CN108761218B - Dual-polarized near-field measuring probe - Google Patents

Dual-polarized near-field measuring probe Download PDF

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CN108761218B
CN108761218B CN201810508524.XA CN201810508524A CN108761218B CN 108761218 B CN108761218 B CN 108761218B CN 201810508524 A CN201810508524 A CN 201810508524A CN 108761218 B CN108761218 B CN 108761218B
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groove
antenna unit
unit
slot
dielectric substrate
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CN108761218A (en
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苏道一
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GUANGDONG MIKWAVE COMMUNICATION TECH Ltd
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GUANGDONG MIKWAVE COMMUNICATION TECH Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas

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Abstract

The invention relates to a dual-polarization near-field measuring probe, which comprises a first antenna unit, a second antenna unit and a metal isolating strip, wherein the first antenna unit is connected with the second antenna unit; the first antenna unit and the second antenna unit each include: a dielectric substrate; the radiation unit is provided with an index type groove and a transition groove, the index type groove and the transition groove are both arranged in the middle of the radiation unit, and the index type groove is communicated with the transition groove; the feeding unit is arranged on the second board surface; the metal through hole penetrates through the dielectric substrate and is electrically connected with the radiation unit and the feed unit; the first antenna unit is connected with the second antenna unit in a clamping manner; the metal isolating strip is arranged on the second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit and is positioned between the feed unit of the first antenna unit and the feed unit of the second antenna unit.

Description

Dual-polarized near-field measuring probe
Technical Field
The invention relates to the technical field of near field measurement, in particular to a dual-polarization near field measurement probe.
Background
With the rapid development of aerospace and electronic communication technologies, the performance requirements for various radars and communication systems are also higher and higher. An antenna is one of the key components of a radio system for radar, communication, etc., and its performance is directly related to the performance of the whole system. Antenna measurement techniques, including far-field and near-field measurements, are increasingly important in modern antenna technology and in military research.
The near-field measurement technology is considered to be an effective method for measuring the performance of the antenna in developed countries, is a necessary means for researching novel antennas, and has great potential for permeating other fields. The near-field scanning measurement has the advantages of large amount of obtained information, small environment and electric random interference, high calculation precision, small investment, all-weather work and the like. Therefore, the method provides an advanced testing means and a metering standard for realizing high-precision automatic testing and rapid detection and debugging of military and civil antennas. Especially with the rapid development of 5G communication, near field measurement is the best method for AAS testing of 5G cellular networks.
Among them, improving the performance of the near-field measurement probe and reducing the size thereof are one of the key directions for developing the near-field measurement technology, however, in the implementation process, the inventor finds that at least the following problems exist in the conventional technology: the traditional probe has the problems of overhigh cross polarization level and poor isolation.
Disclosure of Invention
Based on this, it is necessary to provide a dual-polarized near-field measurement probe for solving the problems of the conventional probe, such as too high cross polarization level and poor isolation.
In order to achieve the above object, an embodiment of the present invention provides a dual-polarized near-field measurement probe, including a first antenna unit, a second antenna unit, and a metal spacer;
the first antenna unit and the second antenna unit each include:
the dielectric substrate comprises a first plate surface and a second plate surface opposite to the first plate surface;
the radiation unit is arranged on the first plate surface, an index-type groove and a transition groove are formed in the radiation unit, the index-type groove and the transition groove are both arranged in the middle of the radiation unit, an opening of the index-type groove is arranged close to the first end of the medium substrate, an opening of the transition groove is arranged close to the second end of the medium substrate, the first end is opposite to the second end, and the index-type groove is communicated with the transition groove;
the feeding unit is arranged on the second board surface;
the metal through hole penetrates through the dielectric substrate and is electrically connected with the radiation unit and the feed unit;
the first antenna unit is connected with the second antenna unit in a clamping manner;
the metal isolating strip is arranged on the second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit and is positioned between the feeding unit of the first antenna unit and the feeding unit of the second antenna unit.
In one embodiment, the first antenna unit is connected with the second antenna unit in a snap-fit manner, and the method includes:
the medium substrate of the first antenna unit is provided with a first clamping groove along the center line of the index-type groove and on the first end part;
the dielectric substrate of the second antenna unit is provided with a second clamping groove along the center line of the index-type groove and on the second end part;
the first antenna unit and the second antenna unit are connected with the first board surface and the second board surface of the dielectric substrate of the second antenna unit in a clamping mode through the side wall of the first clamping groove and the first board surface and the second board surface of the dielectric substrate of the first antenna unit in a clamping mode through the side wall of the second clamping groove.
In one embodiment, the radiating element further comprises a third end and a fourth end opposite the third end;
the third end part is provided with a first groove array; a second groove array is arranged on the fourth end part; the first groove array and the second groove column comprise at least one groove.
In one embodiment, the first slot array comprises 8 rectangular slots; the second slot array comprises 8 rectangular slots.
In one embodiment, the radiating element further comprises a fifth end; the fifth end part is provided with a third groove array and a fourth groove array which are respectively distributed on two sides of the fifth end part; the third groove array and the fourth groove column comprise at least one groove.
In one embodiment, the third slot array comprises 3 rectangular slots; the fourth slot array comprises 3 rectangular slots.
In one embodiment, the device further comprises a loading resistor; the loading resistor is electrically connected between the slot lines of the transition slot.
In one embodiment, the feeding unit includes an arc-shaped feeding portion and a sector-shaped feeding portion, one end of the arc-shaped feeding portion is flush with the second end portion, and the other end is connected with the sector-shaped feeding portion.
In one embodiment, the transition groove comprises a triangular groove and a rectangular groove; the triangular groove is communicated with the index-shaped groove and the rectangular groove; the loading resistor is electrically connected between the slot lines of the rectangular slot.
In one embodiment, the dielectric substrate is a rectangular dielectric substrate.
One of the above technical solutions has the following advantages and beneficial effects:
the first antenna unit and the second antenna unit are in cross-shaped clamping connection, the first antenna unit and the second antenna unit are identical in structure and size and respectively comprise a dielectric substrate, a radiation unit, a feed unit and a metal through hole, the invention designs a dual-polarized near-field measuring probe with a symmetrical plane structure based on a vivaldi type antenna, wherein a radiation unit is arranged on a first plate surface of a dielectric substrate, a feed unit is arranged on a second plate surface of the dielectric substrate, a metal through hole penetrates through the dielectric substrate and is electrically connected with the radiation unit and the feed unit, a metal isolating strip is arranged on the second plate surface of the dielectric substrate of a first antenna unit or a second antenna unit and is positioned between the feed unit of the first antenna unit and the feed unit of the second antenna unit, and because the metal isolating strip is introduced, the problem of overlarge cross polarization level of the traditional probe is solved, and the problem of poor isolation of the traditional probe is also solved.
Drawings
FIG. 1 is a schematic diagram of a first perspective view of a dual polarized near field measurement probe in accordance with an embodiment of the present invention;
FIG. 2 is a schematic diagram of a partially enlarged structure of a metal spacer of the dual-polarized near-field measurement probe according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a first perspective structure of an antenna element of a dual polarized near field measurement probe in accordance with an embodiment of the present invention;
FIG. 4 is a schematic perspective view of a first card slot of a dual polarized near field measurement probe in accordance with an embodiment of the present invention;
FIG. 5 is a schematic perspective view of a second card slot of the dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 6 is a first schematic diagram of the radiating elements of a dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 7 is a second schematic diagram of the radiating elements of the dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 8 is a third schematic diagram of the radiating elements of a dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 9 is a schematic diagram of a second perspective view of a dual polarized near field measurement probe in accordance with an embodiment of the present invention;
FIG. 10 is a schematic diagram of a second perspective view of the antenna elements of the dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 11 is a diagram of the broadband simulation results of the dual polarized near field measurement probe of the present invention in one embodiment;
FIG. 12 is a diagram illustrating the results of an isolation simulation performed by a dual polarized near field measurement probe in accordance with an embodiment of the present invention;
fig. 13 is a diagram showing the results of a gain simulation of the dual polarized near field measurement probe of the present invention in one embodiment.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element and be integral therewith, or intervening elements may also be present. The terms "open," "one end," "the other end," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
In order to solve the problems of the conventional probe that the cross polarization level is too high and the isolation degree is poor, in one embodiment, the invention provides a dual-polarization near-field measurement probe, as shown in fig. 1 and 2, comprising a first antenna unit 11, a second antenna unit 12 and a metal isolating strip 13;
as shown in fig. 3, each of the first antenna element 11 and the second antenna element 12 includes:
a dielectric substrate 21, the dielectric substrate 21 including a first plate surface 212 and a second plate surface 214 opposite to the first plate surface 212;
the radiation unit 22 is arranged on the first plate surface 212, the radiation unit 22 is provided with an index-type groove 222 and a transition groove 224, the index-type groove 222 and the transition groove 224 are both arranged in the middle of the radiation unit 22, the opening of the index-type groove 222 is arranged close to the first end 216 of the medium substrate 21, the opening of the transition groove 224 is arranged close to the second end 218 of the medium substrate 21, the first end 216 is opposite to the second end 218, and the index-type groove 222 is communicated with the transition groove 224;
a power feeding unit 24, the power feeding unit 24 being provided on the second board surface 214;
the metal via 26 penetrates through the dielectric substrate 21 and is electrically connected with the radiation unit 22 and the feed unit 24;
as shown in fig. 1, the first antenna unit 11 is connected to the second antenna unit 12 in a snap-fit manner;
the metal spacer 13 is disposed on the second plate surface 214 of the dielectric substrate 21 of the first antenna element 11 or the second antenna element 12, and the metal spacer 13 is located between the feeding unit 22 of the first antenna element 11 and the feeding unit 22 of the second antenna element 12.
The first antenna element and the second antenna element are vivaldi antennas, and the first antenna element and the second antenna element are completely the same in structure and size and are symmetrical antennas.
The first antenna unit and the second antenna unit respectively comprise a dielectric substrate, a radiation unit, a feed unit and a metal through hole.
Specifically, in one embodiment, the dielectric substrate has a relative dielectric constant ∈r2.2, loss tangent tan delta 0.02, and a rectangular dielectric substrate with a thickness of 0.5 mm. The first board surface of the dielectric substrate is provided with the upper radiation unit, the second board surface is provided with the upper feed unit and the metal isolating strip. In one embodiment, the dielectric substrate is a rectangular dielectric substrate. In this embodiment, only a rectangular dielectric substrate is illustrated, but the shape of the dielectric substrate is not limited to the rectangular dielectric substrateIt is exhaustive and other shapes are possible to apply the present invention. Wherein, the setting can be realized by the attaching and other processes.
The radiation unit is used for radiating electromagnetic waves, is provided with an index type groove, and the opening of the index type groove faces to the outer space of the radiation unit, namely the opening of the index type groove is arranged close to the first end part of the first plate surface of the dielectric substrate and used for controlling the electromagnetic waves to radiate electromagnetic energy from the tip end of the index type groove to the opening end. Wherein the index-type groove is designed by an index function.
The radiation unit is also provided with a transition groove which is communicated with the index type groove through the tip end of the index type groove.
The feeding unit is used for transmitting energy to the radiating unit, and in one embodiment, the feeding unit comprises an arc-shaped feeding part and a fan-shaped feeding part, wherein one end of the arc-shaped feeding part is flush with the third end, and the other end of the arc-shaped feeding part is connected with the fan-shaped feeding part. The feed unit adopting the structure can effectively expand the standing wave bandwidth of the dual-polarized near-field measuring probe and reduce the loss.
The metal through hole is a metalized through hole and penetrates through the dielectric substrate, and the radiation unit and the feed unit are electrically connected through the metal through hole. The metal via is formed by plating a layer of thin copper on the inner wall of the hole through a chemical reaction on the wall of the hole between the top layer and the bottom layer, so that the top layer and the bottom layer of the printed circuit board are connected with each other.
The metal isolating strip is disposed on the second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit, and the metal isolating strip is located between the feeding unit of the first antenna unit and the feeding unit of the second antenna unit, specifically, for example, as shown in fig. 3, when the metal isolating strip is disposed on the second plate surface of the dielectric substrate of the first antenna unit, the metal isolating strip is above the feeding unit, and the metal isolating strip does not intersect with the feeding unit, so as to design the length of the metal isolating strip, and the size of the metal isolating strip can be changed according to actual requirements, in the present invention, the first antenna unit and the second antenna unit are connected by means of fastening, the first antenna unit and the first antenna unit do not coincide with each other in the fastening direction, that is, the fastening direction is staggered, so that the feeding unit of the first antenna unit and the feeding unit of the second antenna unit do not intersect in the fastening direction, the metal isolating strip is arranged between the feeding unit of the first antenna unit and the feeding unit of the second antenna unit.
In one embodiment, the first antenna unit is connected with the second antenna unit in a clamping manner, and the method comprises the following steps: as shown in fig. 4, the dielectric substrate 21 of the first antenna unit 11 has a first slot 111 along the center line of the index-type slot 222 and at the first end 216;
as shown in fig. 5, the dielectric substrate 21 of the second antenna unit 12 has a second slot 121 along the center line of the index-type slot 222 and at the second end 218;
the first antenna unit 11 and the second antenna unit 12 are connected to each other by engaging the side wall of the first slot 111 with the first plate surface and the second plate surface of the dielectric substrate of the second antenna unit 12, and engaging the side wall of the second slot 121 with the first plate surface and the second plate surface of the dielectric substrate of the first antenna unit 11.
Specifically, a clamping groove is formed in each of the first antenna unit and the second antenna unit, and the distance of the first antenna unit and the second antenna unit in the clamping direction is controlled by the depth of each clamping groove. After the first antenna unit and the second antenna unit are clamped in this way, the first antenna unit and the second antenna unit are vertically crossed and connected. Therefore, the electromagnetic waves emitted by the first antenna unit and the electromagnetic waves emitted by the second antenna unit are perpendicular to each other, and a dual-polarized probe is formed.
In each embodiment of the dual-polarized near-field measuring probe, a first antenna unit and a second antenna unit are in cross-shaped clamping connection, the first antenna unit and the second antenna unit are identical in structure and size and comprise dielectric substrates, radiation units, feed units and metal through holes, the radiation units are arranged on a first plate surface of the dielectric substrate, the feed units are arranged on a second plate surface of the dielectric substrate, the metal through holes penetrate through the dielectric substrate and are electrically connected with the radiation units and the feed units, metal isolating strips are arranged on the second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit and are positioned between the feed units of the first antenna unit and the feed units of the second antenna unit, the dual-polarized near-field measuring probe with a symmetrical plane structure is designed based on vivaldi type antennas, and the problem of overlarge cross polarization level of the traditional probe is solved due to the introduction of the metal isolating strips, meanwhile, the problem of poor isolation of the traditional probe is also solved.
Based on the above embodiment, as shown in fig. 6, the radiation unit 22 further includes a third end portion and a fourth end portion opposite to the third end portion;
the third end part is provided with a first groove array 221; the fourth end is provided with a second groove array 223; the first groove array 221 and the second groove column 223 each include at least one groove.
Specifically, a first groove array and a second groove array are respectively provided on both sides (a third end and a fourth end) of the radiation unit that are symmetrical about the central axis thereof. The first slot array includes at least one slot and the second slot array includes at least one slot. Further, in one embodiment, the number of slots included in the first slot array is equal to the number of slots included in the second slot array, and the first slot array and the second slot array are symmetrically arranged at the third end and the fourth end, i.e. the first slot array and the second slot array are the same in both number of slots and size of the corresponding slots.
In each embodiment of the dual-polarized near-field measurement probe, the first groove arrays and the second groove arrays are respectively arranged on the two sides of the radiation unit, so that the cross polarization level of the dual-polarized near-field measurement probe can be improved, the size of the dual-polarized near-field measurement probe is effectively reduced, the size of a traditional antenna system is reduced, and the dual-polarized near-field measurement probe conforms to the miniaturization development trend of the conventional electronic devices.
Based on the above embodiment, further, the first slot array 221 includes 8 rectangular slots; the second groove array 223 includes 8 rectangular grooves.
Specifically, through simulation experiments, under the condition that other structures in the dual-polarized near-field measurement probe are not changed, when the first groove array comprises 8 rectangular grooves and the second groove array comprises 8 rectangular grooves, the cross polarization level of the dual-polarized near-field measurement probe is improved most beneficially. The central line of each rectangular groove of the first groove array is respectively vertical to the side edge corresponding to the first end part; the central line of each rectangular groove of the second groove array is respectively vertical to the side edge corresponding to the second end part. In one embodiment, the first slot array contains 8 rectangular slots of the same size and the second slot array contains 8 rectangular slots of the same size. Further, in one embodiment, the first slot array includes 8 rectangular slots with different sizes, and the second slot array includes 8 rectangular slots with different sizes.
In each embodiment of the dual-polarized near-field measurement probe, the first groove array comprises 8 rectangular grooves; the second groove array comprises 8 rectangular grooves, so that the size of the dual-polarized near-field measurement probe is further reduced, and the cross polarization level of the dual-polarized near-field measurement probe is further improved.
Based on the above embodiment, as shown in fig. 7, the radiation unit 22 further includes a fifth end portion; the fifth end part is provided with a third groove array 225 and a fourth groove array 227 which are respectively distributed on two sides of the fifth end part; the third slot array 225 and the fourth slot column 227 each include at least one slot.
Specifically, a third slot array and a fourth slot array are arranged at a third end of the power feeding unit, wherein the third end is a side of the power feeding unit perpendicular to the central axis of the power feeding unit. The third slot array includes at least one slot and the fourth slot array includes at least one slot. The third slot array and the fourth slot array are symmetrical about the central axis of the radiation unit, namely the third slot array and the fourth slot array are the same regardless of the number of slots and the size of corresponding slots.
In each embodiment of the dual-polarized near-field measurement probe, the radiation units are provided with the third groove array and the fourth groove array, so that the backscattering performance of the dual-polarized near-field measurement probe is improved, and the gain effect of the dual-polarized near-field measurement probe is improved.
Based on the above embodiment, the third slot array 225 includes 3 rectangular slots; the fourth slot array 227 includes 3 rectangular slots.
Specifically, through simulation experiments, under the condition that other structures in the dual-polarized near-field measurement probe are not changed, when the third groove array comprises 3 rectangular grooves and the fourth groove array comprises 3 rectangular grooves, the backscattering performance of the dual-polarized near-field measurement probe is improved, and the gain effect of the dual-polarized near-field measurement probe is improved. The central lines of the rectangular grooves of the third groove array and the fourth groove array are respectively vertical to the side edges corresponding to the third end part. In one embodiment, the third slot array contains 3 equal sized rectangular slots and the fourth slot array contains 3 equal sized rectangular slots. Further, in one embodiment, the third slot array includes 3 rectangular slots with different sizes, and the fourth slot array includes 3 rectangular slots with different sizes.
In each embodiment of the dual-polarized near-field measurement probe, the third groove array comprises 3 rectangular grooves; the fourth groove array comprises 3 rectangular grooves, so that the backscattering performance of the dual-polarized near-field measuring probe is further improved, and the gain effect of the dual-polarized near-field measuring probe is further improved.
In one embodiment, as shown in FIG. 8, a loading resistor 226 is also included; the loading resistor 226 is electrically connected between the slot lines of the transition slot 224.
Further, as shown in fig. 8, the transition groove 224 includes a triangular groove 2241 and a rectangular groove 2242; the triangular groove 2241 is communicated with the connecting index type groove 222 and the rectangular groove 2242; the loading resistor 226 is electrically connected between the slot lines of the rectangular slot 2242.
Specifically, the transition groove is a polygonal groove, and can be divided into a triangular groove and a rectangular groove, the triangular groove is communicated with the index type groove through one tip end of the triangular groove, and the triangular groove is communicated with the rectangular groove. The loading resistor is connected between the conductive layers of the enclosed rectangular slot (the radiating element itself is the conductive layer).
In each embodiment of the dual-polarized near-field measuring probe, the conducting layers on the two sides of the transition slot are connected with the loading resistor, so that the standing wave bandwidth of the dual-polarized near-field measuring probe is effectively improved.
In one embodiment, the dual polarized near field measurement probe of the present invention, as shown in fig. 9 and 10, comprises a first antenna element, a second antenna element, and a metal spacer;
the first antenna unit and the second antenna unit each include:
the dielectric substrate comprises a first plate surface and a second plate surface opposite to the first plate surface; the length of the dielectric substrate is 142.5mm (millimeter), and the width of the dielectric substrate is 142.5 mm;
the radiation unit is arranged on the first plate surface, an index-type groove and a transition groove are formed in the radiation unit, the index-type groove and the transition groove are both arranged in the middle of the radiation unit, an opening of the index-type groove is arranged close to the first end of the medium substrate, an opening of the transition groove is arranged close to the second end of the medium substrate, the first end is opposite to the second end, and the index-type groove is communicated with the transition groove;
the radiating unit further comprises a third end and a fourth end opposite to the third end; the third end part is provided with a first groove array; a second groove array is arranged on the fourth end part; the first slot array comprises 8 rectangular slots; the second slot array comprises 8 rectangular slots;
the radiating element further comprises a fifth end portion; the fifth end part is provided with a third groove array and a fourth groove array which are respectively distributed on two sides of the fifth end part; in one embodiment, the third slot array comprises 3 rectangular slots; the fourth slot array comprises 3 rectangular slots;
the loading resistor is electrically connected between the slot lines of the rectangular slot;
the feeding unit is arranged on the second board surface; the power feeding unit comprises an arc power feeding part and a fan power feeding part, one end of the arc power feeding part is flush with the third end part, and the other end of the arc power feeding part is connected with the fan power feeding part;
the metal through hole penetrates through the dielectric substrate and is electrically connected with the radiation unit and the feed unit;
the metal isolating strip is arranged on the second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit and is positioned between the feed unit of the first antenna unit and the feed unit of the second antenna unit;
the medium substrate of the first antenna unit is provided with a first clamping groove along the center line of the index-type groove and on the first end part;
the dielectric substrate of the second antenna unit is provided with a second clamping groove along the center line of the index-type groove and on the second end part;
the first antenna unit and the second antenna unit are connected with the first board surface and the second board surface of the dielectric substrate of the second antenna unit in a clamping mode through the side wall of the first clamping groove and the first board surface and the second board surface of the dielectric substrate of the first antenna unit in a clamping mode through the side wall of the second clamping groove.
Specifically, in this embodiment, the dielectric substrate has a length of 142.5mm and a width of 142.5 mm. Through performance simulation, as shown in fig. 10, the bandwidth of the standing wave less than 2.5 is 619MHz (megahertz) to 6500 MHz. As shown in fig. 11, the simulated value of the isolation due to the introduction of the metal spacer is at least 30dB (decibel). As shown in fig. 12, the cross-polarization level is at least not less than 25 dB. As shown, the maximum gain at 0.7GHz (gigahertz) is greater than 1 dB. The simulation results show that the probe designed according to the dual-polarization near-field measurement probe structure has wide bandwidth, good cross polarization level performance, high isolation and good gain effect. The scheme further provides a design structure for improving the performance of the traditional probe and reducing the size of the traditional probe, and the specific size of the design structure can be determined according to the actual use requirement.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A dual-polarization near-field measurement probe is characterized by comprising a first antenna unit, a second antenna unit and a metal isolating strip;
the first antenna unit and the second antenna unit each include:
the dielectric substrate comprises a first plate surface and a second plate surface opposite to the first plate surface;
the radiation unit is arranged on the first plate surface, an index type groove and a transition groove are formed in the radiation unit, the index type groove and the transition groove are both arranged in the middle of the radiation unit, the opening of the index type groove is arranged close to the first end of the medium substrate, the opening of the transition groove is arranged close to the second end of the medium substrate, the first end is opposite to the second end, and the index type groove is communicated with the transition groove; the opening of the index-type groove faces the first end part, and the opening of the transition groove faces the second end part of the medium substrate;
the feeding unit is arranged on the second board surface;
the metal through hole penetrates through the dielectric substrate and is electrically connected with the radiation unit and the feed unit;
the first antenna unit is connected with the second antenna unit in a clamping manner;
the metal isolating strip is arranged on a second plate surface of the dielectric substrate of the first antenna unit or the second antenna unit and is positioned between the feeding unit of the first antenna unit and the feeding unit of the second antenna unit.
2. The dual polarized near field measurement probe of claim 1, wherein the first antenna element is snap-fit connected with the second antenna element, comprising:
the medium substrate of the first antenna unit is provided with a first clamping groove along the center line of the index-type groove and on the first end part;
the dielectric substrate of the second antenna unit is provided with a second clamping groove along the center line of the index-type groove and on the second end part;
the first antenna unit and the second antenna unit are connected in a clamping mode through the side wall of the first clamping groove and the effect of the first plate surface and the second plate surface of the dielectric substrate of the second antenna unit, and the side wall of the second clamping groove and the effect of the first plate surface and the second plate surface of the dielectric substrate of the first antenna unit.
3. The dual polarized near field measurement probe of claim 2, wherein the radiating element further comprises a third end and a fourth end opposite the third end;
a first groove array is formed in the third end part; a second groove array is formed in the fourth end part; the first slot array and the second slot column each comprise at least one slot.
4. The dual polarized near field measurement probe of claim 3, wherein the first array of slots comprises 8 rectangular slots; the second slot array comprises 8 rectangular slots.
5. The dual polarized near field measurement probe of any of claims 1 to 4, wherein the radiating element further comprises a fifth end portion;
the fifth end part is provided with a third groove array and a fourth groove array which are respectively distributed on two sides of the second end part; the third groove array and the fourth groove column comprise at least one groove.
6. The dual polarized near field measurement probe of claim 5, wherein the third array of slots comprises 3 rectangular slots; the fourth slot array comprises 3 rectangular slots.
7. The dual polarized near field measurement probe of claim 6, further comprising a loading resistor; the loading resistor is electrically connected between the groove lines of the transition groove.
8. The dual polarized near field measurement probe of claim 7, wherein the feed element comprises an arc-shaped feed portion and a sector-shaped feed portion, one end of the arc-shaped feed portion being flush with the second end portion and the other end being connected to the sector-shaped feed portion.
9. The dual polarized near field measurement probe of claim 8, wherein the transition slot comprises a triangular slot and a rectangular slot; the triangular groove is communicated with the index-shaped groove and the rectangular groove; the loading resistor is electrically connected between the slot lines of the rectangular slot.
10. The dual polarized near field measurement probe of claim 9, wherein the dielectric substrate is a rectangular dielectric substrate.
CN201810508524.XA 2018-05-24 2018-05-24 Dual-polarized near-field measuring probe Active CN108761218B (en)

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