CN108155079A - For the X ray target assembly in scanning electron microscope - Google Patents
For the X ray target assembly in scanning electron microscope Download PDFInfo
- Publication number
- CN108155079A CN108155079A CN201711260936.8A CN201711260936A CN108155079A CN 108155079 A CN108155079 A CN 108155079A CN 201711260936 A CN201711260936 A CN 201711260936A CN 108155079 A CN108155079 A CN 108155079A
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- scanning electron
- electron microscope
- shielding box
- ray
- shielding
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
- G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/16—Vessels; Containers
- H01J37/165—Means associated with the vessel for preventing the generation of or for shielding unwanted radiation, e.g. X-rays
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a kind of X ray target assemblies in scanning electron microscope, it is related to Scanning electron microscopy field, the secondary electron generated after SEM beam bombardment targets can effectively be shielded, solve the problems, such as that the stray light of secondary electron and its induction causes harmful effect to X ray to image quality.The technical solution adopted by the present invention is：For the X ray target assembly in scanning electron microscope, including target and shielding box, target is positioned in shielding box, at least one entrance port and at least one exit portal are set on shielding box, one or more targets are placed in shielding box, each target is correspondingly arranged entrance port and exit portal on shielding box.Scanning electron microscope electron beam is injected by entrance port, the X ray generated after bombardment target is projected from exit portal, the secondary electron that scanning electron microscope beam bombardment target generates effectively is shielded by shielding box, avoids the influence of secondary electron and its stray light of induction to x-ray imaging quality.
Description
Technical field
The present invention relates to Scanning electron microscopy field, specifically a kind of X in scanning electron microscope is penetrated
Line target assembly.
Background technology
Stable nanoscale focus X-ray source, cooperation sample displacement platform, detection can be generated by retouching electron microscope (SEM)
The components such as device can carry out low atomic number material sample high-resolution x-ray imaging and be detected with CT.Dongyang Wu etc.
People 2007 is in composite science and technology《Composites Science and Technology》In the article X- that delivers
ray ultramicroscopy:A new method for observation and measurement of filler
Dispersion in thermoplastic composites disclose a kind of remodeling method of SEM, and this method imaging is differentiated
Rate has been better than 50nm.Compared to other high-resolution x-ray imaging methods, such as by synchronous radiation accelerator or business nanometer is used
Class resolution ratio X ray CT, this method can be realized by carrying out simple transformation to scanning electron microscope, have in the lab
The advantages of simple and practicable, low-cost, in mechanics of biological tissue research, high density integrated circuit detection, inertial confinement fusion target
There is very huge application prospect in the fields such as preparation.
2002, S.C.Mayo of Australia Commonwealth Scientific and Industrial Research Organisation et al. was in microscopy magazine
《Journal of Microscopy》In disclose a kind of SEM improvement and designs, X ray producing method for SEM electron beams directly Hong
Metal targets are hit, detector is direct detection type low-energy X-ray CCD.The design does not bombard generated after target two to SEM
The fluorescence that secondary electronics and secondary electron induce is shielded, although its image resolution ratio is higher, radioscopic image background is made an uproar
Sound is higher, and signal-to-noise ratio is relatively low.
German Brooker company (Bruker) discloses a kind of commercialized Micro-CT products based on SEM, X ray
Producing method also directly bombards metal targets for electron beam, and detector is preposition beryllium window X ray CCD camera.Since CCD camera has
Beryllium window is protected, so, the fluorescence that secondary electron and secondary electron induce is thus completely shielded, and reduces radioscopic image
Background noise.Further, since absorption of the beryllium window to low-energy X-ray, which is difficult to realize to low-density, low atomic number
The high quality imaging of number material sample.
Invention content
The present invention provides a kind of X ray target assembly in scanning electron microscope, can be to SEM beam bombardment targets
The secondary electron generated afterwards is effectively shielded, and solves the stray light of secondary electron and its induction to X ray to image quality
The problem of causing harmful effect.
The technical solution adopted by the present invention to solve the technical problems is：For the x-ray target in scanning electron microscope
Component, including target and shielding box, target is positioned in shielding box, and at least one entrance port and at least one is set on shielding box
Exit portal, and scanning electron microscope electron beam is injected by entrance port, and bombarding the X ray generated after target can penetrate from exit portal
Go out.
