CN108871406A - A kind of algorithm for finding extremely excellent calibration point - Google Patents

A kind of algorithm for finding extremely excellent calibration point Download PDF

Info

Publication number
CN108871406A
CN108871406A CN201810396374.8A CN201810396374A CN108871406A CN 108871406 A CN108871406 A CN 108871406A CN 201810396374 A CN201810396374 A CN 201810396374A CN 108871406 A CN108871406 A CN 108871406A
Authority
CN
China
Prior art keywords
calibration point
group
calibration
value
elbows
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810396374.8A
Other languages
Chinese (zh)
Other versions
CN108871406B (en
Inventor
赵浩华
王恒斌
孙伯乐
高志齐
朱亦正
陈绪聪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHANGZHOU TONGHUI ELECTRONICS Co Ltd
Original Assignee
CHANGZHOU TONGHUI ELECTRONICS Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHANGZHOU TONGHUI ELECTRONICS Co Ltd filed Critical CHANGZHOU TONGHUI ELECTRONICS Co Ltd
Priority to CN201810396374.8A priority Critical patent/CN108871406B/en
Publication of CN108871406A publication Critical patent/CN108871406A/en
Application granted granted Critical
Publication of CN108871406B publication Critical patent/CN108871406B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Complex Calculations (AREA)
  • Image Analysis (AREA)

Abstract

The present invention relates to a kind of algorithms for finding extremely excellent calibration point, include the following steps:1) test data for obtaining the calibration of one group of needs, determines curve matching mode;2) a collection of calibration point is randomly selected;3) good calibration point is exchanged at random;4) several points are suitably chosen again from all the points to substitute;5) it carries out curve fitting to every group of calibration point, calculates Q value;Then scoring is calculated using valuation functions to Q value;6) combined evaluation functional value chooses excellent a collection of calibration point with the mode to shake the elbows and enters next round selection, and chooses classic one group of calibration point record in this wheel.7) step 3) is repeated to step 6);8) a best calibration point group is found after being repeated as many times.The present invention finds extremely excellent calibration point by taking Newton interpolation and cubic spline interpolation as an example in a large amount of measurement points, reaches the calibration effect within the scope of reasonable error with lower complexity, can be used in impedance measurement field, be highly suitable for daily production.

