CN108414450B - Momentum space imaging system and application thereof - Google Patents

Momentum space imaging system and application thereof Download PDF

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CN108414450B
CN108414450B CN201810101383.XA CN201810101383A CN108414450B CN 108414450 B CN108414450 B CN 108414450B CN 201810101383 A CN201810101383 A CN 201810101383A CN 108414450 B CN108414450 B CN 108414450B
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资剑
石磊
张译文
殷海玮
胡松婷
崔靖
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Shanghai Fuxiang Optics Co ltd
Fudan University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
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    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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Abstract

The invention discloses a momentum space imaging system and application thereof. The momentum space imaging system comprises at least the following components: the optical signal is received by the imaging device after passing through the objective lens, the optical lens A and the optical lens B in sequence. The momentum space imaging system can be used for measuring and representing optical information of the micro-nano photonics material in the momentum space, such as band gap properties, energy band structures, dispersion relations and the like. The system can realize optical measurement of a sample in a microscopic region, and the minimum measurement range can reach 1 micron; an observation measurement of the momentum space can also be realized. The momentum space imaging system can accurately select the measuring area of the sample and can be further used for selecting and detecting the momentum space information of the sample.

Description

Momentum space imaging system and application thereof
Technical Field
The invention relates to the technical field of space imaging, in particular to a momentum space imaging system and application thereof.
Background
With the continuous development of optics, in order to perform better modulation and deeper property research on light, people design and manufacture new optical materials and structures, such as photonic crystals, surface plasmons, metamaterial and the like, and gradually develop a new discipline, namely micro-nano photonics. The micro-nano photonics material enables the regulation and control capability of people on light to reach a new level through controllable structural design. The material has many different optical properties from the traditional homogeneous materials, such as nonlinear effects, topological characteristics, special light transport characteristics, and the like.
The micro-nano photonics material often has a periodic structure which is comparable with the action wavelength, can be miniaturized and integrated, and has wide application prospect in various photoelectric devices. The ordered arrangement and distribution of atoms in the crystal have a modulation effect on the movement of electrons. Similarly, the alternating arrangement of materials with different refractive indexes in the micro-nano photonic material also has a modulation effect on the propagation of electromagnetic waves, and can form special optical properties such as dispersion relation, photon energy band, photon band gap and the like which are different from light in a free space. And these properties are closely related to their momentum-space properties.
In recent years, micro-nano photonics develops rapidly, new material structures are continuously generated, new optical phenomena are discovered, and new requirements are provided for corresponding optical measurement technologies. At present, some patent technologies for measuring the optical characteristics of micro-nano photonic materials, such as photoelectric detection equipment, micro-imaging systems and the like, are available in the market. However, these techniques can only meet some of the measurement requirements:
1. a photodetection device. The photoelectric detection device is composed of a plurality of photosensitive elements, and the photosensitive elements can convert incident light signals into electric signals and then generate image signals after the electric signals are processed by a circuit. The photoelectric detection device can be used alone to perform imaging measurement on a macroscopic sample, however, the size of the micro-nano photonics material generally belongs to the mesoscopic (micron and submicron scale) range, and the photoelectric detection device cannot meet the required micro-area measurement requirement.
2. Microscopic imaging technique. The photoelectric detection equipment is combined with the microscope, and the imaging detection of the small-scale micro-nano photon structure can be realized by utilizing the microscopic resolution capability of the microscope and the imaging capability of the photoelectric detection equipment. The method is used for distinguishing in a sample space instead of a momentum space, and important momentum space optical properties of the micro-nano photonic material such as energy band information cannot be obtained, so that the method has certain limitation.
The momentum space imaging system can be used for measuring the optical properties of the micro-nano photonic material, can perform optical analysis and measurement on the micro-nano photonic material with mesoscopic dimensions, realizes microscopic resolution and optical measurement, can realize momentum space resolution at the same time, represents the optical properties of the micro-nano photonic material in a full-momentum space, and makes up for the vacancy of a corresponding optical measurement technology.
Disclosure of Invention
In view of this, the present invention provides a momentum space imaging system and an application thereof, where the system can realize mutual conversion between real space information and momentum space information of a sample through a plurality of optical elements, and utilize a photoelectric detection device to perform imaging and measurement of a momentum space. The system can detect and represent momentum space optical information of the micro-nano photonic material.
The invention adopts the following technical scheme to realize the purpose:
the invention relates to a momentum space imaging system, comprising at least: the optical signal is received by the imaging device after sequentially passing through the objective lens, the optical lens A and the optical lens B;
the distance d1 between the optical lens a and the back focal plane M0 of the objective lens satisfies the following condition:
Figure 246287DEST_PATH_IMAGE002
the distance d2 between the optical lens B and the optical lens A satisfies the following condition:
Figure 710766DEST_PATH_IMAGE004
