CN108287301A - A kind of IGBT drivers test system and method - Google Patents
A kind of IGBT drivers test system and method Download PDFInfo
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- CN108287301A CN108287301A CN201810079330.2A CN201810079330A CN108287301A CN 108287301 A CN108287301 A CN 108287301A CN 201810079330 A CN201810079330 A CN 201810079330A CN 108287301 A CN108287301 A CN 108287301A
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a kind of IGBT drivers test systems and test method, the system to include：Host computer, FPGA control modules, input signal module and output signal module, the FPGA control modules are connected with the host computer, input signal module and output signal module respectively, and the host computer is connected by bus with FPGA control modules；The input signal module includes：Drive secondary side voltage detection module, secondary side short-circuit protection threshold detection module, fault detection module, synchronous detection module, dead zone detection module and gate leve voltage detection module；The output signal module includes：PWM output modules, failure enable module, out-put supply module.The test system and method has the characteristics that multi-functional, modularization, automation, is suitable for different types of IGBT drivers, has the scalability and reduce testing cost.
Description
Technical field
The present invention relates to power electronics field more particularly to a kind of test system and methods of IGBT drivers.
Background technology
Important component of the IGBT drivers as new energy field, in the widely applied power switch device in the field
The reliability of part IGBT and safety are extremely important.Therefore it before IGBT drivers are pushed into market, needs to carry out it in detail
Test, to ensure the function and performance of IGBT drivers.
Currently, IGBT drivers testing scheme both domestic and external, is designed corresponding mainly for certain a IGBT driver
IGBT driver test machines carry out batch testing.Since the model of IGBT drivers differs, test control program is single-minded, has
Limitation；And the type of IGBT drivers is various, and test machine is needed replacing during testing different IGBT drivers, increases
Testing time and testing cost are added.
Invention content
To solve the above problems, the present invention proposes the universal I GBT drivers of a kind of perfect in shape and function, high-performance, automation
Test system and method.
The test system of IGBT drivers provided by the invention includes：Host computer, FPGA control modules, input signal module
And output signal module, the FPGA control modules respectively with the host computer, input signal module and output signal mould
Block is connected, and the host computer is connected by bus with FPGA control modules；The input signal module includes：Driving time polygonal voltage
Detection module, secondary side short-circuit protection threshold detection module, fault detection module, synchronous detection module, dead zone detection module and door
Step voltage detection module；The output signal module includes：PWM output modules, failure enable module, out-put supply module.
The test method of IGBT drivers provided by the invention includes：S1. inquiry test model, judges according to test data
With the presence or absence of corresponding test model；If then entering step S3, if otherwise entering step S2；S2. opening up for IGBT module is set
It flutters structure, selection test item, carry out project configuration, setting certified products decision condition, generate the configuration file of newly-built test model；
S3. the configuration file of the corresponding test model of load, and update test model table；S4. product ID is scanned, to selected test
Item is tested automatically；S5. judge whether test result passes through, if the driver is then categorized into non-defective unit area, if otherwise will
The driver is categorized into faulty section.
Beneficial effects of the present invention：By whole system modularization, host computer, input signal are connected by FPGA control modules
Module and output signal module, can be by changing FPGA softwares for different IGBT drivers using the characteristic that port is abundant
Extend the test item of IGBT drivers.The test system and method has the characteristics that multi-functional, modularization, automation, is suitable for
Different types of IGBT drivers, have the scalability and reduce testing cost.
Description of the drawings
Fig. 1 is the system block diagram that IGBT drivers test system in the embodiment of the present invention.
Fig. 2 is IGBT driver testing method flow charts in the embodiment of the present invention.
Fig. 3 is the block diagram of out-put supply module in the embodiment of the present invention.
Fig. 4 is the block diagram of PWM output modules in the embodiment of the present invention.
Fig. 5 is the block diagram that failure enables module in the embodiment of the present invention.
Fig. 6 is the block diagram of fault detection module in the embodiment of the present invention.
Fig. 7 is the block diagram that secondary side voltage detection module is driven in the embodiment of the present invention.
Fig. 8 is the block diagram of secondary side short-circuit protection threshold detection module in the embodiment of the present invention.
