CN108828630A - Baseband chip performance estimating method and device - Google Patents
Baseband chip performance estimating method and device Download PDFInfo
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- CN108828630A CN108828630A CN201810350170.0A CN201810350170A CN108828630A CN 108828630 A CN108828630 A CN 108828630A CN 201810350170 A CN201810350170 A CN 201810350170A CN 108828630 A CN108828630 A CN 108828630A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
- G01S19/13—Receivers
- G01S19/23—Testing, monitoring, correcting or calibrating of receiver elements
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Abstract
Baseband chip performance estimating method and device provided by the invention, it is tested the speed information by obtaining first location information at each moment that the baseband chip in moving condition exports under preset mode and first, and second location information and second at each moment of the test equipment output in moving condition tests the speed information, baseband chip is obtained in the dynamic positioning error and range rate error at each moment, determine effective dynamic positioning error and effective range rate error, and dynamic locating accuracy is obtained according to each effective dynamic positioning error, rate accuracy is obtained according to each effective range rate error.The dynamic locating accuracy and rate accuracy got by the above method, the selection for baseband chip in practical application provide foundation.
Description
Technical field
The present invention relates to electronic technology field more particularly to a kind of baseband chip performance estimating methods and device.
Background technique
Due to the particularity of maritime environment, the navigation equipment of boat-carrying with respect to the navigation equipment under conventional environment, reliability,
Shockproof, moisture-proof, high temperature-proof and anti-light direct beam etc. have higher requirement, and therefore, ship-borne equipment is required by unified, stringent
Test, using unified evaluation criteria, the ship-borne equipment that performance reaches requirement, which can be installed, goes on board.
The chief component of shipborne navigational aid is baseband chip, by the variation of external environment, the positioning of baseband chip
Precision and time service precision can also generate variation.In actual application process, the positioning of baseband chip under various circumstances is needed
Precision and time service precision reach certain requirement, therefore, in baseband chip using preceding needing to its sound state positioning performance with timely
Clock net synchronization capability carries out comprehensive assessment, to ensure to install the stability of the properties for the baseband chip gone on board.It would therefore be highly desirable to make
The fixed appraisal procedure to baseband chip performance, it is ensured that utilize the stability of the baseband chip properties of appraisal procedure selection.
Summary of the invention
The present invention provides a kind of baseband chip performance estimating method and device, it is ensured that utilizes the base band of appraisal procedure selection
Chip properties are stablized, and the selection for baseband chip in practical application provides foundation.
The first aspect of the present invention provides a kind of baseband chip performance estimating method, the method includes：
When baseband chip is in moving condition, first positioning at each moment that baseband chip exports under preset mode is obtained
Information and first test the speed information and test equipment output second location information and second at each moment test the speed information；
Dynamic positioning error is obtained according to first location information and second location information, and according to described the
One information and described second that tests the speed tests the speed acquisition of information range rate error；
It determines effective dynamic positioning error, and belongs to the mistake that effectively tests the speed of synchronization with effective dynamic positioning error
Difference, wherein effective dynamic positioning error is the error within the scope of default dynamic positioning error；
Dynamic locating accuracy is obtained according to each effective dynamic positioning error, and is obtained according to each effective range rate error
Take rate accuracy.
Optionally, first location information for obtaining each moment that baseband chip exports under preset mode and first is surveyed
Second location information and second at each moment of fast information and test equipment output tests the speed information, including：
The first location information and first for obtaining each moment that baseband chip is exported in the case where monitoring dipper system mode tests the speed
Second location information at each moment that information and test equipment are exported in the case where monitoring dipper system mode and second tests the speed letter
Breath.
Optionally, first location information for obtaining each moment that baseband chip exports under preset mode and first is surveyed
Second location information and second at each moment of fast information and test equipment output tests the speed information, including：
Obtain first location information at each moment that baseband chip is exported in the case where monitor Beidou system and the GPS system mode with
Second positioning at first tests the speed each moment that information and test equipment are exported in the case where monitoring Beidou system and the GPS system mode
Information and second tests the speed information.
Optionally, described that dynamic locating accuracy is obtained according to each effective dynamic positioning error, and described had according to each
It imitates range rate error and obtains rate accuracy, including：
Average dynamic position error is obtained according to each effective dynamic positioning error, is positioned and is missed according to the average dynamic
Poor and each effective dynamic positioning error obtains the root-mean-square value of effective dynamic positioning error, and effective dynamic is determined
Positioning accuracy of the root-mean-square value of position error as the baseband chip；
And average range rate error is obtained according to each effective range rate error, according to the average range rate error and each described
Effective range rate error obtains the root-mean-square value of effective range rate error, using the root-mean-square value of effective range rate error as institute
State the rate accuracy of baseband chip.
Optionally, the method also includes：
Effective dynamic positioning error is obtained in the accounting of the dynamic positioning error；
Judge whether the accounting is more than or equal to 70%, if so, by the dynamic locating accuracy and the rate accuracy
Effective dynamic accuracy as the baseband chip；If it is not, then prompting the dynamic accuracy of the baseband chip below standard.
