CN108538702B - The method for carrying out negative ions analysis simultaneously in an ion trap - Google Patents
The method for carrying out negative ions analysis simultaneously in an ion trap Download PDFInfo
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- CN108538702B CN108538702B CN201810534658.9A CN201810534658A CN108538702B CN 108538702 B CN108538702 B CN 108538702B CN 201810534658 A CN201810534658 A CN 201810534658A CN 108538702 B CN108538702 B CN 108538702B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
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Abstract
The invention discloses a kind of methods for carrying out negative ions analysis simultaneously in an ion trap, it is characterized by: the ion trap is the annular ion trap surrounded by two independent ion trap tracks, each ion trap track surrounds its ion analysis region by four independent electrode plates；The described method includes: in the ion incidence of the annular ion trap, separation phase and ion analysis stage, apply contrary DC constant voltage to two ion trap tracks respectively, by positive and negative separation to two ion trap tracks when making in ion incidence to the annular ion trap, so that in the ion analysis stage, while one of ion trap track carries out cation analysis, another ion trap track carries out anion analysis.It may be implemented in the separation of negative ions in the same ion trap through the invention and while analyzing.
Description
Technical field
The present invention relates to ion detection technical fields, positive and negative more particularly, to that can carry out simultaneously in the same ion trap
The method of ion analysis.
Background technique
Mass spectrograph is a kind of by qualitative, quantitatively measurement substance charge-mass ratio, so that it is determined that the instrument of the substance.Ion
Trap is one of core component of ion trap mass spectrometer, and ion trap comes ion by charge-mass ratio size discrimination, and be sequentially sent to from
Sub- detector.In existing ion trap, one kind of cation or anion can only be once analyzed, it can not be same in an ion trap
When analyze negative ions.
The disclosure of background above technology contents is only used for auxiliary and understands inventive concept and technical solution of the invention, not
The prior art for necessarily belonging to present patent application shows above content in the applying date of present patent application in no tangible proof
Before have disclosed in the case where, above-mentioned background technique should not be taken to evaluation the application novelty and creativeness.
Summary of the invention
It is a primary object of the present invention to propose it is a kind of in an ion trap while the method that carries out negative ions analysis, pass through
Using the annular ion trap being made of two independent fan-shaped ion trap tracks, applied in incidence to two fan-shaped ion trap tracks
Add contrary voltage to realize the separation of negative ions, change the voltage of application after separation again, so that two fan-shaped ion traps
Track carries out the analysis of negative ions respectively, divides to realize the separation of the negative ions in the same ion trap and synchronize
Analysis.
The present invention proposes following technical scheme for the above-mentioned purpose:
A method of negative ions analysis being carried out simultaneously in an ion trap, the ion trap is by two independent ions
The annular ion trap that trap track surrounds, each ion trap track surround its ion analysis district by four independent electrode plates
Domain；The described method includes:
In the ion incidence stage and ion analysis stage of the annular ion trap, respectively to two ion trap rails
Road additionally applies contrary DC constant voltage, by positive and negative separation to two when making in ion incidence to the annular ion trap
A ion trap track, so that one of ion trap track carries out the same of cation analysis in the ion analysis stage
When, another ion trap track carries out anion analysis.
It can overcome ion trap that can only analyze simultaneously a kind of ion of property (just when carrying out ion analysis through the invention
Ion perhaps anion) defect realize macromolecular cleavage or ionic reaction after, efficient, the comprehensive detection of ion improves
Detection efficiency.
Detailed description of the invention
Fig. 1 is the annular ion trap structural schematic diagram that can carry out negative ions analysis simultaneously of the embodiment of the present invention；
Fig. 2 is the explosive view of annular ion well structure shown in FIG. 1；
Fig. 3 is the top view of annular ion trap shown in FIG. 1；
Fig. 4 is the effect picture of simion emulation ion trap separation negative ions；
Fig. 5 is the schematic diagram that annular ion trap of the invention carries out negative ions separation in the ion incidence stage；
Fig. 6 is the timing diagram for applying operating voltage in the annular ion trap course of work of the invention.
Specific embodiment
The invention will be further described with specific embodiment with reference to the accompanying drawing.
