CN108240989A - Illumination imaging optimization device - Google Patents

Illumination imaging optimization device Download PDF

Info

Publication number
CN108240989A
CN108240989A CN201611229914.0A CN201611229914A CN108240989A CN 108240989 A CN108240989 A CN 108240989A CN 201611229914 A CN201611229914 A CN 201611229914A CN 108240989 A CN108240989 A CN 108240989A
Authority
CN
China
Prior art keywords
light source
light
sheen
component
polarised
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201611229914.0A
Other languages
Chinese (zh)
Inventor
王文涛
张春平
陈志列
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EVOC Intelligent Technology Co Ltd
Original Assignee
EVOC Intelligent Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EVOC Intelligent Technology Co Ltd filed Critical EVOC Intelligent Technology Co Ltd
Priority to CN201611229914.0A priority Critical patent/CN108240989A/en
Publication of CN108240989A publication Critical patent/CN108240989A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention provides a kind of illumination imaging optimization device,Including first light source,Second light source,Third light source,First sheen component,Second sheen component and the first polarised light filter out component and the second polarised light filters out component,First light source,Second light source and third light source emit light to imaging object respectively,Form three-dimensional combined light source,First sheen component,Second sheen component carries out sheen processing to the light that first light source and second light source are sent out,First polarised light filters out component and the second polarised light filters out component and filters out processing to light progress polarised light,Pass through the soft design of light,Effectively reduce the noise in detection image,Filtering out technology using polarised light weakens the luminous intensity of zero defect position,Reduce reflective bandwidth,Enhance picture contrast,The image quality of surface defect in imaging object is improved from hardware,Vision-based detection for reliable and stable surface defect provides foundation.

