CN1088355A - The electron gun of dynamic focusing - Google Patents
The electron gun of dynamic focusing Download PDFInfo
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- CN1088355A CN1088355A CN93114799A CN93114799A CN1088355A CN 1088355 A CN1088355 A CN 1088355A CN 93114799 A CN93114799 A CN 93114799A CN 93114799 A CN93114799 A CN 93114799A CN 1088355 A CN1088355 A CN 1088355A
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- China
- Prior art keywords
- voltage
- dynamic
- electron beam
- focus voltage
- phosphor screen
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/50—Electron guns two or more guns in a single vacuum space, e.g. for plural-ray tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/51—Arrangements for controlling convergence of a plurality of beams by means of electric field only
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/16—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by deflecting electron beam in cathode-ray tube, e.g. scanning corrections
- H04N3/26—Modifications of scanning arrangements to improve focusing
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Details Of Television Scanning (AREA)
Abstract
In dynamic focusing electron gun, horizontal dynamic focusing voltage changes according to the position that electron beam on the phosphor screen arrives, and the peak-to-peak value of the horizontal dynamic focusing voltage in a horizontal deflection cycle in zone, fluoroscopic upper and lower is greater than this peak-to-peak value in phosphor screen central authorities, thereby obtains the electron-baem spot of homogeneous on whole phosphor screen.
Description
The present invention relates to be used for the dynamic focusing electron gun of color cathode ray tube (CRT).More specifically, the present invention relates on whole phosphor screen, to form the dynamic focusing electron gun of high resolution electron beam luminous point.
The resolution of color CRT depends on size and the shape that is formed on electron-baem spot on the phosphor screen.For obtaining high-resolution picture, electron-baem spot should be tried one's best the distortion of little and its shape should be as far as possible little.Yet, common color CRT has used so-called auto-convergence method and a deflecting coil, in the method, three-beam electron-beam is through the electrode at a final stage accelerating lens directive phosphor screen back side of electron gun, this deflecting coil can form a pincushion horizontal deflection magnetic field and a barrel-shaped vertical deflection magnetic field, is used as the device that makes the electron beam deflecting.By this structure, the deflection angle of electron beam of pointing to phosphor screen edge is relatively large, electron beam thereby passed inhomogenous vertical and horizontal deflection magnetic field.Thereby the electron beam that passes heterogeneity magnetic field focuses on deficiency in the horizontal direction and focuses on excessively in vertical direction, and the electron-baem spot that is formed by the electron beam that arrives phosphor screen edge is elongated by level thereby luminous point forms sizable ring of light on every side.Therefore this part image of phosphor screen edge formation is compared the distortion that has to a certain degree with the image that is formed on phosphor screen central authorities.
For avoiding the image distortion of above-mentioned edge, a kind of method has been proposed, come the dynamically focusing of controlling electron beam with dynamic electric field according to the phosphor screen zone in the method, so that on whole phosphor screen, form the luminous point of homogeneous.This method is used in a kind of so-called dynamic focusing electron gun, and its various improvement are at United States Patent (USP) the 4814670th, 4473775, and is open in 4771216 and No. 4731563.
With reference to Fig. 1, common dynamic focusing electron gun comprises negative electrode 2, the control utmost point 3 and anode 4, and they constitute three utmost points that are used for producing electron beam; Also comprise a static focus electrode 5a, dynamic focus electrode 5b and final stage accelerating electrode 6, they constitute a main lens system that is used to form static focus lens and dynamic focusing lens.
When the screen pressure of 200-1200 volt was added on the anode 4, the control utmost point 3 remained on 0 volt of current potential.Static focus voltage Vs and dynamic focus voltage Vd are added to respectively on static focus electrode 5a and the dynamic focus electrode 5b.The accelerating voltage Va of 20-35 kilovolt is added on the accelerating electrode 6.The waveform of dynamic focus voltage Vd is normally parabola shaped, and is synchronous with the defection signal that is added on the deflecting coil.Its crest voltage is higher than 600 to 800 volts of static focus voltage.The scope of static focus voltage Vs is the 20-35% of accelerating voltage Va.
The waveform that is added to the dynamic focus voltage on a kind of like this dynamic focusing electron gun usually as shown in Figure 2.Especially, the static focus voltage Vs that is added on the static focus electrode 5a maintains on the value that sets in advance.Thereby, be added on the dynamic focus electrode 5b parabola shaped dynamic focus voltage Vd by electron beam will land the phosphor screen zone and change, and be to repeat in the cycle (1H) with each horizontal deflection cycle.
The minimum voltage of each parabolic waveform of a horizontal deflection cycle may be higher than, be equal to or less than static focus voltage, and the central authorities that arrive arbitrary scan line with electron beam compare, when electron beam arrived the end of arbitrary scan line, this minimum voltage was higher relatively.This difference of minimum voltage changes in a vertical cycle (1V) regularly frame by frame.
The amplitude I of each horizontal deflection cycle of parabola shaped dynamic electric voltage is identical on whole phosphor screen, and irrelevant with the land zone of electron beam.The maximum of dynamic focus voltage and minimum value are to change in the cycle with a vertical cycle.In a horizontal deflection cycle, form a horizontal scanning line and in a vertical cycle, form many horizontal scanning lines, to form frame image data.
In the curve of Fig. 2, cover line V1 and V2 up and down corresponding to the variation of electron beam along the dynamic focus voltage peak value of fluoroscopic arbitrary vertical line land by what the line of parabolic waveform peak value (being respectively positive and negative values) formed.(at this, the peak value that covers line appears at the end points place of this line.) this is looked at as the virtual vertical dynamic focus voltage of a supposition.The contrast this point can be noticed vertically all to change on fluoroscopic both direction (vertical and horizontal direction) with the difference of static focus voltage with horizontal dynamic focusing voltage.Yet, the peak-to-peak value of fluoroscopic central part Vd in a horizontal deflection cycle 1H basically with fluoroscopic on or down the peak-to-peak value at position equate.Vertical dynamic focus voltage applies with a kind of like this form, promptly in vertical deflection in the cycle, and identical at the rate of change of the phosphor screen left and right sides and phosphor screen central part.Thereby the rate of change (showing the variation of vertical dynamic focus voltage Vd) that covers line V1 and V2 up and down equates.
Shown in Fig. 3 and Fig. 4 is the waveform of another kind of conventional dynamic focus voltage.
At first, with reference to Fig. 3, when the electron beam land in fluoroscopic when central authorities, the minimum value of dynamic focus voltage Vd is lower than static focus voltage Vs, and when the electron beam land in fluoroscopic last or than under the position time, the minimum value of dynamic focus voltage is higher relatively.
With reference to Fig. 4, when the electron beam land in fluoroscopic when central authorities, the minimum value of dynamic focus voltage Vd is substantially equal to static focus voltage Vs.When the electron beam land in fluoroscopic last or down during the position, the minimum value of dynamic focus voltage is higher relatively.
The amplitude that is added to the dynamic focus voltage on the conventional dynamic focusing electron gun keeps constant, and does not consider the land position of electron beam on phosphor screen.Yet, owing to change (phosphor screen is non-dome shape) to fluoroscopic distance with the land position from the launch point (from electron gun) of electron beam, and since electron beam because of deflecting coil by serious distortion, thereby can not on whole phosphor screen, obtain the electron-baem spot of homogeneous.Because the structural limitations of CRT, traditional apply voltage method and can not obtain high-quality picture with above-mentioned.
As shown in Figure 5, when the focusing of electron beam adapts to the left side of phosphor screen 100 and right hand edge promptly during the end at horizontal scanning line 110, the core that is positioned at the electron-baem spot of scan line 110 central authorities becomes big, greatly reduces the quality of the image that is formed on phosphor screen central authorities like this.In addition, as shown in Figure 6, when electron beam focuses on along the vertical line that passes phosphor screen central authorities, when promptly adapting to scan line 110 central, the electron-baem spot that is formed on horizontal scanning line 110 ends presents the bigger ring of light, thereby can not obtain high quality image on whole phosphor screen.
Thereby, the purpose of this invention is to provide a kind of dynamic focusing electron gun, it can on the whole phosphor screen equably focused beam so that on whole phosphor screen, obtain high-quality image.
For realizing this purpose of the present invention, the dynamic focusing electron gun that is provided comprises negative electrode, the control utmost point and anode, be used to produce electron beam, also comprise static focus electrode, dynamic focus electrode and final stage accelerating electrode, apply static focus voltage on the static focus electrode to form the main lens that quickens and assemble electron beam, apply dynamic focus voltage on the dynamic focus electrode, apply an accelerating anode voltage the highest on the final stage accelerating electrode, wherein dynamic focus voltage changes with the position that electron beam on the phosphor screen arrives, and so applied, promptly when electron beam scanning to fluoroscopic last and down during the position, the amplitude of dynamic focus voltage is the amplitude during to phosphor screen central authorities greater than electron beam scanning.
Behind its most preferred embodiment of the detailed description of accompanying drawing, above-mentioned purpose of the present invention and other advantage will become more apparent.In the accompanying drawings:
Fig. 1 is the profile of the signal of common dynamic focusing electron gun;
Fig. 2 is the dynamic focus voltage oscillogram that is applied on the conventional focused electron rifle;
Fig. 3 is another dynamic focus voltage oscillogram that is applied on the conventional focused electron rifle;
Fig. 4 is another dynamic focus voltage oscillogram that is applied on the conventional focused electron rifle;
Fig. 5 and Fig. 6 illustrate the distortion of scan line when adopting conventional dynamic focus voltage to apply method;
Fig. 7 is the perspective illustration according to dynamic focusing electron gun of the present invention;
Fig. 8 is the oscillogram that is applied to according to the present invention the dynamic focus voltage on the dynamic focusing electron gun;
Fig. 9 is the oscillogram that is applied to according to another dynamic focus voltage on the dynamic focusing electron gun of the present invention;
Figure 10 is the oscillogram that is applied to according to the another dynamic focus voltage on the dynamic focusing electron gun of the present invention;
Scan line on the phosphor screen that Figure 11 obtains when employing is shown according to dynamic focusing electron gun of the present invention.
With reference to Fig. 7, dynamic focusing electron gun 10 according to the present invention comprises the thermionic negative electrode 20 of emission successively; The control thermion is to form the control utmost point 30 and the anode 40 of electron beam; Static focus electrode 50a, dynamic focus electrode 50b and final stage accelerating electrode 60, electrode 50a, 50b and 60 constitute the prefocus lens and the main focusing lens of main lens system, are used for final convergence and accelerated electron beam.Anode 30, static focus electrode 50a and dynamic focus electrode 50b constitute static prefocus lens and dynamic prefocus lens.Accelerating electrode 60 constitutes dynamic main focusing lens.Send the plane at the electron beam of static focus electrode 50a and form three vertical electron beam through-holes that prolong abreast, form the electron beam through-hole that three levels prolong abreast and receive the plane at the electron beam of the dynamic focus electrode 50b on the opposite of sending the plane that is positioned at static focus electrode.Just do like this and between static focus electrode and dynamic focus electrode, form dynamic quadrupole lens.
According to common method, 0 volt of voltage is added on the control electrode 30 and the voltage of 200-1200 volt is added on the anode 40.Static focus voltage Vs is added to that static focus electrode 50a goes up and dynamic focus voltage Vd is added on the dynamic focus electrode 50b.The accelerating voltage Va of 20-35 kilovolt is added on the accelerating electrode 60.The scope of static focus voltage Vs is the 20-35% of accelerating voltage Va.The crest voltage of dynamic focus voltage is than the high 600-800 volt of static focus voltage.
The waveform that is added to static state on the dynamic focusing electron gun of the present invention and dynamic focus voltage is usually shown in Fig. 8,9 and 10.In Fig. 8,9 and 10, the static focus voltage Vs that is added on the static focus electrode 50a maintains on the predetermined value.The parabola shaped dynamic focus voltage Vd that is added on the dynamic focus electrode 50b changes by the position of electron beam arrival on the phosphor screen, and repeats in each horizontal deflection cycle.As feature of the present invention, the amplitude of each horizontal deflection cycle of parabola shaped dynamic electric voltage changes by the landing positions of electron beam, and the minimum and maximum value of dynamic focus voltage all changes in the cycle in each vertical deflection.The minimum voltage of each parabolic waveform of a horizontal deflection cycle has a value that is higher than, is equal to or less than static focus voltage, and compare in the middle part of each scan line with the electron beam land, when the electron beam land in each scan line than top with than the bottom time, this minimum voltage is higher relatively.The difference of minimum voltage changes in a vertical cycle regularly frame by frame.
In Fig. 8,9 and 10, connect maximum of points and the upper and lower wave-like line V10 of minimum point formation and the variation that V20 illustrates dynamic focus voltage when the electron beam land are on the vertical line that passes fluoroscopic edge and central part of parabolic waveform respectively.Celestial being is relevant with the vertical focusing characteristic in them, thereby can see first and second vertical dynamic focus voltage V10 and the V20 of supposition as.According to the variation of vertical voltage, can see that dynamic focus voltage all changes on fluoroscopic all directions (vertical and horizontal direction) with the difference of static focus voltage.In addition, according to characteristics of the present invention, fluoroscopic on or down the amplitude Io in the horizontal deflection cycle at position be different with amplitude Ic in the horizontal deflection cycle at fluoroscopic central part.In the vertical deflection of vertical dynamic focus voltage V10 and V20 in the cycle, also be different with rate of change in phosphor screen central authorities at the rate of change of the fluoroscopic left and right sides.
With reference to Fig. 9, when the electron beam land in fluoroscopic when central authorities, the minimum value of dynamic focus voltage Vd is lower than static focus voltage Vs, when electron beam land during in fluoroscopic edge, the minimum value of dynamic focus voltage is higher relatively.
With reference to Figure 10, when the electron beam land in fluoroscopic when central authorities, the minimum value of dynamic focus voltage Vd is substantially equal to static focus voltage Vs.When the electron beam land in fluoroscopic during than top with than the bottom, dynamic focus voltage is higher relatively.
At this moment, fluoroscopic than top with different with amplitude Ic in the horizontal deflection cycle in fluoroscopic central part than the amplitude Io in the horizontal deflection cycle in the lower area.In cycle, the rate of change of the parabolic wave of the phosphor screen left and right sides is bigger than phosphor screen central authorities in vertical deflection.So the rate of change of the second vertical dynamic focus voltage V20 that connects the supposition that rate of change and the minimum point of connection horizontal dynamic focusing voltage of the first vertical dynamic focus voltage V10 of the supposition that the maximum of points of horizontal dynamic focusing voltage obtains obtain is different.
As shown in Figure 9, when the electron beam land in fluoroscopic when central authorities, the minimum value of the second vertical dynamic electric voltage V20 of dynamic focus voltage Vd is lower than static focus voltage Vs, and fluoroscopic on and position down, its minimum value is relatively higher than static focus voltage Vs.As shown in figure 10, when the electron beam land in fluoroscopic when central authorities, the minimum value of the second vertical dynamic electric voltage V20 of dynamic focus voltage Vd is identical with static focus voltage basically, and fluoroscopic on and descend the position, its minimum value is higher relatively.
As mentioned above, the electron gun of the present invention amplitude that is characterised in that parabola shaped dynamic focus voltage changes according to the scanning position of electron beam.
Work and the effect of dynamic focusing electron gun embodiment of the present invention will be described below.
Horizontal dynamic focusing voltage Vd changes according to the position that electron beam on the phosphor screen arrives, and this voltage is that the i.e. amplitude in phosphor screen top and the horizontal deflection cycle 1H that produces down that applies like this is greater than the value in phosphor screen central authorities.At the rate of change of the vertical dynamic focus voltage V10 of the phosphor screen left and right sides and V20 greater than rate of change in phosphor screen central authorities.At Fig. 8, in 9 and 10, the parabolical dynamic electric voltage of each root illustrates horizontal focusing voltage Vd and shows the variation of horizontal focusing voltage when electron beam flatly passes through the phosphor screen central scan from left to right or from right to left.
At this,, greater than amplitude, thereby obtained the good focusing characteristic in zone, fluoroscopic upper and lower in phosphor screen central authorities in the amplitude of the parabolic wave of the horizontal dynamic focusing voltage Vd of fluoroscopic upper and lower according to characteristics of the present invention.
More particularly, the middle part of each scan line of electron beam scanning that sends when electron gun and added dynamic electric voltage is low slightly or during a little higher than static focus voltage, then will be subjected to electric field effects therebetween when electron beam passes between static focus electrode 50a and dynamic focus electrode 50b.Like this, being formed on the phosphor screen is vertical relative less electron-baem spot with the horizontal width difference.When dynamic focus voltage is identical with static focus voltage owing to also do not form lens between static focus electrode 50a and the dynamic focus electrode 50b, electron beam by the time be not subjected to the influence of lens.Like this, formation is level and vertical direction width circular electron beam luminous point much at one.
When electron beam scanning during in the end of scan line, because added dynamic focus voltage is higher than static focus voltage, when electron beam passes between static focus electrode 50a and the dynamic focus electrode 50b, this electron beam be formed at the strong quadrupole lens between electrode 50a and the electrode 50b influence and by vertical elongation.Vertical elongation degree to the electron beam of phosphor screen edge deflection changes according to scanning position.When zone, the fluoroscopic upper and lower of electron beam scanning because the quadrupole lens that forms is very strong, the electron beam at four angles of directive phosphor screen by vertical elongation to the limit and focal length be elongated.Because the electron beam of vertical elongation is subjected to the influence of non-homogeneous magnetic deflection field, and owing to the astigmatism according to fluoroscopic aspherical degree, what form when electron beam arrives phosphor screen edge almost is circular electron-baem spot.
By top method, on whole phosphor screen 100, can obtain the scan line 110 of homogeneous, as shown in figure 11.
In according to dynamic focusing electron gun of the present invention and since add dynamic focus voltage amplitude by changing features of the present invention, horizontal focusing state and vertical focusing degree can both be regulated.
Such dynamic focus voltage applies method and can be used in and utilize the low voltage drive method and utilize in the dynamic focusing electron gun of high voltage drive method, wherein the regulation voltage of low voltage drive method is lower than focus voltage, and the regulation voltage of high voltage drive method is higher than focus voltage.
As mentioned above, dynamic focus voltage at dynamic electron rifle of the present invention applies in the method, horizontal dynamic focusing voltage changes according to the position that electron beam on the phosphor screen arrives, and after applying this voltage, the amplitude in the horizontal deflection cycle in the phosphor screen upper and lower is greater than the value in phosphor screen central authorities.In vertical dynamic focus voltage, since at the rate of change of vertical deflection in the cycle of the fluoroscopic left and right sides greater than rate of change in vertical deflection cycle of phosphor screen central authorities, improved the focus state of phosphor screen central authorities and edge, compensated because deflecting coil and geometry thereof and the distortion of the focus characteristics that causes in fluoroscopic edge has obtained high-resolution image on whole phosphor screen.
Can be applicable to HDTV and common TV according to electron gun of the present invention.
Claims (4)
1, a kind of dynamic focusing electron gun, comprise the negative electrode 20 that produces electron beam, the control utmost point 30 and anode 40, be applied with the static focus electrode 50a of static focus voltage, be applied with the dynamic focus electrode 50b and the final stage accelerating electrode 60 that is applied with accelerating anode voltage of dynamic focus voltage, form the main lens that quickens and assemble electron beam, it is characterized in that the point on the phosphor screen that above-mentioned dynamic focus voltage will arrive according to electron beam changes, this voltage applies like this, and the amplitude the when amplitude when making the electron beam scanning phosphor screen than top with than the bottom is more central than electron beam scanning phosphor screen is big.
2, according to the dynamic focusing electron gun in the claim 1, it is characterized in that when the electron beam land in fluoroscopic when central authorities, the negative peak voltage of a horizontal deflection cycle of above-mentioned dynamic focus voltage is lower than described static focus voltage, when the electron beam land were regional in fluoroscopic upper and lower, negative peak voltage was higher relatively.
3, according to the dynamic focusing electron gun in the claim 1, the minimum value that it is characterized in that described dynamic focus voltage is more than or equal to described static focus voltage.
4,, it is characterized in that the minimum voltage value of a horizontal deflection cycle of described dynamic focus voltage is lower than described static focus voltage according to the dynamic focusing electron gun in the claim 1.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR92-24629 | 1992-12-17 | ||
| KR1019920024629A KR950004399B1 (en) | 1992-12-17 | 1992-12-17 | Dynamic focus electron gun |
| KR24629/92 | 1992-12-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1088355A true CN1088355A (en) | 1994-06-22 |
| CN1041145C CN1041145C (en) | 1998-12-09 |
Family
ID=19345897
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN93114799A Expired - Fee Related CN1041145C (en) | 1992-12-17 | 1993-11-15 | Dynamic focusing electron gun |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPH06233151A (en) |
| KR (1) | KR950004399B1 (en) |
| CN (1) | CN1041145C (en) |
| DE (1) | DE4336532A1 (en) |
| NL (1) | NL9301756A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3324282B2 (en) * | 1994-07-11 | 2002-09-17 | 松下電器産業株式会社 | Color picture tube equipment |
| KR101686976B1 (en) | 2014-07-29 | 2016-12-16 | 유석찬 | a wreath holder |
| KR101624544B1 (en) | 2014-07-29 | 2016-05-26 | 유석찬 | a wreath holder manufacturing device |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6199249A (en) * | 1984-10-18 | 1986-05-17 | Matsushita Electronics Corp | Picture tube apparatus |
| JPS62136970A (en) * | 1985-12-11 | 1987-06-19 | Hitachi Ltd | High voltage equipment |
| JPS62283779A (en) * | 1986-05-30 | 1987-12-09 | Fujitsu Ltd | Dynamic focus circuit |
| US4683405A (en) * | 1986-06-27 | 1987-07-28 | Rca Corporation | Parabolic voltage generating apparatus for television |
| US4771216A (en) * | 1987-08-13 | 1988-09-13 | Zenith Electronics Corporation | Electron gun system providing for control of convergence, astigmatism and focus with a single dynamic signal |
| CA1278104C (en) * | 1988-01-28 | 1990-12-18 | Gregory Thomas Barry Crowley | Dynamic focus circuit |
| JPH01243328A (en) * | 1988-03-25 | 1989-09-28 | Hitachi Ltd | Buffer-type gas-blasted circuit breaker |
| NL8900068A (en) * | 1989-01-12 | 1990-08-01 | Philips Nv | IMAGE DISPLAY TUBE. |
| JPH03184479A (en) * | 1989-12-13 | 1991-08-12 | Toshiba Corp | Focus voltage generator |
| KR920005828Y1 (en) * | 1990-01-31 | 1992-08-22 | 삼성전관 주식회사 | Electron gun structure of color crt |
| JPH03294891A (en) * | 1990-04-13 | 1991-12-26 | Hitachi Ltd | Display device |
| GB9104649D0 (en) * | 1991-03-05 | 1991-04-17 | Secr Defence | Focusing means for cathode ray tubes |
-
1992
- 1992-12-17 KR KR1019920024629A patent/KR950004399B1/en not_active IP Right Cessation
-
1993
- 1993-10-11 NL NL9301756A patent/NL9301756A/en not_active Application Discontinuation
- 1993-10-26 DE DE4336532A patent/DE4336532A1/en not_active Withdrawn
- 1993-10-28 JP JP5270625A patent/JPH06233151A/en active Pending
- 1993-11-15 CN CN93114799A patent/CN1041145C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06233151A (en) | 1994-08-19 |
| NL9301756A (en) | 1994-07-18 |
| DE4336532A1 (en) | 1994-06-23 |
| KR950004399B1 (en) | 1995-04-28 |
| CN1041145C (en) | 1998-12-09 |
| KR940016414A (en) | 1994-07-23 |
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Granted publication date: 19981209 Termination date: 20091215 |