CN108168495A - A kind of determining method of material surface sampling parameter - Google Patents
A kind of determining method of material surface sampling parameter Download PDFInfo
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- CN108168495A CN108168495A CN201810023522.1A CN201810023522A CN108168495A CN 108168495 A CN108168495 A CN 108168495A CN 201810023522 A CN201810023522 A CN 201810023522A CN 108168495 A CN108168495 A CN 108168495A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
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- Theoretical Computer Science (AREA)
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- General Engineering & Computer Science (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
The invention discloses a kind of determining methods of material surface sampling parameter:Its surface is observed after material processing, if material is isotropism homogeneous material, two-dimensional measurement system is selected to determine sampling step length and sampling length, if material is anisotropy heterogeneous material, three-dimension measuring system is selected to determine sampling area and sampling step length；After obtaining the two-dimentional point cloud data on isotropism homogeneous material surface, the minimum sampling length of such material and maximum sampling step length are determined based on MATLAB platforms；After obtaining the three dimensional point cloud on anisotropy heterogeneous material surface, the minimum sampling area of such material and maximum sampling step length are determined based on MATLAB platforms.The present invention effectively determines the sampling parameter of material so that obtained surface topography parameters are undistorted, can not only ensure that sampling precision, while improve sampling efficiency with the topographical information on the reflection surface of accurate quantification.
Description
Technical field
The invention belongs to the fields of measurement that the structural parameters to material surface extract, more specifically, being to be related to one
The determining method of kind material surface sampling parameter.
Background technology
MATLAB is a powerful mathematical software, available for algorithm development, data visualization, data analysis and
Numerical computations.Due to computing capability outstanding MATLAB and data result reliability, it is made to be widely used in huge number
According in system for handling and research field.Realize that corresponding calculating process is it by writing the identifiable kernel scripts of MATLAB
One of most important application means.MATLAB softwares have the high-tech computing environment of programming of interactive, and it is M language
A kind of one visualization form of (identifiable language of MATLAB, kernel are based on C language) program, is compiled using the translation and compiling environment
Calculation procedure can realize Accurate Analysis to data.
Be presently used for the measurement of the structural parameters such as material surface roughness, degree of skewness, kurtosis after processing mainly have it is non-contact
Formula and contact two kinds of measurement types, no matter which kind of measurement type, selection sampling parameter is unavoidably encountered when measuring
Problem.How rational sampling parameter range is determined so that obtained surface topography parameters are undistorted, currently without unified knot
It is to describe sample frequency and be necessary for more than twice of measuring signal frequency just to can guarantee by, existing nyquist sampling theorem
Measure reliable, signal not aliasing.But in surface-interrogating process, it is not aware that the topographical information of processing rear surface early period.How
Sampling parameter is selected under conditions of no any information, takes into account the reliability of measurement efficiency and measurement result.
The standard that there is now is ISO468-1982, it is specified that in certain roughness range, corresponding sampling length and
Evaluation length.But phase before measuring first, in this case it is not apparent that the roughness of material surface can only be estimated；Secondly, to isotropism
When finished surface carries out two-dimentional roughness concentration, it is thus necessary to determine that two parameters of sampling step length and sampling length；And to anisotropy
When finished surface carries out three-dimensional roughness measurement, it is thus necessary to determine that the sampling step length and sampling length of X and Y both directions.For this
A little parameters determine, currently without unified standard, only the self-consciousness of survey crew's subjectivity goes to determine these parameters.
In conclusion the detection for material surface after realization processing, urgent need find a kind of side of determining material sample parameter
Method carries out material surface structural parameters accurate effective extraction.
Invention content
The purpose of the invention is to overcome deficiency of the prior art, the sampling parameter of material surface is determined, ensureing
Under the premise of sampling efficiency and sampling precision, it is proposed that a kind of material surface sampling parameter based on MATLAB platforms and M language
Determining method.
The purpose of the present invention is what is be achieved through the following technical solutions.