Description

Illumination imaging optimization device
Technical field
The present invention relates to Imaging processing techniques fields, and optimization device is imaged more particularly to illumination.
Background technology
Conventional needle detects surface defects of products, needs skilled worker to product visual detection.It is examined with magnetic tile surface defect For survey, conventionally employed artificial visual method is mainly based upon the eyes of people, due to some physiologically to be limited in some thin It is difficult that detected, while this method is highly prone to the influence of external environment and physical condition on micro- crackle, it will usually leak Inspection, detection efficiency are relatively very low.
In this regard, there is technical staff to have investigated using machine vision technique, carrying out image to magnetic tile surface defect feature adopts Collection handles pictorial information using image processing software, and the magnetic shoe surface image of acquisition is as shown in Figure 1 and Figure 2.By Fig. 1 with And Fig. 2 can clearly have found that the imaging technique imaging that this technology uses is uneven and not soft, defect is not apparent with background Separation, there are many interference, can lead to false drop rate height in this way.
As it can be seen that it can not cause in general machine vision technique accurately to product (imaging object) surface defect accurate imaging Machine recognition technology detects surface defects of products inaccurate.
Invention content
Based on this, it is necessary in general machine vision technique can not accurately to product (imaging object) surface defect standard Really imaging causes machine recognition technology to detect inaccurate problem to surface defects of products, provides a kind of illumination imaging optimization device The image quality to surface defect in imaging object is improved, ensures that machine recognition technology can accurately examine surface defects of products It surveys.
A kind of illumination imaging optimization device, including first light source, second light source, third light source, sends out light to first light source Line carries out that the first sheen component of sheen processing, emitting beam to second light source carries out the second sheen component, right of sheen processing Third light source emit beam carry out polarised light filter out processing the first polarised light filter out component and to inject external imaging device The second polarised light that light progress polarised light filters out processing filters out component;
First light source is opposite with second light source and is arranged at intervals at the both sides of imaging object, and third light source is towards imaging object Setting, and third light source plane residing for imaging object projection between first light source and second light source, the first sheen group Part is set to first light source, and the second sheen component is set to second light source, and the first polarised light filters out component and is set to third light source, Second polarised light filters out component and is set to external imaging device.
Present invention illumination imaging optimization device, including first light source, second light source, third light source, the first sheen component, the Two sheen components and the first polarised light filter out component and the second polarised light filters out component, and first light source is set respectively with second light source The both sides of imaging object are placed in, third light source is respectively arranged at towards imaging object, the first sheen component with the second sheen component First light source and second light source, the first polarised light filters out component and the second polarised light filter out component be respectively arranged at third light source with And external imaging device (such as camera), first light source, second light source and third light source emit light to imaging object respectively, Three-dimensional combined light source is formed, the first sheen component, the second sheen component carry out the light that first light source and second light source are sent out Sheen processing, the first polarised light filters out component and the second polarised light filters out component and filters out processing to light progress polarised light, passes through The soft design of light, effectively reduces the noise in detection image, and filtering out technology using polarised light makes the light intensity of zero defect position Degree weakens, and reduces reflective bandwidth, enhances picture contrast, and the imaging of surface defect in imaging object is improved from hardware Quality, the vision-based detection for reliable and stable surface defect provide foundation.
Description of the drawings
Fig. 1 and Fig. 2 are the magnetic shoe surface image schematic diagram acquired under different brightness in conventional machines vision technique;
Fig. 3 positions present invention illuminates the structure diagram of combined light source in imaging optimization device;
Fig. 4 is the magnetic shoe exterior view acquired under the conditions of combined light source polishing in present invention illumination imaging optimization device in experiment As schematic diagram;
Fig. 5 and Fig. 6 is present invention illumination imaging optimization device neutral body combined light source difference brightness polishing and soft in experiment The magnetic shoe surface image schematic diagram acquired under the conditions of light processing;
Fig. 7 is the polishing of present invention illumination imaging optimization device neutral body combined light source, sheen processing and polarised light in experiment Filter out the magnetic shoe surface image schematic diagram acquired under treatment conditions;
