CN108871204B - Absolute evaluation method for length measurement relative error in photogrammetry - Google Patents

Absolute evaluation method for length measurement relative error in photogrammetry Download PDF

Info

Publication number
CN108871204B
CN108871204B CN201810816713.3A CN201810816713A CN108871204B CN 108871204 B CN108871204 B CN 108871204B CN 201810816713 A CN201810816713 A CN 201810816713A CN 108871204 B CN108871204 B CN 108871204B
Authority
CN
China
Prior art keywords
measurement
length
scale
relative error
ruler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201810816713.3A
Other languages
Chinese (zh)
Other versions
CN108871204A (en
Inventor
孙鹏
董明利
吕乃光
王君
燕必希
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Information Science and Technology University
Original Assignee
Beijing Information Science and Technology University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Information Science and Technology University filed Critical Beijing Information Science and Technology University
Priority to CN201810816713.3A priority Critical patent/CN108871204B/en
Publication of CN108871204A publication Critical patent/CN108871204A/en
Application granted granted Critical
Publication of CN108871204B publication Critical patent/CN108871204B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention provides an absolute evaluation method of length measurement relative error in photogrammetry, which comprises the following steps: a) establishing a measuring field, wherein the measuring field comprises a reflecting point and a background; b) calibrating a reference ruler; c) arranging the reference ruler in the measuring field and keeping the reference ruler stable in the same posture; d) moving the reference scale in a first mode and adjusting the posture of the reference scale in a measuring field, and taking pictures of the reference scale in a second mode; e) acquiring global adjustment measurement network pictures of the reference scale at different positions and different postures; f) acquiring a three-dimensional coordinate of a space point through the global adjustment measurement network picture; g) identifying the reference scales at different positions, and calculating the length of each position reference scale; h) solving for the average length of the scale
Figure DDA0001740493170000011
And uncertainty u (S)i) (ii) a i) Average length through the scale
Figure DDA0001740493170000012
And uncertainty u (S)i) Calculating a quality parameter B of a relative error of the length measurement; j) and obtaining whether the checking and measuring instrument is qualified.

