CN108871590B - 非制冷红外焦平面探测器非均匀性响应率校正方法及装置 - Google Patents
非制冷红外焦平面探测器非均匀性响应率校正方法及装置 Download PDFInfo
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- CN108871590B CN108871590B CN201811101237.3A CN201811101237A CN108871590B CN 108871590 B CN108871590 B CN 108871590B CN 201811101237 A CN201811101237 A CN 201811101237A CN 108871590 B CN108871590 B CN 108871590B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
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- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
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CN201811101237.3A CN108871590B (zh) | 2018-09-20 | 2018-09-20 | 非制冷红外焦平面探测器非均匀性响应率校正方法及装置 |
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CN201811101237.3A CN108871590B (zh) | 2018-09-20 | 2018-09-20 | 非制冷红外焦平面探测器非均匀性响应率校正方法及装置 |
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CN113252185B (zh) * | 2021-04-07 | 2022-10-04 | 广州市倍尔康医疗器械有限公司 | 红外测温仪温度测量方法、***和存储介质 |
CN113532663A (zh) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | 红外探测器的响应率的获取方法、装置、设备及存储介质 |
CN117146990B (zh) * | 2023-08-30 | 2024-03-08 | 北京波谱华光科技有限公司 | 一种基于非制冷红外探测器的低帧频外触发方法及*** |
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CN102385701A (zh) * | 2011-10-14 | 2012-03-21 | 华中科技大学 | 扫描型红外成像***的非均匀校正方法 |
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US9491376B2 (en) * | 2009-02-23 | 2016-11-08 | Flir Systems, Inc. | Flat field correction for infrared cameras |
CN102176742B (zh) * | 2011-03-14 | 2012-10-10 | 浙江兆晟科技有限公司 | 图像校正系数的获取方法、非均匀图像校正方法及*** |
KR101504022B1 (ko) * | 2013-08-09 | 2015-03-24 | 주식회사 콕스 | 고정 대상체를 이용하여 불균일을 보정하는 열상 카메라 및 그 불균일 보정 방법 |
CN104964746B (zh) * | 2015-06-17 | 2018-04-10 | 北京空间机电研究所 | 基于无快门的非制冷红外成像***和非均匀性校正方法 |
CN107101727A (zh) * | 2017-05-03 | 2017-08-29 | 江苏北方湖光光电有限公司 | 非均匀性校正时校正参数的标定方法 |
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CN102385701A (zh) * | 2011-10-14 | 2012-03-21 | 华中科技大学 | 扫描型红外成像***的非均匀校正方法 |
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Denomination of invention: Method and device for correcting nonuniformity response rate of uncooled infrared focal plane detector Effective date of registration: 20211230 Granted publication date: 20191217 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2021980017076 |
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Date of cancellation: 20230106 Granted publication date: 20191217 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2021980017076 |
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Denomination of invention: Method and device for correcting nonuniformity response rate of uncooled infrared focal plane detector Effective date of registration: 20230113 Granted publication date: 20191217 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2023980031040 |
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Application publication date: 20181123 Assignee: INFIRAY TECHNOLOGIES CO.,LTD. Assignor: Yantai Airui Photo-Electric Technology Co.,Ltd. Contract record no.: X2024980006380 Denomination of invention: Correction method and device for non-uniform response rate of uncooled infrared focal plane detectors Granted publication date: 20191217 License type: Common License Record date: 20240530 |