CN108628699B - ECC-based FLASH data exception processing method and device - Google Patents

ECC-based FLASH data exception processing method and device Download PDF

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CN108628699B
CN108628699B CN201810451180.3A CN201810451180A CN108628699B CN 108628699 B CN108628699 B CN 108628699B CN 201810451180 A CN201810451180 A CN 201810451180A CN 108628699 B CN108628699 B CN 108628699B
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flash
address
data
chip
reading
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CN108628699A (en
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张毅
吉宏斌
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Jasmin International Auto Research and Development Beijing Co Ltd
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Jasmin International Auto Research and Development Beijing Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution

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  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Retry When Errors Occur (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The invention provides a FLASH data exception processing method and device based on ECC, wherein the method comprises the following steps: the method comprises the steps that an MCU judges whether a read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of a current flash sector; if yes, judging whether to enter abnormal interrupt processing; if yes, the reading instruction or the writing instruction is corrected to be the address of the Flash in the next chip, so that the system can be ensured to normally operate under the ECC occurrence state as far as possible.

Description

ECC-based FLASH data exception processing method and device
Technical Field
The invention relates to the technical field of computer processing, in particular to a FLASH data exception handling method and device based on ECC.
Background
EEPROM is the most ideal non-volatile memory for microprocessors to read, write, and update variables. In a microcontroller without an internal EEPROM, internal Flash can be simulated into the EEPROM to achieve the aim.
When the currently used FLASH module based on the ECC is used for simulating the function of the EEPROM, the FLASH may enter a protection mode due to behaviors such as data operation abnormality (improper reading and writing or some external reasons, such as power failure during writing data); when reading the data of the abnormal address under the condition that the FLASH enters the protection mode, the MCU in the controller can be reset or enter some abnormal states, and finally the function of the controller is abnormal, so that danger is caused.
Disclosure of Invention
The invention provides a FLASH data exception processing method and device based on ECC, which at least partially solves the technical problems.
In a first aspect, the present invention provides an ECC-based FLASH data exception handling method, including:
the method comprises the steps that an MCU judges whether a read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of a current flash sector;
if yes, judging whether to enter abnormal interrupt processing;
if yes, the reading instruction or the writing instruction is corrected to be the address of the next Flash in the chip.
Preferably, the method further comprises:
the Flash abnormal mark position corresponding to the protected address is valid, and abnormal interrupt processing is quitted;
judging whether the flash abnormal zone bit of the protected address is valid or not;
if so, giving a default invalid value to a predicted target address, setting the Flash abnormal flag position as invalid, and reading data of the next on-chip Flash address or writing data into the next on-chip Flash address.
Preferably, before determining whether the read or written on-chip flash address is a protected address, the method further includes:
judging whether all data entries in the Flash sector are valid or not;
if so, the data entry is populated with entry data.
Preferably, after determining whether all data entries in the Flash sector are valid, the method further includes:
if not, judging whether all the backup sectors are completely inquired;
if not, judging whether the currently inquired data item is effective or not;
if yes, repeating the step of judging whether all data items in the Flash sector are valid.
Preferably, after determining whether the currently queried data entry is valid, the method further includes:
if not, searching a data area of the current flash sector, acquiring data, and filling the data into the currently inquired data entry;
judging whether reading of the current flash sector is finished;
if yes, repeating the step of judging whether all data items in the Flash sector are valid.
Preferably, the method further comprises:
and generating MCU fault information, and sending the MCU fault information to a display device so that the display device displays the MCU fault information.
In a second aspect, the present invention further provides an ECC-based FLASH data exception handling apparatus, which is characterized by comprising:
the first judging unit is used for judging whether the read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of the current flash sector by the MCU;
the second judgment unit is used for judging whether to enter abnormal interrupt processing if the judgment unit is yes;
and the correcting unit is used for correcting the reading instruction or the writing instruction into reading or writing the next on-chip Flash address if the Flash address is in the correct state.
Preferably, the apparatus further comprises:
the setting unit is used for setting the Flash abnormal mark position corresponding to the protected address to be effective and exiting the abnormal interrupt processing;
a third judging unit, configured to judge whether a flash exception flag of the protected address is valid;
and the assignment unit is used for assigning a default invalid value to a predicted target address if the Flash memory is in the invalid state, reading the data of the next Flash memory address in the chip or writing the data into the next Flash memory address in the chip.
