CN108663694B - Baseband chip performance test method and device - Google Patents
Baseband chip performance test method and device Download PDFInfo
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- CN108663694B CN108663694B CN201810246379.2A CN201810246379A CN108663694B CN 108663694 B CN108663694 B CN 108663694B CN 201810246379 A CN201810246379 A CN 201810246379A CN 108663694 B CN108663694 B CN 108663694B
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- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
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Abstract
The invention provides a method and a device for testing the performance of a baseband chip, wherein the baseband chip to be tested is arranged on a test board, and the method comprises the following steps: under test conditions and N test scenes corresponding to the performance test, outputting test signals to the baseband chip to be tested according to test signal output rules corresponding to the performance test, receiving a positioning result output by the baseband chip to be tested in the test time, and determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time. The starting performance or the re-locking performance of the baseband chip under different environments can be tested, and a basis is provided for selecting the baseband chip in practical application.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a method and a device for testing performance of a baseband chip.
Background
Due to the particularity of the navigation environment, the shipborne navigation equipment has higher requirements on reliability, shock resistance, moisture resistance, high temperature resistance, direct light prevention and the like compared with the navigation equipment in the common environment, and therefore the shipborne navigation equipment can be installed on the ship by adopting an international uniform measurement standard and meeting the required test result through a uniform and strict detection test program.
The main component of the shipborne navigation equipment is a baseband chip, and the positioning precision of the baseband chip can be changed due to the change of the external environment. In the actual application process, the positioning accuracy of the baseband chip in different environments is required to meet certain requirements, the marine environment (the temperature, the humidity, the electromagnetic interference and the like in four seasons) is greatly changed, the baseband chip is required to be capable of achieving the required positioning accuracy in different environments, and the starting performance and the re-locking performance of the baseband chip in different positioning accuracies are different, so that the baseband chip needs to be tested in the starting performance and the re-locking performance before being used, the starting performance test comprises a cold-start first positioning time test and a hot-start first positioning time test, and the re-locking performance test is a re-capturing time test.
However, how to perform the performance test of the baseband chip does not have an effective solution at present.
Disclosure of Invention
The invention provides a method and a device for testing the performance of a baseband chip, which can test the starting performance or the re-locking performance of the baseband chip in different environments and provide a basis for selecting the baseband chip in practical application.
The first aspect of the present invention provides a method for testing the performance of a baseband chip, wherein the baseband chip to be tested is arranged on a test board, and the method comprises the following steps:
under test conditions corresponding to the performance test and N test scenes, outputting test signals to the baseband chip to be tested according to test signal output rules corresponding to the performance test;
receiving a positioning result output by the baseband chip to be tested within the testing time;
and determining performance test parameters according to the positioning result, wherein the performance test parameters are cold-start first-time positioning time, hot-start first-time positioning time or recapture time.
Optionally, the performance test parameter is a cold start first positioning time or a hot start first positioning time, and the test signal output rule corresponding to the performance test is as follows:
outputting a test signal to the baseband chip to be tested;
the determining performance test parameters according to the positioning result comprises:
measuring the time interval T from the time when the to-be-tested baseband chip receives the test signal to the time when the to-be-tested baseband chip outputs the first positioning result meeting the positioning precision requirementiAnd according to the corresponding N T under the N test scenesiA cold start first fix time or a hot start first fix time is determined.
Optionally, the performance test parameter is a cold start first positioning time, and the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 Beidou second-order BD-2 satellites, the precision degree PDOP of the position of the satellite tracked by the baseband chip to be tested is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the performance test parameter is a hot start first positioning time, and the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The base band chip to be tested can track 12 Beidou second-order BD-2 satellites, the PDOP of the position of the base band chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the performance test parameter is recapture time, and the test signal output rule corresponding to the performance test is as follows:
outputting a test signal to the baseband chip to be tested, and continuing to output the test signal after the test signal is interrupted for the first time;
the receiving of the positioning result output by the baseband chip to be tested in the testing time includes:
receiving a positioning result output by the baseband chip to be tested within the testing time after the test signal is interrupted;
the determining performance test parameters according to the positioning result comprises:
measuring the time interval T from the moment the test signal is received again after the test signal is interrupted to the moment the first positioning result meeting the positioning precision requirement is output by the to-be-tested baseband chipjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined.
