CN108613959B - SERS chip and preparation method thereof - Google Patents
SERS chip and preparation method thereof Download PDFInfo
- Publication number
- CN108613959B CN108613959B CN201810240090.XA CN201810240090A CN108613959B CN 108613959 B CN108613959 B CN 108613959B CN 201810240090 A CN201810240090 A CN 201810240090A CN 108613959 B CN108613959 B CN 108613959B
- Authority
- CN
- China
- Prior art keywords
- pits
- substrate
- sers chip
- conductive material
- chip according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004416 surface enhanced Raman spectroscopy Methods 0.000 title claims abstract description 52
- 238000002360 preparation method Methods 0.000 title abstract description 12
- 239000000758 substrate Substances 0.000 claims abstract description 62
- 239000002105 nanoparticle Substances 0.000 claims abstract description 24
- 239000002086 nanomaterial Substances 0.000 claims abstract description 19
- 239000004020 conductor Substances 0.000 claims description 34
- 238000000034 method Methods 0.000 claims description 24
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 16
- 229910052709 silver Inorganic materials 0.000 claims description 16
- 239000004332 silver Substances 0.000 claims description 16
- 239000006185 dispersion Substances 0.000 claims description 14
- 239000010931 gold Substances 0.000 claims description 13
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 12
- 229910052737 gold Inorganic materials 0.000 claims description 12
- 238000001338 self-assembly Methods 0.000 claims description 10
- 239000007788 liquid Substances 0.000 claims description 9
- 239000002904 solvent Substances 0.000 claims description 9
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 8
- 238000011065 in-situ storage Methods 0.000 claims description 7
- 239000002245 particle Substances 0.000 claims description 6
- 239000002077 nanosphere Substances 0.000 claims description 5
- 238000007639 printing Methods 0.000 claims description 5
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 238000003486 chemical etching Methods 0.000 claims description 4
- 239000011258 core-shell material Substances 0.000 claims description 4
- 238000005553 drilling Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000001020 plasma etching Methods 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 238000002848 electrochemical method Methods 0.000 claims description 3
- 238000010329 laser etching Methods 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 239000002131 composite material Substances 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 238000005530 etching Methods 0.000 claims description 2
- 150000007529 inorganic bases Chemical class 0.000 claims 1
- 150000007530 organic bases Chemical class 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 3
- 230000035945 sensitivity Effects 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 9
- 239000002082 metal nanoparticle Substances 0.000 description 8
- 239000011148 porous material Substances 0.000 description 8
- 238000001069 Raman spectroscopy Methods 0.000 description 7
- 239000007864 aqueous solution Substances 0.000 description 7
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 6
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 238000003756 stirring Methods 0.000 description 6
- 229910021642 ultra pure water Inorganic materials 0.000 description 6
- 239000012498 ultrapure water Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000001509 sodium citrate Substances 0.000 description 5
- 238000005406 washing Methods 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- WTDHULULXKLSOZ-UHFFFAOYSA-N Hydroxylamine hydrochloride Chemical compound Cl.ON WTDHULULXKLSOZ-UHFFFAOYSA-N 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 230000002209 hydrophobic effect Effects 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 239000002253 acid Substances 0.000 description 3
- 238000000861 blow drying Methods 0.000 description 3
- 238000009835 boiling Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 230000001276 controlling effect Effects 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- VKYKSIONXSXAKP-UHFFFAOYSA-N hexamethylenetetramine Chemical compound C1N(C2)CN3CN1CN2C3 VKYKSIONXSXAKP-UHFFFAOYSA-N 0.000 description 3
- 230000001788 irregular Effects 0.000 description 3