The method that a specific embodiment of the invention provides one kind in an ion trap while carrying out negative ions analysis, institute
Stating ion trap is the annular ion trap surrounded by two independent ion trap tracks, and each ion trap track is only by four
Vertical electrode plate surrounds its ion analysis region；The described method includes:
In the ion incidence stage and ion analysis stage of the annular ion trap, respectively to two ion trap rails
Road additionally applies contrary DC constant voltage, by positive and negative separation to two when making in ion incidence to the annular ion trap
A ion trap track, so that one of ion trap track carries out the same of cation analysis in the ion analysis stage
When, another ion trap track carries out anion analysis.So, so that it may so that negative ions are in incident stage and analysis
Stage is all to be individually separated in different ion trap tracks, and the analysis of negative ions can be carried out simultaneously in an ion trap,
Two ion trap tracks, a progress cation analysis, another carries out anion analysis, works each independently, so as to
To improve ion detection efficiency.
A kind of exemplary structure of the annular ion trap of the invention is as shown in Figure 1 to Figure 3, and the annular ion trap is by two
A independent ion trap track 100 and 200 is constituted, and each ion trap track is to surround its ion by four independent electrode plates
Analyzed area.For ease of description, described two independent ion trap tracks can be referred to as to the first ion trap track 100 and
Two ion trap tracks 200.
First ion trap track 100 is surrounded by first to fourth electrode plate 1,2,3,4, wherein first electrode plate 1 and second
Electrode plate 2 is two opposite electrode plates, and third electrode plate 3 and the 4th electrode plate 4 are also two electricity for being in relative position
Pole plate, also, ion exit slit can be located therein on any one group of opposite electrode plate, for example, shown in Fig. 1 to Fig. 3
Embodiment in, ion exit slit 10 is located on the third and fourth electrode plate 3,4.In another embodiment, ion exit
Slit can be located on the first and second electrode plates 1,2.
Second ion trap track 200 is surrounded by the 5th to the 8th electrode plate 5,6,7,8, and the opposite electrode plate of two of them is
5th and the 6th electrode plate 5,6, other two opposite electrode plate are the 7th and the 8th electrode plate 7,8, similarly, the second ion
The ion exit slit of trap track 200 can also be located therein on any one group of opposite electrode plate, such as exemplified by Fig. 1 to 3,
Its ion exit slit 11 is located on the 7th and the 8th electrode plate 7,8, it is of course also possible to be located at the 5th and the 6th electrode plate
On.
The size of first and second ion trap tracks can be identical, can not also be identical, and the present invention restricts not to this.Ion
It is incident from ion incidence slit 9 when incident, it is positive when all applying on four electrodes in the first ion trap track 100 with reference to Fig. 5
DC constant voltage V1, when all applying negative DC constant voltage V2 on four electrodes of the second fan-shaped ion trap 200, for the
For one ion trap track 100, both ends are opposite with the second ion trap track, a voltage trap V1 ' formed, to hold onto
Anion；And for the second ion trap track 200, both ends are opposite with the first ion trap track, form a voltage
Massif V2 ' achievees the effect that negative ions separate to hold onto cation, that is, in the ion incidence stage, side of the invention
Negative ions incident simultaneously are separated to two ion trap tracks by method, as shown in figure 4, illustrating the positive and negative ion after incidence
Motion profile a2, a1 in trap.
In one embodiment, when the ion exit slit of the first ion trap track 100 is located at the third and fourth electrode plate
3, on 4, and when the ion exit slit of the second ion trap track 200 is located on the 7th and the 8th electrode plate 7,8, with reference to Fig. 6:
Apply respectively on ion incidence stage S1, the first and second electrode plates 1,2 size and Orientation it is all the same first
Voltage applies size and Orientation second voltage all the same on the 5th and the 6th electrode plate 5,6 respectively, wherein first electricity
Pressure and the second voltage are the fixed high frequency voltage (RF expression) of amplitude, and the amplitude of first voltage and second voltage is solid respectively
It is set to VRF1And VRF2, two values can be identical, can also be different.And all apply on all electrode plates of two ion trap tracks straight
Galvanic electricity pressure (DC expression), in which: on first to fourth electrode plate 1,2,3,4 respectively all apply size and Orientation it is all the same first
DC constant voltage V1；All apply size and Orientation the second direct current all the same on 5th to the 8th electrode plate 5,6,7,8 respectively
Constant voltage V2, and V1 is positive voltage, and V2 is negative voltage.
