CN108680773A - A kind of test contact chip connector - Google Patents
A kind of test contact chip connector Download PDFInfo
- Publication number
- CN108680773A CN108680773A CN201810652706.4A CN201810652706A CN108680773A CN 108680773 A CN108680773 A CN 108680773A CN 201810652706 A CN201810652706 A CN 201810652706A CN 108680773 A CN108680773 A CN 108680773A
- Authority
- CN
- China
- Prior art keywords
- contact chip
- conductive sheet
- mounting groove
- test contact
- fixed plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 61
- 238000003825 pressing Methods 0.000 claims abstract description 30
- 238000003780 insertion Methods 0.000 claims description 17
- 230000037431 insertion Effects 0.000 claims description 17
- 238000009434 installation Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000013100 final test Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000005728 strengthening Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000000686 essence Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a kind of test contact chip connectors, it is characterised in that：Fixed plate including interconnection（1）With pressing plate（2）, and be arranged in fixed plate（1）With pressing plate（2）Between conductive sheet（3）.The present invention's is not only simple in structure, and it is of low cost, p-wire is welded on to one end of conductive sheet when use, the testing needle for testing contact chip is patched to the i.e. accessible conducting of the other end in conductive sheet again, then time and manpower need not be spent to remove the connection between p-wire and testing needle again when replacing test contact chip, therefore it can save time and manpower, be suitble to promote the use of.
Description
Technical field
The present invention relates to a kind of connector more particularly to a kind of test contact chip connectors.
Background technology
Before the completion of semiconductor product manufacturing process, need to enter the final test stage, final test is to utilize test machine
Platform（Tester）, sorting machine (Handler), test board (DUT Board) and test contact chip（Test Finger）Between
Matched combined tests each product.In the case where not needing peripheral components cooperation, the p-wire of test machine directly welds
The pin of tested semiconductor product, is directly contacted the other end of testing needle by testing needle one end onto test contact chip, from
And complete the test of product.Because p-wire is welded direct on the testing needle on test contact chip in use, and is surveyed
Test point needs are frequently contacted with pins of products, and testing needle will carry out the voltage between pins of products and p-wire, electricity at the time of contact
The conduction of the electric signals such as stream, will lead to testing needle serious wear, to cause test parameter to fail, then needs replacing at this time new
Test contact chip.Replace test contact chip when need technical staff by it is old test contact chip on p-wire by welding
It removes, then p-wire is welded on new test contact chip and on sorting machine, it is therefore desirable to expend time and manpower.
Invention content
It is an object of the invention to against the above deficiency, provide a kind of test contact chip connector, to replacement to be solved
The problem of manpower being needed when new test contact chip and the time is spent to disconnect p-wire and testing needle.
The purpose of invention is achieved through the following technical solutions：
A kind of test contact chip connector, includes the fixed plate and pressing plate of interconnection, and setting fixed plate and pressing plate it
Between conductive sheet.
Further, the fixed plate is equipped with is mounted on installation with the matched mounting groove of conductive sheet, the conductive sheet
In slot.
Further, described mounting groove one end is insertion end, and the other end is terminals, is located at the conductive sheet of insertion end
It is equipped with arc contact head, the pressing plate is equipped with and the matched escape groove of arc contact head.
For the ease of contacting the testing needle tested on contact chip with conductive sheet, the insertion end of the mounting groove is equipped with test
Contact chip slot.
For the ease of positioning and compressing conductive sheet when installation, the pressing plate is equipped with and the matched briquetting of mounting groove, institute
State the terminals that briquetting is located at mounting groove.
In order to which the present invention is better achieved, the conductive sheet is bonded in fixed plate, and the pressing plate is also bonded in fixed plate
On.
In order to ensure effect, the pressing plate is equipped with the screw being connected with fixed plate, and the screw is located at mounting groove
Insertion end.
The present invention compared with the prior art, has the following advantages and advantageous effect：
（1）The present invention's is not only simple in structure, and of low cost, and p-wire is welded on one end of conductive sheet by when use, then
The testing needle for testing contact chip is patched into the i.e. accessible conducting of the other end in conductive sheet, is not needed then when replacing test contact chip
It spends time and manpower to remove the connection between p-wire and testing needle again, therefore can save time and manpower.