Description

A kind of algorithm for finding extremely excellent calibration point
Technical field
The present invention relates to electronic surveying fields, are used for instrument calibration, especially a kind of algorithm for finding extremely excellent calibration point.
Background technique
Existing calibration program is mostly linear interpolation method.Nowadays some tip instrument test principles are complicated, can generate survey The phenomenon that nonlinear correlation is presented in magnitude and true value relationship, linear interpolation is very general to such curve matching effect, often needs Negated often more point, or even development is wanted to become look-up table.In face of such issues that, the method for curve matching has significant advantage.
Linear interpolation method selects the method for calibration point very simple, as long as finding inflection point.But the school of curve matching It is not on schedule specific point, human eye can not identify, and calibration point chooses the effect for whether appropriately determining its fitting.In reality Border is in application, measurement point is often a large amount of point, if by method of exhaustion selection wherein more than ten point, complexity is very Height, be unfavorable for actual production.Therefore, the curve different in face of characteristic, how in a large amount of point, with complexity low as far as possible Degree chooses the extremely excellent calibration point of curve matching, becomes a crucial problem.
Summary of the invention
The technical problem to be solved by the present invention is to:A kind of algorithm for finding extremely excellent calibration point is provided, in a large amount of measurement points Extremely excellent calibration point is found, reaches the effect of the calibration within the scope of reasonable error with lower complexity in the actual production process Fruit.
The technical solution adopted by the present invention to solve the technical problems is:A kind of algorithm for finding extremely excellent calibration point, including Following steps:
1) test data for obtaining the calibration of one group of needs, determines curve matching mode;
2) it chooses a batch and organizes initial calibration point group:Calibration point is randomly selected in test data by way of shaking the elbows Several calibration points form a calibration point group, continuously select 200 calibration point groups;
3) outstanding calibration point transposition:Traverse each calibration point group and shake the elbows, if obtain value less than 0.9 if mark Note;How many a calibration points are exchanged in the decision that shakes the elbows again when having multiple calibration point groups labeled, finally pass through the side to shake the elbows again Which calibration point formula selection exchanges;
4) some calibration points are incorporated at random:Each calibration point group is traversed again and is shaked the elbows, if obtained value is less than 0.3 Which calibration point the decision that then continues to shake the elbows needs to replace, which for determining to be substituted in all calibration points finally shakes the elbows again One calibration point;
5) surface fitting is carried out to each individual, calculates Q value;Then valuation functions are used to Q value:It calculates The highest calibration point group that scores, is recorded the range as last optimizing by scoring;
6) combined evaluation functional value chooses excellent calibration point group with the mode to shake the elbows and continues next round search;
7) step 3) is repeated to step 6);
8) the smallest individual of a Q value is found again in all optimal calibration point groups as last extremely excellent calibration point.
Further, the curve matching mode in step 1) of the present invention includes that Newton interpolating method or cubic spline are inserted Value method.
It further says, in step 2) of the present invention, if having chosen identical calibration in a calibration point group Point is then chosen again until not having to repeat calibration point.
Further say, in step 5) of the present invention,WhereinFor match value, Y For true value.
It further says, in step 6) of the present invention, when there is same calibration point, scoring changes low be used as and punishes, together When using last round of optimal calibration point group be directly entered next round optimizing as reward.
The invention has the advantages that solving defect present in background technique, with this algorithm, with Newton interpolation and three For secondary spline interpolation, extremely excellent calibration point is found in a large amount of measurement points, is reached with lower complexity in reasonable error model Interior calibration effect is enclosed, impedance measurement field can be used in, be highly suitable for daily production.
Detailed description of the invention
The following further describes the present invention with reference to the drawings.
5MHz-10MHz measurement data real part curve graph when Fig. 1 is impedance analyzer short circuit;
Fig. 2 is combined valuation functions value line chart;
Fig. 3 is the curve graph being fitted by Newton interpolating method;Curve 1 is measurement line in figure, and curve 2 is fit line;
Fig. 4 is the curve graph being fitted by cubic spline interpolation;Curve 1 is measurement line in figure, and curve 2 is fit line.
Specific embodiment
Presently in connection with attached drawing and preferred embodiment, the present invention is described in further detail.These attached drawings are simplified Schematic diagram, the basic structure of the invention will be illustrated schematically only, therefore it only shows the composition relevant to the invention.
A kind of algorithm for finding extremely excellent calibration point, including choosing a collection of calibration point, exchanging outstanding calibration point, involvement a batch New calibration point, assessment, select valuation functions appropriate in assessment, using reward appropriate and punitive measures can be more It is good to search out global extremely excellent solution faster.
By taking the shorting data of impedance analyzer high frequency section as an example:
Measurement data is following (totally 500):
Since short circuit value is smaller, frequency values are larger, therefore first by frequency values divided by 1000000, measured value is made to return multiplied by 1000 One change processing, obtained data such as following table (totally 500):
It is as shown in Figure 1 to draw its curve.
Then it is fitted with Newton interpolating method and cubic spline interpolation respectively using 10 points of this algorithm picks.
Steps are as follows:
1, a collection of calibration point is chosen:
The mode to shake the elbows is first passed through, 10 measurement data are randomly selected in 500 measurement data and form a calibration Point group, chooses altogether 100 calibration point groups;(since calibration point does not allow the phenomenon that duplicating, thus in an individual if Identical calibration point has been chosen, then has been chosen again until not having to repeat calibration point).
The a collection of calibration point group chosen for the first time is following (one calibration point group of each behavior):
2, outstanding calibration point transposition:
As soon as traverse every group of calibration point group and throwing time dice (range 0-1), if obtain value is marked less than certain probability Note, until next individual for needing transposition occurs, then dice (range 1-500) of throwing, it determines this time to exchange How many a calibration points.After the quantity exchanged, then by way of throwing dice (range 1-10) determine which school exchanged On schedule.(probability is typically chosen 0.9).Initial value exchanges after outstanding calibration point following (every a line represents a calibration point group):
3, some new calibration points are incorporated:
Each calibration point group and throwing dice (range 0-1) are traversed again, if obtained value is less than certain probability, just again Secondary throwing dice (range 1-10) determines which calibration point replaced, and last throwing dice (range 1-500) determines which is incorporated New calibration point.(probability generally takes 0.3).It is incorporated after new calibration point for the first time as follows (one calibration point group of each behavior):
4, excellent calibration point group is selected:
Pass through calibration point group digital simulation curve;
Each calibration point group is chosen, by taking cubic spline interpolation and Newton interpolating method as an example, cubic spline is calculated separately out and inserts The matched curve of value and Newton interpolating method.
A, Newton interpolating method:
Newton's interpolation formula is:
Wherein f [x0,x1,…,xk] it is difference coefficient value.
Wherein:
B, cubic spline interpolation:
Need to calculate a of the equation in each section, b, c, d.The equation for solving four unknown numbers must use four equations, such as The value that the present has interpolation point to obtain end to end has 2 equations.Other two equation uses the continuous condition of its second dervative Calculate its second dervative end to end.Its second dervative is indicated with M1, M2 below.
Wherein
hi=ai+1-ai
μi=1- λi
What is solved can be obtained by its ten lines in the derivative value three times of interpolation point plus M0 and M9=0 to after M.Then A, b, c, d can be solved by four equation solutions, four unknown numbers.
Seek matrix:
A, b, c, d can be solved.Obtain its fit curve equation.
Proper calibration point group is selected by match value error;
Q value is first found out,(For match value, Y is true value), if it is desired to the curve of fitting It is bonded actual curve, then Q value is the smaller the better.Calibration point group best in this calibration point group is first recorded, can finally be taken turns most 200 Best calibration point group is chosen in good calibration point group.Therefore it chooses valuation functions and isWhen Q value is smaller, assessment score is got over Then height combines its valuation functions value, by shaking the elbows, (range is the sum of all assessed values) selects 100 outstanding calibration points Base calibration point group of the group as calibration point optimizing next time.Due to the high individual of score in assessment more easily quilt when shaking the elbows It chooses, so relatively good calibration point can all be selected every time by choosing.Combined valuation functions value line segment is as shown in Figure 2.
Due to step 2 and step 3 or the calibration point having had in individual can be generated, so first being sentenced before selection It is disconnected, if there is identical gene then indirect assignment one very big Q value, keeps its scoring very low as punishment, selecting it When be eliminated.
The optimal calibration point group of epicycle is added directly into the optimizing of next round by selection, is rewarded the most.
5, step 2 is repeated to step 4, and repeating 200 wheels terminates;
6, the 200 classic calibration point groups of wheel recorded are chosen, one group of best calibration point is searched out among this, As extremely excellent calibration point group.
Fig. 3, Fig. 4 is search out to obtain the figure that is fitted of extremely excellent calibration point by this algorithm:
Fig. 3 is the curve graph obtained by Newton interpolating method:
Fig. 4 is the curve graph obtained by cubic spline interpolation:
By Fig. 3, Fig. 4, it is seen that fitting effect is splendid, compares the complexity of traversal and this algorithm:
Traversal:
This algorithm:100 × 200=2 × 104
It can be seen that this algorithm has big advantage, it is highly suitable for daily production.
It is a specific embodiment of the invention described in above instructions, various illustrations are not to reality of the invention The limitation of matter Composition of contents, person of an ordinary skill in the technical field can be to described in the past specific after having read specification Embodiment is made an amendment or is deformed, without departing from the spirit and scope of invention.

