CN108597425B - Testing device and testing method for OLED display panel - Google Patents
Testing device and testing method for OLED display panel Download PDFInfo
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- CN108597425B CN108597425B CN201810230778.XA CN201810230778A CN108597425B CN 108597425 B CN108597425 B CN 108597425B CN 201810230778 A CN201810230778 A CN 201810230778A CN 108597425 B CN108597425 B CN 108597425B
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- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The invention provides a testing device and a method for an OLED display panel, wherein the device comprises the following steps: the test signal supply pad area, the signal supply device, a pair of first contraposition pads and a pair of second contraposition pads; the pair of first counterpoint pads are mutually connected or are both connected with zero potential; the first alignment pad is used as an alignment mark of the test signal receiving pad area; the second alignment pad is used as an alignment mark of the test signal supply pad area; when the test signal supply pad is aligned and attached with the test signal receiving pad, the test signal supply pad transmits a test signal to the test signal receiving pad; when the signal supply device aligns and attaches the plurality of test signal supply pads and the plurality of test signal receiving pads, whether fixed capacitance or impedance is induced at the pair of second alignment pads or not is judged, and if yes, the test signals are output to the plurality of test signal supply pads. The invention can realize accurate alignment of the test signal supply gasket and the test signal receiving gasket in the OLED display panel.
Description
Technical Field
The invention relates to the technical field of display, in particular to a testing device and a testing method for an OLED display panel.
Background
AMOLED (Active-matrix organic light emitting diode) has the advantages of wide color gamut, high contrast, energy saving, and being foldable, and is one of the most competitive technologies in the new generation of display; in order to ensure the yield of an OLED (organic light emitting diode)/LCD (Liquid Crystal Display) panel, a plurality of testing links are inevitably inserted in the production process, and a CT (Cell Test) lighting Test is one of the most important links.
A conventional test Pad supply method is that a Flexible Printed Circuit (FPC) directly supplies a signal by a method of "soft pressing" on the test Pad of the display panel (the signal is mostly supplied by pressing with a probe before that); whether the probe is extruded or the FPC is directly extruded, the phenomenon of abnormal picture display caused by inaccurate alignment can be encountered; the currently common alignment mode adopts optical alignment, the FPC and the CT Pad are amplified through a CCD (charge coupled device) lens, and alignment marks are made on two sides of the Pad, so that alignment is realized. As shown in fig. 1, the display panel may have a plurality of test pads 03 ', which may be divided into a left test Pad area 01' and a right test Pad area 02 ', 04' which are alignment marks for optical alignment, and fig. 2 and 3 show an inorganic film layer 05 'and an organic film layer 06'. However, when the alignment is performed optically, the CT Pad enlarged by the CCD lens is observed by the human eye, and sometimes the alignment is not accurate due to the error observed by the human eye.
Disclosure of Invention
In order to solve the above technical problems, the present invention provides a testing apparatus and a testing method for an OLED display panel, which can achieve accurate alignment between a test signal supply pad and a test signal receiving pad in the OLED display panel.
The invention provides a testing device for an OLED display panel, which comprises: the test signal supply pad area, the signal supply device, a pair of first contraposition pads and a pair of second contraposition pads; the first alignment pad and the second alignment pad are both conductive, and the pair of first alignment pads are electrically connected with each other or the pair of first alignment pads are both switched in a zero potential;
the pair of first alignment pads are respectively positioned at two sides of a test signal receiving pad area on the OLED display panel and used as alignment marks of the test signal receiving pad area;
the pair of second alignment pads are respectively positioned at two sides of the test signal supply pad area and used as alignment marks of the test signal supply pad area;
the test signal supply pad area comprises a plurality of test signal supply pads, the test signal receiving pad area comprises a plurality of test signal receiving pads, and the test signal supply pads transmit test signals to corresponding test signal receiving pads when aligned and attached with the corresponding test signal receiving pads;
the signal supply device is electrically connected with the test signal supply pads and the pair of second alignment pads, and is used for judging whether fixed capacitance or impedance is induced at the pair of second alignment pads or not when the test signal supply pads are aligned and attached with the test signal receiving pads, and if so, outputting a test signal to the test signal supply pads.