（2）The present invention fixed plate be equipped with the matched mounting groove of conductive sheet, by conductive sheet be mounted on mounting groove in
Conductive sheet can be connected in fixed plate.
（3）Mounting groove one end of the present invention is insertion end, and the other end is terminals, is set on the conductive sheet of insertion end
Have an arc contact head, pressing plate be equipped with the matched escape groove of arc contact head, facilitate and patch test contact chip in arc
On contact head, to make testing needle contact conducting with arc contact head.
（4）The insertion end of the mounting groove of the present invention is equipped with test contact chip slot, conveniently patches test contact chip.
（5）The pressing plate of the present invention is equipped with is located at the terminals of mounting groove with the matched briquetting of mounting groove, the briquetting,
It can be by being positioned after briquetting and mounting groove cooperation when pressing plate is mounted in fixed plate, while it can also will be conductive by briquetting
Piece is pressed in mounting groove.
（6）The conductive sheet of the present invention is bonded in fixed plate, and pressing plate is also bonded in fixed plate, the low also side of fixed cost
Convenient to operate.
（7）The pressing plate of the present invention is equipped with the screw being connected with fixed plate, and the screw is located at the insertion end of mounting groove,
Connection that can be between the pressing plate and fixed plate at strengthening arc-shaped contact head position.
Description of the drawings
Fig. 1 is that the conductive sheet of the present invention is mounted on the structural schematic diagram in fixed plate.
Fig. 2 is the structural schematic diagram of the pressing plate of the present invention.
Wherein, entitled corresponding to the reference numeral in attached drawing：
1-fixed plate, 2-pressing plates, 3-conductive sheets, 4-mounting grooves, 5-arc contact heads, 6-escape groove, 7-test contacts
Piece slot.
Specific implementation mode
The present invention is described in further detail with reference to embodiment.
Embodiment
As shown in Figure 1, 2, test contact chip connector of the invention, including the fixed plate 1 of interconnection and pressing plate 2,
The conductive sheet 3 being additionally provided with for connecting test line and testing needle between the fixed plate 1 and pressing plate 2.Due to the test of the present invention
Line is connected on conductive sheet 3, and the time need not then be spent to remove p-wire again with manpower and survey when needing replacing test contact chip
Connection between test point, therefore can save time and manpower.For the ease of conductive sheet 3 to be mounted in fixed plate 1, described solid
Fixed board 1, which is equipped with, to be mounted on 3 matched mounting groove 4 of conductive sheet, the conductive sheet 3 in mounting groove 4, as shown in Figure 1.
4 one end of the mounting groove is insertion end, and the other end is terminals, is welded on p-wire correspondence when use and is located at
On the conductive sheet 3 of the terminals of mounting groove 4, then testing needle is connected on the conductive sheet 3 of the insertion end of mounting groove 4 i.e.
It can.For the ease of testing needle to be connect with conductive sheet 3, the conductive sheet 3 for being located at insertion end is equipped with arc contact head 5, the pressure
Plate 2 is equipped with and 5 matched escape groove 6 of arc contact head.It is patched in arc contact head 5 for the ease of contact chip will be tested
On, the insertion end of the mounting groove 4 is additionally provided with test contact chip slot 7.
For the ease of being positioned when pressing plate 2 is mounted in fixed plate 1, pressing plate 2 of the invention is equipped with and mounting groove 4
Matched briquetting 8, the briquetting 8 are located at the terminals of mounting groove 4, and conductive sheet 3 can be also pressed on mounting groove 4 by when installation
In.The present invention is fixed by the way of bonding, i.e., the conductive sheet 3 is bonded in fixed plate 1, and the pressing plate 2 is also bonded
In fixed plate 1, fixed cost is low to be also conveniently operated.It needs frequently to patch test contact chip in arc contact head when use
5, repeatedly patch causes between pressing plate 2 and fixed plate 1 there is a phenomenon where loosening in order to prevent, and the pressing plate 2 is equipped with and fixation
The screw that plate 1 is connected, the screw are located at the insertion end of mounting groove 4, so as to the solid pressure plate at 5 position of strengthening arc-shaped contact head
Connection between 1 and pressing plate 2.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
All any modification, equivalent and improvement etc., should all be included in the protection scope of the present invention made by within refreshing and principle.
Claims (7)
1. a kind of test contact chip connector, it is characterised in that：Fixed plate including interconnection（1）With pressing plate（2）, Yi Jishe
It sets in fixed plate（1）With pressing plate（2）Between conductive sheet（3）.
2. a kind of test contact chip connector according to claim 1, it is characterised in that：The fixed plate（1）It is equipped with
With conductive sheet（3）Matched mounting groove（4）, the conductive sheet（3）Mounted on mounting groove（4）In.
3. a kind of test contact chip connector according to claim 2, it is characterised in that：The mounting groove（4）One end is
Insertion end, the other end are terminals, are located at the conductive sheet of insertion end（3）It is equipped with arc contact head（5）, the pressing plate（2）
It is equipped with and arc contact head（5）Matched escape groove（6）.
4. a kind of test contact chip connector according to claim 3, it is characterised in that：The mounting groove（4）Insertion
End is equipped with test contact chip slot（7）.
5. a kind of test contact chip connector according to claim 3, it is characterised in that：The pressing plate（2）Be equipped with
Mounting groove（4）Matched briquetting（8）, the briquetting（8）Positioned at mounting groove（4）Terminals.
6. a kind of test contact chip connector according to claim 1, it is characterised in that：The conductive sheet（3）It is bonded in
Fixed plate（1）On, the pressing plate（2）Also it is bonded in fixed plate（1）On.
7. a kind of test contact chip connector according to claim 3, it is characterised in that：The pressing plate（2）Be equipped with
Fixed plate（1）The screw being connected, the screw are located at mounting groove（4）Insertion end.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810652706.4A CN108680773A (en) | 2018-06-22 | 2018-06-22 | A kind of test contact chip connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810652706.4A CN108680773A (en) | 2018-06-22 | 2018-06-22 | A kind of test contact chip connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108680773A true CN108680773A (en) | 2018-10-19 |
Family
ID=63811786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810652706.4A Pending CN108680773A (en) | 2018-06-22 | 2018-06-22 | A kind of test contact chip connector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108680773A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298432A (en) * | 2023-05-24 | 2023-06-23 | 南方电网科学研究院有限责任公司 | Electric wire connecting device based on electric power standard detection |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM248045U (en) * | 2003-12-02 | 2004-10-21 | Niketech Electronic Corp | Improved terminal structure of connector |
| TWM268755U (en) * | 2004-07-30 | 2005-06-21 | Waqo Technology Co Ltd | Assembly of signal transmission line and connector |
| CN202057751U (en) * | 2011-03-29 | 2011-11-30 | 昆山德力康电子科技有限公司 | Connector electric probing device |
| CN203631768U (en) * | 2013-11-30 | 2014-06-04 | 国家电网公司 | Multifunctional wiring terminal |
-
2018
- 2018-06-22 CN CN201810652706.4A patent/CN108680773A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM248045U (en) * | 2003-12-02 | 2004-10-21 | Niketech Electronic Corp | Improved terminal structure of connector |
| TWM268755U (en) * | 2004-07-30 | 2005-06-21 | Waqo Technology Co Ltd | Assembly of signal transmission line and connector |
| CN202057751U (en) * | 2011-03-29 | 2011-11-30 | 昆山德力康电子科技有限公司 | Connector electric probing device |
| CN203631768U (en) * | 2013-11-30 | 2014-06-04 | 国家电网公司 | Multifunctional wiring terminal |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298432A (en) * | 2023-05-24 | 2023-06-23 | 南方电网科学研究院有限责任公司 | Electric wire connecting device based on electric power standard detection |
| CN116298432B (en) * | 2023-05-24 | 2023-09-15 | 南方电网科学研究院有限责任公司 | Electric wire connecting device based on electric power standard detection |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20181019 |
|
| WD01 | Invention patent application deemed withdrawn after publication |