CN108196207A - A kind of magnet field probe using isolated vias structure - Google Patents
A kind of magnet field probe using isolated vias structure Download PDFInfo
- Publication number
- CN108196207A CN108196207A CN201711257850.XA CN201711257850A CN108196207A CN 108196207 A CN108196207 A CN 108196207A CN 201711257850 A CN201711257850 A CN 201711257850A CN 108196207 A CN108196207 A CN 108196207A
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- Prior art keywords
- strip line
- symmetrical
- ring
- unmasked
- line
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
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Abstract
A kind of magnet field probe using isolated vias structure of the invention, including shielded layer, stripline media and strip line signal wire under symmetrical unmasked ring, ground via, strip line, isolated vias, signal via, adapter, unmasked ring symmetric arms extended line, strip line upper shielding layer, strip line.The symmetrical unmasked ring ensures the intensity of symmetrical unmasked ring in the interlayer of the dielectric material of strip line, one arm of symmetrical unmasked ring is directly connected with the signal wire of strip line, and another arm is connected by unmasked symmetrical ring extended line by ground via with the upper shielding layer of strip line and lower shielded layer, isolated vias is located on strip line, and it is connected with strip line upper shielding layer and lower shielded layer, simultaneously between ground via and strip line signal wire, the other end of strip line signal wire is connected by signal via with adapter.
Description
【Technical field】
It is more particularly to a kind of that wideband high-sensitivity near field magnetic field tested the invention belongs to electromagnetic field testing field
Magnet field probe structure, the near field Distribution of Magnetic Field that tested object can be specifically obtained by this probe near-field test are joined
Number.
【Background technology】
With the hair at full speed of the technologies such as electrical engineering, electronic science and technology, computer technology, Control Theory and Control Engineering
Exhibition, electronic circuit occupy indispensable status in the application of all trades and professions.Electronic circuit working frequency frequency range constantly extends, collection
Cheng Du and complexity are higher and higher, and any one section of cabling in circuit is likely to the source as radiation field.Different cablings
Coupling between radiation is one of the main reason for causing system-level electromagnetic compatibility problem.
The file of Issued by China State Bureau of Technical Supervision explicitly points out, any not meet national Specification, and radio interference is tight
The product of weight is forbidden producing and be used.It is index in EMC Design that the radiation of different electronic circuits, which accurately measure,
Quantization link effectively investigates means.It, can not but when the electromagnetic field intensity radiated to circuit-under-test carries out far-field measurement
It is accurate to obtain the accurate location for being devices under middle radiation source, it is faced in the process here it is the rectification of tested Electric Circuit Electromagnetic Compatibility
Main problem.Compared to the deficiency of far field test, near-field test can accurately be accurately positioned the radiation source in electronic circuit.
More and more electronic equipments all have the characteristics that working band is wide, while the signal code on cabling is also very small.But mesh
The magnet field probe used during preceding near-field test cannot have both broadband and highly sensitive feature, therefore need during the test
One group of near-field test probe measures to meet the requirements jointly, and using larger-size probe during including low frequency, when high frequency is changed to
The smaller probe of size.But magnet field probe is frequently replaced in test process can introduce larger measurement error in the result.
【Invention content】
In order to overcome the shortcomings of existing near field magnet field probe, the purpose of the present invention is to provide one kind to be applied to near-field test
Magnet field probe, can solve the problems, such as in broadband test because signal code is faint and cannot test and because replace pop one's head in due to
The defects of introducing measurement error.
The purpose of the present invention is realized using following technical scheme：
A kind of magnet field probe using isolated vias structure, including symmetrical unmasked ring, isolated vias, ground via, band
Shape line, signal via and adapter.
The symmetrical unmasked ring is the important meals structure for picking up near field Distribution of Magnetic Field, and two-arm is about central shaft pair
Claim, and an arm of symmetrical unmasked ring is connected with the signal wire of strip line, another arm of symmetrical unmasked ring is by prolonging
After length by ground via and strip line upper strata shield and underlying shield be connected directly；The unmasked symmetrical ring knot
Structure is similar to U-typed structure type, and two arms in left and right are located in stripline media and about substantially symmetrical about its central axis.
The purpose of described isolated vias is to provide sufficient return flow path for distributed current, is placed on strip line and position
Between symmetrical one arm extended line of unmasked ring and the signal wire of microstrip line；The form of isolated vias is metal throuth hole, is isolated
The upper strata of via and strip line is connected directly with shielding ground and underlying shield.
The purpose of described ground via is that symmetrical unmasked ring and microstrip line are formed access, is located at symmetrical unmasked ring
Extended line end, the form of ground via is the upper strata shielding ground and strip line of metal throuth hole, ground via and strip line
Underlying shield it is connected directly.
