CN108805887B - Modeling method for strip-shaped single-particle imaging noise - Google Patents
Modeling method for strip-shaped single-particle imaging noise Download PDFInfo
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- CN108805887B CN108805887B CN201810629221.3A CN201810629221A CN108805887B CN 108805887 B CN108805887 B CN 108805887B CN 201810629221 A CN201810629221 A CN 201810629221A CN 108805887 B CN108805887 B CN 108805887B
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Abstract
The invention provides a modeling method of strip-shaped single particle imaging noise. The content comprises the following steps: the single particle is obliquely shot to the imaging chip, so that the involved pixels along the straight line track of the single particle are all in high gray value or saturation. The method comprises the steps of carrying out imaging simulation on strip-shaped single particles, wherein the object of gray scale assignment is a connected pixel along a single particle straight line track, and the gray scale assignment mathematical model is a function expression taking the area of a single particle straight line track cutting pixel or the length of a line segment of the single particle straight line track cut by the pixel as an independent variable. The independent variable can select the ratio of the smaller of the two parts of the area obtained by cutting the pixel by the single-particle straight line track to the area of the pixel, can also select the length of the line segment of the single-particle straight line track cut by the pixel, and can also select the square of the length of the line segment of the single-particle straight line track cut by the pixel. The single-particle noise imaging graph generated by the invention is superposed with the simulation image as input, and a simulation experiment is carried out on the camera or the star sensor, so that the similarity of the working condition simulation of the single-particle interference imaging can be improved, the working condition coverage range of model test is enlarged, and the test sufficiency of the embedded system of the camera or the star sensor is improved.
Description
(I) technical field
The invention belongs to the field of image analysis modeling, and particularly relates to a modeling method of strip-shaped single event noise.
(II) background of the invention
The typical effects of a single event phenomenon are blow down, latch up and upset.
The effect of a single event crash is pixel damage, which is often permanent, causing "dead spots" on the imaging chip pixel array, with a gray scale value of 0. The simulation of the single event destruction effect is easy, and the generation of the 'dead pixel' is directly regarded as the generation of the 'dead pixel'.
When the single event latch-up phenomenon occurs, a low-resistance channel can be formed between a power supply and the ground of the device, so that the device enters a large-current maintenance state which is several times of the normal working current, and the device is usually restarted after power failure, otherwise, the function is lost and even the device is burnt.
The single event upset belongs to transient effect, the image of the frame generates single event upset imaging, and the single event upset imaging is not kept in the next image frame because the electronic circuit returns to normal.
The single event phenomenon occurs in time and follows the uniform distribution of random events, and the random uniform distribution is also in space. Because the incident point can be at any position on the surface of the pixel, any combination of the gray values of the surrounding 4 pixels influenced by the single event upset can occur, so that the four adjacent pixel gray values can be randomly assigned in a gray range, the four pixels are independent, and a single event upset point-like image can be simulated. The single particle latch-up imaging simulation needs to keep the imaging position and the gray value unchanged in continuous frames, and the simulation image is also dotted.
The existing single particle noise modeling is directed at the point-like single particle imaging, however, in the practical engineering, the single particle imaging is sometimes strip-shaped because the incidence angle between a single particle and an imaging chip array plane is small, the typical single particle imaging phenomenon needs to be modeled and simulated, and the invention provides a modeling method for the strip-shaped single particle imaging noise.
Disclosure of the invention
The invention aims to provide a modeling method of strip-shaped single-particle imaging noise.
The purpose of the invention is realized by the following technical method:
the single particle is obliquely shot to the imaging chip, so that the involved pixels along the straight line track of the single particle are all in high gray value or saturation.
The method comprises the steps of carrying out imaging simulation on strip-shaped single particles, wherein the object of gray scale assignment is a connected pixel along a single particle straight line track, and the gray scale assignment mathematical model is a function expression taking the area of a single particle straight line track cutting pixel or the length of a line segment of the single particle straight line track cut by the pixel as an independent variable. The independent variable can select the ratio of the smaller of the two parts of the area obtained by cutting the pixel by the single-particle straight line track to the area of the pixel, can also select the length of the line segment of the single-particle straight line track cut by the pixel, and can also select the square of the length of the line segment of the single-particle straight line track cut by the pixel.