It is further：The top surface of the shielding box is openning shape, and the lid of salable shielding box is configured in the top of shielding box
Plate setting through-hole and is used as the entrance port on cover board, and the side of shielding box or bottom surface set the exit portal, and cover board is by one kind
Or a variety of conductors, semi-conducting material are made.
Moreover：The side connection actuator of the cover board, driver can drive cover plate for sealing to shield box top
Opening opens shielding box top opening.
Specifically, the shielding box and cover board are made of one or more kinds of conductors, semi-conducting material.
Specifically, the driver is relay, piezoelectric position moving stage or electricity driving displacement platform.
It is further：Shielding piece is also set up at the exit portal of the shielding box, shielding piece can cover the exit portal.
Specifically, piece is rectangular, round or regular polygon for the shielding, and shielding piece is by one or more kinds of conductors, partly lead
Body material is made.
It is further：One or more targets are placed in the shielding box, each target correspondence on shielding box is set
It is placed in loophole and exit portal.
Specifically, the target is in the combination of cuboid, circular cone, wedge shape, plain film shape or at least aforementioned two kinds of shapes.
Specifically, the shape of the entrance port is square hole, circular hole or bellmouth.
The beneficial effects of the invention are as follows：The secondary electron generated after scanning electron microscope beam bombardment target is by shielding
Box is effectively shielded, and avoids the influence of secondary electron and its stray light of induction to x-ray imaging quality, ensures the clear of imaging
It is clear.
Description of the drawings
Fig. 1 is the structure diagram of first embodiment of the invention.
Fig. 2 is the structure diagram of second embodiment of the invention.
Fig. 3 is the structure diagram of third embodiment of the invention.
Fig. 4 is the structure diagram of fourth embodiment of the invention.
Parts, position and number in figure：Target 1, shielding box 2, cover board 3, exit portal 4, entrance port 5, scanning electron are shown
Micro mirror electron beam incident direction 6, X ray exit direction 7, driver 8, shielding piece 9, actuator movement direction 10, fixed point 11.
Specific embodiment
The invention will be further described with reference to the accompanying drawings and embodiments.
First embodiment
As shown in Figure 1, for the X ray target assembly in scanning electron microscope, including target 1, shielding box 2 and cover board 3,
The top surface of shielding box 2 is openning shape, and cover board 3 is buckled on shielding box 2 and can seal shielding box 2.A target is placed in shielding box 2
Material 1, target 1 is wedge shaped, one circular through hole of setting and is used as the entrance port 5 in other words in triangular prism shape, on cover board 3, screen
One exit portal 4 of setting on the side wall of box 2 is covered, exit portal 4 is a circular window being set in 2 box wall of shielding box.Screen
It covers box 2 and cover board 3 is made of one or more kinds of conductors, semi-conducting material.
Scanning electron microscope electron beam is injected by entrance port 5, and bombarding the X ray generated after target 1 can penetrate from exit portal 4
Go out, scanning electron microscope electron beam incident direction 6 and X ray exit direction 7 are as shown by the arrows in Figure 1.
Second embodiment
As shown in Fig. 2, for the X ray target assembly in scanning electron microscope, including target 1, shielding box 2 and cover board 3,
The top surface of shielding box 2 is openning shape, and cover board 3 is buckled on shielding box 2 and can seal shielding box 2.A target is placed in shielding box 2
Material 1, target 1 is wedge shaped, one circular through hole of setting and is used as the entrance port 5 in other words in triangular prism shape, on cover board 3, screen
One exit portal 4 of setting on the side wall of box 2 is covered, exit portal 4 is the window for a rectangle being set in 2 box wall of shielding box.Screen
The side for covering box 2 corresponds to setting shielding piece 9 at exit portal 4, and shielding piece 9 is rectangular, and can the completely obscured exit portal 4.
Shielding box 2 and cover board 3 are made of one or more kinds of conductors, semi-conducting material.
The side connection actuator 8 of cover board 3, the other end of driver 8 are fixed on fixed point 11, and driver 8 is flexible to be driven
Cover board 3 moves back and forth, and actuator movement direction 10 as denoted by the arrows in fig. 2, is realized 2 top surface opening of closed shield box or opened
2 top surface of shielding box is open.Specifically, driver 8 is relay, piezoelectric position moving stage or electricity driving displacement platform.Scanning electron microscopy
Mirror electron beam is injected by entrance port 5, and bombarding the X ray generated after target 1 can project from exit portal 4, scanning electron microscope electricity
Beamlet incident direction 6 and X ray exit direction 7 are as shown by the arrows in Figure 2.