Apply size and Orientation third all the same respectively on ion analysis stage S2, the first and second electrode plates 1,2
Voltage applies size and Orientation the 4th voltage all the same on the 5th and the 6th electrode plate 5,6 respectively, wherein the third electricity
Pressure and the 4th voltage are that (i.e. amplitude is scan variations to high frequency amplitude scanning voltage, and the ion incidence stage is width
Value is fixed)；Apply the first resonance excitation voltage that size is identical, contrary on third and fourth electrode plate 3,4 respectively, the 7th
Apply the second resonance excitation voltage that size is identical, contrary respectively on the 8th electrode plate 7,8, indicates resonant excitation with AC
Voltage, when the positive and negative ion in the analyzed area of two ion trap tracks reaches respective resonant excitation point, shown in Fig. 5
Embodiment, anion in 100 region of the first ion trap track is from the ion exit slit outgoing on electrode plate 3 and 4, and the
Cation in two ion trap tracks, 200 region is emitted from the ion exit slit on electrode plate 7 and 8.At this stage, Ge Ge electricity
The DC constant voltage that pole plate keeps stage S1 to apply is constant.
In ion removing stage S3, the voltage on all electrode plates is unloaded, remaining ion loses constraint, removes out of trap
It goes out.
In another embodiment, if the ion exit slit of the first ion trap track 100 is located at the first and second electrodes
On plate 1,2, and the ion exit slit of the second ion trap track 200 is located on the 5th and the 6th electrode plate 5,6, then ion incidence
Stage applies alive mode can be identical as previous embodiment, but in the ion analysis stage, the difference is that resonance excitation voltage
Application with high frequency amplitude scanning voltage should swap round, and specifically be exactly: apply respectively on the third and fourth electrode plate 3,4
Add the tertiary voltage that size and Orientation is all the same, it is identical, contrary to apply size respectively on the first and second electrode plates 1,2
First resonance excitation voltage, applies size and Orientation the 4th voltage all the same on the 7th and the 8th electrode plate 7,8 respectively, and the 5th
Apply the second resonance excitation voltage that size is identical, contrary respectively on the 6th electrode plate 5,6.
It should be noted that the amplitude in the resonance excitation voltage AC of ion analysis stage application can be fixed value or scanning
Value.
In addition, the present invention does not restrict the mode for generating negative ions source, it can be using a variety of well known methods, example
Such as corona discharge ion source, Supersonic electric spray ion source.Also the shape of electrode plate is not restricted, can for plate electrode,
Arc-shaped electrode, hyperbolic line electrode or three corner electrodes etc..Track shape ion trap shown in the drawings is not limited to the shape of ion trap,
It is also possible to other shapes of polygon trap or chamfering circle trap etc..To slit location, length, width, the shape on electrode plate
Also with no restriction.
The above content is a further detailed description of the present invention in conjunction with specific preferred embodiments, and it cannot be said that
Specific implementation of the invention is only limited to these instructions.For those skilled in the art to which the present invention belongs, it is not taking off
Under the premise of from present inventive concept, several equivalent substitute or obvious modifications can also be made, and performance or use is identical, all answered
When being considered as belonging to protection scope of the present invention.
Claims (6)
1. a kind of method for carrying out negative ions analysis simultaneously in an ion trap, it is characterised in that: the ion trap is by two
The annular ion trap that independent ion trap track surrounds, each ion trap track surround it by four independent electrode plates
Ion analysis region；The described method includes:
In the ion incidence stage and ion analysis stage of the annular ion trap, respectively to two ion trap track volumes
It is outer to apply contrary DC constant voltage, by positive and negative separation to two institutes when making in ion incidence to the annular ion trap
Ion trap track is stated, so that in the ion analysis stage, while one of ion trap track carries out cation analysis, separately
One ion trap track carries out anion analysis；
When ion incidence, enter to inject the annular ion trap from the slit between two ion trap tracks, and be applied to
Under the action of the contrary DC constant voltage on two ion trap tracks, the cation direct current negative towards application
The ion trap track of constant voltage is mobile, while anion is mobile towards the ion trap track for applying positive DC constant voltage.
2. the method as described in claim 1, it is characterised in that: described two independent ion trap tracks are the first ion trap rail
Road and the second ion trap track；The first ion trap track is surrounded, two of them by first to fourth electrode plate (1,2,3,4)
Opposite electrode plate be the first and second electrode plates (1,2), other two opposite electrode plate be the third and fourth electrode plate (3,
4), also, ion exit slit is located on the first and second electrode plates, alternatively, being located on the third and fourth electrode plate；Described
Two ion trap tracks are surrounded by the 5th to the 8th electrode plate (5,6,7,8), and the opposite electrode plate of two of them is the 5th and the 6th
Electrode plate (5,6), other two opposite electrode plate is the 7th and the 8th electrode plate (7,8), also, ion exit slit is located at
On 5th and the 6th electrode plate, alternatively, being located on the 7th and the 8th electrode plate.
3. method according to claim 2, it is characterised in that: when ion exit slit be located at the first and second electrode plates (1,
2), and, when on the 5th and the 6th electrode plate (5,6):
In the ion incidence stage, the first and second electrode plates apply size and Orientation first voltage all the same on (1,2) respectively,
Apply size and Orientation second voltage all the same respectively on 5th and the 6th electrode plate (5,6), wherein the first voltage and
The second voltage is the fixed high frequency voltage of amplitude；And first to fourth apply on electrode plate (1,2,3,4) respectively it is big
Small and direction the first DC constant voltage all the same applies size and side on 5th to the 8th electrode plate (5,6,7,8) respectively
To the second DC constant voltage all the same；
In the ion analysis stage, the third and fourth electrode plate applies size and Orientation tertiary voltage all the same on (3,4) respectively,
Apply the first resonance excitation voltage that size is identical, contrary on first and second electrode plates (1,2) respectively, the 7th and the 8th
Apply size and Orientation the 4th voltage all the same on electrode plate (7,8) respectively, is applied respectively on the 5th and the 6th electrode plate (5,6)
Increase small the second identical, contrary resonance excitation voltage, wherein the tertiary voltage and the 4th voltage are high frequency
Amplitude scanning voltage；And first to fourth apply that size and Orientation is all the same on electrode plate (1,2,3,4) respectively described
One DC constant voltage, apply on the 5th to the 8th electrode plate (5,6,7,8) respectively size and Orientation it is all the same described second
DC constant voltage.
4. method according to claim 2, it is characterised in that: when ion exit slit be located at the third and fourth electrode plate (3,
4), and, when on the 7th and the 8th electrode plate (7,8):
In the ion incidence stage, the first and second electrode plates apply size and Orientation first voltage all the same on (1,2) respectively,
Apply size and Orientation second voltage all the same respectively on 5th and the 6th electrode plate (5,6), wherein the first voltage and
The second voltage is the fixed high frequency voltage of amplitude；And first to fourth apply on electrode plate (1,2,3,4) respectively it is big
Small and direction the first DC constant voltage all the same applies size and side on 5th to the 8th electrode plate (5,6,7,8) respectively
To the second DC constant voltage all the same；
In the ion analysis stage: the first and second electrode plates apply size and Orientation tertiary voltage all the same on (1,2) respectively,
Apply the first resonance excitation voltage that size is identical, contrary on third and fourth electrode plate (3,4) respectively, the 5th and the 6th
Apply size and Orientation the 4th voltage all the same on electrode plate (5,6) respectively, is applied respectively on the 7th and the 8th electrode plate (7,8)
Increase small the second identical, contrary resonance excitation voltage, wherein the tertiary voltage and the 4th voltage are high frequency
Amplitude scanning voltage；And first to fourth apply that size and Orientation is all the same on electrode plate (1,2,3,4) respectively described
One DC constant voltage, apply on the 5th to the 8th electrode plate (5,6,7,8) respectively size and Orientation it is all the same described second
DC constant voltage.
5. the method as claimed in claim 3 or 4, it is characterised in that: first resonance excitation voltage and second resonance
The amplitude of excitation voltage is fixed value or scan values.
6. the method as claimed in claim 3 or 4, it is characterised in that: after the analysis for completing negative ions, unload the annular
All voltages applied in ion trap carry out ion removing.
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| CN201810534658.9A CN108538702B (en) | 2018-05-29 | 2018-05-29 | The method for carrying out negative ions analysis simultaneously in an ion trap |
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| US7456398B2 (en) * | 2006-05-05 | 2008-11-25 | Thermo Finnigan Llc | Efficient detection for ion traps |
| US7649170B2 (en) * | 2006-10-03 | 2010-01-19 | Academia Sinica | Dual-polarity mass spectrometer |
| GB0703378D0 (en) * | 2007-02-21 | 2007-03-28 | Micromass Ltd | Mass spectrometer |
| WO2014117293A1 (en) * | 2013-01-31 | 2014-08-07 | 北京理工大学 | Ion trap-based apparatus and method for analyzing and detecting bipolar ion |
| JP6553044B2 (en) * | 2013-12-24 | 2019-07-31 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | Simultaneous positive and negative ion accumulation in an ion trap for mass spectrometry |
| CN106024572B (en) * | 2016-07-22 | 2017-09-19 | 中国科学院合肥物质科学研究院 | The organic matter detection means and detection method of a kind of bipolarity Proton transfer reaction mass spectrometry |
| CN107591309B (en) * | 2017-08-30 | 2019-04-16 | 清华大学深圳研究生院 | The concurrent working method of ion trap |
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