Optionally, the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 BD-2 satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the positioning accuracy requirement is as follows: the positioning result is less than 60 meters continuously for 10 times.
A second aspect of the present invention provides a device for testing performance of a baseband chip, in which a baseband chip to be tested is disposed on a test board, the device including:
the signal output module is used for outputting a test signal to the baseband chip to be tested according to a test signal output rule corresponding to the performance test under the test condition corresponding to the performance test and N test scenes;
the receiving module is used for receiving a positioning result output by the baseband chip to be tested within the testing time;
and the determining module is used for determining performance test parameters according to the positioning result, wherein the performance test parameters are cold-start first-time positioning time, hot-start first-time positioning time or recapture time.
Optionally, the performance test parameter is a cold start first positioning time or a hot start first positioning time, and the test signal output rule corresponding to the performance test is as follows:
outputting a test signal to the baseband chip to be tested;
the determining module is used for measuring the time interval T from the time when the to-be-tested baseband chip receives the test signal to the time when the to-be-tested baseband chip outputs the first positioning result meeting the positioning precision requirementiAnd according to the corresponding N T under the N test scenesiA cold start first fix time or a hot start first fix time is determined.
Optionally, the performance test parameter is a cold start first positioning time, and the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 Beidou second-order BD-2 satellites, the precision degree PDOP of the position of the satellite tracked by the baseband chip to be tested is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the performance test parameter is a hot start first positioning time, and the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The base band chip to be tested can track 12 Beidou second-order BD-2 satellites, the PDOP of the position of the base band chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the performance test parameter is recapture time, and the test signal output rule corresponding to the performance test is as follows:
outputting a test signal to the baseband chip to be tested, and continuing to output the test signal after the test signal is interrupted for the first time;
the receiving module is used for receiving a positioning result output by the baseband chip to be tested within the testing time after the test signal is interrupted;
the determining module is used for measuring the time interval T from the moment that the to-be-tested baseband chip receives the test signal again after the test signal is interrupted to the moment that the first positioning result meeting the positioning precision requirement is outputjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined.
Optionally, the test conditions include:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of the acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 BD-2 satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Optionally, the positioning accuracy requirement is as follows: the positioning result is less than 60 meters continuously for 10 times.
A third aspect of the present invention provides a baseband chip performance testing apparatus, including: at least one processor and memory;
the memory stores computer-executable instructions;
the at least one processor executes the computer-executable instructions stored in the memory, so that the baseband chip performance testing device executes the baseband chip performance testing method.
A fourth aspect of the present invention provides a computer-readable storage medium, which stores computer-executable instructions, and when the computer-executable instructions are executed by a processor, the method for testing the performance of a baseband chip is implemented.
The invention provides a method and a device for testing performance of a baseband chip. And receiving a positioning result output by the baseband chip to be tested within the testing time. And determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time. Therefore, the starting performance or the re-locking performance of the baseband chip under different environments can be tested, and a basis is provided for selecting the baseband chip in practical application.
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FIG. 1 is a flow chart of a method for testing the performance of a baseband chip according to the present invention;
FIG. 2 is a schematic flow chart of a method for testing performance of a baseband chip according to the present invention;
FIG. 3 is a schematic block diagram of a connection between a baseband chip performance testing apparatus and a device under test;
FIG. 4 is a schematic flow chart of a method for testing performance of a baseband chip according to the present invention;
fig. 5 is a schematic structural diagram of a baseband chip performance testing apparatus provided in the present invention;
fig. 6 is a schematic structural diagram of a baseband chip performance testing apparatus provided in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The method for testing the performance of the baseband chip can be used for testing the Beidou compatible navigation type dual-mode baseband chip and can also be used for testing the single-mode baseband chip of the Beidou I and Beidou II global satellite navigation systems.
FIG. 1 is a schematic flow chart of a method for testing performance of a baseband chip according to the present invention; the execution main body of the method flow shown in fig. 1 may be a baseband chip performance testing apparatus, and the baseband chip performance testing apparatus may be implemented by any software and/or hardware. As shown in fig. 1, the method for testing performance of a baseband chip provided in this embodiment may include:
s101, under the test conditions and the N test scenes corresponding to the performance test, outputting test signals to the baseband chip to be tested according to the test signal output rule corresponding to the performance test.
S102, receiving a positioning result output by the baseband chip to be tested within the testing time.
S103, determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time.
Specifically, the performance test in this embodiment includes a start performance test and a double-lock performance test, and when the performance test parameter is a cold start first positioning time or a hot start first positioning time, the test signal output rule corresponding to the performance test is as follows: and outputting a test signal to the baseband chip to be tested. In this case, S103 may specifically be: measuring the time interval T from the time when the baseband chip to be tested receives the test signal to the time when the first positioning result meeting the positioning precision requirement is outputiAnd according to the corresponding N T under the N test scenesiA cold start first fix time or a hot start first fix time is determined.
When the performance test parameter is recapture time, the test signal output rule corresponding to the performance test is as follows: and outputting a test signal to the baseband chip to be tested, and continuously outputting the test signal after the test signal is interrupted for the first time. In this case, S102 may specifically be: and receiving a positioning result output by the baseband chip to be tested within the test time after the test signal is interrupted. In this case, S103 may specifically be: measuring the time interval T from the moment that the to-be-tested baseband chip receives the test signal again after the test signal is interrupted to the moment that the first positioning result meeting the positioning precision requirement is outputjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined.
Optionally, the positioning accuracy requirement is as follows: the positioning result is less than 60 meters continuously for 10 times.
In the method for testing performance of a baseband chip provided in this embodiment, under the test conditions and N test scenes corresponding to the performance test, the test signal is output to the baseband chip to be tested according to the test signal output rule corresponding to the performance test. And receiving a positioning result output by the baseband chip to be tested within the testing time. And determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time. Therefore, the starting performance or the re-locking performance of the baseband chip under different environments can be tested, and a basis is provided for selecting the baseband chip in practical application.
FIG. 2 is a schematic flow chart of a method for testing performance of a baseband chip according to the present invention; the execution main body of the method flow shown in fig. 2 may be a baseband chip performance testing apparatus, and the baseband chip performance testing apparatus may be implemented by any software and/or hardware. As shown in fig. 2, the method for testing performance of a baseband chip provided in this embodiment may include:
s201, under the test condition corresponding to the starting performance test and N test scenes, outputting a test signal to the baseband chip to be tested, and receiving a positioning result output by the baseband chip to be tested within the test time.
When testing, the baseband chip to be tested needs to be provided with a matched bottom plate, the bottom plate is arranged on the testing plate, the bottom plate can be fixedly arranged on the testing plate to prevent the bottom plate from moving in the running process of the ship, the testing plate can be a circuit board, for example, the testing plate is an OEM plate, the baseband chip to be tested is arranged on the bottom plate, and the test board does not contain other auxiliary navigation devices or low-noise amplifier devices and the like.
Specifically, a baseband chip to be tested is disposed on a test board disposed in a device under test, and fig. 3 is a schematic block diagram of a connection between a baseband chip performance testing apparatus and the device under test, where the connection between the baseband chip performance testing apparatus and the device under test in this embodiment is as shown in fig. 3, the baseband chip performance testing apparatus outputs a test signal to the device under test, and optionally, outputs a Radio Frequency (RF) signal through a Radio Frequency (RF) interface on the test board, and the baseband chip performance testing apparatus further outputs a control signal to the device under test to control the device under test to be powered on or powered off; and the tested equipment outputs a positioning result to the baseband chip performance testing device.