Description

Absolute evaluation method for length measurement relative error in photogrammetry
The invention relates to a divisional application of an absolute evaluation method of length measurement relative errors in photogrammetry, wherein the application date is 2016, 05 and 06 days, and the application number is 201610297146.6.
Technical Field
The invention relates to an absolute evaluation method for measuring relative errors, in particular to laboratory evaluation for measuring precision of a close-range photogrammetric system.
Background
Photogrammetry techniques have long been recognized as a measurement technique and means with high accuracy, non-contact, low cost, and high efficiency. Any measuring instrument needs to make the measurement uncertainty clear, has reliable and objective precision evaluation data, and a user selects a proper measuring means and a proper measuring instrument according to the measurement precision requirement.
Such evaluation criteria and means have not been available for a long time after the advent of photogrammetry technology, and manufacturers and researchers have attempted to evaluate and describe the accuracy of photogrammetry in various ways, mainly using the following:
1. and (4) image plane precision. In the method, adjustment quality is described through image point coordinate residual error statistics in a light beam adjustment conclusion, and measurement precision is quantitatively described;
2. and estimating the spatial coordinate error. The index is a byproduct of adjustment theory and technology, and after the adjustment process is finished, the error of the parameter to be solved is estimated through a random error transfer model.
The two precision evaluation methods are essentially the same, but the second method carries out error propagation analysis on the statistical result of the image plane precision. The two models are mechanical error transfer models from an image plane to space, are relative accuracy indexes depending on a camera model, and do not represent space absolute measurement accuracy. Different imaging models often bring the same accuracy index, so that the internal accuracy of self-calibration light beam adjustment cannot reflect the measurement accuracy of an object space, the error level of space length measurement is often underestimated by the estimation of the root mean square error of object space coordinates with smaller numerical values, and sometimes the difference is one order of magnitude.
Disclosure of Invention
In order to solve the above technical problem, the present invention provides an absolute evaluation method for a relative error of length measurement in photogrammetry, comprising the steps of:
a) establishing a measuring field, wherein the measuring field comprises a reflecting point and a background;
b) calibrating a reference ruler;
c) arranging the reference ruler in the measuring field and keeping the reference ruler stable in the same posture;
d) moving the reference scale in a first mode and adjusting the posture of the reference scale in a measuring field, and taking pictures of the reference scale in a second mode;
e) acquiring global adjustment measurement network pictures of the reference scale at different positions and different postures;
f) acquiring a three-dimensional coordinate of a space point through the global adjustment measurement network picture;
g) identifying the reference scales at different positions, and calculating the length of each position reference scale;
h) solving for the average length S and uncertainty u (S) of the scalei)；
i) Average length S and uncertainty u (S) through the scalei) Calculating a quality parameter B of a relative error of the length measurement;
j) and obtaining whether the checking and measuring instrument is qualified.
Preferably, the reflective dots in the step a are set to at least include coded reflective dots and also include common reflective dots, wherein the number of the reflective dots is at least 40.
Preferably, the method for calibrating the reference scale in step b is to fix the common return light spot at two ends of the reference scale, and calibrate the length of the reference scale.
Preferably, the first mode of step d is: the normal direction of the coding point is parallel to the intersecting angle bisector of the camera optical axis, and the reference ruler covers the volume space of the measured object and has change in the depth direction.
Preferably, the second mode of step d is:
d1) uniformly dividing a measurement field, wherein the measurement field at least comprises 15 nodes for dividing a space;
d2) moving the reference ruler to a certain node position;
d3) at each node position, rotating the reference scale, and keeping the current posture for a short time when the reference scale has 0 degrees, 45 degrees, 90 degrees and 135 degrees with the horizontal direction;
d4) controlling a camera to shoot a reference scale image;
d5) and d3 and d4 are repeated, all the nodes are traversed, and the global adjustment measurement network pictures of the reference ruler at different positions and different postures are obtained.
Preferably, the step d5) repeats the steps d3 and d4 at least 60 times to traverse all spatial node positions.
Preferably, the at least 15 different position points are arranged in such a way that the two most edge positions where the industrial camera is located are at an angle of at least 90 ° with respect to the center of the measurement field.
Preferably, said uncertainty u (S) is calculated in said step h)i) The method comprises the following steps:
h 1: and scaling all the reconstructed reference lengths by taking the ratio of the calibration length to the average length as a scaling factor, wherein after scaling, each measurement length is respectively as follows:
ksS1ksS2… ksSn
solving the corresponding length measurement relative error delta r through the lengths of the different position reference scalesi
Figure BDA0001740493150000031
Wherein, Delta SiFor the reconstructed errors of the n position scale lengths,
Figure BDA0001740493150000032
h 2: obtaining the relative error mean value
Figure BDA0001740493150000033
Figure 2
h3 obtaining uncertainty u (S) of relative errori)
Figure BDA0001740493150000035
Preferably, the method for calculating the quality parameter B in step i) is as follows:
B＝k·u(Δri)
wherein the quality parameter B is defined as an extension uncertainty of a length measurement relative error; k is a scaling factor.
Preferably, the criterion for checking whether the measuring instrument is qualified in the step j) is that the quality parameter B is smaller than a measurement extreme value, and the measurement extreme value is calculated by the method
E＝A+K·L
Where A and K are constants and L is the length to be measured.
Preferably, step b1 is further included after step b: and designing the shot station and network planning so that shot pictures at different positions of the reference ruler have good network distribution, and the whole station of the measured pictures at all positions of the reference ruler is not repeated.
Preferably, the material of the scale is selected from carbon fiber or low expansion alloys.
Preferably, the scale is arranged to be fixed to a movable mechanism selected from a carriage or a robotic arm.
In summary, the present invention provides a method for evaluating a relative error in length measurement under the background condition that the technology in the field of measuring the reference length dedicated for photogrammetry in China lags behind, and the technology does not depend on the measurement precision of the reference length, and can be regarded that the length sample has no measurement error. The relative error of the length measurement and the uncertainty thereof obtained under the evaluation system have absolute significance.
The invention mainly realizes the following technical effects:
1. establishing a static photographic measuring instrument evaluation system;
2. determining quality parameters of the instrument under the evaluation system;
3. the implementation flow of the evaluation system or method.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a flow chart of the steps of a method for absolute evaluation of the relative error of length measurements in photogrammetry according to the present invention;
FIG. 2a is an experimental measurement field for verifying the absolute evaluation method of the relative error of length measurement in photogrammetry according to the present invention;
FIG. 2b is a scale bar in an experimental measurement field of the absolute evaluation method of relative error of length measurement in photogrammetry according to the present invention;
FIG. 3a is a schematic diagram of a method for camera shooting;
fig. 3b is a schematic view of the extreme position of the industrial camera in the measurement field.
Detailed Description
The objects and functions of the present invention and methods for accomplishing the same will be apparent by reference to the exemplary embodiments. However, the present invention is not limited to the exemplary embodiments disclosed below, and may be implemented in various forms. The nature of the description is merely to assist those skilled in the relevant art in a comprehensive understanding of the specific details of the invention.
Photogrammetry techniques have long been recognized as a measurement technique and means with high accuracy, non-contact, low cost, and high efficiency. Any measuring instrument needs to make the measurement uncertainty clear, has reliable and objective precision evaluation data, and a user selects a proper measuring means and a proper measuring instrument according to the measurement precision requirement. Such evaluation criteria and means do not appear for a long time after the advent of photogrammetric techniques.
The invention provides a method for evaluating relative error of length measurement, which aims at the background condition that the technology of the technical field of the special reference length measurement for photogrammetry in China lags behind. The relative error of the length measurement and the uncertainty thereof obtained under the evaluation system have absolute significance. The absolute evaluation method for the length measurement relative error in photogrammetry mainly comprises the following steps: establishing a static photographic measuring instrument evaluation system; determining quality parameters of the instrument under the evaluation system; the method implementation flow of the evaluation system is established.
As shown in fig. 1, there is provided an absolute evaluation method of a relative error of a length measurement in photogrammetry according to the present invention, comprising the steps of:
step 101: establishing a measuring field;
as shown in fig. 2a, the measurement field in step 101 includes a light reflection point 201 and a background 202;
according to an embodiment of the present invention, the reflective dots 201 in step 101 are set to include at least encoded reflective dots 201a and common reflective dots 201b, wherein the number of the reflective dots 201 is at least 40.
Step 102: calibrating the reference scale, as shown in FIG. 2 b;
according to an embodiment of the present invention, the method for calibrating the reference scale in step 102 is to fix the normal return light spot 201b at two ends of the reference scale 203, and calibrate the length of the reference scale.