Preferably, the plurality of test signal supply pads are identical in shape and size and are arranged at equal intervals, and the plurality of test signal receiving pads are identical in shape and size and are arranged at equal intervals;
the test signal supply pads and the test signal receiving pads are the same in shape and size, and the distance between every two adjacent test signal supply pads is the same as the distance between every two adjacent test signal receiving pads.
Preferably, the first alignment pad and the second alignment pad are the same in shape and size;
the first alignment pads are spaced from the test signal receiving pad region by the same distance d1, and the second alignment pads are spaced from the test signal supply pad region by the same distance d2, where d1 is d 2.
Preferably, the signal supply device includes: the capacitive sensing selection module is electrically connected with the signal output module;
the signal output module is used for outputting the test signal to the capacitance sensing selection module;
the capacitance sensing selection module is electrically connected with the pair of second alignment pads and used for judging whether fixed capacitance or impedance is sensed at the pair of second alignment pads or not when the plurality of test signal supply pads are aligned and attached with the plurality of test signal receiving pads, and if yes, the test signals are output to the test signal supply pads.
Preferably, the OLED display panel includes an organic film layer and an inorganic film layer;
the first alignment pad and the plurality of test signal receiving pads are positioned on the inorganic film layer, the first alignment pad is further covered by the organic film layer, and the pair of first alignment pads are connected with zero potential;
the signal output module is electrically connected with the pair of second alignment pads and is further used for outputting a voltage signal to the pair of second alignment pads;
the capacitance sensing selection module is used for receiving the voltage signal through the pair of second alignment pads and judging whether fixed capacitances are formed at the pair of second alignment pads or not through the voltage signal.
Preferably, the OLED display panel includes an inorganic film layer; the first alignment pads and the plurality of test signal receiving pads are positioned on the inorganic film layer, and the pair of first alignment pads are electrically connected with each other;
the capacitance sensing selection module is used for judging whether impedances are sensed at the pair of second alignment pads or not when the plurality of test signal supply pads are aligned and attached with the plurality of test signal receiving pads.
Preferably, a pair of third alignment pads and a pair of fourth alignment pads are further included; the third alignment pad and the fourth alignment pad are both conductive;
the pair of third alignment pads are respectively positioned at two sides of the test signal receiving pad area and used as alignment marks of the test signal receiving pad area;
the pair of fourth alignment pads are respectively positioned at two sides of the test signal supply pad area and used as alignment marks of the test signal supply pad area;
the pair of third alignment pads are connected with a zero potential, and each fourth alignment pad is electrically connected with the capacitance sensing selection module and the signal output module respectively;
the signal output module is electrically connected with the pair of fourth alignment pads and is further used for outputting a voltage signal to the pair of fourth alignment pads;
the capacitance sensing selection module is further configured to receive the voltage signal through the pair of fourth alignment pads when the plurality of test signal supply pads are aligned and attached to the plurality of test signal receiving pads, and determine whether a fixed capacitance is formed at each of the pair of fourth alignment pads through the voltage signal.
The invention also provides a testing method for the OLED display panel, which is applied to the testing device for the OLED display panel and comprises the following steps:
s1, aligning and attaching the plurality of test signal supply pads and the plurality of test signal receiving pads, and judging whether fixed capacitance or impedance is induced at the pair of second alignment pads through the signal supply device;
and S2, if a fixed capacitance or impedance is induced at both of the pair of second alignment pads, outputting a test signal to the plurality of test signal supply pads.
Preferably, the signal supply device is used for judging whether the fixed capacitors are sensed at the pair of second alignment pads, and the method specifically comprises the following steps:
a signal output module in the signal supply device outputs a voltage signal to the pair of second alignment pads;
a capacitance sensing selection module in the signal supply device receives the voltage signal through the pair of second alignment pads and judges whether fixed capacitances are formed at the pair of second alignment pads or not through the voltage signal;
step S2 includes the following steps:
the signal output module outputs the test signal to the capacitance sensing selection module;
the capacitance sensing selection module outputs a test signal to the plurality of test signal supply pads when fixed capacitance or impedance is sensed at both the pair of second alignment pads.
Preferably, step S1 is specifically:
aligning and attaching the plurality of test signal supply pads and the plurality of test signal receiving pads, judging whether the pair of second alignment pads sense impedance through the signal supply device, and judging whether the pair of fourth alignment pads sense inherent capacitance;
step S2 specifically includes:
if an impedance is induced at both of the pair of second alignment pads and an inherent capacitance is induced at both of the pair of fourth alignment pads, a test signal is output to the plurality of test signal supply pads.