Claims (5)

1. a kind of algorithm for finding extremely excellent calibration point, it is characterised in that include the following steps:
1) test data for obtaining the calibration of one group of needs, determines curve matching mode;
2) it chooses a batch and organizes initial calibration point group:Calibration point composition is randomly selected in test data by way of shaking the elbows One calibration point group continuously selects 200 calibration point groups;
3) outstanding calibration point transposition:Traverse each calibration point group and shake the elbows, if obtain value less than 0.9 if mark; How many a calibration points are exchanged in the decision that shakes the elbows again when having multiple calibration point groups labeled, are finally selected by way of shaking the elbows again It selects and which calibration point is exchanged;
4) some calibration points are incorporated at random:Traverse each calibration point group again and shake the elbows, if obtained value is less than 0.3 after Which calibration point the continuous decision that shakes the elbows needs to replace, and the decision that finally shakes the elbows again is substituted for which of all calibration points Calibration point;
5) to every group of calibration point surface fitting, Q value is calculated;Then valuation functions are used to Q value:Scoring is calculated, it will The highest calibration point group that scores records the range as last optimizing;
6) combined evaluation functional value chooses excellent calibration point group with the mode to shake the elbows and continues next round search;
7) step 3) is repeated to step 6);
8) the smallest calibration point group of a Q value is found again in all optimal calibration point groups as last extremely excellent calibration point.
2. a kind of algorithm for finding extremely excellent calibration point as described in claim 1, it is characterised in that:Curve in the step 1) Fit approach includes Newton interpolating method or cubic spline interpolation.
3. a kind of algorithm for finding extremely excellent calibration point as described in claim 1, it is characterised in that:In the step 2), one If having chosen identical calibration point in a calibration point group, chosen until there is no to repeat calibration point again.
4. a kind of algorithm for finding extremely excellent calibration point as described in claim 1, it is characterised in that:In the step 5),WhereinFor match value, Y is true value.
5. a kind of algorithm for finding extremely excellent calibration point as described in claim 1, it is characterised in that:In the step 6), when having When same calibration point, this group of calibration point group scoring changes low be used as and punishes, while upper one group optimal calibration point group being directly entered Next round optimizing is as reward.
CN201810396374.8A 2018-04-28 2018-04-28 Algorithm for searching excellent calibration points Active CN108871406B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810396374.8A CN108871406B (en) 2018-04-28 2018-04-28 Algorithm for searching excellent calibration points