Fig. 8 is the structure diagram of the present invention illumination imaging optimization one of embodiment of device;
Fig. 9 is the structure diagram of the present invention illumination imaging optimization one of embodiment of device.
Specific embodiment
For the ease of explaining in detail the effect of the technical principle of present invention illumination imaging optimization device and realization, below will Using magnetic shoe as imaging object, in a manner that experiment promotes, elaborating present invention illumination imaging optimization device can improve into As the theoretical foundation of the image quality of surface defect in object and correlation test data.
In practical applications, the good image of a width image quality should condition specific as follows:1st, contrast is apparent, target with The sharpness of border of background;2nd, background is desalinated as possible, larger and uniform with signature grey scale value difference value, does not interfere image procossing;3、 Related with color also needs color true, and brightness is moderate, without overexposure.In this regard, herein, present invention illumination imaging optimization Device provides three-dimensional combined light source as shown in Figure 3.Below in conjunction with attached drawing 3, it is explained in more detail by first light source 100, second The specific relative position relation of three-dimensional combined light source that light source 200 and third light source 300 form.Using plane residing for imaging object as Datum plane (platform), first light source 100 and second light source 200 are respectively arranged at imaging object both sides, 100 institute of first light source Plane residing for locating plane and second light source 200 can be vertical with datum plane respectively, and imaging object is positioned over first light source 100 Between second light source 200, third light source 300 is set towards imaging object, and third light source 300 is in the projection of datum plane Between first light source 100 and second light source 200.Non-essential, the light that third light source 300 is sent out just is being penetrated in imaging object.More Further, three-dimensional combined light source can also include the 4th light source 800, and the 4th light source 800 and third light source 300 are mutually back to setting It puts, the 4th light source 800 emits beam to external imaging device.
The light source that first light source 100, second light source 200 and third light source 300 can be selected includes incandescent source, metal Halogen light source, fluorescent light source, LED (Light-Emitting Diode, light emitting diode) light source, infrared light supply, X-ray source Deng.Wherein incandescent source is eliminated and is not had to substantially, and infrared light supply and X-ray source application field are more single, metal halogen light Source is more for fields such as ambient lighting, display lightings.Most common light source is fluorescent light source and LED light in NI Vision Builder for Automated Inspection Source, their fundamental technology performance index are as shown in table 1.
The fundamental technology performance index of 1 machine in normal service visual illumination light source of table
Fluorescent lamp can make different form and dimensions, and fever is few, long lifespan.The diffused light that its fluorescent tube generates, favorably In hardware of the measurement with albedo.Traditional cold-cathode fluorescence lamp, colour rendering is bad, and life and reliability all compares It is low.It is mixed because its white light is multi-wavelength, achromaticity CCD when measuring (Charge Coupled Device, Charge coupling device imaging sensor) it can be affected to the accuracy of identification of image.The color developing of three-color fluorescent lamp is good, light Effect is strong, using more in Color image of visual detection.LED light source is forth generation light source, gradually substitutes incandescent lamp, fluorescent lamp With the conventional light sources such as high-voltage gas discharging light, have that fast response time, power consumption is low, safe, service life is long, cell cube Product is small, controllability is high and the advantages such as green is recyclable.In field of machine vision, preferred light source of the LED light source as lighting system, Application range is increasingly extensive.With the technological progress of semiconductor and packaging material, LED light source will promote Novel illuminating system and The fast development that equipment manufactures and designs.At present, OLED (Organic Light-Emitting Diode, organic light-emitting diodes Pipe) --- the 5th generation light source is just constantly being applied to illumination and is showing industry.It is a kind of thin film solid state photophore of layer structure Part can be made into large area, flexible light source.Its internal voltage driver is relatively low, and power consumption is smaller, and energy-saving effect is notable.But The production technology of OLED is immature to cause its yield rate low, at high price.Typical light used in mechanical vision inspection technology Source includes its advantage and disadvantage of the Integrated comparatives such as tungsten light lamp, fluorescent lamp, halogen tungsten lamp, discharge lamp, LED light lamp and laser, preferably , the adjustable plurality of LED light sources of brightness can be selected herein, it, which has, responds fast, small, light weight, long lifespan, heat Less, noiseless and it is without friction the advantages that.
Imaging device (camera) is also unusual key equipment in machine vision technique, non-essential, present invention illumination into As optimization device can include imaging device, imaging device imaging object under three-dimensional combined light source polishing environment for acquisition The image data of (product).Specifically, the function of imaging device essence is exactly to convert optical signals into as orderly electric signal, It is also the important link in Machine Vision System Design to select suitable imaging device, and being not only of imaging device directly determines institute The image collected resolution ratio, picture quality etc., while also directly related with the operational mode of whole system, mirror in imaging device The basic function of head is exactly to realize optical beam transformation (modulation), in NI Vision Builder for Automated Inspection, the main function of camera lens be by target into As on the photosurface of imaging sensor, the quality of camera lens directly influences the overall performance of NI Vision Builder for Automated Inspection, reasonably selects Camera lens is selected and installed, is the important link of Machine Vision System Design.Light source is then to influence NI Vision Builder for Automated Inspection image level Key factor because it directly affects the quality and at least 30% application effect of input data, is illuminated by appropriate light source Design makes the target information in image obtain optimal separation with background information, can substantially reduce image processing algorithm segmentation, know Other difficulty, while the positioning of system, measurement accuracy are improved, the reliability and comprehensive performance for making system are improved.Conversely, such as Fruit light source design is improper, can cause to get half the result with twice the effort in image processing algorithm design and imaging system design.Therefore, the work of light source With at least following several:1st, target is illuminated, improves object brightness;2nd, the imaging effect most beneficial for image procossing is formed;3、 Overcome ambient light interference, ensure the stability of image;4th, the tool as measurement or reference.
Non-essential, present invention illumination imaging optimization device can also include controller, and controller is mainly used for each light Source powers, and controls the brightness of light source and controls source lighting positions (bright go out), can also by controller solution send signal come It realizes the stroboscopic of light source, and then greatly prolongs the service life of light source.Controller has analog controller and digitial controller, simulation control For device by adjusting manually, digitial controller can pass through computer or other equipment remote control.
Under above-mentioned three-dimensional combined light source polishing environment, the image for shooting magnetic shoe is as shown in Figure 4.From fig. 4, it can be seen that it claps Its defects of can identifying magnetic shoe surface well of the image taken the photograph, but surface texture has and slightly interferes, and works as the intensity of light source It increases to very by force, defect will be brightened, lead to not defect is presented.Surface defects detection is wanted to reach preferable imaging in magnetic shoe Effect, then need light source to reach certain intensity, thus will appear more noise, fully relies on software algorithm denoising, not only Detection efficiency is influenced, and easily causes flase drop, in order to reduce noise, present invention illumination imaging optimization device is in first light source 100, with adding the first sheen component 400 and the second sheen component 500 on second light source 200, to improve the soft degree of light, make it Image uniform, brightness is moderate, and noise significantly reduces, and shooting magnetic shoe image is as shown in Figure 5 after adding sheen component.
Non-essential, the first sheen component 400 and the second sheen component 500 can select sheen paper.Due to different thickness The effect that degree sheen paper carries out sheen processing differs, in this regard, experiment discovery is carried out again, if covering a layer thickness on light source Sheen paper less than or equal to 0.1 millimeter, can the effective soft degree of high light line, make its image uniform, brightness is moderate, and noise is apparent It reduces, wherein, to select the sheen paper best results of 0.1 millimeters thick, if a layer thickness is covered on LED light source is more than 0.1 milli The sheen paper of rice carries out imaging illumination, and transmitted ray is weaker.Therefore, in the present invention illuminates imaging optimization device, first is soft Using sheen paper, sheen paper is covered each by the mirror position of first light source 100 400 and second sheen component 500 of optical assembly With the mirror position of second light source 200, and the thickness of sheen paper be less than or equal to 0.1 millimeter, in most preferred embodiment, sheen thickness of paper Spend is 0.1 millimeter.
Continue experiment to find, although making an uproar in shooting magnetic shoe image under sheen treated three-dimensional combined light source environment Point significantly reduces, and can substantially tell imaged object surface defect, but there are a lot oves as shown in Figure 6 in its image Light belt.Light belt width directly affects effective detection zone of image, therefore need to as possible reduce under the premise of picture quality is ensured The width of light belt.Present invention illumination imaging optimization device is analyzed by optical theory, is set in third light source 300 and external imaging Polarised light is added in standby and filters out component, and filtering out technology using polarised light reduces light belt width, to realize enhancing picture contrast Purpose, specifically, polarised light, which filters out component, can include polarizer.
