CN108802283A - A kind of test method of glass baseplate surface defect direction and height - Google Patents
A kind of test method of glass baseplate surface defect direction and height Download PDFInfo
- Publication number
- CN108802283A CN108802283A CN201810578783.XA CN201810578783A CN108802283A CN 108802283 A CN108802283 A CN 108802283A CN 201810578783 A CN201810578783 A CN 201810578783A CN 108802283 A CN108802283 A CN 108802283A
- Authority
- CN
- China
- Prior art keywords
- defect
- glass
- test method
- probe
- height
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title claims abstract description 107
- 239000011521 glass Substances 0.000 title claims abstract description 96
- 238000010998 test method Methods 0.000 title claims abstract description 30
- 239000000523 sample Substances 0.000 claims abstract description 64
- 239000000758 substrate Substances 0.000 claims abstract description 38
- 238000000034 method Methods 0.000 claims abstract description 20
- 238000005259 measurement Methods 0.000 claims abstract description 17
- 230000002950 deficient Effects 0.000 claims abstract description 9
- 238000012360 testing method Methods 0.000 claims description 25
- 238000006073 displacement reaction Methods 0.000 claims description 12
- HTCXJNNIWILFQQ-UHFFFAOYSA-M emmi Chemical compound ClC1=C(Cl)C2(Cl)C3C(=O)N([Hg]CC)C(=O)C3C1(Cl)C2(Cl)Cl HTCXJNNIWILFQQ-UHFFFAOYSA-M 0.000 claims description 4
- 238000005530 etching Methods 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 238000004140 cleaning Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 238000003486 chemical etching Methods 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000004554 molding of glass Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000000879 optical micrograph Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 229910021642 ultra pure water Inorganic materials 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
NO. | Title | Unit | Quantity |
1 | Step instrument (Dektak XT) | Platform | 1 |
2 | Glass cutter | It is a | 1 |
3 | Ruler | ? | 1 |
4 | Non-dust cloth | ? | 5 |
5 | Absolute ethyl alcohol | Bottle | 1 |
6 | Supersonic wave cleaning machine | Platform | 1 |
7 | Marking pen | Branch | 1 |
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810578783.XA CN108802283A (en) | 2018-06-07 | 2018-06-07 | A kind of test method of glass baseplate surface defect direction and height |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810578783.XA CN108802283A (en) | 2018-06-07 | 2018-06-07 | A kind of test method of glass baseplate surface defect direction and height |
Publications (1)
Publication Number | Publication Date |
---|---|
CN108802283A true CN108802283A (en) | 2018-11-13 |
Family
ID=64087526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810578783.XA Pending CN108802283A (en) | 2018-06-07 | 2018-06-07 | A kind of test method of glass baseplate surface defect direction and height |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108802283A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110044803A (en) * | 2019-04-23 | 2019-07-23 | 蚌埠中光电科技有限公司 | A method of the measurement glass etching performance of resistance to HF |
CN110095590A (en) * | 2019-04-23 | 2019-08-06 | 深圳市华星光电半导体显示技术有限公司 | Glass substrate residual material method for detecting and device |
CN114001663A (en) * | 2021-10-26 | 2022-02-01 | 首钢京唐钢铁联合有限责任公司 | Rapid verification method and device for strain video control system of waviness test sample |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070075269A1 (en) * | 2005-09-30 | 2007-04-05 | Paul Leblans | Radiation image storage panel suitable for use in mammographic applications provided with particular top-coat |
CN101718714A (en) * | 2009-11-25 | 2010-06-02 | 河北东旭投资集团有限公司 | System and method for detecting surface defects of flat glass |
CN102097287A (en) * | 2009-12-15 | 2011-06-15 | 北大方正集团有限公司 | Method for monitoring chip groove depth and wafer |
CN103017713A (en) * | 2012-12-03 | 2013-04-03 | 南京航空航天大学 | Measuring method for damage layer thickness of optical material subsurface |
CN103232167A (en) * | 2013-04-28 | 2013-08-07 | 中国科学院上海光学精密机械研究所 | Repair method for surface-damaged growth point of melted quartz element |
CN105675272A (en) * | 2014-11-20 | 2016-06-15 | 中国航空工业第六八研究所 | Detection method for judging whether dynamic characteristic of pendulum parts is good or bad |
CN206074471U (en) * | 2016-10-20 | 2017-04-05 | 芜湖东旭光电科技有限公司 | The checking device of glass baseplate surface defect and check system |
CN107907086A (en) * | 2017-11-15 | 2018-04-13 | 西安交通大学 | Chemical etching measuring method, auxiliary experiment device and the test method of optical element sub-surface damage |
-
2018
- 2018-06-07 CN CN201810578783.XA patent/CN108802283A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070075269A1 (en) * | 2005-09-30 | 2007-04-05 | Paul Leblans | Radiation image storage panel suitable for use in mammographic applications provided with particular top-coat |
CN101718714A (en) * | 2009-11-25 | 2010-06-02 | 河北东旭投资集团有限公司 | System and method for detecting surface defects of flat glass |
CN102097287A (en) * | 2009-12-15 | 2011-06-15 | 北大方正集团有限公司 | Method for monitoring chip groove depth and wafer |
CN103017713A (en) * | 2012-12-03 | 2013-04-03 | 南京航空航天大学 | Measuring method for damage layer thickness of optical material subsurface |
CN103232167A (en) * | 2013-04-28 | 2013-08-07 | 中国科学院上海光学精密机械研究所 | Repair method for surface-damaged growth point of melted quartz element |
CN105675272A (en) * | 2014-11-20 | 2016-06-15 | 中国航空工业第六八研究所 | Detection method for judging whether dynamic characteristic of pendulum parts is good or bad |
CN206074471U (en) * | 2016-10-20 | 2017-04-05 | 芜湖东旭光电科技有限公司 | The checking device of glass baseplate surface defect and check system |
CN107907086A (en) * | 2017-11-15 | 2018-04-13 | 西安交通大学 | Chemical etching measuring method, auxiliary experiment device and the test method of optical element sub-surface damage |
Non-Patent Citations (1)
Title |
---|
徐世珍等: "酸蚀深度对熔石英三倍频激光损伤阈值的影响", 《强激光与粒子束》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110044803A (en) * | 2019-04-23 | 2019-07-23 | 蚌埠中光电科技有限公司 | A method of the measurement glass etching performance of resistance to HF |
CN110095590A (en) * | 2019-04-23 | 2019-08-06 | 深圳市华星光电半导体显示技术有限公司 | Glass substrate residual material method for detecting and device |
CN114001663A (en) * | 2021-10-26 | 2022-02-01 | 首钢京唐钢铁联合有限责任公司 | Rapid verification method and device for strain video control system of waviness test sample |
CN114001663B (en) * | 2021-10-26 | 2024-04-09 | 首钢京唐钢铁联合有限责任公司 | Rapid verification method and device for waviness test sample strain video control system |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108802283A (en) | A kind of test method of glass baseplate surface defect direction and height | |
CN101663574B (en) | A method for quantifying defects in a transparent substrate | |
CN106018431A (en) | Solid wood plate surface crack detecting system and detecting method | |
CN107192340A (en) | A kind of NI Vision Builder for Automated Inspection of measured hole, the position of groove and physical dimension | |
CN102636496B (en) | Defect width calibration standardizing method in optical surface defect dark field detection | |
CN102927933B (en) | Method of measuring surface roughness by using confocal laser scanning microscope | |
CN111812103B (en) | Image acquisition device, visual detection system and detection point extraction method | |
CN105651189A (en) | Non-destructive online testing equipment used for measuring thickness of ink layer in mobile phone cover plate | |
CN102840836A (en) | Assembly clearance detection method and device based on machine vision | |
CN112903709B (en) | Construction forming-oriented base material surface cleanliness evaluation method | |
Guo et al. | Experimental investigation of a modified Beckmann–Kirchhoff scattering theory for the in-process optical measurement of surface quality | |
CN207113799U (en) | A kind of NI Vision Builder for Automated Inspection of measured hole, the position of groove and physical dimension | |
CN110426408A (en) | The method that Xray fluorescence spectrometer detects arsenic in the pig iron, tin element content | |
CN102980536A (en) | Brake pad steel backing planeness detecting system and method thereof | |
CN111077055B (en) | Chloride ion penetration depth measuring method | |
CN109115747B (en) | System and method for measuring glass material properties based on Raman spectrum and OCT | |
CN204679384U (en) | A kind of truing tool for video optics contact angle measurement | |
JP2004177170A (en) | Defect inspection method by image recognition | |
CN105486693A (en) | Method for nondestructively detecting defects of high-precision elements | |
CN206944930U (en) | A kind of pcb board hole location detecting device | |
CN106247918A (en) | A kind of probe-type film thickness measuring machine automatic knifing measuring equipment and using method thereof | |
Shi et al. | Automatic recognition and evaluation of micro-contaminant particles on ultra-smooth optical substrates using image analysis method | |
Qiu et al. | Three-dimensional information measurement and reconstruction for micro-hole array based on the modified shape from focus | |
CN113758939A (en) | Method for representing metal surface cleanliness by using metal surface reflection and scattering spectrum | |
Kulkarni et al. | Optical probe for porosity defect detection on inner diameter surfaces of machined bores |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20201116 Address after: No. 498, Wenwu West Road, economic development zone, Mianyang City, Sichuan Province Applicant after: Mianyang Junwei Technology Co., Ltd Address before: 621099 Sichuan city in Mianyang Province Economic Development Zone No. 177 North Road Fu Applicant before: SICHUAN XUHONG OPTOELECTRONIC TECHNOLOGY Co.,Ltd. |
|
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20181113 Assignee: Hebei Guangyang Electronic Technology Co.,Ltd. Assignor: Mianyang Junwei Technology Co., Ltd Contract record no.: X2021990000019 Denomination of invention: A test method for direction and height of surface defects of glass substrate License type: Common License Record date: 20210111 Application publication date: 20181113 Assignee: Henan Xuyang Photoelectric Technology Co.,Ltd. Assignor: Mianyang Junwei Technology Co., Ltd Contract record no.: X2021990000020 Denomination of invention: A test method for direction and height of surface defects of glass substrate License type: Common License Record date: 20210111 |
|
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20181113 Assignee: Hebei Guangxing Semiconductor Technology Co.,Ltd. Assignor: Mianyang Junwei Technology Co., Ltd Contract record no.: X2021980001111 Denomination of invention: A test method for direction and height of surface defects of glass substrate License type: Common License Record date: 20210207 |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20210308 Address after: 621000 No. 177, north section of Fubin Road, economic development zone, Mianyang City, Sichuan Province Applicant after: Sichuan Hongke Innovation Technology Co.,Ltd. Address before: No. 498, Wenwu West Road, economic development zone, Mianyang City, Sichuan Province Applicant before: Mianyang Junwei Technology Co., Ltd |
|
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181113 |