CN108288447A - A kind of test method for SPI interface - Google Patents
A kind of test method for SPI interface Download PDFInfo
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- CN108288447A CN108288447A CN201711454275.2A CN201711454275A CN108288447A CN 108288447 A CN108288447 A CN 108288447A CN 201711454275 A CN201711454275 A CN 201711454275A CN 108288447 A CN108288447 A CN 108288447A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The present invention provides a kind of test methods for SPI interface, pass through the step of increasing test TE signals, hardware ID value in test method, it can prevent the product missing inspection of TE abnormal signals, reduce the omission factor of defective products, reduce the customer complaint rate of client, the problem of dry joint of hardware resistance, resistance are misused can be detected to the detection of hardware ID value, simultaneously when the manufacturer of multiple display modules uses with a control chip, client can also easily distinguish from out the product that the manufacturer of each display module is produced, convenient for looking into the source of defective products.
Description
Technical field
The present invention relates to backlight module detection technique field more particularly to a kind of test methods for SPI interface.
Background technology
Function machine is commonly called as old man's machine, is different from current smart mobile phone, with the development of science and technology, property of the user to function machine
Can be also higher and higher with quality requirements, in order to improve the performance of function machine, SPI of the existing function machine on original FPC plates
The function of TE signals synchronization and ID signal identifications is increased in interface (synchronous serial Peripheral Interface) newly, TE signals are for realizing data
It is synchronous, the ID signals information in display module corresponding to control chip or resistance value for identification, wherein the ID of control chip
Information is known as software I D values, and software I D values represent manufacturer's identity of control chip, and resistance value represents the hardware of display module
Id information, the hardware id information represent manufacturer's identity of display module.As shown in Figure 1, a kind of detection of existing function machine
Method is the first step, and measurement jig is connected with product, that is, display module to be detected；Second step is obtained and is controlled in product to be detected
ID values corresponding to coremaking piece；Third walks, and judges to control the ID values corresponding to chip and the relationship between preset ID values, if ID
Value is not equal to preset ID values, then enters the 4th step；If ID values are equal to preset ID values, enter the 5th step；4th step, it is to be checked
It is unqualified to survey product, replaces next product to be detected, returns to the first step；5th step, to the liquid crystal display of product to be detected
Menu display function be detected, be detected successively using multiple detection pictures, if the display of any detection picture is abnormal,
Into the 6th step；If whole detection pictures is shown normally, enter the 7th step；6th step, product to be detected is unqualified, more
Next product to be detected is changed, the first step is returned；7th step, product to be detected is qualified, and detection process terminates, and replaces next wait for
Product is detected, the first step is returned.In above-mentioned detection method, the ID values of control chip are only only had detected, when multiple display moulds
When producer's use of group is with a control chip, above-mentioned detection method can not distinguish different display module manufacturers,
Cause client that can not look into corresponding display module manufacturer according to product, while above-mentioned testing process does not carry out TE signals
Detection is easy the substandard product of TE abnormal signals being sold to client, and TE abnormal signals will cause function machine normal
It uses, therefore existing detection method has that detection signal is not comprehensive, substandard product omission factor is high.
Invention content
The present invention provides a kind of test method for SPI interface, the test signal for including in the test method is more complete
The omission factor in face, substandard product is relatively low.
The technical solution adopted in the present invention is that a kind of test method for SPI interface includes the following steps：
S1, measurement jig and product to be detected are electrically connected, connect the power supply of measurement jig, the measurement jig packet
The function of detection ID signals and TE signals is included, and is preset with hardware ID standard value, software I D standard values, TE frequency standard values；Institute
The product to be detected stated includes backlight, liquid crystal display and FPC plates, and the FPC plates are connected with the liquid crystal display,
The FPC plates are equipped with resistance, control chip, TE pins and ID pins；
S2, measurement jig obtain resistance value by detecting ID pins, and the resistance value corresponds to the hardware of liquid crystal display
ID values；
Relationship between hardware ID value described in S3, judgement and hardware ID standard value；If the hardware ID value is not belonging to
The range of the hardware ID standard value then enters S4；If the hardware ID value belongs to the model of the hardware ID standard value
It encloses, then enters S5；
S4, backlight flicker indicate that the hardware ID value of liquid crystal display is abnormal, and product to be detected is unqualified, detection process
Terminate, replace next product to be detected, returns to S1；
S5, backlight normally show that measurement jig obtains TE frequency values by detecting TE pins；
Relationship between TE frequency values described in S6, judgement and TE frequency standard values；If the TE frequency values are not belonging to
The range of the TE frequency standard values then enters S7；If the TE frequency values belong to the model of the TE frequency standard values
It encloses, then enters S8；
S7, backlight flicker indicate that the TE frequency values of product to be detected are abnormal, and product to be detected is unqualified, detection process
Terminate, replace next product to be detected, returns to S1；
S8, backlight normally show that measurement jig obtains the software I D values controlled corresponding to chip by detecting ID pins；
The relationship between software I D values and the software I D standard values described in S9, judgement, if the software I D values
Equal to the software I D standard values, then enter S10；If the software I D values are not equal to the software I D standard values,
Into S11；
S10, measurement jig show that software I D values are abnormal, and product to be detected is unqualified, and detection process terminates, and replace next
Product to be detected returns to S1；
S11, the menu display function of liquid crystal display is detected, uses test pictures, black picture, white respectively successively
Picture, red picture, green picture and blue picture are tested；
S12, judge that each picture displays whether normally, if the display of any picture is abnormal, enter S13；If comprehensive picture
Display is normal, then enters S14；
S13, the menu display function of liquid crystal display are abnormal, and product to be detected is unqualified, replaces next production to be detected
Product return to S1；
S14, product to be detected are qualified, and detection process terminates, and replace next product to be detected, return to S1.
After the above technical solution is adopted, compared with the prior art, the present invention has the following advantages：
The present invention tests TE signals by increase, prevents the product missing inspection of TE abnormal signals, reduces the omission factor of defective products,
The customer complaint rate of client is reduced, wherein increasing the test to hardware ID value, which can be used for identifying the life of display module
Business men identity it has also been discovered that resistance dry joint, the problems such as mismatching, intercepts defective products when testing hardware ID, while
When the manufacturer of multiple display modules is used with a control chip, client can also easily distinguish from out each display module
The product that manufacturer is produced, convenient for looking into the source of defective products.
As an improvement, ranging from 0V~1.8V of the hardware ID standard value, resistance value in the range to be detected
Product is produced by the manufacturer of same display module.
As an improvement, ranging from 55HZ~75HZ of the TE frequency standard values, the TE frequency values of different product exist
Difference, the data in the section are as one group of reference value.
Description of the drawings
Fig. 1 is existing detection method flow chart
Fig. 2 is the test method flow chart in the present invention
Specific implementation mode
As shown in Fig. 2, a kind of test method for SPI interface, includes the following steps：
S1, measurement jig and product to be detected are electrically connected, the model GX06B measurement jigs of measurement jig；It connects
The power supply of measurement jig, the SPI interface of the measurement jig include detecting the function of ID signals and TE signals, and control in the test
Hardware ID standard value is preset in tool, in the range of 0V~1.8V；Software I D standard values, for example, use control chip model
It is ST7789S, corresponding software I D values are then 007C 89F0；TE frequency standard values, in the range of 55HZ~75HZ；It is to be checked
It includes backlight, liquid crystal display and FPC plates to survey product, and FPC plates are connected with liquid crystal display, and FPC plates are equipped with resistance, control
Chip, TE pins and ID pins, wherein FPC plates use the communication mode of SPI interface；The size of product to be detected is 1.77 English
Very little, 1.44 inches, the small sizes function machines such as 2.4 inches；
S2, measurement jig obtain resistance value by detecting ID pins, and resistance value corresponds to the hardware ID value of liquid crystal display；
S3, judge relationship between hardware ID value and hardware ID standard value；If hardware ID value is not belonging to hardware ID standard value
Range, i.e., hardware ID value be more than 1.8V when, then enter S4；If hardware ID value belongs to the range of hardware ID standard value, i.e. hardware
ID values ∈ [0,1.8] V then enters S5；
S4, backlight flicker indicate that the hardware ID value of liquid crystal display is abnormal, resistance exist mismatch either damaged or
The problem of missing solder, product to be detected is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S5, backlight normally show that measurement jig obtains TE frequency values by detecting TE pins；
S6, judge relationship between TE frequency values and TE frequency standard values；If TE frequency values are not belonging to TE frequency standard values
Range, i.e. TE frequency values not in 55HZ~75HZ interval ranges, then enter S7；If TE frequency values belong to TE frequency standard values
Range, i.e. TE frequency values ∈ [55,75] HZ, then enter S8；
S7, the flicker of visual detection backlight indicate that the TE frequency values of product to be detected are abnormal, and TE circuits have open circuit or short
The problem of road, product to be detected is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S8, visual detection backlight normally show that measurement jig is obtained by detecting ID pins corresponding to control chip
Software I D values；
S9, judge relationship between software I D values and software I D standard values, measurement jig to software I D values and software I D into
Row matching enters S10 if software I D values are equal to software I D standard values, that is, 007C 89F0；If software I D values are not equal to software I D
Standard value then enters S11；
S10, measurement jig show that software I D values are abnormal, indicate that control chip there are problems that mismatching or damage, wait for
Detection product is unqualified, and detection process terminates, and replaces next product to be detected, returns to S1；
S11, the menu display function of liquid crystal display is detected, uses test pictures, black picture, white respectively successively
Picture, red picture, green picture and blue picture are tested；
S12, judge that each picture displays whether normally, if the display of any picture is abnormal, picture includes blank screen, flower extremely
The defects of screen, bright line, broken string, then enter S13；If comprehensive picture is shown normally, enter S14；
S13, the menu display function of liquid crystal display are abnormal, and product to be detected is unqualified, replaces next production to be detected
Product return to S1；
S14, product various functions to be detected are normal, and product to be detected is qualified, and detection process terminates, and replace next wait for
The product of detection returns to S1.
It is on the one hand whether normal by detecting TE frequency values in above-mentioned steps, the product of TE frequency anomalies can be prevented
Missing inspection reduces the omission factor of defective products, on the other hand by detecting hardware ID value, it is ensured that same display module manufacturer institute
The product of production will not be erroneously interpreted as other display module manufacturers and be produced, and be looked into corresponding to defective products convenient for client
Manufacturer, multiple display module manufacturers that avoid confusion influence the brand image of other manufacturers, furthermore generally in client, needle
Jig used in the product produced to multiple display module manufacturers is different, that is to say, that display module manufacturer and client
The jig at end is one-to-one, and after the underproof product missing inspection of hardware ID value, meeting when with the collocation of the jig of client
Cause display module display abnormal, increases the customer complaint rate of product, therefore be detected to hardware ID value in the present invention, also favorably
In reduction customer complaint rate.In conclusion the test method in the present invention, detection signal is comprehensive, defective products recall rate height, omission factor
It is low, customer complaint rate is low.
The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations.Although with reference to the foregoing embodiments
Invention is explained in detail, it will be understood by those of ordinary skill in the art that, it still can be to implementation above-mentioned
Example recorded in technical solution modify, or to wherein each section technical characteristic carry out equivalent replacement, and these modification or
Person replaces, the range for technical solution of the embodiment of the present invention that it does not separate the essence of the corresponding technical solution.
Claims (3)
1. a kind of test method for SPI interface, which is characterized in that include the following steps：
S1, measurement jig and product to be detected are electrically connected, connect the power supply of measurement jig, the measurement jig includes inspection
The function of ID signals and TE signals is surveyed, and is preset with hardware ID standard value, software I D standard values, TE frequency standard values；Described
Product to be detected includes backlight, liquid crystal display and FPC plates, and the FPC plates are connected with the liquid crystal display, described
FPC plates be equipped with resistance, control chip, TE pins and ID pins；
S2, measurement jig obtain resistance value by detecting ID pins, and the resistance value corresponds to the hardware ID value of liquid crystal display；
Relationship between hardware ID value described in S3, judgement and hardware ID standard value；If the hardware ID value is not belonging to described
Hardware ID standard value range, then enter S4；If the hardware ID value belongs to the range of the hardware ID standard value,
Into S5；
S4, backlight flicker indicate that the hardware ID value of liquid crystal display is abnormal, and product to be detected is unqualified, and detection process terminates,
Next product to be detected is replaced, S1 is returned；
S5, backlight normally show that measurement jig obtains TE frequency values by detecting TE pins；
Relationship between TE frequency values described in S6, judgement and TE frequency standard values；If the TE frequency values are not belonging to described
TE frequency standard values range, then enter S7；If the TE frequency values belong to the range of the TE frequency standard values,
Into S8；
S7, backlight flicker indicate that the TE frequency values of product to be detected are abnormal, and product to be detected is unqualified, and detection process terminates,
Next product to be detected is replaced, S1 is returned；
S8, backlight normally show that measurement jig obtains the software I D values controlled corresponding to chip by detecting ID pins；
The relationship between software I D values and the software I D standard values described in S9, judgement, if the software I D values are equal to
The software I D standard values then enter S10；If the software I D values are not equal to the software I D standard values, enter
S11；
S10, measurement jig show that software I D values are abnormal, and product to be detected is unqualified, and detection process terminates, and replace next to be checked
Product is surveyed, S1 is returned；
S11, the menu display function of liquid crystal display is detected, uses test pictures, black picture, white picture respectively successively
Face, red picture, green picture and blue picture are tested；
S12, judge that each picture displays whether normally, if the display of any picture is abnormal, enter S13；If comprehensive picture is aobvious
Show normally, then enters S14；
S13, the menu display function of liquid crystal display are abnormal, and product to be detected is unqualified, replaces next product to be detected, returns
Return S1；
S14, product to be detected are qualified, and detection process terminates, and replace next product to be detected, return to S1.
2. a kind of test method for SPI interface according to claim 1, which is characterized in that the hardware ID mark
Ranging from 0V~1.8V of quasi- value.
3. a kind of test method for SPI interface according to claim 1, which is characterized in that the TE frequency marks
Ranging from 55HZ~75HZ of quasi- value.
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| CN201711454275.2A CN108288447A (en) | 2017-12-28 | 2017-12-28 | A kind of test method for SPI interface |
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| CN201711454275.2A CN108288447A (en) | 2017-12-28 | 2017-12-28 | A kind of test method for SPI interface |
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| CN202110801U (en) * | 2011-07-06 | 2012-01-11 | 广东欧珀移动通信有限公司 | Control circuit compatible with different LCDs (Liquid Crystal Display) |
| CN102591046A (en) * | 2012-03-08 | 2012-07-18 | 无锡博一光电科技有限公司 | Method for testing RGB (red, green and blue) interface of liquid crystal screen |
| CN102945652A (en) * | 2012-11-27 | 2013-02-27 | 广东欧珀移动通信有限公司 | Method and system for solving abnormal display of display screen |
| CN104635141A (en) * | 2015-01-30 | 2015-05-20 | 华为技术有限公司 | Integrated circuit detection method, device and system |
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2017
- 2017-12-28 CN CN201711454275.2A patent/CN108288447A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101702299A (en) * | 2009-10-29 | 2010-05-05 | 中兴通讯股份有限公司 | System and method for identifying LCD module |
| CN202110801U (en) * | 2011-07-06 | 2012-01-11 | 广东欧珀移动通信有限公司 | Control circuit compatible with different LCDs (Liquid Crystal Display) |
| CN102591046A (en) * | 2012-03-08 | 2012-07-18 | 无锡博一光电科技有限公司 | Method for testing RGB (red, green and blue) interface of liquid crystal screen |
| CN102945652A (en) * | 2012-11-27 | 2013-02-27 | 广东欧珀移动通信有限公司 | Method and system for solving abnormal display of display screen |
| CN104635141A (en) * | 2015-01-30 | 2015-05-20 | 华为技术有限公司 | Integrated circuit detection method, device and system |
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Application publication date: 20180717 |