CN108614178A - Conduction detecting system suitable for RJ45 connectors - Google Patents
Conduction detecting system suitable for RJ45 connectors Download PDFInfo
- Publication number
- CN108614178A CN108614178A CN201611127641.9A CN201611127641A CN108614178A CN 108614178 A CN108614178 A CN 108614178A CN 201611127641 A CN201611127641 A CN 201611127641A CN 108614178 A CN108614178 A CN 108614178A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Abstract
The present invention discloses a kind of conduction detecting system suitable for RJ45 connectors, programmable chip is controlled with boundary scan technique by signal controller respectively and joint test working group chip generates the first conduction detection signal and the second conduction detection signal respectively, to carry out the conduction detection of open circuit and short circuit to the pin of RJ45 connectors to be detected, it can thereby reach and the easy technical effect to RJ45 connector conduction detections is provided.
Description
Technical field
The present invention relates to a kind of detecting system and its method, refer in particular to a kind of sweep with boundary by signal controller respectively
It retouches technical controlling programmable chip and joint test working group chip generates the first conduction detection signal and second leads respectively
Logical detection signal is connected with carrying out the RJ45 that is suitable for of conduction detection of open circuit and short circuit to the pin of RJ45 connectors to be detected
Connect the conduction detecting system of device.
Background technology
The existing conduction detection for RJ45 connectors is usually carrying out functional test (Functional Circuit
Test, FCT) stage can just carry out the conduction detections of RJ45 connectors, and the conduction detection of RJ45 connectors fails to survey in circuit
(In-Circuit-Test) stage of examination carries out the conduction detection of RJ45 connectors.
The progress functional test stage needs to start motherboard with the conduction detection of the RJ45 connectors carried out, could send net
Network signal carries out the conduction detection of RJ45 connectors, this can make measurement jig that can have higher cost and longer test
Time.
In summary, it is known that always exist the conduction detection efficiency of existing RJ45 connectors for a long time in the prior art not
Foot problem, it is therefore necessary to propose improved technological means, come solve the problems, such as this one.
Invention content
There is a problem of the conduction detection efficiency deficiency of existing RJ45 connectors in view of the prior art, the present invention discloses then
A kind of conduction detecting system suitable for RJ45 connectors, wherein:
Disclosed herein the conduction detecting system suitable for RJ45 connectors, be suitable for RJ45 connectors to be detected
(connector), RJ45 transformers (RJ45Magnetics Transformer) and physical layer (Physical Layer,
PHY) the circuit board detecting to be detected of chip electrical series, it includes:Detection circuit board and signal controller, detection circuit board
It further includes:Detect RJ45 connectors, switch chip, programmable chip, joint test working group (Joint Test Action
Group, JTAG) chip and joint test working group connector.
The detection RJ45 connectors of detection circuit board are electrically connected by grid line and RJ45 connectors to be detected;Detection electricity
The switch chip of road plate is electrically connected with detection RJ45 connectors;The programmable chip of detection circuit board electrically connects with switch chip
It connects, whether programmable chip is connected to control the pin of switch chip, programmable chip is believed to generate the first conduction detection
Number;The output pin of joint test working group chip is electrically connected by capacitance with the pin of corresponding detection RJ45 connectors respectively
It connects, joint test working group chip is generating the second conduction detection signal;And the joint test working group of detection circuit board connects
Device is connect to be electrically connected with programmable chip and joint test working group chip respectively.
Signal controller is electrically connected with joint test working group connector, and is controlled programmable chip and generated the first conducting
Signal is detected, or control joint test working group chip generates the second conduction detection signal, with to RJ45 connectors to be detected
Pin carry out open circuit and short circuit conduction detection.
Disclosed herein system it is as above, the difference between the prior art be the present invention controlled respectively by signal
Device controls programmable chip with boundary scan technique and joint test working group chip generates the first conduction detection signal respectively
And the second conduction detection signal, to carry out the conduction detection of open circuit and short circuit to the pin of RJ45 connectors to be detected.
By above-mentioned technological means, the present invention, which can reach, provides the easy technology work to RJ45 connector conduction detections
Effect.
Description of the drawings
Fig. 1 is schematically shown as the system block diagrams that the present invention is suitable for the conduction detecting system of RJ45 connectors.
Fig. 2 is schematically shown as the detection circuit board circuit configuration signal that the present invention is suitable for the conduction detecting system of RJ45 connectors
Figure.