wherein f isADenotes the focal length of the optical lens a; f. ofBDenotes the focal length of the optical lens B;
and placing an optical lens B behind the optical lens A, imaging the back focal plane of the objective lens at a back focal plane first imaging plane M1 behind the optical lens B, and placing the imaging device at a back focal plane first imaging plane M1 behind the optical lens B.
In the invention, the objective lens is composed of one lens or one reflecting mirror, or a combination of a plurality of lenses or a plurality of reflecting mirrors.
In the present invention, d1= fA(ii) a And/or, d2= fA+fB。
In the invention, a lens C1 and a lens C2 are sequentially added between an optical lens B and an imaging device, and light from a sample passes through an objective lens, then sequentially passes through the optical lens A, the optical lens B, the lens C1 and the lens C2 and finally is detected and received by the imaging device.
In the invention, the distance d3 between the lens C1 and the back focal plane first imaging plane M1 behind the optical lens B meets the following conditions:
Figure 910803DEST_PATH_IMAGE006
the distance d4 between the lens C2 and the lens C1 satisfies the following condition:
Figure 232063DEST_PATH_IMAGE008
wherein: f. ofC1Denotes the focal length, f, of lens C1C2Denotes the focal length of lens C2; accordingly, lens C1 and lens C2 image the back focal plane first secondary imaging plane M1 at the back focal plane second secondary imaging plane M2 behind lens C2, and the imaging device is disposed at the back focal plane second secondary imaging plane M2 behind C2.
In the present invention, d3= fC1(ii) a And/or, d4= fC1+fC2。
In the invention, the back focal plane of the objective lens is firstly imaged between an optical lens B and a lens C1 to form a first back focal plane M1 of the objective lens behind the optical lens B, the sample plane is firstly imaged between the optical lens A and the optical lens B to form a first sample plane S1, the sample plane is secondly imaged between a lens C1 and a lens C2 to form a second sample plane S2, and a light-shielding sheet or an optical element with different purposes is placed on the first back focal plane M1 behind the optical lens B, the first sample plane S1 or the second sample plane S2.
In the present invention, n pairs of the lens Cx and the lens Cy are placed in order between the optical lens C2 and the imaging apparatus, and the distance dx between the lens Cx and the back focal plane imaging plane M2 behind the lens C2 satisfies the following condition:
Figure 986393DEST_PATH_IMAGE010
the distance dxy between the lens Cy and the lens Cx satisfies the following condition:
Figure 254563DEST_PATH_IMAGE012
n is a natural number, fCxDenotes the focal length, f, of the lens CxCyRepresents the focal length of the lens Cy; accordingly, the imaging device is disposed at the back focal plane imaging plane My behind the lens Cy.
The momentum space imaging system provided by the invention is applied to the aspect of measuring the optical properties of the micro-nano photonics material.
The invention has the beneficial effects that: the momentum space imaging system can be used for measuring and representing optical information of the micro-nano photonics material in the momentum space, such as band gap properties, energy band structures, dispersion relations and the like. The system can realize optical measurement of a sample in a microscopic region, and the minimum measurement range can reach 1 micron; a selective measure of momentum space may also be implemented. The momentum space imaging system can accurately select the measuring area of the sample and can be further used for selecting and detecting the momentum space information of the sample.
Drawings
FIG. 1 is a schematic diagram of an imaging system according to an embodiment of the invention; wherein, 1 is objective, 2 is optical lens A, 3 is optical lens B, 4 is imaging device, I is the sample, II is the back focal plane of objective, III is the first imaging plane of sample plane, IV is the first imaging plane of back focal plane, d1 is the distance of the back focal plane of lens A and objective, d2 is the distance of lens B and lens A.
FIG. 2 shows the isofrequency chart information of the micro-nano photonic material measured by the momentum space imaging system, wherein (a) shows 670nm, (b) shows 690nm, and (c) shows 710 nm.
Fig. 3 is a schematic structural diagram of an imaging system according to an embodiment of the present invention, where 1 is an objective lens, 2 is an optical lens a, 3 is an optical lens B, 5 is a lens C1, 6 is a lens C2, 4 is an imaging device, I is a sample, II is a back focal plane of the objective lens, III is a sample plane first imaging plane, IV is a back focal plane first imaging plane, V is a sample plane second imaging plane, VI is a back focal plane second imaging plane, d1 is a distance between the lens a and the back focal plane of the objective lens, d2 is a distance between the lens B and the lens a, d3 is a distance between the lens C1 and the back focal plane first imaging plane M1, and d4 is a distance between the lens C2 and the lens C1.
FIG. 4 shows the isofrequency chart information of the micro-nano photonic material measured by the momentum space imaging system, wherein (a) shows 570nm, (b) shows 590nm, and (c) shows 610 nm.
Detailed Description
The technical solution of the present invention is further illustrated by the following specific examples.
Example 1
Figure 43528DEST_PATH_IMAGE014
And a periodic dielectric structure is covered on the metal plane, so that the surface plasmon of the metal surface can be excited. The momentum space imaging system can measure the momentum space information of the sample under the irradiation of different monochromatic light. FIG. 2 shows the results of the momentum space information measured by the present invention at the irradiation light wavelengths of 670nm (a), 690nm (b), and 710nm (c), respectively.
Example 2
Figure DEST_PATH_IMAGE015
And a periodic dielectric structure is covered on the metal plane, so that the surface plasmon of the metal surface can be excited. The momentum space imaging system can measure the momentum space information of the sample under the irradiation of different monochromatic light. FIG. 4 shows the results of the momentum-space information measured by the present invention when the wavelength of the irradiated light is 570nm (a), 590nm (b), and 610nm (c), respectively, after the light-shielding film is placed on the image plane M1.
It should be apparent that the above description of the embodiments is only intended to facilitate the understanding of the system, method, and core concepts of the present invention. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.