According to an embodiment of the present invention, the step 102 further includes a step b 1: and designing the shot station and network planning so that shot pictures at different positions of the reference ruler have good network distribution, and the whole station of the measured pictures at all positions of the reference ruler is not repeated.
Step 103: arranging the reference ruler in the measuring field and keeping the reference ruler stable in the same posture;
step 104: moving the reference scale in a first mode and adjusting the posture of the reference scale in a measuring field, and taking pictures of the reference scale in a second mode;
according to an embodiment of the present invention, the first way of the step 104 is: the normal direction of the coding point is parallel to the intersecting angle bisector of the camera optical axis, and the reference ruler covers the volume space of the measured object and has change in the depth direction.
For example, at least 15 different positions, the measuring field is photographed by a industrial camera in the horizontal direction and the vertical direction, respectively, as shown in fig. 3a, the measuring field 301 is photographed by a camera at the same position in the horizontal direction 302b and the vertical direction 302a, respectively.
According to an embodiment of the present invention, the at least 15 different position points are arranged in such a way that the two positions at the edge of the industrial camera are at an angle of at least 90 ° with respect to the center of the measurement field, as shown in fig. 3b, which is a schematic diagram of the extreme positions of the industrial camera in the measurement field, and the angle 304 between the camera 302 and the camera 303 at the two positions at the edge of the industrial camera is at least 90 ° with respect to the center of the measurement field 301.
According to an embodiment of the present invention, the second way of the step 104 is: d1) uniformly dividing a measurement field, wherein the measurement field at least comprises 15 nodes for dividing a space; d2) moving the reference ruler to a certain node position; d3) at each node position, rotating the reference scale, and keeping the current posture when the reference scale has 0 degrees, 45 degrees, 90 degrees and 135 degrees with the horizontal direction; d4) controlling a camera to shoot a reference scale image; d5) and d3) and d4) are repeated, all the nodes are traversed, and the global adjustment measurement network pictures of the reference ruler at different positions and different postures are obtained. Wherein the steps d3) and d4) are repeated at least 60 times in the step d5) to traverse all spatial node positions. Step 105: acquiring global adjustment measurement network pictures of the reference scale at different positions and different postures;
step 106: acquiring a three-dimensional coordinate of a space point through the global adjustment measurement network picture;
step 107: identifying the reference scales at different positions, and calculating the length of each position reference scale;
step 108: solving for the average length S and uncertainty u (S) of the scalei)；
According to one embodiment of the invention, said uncertainty u (S) is calculated in said step h)i) The method comprises the following steps:
h 1: and scaling all the reconstructed reference lengths by taking the ratio of the calibration length to the average length as a scaling factor, wherein after scaling, each measurement length is respectively as follows:
ksS1ksS2… ksSn
solving the corresponding length measurement relative error delta r through the lengths of the different position reference scalesi
Figure BDA0001740493150000071
Wherein, Delta SiFor calibration errors of the scale at n positions,
Figure 1
wherein, the length true value of the reference scale is assumed to be S0The calibration error of the reference scale is Δ S, and the calibrated reference length is as follows:
S＝S0+ΔS
in the same precision evaluation experiment, the length measurement results of the reference scale at n positions are respectively as follows: s1S2… Sn
The average of the length measurements is:
Figure BDA0001740493150000073
the ratio of the calibration length to the average length is used as a scaling factor:
Figure BDA0001740493150000074
after scaling, the measurement lengths are respectively:
ksS1ksS2… ksSn
it can be seen that the length measurement is evaluated directly, the results obtained are all related to the calibration error Δ S, and the uncertainty of the measurement results will be affected by the calibration uncertainty.
The relative error of the length measurement is solved by the following equation:
Figure BDA0001740493150000075
it can be seen that the relative error of the length measurement is independent of the calibration error Δ S and regresses to a relative error analysis of the direct measurement (not scaled).
h 2: obtaining the relative error mean value
Figure BDA0001740493150000076
Figure BDA0001740493150000081
h3 obtaining uncertainty u (S) of relative errori)
Figure BDA0001740493150000082
It can be seen that in the evaluation method described in the present invention, the relative error uncertainty is independent of the calibration error Δ S, and its analysis is regressed to an uncertainty analysis of the direct measurement (not scaled), which is equal to the ratio of the length measurement uncertainty to the average length.
Step 109: average length S and uncertainty u (S) through the scalei) Calculating a quality parameter B of a relative error of the length measurement;
according to an embodiment of the present invention, the method for calculating the quality parameter B in step 109 is:
Figure BDA0001740493150000083
