CN108445527B - 一种射线源位置坐标的获取方法 - Google Patents
一种射线源位置坐标的获取方法 Download PDFInfo
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- CN108445527B CN108445527B CN201810088133.7A CN201810088133A CN108445527B CN 108445527 B CN108445527 B CN 108445527B CN 201810088133 A CN201810088133 A CN 201810088133A CN 108445527 B CN108445527 B CN 108445527B
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- 238000000034 method Methods 0.000 title claims abstract description 34
- 238000001514 detection method Methods 0.000 claims abstract description 68
- 238000012360 testing method Methods 0.000 claims abstract description 29
- 238000007499 fusion processing Methods 0.000 claims abstract description 11
- 230000005855 radiation Effects 0.000 claims description 53
- 239000004065 semiconductor Substances 0.000 claims description 20
- 238000012937 correction Methods 0.000 claims description 11
- 229910004613 CdTe Inorganic materials 0.000 claims description 5
- 229910004611 CdZnTe Inorganic materials 0.000 claims description 5
- 229910002249 LaCl3 Inorganic materials 0.000 claims description 5
- 229910014323 Lanthanum(III) bromide Inorganic materials 0.000 claims description 5
- 229910052732 germanium Inorganic materials 0.000 claims description 5
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 18
- 239000013078 crystal Substances 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 238000012545 processing Methods 0.000 description 6
- 238000012544 monitoring process Methods 0.000 description 3
- 238000010606 normalization Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011824 nuclear material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 238000005025 nuclear technology Methods 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 239000000941 radioactive substance Substances 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
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- Health & Medical Sciences (AREA)
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- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Electromagnetism (AREA)
- Measurement Of Radiation (AREA)
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CN201810088133.7A CN108445527B (zh) | 2018-01-30 | 2018-01-30 | 一种射线源位置坐标的获取方法 |
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CN201810088133.7A CN108445527B (zh) | 2018-01-30 | 2018-01-30 | 一种射线源位置坐标的获取方法 |
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CN108445527A CN108445527A (zh) | 2018-08-24 |
CN108445527B true CN108445527B (zh) | 2020-04-14 |
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Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101470205B (zh) * | 2007-12-29 | 2011-07-27 | 同方威视技术股份有限公司 | 放射性物质方位探测设备和方法 |
CN101614823B (zh) * | 2009-06-05 | 2011-09-28 | 上海市计量测试技术研究院 | 通道式放射性测控***的现场检测装置及检测方法 |
CN103176201B (zh) * | 2011-12-23 | 2015-03-25 | 同方威视技术股份有限公司 | 放射性物质巡检定位方法及设备 |
CN103645491B (zh) * | 2013-11-25 | 2016-12-07 | 中国科学院高能物理研究所 | 放射源定位方法、装置及*** |
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Effective date of registration: 20200108 Address after: 100080 Beijing Suzhou Street Haidian District No. 29 Talent Service Center No. 20041601 Applicant after: Zhang Lan Address before: 215434 Jiangsu city of Suzhou province Taicang economic and Technological Development Zone, North Ring Road Administrative Service Center ten floor Applicant before: YIRUI NEW MATERIAL TECHNOLOGY (TAICANG) Co.,Ltd. |
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Effective date of registration: 20231124 Address after: Room E402, 4th Floor, Building 1, No. 12 Shangdi Information Road, Haidian District, Beijing, 100085 Patentee after: Beijing lanthanum Technology Co.,Ltd. Address before: 100080 No. 20041601, talent service center, No. 29, Suzhou street, Haidian District, Beijing Patentee before: Zhang Lan |