The strip line by signal wire, stripline media, upper strata shielding and underlying shield form, strip line upper strata
Shielding ground is located at the upper surface of stripline media, is located to strip line underlying shield the lower surface of stripline media, signal wire position
In stripline media；The signal wire other end is connected by signal via with adapter, it is therefore an objective to pick up magnet field probe
The signal got is transferred to test equipment by adapter.
The signal via and adapter are located at the other end of strip line, signal via through stripline media with it is band-like
The signal wire of line is connected, and signal via is isolated with shielding ground and strip line underlying shield with strip line upper strata, for preventing
Short circuit.Adapter is fixed on by signal via on strip line, it is therefore an objective to which providing convenient connection method will pop one's head in what is tested
Signal transmission is to test equipment.
Compared with prior art, the beneficial effects of the present invention are：
Broadband is provided simultaneously with by the present invention in that can be realized with the symmetrical unmasked ring near field magnet field probe of isolated vias
And the characteristics of high sensitivity, it effectively improves in traditional test to small-signal is not measured and introduces and surveys due to replacing probe
The defects of measuring error, the accuracy of the test result of guarantee.
【Description of the drawings】
Fig. 1 is the sonde configuration schematic diagram vertical view of the present invention.
Fig. 2 is the sonde configuration schematic diagram side view of the present invention.
Fig. 3 is the sonde configuration near-field test schematic diagram of the present invention
Reference numeral：1st, unmasked symmetrical ring；2nd, ground via；3rd, strip line；4th, isolated vias；5th, signal via；6、
Adapter；7th, unmasked ring symmetric arms extended line；8th, strip line upper shielding layer；9th, shielded layer under strip line；10th, strip line is situated between
Matter；11st, strip line signal wire；12nd, magnet field probe；13rd, it is tested platform；14th, coaxial cable；15th, test equipment；
【Specific embodiment】
Way of the present invention is further described in detail below in conjunction with attached drawing.
As shown in Fig. 1 Fig. 2, a kind of magnet field probe applied to near-field test is present embodiments provided, including symmetrical non-screen
Cover ring 1, ground via 2, strip line 3, isolated vias 4, signal via 5, adapter 6, unmasked ring symmetric arms extended line 7, band
Shielded layer 9, stripline media 10 and strip line signal wire 11 under shape line upper shielding layer 8, strip line.The symmetrical unmasked ring
1 ensures the intensity of symmetrical unmasked ring in the interlayer of the dielectric material 10 of strip line 3, an arm of ring directly with it is band-like
The signal wire 11 of line 3 is connected, and another arm passes through ground via 2 and strip line 3 by unmasked symmetrical ring extended line 7
Upper shielding layer 8 is connected with lower shielded layer 9, and isolated vias 4 is located on strip line 3, and with strip line upper shielding layer 8 and lower shielding
Layer 9 is connected, while between ground via 2 and strip line signal wire 11, and the other end of strip line signal wire 11 passes through letter
Number via 5 is connected with adapter 6.Integrated electricity can be included by the electronic equipment of near field measurement of magnetic field mentioned in the present embodiment
Road, circuit board, cable, casing etc., these are merely possible to exemplary illustration, and all tested electronics are not set out and set
It is standby.
As shown in figure 3, the magnet field probe 12 in the present invention is placed on a filed-close plane of tested platform 13, magnetic field
Probe 12 is connected with one end of coaxial cable 14, and the other end of coaxial cable 14 is connected with test equipment 15.Pass through movement
The position of magnet field probe 12, it is in read test equipment 15 as a result, the magnetic on the filed-close plane of tested platform 13 can be obtained
Field test result.
For those skilled in the art, technical solution that can be as described above and design, make other
Various corresponding changes and deformation, and all these changes and deformation should all belong to the protection of the claims in the present invention
Within the scope of.