Optionally, the method also includes：
When baseband chip remains static, the third positioning at each moment that baseband chip exports under preset mode is obtained
4th location information at each moment of information and test equipment output；
The baseband chip is obtained in the static state at each moment according to the third location information and the 4th location information
Position error；
Determine that effective static positioning error, effective static positioning error are within the scope of default static positioning error
Error；
The Static positioning accuracy of the baseband chip is obtained according to each effective static positioning error.
Optionally, the method also includes：
When acquisition baseband chip completes the first pulse signal rising edge at each moment exported after positioning under preset mode
Between and test equipment output each moment the second pulse signal rising time；
Each moment is obtained according to the first pulse signal rising time and the second pulse signal rising time
Time error；
Determine that effective time error, the effective time error are the error in preset time error range；
The time service precision of the baseband chip is obtained according to each effective time error.
The second aspect of the present invention provides a kind of baseband chip capability evaluating device, including：
First obtains module, when being in moving condition for baseband chip, obtains baseband chip and exports under preset mode
Each moment the first location information and first test the speed information and test equipment output each moment the second location information and
Second tests the speed information；
Second obtains module, misses for obtaining dynamic positioning according to first location information and second location information
Difference, and tested the speed acquisition of information range rate error according to described first information and described second that tests the speed；
Determining module belongs to synchronization for determining effective dynamic positioning error, and with effective dynamic positioning error
Effective range rate error, wherein effective dynamic positioning error is error within the scope of default dynamic positioning error；
Described second obtains module, for obtaining dynamic locating accuracy, and root according to each effective dynamic positioning error
Rate accuracy is obtained according to each effective range rate error.
Optionally, described first module is obtained, be specifically used for：
The first location information and first for obtaining each moment that baseband chip is exported in the case where monitoring dipper system mode tests the speed
Second location information at each moment that information and test equipment are exported in the case where monitoring dipper system mode and second tests the speed letter
Breath.
Optionally, described first module is obtained, be specifically used for：
Obtain first location information at each moment that baseband chip is exported in the case where monitor Beidou system and the GPS system mode with
Second positioning at first tests the speed each moment that information and test equipment are exported in the case where monitoring Beidou system and the GPS system mode
Information and second tests the speed information.
Optionally, described second module is obtained, be specifically used for：
Average dynamic position error is obtained according to each effective dynamic positioning error, is positioned and is missed according to the average dynamic
Poor and each effective dynamic positioning error obtains the root-mean-square value of effective dynamic positioning error, and effective dynamic is determined
Positioning accuracy of the root-mean-square value of position error as the baseband chip；
And average range rate error is obtained according to each effective range rate error, according to the average range rate error and each described
Effective range rate error obtains the root-mean-square value of effective range rate error, using the root-mean-square value of effective range rate error as institute
State the rate accuracy of baseband chip.
Optionally, described second module is obtained, be also used to：
Effective dynamic positioning error is obtained in the accounting of the dynamic positioning error；
The baseband chip capability evaluating device further includes：
Judgment module, for judging whether the accounting is more than or equal to 70%；
If so, described second obtains module, it is specifically used for：Using the dynamic locating accuracy and the rate accuracy as
Effective dynamic accuracy of the baseband chip；
If it is not, then cue module, for prompting the dynamic accuracy of the baseband chip below standard.
Optionally, described first module is obtained, be also used to：
When baseband chip remains static, the third positioning at each moment that baseband chip exports under preset mode is obtained
4th location information at each moment of information and test equipment output；
The baseband chip is obtained in the static state at each moment according to the third location information and the 4th location information
Position error；
The determining module is also used to determine that effective static positioning error, effective static positioning error are positioned at pre-
If the error within the scope of static positioning error；
Described second obtains module, is also used to obtain the quiet of the baseband chip according to each effective static positioning error
State positioning accuracy.
Optionally, described first module is obtained, be also used to：
When acquisition baseband chip completes the first pulse signal rising edge at each moment exported after positioning under preset mode
Between and test equipment output each moment the second pulse signal rising time；
Described second obtains module, is also used to be believed according to the first pulse signal rising time and second pulse
Number rising time obtains the time error at each moment；
The determining module is also used to determine that effective time error, the effective time error are to miss positioned at preset time
Error in poor range；
Described second obtains module, is also used to obtain the time service essence of the baseband chip according to each effective time error
Degree.
The third aspect of the present invention provides a kind of baseband chip capability evaluating device, including：It at least one processor and deposits
Reservoir；
The memory stores computer executed instructions；
At least one described processor executes the computer executed instructions of the memory storage, so that the baseband chip
Capability evaluating device executes the described in any item appraisal procedures of first aspect.
The fourth aspect of the present invention provides a kind of computer readable storage medium, deposits on the computer readable storage medium
Computer executed instructions are contained, when the computer executed instructions are executed by processor, are realized described in any one of first aspect
Appraisal procedure.
Baseband chip performance estimating method and device provided in an embodiment of the present invention are in the base of moving condition by obtaining
First location information at each moment that microarray strip exports under preset mode and first tests the speed information, and in moving condition
Second location information and second at each moment of test equipment output tests the speed information, and it is fixed in the dynamic at each moment to obtain baseband chip
Position error and range rate error, determine effective dynamic positioning error and effective range rate error, and according to each effective dynamic positioning
Error obtains dynamic locating accuracy, obtains rate accuracy according to each effective range rate error.The dynamic got by the above method
Positioning accuracy and rate accuracy, the selection for baseband chip in practical application provide foundation.
Detailed description of the invention
Fig. 1 is the connection schematic diagram of dynamic performance testing provided in an embodiment of the present invention；
Fig. 2 is the flow diagram one of baseband chip performance estimating method provided by the invention；
Fig. 3 is the flow diagram two of baseband chip performance estimating method provided by the invention；
Fig. 4 is the connection schematic diagram of static time service test provided in an embodiment of the present invention；
Fig. 5 is the flow diagram three of baseband chip performance estimating method provided by the invention；
Fig. 6 is the structural schematic diagram one of baseband chip capability evaluating device provided by the invention；
Fig. 7 is the structural schematic diagram two of baseband chip capability evaluating device provided by the invention；
Fig. 8 is the structural schematic diagram three of baseband chip capability evaluating device provided by the invention.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with the embodiment of the present invention, to this
Technical solution in inventive embodiments is clearly and completely described, it is clear that described embodiment is that a part of the invention is real
Example is applied, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creation
Property labour under the premise of every other embodiment obtained, shall fall within the protection scope of the present invention.
Baseband chip performance estimating method provided in this embodiment mainly for assessment of baseband chip dynamic locating accuracy,
Static positioning accuracy and static time service precision, only in the dynamic locating accuracy of baseband chip, Static positioning accuracy and quiet
When state time service precision is all satisfied corresponding required precision, which can be used for the navigation equipment under application circumstances.Example
Such as, due to the particularity of maritime environment, the navigation equipment of boat-carrying has higher, more essences with respect to the navigation equipment under conventional environment
Degree requires, and only every default required precision of precision satisfaction, which can install, goes on board.In this regard, the present embodiment provides a kind of baseband chips
Capability evaluating device provides baseband chip by the analytical calculation to parameters for parameters when obtaining test
Every accuracy value, the selection for baseband chip in practical application provide foundation.
It should be pointed out that the appraisal procedure of baseband chip performance provided in an embodiment of the present invention is specifically included to base band core
The assessment of the dynamic positioning performance, static immobilization performance and static time service performance of piece.Below with reference to specific embodiment to this
The appraisal procedure for inventing the baseband chip performance provided elaborates.
Fig. 1 is the connection schematic diagram of dynamic performance testing provided in an embodiment of the present invention, as shown in Figure 1, carrying out dynamic
When performance test, baseband chip to be tested and test equipment are mounted on test vehicle simultaneously or test on the test board of ship.
Wherein, the quantity of baseband chip to be tested can be one or more, be not especially limited to this present embodiment.
Baseband chip is connect with navigational route type antenna, and test equipment is connect with high-precision antenna.Test equipment provides high-precision positioning letter
Breath, velocity information etc., the precise information that the baseband chip capability evaluating device of the present embodiment is provided based on test equipment, to be measured
The dynamic property of the baseband chip of examination carries out comprehensive assessment.
On the basis of above-mentioned connection relationship, vehicle or test ship are tested within a preset period of time according to preset path row
Into so that baseband chip and test equipment are in moving condition simultaneously.Baseband chip acquires base band core in real time under preset mode
First location information of vehicle where piece or ship and first tests the speed information, meanwhile, test equipment is adopted in real time under model identical
Second location information of vehicle or ship where collection test equipment and second tests the speed information.
Baseband chip sends the first location information and first to baseband chip capability evaluating device according to default sampling rule
Test the speed information, and test equipment sends the second location information to baseband chip capability evaluating device according to identical default sampling rule
It tests the speed information with second, so that parameter information of the baseband chip capability evaluating device according to each moment received, analyzes base band
The dynamic property of chip.
Specifically, baseband chip formally starts to test after 15 minutes after powering, satellite-signal is received, according to what is captured
Satellite-signal tests baseband chip to the pseudo-distance of satellite and the change rate of distance, demodulates the data such as satellite orbit parameter, root
According to these data, baseband chip can carry out location Calculation by positioning calculation method, obtain and export test vehicle or test ship
First location information (including longitude and latitude, height) at place and the information that tests the speed etc..
The default sampling rule of the present embodiment can be equal periods sampling, alternatively, non-wait periods sampling, as long as ensuring
Sampled point can cover a variety of typical environment, be not especially limited to this present embodiment.
In order to ensure the comparativity of parameter information, the time of test equipment output location information and the information that tests the speed is the same as base band core
The time consistency of piece output location information and the information that tests the speed.
The test method of above-mentioned baseband chip dynamic property, especially suitable for Beidou compatible navigation type bimodulus baseband chip
Test, while being also applied for the single mode base of Beidou No.1, Beidou two, No. three navigation system of Beidou or Global Satellite Navigation System
The test of microarray strip.
Based on above-mentioned test method, the embodiment of the invention provides a kind of baseband chip method of dynamic performance evaluation.Fig. 2 is
The flow diagram one of baseband chip performance estimating method provided by the invention, the executing subject of method shown in Fig. 2 can be base
Microarray strip capability evaluating device, the baseband chip capability evaluating device can be by arbitrary software and or hardware realizations.
As shown in Fig. 2, the appraisal procedure of baseband chip performance provided in this embodiment specifically includes following steps：
When S201, baseband chip are in moving condition, the of each moment for exporting under preset mode of baseband chip is obtained
One location information and first test the speed information and test equipment output second location information and second at each moment test the speed letter
Breath；
Specifically, baseband chip capability evaluating device acquisition baseband chip is defeated in the case where monitoring dipper system mode (single mode)
First location information at each moment out and first tests the speed information and test equipment exports in the case where monitoring dipper system mode
Second location information at each moment and second tests the speed information.Alternatively,
Baseband chip capability evaluating device obtains baseband chip in the case where monitoring Beidou system and the GPS system mode (double mode)
First location information at each moment of output and first tests the speed information and test equipment in monitoring Beidou system and the GPS system
Second location information at each moment exported under mode and second tests the speed information.
Wherein, dipper system mode, that is, baseband chip (or test equipment) only receives dipper system (Beidou No.1, Beidou two
Number or Beidou three) satellite-signal, according to the satellite-signal of dipper system test baseband chip to satellite pseudo-distance and away from
From change rate, demodulate the data such as satellite orbit parameter, according to these data, baseband chip (or test equipment) can be by positioning
Calculation method carries out location Calculation, obtain and export test vehicle or the first location information for testing where ship (or second is fixed
Position information) and the information that tests the speed etc., wherein the first location information (or second location information) includes baseband chip (or test equipment)
Longitude and latitude, elevation information.
Beidou system and the GPS system mode, that is, baseband chip (or test equipment) receives dipper system and GPS system simultaneously
The satellite-signal of system, according to the satellite-signal of dipper system and GPS system test baseband chip to satellite pseudo-distance and away from
From change rate, demodulate the data such as satellite orbit parameter, according to these data, baseband chip can be carried out by positioning calculation method
Location Calculation obtains and exports the first location information (or second location information) where testing vehicle or test ship and tests the speed
Information etc., wherein the first location information (or second location information) includes the longitude and latitude, height of baseband chip (or test equipment)
Information.
S202, dynamic positioning error is obtained according to the first location information and the second location information, and tested the speed according to first
Information and second tests the speed acquisition of information range rate error；
Baseband chip capability evaluating device calculates each moment according to first location information and the second location information at each moment
Dynamic positioning error, specifically, the calculation formula of the dynamic positioning error of a certain moment baseband chip is as follows：
Wherein, D indicates the dynamic positioning error of different moments baseband chip；X1Indicate the first positioning of baseband chip output
Longitude information in information, Y1Indicate the latitude information in the first location information of baseband chip output, Z1Indicate that baseband chip is defeated
The elevation information in the first location information out；X2Indicate the longitude information in the second location information of test equipment output, Y2Table
Show the latitude information in the second location information of test equipment output, Z2In the second location information for indicating test equipment output
Elevation information.
Baseband chip capability evaluating device tests the speed information according to the first of each moment information and second that tests the speed, and calculates each moment
Range rate error, specifically, the calculation formula of the range rate error of a certain moment baseband chip is as follows：
V=| v1-v2| formula two
Wherein, v1Indicate that the first of baseband chip output tests the speed information, v2Indicate that the second of test equipment output tests the speed letter
Breath, V indicate the range rate error of baseband chip.
S203, it determines effective dynamic positioning error, and belongs to effective survey of synchronization with effective dynamic positioning error
Fast error；
Wherein, effective dynamic positioning error is the error within the scope of default dynamic positioning error；
In the present embodiment, baseband chip capability evaluating device is filtered out from the dynamic positioning error at each moment got
Effective dynamic positioning error within the scope of default dynamic positioning error.For example, defining dynamic positioning error less than 100 meters
Error is effective dynamic positioning error.
While determination effective dynamic positioning error, the range rate error of synchronization is effective range rate error.For example,
The dynamic positioning error at t1, t2, t3 moment is respectively 20 meters, 30 meters, 110 meters, and the range rate error at t1, t2, t3 moment is 10m/
S, 15m/s, 18m/s determine that t1, t2 moment corresponding dynamic positioning error are effectively dynamic according to default dynamic positioning error range
State position error, t1, t2 moment corresponding range rate error are effective range rate error.
By above-mentioned screening process, the dynamic positioning that dynamic positioning error exceeds default dynamic positioning error range is excluded
Point, it is ensured that the accuracy of dynamic locating accuracy and rate accuracy calculating.
S204, dynamic locating accuracy is obtained according to each effective dynamic positioning error, and obtained according to each effective range rate error
Rate accuracy.
It is missed specifically, baseband chip capability evaluating device obtains average dynamic positioning according to each effective dynamic positioning error
Difference obtains the root-mean-square value of effective dynamic positioning error according to average dynamic position error and each effective dynamic positioning error, will
Dynamic locating accuracy of the root-mean-square value of effective dynamic positioning error as baseband chip.The calculation formula of dynamic locating accuracy is such as
Under：
Wherein, DiIndicate effective dynamic positioning error at each moment,Indicate average dynamic position error, n indicates effective
The quantity of dynamic positioning point, σDIndicate the dynamic locating accuracy of baseband chip.
Specifically, baseband chip capability evaluating device obtains average range rate error according to each effective range rate error, according to flat
Equal range rate error and each effective range rate error obtain the root-mean-square value of effective range rate error, by the root-mean-square value of effective range rate error
Rate accuracy as baseband chip.The calculation formula of rate accuracy is as follows：
Wherein, ViIndicate effective range rate error at each moment,Indicate that average range rate error, n indicate effective dynamic positioning point
Quantity, σVIndicate the rate accuracy of baseband chip.
Optionally, the quantity of the dynamic positioning point of the present embodiment is 10800.
Baseband chip performance estimating method provided in an embodiment of the present invention is in the baseband chip of moving condition by obtaining
First location information at each moment exported under preset mode and first tests the speed information, and the test in moving condition is set
Second location information at each moment of standby output and second tests the speed information, obtains baseband chip in the dynamic positioning error at each moment
And range rate error, determine effective dynamic positioning error and effective range rate error, and obtain according to each effective dynamic positioning error
Dynamic locating accuracy is taken, rate accuracy is obtained according to each effective range rate error.The dynamic positioning essence got by the above method
Degree and rate accuracy, the selection for baseband chip in practical application provide foundation.
On the basis of the above embodiments, optionally, after getting dynamic locating accuracy and rate accuracy, base band
Chip performance assesses device according to the quantity of effective dynamic positioning error and the total quantity of dynamic positioning error, obtains effectively dynamic
State position error judges whether the accounting is more than or equal to 70% in the accounting of dynamic positioning error, if it is greater than or equal to 70%, then will
The effective dynamic accuracy of dynamic locating accuracy and rate accuracy as baseband chip；If the accounting prompts base band less than 70%
The dynamic accuracy of chip is below standard.By above-mentioned setting, the good baseband chip of further screening dynamic property, it is ensured that in spy
The requirement that the baseband chip to work under different environment meets positioning and tests the speed.
On the basis of the above embodiments, the embodiment of the invention also provides a kind of baseband chip static properties assessment sides
Method.It should be pointed out that static properties test is essentially identical with the test condition of dynamic performance testing, it is simply installed at test board
On baseband chip and test equipment be to remain static, that is, what is tested is same set of equipment in different location different moments
Static immobilization performance, alternatively, static immobilization performance of the same set of equipment in same position different moments.Equipment in the present embodiment
Connection relationship is same as the previously described embodiments, and details are not described herein again.
Fig. 3 is the flow diagram two of baseband chip performance estimating method provided by the invention, the execution of method shown in Fig. 3
Main body can be baseband chip capability evaluating device, which can be by arbitrary software and/or hardware
It realizes.
As shown in figure 3, the appraisal procedure of baseband chip performance provided in this embodiment is specifically further comprising the steps of：
When S301, baseband chip remain static, the of each moment for exporting under preset mode of baseband chip is obtained
4th location information at each moment of three location informations and test equipment output；
Wherein, third location information (or the 4th location information) includes the longitude and latitude, height of baseband chip (or test equipment)
Spend information.
Preset mode in the present embodiment is same as the previously described embodiments, including following two mode：Dipper system mode；North
Bucket system and GPS system mode.
In the present embodiment, baseband chip (or test equipment) obtains third location information and test equipment obtains the 4th and determines
The specific acquisition modes of position information are same as the previously described embodiments, and details are not described herein again.
S302, baseband chip is obtained according to third location information and the 4th location information in the static immobilization mistake at each moment
Difference；
The calculation formula of each moment static positioning error is identical as the formula one in above-described embodiment in the present embodiment, herein
It repeats no more.
S303, effective static positioning error is determined；
Wherein, effective static positioning error is the error within the scope of default static positioning error；
Default static positioning error range in the present embodiment is generally smaller than default dynamic positioning error range, based on pre-
If static positioning error range, effective static positioning error is determined in the static positioning error at each moment, it is ensured that the base of screening
Positioning performance of the microarray strip when remaining static is more preferable.
S304, the Static positioning accuracy that baseband chip is obtained according to each effective static positioning error.
The calculation formula of the Static positioning accuracy of baseband chip and the formula three in above-described embodiment, four phases in the present embodiment
Together, details are not described herein again.
Optionally, the quantity of the static immobilization point of the present embodiment is no less than 3600.
The third at each moment that the present embodiment is exported under preset mode by the baseband chip that acquisition remains static
Location information, and remain static test equipment output each moment the second location information, obtain baseband chip and exist
The static positioning error at each moment determines effective static positioning error, and obtains static state according to each effective static positioning error and determine
Position precision.The Static positioning accuracy got by the above method, the selection for baseband chip in practical application provide foundation.
On the basis of the various embodiments described above, the embodiment of the invention also provides a kind of baseband chip static properties assessment sides
Method.Fig. 4 is the connection schematic diagram of static time service test provided in an embodiment of the present invention, as shown in figure 4, surveying carrying out static time service
When examination, baseband chip to be tested and test equipment are mounted on test board simultaneously, and are connect with time-interval counter.Its
In, baseband chip is connect with navigational route type antenna, and test equipment is connect with high-precision antenna.Test equipment provides standard time letter
Breath, the standard time information of offer of the baseband chip capability evaluating device based on test equipment, to baseband chip to be tested
Static time service performance carries out comprehensive assessment.
It should be pointed out that the static time service precision of baseband chip is for describing baseband chip output timing results and standard
The matching degree of time.
Specific testing procedure is as follows：
Baseband chip and test equipment are connected according to connection schematic diagram shown in Fig. 4；Baseband chip 15 minutes after powering
Formally start to test afterwards, after completing static immobilization, exports second pulse signal (1PPS) in real time to time-interval counter；When utilization
Between interval counter measurement baseband chip output second pulse signal (1PPS) rising time and test equipment output second arteries and veins
Rush signal (1PPS) rising time, statistical time error.Based on above-mentioned test method, combined with specific embodiments below to this hair
The appraisal procedure of bright baseband chip static state time service performance elaborates.
Fig. 5 is the flow diagram three of baseband chip performance estimating method provided by the invention, the execution of method shown in Fig. 5
Main body can be baseband chip capability evaluating device, which can be by arbitrary software and/or hardware
It realizes.
As shown in figure 5, the appraisal procedure of baseband chip performance provided in this embodiment is specifically further comprising the steps of：
S501, the first pulse signal rising that baseband chip completes each moment exported after positioning under preset mode is obtained
The second pulse signal rising time at each moment exported along time and test equipment；
Preset mode in the present embodiment is same as the previously described embodiments, including following two mode：Dipper system mode；North
Bucket system and GPS system mode.Baseband chip capability evaluating device obtains each moment completion positioning from time-interval counter
First pulse signal rising time of baseband chip and the second pulse signal rising time of test equipment afterwards, wherein
Second pulse signal rising time is standard rising time.
S502, obtained according to the first pulse signal rising time and the second pulse signal rising time each moment when
Between error；
In the present embodiment, the calculation formula of the time error of a certain moment baseband chip is as follows：
T=| t1-t2| formula seven
Wherein, t1Indicate the first pulse signal rising time, t2Indicate that the second pulse signal rising time, T indicate base
The time error of microarray strip.
S503, effective time error is determined；
Wherein, effective time error is the error in preset time error range；
Effective time error is determined in the time error at each moment, it is ensured that the baseband chip of screening is remaining static
When time service it is functional.
S504, the time service precision that baseband chip is obtained according to each effective time error.
Wherein, TiIndicate the time error at each moment,Indicate that mean timing error, n indicate the number of effective static immobilization point
Amount, σTIndicate the time service precision of baseband chip.
Optionally, the quantity of the static immobilization point of the present embodiment is no less than 3600.
The present embodiment is by obtaining the first of each moment that the baseband chip to remain static exports under preset mode
Pulse signal rising time, and remain static test equipment output each moment the second pulse signal rising edge
Time obtains baseband chip and determines effective time error in the time error at each moment, and obtains base band according to each time error
The time service precision of chip.The time service precision got by the above method, the selection for baseband chip in practical application provide
Foundation.
Fig. 6 is the structural schematic diagram one of baseband chip capability evaluating device provided by the invention, if Fig. 6 shows, the present embodiment
The baseband chip capability evaluating device 60 of offer, including：
First obtains module 61, and when being in moving condition for baseband chip, it is defeated under preset mode to obtain baseband chip
First location information at each moment out and first test the speed information and test equipment output each moment the second location information
It tests the speed information with second；
Second obtains module 62, for obtaining dynamic positioning according to first location information and second location information
Error, and tested the speed acquisition of information range rate error according to described first information and described second that tests the speed；
Determining module 63 belongs to for determining effective dynamic positioning error, and with effective dynamic positioning error with for the moment
The effective range rate error carved, wherein effective dynamic positioning error is the error within the scope of default dynamic positioning error；
Described second obtains module 62, for obtaining dynamic locating accuracy according to each effective dynamic positioning error, and
Rate accuracy is obtained according to each effective range rate error.
Baseband chip capability evaluating device provided in an embodiment of the present invention, can be used for executing the side in above method embodiment
Method, it is similar that the realization principle and technical effect are similar, and details are not described herein again.
Fig. 7 is the structural schematic diagram two of baseband chip capability evaluating device provided by the invention, embodiment shown in Fig. 6
On the basis of, described first obtains module 61, is specifically used for：
The first location information and first for obtaining each moment that baseband chip is exported in the case where monitoring dipper system mode tests the speed
Second location information at each moment that information and test equipment are exported in the case where monitoring dipper system mode and second tests the speed letter
Breath.
Optionally, described first module 61 is obtained, be specifically used for：
Obtain first location information at each moment that baseband chip is exported in the case where monitor Beidou system and the GPS system mode with
Second positioning at first tests the speed each moment that information and test equipment are exported in the case where monitoring Beidou system and the GPS system mode
Information and second tests the speed information.
Optionally, described second module 62 is obtained, be specifically used for：
Average dynamic position error is obtained according to each effective dynamic positioning error, is positioned and is missed according to the average dynamic
Poor and each effective dynamic positioning error obtains the root-mean-square value of effective dynamic positioning error, and effective dynamic is determined
Positioning accuracy of the root-mean-square value of position error as the baseband chip；
And average range rate error is obtained according to each effective range rate error, according to the average range rate error and each described
Effective range rate error obtains the root-mean-square value of effective range rate error, using the root-mean-square value of effective range rate error as institute
State the rate accuracy of baseband chip.
Optionally, described second module 62 is obtained, be also used to：
Effective dynamic positioning error is obtained in the accounting of the dynamic positioning error；
The baseband chip capability evaluating device 60 further includes：
Judgment module 64, for judging whether the accounting is more than or equal to 70%；
If so, described second obtains module 62, it is specifically used for：The dynamic locating accuracy and the rate accuracy are made
For effective dynamic accuracy of the baseband chip；
If it is not, then cue module 65, for prompting the dynamic accuracy of the baseband chip below standard.
Optionally, described first module 61 is obtained, be also used to：
When baseband chip remains static, the third positioning at each moment that baseband chip exports under preset mode is obtained
4th location information at each moment of information and test equipment output；
The baseband chip is obtained in the static state at each moment according to the third location information and the 4th location information
Position error；
The determining module 63, is also used to determine effective static positioning error, effective static positioning error be positioned at
Error within the scope of default static positioning error；
Described second obtains module 62, is also used to obtain the baseband chip according to each effective static positioning error
Static positioning accuracy.
Optionally, described first module 61 is obtained, be also used to：
When acquisition baseband chip completes the first pulse signal rising edge at each moment exported after positioning under preset mode
Between and test equipment output each moment the second pulse signal rising time；
Described second obtains module 62, is also used to according to the first pulse signal rising time and second pulse
Signal rising time obtains the time error at each moment；
The determining module 63 is also used to determine that effective time error, the effective time error are positioned at preset time
Error in error range；
Described second obtains module 62, is also used to obtain the time service of the baseband chip according to each effective time error
Precision.
Baseband chip capability evaluating device provided in an embodiment of the present invention, can be used for executing the side in above method embodiment
Method, it is similar that the realization principle and technical effect are similar, and details are not described herein again.
Fig. 8 is the structural schematic diagram three of baseband chip capability evaluating device provided by the invention, as shown in figure 8, this implementation
The baseband chip capability evaluating device 80 that example provides, including：At least one processor 81 and memory 82；
The memory 82 stores computer executed instructions；
At least one described processor 81 executes the computer executed instructions that the memory 82 stores, so that the base band
Chip performance assesses the appraisal procedure that device executes baseband chip performance in above method embodiment.Concrete implementation principle can join
See above-described embodiment, this embodiment is not repeated.
The baseband chip capability evaluating device 80 can also include and input/output interface 83.
Input/output interface 83 may include independent output interface and input interface, or integrated input and defeated
Integrated interface out.Wherein, output interface is used for output data, and input interface is used to obtain the data of input, above-mentioned output
Data are the general designation exported in above method embodiment, and the data of input are the general designation inputted in above method embodiment.
The present invention also provides a kind of computer readable storage medium, computer is stored on computer readable storage medium and is held
Row instruction realizes the assessment of baseband chip performance in above method embodiment when computer executed instructions are executed by processor
Method.
Wherein, storage medium can be magnetic disk, CD, read-only memory (Read-Only Memory, ROM), random
Storage memory (Random Access Memory, RAM), flash memory (Flash Memory), hard disk (Hard Disk
Drive, abbreviation：) or solid state hard disk (Solid-State Drive, SSD) etc. HDD；Storage medium can also include mentioned kind
Memory combination.
Finally it should be noted that：The above embodiments are only used to illustrate the technical solution of the present invention., rather than its limitations；To the greatest extent
Present invention has been described in detail with reference to the aforementioned embodiments for pipe, those skilled in the art should understand that：Its according to
So be possible to modify the technical solutions described in the foregoing embodiments, or to some or all of the technical features into
Row equivalent replacement；And these are modified or replaceed, various embodiments of the present invention technology that it does not separate the essence of the corresponding technical solution
The range of scheme.
Claims (10)
1. a kind of baseband chip performance estimating method, which is characterized in that the method includes：
When baseband chip is in moving condition, first location information at each moment that baseband chip exports under preset mode is obtained
Second location information and second at each moment for testing the speed information and test equipment output with first tests the speed information；
Dynamic positioning error is obtained according to first location information and second location information, and is surveyed according to described first
Fast information and described second tests the speed acquisition of information range rate error；
It determines effective dynamic positioning error, and belongs to effective range rate error of synchronization with effective dynamic positioning error,
In, effective dynamic positioning error is the error within the scope of default dynamic positioning error；
Dynamic locating accuracy is obtained according to each effective dynamic positioning error, and is obtained and is surveyed according to each effective range rate error
Fast precision.
2. the method according to claim 1, wherein the acquisition baseband chip exported under preset mode it is each
First location information at moment and first test the speed information and test equipment output each moment the second location information and second
Test the speed information, including：
First location information at each moment that baseband chip is exported in the case where monitoring dipper system mode and first is obtained to test the speed information,
And second location information at each moment that exports in the case where monitoring dipper system mode of test equipment and second tests the speed information.
3. the method according to claim 1, wherein the acquisition baseband chip exported under preset mode it is each
First location information at moment and first test the speed information and test equipment output each moment the second location information and second
Test the speed information, including：
Obtain first location information and first at each moment that baseband chip is exported in the case where monitoring Beidou system and the GPS system mode
Second location information at each moment that the information that tests the speed and test equipment are exported in the case where monitoring Beidou system and the GPS system mode
It tests the speed information with second.
4. the method according to claim 1, wherein described obtained according to each effective dynamic positioning error is moved
State positioning accuracy, and rate accuracy is obtained according to each effective range rate error, including：
Obtain average dynamic position error according to each effective dynamic positioning error, according to the average dynamic position error and
Each effective dynamic positioning error obtains the root-mean-square value of effective dynamic positioning error, and effective dynamic positioning is missed
Positioning accuracy of the root-mean-square value of difference as the baseband chip；
And average range rate error is obtained according to each effective range rate error, according to the average range rate error and it is each it is described effectively
Range rate error obtains the root-mean-square value of effective range rate error, using the root-mean-square value of effective range rate error as the base
The rate accuracy of microarray strip.
5. the method according to claim 1, wherein the method also includes：
Effective dynamic positioning error is obtained in the accounting of the dynamic positioning error；
Judge whether the accounting is more than or equal to 70%, if so, using the dynamic locating accuracy and the rate accuracy as
Effective dynamic accuracy of the baseband chip；If it is not, then prompting the dynamic accuracy of the baseband chip below standard.
6. method according to claim 1-5, which is characterized in that the method also includes：
When baseband chip remains static, the third positioning letter at each moment that baseband chip exports under preset mode is obtained
4th location information at each moment of breath and test equipment output；
The baseband chip is obtained in the static immobilization at each moment according to the third location information and the 4th location information
Error；
Determine that effective static positioning error, effective static positioning error are the mistake within the scope of default static positioning error
Difference；
The Static positioning accuracy of the baseband chip is obtained according to each effective static positioning error.
7. method according to claim 1-6, which is characterized in that the method also includes：
The first pulse signal rising time that baseband chip completes each moment exported after positioning under preset mode is obtained, with
And the second pulse signal rising time at each moment of test equipment output；
According to the first pulse signal rising time and the second pulse signal rising time obtain each moment when
Between error；
Determine that effective time error, the effective time error are the error in preset time error range；
The time service precision of the baseband chip is obtained according to each effective time error.
8. a kind of baseband chip capability evaluating device, which is characterized in that including：
First obtains module, and when being in moving condition for baseband chip, acquisition baseband chip exports each under preset mode
First location information at moment and first test the speed information and test equipment output each moment the second location information and second
Test the speed information；
Second obtains module, for obtaining dynamic positioning error according to first location information and second location information,
And it is tested the speed acquisition of information range rate error according to described first information and described second that tests the speed；
Determining module belongs to having for synchronization for determining effective dynamic positioning error, and with effective dynamic positioning error
Imitate range rate error, wherein effective dynamic positioning error is the error within the scope of default dynamic positioning error；
Described second obtains module, for obtaining dynamic locating accuracy according to each effective dynamic positioning error, and according to each
Effective range rate error obtains rate accuracy.
9. a kind of baseband chip capability evaluating device, which is characterized in that including：At least one processor and memory；
The memory stores computer executed instructions；
At least one described processor executes the computer executed instructions of the memory storage, so that a kind of baseband chip performance
It assesses device perform claim and requires the described in any item appraisal procedures of 1-7.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
It executes instruction, when the computer executed instructions are executed by processor, realizes the described in any item assessment sides claim 1-7
Method.
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