Usually, body surface reflex components are mainly made of diffusing reflection flap, minute surface flap and minute surface spike, distribution Situation is related to the roughness of reflecting surface.For the defective position in magnetic shoe surface, surface roughness is much larger than incident light Line wavelength, in reflex components based on diffusing reflection flap, minute surface flap and minute surface spike are less, diffusing reflection are can be considered, for magnetic Watt flawless position in surface, surface roughness are much smaller than incident ray wavelength, with minute surface flap and minute surface in reflex components Based on spike, diffusing reflection flap is less, can be considered mirror-reflection.Mirror-reflection can keep the polarizability of light, and diffusing reflection Polarised light can be made to become natural light.
According to Malus' law, if the amplitude of original incident light is A0, then incident intensity be:
I0=A0 2
When linearly polarized light is impinged perpendicularly on polarizer, electric vector vibration direction and polarizer shake the angle in direction thoroughly For α, electric vector is shaken the consistent parallel component A in direction thoroughly with polarizerPPolarizer can be penetrated, and electric vector is shaken thoroughly with polarizer The vertical component A in directionnIt is absorbed by the polarizer and filters out.Therefore, transmitted intensity is:
I=Ap 2=(A0cosα)2, that is, I (α)=I0cos2α。
Natural light is by the transmitted intensity after polarizer:
I (α)=0.5I0
When not having polarizer, the light of vertical light source transmitting is the light of natural light, zero defect position and defective locations reflection It is natural light.Assuming that the loss late for the light for receiving and reflecting is respectively k and t.
When the luminous intensity of vertical light source is IilDuring=α, the luminous intensity that magnetic shoe receives is:
Iol=(1-k) α.
The intensity of reflected light that camera lens receives zero defect position minute surface is:
Ipl=(1-t) * (1-k) α.
Camera lens receive defective locations minute surface the intensity that diffuses be:
Iql=(1-t) * (1-k) α.
Assuming that the defects of can telling other than light belt substantially at this time, strong reflective light on imaged object surface (magnetic shoe surface) The width of band is B, then the intensity of reflected light that light belt width is proportional to the zero defect position minute surface of camera lens reception is:
B1∝Ip1=(1-t) * (1-k) α.
When vertical light source and camera lens all install polarizer additional, vertical light source becomes polarised light, and zero defect position is anti-for minute surface It penetrates, reflected light is polarised light, and defective position is diffusing reflection, and reflected light is natural light.Assuming that the light of reception and reflection Loss late is respectively k and t, then when increase luminous intensity to Ii2During=4 α, the luminous intensity of magnetic shoe is:
Io2=0.5 (1-k) * Ii2=2 (1-k) α.
The intensity of polarization light that camera lens receives zero defect position mirror-reflection is:
Ip2=(1-t) Io2cos2α=2 (1-t) (1-k) a cos2α。
Camera lens receive defective locations mirror-reflection natural light intensity be
Iq2=0.5 (1-k) Io2=(1-t) (1-k) a=Iq1
Light belt width is:
B2∝Ip2=2 (1-t) (1-k) a cos2α。
It enables
Ip2< Ip1=(1-t) (1-k) a.
Acquire 45 ° of 135 ° of < α <, B2< B1.At this point, the intensity of the defects of camera lens receives position reflected light is sufficiently large, it is (1-t) * (1-k) a meets the requirement of defect imaging, but the intensity of zero defect position reflected light that camera lens receives is less than (1-t) * (1-k) a, by B1∝Ip1=(1-t) * (1-k) α can be obtained:Light belt width is less than the light belt width not added before polarizer.As it can be seen that Polarizer is installed additional before vertical light source (third light source 300) and camera lens, and passes through reasonable rotatory polarization piece, can camera lens be connect The defects of receipts, the luminous intensity of position mirror-reflection was constant, and the luminous intensity of zero defect position mirror-reflection dies down.
Technology is filtered out using polarised light to have the following advantages:
1st, increase detectable range
In the case where not weakening defect recognition ability, reduce light belt width, increase the detectable range of image.
2nd, increase picture contrast
During imaging, in the case where the luminous intensity of defective locations is constant, the luminous intensity of zero defect position is reduced, it can be effective Increase the contrast of image.
3rd, reduce noise
Due to reducing the luminous intensity of zero defect position, so effectively filtered out the zero defect position of imaged object surface Noise signal.Filtering out light belt width after technology using polarised light being obviously reduced can be obtained by formula and experiment:When α=90 °, light Band is most narrow, but image is most dark, influences detection result;When α=70 °, light belt width during α=90 ° than having increased slightly, picture quality Preferably, most of defect can be identified;When α=50 °, the soft degree of image, brightness make moderate progress, and can have The defects of effect identification dark space, light belt width ratio also have apparent reduction before adding polarizer, and imaging effect is optimal.Polarised light is added to filter Except the image after component (polarizer) is as shown in Figure 7.
