connection surface, the first connection surface and the second connection surface are both part of a spherical surface, the first connection surface and the second connection surface are cooperatively connected and have the same spherical center, and the rotational connector and the fixed connector can perform spherical rotation relative to the spherical center.
4. A contact sensing probe assembly structure according to claim 3, wherein said axis passes through said center of sphere.
5. A touch sensitive probe mounting structure according to claim 3, wherein the first connection face faces away from the center of sphere and the second connection face faces toward the center of sphere.
6. A touch sensing probe assembly structure according to any of claims 1-5, wherein a blocking portion is provided in the receiving cavity, and wherein a blocking mating portion is provided on the probe assembly, the blocking portion abutting the blocking mating portion and preventing the probe assembly from continuing to extend out of the detection opening when the probe assembly is in the first position.
7. The touch sensitive probe assembly structure of claim 6, wherein the blocking portion is annular and disposed about the probe opening, and the blocking mating portion is annular and mates with the blocking portion.
8. The touch sensitive probe assembly structure of claim 7, further comprising a support member, the receiving cavity extending through the rotational connector along the axis, the support member being secured within the assembly cavity at an end facing away from the probe opening, the resilient return member being between the probe assembly and the support member, the resilient return member being in a natural or compressed state when the probe assembly is in the first position.
9. A patrol robot comprising the touch-sensitive probe assembly structure of any one of claims 1 to 8.
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JP2597671B2 (en) * | 1988-09-05 | 1997-04-09 | 株式会社竹中工務店 | Clean room measurement robot |
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WO2011052039A1 (en) * | 2009-10-27 | 2011-05-05 | 帝人ファーマ株式会社 | Medical-equipment-use probe fixture having angle adjustable mechanism |
CN204881882U (en) * | 2015-05-12 | 2015-12-16 | 苏州星火量测设备有限公司 | Main shaft running -in machine temperature -detecting device |
CN106343966A (en) * | 2016-10-08 | 2017-01-25 | 佛山市兴兴智能科技有限公司 | Probe abutting-against device for medical detection device |
CN107424658B (en) * | 2017-05-27 | 2019-05-21 | 苏州热工研究院有限公司 | A kind of flow probe apparatus for nuclear fuel rod EDDY CURRENT |
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CN102551682A (en) * | 2011-12-31 | 2012-07-11 | 深圳和而泰智能控制股份有限公司 | Contact type thermometric indicator |
CN206020535U (en) * | 2016-08-31 | 2017-03-15 | 西安隆基硅材料股份有限公司 | Probe detector |
CN208075813U (en) * | 2018-04-08 | 2018-11-09 | 海南电网有限责任公司万宁供电局 | Contact inductive probe assembling structure and crusing robot |
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