Fig. 9 is the block diagram of synchronous detection module in the embodiment of the present invention.
Figure 10 is the block diagram of dead zone detection module in the embodiment of the present invention.
Figure 11 is the block diagram of gate leve voltage detection module in the embodiment of the present invention.
Figure 12 is the block diagram of voltage detection unit in the embodiment of the present invention.
Specific implementation mode
With reference to embodiment and compares attached drawing invention is further described in detail, it should be emphasised that,
Following the description is only exemplary, the range being not intended to be limiting of the invention and its application.
As shown in Figure 1, IGBT drivers provided by the invention test system, system includes：Host computer, FPGA control mould
Block, input signal module and output signal module；FPGA control modules respectively with the host computer, input signal module and
Output signal module is connected, and host computer is connected by bus with FPGA control modules, and bus is specifically as follows：485 buses.Output
Signaling module includes：PWM output modules, failure enable module and out-put supply module.Input signal module includes：Drive secondary side
Voltage detection module, secondary side short-circuit protection threshold detection module, fault detection module, synchronous detection module, dead zone detection module
With gate leve voltage detection module.Whole system, can be by changing FPGA software extensions using the abundant characteristic of modularization and port
The test item of IGBT drivers.
FPGA control modules are the main control module of system, realize communication with host computer, the output for setting PWM,
The output of square wave, measure voltage ＆ current data conversion and time detection are set, the channel choosing of one channel selecting chip of multiselect is provided
Select signal.
System is tested according to IGBT drivers as above, the test method of the system is as shown in Fig. 2, include the following steps：
S11：Host computer judge test model flag bit whether be lock-out state, if then entering step S18, if otherwise into
Enter step S12；
S12：All test items are executed according to maximum series in parallel and maximum level table structure；
S13：Inquiry test model table, determines whether that there are corresponding test models, if then entering according to test data
Step S16, if otherwise entering step S14；
S14：Judge whether newly-built IGBT drivers test model, if then entering step S15, if otherwise entering step
S11；
S15：It sets the topological structure of IGBT module, selection test item, carry out project configuration, setting certified products judgement item
Part；
S16：The configuration file of the corresponding test model of load, and update test model table；
S17：Whether locking test model operation is carried out, if then entering step S18, if otherwise entering step S11；
S18：Product ID is scanned, selected test item is tested automatically, the detailed data and result of test are protected
There are on local and network server.
S19：Judge whether test result passes through, if then entering step S20, if otherwise entering step S21；
S20：IGBT drivers are categorized into non-defective unit area；
S21：Judge whether test result does not pass through repeatedly, if then entering step S22, if otherwise entering step S18；
S22：IGBT drivers are categorized into faulty section.
Specifically, it designs a universal I GBT driver and tests system, only needed for the IGBT drivers of different model
One piece of test point adaptation board is used, the three level IGBT drivers in parallel no more than three can be measured.
As shown in figure 3, out-put supply module includes：Power supply, DC-DC power source conversion module, adjustable voltage module, multiselect one
Channel selecting chip, output voltage current detecting unit.DC-DC power source conversion module and adjustable voltage wired in parallel, power supply with
DC-DC power source conversion module is connected with adjustable voltage module, and operation principle is power supply to DC-DC power source conversion module and adjustable electric
Die block is powered, and providing system by one chip of multiselect controls required supply voltage；Another output voltage current detecting unit
The voltage and current of output is detected, and is exported to FPGA control modules.Wherein, the selection letter of one channel selecting chip of multiselect
It number is provided by the FPGA control modules.
As shown in figure 4, PWM output modules include：Level conversion unit, one channel selecting chip of multiselect, the FPGA controls
Molding block, level conversion unit, one channel selecting chip of multiselect are sequentially connected.Operation principle is that FPGA control modules send out system
Required PWM waveform improves the level voltage of PWM by level conversion, is realized by one channel selecting chip of multiselect and selectes channel
Output pwm signal.Wherein, the selection signal of one channel selecting chip of multiselect is provided by the FPGA control modules.
As shown in figure 5, the enabled module of failure includes：Level conversion unit, one channel selecting chip of multiselect, output optocoupler；
The FPGA control modules, level conversion unit, one channel selecting chip of multiselect, output optocoupler are sequentially connected；Operation principle is
FPGA control modules send out the square wave needed for system, and the level voltage of square wave is improved by level conversion, passes through one channel of multiselect
Chip realizes that selecting channel exports square-wave signal.Wherein, the selection signal of one channel selecting chip of multiselect is controlled by the FPGA
Module provides；It includes linear optical coupling to export optocoupler.
As shown in fig. 6, fault detection module includes：Fault-signal input port, the fault-signal input port and institute
State the connection of FPGA control modules.Operation principle sends out fault-signal when being IGBT driver malfunctions, defeated by test machine fault-signal
Inbound port passes to FPGA control modules.
As shown in fig. 7, driving secondary side voltage detection module includes：Input optocoupler and voltage detection unit, the input light
Coupling, voltage detection unit, FPGA control modules are sequentially connected；Operation principle be driving secondary side voltage signal by input optocoupler every
From FPGA control modules pass through voltage detection unit input voltage signal；It includes linear optical coupling to input optocoupler.
As shown in figure 8, secondary side short-circuit protection threshold detection module includes：Input optocoupler, one channel selecting chip of multiselect, electricity
Press detection unit；The input optocoupler, one channel selecting chip of multiselect, voltage detection unit, FPGA control modules are sequentially connected.
Operation principle is that secondary side short-circuit protection voltage signal passes through one channel selecting of multiselect by inputting light-coupled isolation, optocoupler output signal
Chip realizes that selecting channel is output to voltage detection unit, and FPGA control modules analyze input signal to obtain voltage value；
The selection signal of one channel selecting chip of the multiselect is provided by the FPGA control modules, and input optocoupler includes linear optical coupling.
As shown in figure 9, synchronous detection module includes：Input optocoupler, one channel selecting chip of multiselect；The input optocoupler,
One channel selecting chip of multiselect, FPGA control modules are sequentially connected.Operation principle be drive output signal by input optocoupler every
From input optocoupler output signal realizes that selecting channel is output to FPGA control modules, FPGA by one channel selecting chip of multiselect
Control module analyzes input signal to obtain synchronization time.The selection signal of one channel selecting chip of the multiselect is by described
FPGA control modules provide, and input optocoupler includes linear optical coupling.
As shown in Figure 10, dead zone detection module includes：Input optocoupler, one channel selecting chip of multiselect；The input optocoupler,
One channel selecting chip of multiselect, FPGA control modules are sequentially connected.Operation principle be drive output signal by input optocoupler every
From input optocoupler output signal realizes that selecting channel is output to FPGA control modules, FPGA by one channel selecting chip of multiselect
Control module analyzes input signal to obtain dead time.The selection signal of one channel selecting chip of the multiselect is by described
FPGA control modules provide, and input optocoupler includes linear optical coupling.
As shown in figure 11, gate leve voltage detection module includes：Input optocoupler, one channel selecting chip of multiselect, voltage detecting
Unit；The input optocoupler, one channel selecting chip of multiselect, voltage detection unit, FPGA control modules are sequentially connected.Work is former
Reason is that drive output signal realizes choosing by inputting light-coupled isolation, input optocoupler output signal by one channel selecting chip of multiselect
Routing is output to voltage detection unit, and FPGA control modules analyze input signal to obtain voltage value.The multiselect one
The selection signal of channel selecting chip is provided by the FPGA control modules, and input optocoupler includes linear optical coupling.
In each detection module in above input signal module, the voltage detection unit that is related to can be used common
Voltage detection unit, but in order to improve the accuracy of detection of voltage detection unit, using following circuit, as shown in figure 12, electricity
Pressure detection unit include：Comparison circuit, ratio circuit and modulus conversion chip；Its operation principle is that tested voltage signal passes through
Comparison circuit is compared with setting value obtains ratio circuit enable signal, judges that the voltage belongs to high voltage range or low electricity
Press range；The voltage signal simultaneously compares the voltage signal if ratio circuit enable signal is effective by ratio circuit
Example scaling, is converted into modulus conversion chip；If ratio circuit enable signal is invalid, which is directly entered mould
Number conversion chip is converted.In existing technology, for a kind of voltage signal, the modulus of the same sampling precision of generally use
Converter, but in the present system, the voltage class of same test voltage signal is different in different test models；First with one
Comparison circuit is classified to this voltage signal, and high the entering after ratio circuit carries out proportional zoom of voltage class turns into modulus
Parallel operation；And the low voltage signal of voltage class is directly entered analog-digital converter, can use a lower height of voltage range in this way
Precision analog-digital converter realizes the accurate measurement of different voltages grade.
In above-mentioned IGBT driver testing methods, configuration file and operational order are handed down to by host computer through 485 buses
FPGA control modules.
In step s 11, whether discriminating test mark position is lock-out state, to determine test machine to certain
The product of one fc-specific test FC model is tested.
In step s 12, all test items are executed successively according to three series in parallel and three level table structures.
Newly-built IGBT drive models are needed to enter step S15 in the deterministic process of step S13, S14, for
Newly-built IGBT drive models, can set the topological structure of IGBT module, specifically include IGBT module parallel series, IGBT moulds
Block level series, NTC (Negative Temperature Coefficient) detect series.The IGBT drivers that need to be tested,
Each there is unique sequence number.For the IGBT drivers of different model, different test item and certified products can be flexibly selected
Rule of judgment.Test item cover the most test item of IGBT drivers, including quiescent dissipation, on/off delay, open/
It turns off synchronization time, the short-circuit protection time, the fault locking time, dead time, under-voltage protection threshold value, under-voltage recovery threshold value, open
Be powered pressure, shutdown voltage, short-circuit protection threshold value, secondary side voltage measurement, NTC detections etc..Such as：In above-mentioned newly-built IGBT drivers
In model, it includes above-mentioned all totally 13 test events to set its test event, and is independently set to the progress of each test event
It is fixed, certified products decision condition is set, corresponding parameter configuration files are generated.
In step s 16, since the test item of each IGBT drive model is not quite similar, selected test need to be loaded
Number corresponding configuration file.
In step S17, is improved by testing efficiency, is needed in order to save the time for the different product of same test model
Test model is locked.The step of lock-out state can make next product skip detection test model i.e. step S12, S13,
S14、S15、S16、S17.Unlock test model can be detected judgement to test model.
In step S18, each IGBT driver has unique sequence number.Test system to selected test item into
The automatic test of row, test are completed, and test machine generates form document and records test data, are generated text file and are uploaded test result
To network server, in order to which data analysis and Product Status track.
In step S19, the test result that example generates corresponds to 13 test items, and only 13 test items are all qualified,
It just can determine that this IGBT test driver is certified products, enter step S20 and be categorized into non-defective unit class；If wherein at least one is surveyed
Examination item is unqualified and this IGBT driver did not carried out test before this, then enters step S21 and judged, judges that this IGBT drives
Device is repetition measurement product, need to enter step S18 and re-start detection；If driver repeatedly has unqualified situation, this IGBT is judged
Driver is defective work, enters step S22 and is categorized into failure classes.
In order to adapt to 13 test items of test machine independent test, realize that the versatility of test machine, system main circuit are configured with
10 above-mentioned standalone modules：Out-put supply module, FPGA control modules, PWM output modules, failure enable module, failure inspection
Survey module, driving secondary side voltage detection module, secondary side short-circuit protection threshold detection module, synchronous detection module, dead zone detection mould
Block, gate voltage detection module.Since the test voltage grade of different drive models is different, in order to realize voltage detecting
In high precision, the voltage detecting involved in above-mentioned module is all made of high-precision detection circuit as shown in figure 12.13 test items
Relevant configuration passes to FPGA control modules by host computer by communication bus.
It when carrying out quiescent dissipation measurement, is set according to configuration file, FPGA control modules control the output of out-put supply module
15V supply voltages, and the voltage and current signal passed back to out-put supply module is converted and is read.
It when carrying out on/off Time delay measurement, is set according to configuration file, FPGA control modules generate test and believed with PWM
Number, failure enable signal and channel selecting signal, given respectively to PWM output modules and failure and enable module shield failure, together
When, the difference that pwm signal and gate drive signals are detected by synchronous detection module obtains on/off delay time.