As shown in figure 8, present invention illumination imaging optimization device includes first light source 100, second light source 200, third light source 300th, it emits beam to first light source 100 and carries out the first sheen component 400 of sheen processing, emits beam to second light source 200 Carry out sheen processing the second sheen component 500, to third light source 300 emit beam carry out polarised light filter out processing first partially The light that shakes filters out component 600 and carries out polarised light and filter out the second polarised light of processing filtering out group to injecting external imaging device light Part 700;
First light source 100 is opposite with second light source 200 and is arranged at intervals at the both sides of imaging object, 300 court of third light source It is set to imaging object, and third light source 300 is located at first light source 100 and second light source in the projection of plane residing for imaging object Between 200, the first sheen component 400 is set to first light source 100, and the second sheen component 500 is set to second light source 200, the One polarised light filters out component 600 and is set to third light source 300, and the second polarised light filters out component 700 and is set to external imaging device.
Present invention illumination imaging optimization device, it is soft including first light source 100, second light source 200, third light source 300, first Optical assembly 400, the second sheen component 500 and the first polarised light filter out 600 and second polarised light of component and filter out component 700, the One light source 100 is respectively arranged at the both sides of imaging object with second light source 200, and third light source 300 is soft towards imaging object, first 400 and second sheen component 500 of optical assembly is respectively arranged at first light source 100 and second light source 200, and the first polarised light filters out group 600 and second polarised light of part filters out component 700 and is respectively arranged at third light source 300 and external imaging device (such as camera), First light source 100, second light source 200 and third light source 300 emit light to imaging object respectively, form three-dimensional combination light Source, the first sheen component 400, the second sheen component 500 carry out first light source 100 with the light that second light source 200 is sent out soft Light processing, the first polarised light filter out 600 and second polarised light of component filter out component 700 to light carry out polarised light filter out processing, By the soft design of light, the noise in detection image is effectively reduced, filtering out technology using polarised light makes zero defect position Luminous intensity weakens, and reduces reflective bandwidth, enhances picture contrast, and surface defect in imaging object is improved from hardware Image quality, the vision-based detection for reliable and stable surface defect provide foundation.
Specifically, the first sheen component 400 and the second sheen component 500 include sheen paper, and sheen paper is covered each by It is less than or equal in the mirror position and the mirror position of second light source 200, the thickness of preferred sheen paper of first light source 100 0.1 millimeter, most preferably 0.1 millimeter of sheen paper thickness.First polarised light filters out 600 and second polarised light of component and filters out component 700 Include polarizer, polarizer is respectively arranged at the mirror position of third light source 300 and the mirror of camera lens in external imaging device Face position, polarizer are included when linearly polarized light vertical incidence, and the angle in electric vector vibration direction and the direction that shakes thoroughly is less than or waits In 70 degree of polarizer, it is preferred that polarizer is included when linearly polarized light vertical incidence, electric vector vibration direction and the direction that shakes thoroughly Angle be 50 degree polarizer.
It is non-essential, as shown in figure 9, first light source 100, second light source 200 and third light source 300 are LED light source, First light source 100 is bar-shaped LED light source with second light source 200, and third light source 300 is annular LED light source.Present invention illumination imaging Optimization device further includes lamp source controller, lamp source controller respectively with first light source 100, second light source 200 and third light source 300 connections, lamp source controller for control for light source power supply, control the brightness of light source and control source lighting positions (it is bright Go out), it can also realize the stroboscopic of light source, and then greatly prolong the service life of light source by sending signal to controller solution.
As shown in figure 9, present invention illumination imaging optimization device further includes the 4th light source 800 in one of the embodiments, 4th light source 800 is with third light source 300 mutually back to setting.Non-essential, the 4th light source 800 is dome LED light source.
Above example only expresses the several embodiments of the present invention, and description is more specific and detailed, but can not Therefore it is construed as limiting the scope of the patent.It should be pointed out that for those of ordinary skill in the art, Under the premise of not departing from present inventive concept, various modifications and improvements can be made, these belong to protection scope of the present invention. Therefore, the protection domain of patent of the present invention should be determined by the appended claims.