In a third aspect, the present invention provides an electronic device, including:
at least one processor; and
at least one memory communicatively coupled to the processor, wherein:
the memory stores program instructions executable by the processor, the processor invoking the program instructions to perform the method.
In a fourth aspect, the invention also provides a non-transitory computer-readable storage medium storing computer instructions that cause the computer to perform the method.
According to the technical scheme, in the FLASH data exception handling method based on the ECC, the MCU judges whether the read or written in-chip FLASH address is a protected address or not in the process of reading or writing in-chip FLASH data of the current FLASH sector; if yes, judging whether to enter abnormal interrupt processing; if yes, the reading instruction or the writing instruction is corrected to be the address of the Flash in the next chip, so that the system can be ensured to normally operate under the ECC occurrence state as far as possible.
Drawings
Fig. 1 is a flowchart of a FLASH data exception handling method based on ECC according to an embodiment of the present invention;
fig. 2 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention;
FIG. 3 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention;
fig. 4 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention;
FIG. 5 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention;
FIG. 6 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention;
fig. 7 is a schematic block diagram of an ECC-based FLASH data exception handling apparatus according to another embodiment of the present invention;
fig. 8 is a block diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a flowchart of a FLASH data exception handling method based on ECC according to an embodiment of the present invention.
As shown in fig. 1, an ECC-based FLASH data exception handling method includes:
s101, judging whether a read or written on-chip flash address is a protected address or not by an MCU (micro control unit) in the process of reading or writing on-chip flash data of a current flash sector; if yes, go to step S102; if not, executing step S102';
s102, judging whether to enter abnormal interrupt processing; if yes, go to step S103; if not, executing step S103'; s103, correcting the reading instruction or the writing instruction to read or write the next Flash address in the chip.
In this step, the next on-chip Flash address is the next on-chip Flash address according to the preset reading or writing order.
S103', reading or writing according to a normal reading or writing method.
It will be appreciated that the reading or writing according to the normal reading or writing method may be reading or writing to the on-chip flash address.
S102', reading or writing the flash address in the chip.
Fig. 2 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention.
Steps S201 to S203 'in fig. 2 are the same as steps S101 to S103' described above and will not be described again.
As a preferred embodiment, the method further comprises:
s204, the Flash abnormal mark position corresponding to the protected address is valid, and abnormal interrupt processing is quitted;
in this step, the address is an on-chip Flash address, which is not described in detail below.
S205, judging whether the flash abnormal zone bit of the protected address is valid or not; if yes, go to step S206; if not, go to step S206'.
And S206, giving a default invalid value to a predicted target address, setting the Flash abnormal flag position as invalid, and reading data of the next on-chip Flash address or writing data into the next on-chip Flash address.
S206', read the next address data.
Fig. 3 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention.
Steps S303 to S308 'in fig. 3 are the same as steps S201 to S206' described above, and are not described again.
As a preferred embodiment, before the step S303, the method further includes:
s301, judging whether all data entries in the Flash sector are valid or not; if yes, go to step S302.
S302, filling entry data into the data entry.
Fig. 4 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention.
Steps S401 to S408 'in fig. 4 are the same as steps S301 to S308' described above, and are not described again.
As a preferred embodiment, after the step S401, the method further includes:
if not, executing step S409;
s409, judging whether all the backup sectors are queried; if not, go to step S410;
s410, judging whether the currently inquired data item is effective;
it should be noted that, in the present invention, each data entry is sequentially queried according to a preset order.
If yes, the step S401 is repeated.
Fig. 5 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention.
Steps S501 to S510 in fig. 5 are the same as steps S401 to S410, and are not described again.
As a preferred embodiment, after the step S510, the method further includes:
if not, executing step S511;
s511, searching a data area of the current flash sector, acquiring data, and filling the data into the currently inquired data entry;
it is worth noting that the query sector is a sector-by-sector sequential query starting from the newest data storage sector, and the valid contents of the newest data entry are filled in the address of the currently queried data entry. After the current search entry queries valid data once, the data entry is set to be valid, and the search is not executed any more.
S512, judging whether reading of the current flash sector is finished; if yes, repeating the step S501; if not, go to step S513;
and S513, continuing to read the current flash sector until the reading is finished.
Fig. 6 is a flowchart of a FLASH data exception handling method based on ECC according to another embodiment of the present invention.
Steps S601 to S613 in fig. 6 are the same as steps S501 to S513 described above, and are not described again.
As a preferred embodiment, the method further comprises:
and S614, generating MCU fault information, and sending the MCU fault information to a display device so that the display device displays the MCU fault information. So that information about the occurrence of an abnormality can be recorded.
In the FLASH data exception handling method based on ECC, an MCU judges whether the read or written in-chip FLASH address is a protected address or not in the process of reading or writing in-chip FLASH data of the current FLASH sector; if yes, judging whether to enter abnormal interrupt processing; if so, correcting the reading instruction or the writing instruction to read or write the next Flash address in the chip, thereby ensuring that the system can normally operate in the ECC occurrence state as far as possible; ensuring that all data entries store data that is as efficient as possible. And after the data exception of the FLASH is eliminated, correcting the relevant FLASH sector.
Fig. 7 is a schematic block diagram of an ECC-based FLASH data exception handling apparatus according to another embodiment of the present invention.
An ECC-based FLASH data exception handling apparatus as shown in fig. 7 includes:
a first judging unit 701, configured to judge, by the MCU, whether a read or write on-chip flash address is a protected address in a process of reading or writing on-chip flash data of a current flash sector;
a second determining unit 702, configured to determine whether to enter an abnormal interrupt process if the determination result is positive;
and the correcting unit 703 is configured to correct the read instruction or the write instruction to read or write the next on-chip Flash address if the read instruction or the write instruction is correct.
In the device, the next on-chip Flash address is the next on-chip Flash address according to the preset reading or writing sequence.
As a preferred embodiment, the apparatus further comprises:
the setting unit is used for setting the Flash abnormal mark position corresponding to the protected address to be effective and exiting the abnormal interrupt processing;
a third judging unit, configured to judge whether a flash exception flag of the protected address is valid;
and the assignment unit is used for assigning a default invalid value to a predicted target address if the Flash memory is in the invalid state, reading the data of the next Flash memory address in the chip or writing the data into the next Flash memory address in the chip.
In the FLASH data exception handling method based on ECC, an MCU judges whether the read or written in-chip FLASH address is a protected address or not in the process of reading or writing in-chip FLASH data of the current FLASH sector; if yes, judging whether to enter abnormal interrupt processing; if so, correcting the reading instruction or the writing instruction to read or write the next Flash address in the chip, thereby ensuring that the system can normally operate in the ECC occurrence state as far as possible; ensuring that all data entries store data that is as efficient as possible. And after the data exception of the FLASH is eliminated, correcting the relevant FLASH sector.
Fig. 8 is a block diagram of an electronic device according to an embodiment of the present invention.
An electronic device as shown in fig. 8, comprising: a processor 801(processor), a memory 802(memory), and a bus 803; wherein,
the processor 801 and the memory 802 complete communication with each other through the bus 803;
the processor 801 is configured to call the program instructions in the memory 802 to execute the method provided by the above method embodiments, for example, including: the method comprises the steps that an MCU judges whether a read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of a current flash sector; if yes, judging whether to enter abnormal interrupt processing; if yes, the reading instruction or the writing instruction is corrected to be the address of the next Flash in the chip.
The present invention also provides a non-transitory computer-readable storage medium storing computer instructions that cause the computer to perform a method provided by the above method embodiments, for example, comprising: the method comprises the steps that an MCU judges whether a read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of a current flash sector; if yes, judging whether to enter abnormal interrupt processing; if yes, the reading instruction or the writing instruction is corrected to be the address of the next Flash in the chip.
It should be noted that, in the respective components of the apparatus of the present invention, the components therein are logically divided according to the functions to be implemented, but the present invention is not limited thereto, and the respective components may be re-divided or combined as needed, for example, some components may be combined into a single component, or some components may be further decomposed into more sub-components.
The various component embodiments of the invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that a microprocessor or Digital Signal Processor (DSP) may be used in practice to implement some or all of the functionality of some or all of the components in an apparatus according to an embodiment of the invention. The present invention may also be embodied as apparatus or device programs (e.g., computer programs and computer program products) for performing a portion or all of the methods described herein. Such programs implementing the present invention may be stored on computer-readable media or may be in the form of one or more signals. Such a signal may be downloaded from an internet website or provided on a carrier signal or in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The usage of the words first, second and third, etcetera do not indicate any ordering. These words may be interpreted as names.
The above embodiments are only suitable for illustrating the present invention and not limiting the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, so that all equivalent technical solutions also belong to the scope of the present invention, and the scope of the present invention should be defined by the claims.

Claims (8)

1. An ECC-based FLASH data exception handling method is characterized by comprising the following steps:
the method comprises the steps that an MCU judges whether a read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of a current flash sector;
if yes, judging whether to enter abnormal interrupt processing;
if so, correcting the reading instruction or the writing instruction to read or write the next Flash address in the chip;
the Flash abnormal mark position corresponding to the protected address is valid, and abnormal interrupt processing is quitted;
judging whether the flash abnormal zone bit of the protected address is valid or not;
if so, giving a default invalid value to a predicted target address, setting the Flash abnormal flag position as invalid, and reading data of the next on-chip Flash address or writing data into the next on-chip Flash address.
2. The method of claim 1, wherein before determining whether the read or write on-chip flash address is a protected address, the method further comprises:
judging whether all data entries in the Flash sector are valid or not;
if so, the data entry is populated with entry data.
3. The method of claim 2, wherein after determining whether all data entries in the Flash sector are valid, the method further comprises:
if not, judging whether all the backup sectors are completely inquired;
if not, judging whether the currently inquired data item is effective or not;
if yes, repeating the step of judging whether all data items in the Flash sector are valid.
4. The method of claim 3, wherein after determining whether the currently queried data entry is valid, the method further comprises:
if not, searching a data area of the current flash sector, acquiring data, and filling the data into the currently inquired data entry;
judging whether reading of the current flash sector is finished;
if yes, repeating the step of judging whether all data items in the Flash sector are valid.
5. The method of claim 1, further comprising:
and generating MCU fault information, and sending the MCU fault information to a display device so that the display device displays the MCU fault information.
6. An ECC-based FLASH data exception handling device, comprising:
the first judging unit is used for judging whether the read or written on-chip flash address is a protected address or not in the process of reading or writing on-chip flash data of the current flash sector by the MCU;
the second judgment unit is used for judging whether to enter abnormal interrupt processing if the judgment unit is yes;
the correcting unit is used for correcting the reading instruction or the writing instruction into reading or writing a next on-chip Flash address if the Flash address is in the first on-chip Flash address;
the setting unit is used for setting the Flash abnormal mark position corresponding to the protected address to be effective and exiting the abnormal interrupt processing;
a third judging unit, configured to judge whether a flash exception flag of the protected address is valid;
and the assignment unit is used for assigning a default invalid value to a predicted target address if the Flash memory is in the invalid state, reading the data of the next Flash memory address in the chip or writing the data into the next Flash memory address in the chip.
7. An electronic device, comprising:
at least one processor; and
at least one memory communicatively coupled to the processor, wherein:
the memory stores program instructions executable by the processor, the processor invoking the program instructions to perform the method of any of claims 1-5.
8. A non-transitory computer-readable storage medium storing computer instructions that cause a computer to perform the method of any one of claims 1-5.
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