wherein the quality parameter B is defined as an extension uncertainty of a length measurement relative error; k is a scaling factor.
Step 110: and obtaining the result of whether the measuring instrument to be checked is qualified.
According to an embodiment of the present invention, the criterion for checking whether the measuring instrument is qualified in step i) is whether the product of the quality parameters B and L is smaller than a measurement extreme value, and the measurement extreme value is calculated by:
E＝A+K·L
where A and K are constants and L is the length to be measured.
If the evaluation experiment for an instrument indicates that the extended uncertainty is less than the measurement limit, the instrument is qualified; conversely, if the extended uncertainty is greater than the measurement limit, the instrument is rejected.
According to one embodiment of the invention, the material of the scale is selected from carbon fiber or low expansion alloys.
According to one embodiment of the invention, the scale is arranged to be fixed to a movable mechanism selected from a carriage or a robotic arm.
The technical effect of the method according to the invention is illustrated below by means of specific experiments.
The effectiveness of the absolute evaluation method for the relative error of the length measurement in photogrammetry according to the present invention is verified by specific experiments using the method according to the present invention described above. Experimental conditions were as follows, and the experiment was carried out in an established measurement field of 3.2 m by 2.4 m, as shown in fig. 2, which is a photogrammetric field experimental plot of the experiment. Before the evaluation method is used, an experimental field is measured through a field-independent distortion parameter model and a field-related distortion parameter model respectively, and coordinate precision estimation RMSE given by beam adjustment is further analyzed to be unreliable. Finally, as comparison, the method of the invention is applied to test the measurement field, and the quality evaluation of the two methods which are consistent with the theory is given.
In the experiment, an AVT GE4900 industrial camera is adopted, and a 35mm Nikon fixed-focus lens and a commercial flash lamp are matched to shoot 174 pictures in a measurement field. And obtaining the identical image plane observation coordinates by using the same image processing software. The data are processed by adjustment software of two different models, and the obtained image plane error and space coordinate estimation are shown in tables 1 and 2.
TABLE 1 statistical results of beam adjustment of field correlation model (unit: mm)
Figure BDA0001740493150000091
TABLE 2 field-independent distortion model Beam adjustment statistical results (unit: mm)
Figure BDA0001740493150000092
Figure BDA0001740493150000101
It can be seen that the two models are very similar in the two indexes of image plane error and space coordinate average uncertainty, but the maximum and standard uncertainties have obvious changes, and the conclusion given by such evaluation is that compared with the model independent of object distance, the distortion model related to object distance has low precision, which is a result of paradoxical analysis.
Therefore, for comparison, the method for absolutely evaluating the relative error of length measurement in photogrammetry according to the present invention performs an experiment on a measurement field, and comprises the steps of:
a) establishing a measuring field, wherein the measuring field comprises a reflecting point and a background;
b) calibrating the length of a reference ruler;
c) arranging the reference ruler in the measuring field and keeping the reference ruler stable in the same posture;
d) moving the reference scale in a first mode and adjusting the posture of the reference scale in a measuring field, and taking pictures of the reference scale in a second mode;
e) acquiring global adjustment measurement network pictures of the reference scale at different positions and different postures;
f) acquiring a three-dimensional coordinate of a space point through the global adjustment measurement network picture;
g) identifying the reference scales at different positions, and calculating the length of each position reference scale;
h) solving for the average length S and uncertainty u (S) of the scalei)；
i) Average length S and uncertainty u (S) through the scalei) Calculating a quality parameter B of a relative error of the length measurement;
j) and obtaining whether the checking and measuring instrument is qualified.
TABLE 3 Length measurement result (unit: mm) when the judgment standard for gross error in image plane is 1um
Figure BDA0001740493150000102
Figure BDA0001740493150000111
TABLE 4 Length measurement result (unit: mm) when the judgment criterion for gross error in image plane is 0.6um
Figure BDA0001740493150000112
Figure BDA0001740493150000121
It can be seen that in the multi-station static photogrammetry, no matter what gross error judgment standard, the field-dependent non-focusing distortion model is obviously superior to the traditional object distance-independent distortion model in terms of the quality parameters of the length-relative measurement. The conclusion of imaging model theoretical analysis is verified from experimental data, and the evaluation system and the process in the research are also proved to be effective and accurate.
The above description is only exemplary of the invention and should not be taken as limiting the scope of the invention, which is intended to include all equivalent variations or modifications of the structure, features and principles of the invention as described in the claims.

Claims (5)

1. An absolute evaluation method for the relative error of length measurement in photogrammetry comprises the following steps:
a) establishing a measuring field, wherein the measuring field comprises reflecting points and a background, the reflecting points at least comprise coded reflecting points and common reflecting points, and the number of the reflecting points is at least 40;
b) calibrating a reference ruler, wherein the method for calibrating the reference ruler is to fix the common reflection points at two ends of the reference ruler and calibrate the length of the reference ruler;
c) arranging the reference ruler in the measuring field and keeping the reference ruler stable in the same posture;
d) in a measurement field, moving the reference scale in a first mode, adjusting the posture of the reference scale, and taking pictures of the reference scale in a second mode, wherein the first mode is as follows: the normal direction of the coded light reflecting points is parallel to an intersecting angle bisector of the camera optical axis, and the reference ruler covers the volume space of the measured object and has change in the depth direction;
e) acquiring global adjustment measurement network pictures of the reference scale at different positions and different postures;
f) acquiring a three-dimensional coordinate of a space point through the global adjustment measurement network picture;
g) identifying the reference scales at different positions, and calculating the length of each position reference scale;
h) solving for the average length of the scale
Figure FDA0002263745660000011
And uncertainty u (S)i)；
i) Average length through the scale
Figure FDA0002263745660000012
And uncertainty u (S)i) ComputingQuality parameter B of length measurement relative error:
Figure FDA0002263745660000013
wherein the quality parameter B is defined as an extension uncertainty of a length measurement relative error; k is a scale factor, Δ riMeasuring a relative error for the length;
j) and obtaining whether the checking and measuring instrument is qualified.
2. The absolute evaluation method of the relative error of the length measurement in the photogrammetry according to claim 1, characterized in that: the second mode of the step d is as follows:
d1) uniformly dividing a measurement field, wherein the measurement field at least comprises 15 nodes for dividing a space;
d2) moving the reference ruler to a certain node position;
d3) at each node position, rotating the reference scale, and keeping the current posture when the reference scale has 0 degrees, 45 degrees, 90 degrees and 135 degrees with the horizontal direction;
d4) controlling a camera to shoot a reference scale image;
d5) and d3 and d4 are repeated, all the nodes are traversed, and the global adjustment measurement network pictures of the reference ruler at different positions and different postures are obtained.
3. The absolute evaluation method of the relative error of the length measurement in the photogrammetry according to claim 2, characterized in that: the step d5) is repeated at least 60 times with steps d3 and d4 to traverse all spatial node positions.
4. The absolute evaluation method of the relative error of the length measurement in the photogrammetry according to claim 2, characterized in that: the at least 15 nodes for dividing the space are arranged in a way that two positions at the extreme edges of the camera are at an angle of at least 90 DEG relative to the center of the measurement field.
5. The absolute evaluation method of the relative error of the length measurement in the photogrammetry according to claim 1, characterized in that: the measurement standard for checking whether the measuring instrument is qualified in the step j) is whether the product of the quality parameters B and L is smaller than a measurement extreme value of the instrument, and the expression method of the measurement extreme value of the instrument is
E＝A+K·L
Where A and K are constants and L is the length to be measured.
CN201810816713.3A 2016-05-06 2016-05-06 Absolute evaluation method for length measurement relative error in photogrammetry Active CN108871204B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810816713.3A CN108871204B (en) 2016-05-06 2016-05-06 Absolute evaluation method for length measurement relative error in photogrammetry