Claims (10)

1. a kind of illumination imaging optimization device, which is characterized in that including first light source, second light source, third light source, to described the One light source emits beam and carries out the first sheen component of sheen processing, emit beam to the second light source progress sheen processing Second sheen component, to the third light source emit beam carry out polarised light filter out processing the first polarised light filter out component and The second polarised light that processing is filtered out to injecting external imaging device light progress polarised light filters out component;
The first light source is opposite with the second light source and is arranged at intervals at the both sides of imaging object, the third light source direction Imaging object setting, and the third light source the projection of plane residing for the imaging object be located at the first light source and Between the second light source, the first sheen component is set to the first light source, and the second sheen component is set to institute Second light source is stated, first polarised light filters out component and is set to the third light source, and second polarised light filters out component and sets It is placed in external imaging device.
2. illumination imaging optimization device according to claim 1, which is characterized in that further include the 4th light source, the described 4th Light source is with the third light source mutually back to setting.
3. illumination imaging optimization device according to claim 1, which is characterized in that the first sheen component and described the Two sheen components include sheen paper, and the sheen paper is covered each by mirror position and described second in the first light source The mirror position of light source.
4. illumination imaging optimization device according to claim 3, which is characterized in that the thickness of the sheen paper is less than or waits In 0.1 millimeter.
5. it is according to claim 1 illumination imaging optimization device, which is characterized in that first polarised light filter out component with Second polarised light filters out component and includes polarizer, and the polarizer is respectively arranged at the mirror position of the third light source And in the external imaging device camera lens mirror position.
6. illumination imaging optimization device according to claim 5, which is characterized in that the polarizer includes working as linearly polarized light During vertical incidence, the angle in electric vector vibration direction and the direction that shakes thoroughly is less than or equal to 70 degree of polarizer.
7. illumination imaging optimization device according to claim 5, which is characterized in that the polarizer includes working as linearly polarized light During vertical incidence, electric vector vibration direction and shake thoroughly direction angle be 50 degree polarizer.
8. illumination imaging optimization device according to claim 1, which is characterized in that the first light source, second light Source and the third light source are LED light source.
9. illumination imaging optimization device according to claim 1, which is characterized in that further include lamp source controller, the lamp Source controller is connect respectively with the first light source, the second light source and the third light source.
10. illumination imaging optimization device according to claim 1, which is characterized in that the first light source and described second Light source is strip source, and the third light source is annular light source.
CN201611229914.0A 2016-12-27 2016-12-27 Illumination imaging optimization device Pending CN108240989A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611229914.0A CN108240989A (en) 2016-12-27 2016-12-27 Illumination imaging optimization device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611229914.0A CN108240989A (en) 2016-12-27 2016-12-27 Illumination imaging optimization device