Claims (6)

1. A momentum space imaging system, comprising at least: the objective lens, the optical lens A, the optical lens B and the imaging device are arranged along the same straight line optical axis, a lens C1 and a lens C2 are sequentially added between the optical lens B and the imaging device, light from a sample passes through the objective lens, then sequentially passes through the optical lens A, the optical lens B, the lens C1 and the lens C2, and finally is detected and received by the imaging device; the distance d1 between the optical lens a and the back focal plane M0 of the objective lens satisfies the following condition:
0≤d1≤2fA
the distance d2 between the optical lens B and the optical lens A satisfies the following condition:
fA＜d2≤2fB+fA
wherein f isADenotes the focal length of the optical lens a; f. ofBDenotes the focal length of the optical lens B; placing an optical lens B behind the optical lens A, and imaging the back focal plane of the objective lens on a back focal plane first imaging plane M1 behind the optical lens B;
the distance d3 between the lens C1 and the back focal plane primary imaging plane M1 behind the optical lens B satisfies the following condition:
0≤d3≤2fC1
the distance d4 between the lens C2 and the lens C1 satisfies the following condition:
fC1＜d4≤2fC2+fC1
wherein: f. ofC1Denotes the focal length, f, of lens C1C2Representing the focal length of lens C2, lens C1 and lens C2 image the back focal plane first secondary imaging plane M1 at the back focal plane second secondary imaging plane M2 behind lens C2, and the imaging device is set at the back focal plane second secondary imaging plane M2 behind C2.
2. The momentum space imaging system according to claim 1, wherein the objective lens is composed of one lens or one mirror, or a combination of a plurality of lenses or a plurality of mirrors.
3. The momentum space imaging system of claim 2, wherein d1= fA(ii) a And/or, d2= fA+fB。
4. The momentum space imaging system of claim 1, wherein d3= fC1(ii) a And/or, d4= fC1+fC2。
5. The momentum space imaging system of claim 1, wherein the back focal plane of the objective lens is imaged for the first time between optical lens B and lens C1, forming an objective lens back focal plane first imaging plane M1 behind optical lens B; the sample plane is firstly imaged between the optical lens A and the optical lens B to form a sample plane primary imaging plane S1, secondly imaged between the lens C1 and the lens C2 to form a sample plane secondary imaging plane S2, and a light shielding sheet is placed on a back focal plane primary imaging plane M1 behind the optical lens B or a sample plane primary imaging plane S1 behind the optical lens B or a sample plane secondary imaging plane S2.
6. The momentum space imaging system according to claim 1, wherein n pairs of lens Cx and lens Cy are placed in sequence between the optical lens C2 and the imaging device, and the distance dx between the lens Cx and the back focal plane imaging plane M2 behind the lens C2 satisfies the following condition:
0≤dX≤2fCx
distance d between lens Cy and lens CxxyThe following conditions are satisfied:
fCx＜dxy≤2fCy+fCx
n is a natural number, fCxDenotes the focal length, f, of the lens CxCyRepresents the focal length of the lens Cy; accordingly, the imaging device is disposed at the back focal plane imaging plane My behind the lens Cy.
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CN1201154A (en) * 1997-05-29 1998-12-09 中国科学院上海光学精密机械研究所 Super-fine structural optical measuring system
CN104020085A (en) * 2014-06-17 2014-09-03 大连理工大学 Optical detection and microimaging method of micro-nano particles not subjected to influence of background

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CN1201154A (en) * 1997-05-29 1998-12-09 中国科学院上海光学精密机械研究所 Super-fine structural optical measuring system
CN104020085A (en) * 2014-06-17 2014-09-03 大连理工大学 Optical detection and microimaging method of micro-nano particles not subjected to influence of background

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