CN108710580A - A kind of bad block management method promoting storage device active volume - Google Patents

A kind of bad block management method promoting storage device active volume Download PDF

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Publication number
CN108710580A
CN108710580A CN201810395368.0A CN201810395368A CN108710580A CN 108710580 A CN108710580 A CN 108710580A CN 201810395368 A CN201810395368 A CN 201810395368A CN 108710580 A CN108710580 A CN 108710580A
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CN
China
Prior art keywords
module unit
block
bad block
good
bad
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201810395368.0A
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Chinese (zh)
Inventor
谢享奇
李庭育
魏智汎
蔡定国
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Jiangsu Hua Cun Electronic Technology Co Ltd
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Jiangsu Hua Cun Electronic Technology Co Ltd
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Publication date
Application filed by Jiangsu Hua Cun Electronic Technology Co Ltd filed Critical Jiangsu Hua Cun Electronic Technology Co Ltd
Priority to CN201810395368.0A priority Critical patent/CN108710580A/en
Priority to PCT/CN2018/105859 priority patent/WO2019205444A1/en
Publication of CN108710580A publication Critical patent/CN108710580A/en
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/0223User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023Free address space management
    • G06F12/0238Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The invention discloses a kind of bad block management methods promoting storage device active volume, the purpose of the present invention is with the concept of virtual plane, the number that good block was erased in the good block message and unit being denoted as in the module unit that can not be used using fuzzy theory record counts, and it is corresponded on the address of block using mapping table mode for when judging that bad number of blocks is less than sample rate via Fuzzy Optimal Control in the module unit that can not be used, and it can will completely gather out in a good module unit income to virtual plane, when read-write is to module unit in virtual plane, automatically the address mapping of bad block can be gone to the good block address prepared, effectively preserve the maximization of storage device use space, since the module unit in more several virtual planes shares the read-write number of each block, the service life of whole device can be effectively increased.

Description

A kind of bad block management method promoting storage device active volume
Technical field
The present invention relates to bad block management technical field, specially a kind of bad block management side promoting storage device active volume Method.
Background technology
Flash data access can be limited by the factor of data endurance, storage reliability and Dyslexia, in the life of memory Ordering can be because prolonged access generates abnormal bad block in the period, therefore master component must be done for this characteristic at fine or not block Reason mechanism, avoids data from causing mistake because of writing in bad block.Include 4 planes, Mei Geping inside the bare die of general flash memory Face includes several pieces, and since storage device is under the high request of read performance, master component can be deposited using more plane modes of interlocking It takes, the parallel read-write motion of homochronousness is exactly done with the corresponding solid block of 4 planes, 4 block groups are come as a module unit Effectively management.The Bad Block Management mechanism of main control processor is exactly to manage the module unit in each bare die, is appointed when having in module unit Mistake, which occurs, for what block to avoid firmware journey in use, this module unit can be denoted as the module unit that can not be used by master control Sequence accidentally uses backward.This mechanism can effectively ensure that master control will will not be counted accidentally in a manner of interlocking by more planes when reading and writing data According to writing in bad block.However this mode can cause a disadvantage, if only a quarter bad block in a module unit, His 3/4ths blocks for being all will result in up to 3/4ths unnecessary storage spaces wastes, what is more if bad block It occurs mostly in approximately the same plane, and when the corresponding block address of other planes is all available situation, entire flash memory is naked The entity parking space of piece will be greatly decreased.
Invention content
It is above-mentioned to solve the purpose of the present invention is to provide a kind of bad block management method promoting storage device active volume The problem of being proposed in background technology.
To achieve the above object, the present invention provides the following technical solutions:A kind of bad block promoting storage device active volume Management method includes the following steps:
A, each entity bare die is cut into several module units as the basic unit of Bad Block Management by master component;
B, bad block occurs when master component such as erases as data, reads or be written to flash memory at the actions, at this time Bad Block Management mechanism Module unit existing for this bad block can be denoted as using;
C, the defect block addresses that can not be used in module unit are indicated, and arrange the information for noting down all good blocks;
What the sequentially one-to-one image again of bad block present in D, being denoted as in the module unit that can not be used was recorded to step C Number block address, when the bad block in module unit all can by image again to good block address when, change using this module unit as virtual plane It is set as available module unit;
E, when master component receiving host order accesses the module unit to virtual plane;
F, by mapping table by the good block address in the defect block addresses image in virtual plane to other available module units;
G, it is confirmed whether newly-increased bad block and returns to main flow.
Preferably, master component forms a module unit with each block of 4 planes in the step A.
Compared with prior art, the beneficial effects of the invention are as follows:The purpose of the present invention is with the concept of virtual plane, utilize The number that good block was erased in the good block message and unit that fuzzy theory record is denoted as in the module unit that can not be used is done Statistics, and use image for when judging that bad number of blocks is less than sample rate via Fuzzy Optimal Control in the module unit that can not be used Table mode has corresponded on the address of block, and can will completely gather out in a good module unit income to virtual plane, works as read-write When module unit in virtual plane, the address mapping of bad block can be gone automatically to the good block address prepared, effectively preserve and store The maximization of device use space, since the module unit in more several virtual planes shares the read-write number of each block, energy It is effectively increased the service life of whole device.
Description of the drawings
Fig. 1 is bad block management schematic diagram of the present invention;
Fig. 2 is bad block management flow chart of the present invention.
Specific implementation mode
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation describes, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
- 2 are please referred to Fig.1, the present invention provides a kind of technical solution:A kind of bad block management promoting storage device active volume Method includes the following steps:
A, master component forms a module unit with each block of 4 planes, and each entity bare die is cut into several module units Basic unit as Bad Block Management;
B, bad block occurs when master component such as erases as data, reads or be written to flash memory at the actions, at this time Bad Block Management mechanism Module unit existing for this bad block can be denoted as using;
C, the defect block addresses that can not be used in module unit are indicated, and arrange the information for noting down all good blocks;
What the sequentially one-to-one image again of bad block present in D, being denoted as in the module unit that can not be used was recorded to step C Number block address, when the bad block in module unit all can by image again to good block address when, change using this module unit as virtual plane It is set as available module unit;
E, when master component receiving host order accesses the module unit to virtual plane;
F, by mapping table by the good block address in the defect block addresses image in virtual plane to other available module units;
G, it is confirmed whether newly-increased bad block and returns to main flow.
In the present invention, still available block message in above-mentioned module unit is recorded by fuzzy theory, is judged each The good block message of module unit simultaneously counts strange good block and erases number, is permitted to do well good good block and sequentially through threshold values through fuzzy optimization Image is to the address of bad block, and bad block inside the module unit that can not entirely use is all on mapped to available piece When, firmware program can become available module unit with the concept of virtual plane by the module unit that can not be used is labeled.
The purpose of the present invention is with the concept of virtual plane, the block list that can not be used is denoted as using fuzzy theory record The number that good block was erased in good block message and unit in member counts, and interior via mould for the module unit that can not be used Paste optimal control judges to have corresponded on the address of block using mapping table mode when bad number of blocks is less than sample rate, and can be complete It gathers out in a good module unit income to virtual plane, it, can be automatically by bad block when read-write is to module unit in virtual plane Address mapping gone to the good block address prepared, the maximization of storage device use space is effectively preserved, due to more several void Module unit in quasi-plane shares the read-write number of each block, can be effectively increased the service life of whole device.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with Understanding without departing from the principles and spirit of the present invention can carry out these embodiments a variety of variations, modification, replace And modification, the scope of the present invention is defined by the appended.