When carrying out on/off measurement synchronization time, set according to configuration file, FPGA control modules generate test and use
Pwm signal, failure enable signal and channel selecting signal give respectively to PWM output modules and failure and enable module shield event
Barrier, meanwhile, the difference that gate drive signals in parallel are detected by synchronous detection module obtains on/off synchronization time.
It when carrying out the measurement of short-circuit protection time, is set according to configuration file, FPGA control modules generate test and believed with PWM
Number, failure enable signal and channel selecting signal, give respectively and enable module to PWM output modules and failure and trigger failure, together
When, the time difference for opening the moment to the shutdown moment by synchronous detection module detection gate pole is the short-circuit protection time.
It when carrying out the measurement of fault locking time, is set according to configuration file, FPGA control modules generate test and believed with PWM
Number, failure enable signal and channel selecting signal, give respectively and enable module to PWM output modules and failure and trigger failure, together
When, the time difference that driver malfunction signal failing edge moment to rising edge time are detected by fault detection module is failure lock
It fixes time.
It when carrying out dead time measurement, is set according to configuration file, FPGA control modules generate test pwm signal, event
Hinder enable signal and channel selecting signal, is given respectively to PWM output modules and failure and enable module shield failure, meanwhile, lead to
Cross dead zone detection module detection driver dead time.
When carrying out under-voltage protection threshold measurement, set according to configuration file, FPGA control modules generation adjustable voltage signal,
Power channel selection signal and failure enable signal give respectively to out-put supply module, failure and enable module, while passing through event
Hinder detection module and detect driver malfunction signal, when driver malfunction signal triggers, measures the output valve of out-put supply module
As under-voltage protection threshold value.
When carrying out under-voltage recovery threshold measurement, set according to configuration file, FPGA control modules generation adjustable voltage signal,
Power channel selection signal and failure enable signal give respectively to out-put supply module, failure and enable module, meanwhile, detection
Driver malfunction signal, when driver malfunction blackout, the output valve for measuring adjustable voltage is under-voltage recovery threshold value.
It when carrying out turning-on voltage measurement, is set according to configuration file, FPGA control modules generate test pwm signal, event
Hinder enable signal and channel selecting signal, is given respectively to PWM output modules and failure and enable module shield failure, meanwhile, lead to
Step voltage detection module of moving into one's husband's household upon marriage detection gate leve voltage signal obtains corresponding IGBT turning-on voltages.
It when carrying out shutdown voltage measurement, is set according to configuration file, FPGA control modules generate test pwm signal, event
Hinder enable signal and channel selecting signal, is given respectively to PWM output modules and failure and enable module shield failure, meanwhile, lead to
Step voltage detection module of moving into one's husband's household upon marriage detection gate leve voltage signal obtains corresponding IGBT shutdowns voltage.
It when carrying out short-circuit protection threshold measurement, is set according to configuration file, FPGA control modules generate test and believed with PWM
Number, failure enable signal and channel selecting signal, give respectively and enable module to PWM output modules and failure and trigger failure, together
When, short-circuit protection threshold value is obtained by secondary side short-circuit protection threshold detection module.
It when carrying out driving secondary side voltage measurement, is set according to configuration file, FPGA control modules generate test and believed with PWM
Number, failure enable signal and channel selecting signal, give respectively and enable module to PWM output modules and failure and trigger failure, together
When, by driving secondary side voltage detection module to obtain driving time polygonal voltage.
It when carrying out NTC detections, is set according to configuration file, FPGA control modules generate test failure enable signal and lead to
Road selection signal gives respectively to failure and enables module, while detecting driving malfunction signal.If in the case of enabled failure,
It detects driving malfunction, and driving malfunction is not detected in the case where shielding failure and then thinks that NTC functions are normal, it is on the contrary then recognize
For NTC functional faults.
The above content is specific/preferred embodiment further description made for the present invention is combined, cannot recognize
The specific implementation of the fixed present invention is confined to these explanations.For those of ordinary skill in the art to which the present invention belongs,
Without departing from the inventive concept of the premise, some replacements or modification can also be made to the embodiment that these have been described,
And these are substituted or variant all shall be regarded as belonging to protection scope of the present invention.