【Symbol description】
10 circuit boards to be detected
11 RJ45 connectors to be detected
12 RJ45 transformers
13 physical chips
20 detection circuit boards
21 detection RJ45 connectors
22 switch chips
23 programmable chips
24 joint test working group chips
25 joint test working group connectors
30 signal controllers
The first capacitances of C1
The second capacitances of C2
C3 third capacitances
The 4th capacitances of C4
The 5th capacitances of C5
The 6th capacitances of C6
The 7th capacitances of C7
The 8th capacitances of C8
The first pins of pin1
Pin2 second pins
Pin3 third pins
The 4th pins of pin4
The 5th pins of pin5
The 6th pins of pin6
The 7th pins of pin7
The 8th pins of pin8
The first input pins of pin_I1
The second input pins of pin_I2
Pin_I3 third input pins
The 4th input pins of pin_I4
The 5th input pins of pin_I5
The 6th input pins of pin_I6
The 7th input pins of pin_I7
The 8th input pins of pin_I8
The first output pins of pin_O1
The second output pins of pin_O2
Pin_O3 third output pins
The 4th output pins of pin_O4
The 5th output pins of pin_O5
The 6th output pins of pin_O6
The 7th output pins of pin_O7
The 8th output pins of pin_O8
The first input and output pins of pin_IO1
The second input and output pins of pin_IO2
Pin_IO3 third input and output pins
The 4th input and output pins of pin_IO4
The 5th input and output pins of pin_IO5
The 6th input and output pins of pin_IO6
The 7th input and output pins of pin_IO7
The 8th input and output pins of pin_IO8
The first output pins of pin_JO1
The second output pins of pin_JO2
Pin_JO3 third output pins
The 4th output pins of pin_JO4
The 5th output pins of pin_JO5
The 6th output pins of pin_JO6
The 7th output pins of pin_JO7
The 8th output pins of pin_JO8
The first difference of Tx1_DP transmits signal
The second difference of Tx1_DN transmits signal
The first difference of Tx2_DP transmits signal
The second difference of Tx2_DN transmits signal
The first differential received signals of Rx1_DP
The second differential received signals of Rx1_DN
The first differential received signals of Rx2_DP
The second differential received signals of Rx2_DN
Specific implementation mode
Carry out the embodiment that the present invention will be described in detail below in conjunction with schema and embodiment, thereby how the present invention is applied
Technological means solves technical problem and reaches the realization process of technical effect to fully understand and implement.
First have to illustrate below disclosed herein the conduction detecting system suitable for RJ45 connectors, and please refer to "
Fig. 1 " and " Fig. 2 " are shown, and " Fig. 1 " is schematically shown as the system square that the present invention is suitable for the conduction detecting system of RJ45 connectors
Figure;" Fig. 2 " is schematically shown as the detection circuit board circuit configuration schematic diagram that the present invention is suitable for the conduction detecting system of RJ45 connectors.
Disclosed herein the conduction detecting system suitable for RJ45 connectors, be suitable for RJ45 connectors to be detected
(connector) 11, RJ45 transformers (RJ45Magnetics Transformer) 12 and physical layer (Physical
Layer, PHY) chip 13 electrical series circuit board detecting to be detected 10, it includes:Detection circuit board 20 and signal control
Device 30, detection circuit board 20 further include:Detect RJ45 connectors 21, switch chip 22, programmable chip 23, joint test work
Group (Joint Test Action Group, JTAG) chip 24 and joint test working group connector 25.
Circuit board 10 to be detected can be general motherboard, expansion board ... etc., herein by way of example only it, not with
The application category of this limitation present invention, in circuit board 10 to be detected, RJ45 transformers 12 and 11 electricity of RJ45 connectors to be detected
Property connection and physical chip 13 and RJ45 transformers 12 be electrically connected, wherein RJ45 transformers 12 are to provide physical layer core
The filtering that signal is carried out between piece 13 and RJ45 connectors 11 to be detected is used and improves physical chip 13 and RJ45 to be detected companies
It connects effectiveness between device 11 and prevents low frequency signal from interfering.
Detection circuit board 20 is provided for the conduction detection of the RJ45 connectors 11 to be detected of circuit board 10 to be detected,
In detection circuit board 20, detection RJ45 connectors 21 are electrically connected by grid line and RJ45 connectors 11 to be detected, that is, are detected
First pin pin1 of RJ45 connectors 21 is electrically connected with the first pin pin1 of RJ45 connectors 11 to be detected by grid line
It connects;The second pin pin2 and the second pin pin2 of RJ45 connectors 11 to be detected of detection RJ45 connectors 21 pass through grid line
It is electrically connected;The third pin pin3 and the third pin pin3 of RJ45 connectors 11 to be detected of detection RJ45 connectors 21 pass through
Grid line is electrically connected;Detect the 6th pin of the 6th pin pin6 and RJ45 connectors 11 to be detected of RJ45 connectors 21
Pin6 is electrically connected by grid line;Detect the of the 4th pin pin4 of RJ45 connectors 21 and RJ45 connectors 11 to be detected
Four pin pin4 are electrically connected by grid line;Detect the 5th pin pin5 of RJ45 connectors 21 and RJ45 connectors to be detected
11 the 5th pin pin5 is electrically connected by grid line;Detect the 7th pin pin7 and RJ45 to be detected of RJ45 connectors 21
7th pin pin7 of connector 11 is electrically connected by grid line;And the 8th pin pin8 of detection RJ45 connectors 21 with
8th pin pin8 of RJ45 connectors 11 to be detected is electrically connected by grid line.
And the second pin pin2 for detecting the first pin pin1 and detection the RJ45 connector 21 of RJ45 connectors 21 is regarded
For the first circuit (loopback);Detect the 6th of third pin pin3 and detection the RJ45 connector 21 of RJ45 connectors 21
Pin pin2 is considered as second servo loop;Detect the 5th of the 4th pin pin4 and detection the RJ45 connector 21 of RJ45 connectors 21
Pin pin5 is considered as tertiary circuit;And the 7th pin pin7 and detection the RJ45 connector 21 of detection RJ45 connectors 21
8th pin pin8 is considered as the 4th circuit.
Switch chip 22 and detection RJ45 connectors 21 are electrically connected, i.e. the first output pin pin_O1 of switch chip 22
It is electrically connected with the first pin pin1 of detection RJ45 connectors 21;Second output pin pin_O2 of switch chip 22 and detection
The second pin pin2 of RJ45 connectors 21 is electrically connected;The third output pin pin_O3 of switch chip 22 connects with detection RJ45
The third pin pin3 for connecing device 21 is electrically connected;4th output pin pin_O4 of switch chip 22 and detection RJ45 connectors 21
The 6th pin pin6 be electrically connected;The 4th of 5th output pin pin_O1 of switch chip 22 and detection RJ45 connectors 21
Pin pin4 is electrically connected;5th pin of the 6th output pin pin_O6 of switch chip 22 and detection RJ45 connectors 21
Pin5 is electrically connected;7th pin pin7 electricity of the 7th output pin pin_O7 of switch chip 22 and detection RJ45 connectors 21
Property connection;And the 8th output pin pin_O8 of switch chip 22 and the 8th pin pin8 of detection RJ45 connectors 21 is electrical
Connection, by control switch chip 22 with determine switch chip 22 pin whether with corresponding 21 pin of detection RJ45 connectors
Conducting.
Programmable chip 23 is electrically connected with switch chip 22, you can the first input and output pin pin_ of programming chip 23
The first input pin pin_I1 of IO1 and switch chip 22 are electrically connected;Second input and output pin of programmable chip 23
The second input pin pin_I2 of pin_IO2 and switch chip 22 are electrically connected;The third input and output of programmable chip 23 are drawn
Foot pin_IO3 and the third input pin pin_I3 of switch chip 22 are electrically connected;4th input and output of programmable chip 23
Pin pin_IO4 and the 4th input pin pin_I4 of switch chip 22 are electrically connected;5th input of programmable chip 23 is defeated
Go out pin pin_IO5 and the 5th input pin pin_I5 of switch chip 22 is electrically connected;6th input of programmable chip 23
Output pin pin_IO6 and the 6th input pin pin_I6 of switch chip 22 are electrically connected;The 7th of programmable chip 23 is defeated
Enter output pin pin_IO7 and the 7th input pin pin_I7 of switch chip 22 is electrically connected;And programmable chip 23
The 8th input pin pin_I8 of 8th input and output pin pin_IO8 and switch chip 22 are electrically connected.
Above-mentioned programmable chip 23 includes complex programmable logic chip (Complex Programmable Logic
Device, CPLD) and field programmable gate array chip (Field Programmable Gate Array, FPGA), herein
By way of example only it, not with this limit to the present invention application category, and the pin of switch chip 22 whether with corresponding inspection
It surveys the 21 pin conducting of RJ45 connectors to be controlled by programmable chip 23, and programmable chip 23 is to generate
First conduction detection signal.
Above-mentioned first conduction detection signal includes 4 detection signals, each detection signal corresponds respectively to detect
21 corresponding circuit of RJ45 connectors, each above-mentioned detection signal are, for example,:0001,0010,0011,0100 ... etc., herein
It, does not limit to the application category of the present invention, and it is worth noting that, when detecting, first is connected with this by way of example only
Each detection signal in detection signal all differs, to avoid erroneous judgement when causing to detect.
Pin of the output pin of joint test working group chip 24 respectively by capacitance and detection RJ45 connectors is electrical
Connection, i.e. the first output pin pin_JO1 of joint test working group chip 24 are connect by the first capacitance C1 with detection RJ45
First pin pin1 of device 21 is electrically connected;Second output pin pin_JO2 of joint test working group chip 24 passes through second
The second pin pin2 of capacitance C2 and detection RJ45 connectors 21 is electrically connected;The third of joint test working group chip 24 exports
Pin pin_JO3 is electrically connected by the third pin pin3 of third capacitance C3 and detection RJ45 connectors 21;Joint test work
The 6th pin pin6 that 4th output pin pin_JO4 of work group chip 24 passes through the 4th capacitance C4 and detection RJ45 connectors 21
It is electrically connected;5th output pin pin_JO5 of joint test working group chip 24 is connected by the 5th capacitance C5 and detection RJ45
The 4th pin pin4 for connecing device 21 is electrically connected;6th output pin pin_JO6 of joint test working group chip 24 passes through
5th pin pin5 of six capacitance C6 and detection RJ45 connectors 21 is electrically connected;The 7th of joint test working group chip 24 is defeated
Go out pin pin_JO7 to be electrically connected by the 7th pin pin7 of the 7th capacitance C7 and detection RJ45 connectors 21;And joint
8th output pin pin_JO8 of test job group chip 24 is drawn by the 8th capacitance C8 and the 8th of detection RJ45 connectors 21
Foot pin8 is electrically connected, and joint test working group chip 24 is to generate the second conduction detection signal.
The capacitance of above-mentioned first capacitance C1 to the 8th capacitance C8 between 20nF between 1000nF, examine by above-mentioned second conducting
It is to turn off the switch when chip 22 is connected with detection RJ45 connectors 21 to generate in switch chip 22 to survey signal, the second conduction detection letter
Number comprising the first difference (differential) transmission (Tx) signal group and the first differential received (Rx) signal group respectively with the
Primary Ioops and second servo loop be corresponding and the second difference transmission signal group and the second differential received signal group respectively with third
Circuit and the 4th circuit correspond to.
The first difference transmission signal Tx1_DP that first difference transmits signal group is by joint test working group chip 24
Second output pin pin_JO2 is sent out, and the second difference transmission signal Tx1_DN that the first difference transmits signal group is by combining
The third output pin pin_JO3 of test job group chip 24 is sent out, and the second difference transmits the first difference transmission of signal group
Signal Tx2_DP is sent out by the 5th output pin pin_JO5 of joint test working group chip 24, the second difference transmission letter
The second difference transmission signal Tx2_DN of number group is the 7th output pin pin_JO7 transmission by joint test working group chip 24
Go out, herein by way of example only it, not with this limit to the present invention application category.
First differential received signal Rx1_DP of the first differential received signal group is by joint test working group chip 24
First output pin pin_JO1 is received, and the second differential received signal Rx1_DN of the first differential received signal group is surveyed by joint
The 6th output pin pin_JO6 for trying working group's chip 24 is received, the first differential received signal of the second differential received signal group
Rx2_DP is received by the 4th output pin pin_JO4 of joint test working group chip 24, the second differential received signal group
Second differential received signal Rx2_DN is received by the 8th output pin pin_JO8 of joint test working group chip 24, herein
It, does not limit to the application category of the present invention with this by way of example only.
The joint test working group connector 25 of detection circuit board 20 respectively with programmable chip 23 and joint test work
Work group chip 24 is electrically connected, and joint test working group connector 25, which is available to signal controller 30, to be electrically connected (generally to come
It says that signal controller 30 is to wait to be plugged in joint test working group connector 25 by signal wire, winding displacement ..., is only for example herein
Illustrate it, the application category of the present invention is not limited to this).
Signal controller 30 is provided for 24 required work of programmable chip 23 and joint test working group chip
Make voltage, and signal controller 30 is by boundary scan (boundary scan) technical controlling programmable chip 23 to produce
Raw first conduction detection signal and signal controller 30 are to control joint test working group chip 24 by boundary scan technique
To generate the second conduction detection signal, to carry out the conduction detection of open circuit and short circuit to the pin of RJ45 connectors to be detected.
Assuming that signal controller 30 controls programmable chip 23 by boundary scan technique generates the first conduction detection signal
Respectively first detection signal is " 0001 ", the second detection signal is " 0010 ", third detection signal is " 0011 " and the 4th
It is " 0100 " to detect signal.
First detection signal corresponds to the first circuit, when the second pin pin2 of detection RJ45 connectors 21 sends out first
It is " 0001 " to detect signal, and it is " 0001 " that the first pin pin1 by detecting RJ45 connectors 21, which receives first detection signal,
When, it indicates that the first circuit is completely normal, has no the problem of open circuit and short circuit.
Second detection signal corresponds to second servo loop, when the third pin pin3 of detection RJ45 connectors 21 sends out second
It is " 0010 " to detect signal, and it is " 1111 " that the 6th pin pin6 by detecting RJ45 connectors 21, which receives the second detection signal,
When (being expressed as dull state), expression detects that second servo loop has breaking problem.
Third detects signal and corresponds to tertiary circuit and the 4th detection signal corresponding to the 4th circuit, when detection RJ45 connects
The 5th pin pin5 for connecing device 21 sends out third detection signal as " 0011 " and the 7th pin of detection RJ45 connectors 21
It is " 0100 " that pin7, which sends out the 4th detection signal, and the 4th pin pin4 by detecting RJ45 connectors 21 receives third detection
It is " 0001 " that signal receives the 4th detection signal for the 8th pin pin8 of " 0001 " and detection RJ45 connectors 21, is indicated
Detect that tertiary circuit and the 4th circuit have short circuit problem.
Above-mentioned pin signal transmission with receive by way of example only it, in fact can be drawn by programmable chip 23
Foot signal transmits the setting with reception, system that the present invention is not limited thereto.
Signal is transmitted when sending out the first difference by the second output pin pin_JO2 of joint test working group chip 24
The first output pin pin_JO1 of Tx1_DP and joint test working group chip 24 receive the first differential received signal Rx1_DP phases
Meanwhile it indicating to detect that the first circuit has short circuit problem.
Signal is transmitted when sending out the second difference by the third output pin pin_JO3 of joint test working group chip 24
The 6th output pin pin_JO6 of Tx1_DN and joint test working group chip 24 receive the second differential received signal Rx1_DN phases
Meanwhile it indicating to detect that second servo loop has short circuit problem.
Signal is transmitted when sending out the first difference by the 5th output pin pin_JO5 of joint test working group chip 24
The 4th output pin pin_JO4 of Tx2_DP and joint test working group chip 24 receive the first differential received signal Rx2_DP phases
Meanwhile it indicating to detect that tertiary circuit has short circuit problem.
Signal is transmitted when sending out the second difference by the 7th output pin pin_JO7 of joint test working group chip 24
The 8th output pin pin_JO8 of Tx2_DN and joint test working group chip 24 receive the second differential received signal Rx2_DN phases
Meanwhile it indicating to detect that the 4th circuit has short circuit problem.
In summary, it is known that the difference between the present invention and the prior art be the present invention respectively by signal controller with
Boundary scan technique control programmable chip and joint test working group chip generate respectively the first conduction detection signal and
Second conduction detection signal, to carry out the conduction detection of open circuit and short circuit to the pin of RJ45 connectors to be detected.
The conduction detection efficiency of existing RJ45 connectors present in the prior art can be solved by this technological means
Insufficient problem, and then reach and the easy technical effect to RJ45 connector conduction detections is provided.
Although disclosed herein embodiment it is as above, only the content is not directly to limit the special of the present invention
Sharp protection domain.Any the technical staff in the technical field of the invention, do not depart from disclosed herein spirit and model
Under the premise of enclosing, a little change can be made in the formal and details of implementation.The scope of patent protection of the present invention, still must be with
Subject to appended claims institute defender.
Claims (7)
1. a kind of conduction detecting system suitable for RJ45 connectors, be suitable for RJ45 connectors to be detected, RJ45 transformers with
An and circuit board detecting to be detected of physical chip electrical series, which is characterized in that include:
One detection circuit board, the detection circuit board further include:
One detection RJ45 connectors, the detection RJ45 connectors are electrically connected by grid line and the RJ45 connectors to be detected
It connects;
One switch chip, the switch chip are electrically connected with the detection RJ45 connectors;
One programmable chip, the programmable chip and the switch chip are electrically connected, and the programmable chip is controlling
Whether the pin conducting of the switch chip, the programmable chip is generating one first conduction detection signal;
One joint test working group chip, the output pin of the joint test working group chip respectively by capacitance with it is corresponding
The pin of the detection RJ45 connectors is electrically connected, and the joint test working group chip is generating one second conduction detection
Signal;And
One joint test working group connector, the joint test working group connector respectively with the programmable chip and institute
State the electric connection of joint test working group chip;And
One signal controller, the signal controller are electrically connected with the joint test working group connector, and described in control
Programmable chip generates the first conduction detection signal, or the control joint test working group chip generates described second
Conduction detection signal, to carry out the conduction detection of open circuit and short circuit to the pin of the RJ45 connectors to be detected.
2. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the programmable core
Piece includes complex programmable logic chip and field programmable gate array chip.
3. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the joint test
The second conduction detection signal caused by working group's chip includes that two groups of difference transmit signal and two groups of differential received letters
Number.
4. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the joint test
The output pin of working group's chip passes through capacitance and the capacitance in the pin electric connection of the detection RJ45 connectors respectively
Between 20nF between 1000nF.
5. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the programmable core
Piece and the joint test working group chip are to provide required operating voltage by the signal controller.
6. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the signal control
Device is to control the programmable chip by boundary scan technique to generate the first conduction detection signal.
7. being suitable for the conduction detecting system of RJ45 connectors as described in claim 1, which is characterized in that the signal control
Device is that signal boundary scanning technique controls the joint test working group chip to generate the second conduction detection signal.
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CN201611127641.9A CN108614178A (en) | 2016-12-09 | 2016-12-09 | Conduction detecting system suitable for RJ45 connectors |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111104279A (en) * | 2018-10-29 | 2020-05-05 | 英业达科技有限公司 | SAS connector conduction detection system and method thereof |
CN112286747A (en) * | 2020-11-06 | 2021-01-29 | 苏州浪潮智能科技有限公司 | Method, system, device and medium for detecting server cable |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1589409A (en) * | 2001-09-27 | 2005-03-02 | 英特尔公司 | Method and apparatus for in-circuit testing of sockets |
CN1614437A (en) * | 2003-11-06 | 2005-05-11 | 安捷伦科技有限公司 | Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies |
CN101241462A (en) * | 2007-02-08 | 2008-08-13 | 佛山市顺德区顺达电脑厂有限公司 | Signal circuit detection device |
CN202735479U (en) * | 2012-09-11 | 2013-02-13 | 中国电子科技集团公司第三十八研究所 | Extensible boundary scan test system |
CN103675576A (en) * | 2012-09-18 | 2014-03-26 | 英业达科技有限公司 | Chip connection test system and method based on boundary scan |
-
2016
- 2016-12-09 CN CN201611127641.9A patent/CN108614178A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1589409A (en) * | 2001-09-27 | 2005-03-02 | 英特尔公司 | Method and apparatus for in-circuit testing of sockets |
CN1614437A (en) * | 2003-11-06 | 2005-05-11 | 安捷伦科技有限公司 | Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies |
CN101241462A (en) * | 2007-02-08 | 2008-08-13 | 佛山市顺德区顺达电脑厂有限公司 | Signal circuit detection device |
CN202735479U (en) * | 2012-09-11 | 2013-02-13 | 中国电子科技集团公司第三十八研究所 | Extensible boundary scan test system |
CN103675576A (en) * | 2012-09-18 | 2014-03-26 | 英业达科技有限公司 | Chip connection test system and method based on boundary scan |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111104279A (en) * | 2018-10-29 | 2020-05-05 | 英业达科技有限公司 | SAS connector conduction detection system and method thereof |
CN111104279B (en) * | 2018-10-29 | 2021-11-12 | 英业达科技有限公司 | SAS connector conduction detection system and method thereof |
CN112286747A (en) * | 2020-11-06 | 2021-01-29 | 苏州浪潮智能科技有限公司 | Method, system, device and medium for detecting server cable |
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Application publication date: 20181002 |