Specifically, the starting performance test includes a cold-start first positioning time test and a hot-start first positioning time test, and the cold-start first positioning time refers to the time required by a baseband chip (also called a device to be tested) from power-on to the time of meeting the positioning accuracy requirement for the first time under the condition of no information such as a valid ephemeris, an almanac, an approximate position and time. The hot start first positioning time refers to the time required by a baseband chip (also called a device under test) to be tested from power-on to the time when the positioning accuracy requirement is met for the first time under the condition that information such as effective ephemeris, almanac, approximate position and time exists.
Firstly, in the testing process, the performance testing apparatus of the baseband chip in this embodiment generates N testing scenarios in a simulation manner, where N is a preset value, and different testing scenarios are different, such as temperature, humidity, and electromagnetic interference. Next, the baseband chip performance testing apparatus in this embodiment sets a testing condition, optionally, if the start performance test is a cold start first positioning time test, the testing condition includes: 1) setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) In a single mode (BD) mode, the baseband chip to be tested can track at least 9 Beidou second- # BD-2 satellites, the precision (PDOP) of the position of the satellite tracked by the baseband chip to be tested is less than or equal to 5, and a test signal is a frequency point signal corresponding to the BD-2 satellite, such as a B1 frequency point I branch signal; or, in a dual mode, such as a BD + Global Positioning System (GPS) mode, the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, a PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites, such as B1 frequency point I branch signals and L1 frequency point I branch signals.
If the starting performance test is a hot-start first positioning time test, the test conditions comprise: 1) setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) Under the single BD mode, the base band chip to be tested can track 12 Beidou second (BD-2) satellites, the PDOP of the base band chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or, in the dual-mode (BD + GPS), the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the satellite position is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellite and frequency point signals corresponding to the GPS satellite.
Alternatively, the test signal power may be set to-130 dBm.
The baseband chip performance testing device in this embodiment controls the baseband chip to be tested to be powered on after setting the corresponding testing condition according to the start performance test, that is, to output the testing signal to the baseband chip to be tested, and the baseband chip outputs the positioning result in real time after receiving the testing signal, where the testing time is, for example, 2 minutes.
S202, measuring a time interval T from the moment when the to-be-tested baseband chip receives the test signal to the moment when the to-be-tested baseband chip outputs a first positioning result meeting the positioning precision requirementiAnd according to the corresponding N T under the N test scenesiA cold start first fix time or a hot start first fix time is determined.
In this embodiment, optionally, the positioning accuracy is required to be less than 60 meters for 10 consecutive times of the positioning result. In each test scenario, the apparatus in this embodiment measures a time interval T from when the test signal is received to when the first positioning result meeting the positioning accuracy requirement is output from the baseband chip to be testediAfter the test is completed in a test scenario, the power is turned off, and the device in this embodiment replaces another test scenario, so that the information such as ephemeris, almanac, position, time and the like stored in the baseband chip to be tested is in a failure state. Continuously using the corresponding test conditions to repeatedly measure and obtain the corresponding N T under the N test scenesiFinally according to N TiDetermining the first positioning time of cold start or hot start, optionally, determining N TiIf M is less than the preset value, the test is invalid and fails, if M is greater than the preset value, M T are selectediFor example, N is 10, the preset value is 9, if the valid results are less than 9, the test is invalid, the test fails, and if the valid results are equal to 9, the average value of the 9 valid results is taken as the cold startA first fix time or a warm start first fix time.
In the method for testing performance of a baseband chip provided in this embodiment, a test signal is output to a baseband chip to be tested under test conditions corresponding to performance test start and N test scenes, a positioning result output by the baseband chip to be tested during a test time is received, and then a time interval T from the time when the baseband chip to be tested receives the test signal to the time when a first positioning result meeting a positioning accuracy requirement is output is measurediAnd according to the corresponding N T under the N test scenesiAnd determining the cold start first positioning time or the hot start first positioning time, so that the starting performance of the baseband chip under different environments can be tested, and a basis is provided for selecting the baseband chip in practical application.
FIG. 4 is a schematic flow chart of a method for testing performance of a baseband chip according to the present invention; the execution main body of the method flow shown in fig. 4 may be a baseband chip performance testing apparatus, and the baseband chip performance testing apparatus may be implemented by any software and/or hardware. As shown in fig. 4, the method for testing performance of a baseband chip provided in this embodiment may include:
s301, under the test conditions and N test scenes corresponding to the multiple locking performance test, outputting a test signal to the baseband chip to be tested, continuing to output the test signal after the test signal is interrupted for the second time, and receiving the positioning result output by the baseband chip to be tested in real time.
In the same way as the embodiment shown in fig. 1, during testing, the baseband chip to be tested needs to have a matching bottom plate, the bottom plate is disposed on the test board, the bottom plate can be fixedly disposed on the test board to prevent the bottom plate from moving during the running of the ship, the test board can be a circuit board, for example, the test board is an OEM board, and the bottom plate is provided with the baseband chip to be tested and does not contain other auxiliary navigation devices or low-noise amplifier devices.
Specifically, the baseband chip to be tested is disposed on the test board, and the test board is disposed in the device under test, and the connection relationship between the baseband chip performance testing apparatus and the device under test of this embodiment can be as shown in fig. 3, which is not described herein again.
Specifically, the multiple locking performance test is a multiple capture time test, and the multiple capture time is the time required for recovering a signal to meet the positioning accuracy requirement when the signal is interrupted in a short time. The reacquisition time may characterize the re-lock performance of the baseband chip.
Firstly, in the testing process, the performance testing apparatus of the baseband chip in this embodiment generates N testing scenarios in a simulation manner, where N is a preset value, and different testing scenarios are different, such as temperature, humidity, and electromagnetic interference. Next, the baseband chip performance testing apparatus in this embodiment sets a testing condition, optionally, the testing condition includes: 1) setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) Under the single BD mode, the baseband chip to be tested can track at least 9 BD-2 satellites, the PDOP of the baseband chip to be tested for tracking the satellite position is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or, in the dual-mode (BD + GPS), the baseband chip to be tested can track 6 BD-2 satellites and 6 GPS satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Alternatively, the test signal power may be set to-130 dBm.
The baseband chip performance testing apparatus in this embodiment outputs a test signal to the baseband chip to be tested, for example, outputs the test signal at 2Hz, performs normal positioning, outputs a positioning result, and continues to output the test signal for a second time, for example, 30 seconds, after the output of the test signal is interrupted for the second time, for example, 2 minutes.
S302, measuring a time interval T from the time when the to-be-tested baseband chip receives the test signal to the time when the to-be-tested baseband chip outputs a first positioning result meeting the positioning precision requirementjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined.
Specifically, the time interval T from the time when the test signal is received again after the test signal is interrupted to the time when the first positioning result meeting the positioning accuracy requirement is output is measuredjIn this embodiment, optionally, the positioning accuracy is required to be less than 60 meters for 10 consecutive times of the positioning result. In each test scenario, the apparatus in this embodiment measures TjAfter the test under one test scenario is completed, the device in this embodiment replaces another test scenario, and continues to use the corresponding test conditions to repeatedly measure to obtain N T corresponding to N test scenariosjFinally according to N TjDetermining the reacquisition time, optionally, determining N TjIf M is less than the preset value, the test is invalid and fails, if M is greater than the preset value, M T are selectedjFor example, N is 10, the preset value is 9, if the valid results are less than 9, the test is invalid, and fails, and if the valid results are equal to 9, the average value of the 9 valid results is taken as the recapture time.
In the method for testing performance of a baseband chip provided in this embodiment, a test signal is output to a baseband chip to be tested under test conditions corresponding to a multiple-locking performance test and N test scenes, the test signal is continuously output after the test signal is interrupted for a second time, a positioning result output in real time by the baseband chip to be tested is received, and then a time interval T from when the test signal is received by the baseband chip to be tested to when a first positioning result meeting a positioning accuracy requirement is output is measuredjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined. Therefore, the method can test the re-locking performance of the baseband chip in different environments and provides a basis for selecting the baseband chip in practical application.
It should be noted that, in the embodiment shown in fig. 1 and fig. 2, after the baseband chip performance testing apparatus generates N test scenes in a simulation manner, the testing conditions may be set first, the cold start first positioning time and the hot start first positioning time are tested in sequence, then the testing conditions are set, and the recapture time is tested, so as to finally obtain the start and re-lock performance of the baseband chip, thereby providing a basis for selecting the baseband chip in practical application.
Fig. 5 is a schematic structural diagram of a baseband chip performance testing apparatus provided in the present invention, and as shown in fig. 5, the baseband chip performance testing apparatus includes: a signal output module 11, a receiving module 12 and a determining module 13, wherein,
the signal output module 11 is configured to output a test signal to the baseband chip to be tested according to a test signal output rule corresponding to the performance test under the test condition corresponding to the performance test and the N test scenarios.
The receiving module 12 is configured to receive a positioning result output by the baseband chip to be tested within the testing time.
The determining module 13 is configured to determine a performance test parameter according to the positioning result, where the performance test parameter is a cold start first positioning time, a hot start first positioning time, or a reacquisition time.
Optionally, the performance test parameter is a cold start first positioning time or a hot start first positioning time, and the test signal output rule corresponding to the performance test is as follows: and outputting a test signal to the baseband chip to be tested. The determining module 13 is used for measuring a time interval T from the time when the test signal is received to the time when the first positioning result meeting the positioning accuracy requirement is outputiAnd according to the corresponding N T under the N test scenesiA cold start first fix time or a hot start first fix time is determined.
In this embodiment, optionally, the positioning accuracy requirement is as follows: the positioning result is less than 60 meters continuously for 10 times.
Optionally, if the performance test parameter is a cold start first positioning time, the test conditions include: 1) setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) Under the single mode (BD) mode, the baseband chip to be tested can track at least 9 Beidou second- # BD-2 satellites, and the baseband chip to be tested tracks the positions of the satellitesThe precision strength (PDOP) is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or, in a dual mode, such as a BD + Global Positioning System (GPS) mode, the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, a PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
If the performance test parameter is the hot start first positioning time, the test conditions include: 1) setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) Under the single BD mode, the base band chip to be tested can track 12 Beidou second (BD-2) satellites, the PDOP of the base band chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or, in the dual-mode (BD + GPS), the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Alternatively, the test signal power may be set to-130 dBm.
Optionally, the performance test parameter is recapture time, and the test signal output rule corresponding to the performance test is as follows: and outputting a test signal to the baseband chip to be tested, and continuously outputting the test signal after the test signal is interrupted for the first time. The receiving module 12 is configured to receive a positioning result output by the baseband chip to be tested within the test time after the test signal is interrupted. The determining module 13 is used for measuring a time interval T from when the baseband chip to be tested receives the test signal again after the test signal is interrupted to when the first positioning result meeting the positioning accuracy requirement is outputjAnd according to the corresponding N T under the N test scenesjA reacquisition time is determined.
Optionally, the test conditions include: 1) the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay are set to be freeA time-varying error pattern; 2) the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3(ii) a 3) Under the single BD mode, the baseband chip to be tested can track at least 9 BD-2 satellites, the PDOP of the baseband chip to be tested for tracking the satellite position is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or, in the dual-mode (BD + GPS), the baseband chip to be tested can track 6 BD-2 satellites and 6 GPS satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
Alternatively, the test signal power may be set to-130 dBm.
The baseband chip performance testing device provided in this embodiment is similar to the baseband chip performance testing method in principle and technical effect, and is not described here again.
Fig. 6 is a schematic structural diagram of a baseband chip performance testing apparatus provided in the present invention, where the baseband chip performance testing apparatus may be, for example, a terminal device, such as a smart phone, a tablet computer, a computer, and the like. As shown in fig. 6, the baseband chip performance testing apparatus 400 includes: a memory 401 and at least one processor 402.
A memory 401 for storing program instructions.
The processor 402 is configured to implement the method for testing performance of a baseband chip in this embodiment when the program instruction is executed, and specific implementation principles may be referred to in the foregoing embodiments, which are not described herein again.
The baseband chip performance test apparatus may further include an input/output interface 403. The input/output interface 403 may include a separate output interface and input interface, or may be an integrated interface that integrates input and output. The output interface is used for outputting data, the input interface is used for acquiring input data, the output data is a general name output in the method embodiment, and the input data is a general name input in the method embodiment.
The invention also provides a readable storage medium, in which an execution instruction is stored, and when at least one processor of the baseband chip performance testing apparatus executes the execution instruction, when the computer executes the execution instruction and the processor executes the execution instruction, the baseband chip performance testing method in the above embodiment is implemented.
The present invention also provides a program product comprising execution instructions stored in a readable storage medium. The at least one processor of the baseband chip performance testing apparatus may read the execution instruction from the readable storage medium, and the execution of the execution instruction by the at least one processor causes the baseband chip performance testing apparatus to implement the baseband chip performance testing method provided by the various embodiments described above.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
The integrated unit implemented in the form of a software functional unit may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device) or a processor (processor) to execute some steps of the methods according to the embodiments of the present invention. And the aforementioned storage medium includes: a U disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In the foregoing embodiments of the network device or the terminal device, it should be understood that the Processor may be a Central Processing Unit (CPU), or may be other general-purpose processors, Digital Signal Processors (DSP), Application Specific Integrated Circuits (ASIC), etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with the present application may be embodied directly in a hardware processor, or in a combination of the hardware and software modules in the processor.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for testing performance of a baseband chip is characterized in that the baseband chip to be tested is arranged on a test board, and the method comprises the following steps:
under test conditions corresponding to the performance test and N test scenes, outputting test signals to the baseband chip to be tested according to test signal output rules corresponding to the performance test; the test scenes comprise different scenes such as temperature, humidity, electromagnetic interference and the like;
receiving a positioning result output by the baseband chip to be tested within the testing time;
determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time;
the determining performance test parameters according to the positioning result comprises:
determining performance test parameters according to the time interval from the time when the test signals are received to the time when the first positioning result meeting the positioning precision requirement is output by the corresponding N base chips to be tested under the N test scenes; if M effective test results in the N time intervals are larger than a preset value, the performance test parameter is the average value of the M effective test results in the N time intervals; and if the M valid test results in the N time intervals are smaller than the preset value, the test is invalid.
2. The test method according to claim 1, wherein the performance test parameter is a cold start first positioning time or a hot start first positioning time, and the test signal output rule corresponding to the performance test is:
outputting a test signal to the baseband chip to be tested;
the determining performance test parameters according to the positioning result comprises:
measuring the time interval T from the time when the to-be-tested baseband chip receives the test signal to the time when the to-be-tested baseband chip outputs the first positioning result meeting the positioning precision requirementiAnd according to the corresponding N T under the N test scenesiDetermining the first positioning time of cold start or hot start if N TiIf the M effective test results are greater than the preset value, the cold start first positioning time or the hot start first positioning time is M TiAverage value of (d); and if the M valid test results in the N time intervals are smaller than the preset value, the test is invalid.