The implementation of the invention has the following beneficial effects: according to the invention, the first alignment pads are arranged on the two sides of the test signal receiving pad area on the OLED display panel, the second alignment pads are arranged on the two sides of the test signal supplying pad area, and when the test signal supplying pad area and the test signal receiving pad area are aligned and attached (namely aligned to form soft pressure), whether the second alignment pads are aligned with the first alignment pads or not is judged by judging whether fixed capacitors are formed between the second alignment pads and the first alignment pads or whether impedance between the first alignment pads can be detected, so that whether the second alignment pads are aligned with the first alignment pads or not can be judged, and further, whether the test signal supplying pads are aligned with the test signal receiving pads or not can be judged. After the test signal supply pads are aligned with the test signal receiving pads, the test signals are transmitted to the test signal supply pads, and the test signals are transmitted to the test signal receiving pads of the OLED display panel through the test signal supply pads.
Therefore, the invention can realize the accurate alignment of the test signal supply pad and the test signal receiving pad, can greatly improve the accuracy of the alignment of the test signal supply pad and the test signal receiving pad, can accurately transmit the test signal to the OLED display panel, achieves the aim of accurate alignment test, and prevents the OLED display panel from having abnormal picture display.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a test pad in the background art provided by the present invention.
FIG. 2 is a schematic diagram of the structure of the left test pad of FIG. 1 on a display panel according to the present invention.
FIG. 3 is a schematic diagram of the structure of the right side test pad of FIG. 1 on a display panel according to the present invention.
Fig. 4 is a schematic diagram of a signal supply device, a pair of second alignment pads, and a test signal supply pad area according to a first embodiment of the present invention.
FIG. 5 is a schematic diagram of a first alignment pad switched in to zero potential and a test signal receiving pad area in a first embodiment of the present invention.
FIG. 6 is a diagram illustrating a pair of first alignment pads electrically connected to each other and a test signal receiving pad area according to a second embodiment of the present invention.
Fig. 7 is a schematic structural diagram of the left test signal receiving pad area on the display panel in fig. 4 according to the present invention.
Fig. 8 is a schematic structural diagram of the right test signal receiving pad area on the display panel in fig. 4 according to the present invention.
FIG. 9 is a schematic diagram of a second alignment pad and a first alignment pad forming a capacitor according to the present invention.
Fig. 10 is a schematic structural diagram of the left test signal receiving pad area on the display panel in fig. 5 according to the present invention.
Fig. 11 is a schematic structural diagram of the right test signal receiving pad area on the display panel in fig. 5 according to the present invention.
Fig. 12 is a schematic diagram of a signal supply device, a pair of second alignment pads, and a test signal supply pad area according to a second embodiment of the present invention.
Fig. 13 is a schematic view of a first alignment pad and a third alignment pad in a third embodiment of the present invention.
Fig. 14 is a schematic diagram of a signal supply device, a pair of second alignment pads, a pair of fourth alignment pads, and a test signal supply pad area according to a third embodiment of the present invention.
Detailed Description
The present invention provides a testing device for an OLED display panel, the testing device including: a test signal supply pad area 12 shown in fig. 4, a signal supply device 6, a pair of second alignment pads 32, a pair of first alignment pads 31 shown in fig. 5 or 6; in the first embodiment, as shown in fig. 5, a pair of the first alignment pads 31 are connected to a zero potential, for example, the first alignment pads 31 are connected to the ground line 311; as shown in fig. 6, in the second embodiment, a pair of first alignment pads 31 are electrically connected to each other through a metal line 312. Of course, the pair of first alignment pads 31 can also be switched into the zero potential through other signal lines that can provide the zero potential.
The pair of first alignment pads 31 are respectively located on two sides of the test signal receiving pad area 11 on the OLED display panel, and serve as alignment marks of the test signal receiving pad area 11.
The pair of second alignment pads 32 are respectively located at two sides of the test signal supply pad area 12, and serve as alignment marks for the test signal supply pad area 12.
The test signal supply pad area 12 includes a plurality of test signal supply pads 22, and the test signal reception pad area 11 includes a plurality of test signal reception pads 21, and the test signal supply pads 22 deliver test signals to the corresponding test signal reception pads 21 when aligned and attached to the corresponding test signal reception pads 21.
When the pair of second alignment pads 32 are aligned with the pair of first alignment pads 31, the plurality of test signal supply pads 22 are aligned with the plurality of test signal reception pads 21, respectively.
The signal supply device 6 is electrically connected to the plurality of test signal supply pads 22 and the pair of second alignment pads 32, and is configured to determine whether a fixed capacitance or impedance is induced at each of the pair of second alignment pads 32 when the plurality of test signal supply pads 22 are aligned and attached to the plurality of test signal receiving pads 21, and if so, determine that the second alignment pads 32 are aligned with the first alignment pads 31, that is, each of the test signal supply pads 22 in the test signal supply pad area 12 is aligned with each of the test signal receiving pads 21 in the test signal receiving pad area 11, and at this time, may output a test signal to the plurality of test signal supply pads 22.
Preferably, the test signal supply pad region 12 and the pair of second alignment pads 32 are both located on an FPC (Flexible Printed Circuit), and the signal supply device 6 is electrically connected to the FPC. The first alignment pad 31, the second alignment pad 32, the test signal supply pad 22, and the test signal reception pad 21 may be made of a metal material or an ITO (indium tin oxide) conductive material.
Further, the plurality of test signal supply pads 22 are arranged in the same shape and size at equal intervals, and the plurality of test signal reception pads 21 are arranged in the same shape and size at equal intervals.
The test signal supply pads 22 and the test signal receiving pads 21 have the same shape and size, and the distance between two adjacent test signal supply pads 22 is the same as the distance between two adjacent test signal receiving pads 21.
Further, the first alignment pad 31 and the second alignment pad 32 have the same shape and size; the first alignment pads 31 are spaced from the test signal receiving pad area 11 by the same distance d1, and the second alignment pads 32 are spaced from the test signal supply pad area 12 by the same distance d2, where d1 is d 2.
Further, as shown in fig. 4, the signal supply device 6 includes: a capacitance sensing selection module 61 and a signal output module 62 electrically connected to the capacitance sensing selection module 61.
The signal output module 62 is used for outputting the test signal to the terminal 612 of the capacitance sensing selection module 61 through the terminal 621.
The capacitance sensing selection module 61 is electrically connected to the pair of second alignment pads 32, and is configured to determine whether a fixed capacitance or impedance is sensed at each of the pair of second alignment pads 32 when the plurality of test signal supply pads 22 are aligned and attached to the plurality of test signal receiving pads 21, and if so, output a test signal to the test signal supply pads 22 through the terminal 611.
Generally, the capacitance sensing selection module 61 may be configured to be electrically connected to the test signal supply pad 22 through a switching device such as a thin film transistor, and when the capacitance sensing selection module 61 determines that a fixed capacitance or impedance is sensed at both of the pair of second alignment pads 32, the thin film transistor may be controlled to be turned on.
In the first embodiment, the OLED display panel includes the organic film layer 4 and the inorganic film layer 5 shown in fig. 7 and 8. The organic film layer 4 is an insulating film layer.
The first alignment pad 31 and the plurality of test signal receiving pads 21 are all located on the inorganic film layer 5, the first alignment pad 31 is further covered by the organic film layer 4, and the pair of first alignment pads 31 are all connected to zero potential. The plurality of test signal receiving pads 21 are each spaced apart from one another by the organic film layer 4.
The signal output module 62 is electrically connected to the pair of second alignment pads 32, and is further configured to output a voltage signal to the pair of second alignment pads 32 through the terminal 622. The voltage signal here may be a low potential signal.
The capacitance sensing selection module 61 is configured to receive a voltage signal through the pair of second alignment pads 32, and determine whether a fixed capacitance is formed at each of the pair of second alignment pads 32 according to the voltage signal. As shown in fig. 9, the second alignment pad 32 is separated from the first alignment pad 31 by the organic film layer 4 when the alignment is performed, so that whether a fixed capacitance can be formed between the second alignment pad 32 and the first alignment pad 31 can be determined. Here, the capacitance sensing selection module 61 may determine the magnitude of the fixed capacitance at the second alignment pad 32 by sensing a potential variation of the voltage signal.
In the second embodiment, the OLED display panel includes the inorganic film layer 5 shown in fig. 10 and 11; the first alignment pads 31 and the plurality of test signal receiving pads 21 are disposed on the inorganic film 5, and the pair of first alignment pads 31 are electrically connected to each other; in the second embodiment, the test signal receiving pad 21 does not need to be covered by the organic film layer 4, so that the first alignment pad 31 and the second alignment pad 32 can be electrically connected when they are aligned.
The capacitance sensing selection module 61 is used for determining whether impedance is sensed at each of the pair of second alignment pads 32 when the plurality of test signal supply pads 22 are aligned and attached to the plurality of test signal receiving pads 21. As shown in fig. 12, in the second embodiment, the signal output module 62 may not be connected to the second alignment pad 32, the terminal 611 and the terminal 612 are the signal output terminal and the signal receiving terminal of the capacitance sensing selection module 61, respectively, and the terminal 621 is the signal output terminal of the signal output module 62. The capacitance sensing selection module 61 can detect the impedance between the pair of first alignment pads 31 by using the principle of a multimeter, for example, by outputting a current signal to the first alignment pad 31 through the second alignment pad 32 and detecting the voltage between the pair of second alignment pads 32, the impedance between the pair of first alignment pads 31 can be calculated. As long as the pair of first alignment pads 31 is aligned with the pair of second alignment pads 32, the impedance between the pair of first alignment pads 31 can be detected by the capacitance sensing selection module 61.
In the third embodiment, the testing apparatus for an OLED display panel further includes a pair of third alignment pads 71 and a pair of fourth alignment pads 72 as shown in fig. 13; the third alignment pad 71 and the fourth alignment pad 72 are both conductive.
The pair of third alignment pads 71 are respectively located at two sides of the test signal receiving pad area 11 and serve as alignment marks for the test signal receiving pad area 11.
The pair of fourth alignment pads 72 are respectively located at two sides of the test signal supply pad area 12, and serve as alignment marks for the test signal supply pad area 12.
The pair of third alignment pads 71 are connected to a zero potential, for example, the ground line 711 is connected to the zero potential, and each of the fourth alignment pads 72 is electrically connected to the capacitance sensing selection module 61 and the signal output module 62, respectively. The pair of first alignment pads 31 are electrically connected to each other.
As shown in fig. 14, the signal output module 62 is electrically connected to the pair of fourth alignment pads 72, and is further configured to output a voltage signal to the pair of fourth alignment pads 72 through the terminal 622. The terminal 621 is also a signal output terminal of the signal output module 62, and the terminal 611 and the terminal 612 are respectively a signal output terminal and a signal receiving terminal of the capacitance sensing selection module 61.
The capacitance sensing selection module 61 is configured to determine whether impedances are sensed at the pair of second alignment pads 32 when the plurality of test signal supply pads 22 are aligned and attached to the plurality of test signal receiving pads 21, receive a voltage signal through the pair of fourth alignment pads 72, and determine whether a fixed capacitance is formed at the pair of fourth alignment pads 72 through the voltage signal. If the capacitance sensing selection module 61 determines that the pair of second alignment pads 32 sense the impedance and the pair of fourth alignment pads 72 form a fixed capacitance, it is determined that the second alignment pads 32 are aligned with the first alignment pads 31 and the fourth alignment pads 72 are aligned with the third alignment pads 71, that is, the test signal supply pads 22 are aligned with the test signal receiving pads 21, and at this time, the test signal can be transmitted to the test signal receiving pads 21 through the test signal supply pads 22.
In the third embodiment, it can be determined whether the second alignment pad 32 is aligned with the first alignment pad 31, and it can also be determined whether the fourth alignment pad 72 is aligned with the third alignment pad 71, thereby performing a double safety function.
The invention also provides a testing method for the OLED display panel, which is characterized by being applied to the testing device for the OLED display panel, and the testing method comprises the following steps:
s1, aligning and bonding the test signal supply pads 22 and the test signal reception pads 21, and determining whether a fixed capacitance or impedance is induced at each of the pair of second alignment pads 32 by the signal supply device 6;
s2, if a fixed capacitance or impedance is sensed at both of the pair of second alignment pads 32, then a test signal is output to the plurality of test signal supply pads 22.
Further, the signal supply device 6 is used to determine whether the fixed capacitors are sensed at the pair of second alignment pads 32, specifically:
the signal output module 62 in the signal supply device 6 outputs the voltage signal to the pair of second alignment pads 32;
the capacitance sensing selection module 61 in the signal supply device 6 receives the voltage signal through the pair of second alignment pads 32, and determines whether a fixed capacitance is formed at each of the pair of second alignment pads 32 according to the voltage signal;
step S2 includes the following steps:
the signal output module 62 outputs the test signal to the capacitance sensing selection module 61;
the capacitance sensing selection module 61 outputs a test signal to the plurality of test signal supply pads 22 when a fixed capacitance or impedance is sensed at both of the pair of second alignment pads 32.
Further, when the testing method is applied to the testing apparatus including the third alignment pad 71 and the pair of fourth alignment pads 72, the step S1 specifically includes:
aligning and attaching a plurality of test signal supply pads 22 and a plurality of test signal receiving pads 21, determining whether impedance is induced at a pair of second alignment pads 32 and determining whether inherent capacitance is induced at a pair of fourth alignment pads 72 by a signal supply device 6;
step S2 specifically includes:
if an impedance is sensed at both the pair of second alignment pads 32 and an inherent capacitance is sensed at both the pair of fourth alignment pads 72, a test signal is output to the plurality of test signal supply pads 22.
In summary, in the present invention, a pair of first alignment pads 31 is disposed on two sides of the test signal receiving pad area 11 on the OLED display panel, and a pair of second alignment pads 32 is disposed on two sides of the test signal supplying pad area 12, so that when the test signal supplying pad area 12 and the test signal receiving pad area 11 are aligned and attached (i.e. aligned "soft pressure"), whether the second alignment pads 32 and the first alignment pads 31 are aligned or not is determined by determining whether a fixed capacitor is formed between the second alignment pads 32 and the first alignment pads 31 or whether the impedance between the pair of first alignment pads 31 can be detected, and thus whether the test signal supplying pads 22 and the test signal receiving pads 21 are aligned or not can be determined. After the test signal supply pads 22 are aligned with the test signal receiving pads 21, the test signals are supplied to the test signal supply pads 22, and the test signals are supplied to the test signal receiving pads 21 of the OLED display panel through the test signal supply pads 22.
Therefore, the invention can realize the accurate alignment of the test signal supply pad 22 and the test signal receiving pad 21, can greatly improve the accuracy of the alignment of the test signal supply pad 22 and the test signal receiving pad 21, can accurately transmit the test signal to the OLED display panel, achieves the aim of accurate alignment test, and prevents the OLED display panel from having abnormal picture display.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (8)
1. A test apparatus for an OLED display panel, comprising: the test signal supply pad area, the signal supply device, a pair of first contraposition pads and a pair of second contraposition pads; the first alignment pad and the second alignment pad are both conductive, and the pair of first alignment pads are electrically connected with each other or the pair of first alignment pads are both switched in a zero potential;
the pair of first alignment pads are respectively positioned at two sides of a test signal receiving pad area on the OLED display panel and used as alignment marks of the test signal receiving pad area;
the pair of second alignment pads are respectively positioned at two sides of the test signal supply pad area and used as alignment marks of the test signal supply pad area;
the test signal supply pad area comprises a plurality of test signal supply pads, the test signal receiving pad area comprises a plurality of test signal receiving pads, and the test signal supply pads transmit test signals to corresponding test signal receiving pads when aligned and attached with the corresponding test signal receiving pads;
the signal supply device includes: the capacitive sensing selection module is electrically connected with the signal output module;
the signal output module is used for outputting the test signal to the capacitance sensing selection module;
the capacitance sensing selection module is electrically connected with the pair of second alignment pads and used for judging whether fixed capacitance or impedance is sensed at the pair of second alignment pads or not when the plurality of test signal supply pads are aligned and attached with the plurality of test signal receiving pads, and if yes, the test signals are output to the test signal supply pads.
2. The testing apparatus for the OLED display panel according to claim 1, wherein the plurality of test signal supply pads are arranged in the same shape and size at equal intervals, and the plurality of test signal reception pads are arranged in the same shape and size at equal intervals;
the test signal supply pads and the test signal receiving pads are the same in shape and size, and the distance between every two adjacent test signal supply pads is the same as the distance between every two adjacent test signal receiving pads.