Publications (1)

Publication Number Publication Date
CN108240989A true CN108240989A (en) 2018-07-03

Family

ID=62703030

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611229914.0A Pending CN108240989A (en) 2016-12-27 2016-12-27 Illumination imaging optimization device

Country Status (1)

Country Link
CN (1) CN108240989A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109991166A (en) * 2019-03-19 2019-07-09 深圳市派科斯科技有限公司 Equipment for product appearance defect detection and combinations thereof light supply apparatus, method
CN110018166A (en) * 2019-03-19 2019-07-16 深圳市派科斯科技有限公司 A kind of device and method for product appearance defect detection

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201348611Y (en) * 2009-01-12 2009-11-18 北京大恒图像视觉有限公司 Quality detecting system for laser printed matter
CN201765380U (en) * 2010-09-15 2011-03-16 南京协力电子科技集团有限公司 Three-dimensional optical lighting system
CN103048333A (en) * 2012-12-07 2013-04-17 北京优纳科技有限公司 Appearance detection equipment and method
CN204629260U (en) * 2015-05-29 2015-09-09 杭州利珀科技有限公司 A kind of light source for crown cap defect intelligent detection equipment
CN105675615A (en) * 2016-02-26 2016-06-15 苏州塞罗尔医学影像科技有限公司 High-speed large-range high-resolution imaging system
CN205374336U (en) * 2016-01-29 2016-07-06 凯吉凯精密电子技术开发(苏州)有限公司 Light and shade field of vision image acquisition system for contact lens of detection

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201348611Y (en) * 2009-01-12 2009-11-18 北京大恒图像视觉有限公司 Quality detecting system for laser printed matter
CN201765380U (en) * 2010-09-15 2011-03-16 南京协力电子科技集团有限公司 Three-dimensional optical lighting system
CN103048333A (en) * 2012-12-07 2013-04-17 北京优纳科技有限公司 Appearance detection equipment and method
CN204629260U (en) * 2015-05-29 2015-09-09 杭州利珀科技有限公司 A kind of light source for crown cap defect intelligent detection equipment
CN205374336U (en) * 2016-01-29 2016-07-06 凯吉凯精密电子技术开发(苏州)有限公司 Light and shade field of vision image acquisition system for contact lens of detection
CN105675615A (en) * 2016-02-26 2016-06-15 苏州塞罗尔医学影像科技有限公司 High-speed large-range high-resolution imaging system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
徐光明: "磁瓦表面缺陷自动检测识别方法的研究", 《中国优秀硕士学位论文全文数据库 信息科技辑》 *
杨子琦: "柱塞式汽车制动器总泵活塞表面缺陷机器视觉检测", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109991166A (en) * 2019-03-19 2019-07-09 深圳市派科斯科技有限公司 Equipment for product appearance defect detection and combinations thereof light supply apparatus, method
CN110018166A (en) * 2019-03-19 2019-07-16 深圳市派科斯科技有限公司 A kind of device and method for product appearance defect detection
CN109991166B (en) * 2019-03-19 2021-08-03 深圳市派科斯科技有限公司 Equipment for detecting product appearance defects and combined light source device and method thereof

Similar Documents

Publication Publication Date Title
US11195045B2 (en) Method for regulating position of object
TWI558996B (en) System and method for capturing illumination reflected in multiple directions
TWI464384B (en) Defect inspection and photoluminescence measurement system
CN101501474A (en) Optical inspection
US9188431B2 (en) Backlit vision machine
CN108027328A (en) The color measuring of jewel
US20010015414A1 (en) Method and arrangement for inspection of surfaces
CN107884414A (en) It is a kind of to reject mirror article surface defect detecting system and the method that dust influences
US20020085199A1 (en) LCC device inspection module
JP2019100930A (en) Inspection system and inspection method
CN110186937A (en) Reject mirror article surface two-dimensional defect detection method and system that dust influences
TWI497059B (en) Multi - surface detection system and method
CN110044931A (en) A kind of detection device on bend glass surface and internal flaw
CN108240989A (en) Illumination imaging optimization device
KR20140012342A (en) Inspection apparatus for led module
TW200819770A (en) Adjustable illumination apparatus and AOI system using the same
CN203259248U (en) Portable colorimeter
CN104458758A (en) Detection device for synthetic sapphire wafer
JP2005091049A (en) Light irradiator for image processing and light irradiation method for image processing
CN208013080U (en) One kind detecting Plastic foreign fiber device based on polarization state detection technique
CN105651733B (en) Material scattering characteristic measuring device and method
TWI598580B (en) Led wafer testing device and method thereof
KR20230068578A (en) Micro LED Inspection Device for Performing Photoluminescence Inspection and Automatic Optical Inspection Simultaneously
TWM606486U (en) Testing equipment and light receiving device
CN107064174A (en) A kind of detecting system detected for glass surface defects

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20180703

RJ01 Rejection of invention patent application after publication