3rd embodiment
As shown in figure 3, for the X ray target assembly in scanning electron microscope, including target 1, shielding box 2 and cover board 3,
The top surface of shielding box 2 is openning shape, and cover board 3 is buckled on shielding box 2 and can seal shielding box 2.A target is placed in shielding box 2
Material 1, target 1 are in plain film shape, i.e., target 1 is in lamellar.One circular through hole on cover board 3 is set and is used as the entrance port 5, screen
The bottom surface setting exit portal 4 of box 2 is covered, exit portal 4 is the window of rectangle.Shielding box 2 and cover board 3 are led by one or more
Body, semi-conducting material are made.
Scanning electron microscope electron beam is injected by entrance port 5, and bombarding the X ray generated after target 1 can penetrate from exit portal 4
Go out, scanning electron microscope electron beam incident direction 6 and X ray exit direction 7 are as shown by the arrows in Figure 3.
Fourth embodiment
As shown in figure 4, for the X ray target assembly in scanning electron microscope, including target 1, shielding box 2 and cover board 3,
The top surface of shielding box 2 is openning shape, and cover board 3 is buckled on shielding box 2 and can seal shielding box 2.Three circles are set on cover board 3
Through-hole and respectively as entrance port 5, places three targets 1, three targets 1 are respectively disc-shaped, cylinder+circular cone in shielding box 2
Shape, triangular prism shape, three entrance ports 5 correspond respectively to three targets 1.The bottom of shielding box 2 sets a circular window conduct
The exit portal 4 of disc-shaped target 1.The side of shielding box 2 sets exit portal of the window of a rectangle as other two target 1
4.Shielding piece 9 is also set up on the outside of the window of rectangle, shielding piece 9 is rectangular.Shielding box 2 and cover board 3 are led by one or more
Body, semi-conducting material are made.
Three beams scanning electron microscope electron beam is injected by three entrance ports 5, and bombarding after target 1 X ray that generates can be from
Three exit portals 4 project, and scanning electron microscope electron beam incident direction 6 and X ray exit direction 7 are as shown by the arrows in Figure 4.
Claims (10)
1. for the X ray target assembly in scanning electron microscope, it is characterised in that：Including target (1) and shielding box (2), target
Material (1) is positioned in shielding box (2), and at least one entrance port (5) and at least one exit portal (4) are set on shielding box (2), and
And scanning electron microscope electron beam is injected by entrance port (5), the X ray that bombardment target (1) generates afterwards can be penetrated from exit portal (4)
Go out.
2. as described in claim 1 for the X ray target assembly in scanning electron microscope, it is characterised in that：The shielding
The top surface of box (2) is openning shape, and the cover board (3) of salable shielding box (2) is configured in the top of shielding box (2), and cover board is set on (3)
Through-hole is simultaneously used as the entrance port (5), and the side of shielding box (2) or bottom surface set the exit portal (4), and cover board (3) is by one kind
Or a variety of conductors, semi-conducting material are made.
3. as claimed in claim 2 for the X ray target assembly in scanning electron microscope, it is characterised in that：The cover board
(3) side connection actuator (8), driver (8) can drive cover board (3) closed shield box (2) top surface to be open or open shielding
Box (2) top surface is open.
4. as claimed in claim 2 for the X ray target assembly in scanning electron microscope, it is characterised in that：The shielding
Box (2) and cover board (3) are made of one or more kinds of conductors, semi-conducting material.
5. as claimed in claim 3 for the X ray target assembly in scanning electron microscope, it is characterised in that：The transmission
Device (8) is relay, piezoelectric position moving stage or electricity driving displacement platform.
6. the X ray target assembly being used in scanning electron microscope as described in claim 1 to 5 any claim, special
Sign is：Shielding piece (9) is also set up at the exit portal (4) of the shielding box (2), shielding piece (9) can cover the exit portal
(4)。
7. as claimed in claim 6 for the X ray target assembly in scanning electron microscope, it is characterised in that：The shielding
Piece (9) is rectangular, round or regular polygon, and shielding piece (9) is made of one or more kinds of conductors, semi-conducting material.
8. the X ray target assembly being used in scanning electron microscope as described in claim 1 to 5 any claim, special
Sign is：One or more targets (1) are placed in the shielding box (2), each target (1) correspondence on shielding box (2) is set
It is placed in loophole (5) and exit portal (4).
9. as claimed in claim 8 for the X ray target assembly in scanning electron microscope, it is characterised in that：The target
(1) in the combination of cuboid, circular cone, wedge shape, plain film shape or at least aforementioned two kinds of shapes.
10. as claimed in claim 8 for the X ray target assembly in scanning electron microscope, it is characterised in that：The incidence
The shape of mouth (5) is square hole, circular hole or bellmouth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711260936.8A CN108155079B (en) | 2017-12-04 | 2017-12-04 | For the X-ray target assembly in scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711260936.8A CN108155079B (en) | 2017-12-04 | 2017-12-04 | For the X-ray target assembly in scanning electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108155079A true CN108155079A (en) | 2018-06-12 |
| CN108155079B CN108155079B (en) | 2019-07-05 |
Family
ID=62466450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711260936.8A Active CN108155079B (en) | 2017-12-04 | 2017-12-04 | For the X-ray target assembly in scanning electron microscope |
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| Country | Link |
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| CN (1) | CN108155079B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112099226A (en) * | 2020-03-06 | 2020-12-18 | 中国工程物理研究院激光聚变研究中心 | Laser beam guiding method for aiming of silk target |
| CN113764246A (en) * | 2020-06-03 | 2021-12-07 | 聚束科技（北京）有限公司 | Microscope |
| CN113873739A (en) * | 2021-08-20 | 2021-12-31 | 苏州爱索拓普智能科技有限公司 | System based on proton irradiation Ni and preparation method of high-purity Ni target |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5387793A (en) * | 1992-10-15 | 1995-02-07 | Hitachi, Ltd. | Scanning electron microscope |
| CN101545874A (en) * | 2008-03-28 | 2009-09-30 | Fei公司 | Environmental cell for a particle-optical apparatus |
| CN101714491A (en) * | 2004-04-15 | 2010-05-26 | 纳沃技术有限公司 | Apparatus for investigating or modifying a surface with a beam of charged particles |
| WO2012123216A1 (en) * | 2011-03-17 | 2012-09-20 | Carl Zeiss Microscopy Gmbh | X-ray spectroscopy device |
| CN105229772A (en) * | 2013-05-15 | 2016-01-06 | 学校法人冲绳科学技术大学院大学学园 | The LEED of SEM |
-
2017
- 2017-12-04 CN CN201711260936.8A patent/CN108155079B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5387793A (en) * | 1992-10-15 | 1995-02-07 | Hitachi, Ltd. | Scanning electron microscope |
| CN101714491A (en) * | 2004-04-15 | 2010-05-26 | 纳沃技术有限公司 | Apparatus for investigating or modifying a surface with a beam of charged particles |
| CN101545874A (en) * | 2008-03-28 | 2009-09-30 | Fei公司 | Environmental cell for a particle-optical apparatus |
| WO2012123216A1 (en) * | 2011-03-17 | 2012-09-20 | Carl Zeiss Microscopy Gmbh | X-ray spectroscopy device |
| CN105229772A (en) * | 2013-05-15 | 2016-01-06 | 学校法人冲绳科学技术大学院大学学园 | The LEED of SEM |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112099226A (en) * | 2020-03-06 | 2020-12-18 | 中国工程物理研究院激光聚变研究中心 | Laser beam guiding method for aiming of silk target |
| CN112099226B (en) * | 2020-03-06 | 2022-02-08 | 中国工程物理研究院激光聚变研究中心 | Laser beam guiding method for aiming of silk target |
| CN113764246A (en) * | 2020-06-03 | 2021-12-07 | 聚束科技（北京）有限公司 | Microscope |
| CN113873739A (en) * | 2021-08-20 | 2021-12-31 | 苏州爱索拓普智能科技有限公司 | System based on proton irradiation Ni and preparation method of high-purity Ni target |
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| Publication number | Publication date |
|---|---|
| CN108155079B (en) | 2019-07-05 |
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