Claims (2)

1. a kind of bad block management method promoting storage device active volume, it is characterised in that:Include the following steps:
A, each entity bare die is cut into several module units as the basic unit of Bad Block Management by master component;
B, bad block occurs when master component such as erases as data, reads or be written to flash memory at the actions, at this time Bad Block Management mechanism Module unit existing for this bad block can be denoted as using;
C, the defect block addresses that can not be used in module unit are indicated, and arrange the information for noting down all good blocks;
What the sequentially one-to-one image again of bad block present in D, being denoted as in the module unit that can not be used was recorded to step C Number block address, when the bad block in module unit all can by image again to good block address when, change using this module unit as virtual plane It is set as available module unit;
E, when master component receiving host order accesses the module unit to virtual plane;
F, by mapping table by the good block address in the defect block addresses image in virtual plane to other available module units;
G, it is confirmed whether newly-increased bad block and returns to main flow.
2. a kind of bad block management method promoting storage device active volume according to claim 1, it is characterised in that:Institute It states master component in step A and one module unit is formed with each block of 4 planes.
CN201810395368.0A 2018-04-27 2018-04-27 A kind of bad block management method promoting storage device active volume Withdrawn CN108710580A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201810395368.0A CN108710580A (en) 2018-04-27 2018-04-27 A kind of bad block management method promoting storage device active volume
PCT/CN2018/105859 WO2019205444A1 (en) 2018-04-27 2018-09-14 Bad block management method for increasing available capacity of storage device

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Application Number Priority Date Filing Date Title
CN201810395368.0A CN108710580A (en) 2018-04-27 2018-04-27 A kind of bad block management method promoting storage device active volume

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WO (1) WO2019205444A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112578993A (en) * 2019-09-27 2021-03-30 北京忆恒创源科技有限公司 Method for processing programming error of multi-plane NVM and storage device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114968066A (en) * 2021-02-19 2022-08-30 瑞昱半导体股份有限公司 Method and apparatus for fault block management in flash memory

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100520734C (en) * 2005-11-18 2009-07-29 凌阳科技股份有限公司 Control apparatus and method of flash memory
CN104360958A (en) * 2014-12-09 2015-02-18 哈尔滨工业大学 Bad block management system and bad block management method based on block reservation area replacement
CN109783017B (en) * 2015-01-27 2021-05-18 华为技术有限公司 Storage device bad block processing method and device and storage device
CN105843749B (en) * 2016-03-24 2019-01-25 浙江大学 A kind of NAND Flash fault-tolerance approach based on FPGA

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112578993A (en) * 2019-09-27 2021-03-30 北京忆恒创源科技有限公司 Method for processing programming error of multi-plane NVM and storage device

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Application publication date: 20181026