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610297146.6A CN105783733B (en) 2016-05-06 2016-05-06 The absolute evaluation method of photogrammetric middle linear measure longimetry relative error
CN201810816713.3A CN108871204B (en) 2016-05-06 2016-05-06 Absolute evaluation method for length measurement relative error in photogrammetry

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201610297146.6A Division CN105783733B (en) 2016-05-06 2016-05-06 The absolute evaluation method of photogrammetric middle linear measure longimetry relative error

Publications (2)

Publication Number Publication Date
CN108871204A CN108871204A (en) 2018-11-23
CN108871204B true CN108871204B (en) 2020-04-21

Family

ID=56401721

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201610297146.6A Active CN105783733B (en) 2016-05-06 2016-05-06 The absolute evaluation method of photogrammetric middle linear measure longimetry relative error
CN201810816713.3A Active CN108871204B (en) 2016-05-06 2016-05-06 Absolute evaluation method for length measurement relative error in photogrammetry

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201610297146.6A Active CN105783733B (en) 2016-05-06 2016-05-06 The absolute evaluation method of photogrammetric middle linear measure longimetry relative error

Country Status (1)

Country Link
CN (2) CN105783733B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106595716B (en) * 2017-01-09 2019-05-24 哈尔滨工业大学 The photogrammetric calibration standard ruler fixture in large space type face
CN109520477B (en) * 2018-10-30 2021-01-26 成都飞机工业（集团）有限责任公司 High-precision scale factor measuring method based on two-dimensional photography

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005017286A (en) * 2003-06-06 2005-01-20 Mitsubishi Electric Corp Method and system for camera calibration
CN101694370A (en) * 2009-09-15 2010-04-14 北京信息科技大学 Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device
CN102889882A (en) * 2012-09-03 2013-01-23 北京信息科技大学 Three-dimensional reconstruction method based on bundle adjustment
CN103389072A (en) * 2013-07-22 2013-11-13 北京信息科技大学 An image point positioning precision assessment method based on straight line fitting
CN104036542A (en) * 2014-05-21 2014-09-10 北京信息科技大学 Spatial light clustering-based image surface feature point matching method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6110708A (en) * 1984-06-25 1986-01-18 Kawasaki Steel Corp Size measuring device using measuring camera
CN101644563B (en) * 2009-08-18 2010-12-08 北京信息科技大学 Vision measuring system uncertainty evaluation method based on distance restraint fit point

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005017286A (en) * 2003-06-06 2005-01-20 Mitsubishi Electric Corp Method and system for camera calibration
CN101694370A (en) * 2009-09-15 2010-04-14 北京信息科技大学 Method for evaluating precision of large-scale industrial photogrammetry system and benchmark device
CN102889882A (en) * 2012-09-03 2013-01-23 北京信息科技大学 Three-dimensional reconstruction method based on bundle adjustment
CN103389072A (en) * 2013-07-22 2013-11-13 北京信息科技大学 An image point positioning precision assessment method based on straight line fitting
CN104036542A (en) * 2014-05-21 2014-09-10 北京信息科技大学 Spatial light clustering-based image surface feature point matching method

Also Published As

Publication number Publication date
CN108871204A (en) 2018-11-23
CN105783733A (en) 2016-07-20
CN105783733B (en) 2018-08-17

Similar Documents

Publication Publication Date Title
US20210041236A1 (en) Method and system for calibration of structural parameters and construction of affine coordinate system of vision measurement system
Colosimo et al. Multisensor data fusion via Gaussian process models for dimensional and geometric verification
CN106959075B (en) Method and system for accurate measurement using a depth camera
Fraser et al. Metric exploitation of still video imagery
CN108801218B (en) High-precision orientation and orientation precision evaluation method of large-size dynamic photogrammetry system
Toschi et al. On the evaluation of photogrammetric methods for dense 3D surface reconstruction in a metrological context
CN108871204B (en) Absolute evaluation method for length measurement relative error in photogrammetry
US20020033885A1 (en) Method and apparatus for the determination of the contour of sheet metal blanks
CN113916128A (en) Method for improving precision based on optical pen type vision measurement system
CN112116665B (en) Structural light sensor calibration method
CN113822920A (en) Method for acquiring depth information by structured light camera, electronic equipment and storage medium
González-Aguilera et al. Accuracy assessment of vehicles surface area measurement by means of statistical methods
CN116294993A (en) Coordinate measuring system
CN116359615A (en) Collimation device and method in planar near field measurement
Long et al. Portable visual metrology without traditional self-calibration measurement model
Tagoe et al. Determination of the Interior Orientation Parameters of a Non-metric Digital Camera for Terrestrial Photogrammetric Applications
CN105528788B (en) Scaling method, device and the device for determining 3D shape of relative pose parameter
Yuan et al. Laboratory geometric calibration of non-metric digital camera
CN114170321A (en) Camera self-calibration method and system based on distance measurement
CN109520477B (en) High-precision scale factor measuring method based on two-dimensional photography
CN110044349B (en) Sphere positioning method based on theodolite
Rofallski et al. An efficient solution to ray tracing problems for hemispherical refractive interfaces
Haig et al. Lens inclination due to instable fixings detected and verified with VDI/VDE 2634 Part 1
El-Hakim Application and performance evaluation of a vision-based automated measurement system
Shortis et al. Extended lens model calibration of digital still cameras

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant