CN108830311A - A kind of infrared image photovoltaic array recognition methods based on Adaboost - Google Patents

A kind of infrared image photovoltaic array recognition methods based on Adaboost Download PDF

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CN108830311A
CN108830311A CN201810555978.2A CN201810555978A CN108830311A CN 108830311 A CN108830311 A CN 108830311A CN 201810555978 A CN201810555978 A CN 201810555978A CN 108830311 A CN108830311 A CN 108830311A
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刘峰
马浩
崔子冠
干宗良
唐贵进
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Nanjing Post and Telecommunication University
Nanjing University of Posts and Telecommunications
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Abstract

The infrared image photovoltaic array recognition methods based on Adaboost that the invention discloses a kind of, including preparing training required positive sample and negative sample;Using LBP feature training Weak Classifier, Weak Classifier training strong classifier is utilized;Utilize obtained multiple strong classifiers training cascade classifier;Picture to be detected is tentatively identified using cascade classifier;Background process is carried out to preliminary recognition result, obtains the final result of photovoltaic array identification.The present invention improves the accuracy rate of array identification by carrying out photovoltaic array Preliminary detection using Adaboost and combining using the method for removing background based on temperature characterisitic;Avoiding occur when ambient temperature is higher than array according to the method that temperature characterisitic identifies array is misrecognition phenomenon that array, array are identified as background by Background Recognition.

Description

A kind of infrared image photovoltaic array recognition methods based on Adaboost
Technical field
The infrared image photovoltaic array recognition methods based on Adaboost that the present invention relates to a kind of, belongs in photovoltaic plant Array detects automatically and analysis technical field.
Background technique
In recent years, it is constantly progressive as the worldwide petrochemical energy becomes closer to exhausted and solar photovoltaic technology, light Volt power generation enters the stage of rapid development.China was since 2013, continuous 4 years global photovoltaic industries of taking the lead in race, wherein concentrating Formula photovoltaic plant accounts for 85% or more.One large-sized photovoltaic power station is generally made of the photovoltaic array of many a queueing disciplines, often A array is made of the regularly arranged battery of certain amount again.These photovoltaic plants are in for a long time in outdoor environment, very It is easy blocking by dust, weeds, birds droppings, building and other photovoltaic solar plates, and then leads to the generation of hot spot effect.Heat Spot will lead to a large amount of fevers in photovoltaic module part, can not convert light energy into electric energy, so not only strong influence power generation effect Rate, or even the problem of photovoltaic array causes fire can be burnt.Therefore, detection hot spot has photovoltaic plant in daily maintenance in time There is important meaning.
The method of array hot spot detection at present is broadly divided into two major classes:One kind is to constitute circuit based on photovoltaic cell component C-V characteristic, another kind of is the temperature characterisitic based on infrared imaging.First kind needs build physical circuit outside photovoltaic array, lead to It crosses monitoring C-V characteristic and judges whether there is hot spot.This method not only increases the maintenance cost of photovoltaic plant and is building electricity The physical structure of solar battery itself can be destroyed when road.Second class detects hot spot based on the temperature characterisitic of infrared imaging, It relies primarily on unmanned plane and carries infrared camera Direct Acquisition temperature data, and detect ground automatically by the method for infrared image analysis The hot spot in face, accuracy is higher and will not generate destruction to photovoltaic array internal structure.Currently based on the heat of infrared image analysis Spot detection method is generally divided into two steps:The first step identifies each photovoltaic array in infrared array image;Second step is based on infrared Image photovoltaic array recognition result detects hot spot.The first step plays a crucial role in the method, tional identification array It is using temperature data Direct Recognition array, occurring in ambient temperature and close array temperature is battle array by Background Recognition Column, array are identified as the misrecognition phenomenon of background, once array identification is when the error occurs, second step hot spot detection effect It can have a greatly reduced quality, so the accuracy rate for improving array identification has great importance for improving hot spot detection effect.
Summary of the invention
In order to solve the above-mentioned technical problems, the present invention provides a kind of, and the infrared image photovoltaic array based on Adaboost is known Other method.
In order to achieve the above object, the technical scheme adopted by the invention is that:
A kind of infrared image photovoltaic array recognition methods based on Adaboost, includes the following steps,
Prepare training required positive sample and negative sample, wherein negative sample includes incomplete photovoltaic array picture and non-light Photovoltaic array picture, positive sample include complete photovoltaic array picture;
Using LBP feature training Weak Classifier, Weak Classifier training strong classifier is utilized;
Utilize obtained multiple strong classifiers training cascade classifier;
Picture to be detected is tentatively identified using cascade classifier;
Background process is carried out to preliminary recognition result, obtains the final result of photovoltaic array identification.
Positive sample and negative sample prepare according to certain ratio, incomplete photovoltaic array picture and non-photovoltaic battle array in negative sample Column picture meets certain ratio.
Training Weak Classifier process be,
Calculate positive sample and negative sample integrogram;
The LBP value for calculating each pixel obtains the LBP characteristic value for reflecting the pixel adjacent domain texture;
All LBP characteristic values are put into a feature set;
Construct Multiway Tree Structure LBP feature Weak Classifier, each branch correspond to some determine LBP characteristic value, weak point Class device definition is,
Wherein, fi(x) characteristic value that the corresponding LBP of each branch x is determined, f are indicatedi(x) value is bigger, is photovoltaic array Possibility is bigger, xkIt is k-th of component of vector x, i is the ith feature of window to be detected, and point of Weak Classifier is indicated with n Branch, n are integer, and the value range of n is 0~L, anIndicate the parameter obtained by training,
Wherein, N is the sum of training sample, wjFor the weight of j-th of training sample, yjFor j-th of training sample classification mark Label,For k-th of component of j-th of training sample,When equal with n,It is 1, is otherwise 0;
Work as anWhen > 0, illustrates that a possibility that j-th of training sample is positive sample is greater than negative sample, threshold θ is set;
Work as fi(x) >=θ when, be judged as positive sample, be otherwise negative sample.
Threshold θ is the value that a dynamic updates, and specific setting up procedure is,
The weight of all negative samples is set and for Q;
The LBP characteristic value of selected j-th of training sample sets all positive samples and negative sample judged as threshold value Weight and respectively S+And S-
Calculate ej=S++(Q-S-)
All samples are traversed, e is obtained1,...,eN
Calculate e=min { e1,...,eN, the corresponding experienced sample LBP characteristic value of e is optimal threshold.
Using Weak Classifier training strong classifier process be,
Training sample set S is defined, wherein positive sample and negative sample number are respectively numPos and numNeg, the weight of positive sample Initial value is 1/ (2 × numPos), and the weight initial value of negative sample is 1/ (2 × numNeg);
T iteration is carried out, each process is:The corresponding Weak Classifier of each feature is constructed first, and it is flat to select wherein weight Square error andThe smallest Weak Classifier ht(x);Then according to formulaWeight is updated, wherein wt+1,j,wt,jPower when respectively j-th training sample t+1 times and t iteration Weight, β is according to formula β=Jwse/(1-Jwse) undated parameter being calculated, e 'j=1 indicates that training sample classification is wrong Accidentally, e 'j=0 indicates that training sample classification is correct;Finally positive sample and negative sample weight are normalized;
The classification error rate of each weak typing is its weight αt, obtaining strong classifier is,
Wherein,
Training cascade classifier process be,
1) number for defining strong classifier is M, i.e., the maximum number of plies of cascade classifier is M, and training each of obtains strong point The minimum detection rate of class device and maximum false detection rate are respectively dminAnd fmax, select a positive sample of numPos ' and a negative sample of numNeg ' This, the ratio between negative sample and positive sample are
Rario=numPos '/numNeg ', the initial false detection rate of cascade classifier are F0=1;
2) training:
21) j '=1 is defined;
22) training jth ' a strong classifier, makes its verification and measurement ratio dj′Greater than dmin, while false detection rate fj′Less than fmax
23)Fj′=fj′*Fj′-1, judge Fj′≤Fj′-1It is whether true, terminate if setting up, otherwise judges whether j ' is equal to M, Terminate if being equal to, otherwise j '=j '+1;
24) positive sample is verified, the positive sample number by cascade classifier is M ', positive sample in modification next round training M ' is assigned to numPos ' by this number, is verified to negative sample, and the negative sample of correct rejection is removed, and supplements negative sample, Make negative sample number numNeg '=numPos '/rario, goes to step 22;
3) obtained cascade classifier is saved.
During tentatively identifying picture to be detected, needs first to scale detection window and picture to be detected, make detection window It is identical with the size of picture to be detected, then it is screened by cascade classifier.
The background process is gone to be,
Foreground and background differentiation is carried out to preliminary recognition result, extracts foreground target;
Calculate foreground target temperature mean value, when temperature mean value be higher than temperature threshold, then be determined as photovoltaic array, otherwise for Shade;
The pixel value for being determined as photovoltaic array region is set as 1, shadow region pixel value is set as 0;
The region for being 1 to pixel value calculates local variance, local variance figure is obtained, using Otsu algorithm to local variogram Thresholding has obtained the binary image of removal shade and background;
Screen temperature distribution range;
Using opening operation, background interference in binary image is eliminated, disconnects the connection between photovoltaic module;
The connected region of photovoltaic module is found, and the number of altitude is carried out to photovoltaic module, to the photovoltaic for being less than average height Component is marked with average height.
The beneficial effects obtained by the present invention are as follows:1, the present invention carries out photovoltaic array using the Adaboost algorithm of LBP feature Preliminary identification, improves the accuracy of photovoltaic array coarse positioning;2, the present invention is at the beginning of by carrying out photovoltaic array using Adaboost Step is detected and is combined using the method based on temperature characterisitic removal background, and the accuracy rate of array identification is improved;Avoid root What is occurred when ambient temperature is higher than array according to the method for temperature characterisitic identification array is that array, array are identified as by Background Recognition The misrecognition phenomenon of background;3, the present invention only carries out the processing work of temperature data to the region that Preliminary detection is array rather than right The temperature data of entire image is handled, and reduces calculation amount in this way, improves efficiency.
Detailed description of the invention
Fig. 1 is flow chart of the invention;
Fig. 2 is the flow chart of training cascade classifier;
Fig. 3 is the flow chart tentatively identified.
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.Following embodiment is only used for clearly illustrating the present invention Technical solution, and not intended to limit the protection scope of the present invention.
As shown in Figure 1, a kind of infrared image photovoltaic array recognition methods based on Adaboost, includes the following steps:
Step 1, prepare training required positive sample and negative sample.
Negative sample includes incomplete photovoltaic array picture and non-photovoltaic array picture, and positive sample includes complete photovoltaic array figure Piece;Positive sample and negative sample prepare according to certain ratio, incomplete photovoltaic array picture and non-photovoltaic array figure in negative sample Piece meets certain ratio.
Aforementioned proportion can be adjusted according to different situations, and in operation, the ratio of positive sample and negative sample is 1:3~1:5, The ratio of incomplete photovoltaic array picture and non-photovoltaic array picture is 1:3~1:4.Prepare 802 positive samples, 3530 negative samples This, wherein 850 incomplete photovoltaic array pictures and 2680 non-photovoltaic array pictures, all dimension of pictures are normalized to grow The size of wide 60 pixel of 160 pixels, all pictures are jpg format.
Step 2, all it is the attribute of regular geometric pattern according to photovoltaic array, using LBP feature training Weak Classifier, utilizes Weak Classifier trains strong classifier, specific as shown in Figure 2.
The process of training Weak Classifier is as follows:
201) positive sample and negative sample integrogram are calculated.
202) the LBP value for calculating each pixel, obtains the LBP characteristic value for reflecting the pixel adjacent domain texture;
In 3 × 3 window, using window center pixel LBP value as threshold value, the pixel LBP value and threshold in 8 fields of surrounding Value compares, and is 1, otherwise as 0 if pixel LBP value is greater than threshold value, just has 8 unsigned numbers in such window, can be with The pixel LBP value at center is indicated with 8 bits, this 8 bit is referred to as LBP characteristic value, this LBP characteristic value It can be used to reflect the texture information in 3 × 3 regions.
203) all LBP characteristic values are put into a feature set, are used during training Weak Classifier.
204) the LBP feature Weak Classifier of Multiway Tree Structure is constructed, each branch corresponds to the LBP characteristic value of some determination, Weak Classifier definition is:
Wherein, fi(x) characteristic value that the corresponding LBP of each branch x is determined, f are indicatedi(x) value is bigger, is photovoltaic array Possibility is bigger, xkIt is k-th of component of vector x, i is the ith feature of window to be detected, and point of Weak Classifier is indicated with n Branch, n are integer, and the value range of n is 0~L, and L+1 is branch's number, generally 256, anIndicate the ginseng obtained by training Number, an∈ { 1, -1 }, training formula are:
Wherein, N is the sum of training sample, wjFor the weight of j-th of training sample, yjFor j-th of training sample classification mark Label,For k-th of component of j-th of training sample,When equal with n,It is 1, is otherwise 0.
205) work as anWhen > 0, illustrates that a possibility that j-th of training sample is positive sample is greater than negative sample, threshold θ is set; Work as fi(x) >=θ when, be judged as positive sample, be otherwise negative sample.
fi(x) a possibility that value is bigger, is photovoltaic array is also higher, its value is carried out ascending order arrangement;Above-mentioned threshold θ is simultaneously A non-fixed value, but the value that a dynamic updates, specific setting up procedure are as follows:
211) weight of all negative samples is set and it is Q.
212) the LBP characteristic value of j-th of training sample is selected as threshold value, sets all positive samples judged and negative sample This weight and respectively S+And S-
213) e is calculatedj=S++(Q-S-)
214) all samples are traversed, e is obtained1,...,eN
215) e=min { e is calculated1,...,eN, the corresponding experienced sample LBP characteristic value of e is optimal threshold.
The process of single Weak Classifier is subjected to T iteration, by constantly increasing the weight of error sample, obtains T points The best Weak Classifier of class ability forms Weak Classifier collection, then by adjusting the weight of each Weak Classifier, is changing weight When simultaneously positive sample and negative sample are normalized, this makes it possible to obtain a strong classifier.Specific training is strong The process of classifier is as follows:
221) training sample set S={ (x is defined1,y1)(x2,y3)...(xN,yN), xjFor j-th of training sample, work as yj= When 1, x is indicatedjFor positive sample, work as yjWhen=- 1, x is indicatedjFor negative sample, in S positive sample and negative sample number be respectively numPos and NumNeg, the weight initial value of positive sample are 1/ (2 × numPos), and the weight initial value of negative sample is 1/ (2 × numNeg).
222) T iteration is carried out, each process is:The corresponding Weak Classifier of each feature is constructed first, is selected and is wherein weighed Be worth square error andThe smallest Weak Classifier ht(x);Then basis FormulaWeight is updated, wherein wt+1,j,wt,jWhen respectively j-th training sample t+1 times and t iteration Weight, β is according to formula β=Jwse/(1-Jwse) undated parameter being calculated, e 'j=1 indicates training sample classification Mistake, e 'j=0 indicates that training sample classification is correct;Finally positive sample and negative sample weight are normalized.
223) the classification error rate of each weak typing is its weight αt, obtaining strong classifier is,
Wherein,
Step 3, obtained multiple strong classifiers training cascade classifier is utilized.
Strong classifier has been obtained by previous step is trained, but in order to improve detection rates, reduces false detection rate, Continue to train cascade classifier on the basis of strong classifier.Cascade classifier is exactly the sieve that sieve pore is ascending from level to level, often One layer of effect is the negative sample that can be weeded out upper layer sieve pore and leave, and can just be determined as photovoltaic array by all sieve pores.
Detailed process is as follows for training cascade classifier:
31) number for defining strong classifier is M, i.e., the maximum number of plies of cascade classifier is M, and training each of obtains strong point The minimum detection rate of class device and maximum false detection rate are respectively dminAnd fmax, the minimum detection rate D of entire cascade classifierminIt is M Strong classifier dminProduct, maximum false detection rate FmaxIt is exactly the maximum false detection rate f that classifies M strongmaxAccumulation, it is a just to select numPos ' Sample and a negative sample of numNeg ', the ratio between negative sample and positive sample are rario=numPos '/numNeg ', cascade classifier Initial false detection rate is F0=1.
32) training;
321) j '=1 is defined;
322) training jth ' a strong classifier, makes its verification and measurement ratio dj′Greater than dmin, while false detection rate fj′Less than fmax
323)Fj′=fj′*Fj′-1, judge Fj′≤Fj′-1It is whether true, terminate if setting up, otherwise judges whether j ' is equal to M terminates, otherwise j '=j '+1 if being equal to;
324) positive sample is verified, the positive sample number by cascade classifier is M ', is modified in next round training just M ' is assigned to numPos ' by number of samples, is verified to negative sample, and the negative sample of correct rejection is removed, and supplements negative sample This, makes negative sample number numNeg '=numPos '/rario, goes to step 22.
33) obtained cascade classifier is saved.
Step 4, picture to be detected is tentatively identified using cascade classifier.
As shown in figure 3, tentatively identifying that the process of picture to be detected is as follows:
41) detection window and picture to be detected are scaled, keeps detection window identical with the size of picture to be detected.
The size that will test window first is initialized as the size of positive sample, then according to 1.1 times of size to detection window Mouth amplifies;Then picture to be detected is subjected to scaled down, i.e., original picture to be detected is reduced 1.1 times every time; Aforesaid operations are repeated until the size of detection window is identical with the size of picture to be detected.
42) load cascade classifier carries out target detection, and detection window is needed by cascade classifier, in this process Constantly screening removes some non-photovoltaic array pictures and incomplete photovoltaic array picture, until passing through all layers of screening ability It is considered as complete photovoltaic array picture.
Step 5, background process is carried out to preliminary recognition result, obtains the final result of photovoltaic array identification.
Go background process as follows:
51) gradient is carried out to preliminary recognition result and gradient image is calculated, then carry out thresholding using Otsu algorithm Processing;Foreground and background differentiation can be carried out by above-mentioned processing, extracts foreground target.
52) calculate foreground target temperature mean value, when temperature mean value be higher than temperature threshold, then be determined as photovoltaic array, it is no It is then shade.
53) pixel value for being determined as photovoltaic array region is set as 1, shadow region pixel value is set as 0.
54) region for being 1 to pixel value calculates the local variance in 2 × 2 regions, obtains local variance figure, utilizes Otsu Algorithm has obtained the binary image of removal shade and background to local variogram thresholding.
55) temperature distribution range is screened.
It is similar to the priori knowledge of Gaussian Profile, the temperature of array region according to array temperature distribution in preliminary recognition result Distribution should be averaged near peak value max it is contemplated that the temperature for being likely to occur hot spot on photovoltaic array is apparently higher than array The case where temperature, so selecting [max-4, max+12] when screening temperature distribution range.
56) opening operation is utilized, background interference in binary image is eliminated, disconnects the connection between photovoltaic module.
57) connected region of photovoltaic module is found (if pixel a, in the eight neighborhood of pixel b, a is to be connected to b.From From the point of view of visually, the point to communicate with each other forms a region, and disconnected point forms different regions, such a institute The set for thering is the point to communicate with each other to constitute, referred to as a connected region.Because the operation before passing through has been removed background, leave It is photovoltaic module, so detecting connected region i.e. photovoltaic module connected region.), and the number of altitude is carried out to photovoltaic module, The photovoltaic module for being less than average height is marked with average height.
It is above-mentioned to put by carrying out photovoltaic array Preliminary detection using Adaboost and removing background using based on temperature characterisitic Method combine, improve array identification accuracy rate;It avoids and identifies the method for array in background temperature according to temperature characterisitic It is misrecognition phenomenon that array, array are identified as background by Background Recognition that degree, which is higher than occur when array,.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art For member, without departing from the technical principles of the invention, several improvement and deformations can also be made, these improvement and deformations Also it should be regarded as protection scope of the present invention.

Claims (8)

1. a kind of infrared image photovoltaic array recognition methods based on Adaboost, it is characterised in that:Include the following steps,
Prepare training required positive sample and negative sample, wherein negative sample includes incomplete photovoltaic array picture and non-photovoltaic battle array Column picture, positive sample include complete photovoltaic array picture;
Using LBP feature training Weak Classifier, Weak Classifier training strong classifier is utilized;
Utilize obtained multiple strong classifiers training cascade classifier;
Picture to be detected is tentatively identified using cascade classifier;
Background process is carried out to preliminary recognition result, obtains the final result of photovoltaic array identification.
2. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:Positive sample and negative sample prepare according to certain ratio, incomplete photovoltaic array picture and non-photovoltaic array figure in negative sample Piece meets certain ratio.
3. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:Training Weak Classifier process be,
Calculate positive sample and negative sample integrogram;
The LBP value for calculating each pixel obtains the LBP characteristic value for reflecting the pixel adjacent domain texture;
All LBP characteristic values are put into a feature set;
The LBP feature Weak Classifier of Multiway Tree Structure is constructed, each branch corresponds to the LBP characteristic value of some determination, Weak Classifier Definition is,
Wherein, fi(x) characteristic value that the corresponding LBP of each branch x is determined, f are indicatedi(x) value is bigger, is the possibility of photovoltaic array Bigger, the x of propertykIt is k-th of component of vector x, i is the ith feature of window to be detected, and the branch of Weak Classifier, n are indicated with n For integer, the value range of n is 0~L, anIndicate the parameter obtained by training,
Wherein, N is the sum of training sample, wjFor the weight of j-th of training sample, yjFor j-th of training sample class label,For k-th of component of j-th of training sample,When equal with n,It is 1, is otherwise 0;
Work as anWhen > 0, illustrates that a possibility that j-th of training sample is positive sample is greater than negative sample, threshold θ is set;
Work as fi(x) >=θ when, be judged as positive sample, be otherwise negative sample.
4. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 3, feature exist In:Threshold θ is the value that a dynamic updates, and specific setting up procedure is,
The weight of all negative samples is set and for Q;
The LBP characteristic value of selected j-th of training sample sets the weight of all positive samples and negative sample judged as threshold value Respectively S+And S-
Calculate ej=S++(Q-S-)
All samples are traversed, e is obtained1,...,eN
Calculate e=min { e1,...,eN, the corresponding experienced sample LBP characteristic value of e is optimal threshold.
5. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:Using Weak Classifier training strong classifier process be,
Training sample set S is defined, wherein positive sample and negative sample number are respectively numPos and numNeg, the weight initial value of positive sample For 1/ (2 × numPos), the weight initial value of negative sample is 1/ (2 × numNeg);
T iteration is carried out, each process is:The corresponding Weak Classifier of each feature is constructed first, selects wherein weight square mistake Difference andThe smallest Weak Classifier ht(x);Then according to formulaWeight is updated, wherein wt+1,j,wt,jPower when respectively j-th training sample t+1 times and t iteration Weight, β is according to formula β=Jwse/(1-Jwse) undated parameter being calculated, e 'j=1 indicates that training sample classification is wrong Accidentally, e 'j=0 indicates that training sample classification is correct;Finally positive sample and negative sample weight are normalized;
The classification error rate of each weak typing is its weight αt, obtaining strong classifier is,
Wherein,
6. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:Training cascade classifier process be,
1) number for defining strong classifier is M, i.e., the maximum number of plies of cascade classifier is M, each strong classifier that training obtains Minimum detection rate and maximum false detection rate be respectively dminAnd fmax, a positive sample of numPos ' and a negative sample of numNeg ' are selected, The ratio between negative sample and positive sample are rario=numPos '/numNeg ', and the initial false detection rate of cascade classifier is F0=1;
2) training:
21) j '=1 is defined;
22) training jth ' a strong classifier, makes its verification and measurement ratio dj′Greater than dmin, while false detection rate fj′Less than fmax
23)Fj′=fj′*Fj′-1, judge Fj′≤Fj′-1It is whether true, terminate if setting up, otherwise judge whether j ' is equal to M, if waiting In then terminating, otherwise j '=j '+1;
24) positive sample is verified, the positive sample number by cascade classifier is M ', positive sample number in modification next round training M ' is assigned to numPos ' by mesh, is verified to negative sample, and the negative sample of correct rejection is removed, and is supplemented negative sample, is made to bear Sample number numNeg '=numPos '/rario, goes to step 22;
3) obtained cascade classifier is saved.
7. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:It during tentatively identifying picture to be detected, needs first to scale detection window and picture to be detected, makes detection window and to be checked The size of mapping piece is identical, is then screened by cascade classifier to it.
8. a kind of infrared image photovoltaic array recognition methods based on Adaboost according to claim 1, feature exist In:The background process is gone to be,
Foreground and background differentiation is carried out to preliminary recognition result, extracts foreground target;
Calculate foreground target temperature mean value, when temperature mean value be higher than temperature threshold, then be determined as photovoltaic array, be otherwise yin Shadow;
The pixel value for being determined as photovoltaic array region is set as 1, shadow region pixel value is set as 0;
The region for being 1 to pixel value calculates local variance, local variance figure is obtained, using Otsu algorithm to local variogram threshold value Change, has obtained the binary image of removal shade and background;
Screen temperature distribution range;
Using opening operation, background interference in binary image is eliminated, disconnects the connection between photovoltaic module;
The connected region of photovoltaic module is found, and the number of altitude is carried out to photovoltaic module, to the photovoltaic module for being less than average height It is marked with average height.
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Application publication date: 20181116