A kind of determining method of material surface sampling parameter, includes the following steps:
Step 1 observes its surface after material processing, if material is isotropism homogeneous material, selects two-dimensional measurement system
System determines sampling step length and sampling length, if material is anisotropy heterogeneous material, three-dimension measuring system is selected to determine to adopt
Sample area and sampling step length；
After obtaining the two-dimentional point cloud data on isotropism homogeneous material surface, this is determined based on MATLAB platforms for step 2
The minimum sampling length of class material and maximum sampling step length；
Step 3 after obtaining the three dimensional point cloud on anisotropy heterogeneous material surface, is determined based on MATLAB platforms
The minimum sampling area of such material and maximum sampling step length.
Two-dimensional measurement system determines that the process of sampling step length and sampling length is divided into step 1：
The roughness range of material surface is estimated first, according to ISO468-1982 standards,
If scantling is smaller, (size that measuring surface vertically processes grain direction is less than or equal to estimate roughness range correspondence
Evaluation length), then the entire material surface of sampling length selected as perpendicular to processing grain direction full-size, sampling step length
The attainable minimum value of selected as measuring instrument institute；
If scantling is larger, (size that measuring surface vertically processes grain direction is more than and estimates that roughness range is corresponding to be commented
Estimate length), provide the 1~5 of evaluation length times of sampling length selected as standard, sampling step length selected as measuring instrument can reach
The minimum value arrived.
Three-dimension measuring system determines that the process of sampling area and sampling step length is divided into step 1：
If scantling is smaller (measuring surface length and width dimensions are less than or equal to 5mmx5mm), the entire material of sampling area selected as
Expect surface, the attainable minimum value of sampling step length selected as measuring instrument institute；
If scantling is larger (measuring surface length and width dimensions are more than 5mmx5mm), sampling area selected as includes material table
1~10 times or more of the minimum area of face processing and material itself textural characteristics, sampling step length selected as measuring instrument can reach
The minimum value arrived.
The determination process of minimum sampling length and maximum sampling step length is in step 2：
Control sampling step length first is constant, is gradually reduced sampling length, obtains the surface topography ginseng under different sampling lengths
Number, when sampling length is reduced to certain numerical value, obtained surface topography parameters are inherently beyond the table obtained with full accuracy
The tolerance range of [- 3 σ, 3 σ] centered on the structural parameters of face, at this time selection exceed the last one sampling length before tolerance range
Minimum sampling length as such rapidoprint；
Then it controls minimum sampling length constant, gradually increases sampling step length, obtain the surface shape under different sampling step lengths
Looks parameter, when sampling step length increases to certain numerical value, obtained surface topography parameters can equally exceed to be obtained with full accuracy
Surface topography parameters centered on [- 3 σ, 3 σ] tolerance range, the last one sampling of selection at this time before the tolerance range
Maximum sampling step length of the step-length as such rapidoprint.
The determination process of minimum sampling area and maximum sampling step length is in step 3：
It controls the sampling length of X, Y-direction sampling step length and Y-direction constant first, is gradually reduced the sampling length of X-direction,
Obtain the minimum sampling length in X-direction；Similarly, it controls X, Y-direction sampling step length constant, minimum sampling length is selected in X-direction
Degree, is gradually reduced the sampling length of Y-direction, obtains the minimum sampling length in Y-direction, so as to obtain such rapidoprint most
Small sampling area；
Then it controls the sampling step length of X, the minimum sampling length of Y-direction and Y-direction constant, gradually increases adopting for X-direction
Sample step-length obtains the maximum sampling step length in X-direction；Similarly, X, the minimum sampling length of Y-direction and the maximum of X-direction are controlled
Sampling step length is constant, gradually increases the sampling step length of Y-direction, obtains the maximum sampling step length in Y-direction, add so as to obtain such
The maximum sampling step length in x and y direction of work material.
Compared with prior art, advantageous effect caused by technical scheme of the present invention is：
(1) present invention effectively determines the sampling parameter of material so that obtained surface topography parameters are undistorted, can be with
The topographical information on the reflection surface of accurate quantification.
(2) a large amount of engineering surfaces that the present invention obtains same type of material processing method of the same race, it is only necessary to measure a table
Face, after determining sampling parameter, you can sampling parameter is in use in the measurement of other surfaces, both improves sampling efficiency, simultaneously
In turn ensure measurement accuracy.
Description of the drawings
Fig. 1 is the flow chart of the determining method of material surface sampling parameter of the present invention；
Fig. 2 is stainless steel surface contour shape schematic diagram；
Fig. 3 is that minimum sampling length determines schematic diagram；
Fig. 4 is that maximum sampling step length determines schematic diagram；
Fig. 5 is sampling time comparison diagram.
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.
The determining method of the material surface sampling parameter of the present invention, as shown in Figure 1, including the following steps:
Step 1 observes its surface after material processing, if material is isotropism homogeneous material, selects two-dimensional measurement system
System determines sampling step length and sampling length, if material is anisotropy heterogeneous material, three-dimension measuring system is selected to determine to adopt
Sample area and sampling step length.
Wherein, two-dimensional measurement system determines that the process of sampling step length and sampling length is divided into：
The roughness range of material surface is estimated first, according to ISO468-1982 standards,
If scantling is smaller, (size that measuring surface vertically processes grain direction is less than or equal to estimate roughness range correspondence
Evaluation length), then the entire material surface of sampling length selected as perpendicular to processing grain direction full-size, sampling step length
The attainable minimum value of selected as measuring instrument institute.
If scantling is larger, (size that measuring surface vertically processes grain direction is more than and estimates that roughness range is corresponding to be commented
Estimate length), then the roughness range of material surface is first estimated, according to ISO468-1982 standards, sampling length selected as standard
1~5 times of the evaluation length provided, the attainable minimum value of sampling step length selected as measuring instrument institute.
Wherein, three-dimension measuring system determines that the process of sampling area and sampling step length is divided into：
If scantling is smaller (measuring surface length and width dimensions are less than or equal to 5mmx5mm), the entire material of sampling area selected as
Expect surface, the attainable minimum value of sampling step length selected as measuring instrument institute；
If scantling is larger (measuring surface length and width dimensions are more than 5mmx5mm), sampling area selected as includes as far as possible
1~10 times or more of the minimum area of material surface processing and material itself textural characteristics, sampling step length selected as measuring instrument
The attainable minimum value of institute.
This step 1 process is primarily to obtain material surface sufficiently accurate cloud information and this precision as far as possible
Under corresponding surface topography parameters：Roughness, degree of skewness, kurtosis, but sampling efficiency is relatively low, and the sampling time is longer, in face of engineering
In a large amount of measurement task can not meet measurement demand.
After obtaining the two-dimentional point cloud data on isotropism homogeneous material surface, this is determined based on MATLAB platforms for step 2
The minimum sampling length of class material and maximum sampling step length.
Control sampling step length first is constant, is gradually reduced sampling length, obtains the surface topography ginseng under different sampling lengths
Number, when sampling length is reduced to certain numerical value, obtained surface topography parameters are inherently beyond the table obtained with full accuracy
The tolerance range of [- 3 σ, 3 σ] centered on the structural parameters of face, at this time selection exceed the last one sampling length before tolerance range
Minimum sampling length as such rapidoprint.
Then it controls minimum sampling length constant, gradually increases sampling step length, obtain the surface shape under different sampling step lengths
Looks parameter, when sampling step length increases to certain numerical value, obtained surface topography parameters can equally exceed to be obtained with full accuracy
Surface topography parameters centered on [- 3 σ, 3 σ] tolerance range, the last one sampling of selection at this time before the tolerance range
Maximum sampling step length of the step-length as such rapidoprint.
This defines the sampling parameters of finished surface that such materials'use processing method of the same race obtains in engineering, that is, protect
Measurement accuracy has been demonstrate,proved, and measurement efficiency can be improved.
Step 3 after obtaining the three dimensional point cloud on anisotropy heterogeneous material surface, is determined based on MATLAB platforms
The minimum sampling area of such material and maximum sampling step length.
It controls the sampling length of X, Y-direction sampling step length and Y-direction constant first, is gradually reduced the sampling length of X-direction,
Obtain the minimum sampling length in X-direction；Similarly, it controls X, Y-direction sampling step length constant, minimum sampling length is selected in X-direction
Degree, is gradually reduced the sampling length of Y-direction, obtains the minimum sampling length in Y-direction, so as to obtain such rapidoprint most
Small sampling area.
Then it controls the sampling step length of X, the minimum sampling length of Y-direction and Y-direction constant, gradually increases adopting for X-direction
Sample step-length obtains the maximum sampling step length in X-direction；Similarly, X, the minimum sampling length of Y-direction and the maximum of X-direction are controlled
Sampling step length is constant, gradually increases the sampling step length of Y-direction, obtains the maximum sampling step length in Y-direction, add so as to obtain such
The maximum sampling step length in x and y direction of work material.Three-dimensional measurement is that the extension of two-dimensional measurement method extends, basic principle
It is identical.
Embodiment：
Now by taking the measurement of stainless steel surface after grinding as an example, the realization process of the present invention is illustrated.It is specific real
Existing step is as follows：
(1) surface is observed after material processing, stainless steel is isotropism homogeneous material, and scantling is larger, estimates material
Surface roughness is about within 2 μm, according to ISO468-1982 standards (as shown in table 1), measure and selects sampling length early period as mark
1~5 times of the evaluation length that standard provides --- 10mm.Sampling step length selects measuring instrument NANOVEA non-contact 3-D patterns
0.01 μm of the full accuracy of instrument, sampling time required at this time are 2h 46min 42s.Measurement obtains the contour shape on surface such as
Shown in Fig. 2.
Table 1ISO468-1982 standards roughness table corresponding with sampling length
(2) fixed sample step-length is constant, reduces sampling length, obtains minimum sampling length as 2.4mm, as shown in Figure 3.
(3) fixed minimum sampling length is constant, increases sampling step length, and it is 1 μm to obtain maximum sampling step length, as shown in Figure 4.
(4) with obtained minimum sampling length and maximum sampling step length measurement surface, the required time is 25s, samples effect
Rate about improves 400 times, as shown in Figure 5.
The sampling parameter of stainless steel surface after being ground by more than flow, it is stainless for batch machining in engineering
Steel can obtain the accurate topographical information of material surface, while greatly improve sampling efficiency by more than sampling parameter.The present invention
Isotropic homogeneous material is applicable not only to, while is also applied for the heterogeneous composite material surface of anisotropy and measures.
Although the function and the course of work of the present invention are described above in conjunction with attached drawing, the invention is not limited in
Above-mentioned concrete function and the course of work, above-mentioned specific embodiment is only schematical rather than restricted, ability
The those of ordinary skill in domain is not departing from present inventive concept and scope of the claimed protection situation under the enlightenment of the present invention
Under, many forms can also be made, these are belonged within the protection of the present invention.
Claims (5)
- A kind of 1. determining method of material surface sampling parameter, which is characterized in that include the following steps:Step 1 observes its surface after material processing, if material is isotropism homogeneous material, selects two-dimensional measurement system true Determine sampling step length and sampling length, if material is anisotropy heterogeneous material, three-dimension measuring system is selected to determine sampling face Product and sampling step length；After obtaining the two-dimentional point cloud data on isotropism homogeneous material surface, such material is determined based on MATLAB platforms for step 2 The minimum sampling length of material and maximum sampling step length；After obtaining the three dimensional point cloud on anisotropy heterogeneous material surface, such is determined based on MATLAB platforms for step 3 The minimum sampling area of material and maximum sampling step length.
- 2. the determining method of material surface sampling parameter according to claim 1, which is characterized in that two dimension is surveyed in step 1 Amount system determines that the process of sampling step length and sampling length is divided into：The roughness range of material surface is estimated first, according to ISO468-1982 standards,If scantling is smaller, (size that measuring surface vertically processes grain direction is less than or equal to estimate that roughness range is corresponding to be commented Estimate length), then the entire material surface of sampling length selected as is perpendicular to the full-size of processing grain direction, sampling step length selection For the attainable minimum value of measuring instrument；If scantling is larger, (size that measuring surface vertically processes grain direction is grown more than the corresponding assessment of roughness range is estimated Degree), provide the 1~5 of evaluation length times of sampling length selected as standard, sampling step length selected as measuring instrument institute is attainable Minimum value.
- 3. the determining method of material surface sampling parameter according to claim 1, which is characterized in that three-dimensional in step 1 to survey Amount system determines that the process of sampling area and sampling step length is divided into：If scantling is smaller (measuring surface length and width dimensions are less than or equal to 5mmx5mm), the entire material table of sampling area selected as Face, the attainable minimum value of sampling step length selected as measuring instrument institute；If scantling is larger (measuring surface length and width dimensions are more than 5mmx5mm), sampling area selected as adds comprising material surface 1~10 times or more of the minimum area of work and material itself textural characteristics, sampling step length selected as measuring instrument institute are attainable Minimum value.
- 4. the determining method of material surface sampling parameter according to claim 1, which is characterized in that minimum is adopted in step 2 Sample length and the determination process of maximum sampling step length are：Control sampling step length first is constant, is gradually reduced sampling length, obtains the surface topography parameters under different sampling lengths, when When sampling length is reduced to certain numerical value, obtained surface topography parameters are inherently beyond the surface topography obtained with full accuracy The tolerance range of [- 3 σ, 3 σ] centered on parameter selects the last one sampling length before tolerance range as this at this time The minimum sampling length of class rapidoprint；Then it controls minimum sampling length constant, gradually increases sampling step length, obtain the surface topography ginseng under different sampling step lengths Number, when sampling step length increases to certain numerical value, obtained surface topography parameters can equally exceed the table obtained with full accuracy The tolerance range of [- 3 σ, 3 σ] centered on the structural parameters of face, at this time selection exceed the last one sampling step length before tolerance range Maximum sampling step length as such rapidoprint.
- 5. the determining method of material surface sampling parameter according to claim 1, which is characterized in that minimum is adopted in step 3 Sample area and the determination process of maximum sampling step length are：It controls the sampling length of X, Y-direction sampling step length and Y-direction constant first, is gradually reduced the sampling length of X-direction, obtains Minimum sampling length in X-direction；Similarly, it controls X, Y-direction sampling step length constant, minimum sampling length is selected in X-direction, by The sampling length of decrescence small Y-direction obtains the minimum sampling length in Y-direction, so as to which the minimum for obtaining such rapidoprint is adopted Sample area；Then it controls the sampling step length of X, the minimum sampling length of Y-direction and Y-direction constant, gradually increases the sampling step of X-direction It is long, obtain the maximum sampling step length in X-direction；Similarly, the maximum sampling of X, the minimum sampling length of Y-direction and X-direction is controlled Step-length is constant, gradually increases the sampling step length of Y-direction, obtains the maximum sampling step length in Y-direction, so as to obtain such processing material The maximum sampling step length in x and y direction of material.
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| CN107179101A (en) * | 2017-05-27 | 2017-09-19 | 郑州磨料磨具磨削研究所有限公司 | A kind of detection and the evaluation method of wheel face roughness and abrasive particle distribution |
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2018
- 2018-01-10 CN CN201810023522.1A patent/CN108168495A/en active Pending
Patent Citations (3)
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| CN102592284A (en) * | 2012-02-27 | 2012-07-18 | 上海交通大学 | Method for transforming part surface appearance three-dimensional high-density point cloud data into grayscale image |
| CN103700131A (en) * | 2013-12-01 | 2014-04-02 | 北京航空航天大学 | Method for measuring material difference of three-dimensional image through feature descriptor |
| CN107179101A (en) * | 2017-05-27 | 2017-09-19 | 郑州磨料磨具磨削研究所有限公司 | A kind of detection and the evaluation method of wheel face roughness and abrasive particle distribution |
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