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810396374.8A CN108871406B (en) 2018-04-28 2018-04-28 Algorithm for searching excellent calibration points

Publications (2)

Publication Number Publication Date
CN108871406A true CN108871406A (en) 2018-11-23
CN108871406B CN108871406B (en) 2021-05-25

Family

ID=64327216

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810396374.8A Active CN108871406B (en) 2018-04-28 2018-04-28 Algorithm for searching excellent calibration points

Country Status (1)

Country Link
CN (1) CN108871406B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022000756A1 (en) * 2020-06-29 2022-01-06 济南浪潮高新科技投资发展有限公司 Method for automatically calibrating superconducting quantum chip parameters and related components

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1442704A (en) * 2002-03-05 2003-09-17 特克特朗尼克公司 Improved calibration of vector network analyzer
RU2262713C2 (en) * 2002-01-28 2005-10-20 Чекушкин Всеволод Викторович Method for calibration of measuring systems
CN102025430A (en) * 2010-11-19 2011-04-20 中兴通讯股份有限公司 Closed loop-based automatic calibration method and equipment
CN103543426A (en) * 2013-10-28 2014-01-29 中国电子科技集团公司第四十一研究所 Interpolating compensation method for each-band calibration of network analyzer
CN106840240A (en) * 2016-12-27 2017-06-13 江苏省无线电科学研究所有限公司 Suitable for the two-dimensional linear modification method of digital sensor

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2262713C2 (en) * 2002-01-28 2005-10-20 Чекушкин Всеволод Викторович Method for calibration of measuring systems
CN1442704A (en) * 2002-03-05 2003-09-17 特克特朗尼克公司 Improved calibration of vector network analyzer
CN102025430A (en) * 2010-11-19 2011-04-20 中兴通讯股份有限公司 Closed loop-based automatic calibration method and equipment
CN103543426A (en) * 2013-10-28 2014-01-29 中国电子科技集团公司第四十一研究所 Interpolating compensation method for each-band calibration of network analyzer
CN106840240A (en) * 2016-12-27 2017-06-13 江苏省无线电科学研究所有限公司 Suitable for the two-dimensional linear modification method of digital sensor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022000756A1 (en) * 2020-06-29 2022-01-06 济南浪潮高新科技投资发展有限公司 Method for automatically calibrating superconducting quantum chip parameters and related components

Also Published As

Publication number Publication date
CN108871406B (en) 2021-05-25

Similar Documents

Publication Publication Date Title
CN104166731B (en) A kind of overlapping community discovery system and method for social networks
US6631509B2 (en) Computer aided design apparatus for aiding design of a printed wiring board to effectively reduce noise
CN108256699A (en) Graduation whereabouts Forecasting Methodology and system based on college student stereo data
CN115830030B (en) Appearance quality assessment method and system for quartz wafer
CN108510204A (en) Methods of marking, device and electric terminal
US6920451B2 (en) Method for the manipulation, storage, modeling, visualization and quantification of datasets
CN108871406A (en) A kind of algorithm for finding extremely excellent calibration point
US20040230453A1 (en) Method for measuring contract quality/risk
CN111739599B (en) Teaching medical record generation method and device
CN109885929A (en) Automatic Pilot decision rule data reproducing method and device
CN111008916A (en) Knowledge point grasp inference method, knowledge point grasp inference system, computer device, and storage medium
CN108171756A (en) Self-adapting calibration method, apparatus and terminal
Mian et al. Application of the sampling strategies in the inspection process
CN109615204A (en) Method for evaluating quality, device, equipment and the readable storage medium storing program for executing of medical data
McGarry et al. Evaluation of a contemporary CAD/CAM system
Doreian On the ranking of psychological journals
CN113537717B (en) Test paper analysis method and device, electronic equipment and storage medium
CN112446561A (en) Advertisement design drawing quality detection method and device
CN108920667B (en) Logging data organization display method based on test depth and test time
CN115656632A (en) Curve scanning track tracing and comparing algorithm suitable for impedance analyzer
CN108694998A (en) The methods of exhibiting and device of medical score data
CN117611263A (en) Method for constructing blood glucose meter selection recommendation system, decision method and device thereof
CN116500070A (en) Improved method for calculating quartz crystallinity index by X-ray diffraction method and application
Johnson Basic 3-P sampling
Spiroglou et al. SMART Swings-Systematic Market Structure

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant