CN108182311B - Command communication equipment reliability evaluation method based on accelerated life test - Google Patents

Command communication equipment reliability evaluation method based on accelerated life test Download PDF

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CN108182311B
CN108182311B CN201711419754.0A CN201711419754A CN108182311B CN 108182311 B CN108182311 B CN 108182311B CN 201711419754 A CN201711419754 A CN 201711419754A CN 108182311 B CN108182311 B CN 108182311B
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田双蜀
石文生
胡荣
李昌隆
姚臣
曲艳萍
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Beijing Aerospace Chenxin Technology Co ltd
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Abstract

The invention discloses a command communication equipment reliability evaluation method based on an accelerated life test, which is realized by the steps of determining environmental stress, determining electrical stress, determining an environmental stress accelerated life model, determining an electrical stress accelerated life model, determining an accelerated life test section, detecting equipment, analyzing equipment faults, analyzing maintenance cost and service life, analyzing weak links of the equipment and improving reliability. The method effectively judges the weak parts restricting the use of the equipment, predicts the failure time of the weak parts of the equipment according to the occurrence time of the failure, and provides support for the establishment of maintenance plans and maintenance spare part storage schemes.

Description

Command communication equipment reliability evaluation method based on accelerated life test
Technical Field
The invention relates to an electronic equipment reliability evaluation method, in particular to a command communication equipment reliability evaluation method based on an accelerated life test.
Background
The command communication equipment has a specific design life, and if the design life is reached, the equipment is replaced by new equipment, so that the residual value of the original equipment is wasted, and the use economy of the equipment is reduced. However, as the service life of the equipment increases, the failure rate of the equipment gradually increases, and the reliability of the equipment is reduced. If the parts restricting the service life of the equipment can be determined and spare parts and maintenance can be reasonably arranged, the equipment maintenance time can be shortened, and the equipment availability is further improved; the actual service life of the in-service equipment is accurately evaluated, batch replacement is carried out before the service life of the in-service equipment is reached, and the method has great significance for improving the reliability and the economy of the equipment.
The reliability design of the command communication equipment is generally guaranteed by selecting components, and the reliability is verified by using an aging test and a routine test under a specific environment. The actual use natural environment of the equipment is complex and harsh, the operation mode and the electromagnetic environment are various, and the difference with the reliability verification environment is large, so that the failure rate, the actual service life and the design of the command communication equipment are inconsistent, and the difficulty is brought to the maintenance and the health management of the equipment. The specific service life of the equipment needs to be quantitatively checked and verified in combination with the actual use environment of the equipment. In order to accurately evaluate the actual service life of the active command communication equipment and reasonably arrange spare parts and maintain, a command communication equipment reliability evaluation method based on an accelerated life test is provided.
Disclosure of Invention
The invention aims to provide a command communication equipment reliability evaluation method based on an accelerated life test, and solves the problems of insufficient reliability evaluation under a specific environment, insufficient equipment maintenance caused by operation and use environment change and insufficient spare part storage for maintenance.
A command communication equipment reliability evaluation method based on an accelerated life test comprises the following specific steps:
first step determination of environmental stress
And determining the environmental stress influencing the service life of the equipment according to a storage life prolonging theory and an accelerated life test theory by combining with the actual service environment of the communication equipment. Command communication equipment operational environment is complicated various, needs to confirm the environmental stress that influences life according to the concrete mounted position of equipment, surrounding environment. The stress determination is determined with reference to the failure and failure analysis conclusions of similar equipment. Environmental stresses in a relatively clean room of the shelter type, which affect the service life of the equipment, include: temperature, humidity, vibration, air pressure and salt spray; work in exposed environments, considering increasing sand wind stress.
And (4) carrying out statistical analysis on the duration and the stress amplitude of different environmental stresses in the storage time and the working time of the equipment to form an actual use profile of the equipment.
Second step determination of electrical stress
Electrical stress, comprising: voltage stress, power and switching pulses, the stress being determined with reference to actual measurements or conditions of use of the equipment, and also with reference to the operating range requirements of the equipment.
Thirdly, determining an environment stress accelerated life model
The service life of the equipment is divided into storage life and working life according to the actual service conditions of the equipment. The stresses that affect the shelf life of the device are environmental stresses including: temperature, humidity, air pressure and vibration during transportation; the stress affecting the working life of the equipment is the comprehensive stress of environmental stress and electric stress.
The temperature stress during the shelf life is expressed by the equation (1) using Arrhenius, a model of Arrhenius:
Figure BDA0001522780570000021
in the formula (1), ε represents lifetime; eaThe activation energy is determined according to the activation energy of main components influencing the service life of the electronic equipment, and is related to materials and has a unit of electron volt eV; k is Boltzmann constant of 8.617 × 10‐5eV/K; t is the absolute temperature; and Λ is a normal number related to product characteristics, geometric shapes and test modes.
The acceleration factor af (t) is expressed by equation (2):
Figure BDA0001522780570000022
in the formula (2), T0Is the normal working absolute temperature, unit K; t is the absolute temperature for accelerated storage in K.
Obtaining corresponding accelerated life time t according to the actual storage time1Expressed by equation (3):
Figure BDA0001522780570000031
in the formula (3), t0Is the actual working time.
The temperature stress in the standby process is cyclic temperature stress, the high-temperature acceleration time is calculated by adopting an Arrhenius model, and the cyclic times are estimated by adopting a coffee-Manson model, namely
Figure BDA0001522780570000032
In the formula (4), N is the cycle number; delta T is the difference between the upper and lower limit temperatures of the temperature cycle; alpha is the plasticity index of the material, and 1.4-2 is taken; c is a constant.
Then the process of the first step is carried out,
Figure BDA0001522780570000033
in the formula (5), N0The number of temperature cycles in actual work is shown; n is a radical of1The number of cycles after temperature acceleration; delta T0Is the actual temperature difference; delta T1The temperature difference was used to speed up the test.
The product can be under the action of vibration stress in the transportation process, and a vibration acceleration life model based on a Palmgren-Miner accumulated damage criterion is adopted. Namely, it is
Figure BDA0001522780570000034
In the formula (6), t0Is the vibration time; t is t12Is the equivalent acceleration time; s0The vibration amplitude spectrum in the actual use environment; s1Accelerating the vibration amplitude spectrum of the experiment; m is a value related to the slope of the S-N curve of the material.
Humidity stress employs an inverse power law accelerated life model, i.e.
ε＝AS-c (7)
In the formula (7), ε represents lifetime; a is a normal number; c is a normal number related to activation energy; s is the stress level.
Fourthly, determining an electric stress accelerated life model
Electrical stress, comprising: voltage stress, power and switching pulses.
For the voltage stress, an inverse power rate acceleration life model shown in formula (7) is adopted, and the voltage range needs to be selected within the normal working range of the equipment.
For power stress, the actual working condition required when the equipment is used needs to be combined, and the load of the equipment and the working time proportion under different powers are considered for design.
The durability of the switch pulse stress examination equipment at the moment of power-on is improved. And performing 1-to-1 simulation examination according to the switching times of actual equipment in use.
Fifth step accelerated life test Profile determination
And determining an annual accelerated life test section of the equipment according to the environmental stress, the electrical stress and the corresponding accelerated life model determined in the previous step and the annual actual use section of the equipment. In actual environment, the equipment is subjected to comprehensive application of various stresses, and the accelerated life test profile is determined by adopting a comprehensive application mode of various stresses in the accelerated life test profile.
Sixth step of device detection
In the accelerated life test process, the detection time of the equipment is as follows: before, during and after the test. The detection time is reasonably arranged, and the state of the equipment in the test process is effectively detected. And when the function and performance indexes of the equipment do not meet the requirements, performing fault analysis.
Seventh step of device failure analysis
And establishing a corresponding relation between the fault feature set and the fault source set by using a conservation coverage set theory for reference, and further finding out the fault source. Different fault characteristics correspond to different fault source sets, and the optimal corresponding relation between the fault characteristics and the fault sources is obtained by using a conservation coverage set theory for reference. The theoretical analysis process using the conservation coverage set is as follows:
if F represents the possible fault feature set of the equipment and F represents the possible fault feature number, the fault occurrence is 2FAnd (4) possibility. Each kind ofThe possibilities can be seen as a subset F of FI. When F is presentI＝{f1,f2,…,fnDenotes the failure feature f1,f2,…,fnWhen a failure occurs, and others
Figure BDA0001522780570000051
The failure of (2) does not occur. The problem of multiple fault diagnosis in the equipment is solved in all 2FThe most likely combination is found among the possibilities. The best combination is found by using symbolic reasoning-conservation coverage theory.
The conservation coverage theory is a theory for clarifying the system of diagnostic experts by using induced reasoning. It describes the diagnostic problem as a quadruplet P ═ F, A, R, A+Therein, wherein
F＝{f1,f2,…,fnRepresents a finite, non-empty set of fault signatures;
A＝{a1,a2,…,anrepresents a finite, non-empty set of failure sources;
Figure BDA0001522780570000052
representing a subset of ordered relationships defined on F × a;
Figure BDA0001522780570000053
representing a known set of sources of failure.
The symbol R represents a direct causal relationship between the fault signature and the fault source, < fi,aj> ∈ R denotes fiMay be formed byjCause it does not mean when fiExist of ajAlways, but only possibly. A. the+Is a special subset of A, representing features known to exist under a particular problem, not A+May be considered to be absent.
Furthermore, two functions are defined: for all aj∈A，parts(aj)＝{fi|＜fi,aj"Easter R } represents fault source ajAll possible fault features, features (f)i)＝{aj|＜fi,aj"Easter R } represents a possibly fault-causing feature fiAll sources of failure. Simultaneous definition of
Figure BDA0001522780570000054
And
Figure BDA0001522780570000055
when in use
Figure BDA0001522780570000056
Then, it is called fault feature set FIIs a characteristic value
Figure BDA0001522780570000057
One covering of (a).
With the minimum criteria, namely: when A is+Is an interpretation that satisfies a minimum rule to determine that each fault in the device corresponds to the least fault source coverage.
Eighth step of maintenance cost analysis and life evaluation
And maintaining the fault, recovering the performance of the equipment, analyzing the maintenance cost of the equipment, and continuing to perform the accelerated life test when the maintenance cost is lower. And determining whether the service life of the equipment is reached or not according to the frequency of the faults and the cost of maintenance and replacement, and further determining the replacement time of the whole machine.
Ninth step, analyzing weak link of equipment and improving reliability
The method comprises the steps of analyzing faults and maintenance and replacement measures of equipment in the accelerated life test process, determining life parts restricting the use of the equipment, and determining the maintenance measures and the replacement time of the life parts of the equipment according to the time when the faults occur and the requirements of equipment guarantee so as to improve the reliability of the equipment.
The method effectively judges the weak parts restricting the use of the equipment, predicts the failure time of the weak parts of the equipment according to the occurrence time of the failure, and provides support for the establishment of maintenance plans and maintenance spare part storage schemes.
Detailed Description
A command communication equipment reliability evaluation method based on an accelerated life test comprises the following specific steps:
first step determination of environmental stress
And determining the environmental stress influencing the service life of the equipment according to a storage life prolonging theory and an accelerated life test theory by combining with the actual service environment of the communication equipment. Command communication equipment operational environment is complicated various, needs to confirm the environmental stress that influences life according to the concrete mounted position of equipment, surrounding environment. The stress determination is determined with reference to the failure and failure analysis conclusions of similar equipment. Environmental stresses in a relatively clean room of the shelter type, which affect the service life of the equipment, include: temperature, humidity, vibration, air pressure and salt spray; work in exposed environments, considering increasing sand wind stress.
And (4) carrying out statistical analysis on the duration and the stress amplitude of different environmental stresses in the storage time and the working time of the equipment to form an actual use profile of the equipment.
Second step determination of electrical stress
Electrical stress, comprising: voltage stress, power and switching pulses, the stress being determined with reference to actual measurements or conditions of use of the equipment, and also with reference to the operating range requirements of the equipment.
Thirdly, determining an environment stress accelerated life model
The service life of the equipment is divided into storage life and working life according to the actual service conditions of the equipment. The stresses that affect the shelf life of the device are environmental stresses including: temperature, humidity, air pressure and vibration during transportation; the stress affecting the working life of the equipment is the comprehensive stress of environmental stress and electric stress.
The temperature stress during the shelf life is expressed by the equation (1) using Arrhenius, a model of Arrhenius:
Figure BDA0001522780570000071
in the formula (1), ε represents lifetime; eaThe activation energy is determined according to the activation energy of main components influencing the service life of the electronic equipment, and is related to materials and has a unit of electron volt eV; k is Boltzmann constant of 8.617 × 10‐5eV/K; t is the absolute temperature; and Λ is a normal number related to product characteristics, geometric shapes and test modes.
The acceleration factor af (t) is expressed by equation (2):
Figure BDA0001522780570000072
in the formula (2), T0Is the normal working absolute temperature, unit K; t is the absolute temperature for accelerated storage in K.
Obtaining corresponding accelerated life time t according to the actual storage time1Expressed by equation (3):
Figure BDA0001522780570000073
in the formula (3), t0Is the actual working time.
The temperature stress in the standby process is cyclic temperature stress, the high-temperature acceleration time is calculated by adopting an Arrhenius model, and the cyclic times are estimated by adopting a coffee-Manson model, namely
Figure BDA0001522780570000074
In the formula (4), N is the cycle number; delta T is the difference between the upper and lower limit temperatures of the temperature cycle; alpha is the plasticity index of the material, and 1.4-2 is taken; c is a constant.
Then the process of the first step is carried out,
Figure BDA0001522780570000081
in the formula (5), N0The number of temperature cycles in actual work is shown; n is a radical of1The number of cycles after temperature acceleration; delta T0Is the actual temperature difference；ΔT1The temperature difference was used to speed up the test.
The product can be under the action of vibration stress in the transportation process, and a vibration acceleration life model based on a Palmgren-Miner accumulated damage criterion is adopted. Namely, it is
Figure BDA0001522780570000082
In the formula (6), t0Is the vibration time; t is t12Is the equivalent acceleration time; s0The vibration amplitude spectrum in the actual use environment; s1Accelerating the vibration amplitude spectrum of the experiment; m is a value related to the slope of the S-N curve of the material.
Humidity stress employs an inverse power law accelerated life model, i.e.
ε＝AS-c (7)
In the formula (7), ε represents lifetime; a is a normal number; c is a normal number related to activation energy; s is the stress level.
Fourthly, determining an electric stress accelerated life model
Electrical stress, comprising: voltage stress, power and switching pulses.
For the voltage stress, an inverse power rate acceleration life model shown in formula (7) is adopted, and the voltage range needs to be selected within the normal working range of the equipment.
The power stress is determined by combining the actual working condition required when the equipment is used, and considering the load of the equipment and the working time proportion under different powers.
The durability of the switch pulse stress examination equipment at the moment of power-on is improved. And performing 1-to-1 simulation examination according to the switching times of actual equipment in use.
Fifth step accelerated life test Profile determination
And determining an annual accelerated life test section of the equipment according to the environmental stress, the electrical stress and the corresponding accelerated life model determined in the previous step and the annual actual use section of the equipment. In actual environment, the equipment is subjected to comprehensive application of various stresses, and the accelerated life test profile is determined by adopting a comprehensive application mode of various stresses in the accelerated life test profile.
Sixth step of device detection
In the accelerated life test process, the detection time of the equipment is as follows: before, during and after the test. The detection time is reasonably arranged, and the state of the equipment in the test process is effectively detected. When the function and performance indexes of the equipment do not meet the requirements, fault analysis is required.
Seventh step of device failure analysis
And establishing a corresponding relation between the fault feature set and the fault source set by using a conservation coverage set theory for reference, and further finding out the fault source. Different fault characteristics correspond to different fault source sets, and the optimal corresponding relation between the fault characteristics and the fault sources is obtained by using a conservation coverage set theory for reference. The theoretical analysis process using the conservation coverage set is as follows:
if F represents the possible fault feature set of the equipment and F represents the possible fault feature number, the fault occurrence is 2FAnd (4) possibility. Each possibility can be viewed as a subset F of FI. When F is presentI＝{f1,f2,…,fnDenotes the failure feature f1,f2,…,fnWhen a failure occurs, and others
Figure BDA0001522780570000091
The failure of (2) does not occur. The problem of multiple fault diagnosis in the equipment is solved in all 2FThe most likely combination is found among the possibilities. The best combination is found by using symbolic reasoning-conservation coverage theory.
The conservation coverage theory is a theory for clarifying the system of diagnostic experts by using induced reasoning. It describes the diagnostic problem as a quadruplet P ═ F, A, R, A + >, where
F＝{f1,f2,…,fnRepresents a finite, non-empty set of fault signatures;
A＝{a1,a2,…,anrepresents a finite, non-empty set of failure sources;
Figure BDA0001522780570000092
representing a subset of ordered relationships defined on F × a;
Figure BDA0001522780570000093
representing a known set of sources of failure.
The symbol R represents a direct causal relationship between the fault signature and the fault source, < fi,aj> ∈ R denotes fiMay be formed byjCause it does not mean when fiExist of ajAlways, but only possibly. A. the+Is a special subset of A, representing features known to exist under a particular problem, not A+May be considered to be absent.
Furthermore, two functions are defined: for all aj∈A，parts(aj)＝{fi|＜fi,aj"Easter R } represents fault source ajAll possible fault features, features (f)i)＝{aj|＜fi,aj"Easter R } represents a possibly fault-causing feature fiAll sources of failure. Simultaneous definition of
Figure BDA0001522780570000101
And
Figure BDA0001522780570000102
when in use
Figure BDA0001522780570000103
Then, it is called fault feature set FIIs a characteristic value
Figure BDA0001522780570000104
One covering of (a).
With the minimum criteria, namely: when A is+Is an interpretation that satisfies a minimum rule to determine that each fault in the device corresponds to the least fault source coverage.
Eighth step of maintenance cost analysis and life evaluation
And maintaining the fault, recovering the performance of the equipment, analyzing the maintenance cost of the equipment, and continuing to perform the accelerated life test when the maintenance cost is lower. And determining whether the service life of the equipment is reached or not according to the frequency of the faults and the cost of maintenance and replacement, and further determining the replacement time of the whole machine.
Ninth step, analyzing weak link of equipment and improving reliability
The method comprises the steps of analyzing faults and maintenance and replacement measures of equipment in the accelerated life test process, determining life parts restricting the use of the equipment, and determining the maintenance measures and the replacement time of the life parts of the equipment according to the time when the faults occur and the requirements of equipment guarantee so as to improve the reliability of the equipment.

Claims (1)

1. A command communication equipment reliability evaluation method based on an accelerated life test is characterized by comprising the following specific steps:
first step determination of environmental stress
Determining environmental stress influencing the service life of the equipment by combining the actual service environment of the command communication equipment according to a storage life prolonging theory and an accelerated life test theory; commanding communication equipment to work in complex and various environments, and determining environmental stress influencing service life according to the specific installation position and the surrounding environment of the equipment; the stress is determined by referring to the failure and failure analysis conclusion of similar equipment; environmental stresses in a relatively clean room of the shelter type, which affect the service life of the equipment, include: temperature, humidity, vibration, air pressure and salt spray; working in an exposed environment, and considering increasing the wind and sand stress;
carrying out statistical analysis on the duration and the stress amplitude of different environmental stresses in the storage time and the working time of the equipment to form an actual use profile of the equipment;
second step determination of electrical stress
Electrical stress, comprising: the voltage stress, power and switching pulse are determined by actual measurement values or using conditions of stress reference equipment or determined by reference to the working range requirement of the equipment;
thirdly, determining an environment stress accelerated life model
Dividing the service life of the equipment into a storage life and a working life according to the actual service condition of the equipment; the stresses that affect the shelf life of the device are environmental stresses including: temperature, humidity, air pressure and vibration during transportation; the stress influencing the service life of the equipment is the comprehensive stress of environmental stress and electrical stress;
the temperature stress during the shelf life is expressed by the equation (1) using Arrhenius, a model of Arrhenius:
Figure FDA0002847329410000011
in the formula (1), ε represents lifetime; eaThe activation energy is determined according to the activation energy of main components influencing the service life of the electronic equipment, and is related to materials and has a unit of electron volt eV; k is Boltzmann constant of 8.617 × 10-5eV/K; t is the absolute temperature; Λ is a normal number related to product characteristics, geometry and test mode;
the acceleration factor af (t) is expressed by equation (2):
Figure FDA0002847329410000012
in the formula (2), T0Is the normal working absolute temperature, unit K; t is the absolute temperature of accelerated storage in K;
obtaining corresponding accelerated life time t according to the actual storage time1Expressed by equation (3):
Figure FDA0002847329410000021
in the formula (3), t0Actual working time;
the temperature stress in the standby process is cyclic temperature stress, the high-temperature acceleration time is calculated by adopting an Arrhenius model, and the cyclic times are estimated by adopting a coffee-Manson model, namely
Figure FDA0002847329410000022
In the formula (4), N is the cycle number; delta T is the difference between the upper and lower limit temperatures of the temperature cycle; alpha is the plasticity index of the material, and 1.4-2 is taken; c is a constant;
then the process of the first step is carried out,
Figure FDA0002847329410000023
in the formula (5), N0The number of temperature cycles in actual work is shown; n is a radical of1The number of cycles after temperature acceleration; delta T0Is the actual temperature difference; delta T1The temperature difference used to accelerate the test;
the product can be under the action of vibration stress in the transportation process, and a vibration accelerated life model based on Palmgren-Miner accumulated damage criterion is adopted; namely, it is
Figure FDA0002847329410000024
In the formula (6), t0Is the vibration time; t is t12Is the equivalent acceleration time; s0The vibration amplitude spectrum in the actual use environment; s1Accelerating the vibration amplitude spectrum of the experiment; m is a value related to the slope of the S-N curve of the material;
humidity stress employs an inverse power law accelerated life model, i.e.
ε＝AS-c (7)
In the formula (7), ε represents lifetime; a is a normal number; c is a normal number related to activation energy; s is the stress level;
fourthly, determining an electric stress accelerated life model
Electrical stress, comprising: voltage stress, power and switching pulses;
for the voltage stress, an inverse power rate acceleration life model shown in a formula (7) is adopted, and the voltage range needs to be selected within the normal working range of the equipment;
for power stress, the load of the equipment and the working time proportion under different powers are considered to be determined by combining the actual working condition required by the equipment during use;
the durability of the switch pulse stress examination equipment at the moment of power-on is ensured; performing 1 to 1 simulation examination according to the switching times of actual equipment in use;
fifth step accelerated life test Profile determination
Determining an annual accelerated life test section of the equipment according to the determined environmental stress, electrical stress and corresponding accelerated life models and by combining the annual actual use section of the equipment; in an actual environment, the equipment is subjected to comprehensive application of various stresses, and an accelerated life test section is determined in an accelerated life test section in a mode of comprehensively applying various stresses;
sixth step of device detection
In the accelerated life test process, the detection time of the equipment is as follows: before test, after test neutralization; reasonably arranging detection time, and effectively detecting the state of the equipment in the test process; when the function and performance indexes of the equipment do not meet the requirements, fault analysis is carried out;
seventh step of device failure analysis
Establishing a corresponding relation between a fault feature set and a fault source set by using a conservation coverage set theory for reference, and further finding out a fault source; different fault characteristics correspond to different fault source sets, and the optimal corresponding relation between the fault characteristics and the fault sources is obtained by using a cover-saving set theory for reference; the theoretical analysis process using the conservation coverage set is as follows:
if F represents the possible fault feature set of the equipment and F represents the possible fault feature number, the fault occurrence is 2FA seed probability; each possibility is regarded as a subset F of FI(ii) a When F is presentI＝{f1,f2,…,fnDenotes the failure feature f1,f2,...,fnWhen a failure occurs, and others
Figure FDA0002847329410000047
The failure of (2) does not occur; the problem of multiple fault diagnosis in the equipment is solved in all 2FFinding the most likely combination among the possibilities; searching for the optimal combination by using a symbolic reasoning-saving coverage theory;
the conservation coverage theory is a theory for clarifying the diagnostic expert system by using induced reasoning; it describes the diagnostic problem as a quadruplet P ═ F, A, R, A+Therein, wherein
F＝{f1,f2,...,fnRepresents a finite, non-empty set of fault signatures;
A＝{a1,a2,...,anrepresents a finite, non-empty set of failure sources;
Figure FDA0002847329410000041
representing a subset of ordered relationships defined on F × a;
Figure FDA0002847329410000042
representing a set of known fault sources;
the symbol R represents a direct causal relationship between the fault signature and the fault source, < fi,aj> ∈ R denotes fiMay be formed byjCause it does not mean when fiExist of ajAlways, but only possibly; a. the+Is a special subset of A, representing features known to exist under a particular problem, not A+Is considered to be absent;
furthermore, two functions are defined: for all aj∈A，parts(aj)＝{fi|＜fi,aj"Easter R } represents fault source ajAll possible fault features, features (f)i)＝{aj|＜fi,aj"Easter R } represents a possibly fault-causing feature fiAll sources of failure of (2);simultaneous definition of
Figure FDA0002847329410000043
And
Figure FDA0002847329410000044
when in use
Figure FDA0002847329410000045
Then, it is called fault feature set FIIs a characteristic value
Figure FDA0002847329410000046
One covering of (1);
with the minimum criteria, namely: when A is+Is an interpretation that satisfies a minimum rule, determining that each fault in the device corresponds to the minimum fault source coverage;
eighth step of maintenance cost analysis and life evaluation
Maintaining the fault, recovering the performance of the equipment, analyzing the maintenance cost of the equipment, and continuing to perform an accelerated life test when the maintenance cost is lower; determining whether the service life of the equipment is reached or not according to the frequency of the faults and the cost of maintenance and replacement, and further determining the replacement time of the whole machine;
ninth step, analyzing weak link of equipment and improving reliability
The method comprises the steps of analyzing faults and maintenance and replacement measures of equipment in the accelerated life test process, determining life parts restricting the use of the equipment, and determining the maintenance measures and the replacement time of the life parts of the equipment according to the time when the faults occur and the requirements of equipment guarantee so as to improve the reliability of the equipment.
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