The beneficial effects of the invention are illustrated as follows:
the single-particle noise imaging graph generated by the invention is superposed with the simulation image as input, and a simulation experiment is carried out on the camera or the star sensor, so that the similarity of single-particle interference imaging working condition simulation is improved, the working condition coverage range of model test is enlarged, and the test sufficiency of the camera or the star sensor embedded system is improved.
(IV) description of the drawings
FIG. 1 is a schematic diagram of a single particle injected at a small oblique angle;
FIG. 2 is a diagram illustrating gray scale assignments for a implicated pixel.
(V) detailed description of the preferred embodiments
The invention is described in more detail below:
the energy of the single particles in the space is determined, and the number of pixels affected by the single particles is different along with the difference of the incidence angles of the single particles injected into the array surface of the imaging chip. The pixel passed by the single particle track straight line is called a connected pixel, the smaller the incidence angle is, the more the connected pixel number is, the more the energy is dispersed, and the maximum gray value of the pixel is attenuated.
The input parameters of the model include: the incidence angle, the azimuth angle, the incidence point relative to the imaging chip array surface, the length of a track straight line segment and the maximum gray reference value (related to the energy of a single particle and the pixel sensitivity).
There are three types of embodiments of the present invention,
the method comprises the following steps:
(1) for each involved pixel, the single-particle straight-line track is cut with the pixel to obtain two parts of areas, and the area of the smaller part of the area is taken;
(2) and calculating the ratio of the area of the smaller part of the upper step to the area of the pixel, and multiplying the ratio by the maximum gray reference value to serve as the gray assignment of the single-particle-involved pixel.
The second method comprises the following steps:
(1) calculating the length of a line segment cut by the pixel of the single-particle straight line track aiming at each involved pixel;
(2) and calculating the ratio of the length of the upper step line segment to the diagonal length of the pixel, and multiplying the ratio by the maximum gray reference value to serve as the gray assignment of the involved pixels.
The third method comprises the following steps:
(1) calculating the length of a line segment of the single-particle straight line track cut by the pixel aiming at each connected pixel, and taking the square value of the line segment;
(2) and calculating the ratio of the square value of the length of the upper step line and the square value of the diagonal length of the pixel, and multiplying the ratio by the maximum gray reference value to serve as the gray assignment of the involved pixels.
Claims (4)
1. A modeling method of strip-shaped single particle imaging noise is characterized in that: under the condition that the single particles obliquely irradiate to the imaging chip, the gray-scale assignment object is a connected pixel along a single-particle straight line track, and the gray-scale assignment mathematical model is a function expression taking the area of the single-particle straight line track cutting pixel or the length of a line segment of the single-particle straight line track cut by the pixel as an independent variable.
2. The modeling method of the stripe-shaped single particle imaging noise according to claim 1, characterized in that: and selecting the ratio of the smaller of the two parts of the area obtained by cutting the pixel by the single-particle straight-line track and the pixel area by using an independent variable of the gray-scale assignment mathematical model.
3. The modeling method of the stripe-shaped single particle imaging noise according to claim 1, characterized in that: and selecting the length of a line segment of the single-particle straight line track cut by the pixel by an independent variable of the gray-scale assignment mathematical model.
4. The modeling method of the stripe-shaped single particle imaging noise according to claim 1, characterized in that: an argument of the grayscale assignment mathematical model selects the square of the length of the line segment of the single-particle straight-line trajectory clipped by the pixel.
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| CN107886118A (en) * | 2017-10-27 | 2018-04-06 | 北京中科慧眼科技有限公司 | Binocular solid camera image Region Matching optimization method, equipment and storage medium |
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| CA2984777C (en) * | 2005-09-21 | 2018-04-03 | Luminex Corporation | Methods and systems for image data processing |
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| CN102999666A (en) * | 2012-11-26 | 2013-03-27 | 西北核技术研究所 | Single even effect cross section obtaining method based on simulation |
| CN104573187A (en) * | 2014-12-11 | 2015-04-29 | 深圳市国微电子有限公司 | Simulation method and simulation device based on single event effect |
| CN106447669A (en) * | 2016-04-08 | 2017-02-22 | 潍坊学院 | Circular masking-out area rate determination-based adhesive particle image concave point segmentation method |
| CN206020676U (en) * | 2016-08-02 | 2017-03-15 | 西北核技术研究所 | A kind of single particle energy measuring device based on optical imagery |
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