Claims (10)
1. a kind of IGBT drivers test system, which is characterized in that including：Host computer, FPGA control modules, input signal module
And output signal module, the FPGA control modules respectively with the host computer, input signal module and output signal mould
Block is connected, and the host computer is connected by bus with FPGA control modules；The input signal module includes：Driving time polygonal voltage
Detection module, secondary side short-circuit protection threshold detection module, fault detection module, synchronous detection module, dead zone detection module and door
Step voltage detection module；The output signal module includes：PWM output modules, failure enable module, out-put supply module.
2. the system as claimed in claim 1, which is characterized in that the out-put supply module includes：Power supply, DC-DC power source turn
Change the mold block, adjustable voltage module, one channel selecting chip of multiselect, output voltage current detecting unit；The power supply with it is in parallel
DC-DC power source conversion module is connected with adjustable voltage module, and the power supply is to DC-DC power source conversion module and adjustable voltage module
Power supply provides system by one channel selecting chip of multiselect and controls required supply voltage；One channel selecting core of the multiselect
The selection signal of piece is provided by the FPGA control modules；
The PWM output modules include level conversion unit, one channel selecting chip of multiselect, the FPGA control modules, level
Converting unit, one channel selecting chip of multiselect are sequentially connected；The selection signal of one channel selecting chip of the multiselect is by described
FPGA control modules provide；
It includes level conversion unit, one channel selecting chip of multiselect, output optocoupler that the failure, which enables module,；The FPGA controls
Module, level conversion unit, one channel selecting chip of multiselect, output optocoupler are sequentially connected；One channel selecting chip of the multiselect
Selection signal provided by the FPGA control modules.
3. the system as claimed in claim 1, which is characterized in that the fault detection module includes fault-signal input port,
The fault-signal input port is connect with the FPGA control modules.
4. the system as claimed in claim 1, which is characterized in that the driving secondary side voltage detection module include input optocoupler and
Voltage detection unit, the input optocoupler, voltage detection unit, FPGA control modules are sequentially connected, and drive secondary side voltage signal
By inputting light-coupled isolation, FPGA control modules pass through voltage detection unit input voltage signal；
The secondary side short-circuit protection threshold detection module includes input optocoupler, one channel selecting chip of multiselect, voltage detection unit；
The input optocoupler, one channel selecting chip of multiselect, voltage detection unit, FPGA control modules are sequentially connected；The multiselect one
The selection signal of channel selecting chip is provided by the FPGA control modules.
5. the system as claimed in claim 1, which is characterized in that the synchronous detection module is logical including input optocoupler, multiselect one
Road selects chip；The input optocoupler, one channel selecting chip of multiselect, FPGA control modules are sequentially connected, and the multiselect one is logical
The selection signal of road selection chip is provided by the FPGA control modules.
6. the system as claimed in claim 1, which is characterized in that the dead zone detection module is logical including input optocoupler, multiselect one
Road selects chip；The input optocoupler, one channel selecting chip of multiselect, FPGA control modules are sequentially connected, and the multiselect one is logical
The selection signal of road selection chip is provided by the FPGA control modules.
7. the system as claimed in claim 1, which is characterized in that the gate leve voltage detection module includes input optocoupler, multiselect
One channel selecting chip, voltage detection unit；The input optocoupler, one channel selecting chip of multiselect, voltage detection unit, FPGA
Control module is sequentially connected, and the selection signal of one channel selecting chip of the multiselect is provided by the FPGA control modules.
8. the test method of the system as described in claim 1-7 is any, which is characterized in that include the following steps：
S1. inquiry test model, determines whether that there are corresponding test models according to test data；If then entering step S3,
If otherwise entering step S2；
S2. the topological structure of setting IGBT module, selection test item, progress project configuration, setting certified products decision condition, generate
The configuration file of newly-built test model；
S3. the configuration file of the corresponding test model of load, and update test model table；
S4. product ID is scanned, selected test item is tested automatically；
S5. judge whether test result passes through, if the driver is then categorized into non-defective unit area, if otherwise the driver is classified
To faulty section.
9. test method as claimed in claim 8, which is characterized in that the test item includes：Quiescent dissipation, on/off
It is delay, on/off synchronization time, the short-circuit protection time, the fault locking time, dead time, under-voltage protection threshold value, under-voltage extensive
It is one or more in multiple threshold value, turning-on voltage, shutdown voltage, short-circuit protection threshold value, secondary side voltage measurement, NTC detections.
10. test method as claimed in claim 8, which is characterized in that the topological structure includes：IGBT module parallel grade
Number, IGBT module level series, NTC detect series.
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| CN201810079330.2A CN108287301B (en) | 2018-01-26 | 2018-01-26 | IGBT driver testing system and method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110045270A (en) * | 2019-05-11 | 2019-07-23 | 宁波吉田智能洁具科技有限公司 | Integral type detects encapsulating line |
| CN110262302A (en) * | 2019-04-11 | 2019-09-20 | 汉腾汽车有限公司 | A kind of detection method of electric machine controller MCU |
| CN111308308A (en) * | 2020-03-23 | 2020-06-19 | 湖南银河电气有限公司 | High-power IGBT switching characteristic testing device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101413983A (en) * | 2008-12-04 | 2009-04-22 | 吉林大学 | IGBT bridge circuit and drive protective circuit detection device |
| JP2012039458A (en) * | 2010-08-09 | 2012-02-23 | Honda Motor Co Ltd | Device and method of driving semiconductor element |
| CN202522687U (en) * | 2012-03-22 | 2012-11-07 | 广州三晶电气有限公司 | Detection device of frequency converter power supply board |
| CN203561714U (en) * | 2013-09-20 | 2014-04-23 | 中国第一汽车股份有限公司 | A IGBT power module driving real-time monitoring apparatus |
| CN104237761A (en) * | 2013-06-13 | 2014-12-24 | 通用电气公司 | Failure mode detection and protection system and method of insulated gate bipolar transistor |
| CN106597245A (en) * | 2016-11-04 | 2017-04-26 | 山东科技大学 | IGBT fault monitoring device and method |
| CN107329071A (en) * | 2017-07-11 | 2017-11-07 | Tcl空调器(中山)有限公司 | A kind of performance test circuit, test device and the method for IGBT drivers |
| CN208000360U (en) * | 2018-01-26 | 2018-10-23 | 深圳青铜剑科技股份有限公司 | A kind of IGBT drivers test system |
-
2018
- 2018-01-26 CN CN201810079330.2A patent/CN108287301B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101413983A (en) * | 2008-12-04 | 2009-04-22 | 吉林大学 | IGBT bridge circuit and drive protective circuit detection device |
| JP2012039458A (en) * | 2010-08-09 | 2012-02-23 | Honda Motor Co Ltd | Device and method of driving semiconductor element |
| CN202522687U (en) * | 2012-03-22 | 2012-11-07 | 广州三晶电气有限公司 | Detection device of frequency converter power supply board |
| CN104237761A (en) * | 2013-06-13 | 2014-12-24 | 通用电气公司 | Failure mode detection and protection system and method of insulated gate bipolar transistor |
| CN203561714U (en) * | 2013-09-20 | 2014-04-23 | 中国第一汽车股份有限公司 | A IGBT power module driving real-time monitoring apparatus |
| CN106597245A (en) * | 2016-11-04 | 2017-04-26 | 山东科技大学 | IGBT fault monitoring device and method |
| CN107329071A (en) * | 2017-07-11 | 2017-11-07 | Tcl空调器(中山)有限公司 | A kind of performance test circuit, test device and the method for IGBT drivers |
| CN208000360U (en) * | 2018-01-26 | 2018-10-23 | 深圳青铜剑科技股份有限公司 | A kind of IGBT drivers test system |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110262302A (en) * | 2019-04-11 | 2019-09-20 | 汉腾汽车有限公司 | A kind of detection method of electric machine controller MCU |
| CN110045270A (en) * | 2019-05-11 | 2019-07-23 | 宁波吉田智能洁具科技有限公司 | Integral type detects encapsulating line |
| CN110045270B (en) * | 2019-05-11 | 2024-05-17 | 宁波吉田智能洁具科技有限公司 | Integrated detection glue filling line |
| CN111308308A (en) * | 2020-03-23 | 2020-06-19 | 湖南银河电气有限公司 | High-power IGBT switching characteristic testing device |
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