- 238000010907 mechanical stirring Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 229910000510 noble metal Inorganic materials 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 229910001961 silver nitrate Inorganic materials 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- HRXKRNGNAMMEHJ-UHFFFAOYSA-K trisodium citrate Chemical compound [Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O HRXKRNGNAMMEHJ-UHFFFAOYSA-K 0.000 description 3
- 229940038773 trisodium citrate Drugs 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910001260 Pt alloy Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- SZVJSHCCFOBDDC-UHFFFAOYSA-N ferrosoferric oxide Chemical compound O=[Fe]O[Fe]O[Fe]=O SZVJSHCCFOBDDC-UHFFFAOYSA-N 0.000 description 2
- PQTCMBYFWMFIGM-UHFFFAOYSA-N gold silver Chemical compound [Ag].[Au] PQTCMBYFWMFIGM-UHFFFAOYSA-N 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 238000001127 nanoimprint lithography Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 239000004926 polymethyl methacrylate Substances 0.000 description 2
- 239000010970 precious metal Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000004451 qualitative analysis Methods 0.000 description 2
- 238000004445 quantitative analysis Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000002791 soaking Methods 0.000 description 2
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000000479 surface-enhanced Raman spectrum Methods 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 229910001339 C alloy Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 1
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 description 1
- IHWJXGQYRBHUIF-UHFFFAOYSA-N [Ag].[Pt] Chemical compound [Ag].[Pt] IHWJXGQYRBHUIF-UHFFFAOYSA-N 0.000 description 1
- GUWKQWHKSFBVAC-UHFFFAOYSA-N [C].[Au] Chemical compound [C].[Au] GUWKQWHKSFBVAC-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- JBTHDAVBDKKSRW-UHFFFAOYSA-N chembl1552233 Chemical compound CC1=CC(C)=CC=C1N=NC1=C(O)C=CC2=CC=CC=C12 JBTHDAVBDKKSRW-UHFFFAOYSA-N 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- QRJOYPHTNNOAOJ-UHFFFAOYSA-N copper gold Chemical compound [Cu].[Au] QRJOYPHTNNOAOJ-UHFFFAOYSA-N 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000008098 formaldehyde solution Substances 0.000 description 1
- JUWSSMXCCAMYGX-UHFFFAOYSA-N gold platinum Chemical compound [Pt].[Au] JUWSSMXCCAMYGX-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229920002521 macromolecule Polymers 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000002715 modification method Methods 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229940073450 sudan red Drugs 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
Abstract
Description
Claims (12)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810240090.XA CN108613959B (en) | 2018-03-22 | 2018-03-22 | SERS chip and preparation method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810240090.XA CN108613959B (en) | 2018-03-22 | 2018-03-22 | SERS chip and preparation method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108613959A CN108613959A (en) | 2018-10-02 |
CN108613959B true CN108613959B (en) | 2020-03-24 |
Family
ID=63658634
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810240090.XA Active CN108613959B (en) | 2018-03-22 | 2018-03-22 | SERS chip and preparation method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108613959B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109738469A (en) * | 2018-12-29 | 2019-05-10 | 赛纳生物科技(北京)有限公司 | A kind of compactness detection method of FOP surface micro-pit plated film |
CN110314830B (en) * | 2019-07-09 | 2020-10-02 | 山东大学 | Flexible surface enhanced Raman scattering substrate based on single-layer ordered nanoparticle array |
CN112666148B (en) * | 2020-12-02 | 2022-03-29 | 山东大学 | Surface-enhanced Raman scattering detection substrate, system, preparation method of surface-enhanced Raman scattering detection substrate and system, and application of surface-enhanced Raman scattering detection substrate and system in cancer diagnosis |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7321422B2 (en) * | 2004-09-16 | 2008-01-22 | Hewlett-Packard Development Company, L.P. | SERS-active structures having nanoscale dimensions |
CN101024483B (en) * | 2007-03-27 | 2010-12-29 | 吉林大学 | Constituting method for metal ordered structure surface reinforced base |
JP2009031023A (en) * | 2007-07-25 | 2009-02-12 | Keio Gijuku | Production method of substrate for surface enhanced raman spectroscopic analysis, manufacturing method of micro-tas, and the micro-tas |
CN104949957A (en) * | 2015-04-07 | 2015-09-30 | 上海大学 | Embedded type nano dot array surface enhanced Raman active substrate and preparation method thereof |
CN105259157B (en) * | 2015-11-06 | 2018-01-16 | 合肥学院 | A kind of focus visible surface enhanced Raman scattering substrate, preparation method and the method using the substrate detection molecules |
CN106282931B (en) * | 2016-08-11 | 2019-08-09 | 华南师范大学 | A method of preparing orderly silver nanoparticle ball array |
-
2018
- 2018-03-22 CN CN201810240090.XA patent/CN108613959B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN108613959A (en) | 2018-10-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Wang et al. | Advanced colloidal lithography: From patterning to applications | |
Son et al. | Placement control of nanomaterial arrays on the surface-reconstructed block copolymer thin films | |
CN103868909B (en) | Mushroom-shaped array surface strengthens Raman spectrum active substrate and preparation method | |
CN108613959B (en) | SERS chip and preparation method thereof | |
CN108872192B (en) | SERS unit and SERS system | |
Akin et al. | Large area uniform deposition of silver nanoparticles through bio-inspired polydopamine coating on silicon nanowire arrays for practical SERS applications | |
Lin et al. | Size and dimension dependent surface-enhanced Raman scattering properties of well-defined Ag nanocubes | |
CN108872185B (en) | Preparation method of SERS chip | |
Goreham et al. | A substrate independent approach for generation of surface gradients | |
CN102590179A (en) | Silver nano lattice surface enhanced raman active substrate and preparation method thereof | |
JP2007139612A (en) | Microstructure, method of manufacturing same, raman spectroscopy and raman spectroscopic device | |
Zayer et al. | Accurate controlled deposition of silver nanoparticles on porous silicon by drifted ions in electrolytic solution | |
Chakraborti et al. | Vertically aligned silicon nanowire array decorated by Ag or Au nanoparticles as SERS substrate for bio-molecular detection | |
CN104237202B (en) | A kind of silicon nano-array substrate and preparation method thereof, application | |
CN109827949B (en) | SERS substrate for detecting synthetic pigment and Raman detection method | |
CN109612975B (en) | Surface-enhanced Raman substrate and preparation method thereof | |
CN109795979B (en) | Preparation method of nanopore array structure with embedded metal ring | |
Bechelany et al. | Extended domains of organized nanorings of silver grains as surface-enhanced Raman scattering sensors for molecular detection | |
CN103257132A (en) | Silver nanoparticle cap array surface-enhanced raman activity substrate and preparation method thereof | |
JP2008128786A (en) | Surface-strengthened tool for vibration spectral analysis and its manufacturing method | |
Chen et al. | Sonochemical and mechanical stirring synthesis of liquid metal nanograss structures for low‐cost SERS substrates | |
Huang et al. | Self-assembled dendrite Ag arrays with tunable morphologies for surface-enhanced Raman scattering | |
Shin et al. | Fabrication of 50 nm scale Pt nanostructures by block copolymer (BCP) and its characteristics of surface-enhanced Raman scattering (SERS) | |
CN108872186B (en) | Preparation method of SERS chip | |
CN108872184B (en) | Preparation method of SERS chip |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20200724 Address after: Room 406, building 09, Northwest District of Suzhou nano City, No.99 Jinjihu Avenue, Suzhou Industrial Park, Suzhou area, China (Jiangsu) pilot Free Trade Zone, Suzhou City, Jiangsu Province Patentee after: Suzhou Infineon nanotechnology Co.,Ltd. Address before: 215123 7 D building, 398 Shui Shui Road, Suzhou Industrial Park, Jiangsu Patentee before: SUZHOU TIANJI INNOVATION NANO TECHNOLOGY Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240104 Address after: Room 301, Building NE-37, Northeast District, Suzhou Nanocity, No. 99 Jinjihu Avenue, Suzhou Area, China (Jiangsu) Pilot Free Trade Zone, Suzhou City, Jiangsu Province, 215124 Patentee after: Suzhou Nawei Life Technology Co.,Ltd. Address before: Room 406, building 09, northwest Suzhou nano City, 99 Jinjihu Avenue, Suzhou Industrial Park, Suzhou area, China (Jiangsu) pilot Free Trade Zone, Suzhou 215000 Patentee before: Suzhou Infineon nanotechnology Co.,Ltd. |