3. The testing apparatus for OLED display panels according to claim 2,
the first alignment pad and the second alignment pad are the same in shape and size;
the first alignment pads are spaced from the test signal receiving pad region by the same distance d1, and the second alignment pads are spaced from the test signal supply pad region by the same distance d2, where d1 is d 2.
4. The testing apparatus for OLED display panels according to claim 3,
the OLED display panel comprises an organic film layer and an inorganic film layer;
the first alignment pad and the plurality of test signal receiving pads are positioned on the inorganic film layer, the first alignment pad is further covered by the organic film layer, and the pair of first alignment pads are connected with zero potential;
the signal output module is electrically connected with the pair of second alignment pads and is further used for outputting a voltage signal to the pair of second alignment pads;
the capacitance sensing selection module is used for receiving the voltage signal through the pair of second alignment pads and judging whether fixed capacitances are formed at the pair of second alignment pads or not through the voltage signal.
5. The testing device for the OLED display panel according to claim 3, wherein the OLED display panel includes an inorganic film layer; the first alignment pads and the plurality of test signal receiving pads are positioned on the inorganic film layer, and the pair of first alignment pads are electrically connected with each other;
the capacitance sensing selection module is used for judging whether impedances are sensed at the pair of second alignment pads or not when the plurality of test signal supply pads are aligned and attached with the plurality of test signal receiving pads.
6. The testing device for the OLED display panel according to claim 5, further comprising a pair of third alignment pads and a pair of fourth alignment pads; the third alignment pad and the fourth alignment pad are both conductive;
the pair of third alignment pads are respectively positioned at two sides of the test signal receiving pad area and used as alignment marks of the test signal receiving pad area;
the pair of fourth alignment pads are respectively positioned at two sides of the test signal supply pad area and used as alignment marks of the test signal supply pad area;
the pair of third alignment pads are connected with a zero potential, and each fourth alignment pad is electrically connected with the capacitance sensing selection module and the signal output module respectively;
the signal output module is electrically connected with the pair of fourth alignment pads and is further used for outputting a voltage signal to the pair of fourth alignment pads;
the capacitance sensing selection module is further configured to receive the voltage signal through the pair of fourth alignment pads when the plurality of test signal supply pads are aligned and attached to the plurality of test signal receiving pads, and determine whether a fixed capacitance is formed at each of the pair of fourth alignment pads through the voltage signal.
7. A testing method for an OLED display panel is applied to the testing device for the OLED display panel of any one of claims 1 to 6, and comprises the following steps:
s1, aligning and attaching the plurality of test signal supply pads and the plurality of test signal receiving pads, and judging whether fixed capacitance or impedance is induced at the pair of second alignment pads through the signal supply device;
wherein, judge whether a pair of second counterpoint liner department all senses fixed capacitance through signal supply device, specifically do:
a signal output module in the signal supply device outputs a voltage signal to the pair of second alignment pads;
a capacitance sensing selection module in the signal supply device receives the voltage signal through the pair of second alignment pads and judges whether fixed capacitances are formed at the pair of second alignment pads or not through the voltage signal;
s2, if a fixed capacitance or impedance is induced at both of the pair of second alignment pads, outputting a test signal to the plurality of test signal supply pads;
wherein, step S2 includes the following steps:
the signal output module outputs the test signal to the capacitance sensing selection module;
the capacitance sensing selection module outputs a test signal to the plurality of test signal supply pads when fixed capacitance or impedance is sensed at both the pair of second alignment pads.
8. The testing method for the OLED display panel according to claim 7, wherein when the testing method is applied to the testing apparatus according to claim 6, the step S1 is specifically as follows:
aligning and attaching the plurality of test signal supply pads and the plurality of test signal receiving pads, judging whether the pair of second alignment pads sense impedance through the signal supply device, and judging whether the pair of fourth alignment pads sense inherent capacitance;
step S2 specifically includes:
if an impedance is induced at both of the pair of second alignment pads and an inherent capacitance is induced at both of the pair of fourth alignment pads, a test signal is output to the plurality of test signal supply pads.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810230778.XA CN108597425B (en) | 2018-03-20 | 2018-03-20 | Testing device and testing method for OLED display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810230778.XA CN108597425B (en) | 2018-03-20 | 2018-03-20 | Testing device and testing method for OLED display panel |
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| Publication Number | Publication Date |
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