Claims (4)
1. a kind of magnet field probe using isolated vias structure, it is characterised in that：Including symmetrical unmasked ring, isolated vias, connect
Ground via, strip line, signal via and adapter；
The symmetrical unmasked ring is the important meals structure for picking up near field Distribution of Magnetic Field, two-arm about substantially symmetrical about its central axis, and
One arm of symmetrical unmasked ring is connected with the signal wire of strip line, another arm of symmetrical unmasked ring leads to after extension
Ground via is crossed to be connected directly with shielding ground and underlying shield with strip line upper strata；
The isolated vias is to provide sufficient return flow path for distributed current, is placed on strip line and positioned at symmetrical non-screen
It covers between one arm extended line of ring and the signal wire of microstrip line；The upper strata of isolated vias and strip line is with shielding ground and underlying shield
It is connected directly；
The ground via is that symmetrical unmasked ring and microstrip line are formed access, is located at the extended line of symmetrical unmasked ring
The upper strata of end, ground via and strip line is connected directly with shielding ground and strip line underlying shield；
The strip line by signal wire, stripline media, upper strata shielding and underlying shield form；Strip line upper strata shielding ground
Positioned at the upper surface of stripline media, strip line underlying shield it is located at the lower surface of stripline media, signal wire is located at band-like
In line medium；The signal wire other end is connected by signal via with adapter, and the signal that magnet field probe picks up is passed through switching
Head is transferred to test equipment；
The signal via and adapter are located at the other end of strip line, and signal via is through stripline media and the letter of strip line
Number line is connected, and signal via is isolated with shielding ground and strip line underlying shield with strip line upper strata, prevents short circuit；Adapter
It is fixed on strip line by signal via, the signal transmission tested that will pop one's head in is to test equipment.
2. a kind of according to claim 11, magnet field probe using isolated vias structure, it is characterised in that：Described is non-
It is similar to U-typed structure type to shield symmetrical ring structure, and two arms in left and right are located in stripline media and about central shaft
Symmetrically.
3. a kind of according to claim 11, magnet field probe using isolated vias structure, it is characterised in that：Isolated vias
Form be metal throuth hole.
4. a kind of according to claim 11, magnet field probe using isolated vias structure, it is characterised in that：Ground via
Form be metal throuth hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711257850.XA CN108196207B (en) | 2017-12-04 | 2017-12-04 | Magnetic field probe adopting isolated via hole structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711257850.XA CN108196207B (en) | 2017-12-04 | 2017-12-04 | Magnetic field probe adopting isolated via hole structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108196207A true CN108196207A (en) | 2018-06-22 |
| CN108196207B CN108196207B (en) | 2020-06-23 |
Family
ID=62573317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711257850.XA Active CN108196207B (en) | 2017-12-04 | 2017-12-04 | Magnetic field probe adopting isolated via hole structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108196207B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109215859A (en) * | 2018-08-10 | 2019-01-15 | 深圳市信维通信股份有限公司 | A kind of strip line/microstrip line of transmitting radio frequency signal |
| CN113960374A (en) * | 2021-10-09 | 2022-01-21 | 中国舰船研究设计中心 | Near-field measurement composite electromagnetic probe |
| CN116679244A (en) * | 2023-07-27 | 2023-09-01 | 中国科学院上海高等研究院 | Automatic measuring device and method for fast pulse magnetic field |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5052947A (en) * | 1990-11-26 | 1991-10-01 | United States Of America As Represented By The Secretary Of The Air Force | Cable shield termination backshell |
| CN204389661U (en) * | 2015-01-08 | 2015-06-10 | 南京信息工程大学 | Printed circuit template magnet field probe |
| CN105717466A (en) * | 2016-04-08 | 2016-06-29 | 北京航空航天大学 | Broadband minitype near field magnetic field measurement probe |
| CN105891611A (en) * | 2016-04-08 | 2016-08-24 | 北京航空航天大学 | Broadband miniature near-field electric field test probe |
-
2017
- 2017-12-04 CN CN201711257850.XA patent/CN108196207B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5052947A (en) * | 1990-11-26 | 1991-10-01 | United States Of America As Represented By The Secretary Of The Air Force | Cable shield termination backshell |
| CN204389661U (en) * | 2015-01-08 | 2015-06-10 | 南京信息工程大学 | Printed circuit template magnet field probe |
| CN105717466A (en) * | 2016-04-08 | 2016-06-29 | 北京航空航天大学 | Broadband minitype near field magnetic field measurement probe |
| CN105891611A (en) * | 2016-04-08 | 2016-08-24 | 北京航空航天大学 | Broadband miniature near-field electric field test probe |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109215859A (en) * | 2018-08-10 | 2019-01-15 | 深圳市信维通信股份有限公司 | A kind of strip line/microstrip line of transmitting radio frequency signal |
| CN109215859B (en) * | 2018-08-10 | 2023-12-19 | 深圳市信维通信股份有限公司 | Strip line/microstrip line for transmitting radio frequency signals |
| CN113960374A (en) * | 2021-10-09 | 2022-01-21 | 中国舰船研究设计中心 | Near-field measurement composite electromagnetic probe |
| CN116679244A (en) * | 2023-07-27 | 2023-09-01 | 中国科学院上海高等研究院 | Automatic measuring device and method for fast pulse magnetic field |
| CN116679244B (en) * | 2023-07-27 | 2023-10-17 | 中国科学院上海高等研究院 | Automatic measuring device and method for fast pulse magnetic field |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108196207B (en) | 2020-06-23 |
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