3. The test method of claim 2, wherein the performance test parameter is a cold start first fix time, and the test conditions comprise:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 Beidou second-order BD-2 satellites, the precision degree PDOP of the position of the satellite tracked by the baseband chip to be tested is less than or equal to 5, and the test signal is a frequency point signal corresponding to the BD-2 satellite; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
4. The testing method of claim 2, wherein the performance testing parameter is a hot start first fix time, and the testing conditions comprise:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The base band chip to be tested can track 12 Beidou second-order BD-2 satellites, the PDOP of the position of the base band chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track at least 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
5. The method according to claim 1, wherein the performance test parameter is reacquisition time, and the test signal output rule corresponding to the performance test is:
outputting a test signal to the baseband chip to be tested, and continuing to output the test signal after the test signal is interrupted for the first time;
the receiving of the positioning result output by the baseband chip to be tested in the testing time includes:
receiving a positioning result output by the baseband chip to be tested within the testing time after the test signal is interrupted;
the determining performance test parameters according to the positioning result comprises:
measuring the time interval T from the moment the test signal is received again after the test signal is interrupted to the moment the first positioning result meeting the positioning precision requirement is output by the to-be-tested baseband chipjAnd according to the corresponding N T under the N test scenesjDetermining a reacquisition time; if N TjIf the M valid test results are greater than the preset value, the recapture time is M TjAverage value of (d); and if the M valid test results in the N time intervals are smaller than the preset value, the test is invalid.
6. The test method of claim 5, wherein the test conditions comprise:
setting the satellite orbit, the satellite clock error, the ionosphere time delay and the troposphere time delay into a time-invariant error mode;
the maximum speed of the ship on which the test board is arranged is less than or equal to 30m/s, and the maximum acceleration is less than or equal to 0.5m/s2The maximum rate of change of acceleration is less than or equal to 0.05m/s3；
The baseband chip to be tested can track at least 9 BD-2 satellites, the PDOP of the position of the baseband chip to be tested for tracking the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites; or,
the baseband chip to be tested can track 6 BD-2 satellites and 6 GPS satellites, the PDOP of the baseband chip to be tested for tracking the positions of the satellites is less than or equal to 5, and the test signals are frequency point signals corresponding to the BD-2 satellites and frequency point signals corresponding to the GPS satellites.
7. The test method according to claim 2 or 5, wherein the positioning accuracy requirement is: the positioning result is less than 60 meters continuously for 10 times.
8. The utility model provides a baseband chip capability test device which characterized in that, the baseband chip that awaits measuring sets up on surveying the board, the device includes:
the signal output module is used for outputting a test signal to the baseband chip to be tested according to a test signal output rule corresponding to the performance test under the test condition corresponding to the performance test and N test scenes;
the receiving module is used for receiving a positioning result output by the baseband chip to be tested within the testing time;
the determining module is used for determining performance test parameters according to the positioning result, wherein the performance test parameters are cold start first positioning time, hot start first positioning time or recapture time;
the determining module is specifically configured to:
determining performance test parameters according to the time interval from the time when the test signals are received to the time when the first positioning result meeting the positioning precision requirement is output by the corresponding N base chips to be tested under the N test scenes; if M effective test results in the N time intervals are larger than a preset value, the performance test parameter is the average value of the M effective test results in the N time intervals; and if the M valid test results in the N time intervals are smaller than the preset value, the test is invalid.
9. A baseband chip performance testing device, comprising: at least one processor and memory;
the memory stores computer-executable instructions;
the at least one processor executing the computer-executable instructions stored by the memory causes a baseband chip performance testing apparatus to perform the method of any of claims 1-7.
10. A computer-readable storage medium having computer-executable instructions stored thereon which, when executed by a processor, implement the method of any one of claims 1-7.
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