CN108177047B - The processing unit (plant) detection device and processing method of larger size panel strip optical element - Google Patents

The processing unit (plant) detection device and processing method of larger size panel strip optical element Download PDF

Info

Publication number
CN108177047B
CN108177047B CN201711352614.6A CN201711352614A CN108177047B CN 108177047 B CN108177047 B CN 108177047B CN 201711352614 A CN201711352614 A CN 201711352614A CN 108177047 B CN108177047 B CN 108177047B
Authority
CN
China
Prior art keywords
optical element
lath
detection device
strip optical
plant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201711352614.6A
Other languages
Chinese (zh)
Other versions
CN108177047A (en
Inventor
顿爱欢
邵建达
吴福林
徐学科
陈荣
许振其
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Optics and Fine Mechanics of CAS
Original Assignee
Shanghai Institute of Optics and Fine Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Optics and Fine Mechanics of CAS filed Critical Shanghai Institute of Optics and Fine Mechanics of CAS
Priority to CN201711352614.6A priority Critical patent/CN108177047B/en
Publication of CN108177047A publication Critical patent/CN108177047A/en
Application granted granted Critical
Publication of CN108177047B publication Critical patent/CN108177047B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B13/00Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor
    • B24B13/0018Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor for plane optical surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B13/00Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor
    • B24B13/005Blocking means, chucks or the like; Alignment devices
    • B24B13/0055Positioning of lenses; Marking of lenses
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/02Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)

Abstract

A kind of processing unit (plant), detection device and the processing method of larger size panel strip optical element, the device includes that the processing unit (plant) includes assorted cold dishes formula frock clamp, standard single shaft polishing machine and detection device, the detection device includes the components such as vertical interferometer, computer control terminal and adjustable carrying vehicle, the present invention realizes lath-shaped optical element assorted cold dishes formula more than one piece and disposably processes, and realizes the whole disk surface testing of lath-shaped optical element of above-mentioned assorted cold dishes.The invention is suitable for the batch machining and detection of larger size panel strip optical element, has high-efficient, at low cost feature.

Description

The processing unit (plant) detection device and processing method of larger size panel strip optical element
Technical field
The present invention relates to the processing of lath-shaped optical element, especially a kind of processing unit (plant) of larger size panel strip optical element Detection device and processing method.
Background technique
Lath-shaped optical element is in fields such as high power laser system, laser manufacture, increasing material manufacturing, space optics and military affairs More and more extensive application is obtained.Current lath-shaped optical element develops towards big radius-thickness ratio and large scale direction.Currently Lath-shaped optical element face deformation occurs since the influence of self weight is easy to be deformed in process;In addition plus Work mode generally uses monolithic cooked mode, and processing efficiency is extremely low and stability, consistency are poor.
Summary of the invention
The purpose of the present invention is to provide a kind of processing unit (plant) detection device of larger size panel strip optical element and processing Method, he overcomes current lath-shaped optical element, especially heavy caliber lath-shaped optical element monolithic, and processing efficiency is low, processing Process face deformationization is big, can not achieve the defect of mass processing.The present invention utilizes special frock clamp and detection device, real Show lath-shaped optical element assorted cold dishes formula more than one piece disposably to process and whole disk surface testing, high in machining efficiency, processing cost is low, can Realize the mass processing of lath-shaped optical element.
Technical scheme is as follows:
A kind of processing unit (plant) and detection device of larger size panel strip optical element, it is characterized in that the processing unit (plant) includes Assorted cold dishes formula frock clamp and standard single shaft polishing machine;The assorted cold dishes formula frock clamp includes: tightening member, workpiece substrate and upper disk machine Structure;Lath-shaped optical element to be processed is bonded on the workpiece substrate, and the workpiece substrate and the upper disc mechanism are logical Tightening member is crossed to link together;
The detection device includes: standard mirror assembly, for the adjustable carrying of whole plate strip optical element placement to be measured Vehicle, computer control terminal, vertical interferometer, face shape display end and workbench;The standard mirror assembly and the vertical interference Instrument is fixedly connected to be placed in rack from bottom to top and be used cooperatively, and has a through-hole on the work top, successively sets Computer control terminal, rack, face shape display end are set, the vertical interferometer and standard mirror assembly are located at the upper of the through-hole Side, the vertical interferometer and face shape display end are connected with the computer control terminal respectively, and the adjustable carrying vehicle is set Under the work top and it is located at below the vertical interferometer.
Parallel via holes are provided on the workpiece substrate, are grasped convenient for the heat dissipation of lath-shaped optical element process and lower wall Make;The size of workpiece substrate can be adjusted according to the length and width of lath-shaped optical element.
The vertical interferometer is using vertical structure and is furnished with linear guide, can be before and after guide rail is in table plane Side-to-side movement, convenient for measuring the face graphic data of whole plate strip optical element different zones to be measured.
The height of the adjustable carrying vehicle and feeding are adjustable, convenient for detection;It is additionally equipped with idler wheel and retaining mechanism, is convenient for Motion and standstill.
Larger size panel strip optics is processed using the processing unit (plant) and detection device of above-mentioned larger size panel strip optical element The method of element, it is characterized in that this method includes the following steps:
1) workpiece substrate is lain on workbench, the uniform stationing glue special on workpiece substrate;By lath-shaped light Element is uniform, parallel arrangement carries out assorted cold dishes on the workpiece substrate;Whole disk is formed after glue dries, workpiece cement Lath-shaped optical element overturns the whole plate strip optical element, and the upper disc mechanism is fitted in the work The workpiece substrate and upper disc mechanism are fixed together by the bottom of part substrate using tightening member;
2) workpiece for the entire frock clamp that assorted cold dishes are completed is placed on to the polishing of the standard single shaft polishing machine down On disk, the stylus of standard single shaft polishing machine is attached with upper disc mechanism;
3) starting standard single shaft polish electromechanical source, fill polishing fluid, pair assorted cold dishes formula more than one piece lath-shaped optical element (3) into The disposable processing of row;
4) uniaxial machine out of service, by under frock clamp whole disc picking, with deionized water by the whole plate strip optics It after element is rinsed well, is placed on adjustable carrying vehicle, shifts the underface of the vertical interferometer by adjustable carrying vehicle;It opens It moves the computer control terminal and face shape display end and opens surface testing software, adjust the vertical interferometer and standard mirror The pitch angle and distance of component, and the height of whole plate strip optical element to be measured is adjusted, until on the face shape display end It shows clearly face shape interference fringe and records data, complete surface testing;
5) when the surface testing of whole plate strip optical element is unsatisfactory for requiring, then return step 2), when whole plate strip The surface testing of optical element is met the requirements, then is entered in next step
6) by the lath-shaped optical element lower wall.
The invention has the advantages that
1) frock clamp and detection device are utilized, lath-shaped optical element assorted cold dishes formula more than one piece is realized and disposably adds Work and whole disk surface testing, high in machining efficiency, processing cost is low, it can be achieved that the mass of lath-shaped optical element is processed.
2) vertical interferometer of the present invention, which can be realized, all around moves, and can realize face shape dynamic detection.
Detailed description of the invention
Fig. 1 is larger size panel strip optical element of the present invention processing assorted cold dishes formula frock clamp schematic diagram used;
Fig. 2 is larger size panel strip optical element on-line quick detection schematic device;
In Fig. 1: 1- tightening member, 2- workpiece substrate, 3- lath-shaped optical element, the upper disc mechanism of 4-;
In Fig. 2: 5- standard mirror assembly, 6- whole plate strip optical element to be measured, 7- is adjustable carrying vehicle, the control of 8- computer End, the vertical interferometer of 9-, the face 10- shape display end, 11- workbench;
Specific embodiment
Below with reference to embodiment and attached drawing, the invention will be further described, but protection model of the invention should not be limited with this It encloses.
Refering to fig. 1 and Fig. 2, as seen from the figure, the processing unit (plant) and detection device of larger size panel strip optical element of the present invention, The processing unit (plant) includes assorted cold dishes formula frock clamp and standard single shaft polishing machine;The assorted cold dishes formula frock clamp include: tightening member 1, Workpiece substrate 2 and upper disc mechanism 4;Lath-shaped optical element 3 to be processed is bonded on the workpiece substrate 2, the workpiece base Plate 2 is linked together with the upper disc mechanism 4 by tightening member 1;
The detection device includes standard mirror assembly 5, adjustable carrying vehicle 7, computer control terminal 8, vertical interferometer 9, face Shape display end 10 and workbench 11;The standard mirror assembly 5 is fixedly connected with juxtaposition with the vertical interferometer 9 from bottom to top In being used cooperatively in rack, there is a through-hole on 11 face of workbench, set gradually computer control terminal 8, rack, face Shape display end 10, the vertical interferometer 9 and standard mirror assembly 5 are located at the top of the through-hole, the vertical interference Instrument 9 and face shape display end 10 are connected with the computer control terminal 8 respectively, and the adjustable carrying vehicle 7 is placed in the work The lower section of the vertical interferometer 9 under 11 face of platform.
Parallel via holes are provided on the workpiece substrate 2, heat dissipation and lower wall convenient for lath-shaped optical element process Operation;The size of workpiece substrate 2 can be adjusted according to the length and width of lath-shaped optical element.
The vertical interferometer 9 is using vertical structure and is furnished with linear guide, can be before guide rail is in table plane Side-to-side movement afterwards, convenient for measuring the face graphic data of whole 6 different zones of plate strip optical element to be measured.
The height of the adjustable carrying vehicle 7 and feeding are adjustable, convenient for detection;It is additionally equipped with idler wheel and retaining mechanism, just In motion and standstill.
Larger size panel strip optics is processed using the processing unit (plant) and detection device of above-mentioned larger size panel strip optical element The method of element, this method include the following steps:
1) workpiece substrate 2 is lain on workbench, the uniform stationing glue special on workpiece substrate 2;By lath-shaped Optical element 3 is uniform, parallel arrangement carries out assorted cold dishes on the workpiece substrate 2;It is formed after glue dries, workpiece cement One whole plate strip optical element 6 including workpiece substrate 2, the whole plate strip optical element 6 is overturn, will be described Upper disc mechanism 4 be fitted in the bottom of the workpiece substrate 2, using tightening member 1 by the workpiece substrate 2 and upper disk machine Structure 4 is fixed together;
2) workpiece for the entire frock clamp that assorted cold dishes are completed is placed on to the polishing of the standard single shaft polishing machine down On disk, the stylus of standard single shaft polishing machine and upper disc mechanism 4 are attached;
3) starting standard single shaft polish electromechanical source, fill polishing fluid, pair assorted cold dishes formula more than one piece lath-shaped optical element 3 carry out Disposable processing;
4) uniaxial machine out of service, by under frock clamp whole disc picking, with deionized water by the whole plate strip optics After element 6 is rinsed well, be placed on adjustable carrying vehicle 7, shifted by adjustable carrying vehicle 7 the vertical interferometer 9 just under Side;The starting computer control terminal 8 and face shape display end 10 simultaneously open surface testing software, adjust the vertical interferometer 9 and standard mirror assembly 5 pitch angle and distance, and the height of whole plate strip optical element 6 to be measured is adjusted, until the face Clearly face shape interference fringe is shown on shape display end 10 and records data, completes surface testing;
5) when the surface testing of whole plate strip optical element 6 is unsatisfactory for requiring, then return step 2), when whole plate strip The surface testing of optical element 6 is met the requirements, then is entered in next step
6) by the lath-shaped optical element lower wall.
Experiment shows that the present invention overcomes current lath-shaped optical elements, especially heavy caliber lath-shaped optical element list Processing efficiency is low for piece, process face deformationization is big, can not achieve the defect of mass processing.The present invention is according to lath-shaped optics The characteristics of element is processed realizes the assorted cold dishes formula processing of lath-shaped optical element using special frock clamp, every time can be real Existing more than ten piece element simultaneous processings, and the stability and consistency processed are good.In addition, according to above-mentioned assorted cold dishes formula cooked mode, Vertical interference checking device has been invented again, has realized the not disc on-line checking of whole disk workpiece, greatly improves detection effect Rate.
Maximum feature of the invention is to realize the processing of whole disc type and detection of lath-shaped optical element, is greatly improved Processing efficiency reduces processing cost, it can be achieved that the mass of the class component is processed.
Using special frock clamp and detection device, realizes lath-shaped optical element assorted cold dishes formula more than one piece and disposably process High in machining efficiency with whole disk surface testing, processing cost is low, it can be achieved that the mass of lath-shaped optical element is processed.

Claims (5)

1. a kind of processing unit (plant) and detection device of larger size panel strip optical element, it is characterised in that the processing unit (plant) includes spelling Disc type frock clamp and standard single shaft polishing machine;The assorted cold dishes formula frock clamp includes: tightening member (1), workpiece substrate (2) and upper Disc mechanism (4);Lath-shaped optical element (3) to be processed is bonded on the workpiece substrate (2), the workpiece substrate (2) with The upper disc mechanism (4) is linked together by tightening member;
The detection device includes: standard mirror assembly (5), for adjustable the holding of whole plate strip optical element (6) placement to be measured Carrier vehicle (7), computer control terminal (8), vertical interferometer (9), face shape display end (10) and workbench (11);The standard microscope group Part (5) is fixedly connected to be placed in rack from bottom to top and be used cooperatively with the vertical interferometer (9), in the workbench (11) there is a through-hole on face, set gradually computer control terminal (8), rack, face shape display end (10), the vertical interference Instrument (9) and standard mirror assembly (5) are located at the top of the through-hole, the vertical interferometer (9) and face shape display end (10) It is connected respectively with the computer control terminal (8), the adjustable carrying vehicle (7) is placed in described under described workbench (11) face Vertical interferometer (9) below.
2. the processing unit (plant) and detection device of larger size panel strip optical element according to claim 1, it is characterised in that Parallel via holes are provided on the workpiece substrate (2), are operated convenient for the heat dissipation of lath-shaped optical element process and lower wall;Work The size of part substrate (2) can be adjusted according to the length and width of lath-shaped optical element.
3. the processing unit (plant) and detection device of larger size panel strip optical element according to claim 1, it is characterised in that The vertical interferometer (9) is simultaneously furnished with linear guide using vertical structure, can along guide rail in table plane all around Movement, convenient for measuring the face graphic data of whole plate strip optical element (6) different zones to be measured.
4. the processing unit (plant) and detection device of larger size panel strip optical element according to claim 1, it is characterised in that The height of the adjustable carrying vehicle (7) and feeding are adjustable, convenient for detection;It is additionally equipped with idler wheel and retaining mechanism, convenient for movement With it is static.
5. the processing unit (plant) and detection device using the described in any item larger size panel strip optical elements of Claims 1-4 4 add The method of work larger size panel strip optical element, it is characterised in that this method includes the following steps:
1) workpiece substrate (2) is lain on workbench, the uniform stationing glue special on workpiece substrate (2);By lath-shaped Optical element (3) is uniform, parallel arrangement carries out assorted cold dishes on the workpiece substrate (2);After glue dries, workpiece cement Whole plate strip optical element (6) is formed, the whole plate strip optical element (6) is overturn, by the upper disc mechanism (4) it is fitted in the bottom of the workpiece substrate (2), using tightening member (1) by the workpiece substrate (2) and upper disc mechanism (4) it is fixed together;
2) workpiece for the entire frock clamp that assorted cold dishes are completed is placed on down on the polishing disk of the standard single shaft polishing machine, The stylus of standard single shaft polishing machine and upper disc mechanism (4) are attached;
3) starting standard single shaft polish electromechanical source, fill polishing fluid, pair assorted cold dishes formula more than one piece lath-shaped optical element (3) carry out one Secondary property processing;
4) uniaxial machine out of service, by under frock clamp whole disc picking, with deionized water by the whole plate strip optical element (6) it after rinsing well, is placed on adjustable carrying vehicle (7), shifts the vertical interferometer (9) by adjustable carrying vehicle (7) Underface;The starting computer control terminal (8) and face shape display end (10) simultaneously open surface testing software, adjust described erect The pitch angle and distance of formula interferometer (9) and standard mirror assembly (5), and adjust the height of whole plate strip optical element (6) to be measured Degree completes surface testing until showing clearly face shape interference fringe on the face shape display end (10) and recording data;
5) when the surface testing of whole plate strip optical element (6) is unsatisfactory for requiring, then return step 2), when whole plate strip light The surface testing for learning element (6) is met the requirements, then is entered in next step
6) by the lath-shaped optical element lower wall.
CN201711352614.6A 2017-12-15 2017-12-15 The processing unit (plant) detection device and processing method of larger size panel strip optical element Active CN108177047B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711352614.6A CN108177047B (en) 2017-12-15 2017-12-15 The processing unit (plant) detection device and processing method of larger size panel strip optical element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711352614.6A CN108177047B (en) 2017-12-15 2017-12-15 The processing unit (plant) detection device and processing method of larger size panel strip optical element

Publications (2)

Publication Number Publication Date
CN108177047A CN108177047A (en) 2018-06-19
CN108177047B true CN108177047B (en) 2019-10-18

Family

ID=62546203

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711352614.6A Active CN108177047B (en) 2017-12-15 2017-12-15 The processing unit (plant) detection device and processing method of larger size panel strip optical element

Country Status (1)

Country Link
CN (1) CN108177047B (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3905163A (en) * 1974-03-06 1975-09-16 Tropel Lens making method
JPS618269A (en) * 1984-06-22 1986-01-14 Canon Inc Curved-face polishing machine
CN101918176A (en) * 2008-01-10 2010-12-15 株式会社纳米光学能量 Be used to make the manufacture method of grinding attachment, optical element of optical element and the micrometric measurement device that the shape/size of the mould that is used to make optical element or optical element is carried out micrometric measurement
CN102435420A (en) * 2011-09-20 2012-05-02 浙江师范大学 Method for detecting intermediate frequency errors of optical element
CN202271259U (en) * 2011-08-19 2012-06-13 上海中晶企业发展有限公司 High-precision spherical polishing machine
CN203636544U (en) * 2013-12-31 2014-06-11 焦作市巡返特种玻璃厂 Glass edge grinding machine
CN106565105A (en) * 2016-11-04 2017-04-19 中国科学院上海光学精密机械研究所 Full-aperture film-coating clamp for large-dimension optical component

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3905163A (en) * 1974-03-06 1975-09-16 Tropel Lens making method
JPS618269A (en) * 1984-06-22 1986-01-14 Canon Inc Curved-face polishing machine
CN101918176A (en) * 2008-01-10 2010-12-15 株式会社纳米光学能量 Be used to make the manufacture method of grinding attachment, optical element of optical element and the micrometric measurement device that the shape/size of the mould that is used to make optical element or optical element is carried out micrometric measurement
CN202271259U (en) * 2011-08-19 2012-06-13 上海中晶企业发展有限公司 High-precision spherical polishing machine
CN102435420A (en) * 2011-09-20 2012-05-02 浙江师范大学 Method for detecting intermediate frequency errors of optical element
CN203636544U (en) * 2013-12-31 2014-06-11 焦作市巡返特种玻璃厂 Glass edge grinding machine
CN106565105A (en) * 2016-11-04 2017-04-19 中国科学院上海光学精密机械研究所 Full-aperture film-coating clamp for large-dimension optical component

Also Published As

Publication number Publication date
CN108177047A (en) 2018-06-19

Similar Documents

Publication Publication Date Title
US9333547B2 (en) Refitting mechanism
CN109186977B (en) Layered three-degree-of-freedom test bed for single leg of foot type robot
CN107367684A (en) Layout PCBA test devices and method of testing
CN108177037B (en) Large scale muti-piece neodymium glass element lateral processing device detection device and processing method
CN113950650A (en) Adjustment amount estimation device, adjustment amount estimation method, and adjustment amount estimation program
CN108088652A (en) Localization tool, 3D bend glasses detecting system and method
CN108177047B (en) The processing unit (plant) detection device and processing method of larger size panel strip optical element
TWM527961U (en) Two-stage electronic product inspection probe jig module
CN102419157A (en) Micro-depth-dimension automatic image measuring system
CN211305215U (en) Coating thickness detection and bottom laser marking equipment
CN206177368U (en) Cell -phone size comprehensive tester
CN207395688U (en) Localization tool and 3D bend glass detecting systems
CN211135919U (en) Ceramic material laser scribing processing device
CN104502070A (en) Flip LED (light emitting diode) chip on-line detection light receiving testing module
CN206430701U (en) A kind of measurement apparatus of gap offset
CN104502069B (en) A kind of flip LED chips on-line checking receives flash ranging method for testing
CN103969521A (en) Multi-connecting-plate detection bench
CN215727696U (en) High-precision optical transmittance testing mechanism
CN210198327U (en) 2D and 3D measuring device
CN215180394U (en) Wafer test motion platform and probe station comprising same
CN210165929U (en) Measuring machine
CN112797948A (en) Cutter deformation energy measuring device
CN208013936U (en) multi-point touch detection device
CN208189185U (en) A kind of liquid crystal module detection device
CN111678676A (en) Silicon-based OLED probe testing device and testing method thereof

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant