CN108413870A - The method for measuring planar dimension based on substitution method - Google Patents

The method for measuring planar dimension based on substitution method Download PDF

Info

Publication number
CN108413870A
CN108413870A CN201810125404.1A CN201810125404A CN108413870A CN 108413870 A CN108413870 A CN 108413870A CN 201810125404 A CN201810125404 A CN 201810125404A CN 108413870 A CN108413870 A CN 108413870A
Authority
CN
China
Prior art keywords
measured
measurement point
measurement
product
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810125404.1A
Other languages
Chinese (zh)
Other versions
CN108413870B (en
Inventor
徐祯鞠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Giezhy Measurement Technology Co ltd
Original Assignee
Dongguan City Bentley Fine Automation Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongguan City Bentley Fine Automation Technology Co Ltd filed Critical Dongguan City Bentley Fine Automation Technology Co Ltd
Priority to CN201810125404.1A priority Critical patent/CN108413870B/en
Publication of CN108413870A publication Critical patent/CN108413870A/en
Application granted granted Critical
Publication of CN108413870B publication Critical patent/CN108413870B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention relates to the methods for measuring planar dimension based on substitution method, on the basis of Theoretical Design distance X0 of this method between the first measurement point A of known product to be measured and the second measurement point B, product to be measured is placed in the coordinate system of measuring system, coordinate system divides the unit measurement zone that several continuous unit values are D, the relative coordinate values of measurement A, B to the unit measurement zone boundary at place;According to formula L=△ X1 △ X2+X;It is that Theoretical Design distance X0 and X0 ± D substitute into calculating by X, obtain three measured values, then three measured values and Theoretical Design distance X0 are compared, the measured value closest to Theoretical Design distance X0 is calculated as the actual range between the first measurement point A of product to be measured and the second measurement point B.The present invention can be used High-precision image and seize the measurement point that device captures product to be measured, using substitution ratio pair is substituted into, after computer carries out conversion processing, obtain the higher product plane size to be measured of precision, measurement is convenient, fast, meets industry utilization.

Description

The method for measuring planar dimension based on substitution method
Technical field
The present invention relates to photoelectric detection technology fields, more particularly, to product plane measurement world.
Background technology
After product processing and fabricating, it is that tool ruler measures, but imitates to need the planar dimension for measuring its correlated characteristic, conventional method Rate is low, and accuracy is not high.Then there are such as CCD detecting instruments, computer is transferred to after the image by seizing measured object Upper analyzing processing and conversion, thus to obtain more accurate testing result, high-precision, efficient detection meet modern manufacturing industry Production requirement.But in the prior art, since image seizes device(CCD)It is structural, captured image surface is bigger, then differentiates Rate is lower, therefore when measuring the product of larger area, if once having captured the image of product, the point accuracy pole that measures Big to decline, if capturing the image of product by several times, device moving reference error can be seized by image to be influenced, and equally causes to measure Point accuracy decline.
Invention content
It is an object of the invention to overcome the deficiencies of existing technologies, provide a kind of convenient, fast, detection is accurately based on generation Enter the method that method measures planar dimension.
In order to achieve the above objectives, the present invention adopts the following technical scheme that:
Based on the method that substitution method measures planar dimension, this method is measured in the first measurement point A of known product to be measured and second On the basis of Theoretical Design distance X0 between point B, product to be measured is placed in the coordinate system of measuring system, if coordinate system divides Continuous unit measurement zone is done, the unit value of unit measurement zone is D, and
The unit measurement zone image where device captures the first measurement point A and the first measurement point A of product to be measured is seized using image, The first measured value △ X1 are handled and are calculated by computer, which is lists of the first measurement point A to place The relative coordinate values on position measurement zone boundary;
The unit measurement zone image where device captures the second measurement point B and the second measurement point B of product to be measured is seized using image, The second measured value △ X2 are handled and are calculated by computer, which is lists of the second measurement point B to place The relative coordinate values on position measurement zone boundary;
The measurement direction of first measured value △ X1 and the second measured value △ X2 are consistent and in the first measurement point A and the second measurement point B Between measure line;
Actual range between the first measurement point A and the second measurement point B of product to be measured is:
L=△X1-△X2+X;
It is that Theoretical Design distance X0 and X0 ± D substitute into calculating by X, obtains three measured values, then by three measured values and theory Designed distance X0 is compared, and the surveys of the first measurement point A and second of product to be measured are calculated as closest to the measured value of Theoretical Design distance X0 Measure the actual range between point B.
In said program, the unit measurement zone is grid, dot matrix, bar code composition, the unit value D of unit measurement zone More than dimensional tolerance between the first measurement point A and the second measurement point B.
It is provided by the invention based on substitution method measure planar dimension method, can be used High-precision image seize device crawl wait for The measurement point for surveying product, promotes the point accuracy of measurement, using substitution ratio pair is substituted into, is not seized device moving reference by image and missed Difference influences, and after computer carries out conversion processing, obtains the higher product plane size to be measured of precision, measures convenient, fast, symbol Conjunction industry utilizes.
Description of the drawings:
Attached drawing 1 is present pre-ferred embodiments structural schematic diagram.
Specific implementation mode:
Design below with reference to attached drawing to the present invention, the technique effect that concrete structure generates is described further, with abundant Ground understands the purpose of invention, feature and effect.
As shown in fig.1, the present invention is in relation to a kind of method measuring planar dimension based on substitution method, it is characterised in that:It should On the basis of Theoretical Design distance X0 of the method between the first measurement point A of known product to be measured and the second measurement point B, it will wait for It surveys product to be placed in the coordinate system of measuring system, coordinate system divides several continuous unit measurement zones, the unit of unit measurement zone Value is D, and the unit measurement zone is grid, dot matrix, bar code composition, and the unit value D of unit measurement zone is more than first and measures Dimensional tolerance between point A and the second measurement point B.And seize the first measurement point A and that device captures product to be measured using image Unit measurement zone image where one measurement point A handles by computer and is calculated the first measured value △ X1, first measurement Value △ X1 are relative coordinate values of the first measurement point A to the unit measurement zone boundary at place;It is to be measured that device crawl is seized using image The the second measurement point B and the unit measurement zone image where the second measurement point B of product, are handled by computer and are calculated second Measured value △ X2, the second measured value △ X2 are relative coordinate values of the second measurement point B to the unit measurement zone boundary at place.Its In, the measurement direction of the first measured value △ X1 and the second measured value △ X2 it is consistent and the first measurement point A and the second measurement point B it Between measure line, when such as measuring the size of X axis, measure the unit measurement zone boundary of the first measurement point A and its left side, measurement the Two measurement point B are also the unit measurement zone boundary with its left side.
Actual range between the first measurement point A and the second measurement point B of product to be measured is:
L=△X1-△X2+X;
It is that Theoretical Design distance X0 and X0 ± D substitute into calculating by X, obtains three measured values, then by three measured values and theory Designed distance X0 is compared, and the surveys of the first measurement point A and second of product to be measured are calculated as closest to the measured value of Theoretical Design distance X0 Measure the actual range between point B.
Embodiment:
Assuming that Theoretical Design distance X0 is 300mm, the unit value D of unit measurement zone is 5mm, and it is CCD that image, which seizes device, and image is seized Device gripping surface is taken to be more than unit measurement zone, image seizes the first measurement point A and the second measurement point B that device captures product to be measured respectively And the unit measurement zone image at corresponding place, after sending computer to, is handled by computer and measured value △ X1, △ is calculated Then X2 utilizes formula:L=△ X1- △ X2+X, X are that 300mm, 295mm, 305mm substitute into conversion respectively, obtain three measured values Then L1, L2, L3 are compared by three measured values and Theoretical Design distance X0, closest to the measured value of Theoretical Design distance X0 The actual range being calculated as between the first measurement point A of product to be measured and the second measurement point B.
The present invention can be used High-precision image and seize the measurement point that device captures product to be measured, and the point for promoting measurement is accurate Property, using substitution ratio pair is substituted into, not seized device moving reference error by image is influenced, and after computer carries out conversion processing, is obtained The higher product plane size to be measured of precision is obtained, measurement is convenient, fast, meets industry utilization.
Certainly, the present invention is elaborated above in association with embodiment, only technical concept to illustrate the invention and Feature can not limit this its object is to allow person skilled in the art to understand present disclosure and be implemented with this The protection domain of invention, therefore all equivalent change or modifications done according to spirit of the invention should all be covered the present invention's In protection domain.

Claims (2)

1. the method for measuring planar dimension based on substitution method, it is characterised in that:This method is measured the first of known product to be measured On the basis of Theoretical Design distance X0 between point A and the second measurement point B, product to be measured is placed in the coordinate system of measuring system In, coordinate system divides several continuous unit measurement zones, and the unit value of unit measurement zone is D, and
The unit measurement zone image where device captures the first measurement point A and the first measurement point A of product to be measured is seized using image, The first measured value △ X1 are handled and are calculated by computer, which is lists of the first measurement point A to place The relative coordinate values on position measurement zone boundary;
The unit measurement zone image where device captures the second measurement point B and the second measurement point B of product to be measured is seized using image, The second measured value △ X2 are handled and are calculated by computer, which is lists of the second measurement point B to place The relative coordinate values on position measurement zone boundary;
The measurement direction of first measured value △ X1 and the second measured value △ X2 are consistent and in the first measurement point A and the second measurement point B Between measure line;
Actual range between the first measurement point A and the second measurement point B of product to be measured is:
L=△X1-△X2+X;
It is that Theoretical Design distance X0 and X0 ± D substitute into calculating by X, obtains three measured values, then by three measured values and theory Designed distance X0 is compared, and the surveys of the first measurement point A and second of product to be measured are calculated as closest to the measured value of Theoretical Design distance X0 Measure the actual range between point B.
2. the method according to claim 1 for measuring planar dimension based on substitution method, it is characterised in that:The unit measures Area is that grid, dot matrix, bar code are constituted, the unit value D of unit measurement zone be more than the first measurement point A and the second measurement point B it Between dimensional tolerance.
CN201810125404.1A 2018-02-08 2018-02-08 Method for measuring plane size based on substitution method Active CN108413870B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810125404.1A CN108413870B (en) 2018-02-08 2018-02-08 Method for measuring plane size based on substitution method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810125404.1A CN108413870B (en) 2018-02-08 2018-02-08 Method for measuring plane size based on substitution method

Publications (2)

Publication Number Publication Date
CN108413870A true CN108413870A (en) 2018-08-17
CN108413870B CN108413870B (en) 2020-04-28

Family

ID=63128048

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810125404.1A Active CN108413870B (en) 2018-02-08 2018-02-08 Method for measuring plane size based on substitution method

Country Status (1)

Country Link
CN (1) CN108413870B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112254655A (en) * 2020-11-11 2021-01-22 北京平恒智能科技有限公司 Super large-size high accuracy two-dimensional plane measuring equipment
CN115143883A (en) * 2022-06-30 2022-10-04 北京市测绘设计研究院 Measuring method and measuring system

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2570732Y (en) * 2002-10-11 2003-09-03 徐春云 Precision measuring instrument
CN201152739Y (en) * 2007-12-29 2008-11-19 徐春云 Measuring instrument
CN102607446A (en) * 2011-10-21 2012-07-25 中建工业设备安装有限公司 Method for measuring steel structure welding deformation based on gridding
CN104236501A (en) * 2014-09-22 2014-12-24 上海市计量测试技术研究院 Self-calibration method for grid point system error of two-dimensional grid plate
CN105387826A (en) * 2014-07-07 2016-03-09 通用汽车环球科技运作有限责任公司 method and apparatus for quantifying dimensional variations and process capability
EP3252615A1 (en) * 2016-06-03 2017-12-06 Commissariat à l'Energie Atomique et aux Energies Alternatives Method and system for determining cells crossed by a measuring or viewing axis

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2570732Y (en) * 2002-10-11 2003-09-03 徐春云 Precision measuring instrument
CN201152739Y (en) * 2007-12-29 2008-11-19 徐春云 Measuring instrument
CN102607446A (en) * 2011-10-21 2012-07-25 中建工业设备安装有限公司 Method for measuring steel structure welding deformation based on gridding
CN105387826A (en) * 2014-07-07 2016-03-09 通用汽车环球科技运作有限责任公司 method and apparatus for quantifying dimensional variations and process capability
CN104236501A (en) * 2014-09-22 2014-12-24 上海市计量测试技术研究院 Self-calibration method for grid point system error of two-dimensional grid plate
EP3252615A1 (en) * 2016-06-03 2017-12-06 Commissariat à l'Energie Atomique et aux Energies Alternatives Method and system for determining cells crossed by a measuring or viewing axis

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112254655A (en) * 2020-11-11 2021-01-22 北京平恒智能科技有限公司 Super large-size high accuracy two-dimensional plane measuring equipment
CN115143883A (en) * 2022-06-30 2022-10-04 北京市测绘设计研究院 Measuring method and measuring system

Also Published As

Publication number Publication date
CN108413870B (en) 2020-04-28

Similar Documents

Publication Publication Date Title
WO2015188515A1 (en) Macro-micro composite grating scale measurement system based on vertical and horizontal conversion amplification
US8019147B2 (en) Three-dimensional data registration method for vision measurement in flow style based on double-sided target
CN103292701A (en) Machine-vision-based online dimensional measurement method of precise instrument
CN103644860A (en) Large-scale spatial free curved surface measurement method
CN108413870A (en) The method for measuring planar dimension based on substitution method
CN107990856B (en) Spatial position error detection method for over-range workpiece
CN103759672A (en) Vision measurement method for ice cream stick plane contour dimensions
CN102997854A (en) Laser detection guiding device
CN110332886A (en) A kind of precision visual method for rapidly positioning
CN108225212B (en) Method for detecting profile tolerance of curved glass
CN105627935A (en) Product material thickness three-dimensional analysis system and method
CN206803992U (en) A kind of mechanism of quick measurement wood craft machines flatness
CN103600353A (en) Material edge detecting method of tooling
CN107764296A (en) Absolute position code and its reading device
CN103940379A (en) Method for measuring flatness of glass based on distorting mirror principle
CN203869670U (en) Edge curved angle contour detection apparatus of flat glass
CN116858139B (en) Metal structure flatness measuring method based on binocular vision
CN105486244B (en) The Two-dimensional strain measuring system measured based on superhigh precision digital picture
CN206235284U (en) A kind of dedicated slot model
CN203869666U (en) Macro-micro composite raster ruler measuring system based on vertical and horizontal conversion, amplification and subdivision
CN105115420A (en) Large-picture detection method
CN103983181A (en) Device and method for rapidly detecting optical grating auxiliary gap at high precision
CN106556610A (en) A kind of silicon chip stria detection method and detection means
CN107381050B (en) Glass crawl position corrects system and method
CN115615992A (en) Method for measuring size and detecting defects of refractory bricks

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20230612

Address after: 302, No. 28-1, Shanzhuang Road, Hecun, Dashi Street, Panyu District, Guangzhou, Guangdong 510000

Patentee after: GUANGZHOU GIEZHY MEASUREMENT TECHNOLOGY Co.,Ltd.

Address before: No. 318, Huangcaoling, Jinju Village, Dalingshan, Dongguan, Guangdong 523000

Patentee before: DONGGUAN INTELLIGENT AUTOMATION TECHNOLOGY CO.,LTD.

TR01 Transfer of patent right