CN108152689B - High-voltage electrical equipment experiment table and experiment system - Google Patents
High-voltage electrical equipment experiment table and experiment system Download PDFInfo
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- CN108152689B CN108152689B CN201711455111.1A CN201711455111A CN108152689B CN 108152689 B CN108152689 B CN 108152689B CN 201711455111 A CN201711455111 A CN 201711455111A CN 108152689 B CN108152689 B CN 108152689B
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- 238000012360 testing method Methods 0.000 claims abstract description 40
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- 238000005259 measurement Methods 0.000 claims abstract description 24
- 210000001503 joint Anatomy 0.000 claims abstract description 4
- 238000005192 partition Methods 0.000 claims description 22
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- 238000004891 communication Methods 0.000 claims description 9
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention provides a high-voltage electrical equipment experiment table and an experiment system, which relate to the technical field of experiment equipment and comprise an experiment main table and a shared column arranged in the center of the experiment main table; the experiment main table is provided with a plurality of subareas, and each subarea is provided with a test device of high-voltage electrical equipment; the common column is in a hollow form, and the outer wall of the common column is sequentially provided with an annular display layer, a high-voltage wiring layer and a data measuring layer from top to bottom; an external power supply, a plurality of transformers and a plurality of parameter detection devices are arranged in the hollow cavity of the common column; the external power supply is connected with at least one transformer, and each transformer is in butt joint with the high-voltage wiring layer or the low-voltage wiring layer; the multiple parameter detection devices are abutted to the data measurement layer; the high-voltage electrical equipment experiment table and the experiment system provided by the invention have rich functions, so that the experiment is more convenient, and meanwhile, the experiment cost is effectively reduced.
Description
Technical Field
The invention relates to the technical field of experimental equipment, in particular to a high-voltage electrical equipment experiment table and an experiment system.
Background
In the experimental process, in order to test the relevant parameters of the electrical equipment and obtain the performance of the electrical equipment, the relevant personnel often need to test the electrical equipment by using an electrical experiment table. However, most of the existing electrical equipment experiment tables can only test one type of electrical equipment, and the functions are single.
Disclosure of Invention
In view of the above, the present invention aims to provide a high-voltage electrical equipment laboratory table and an experimental system, so as to solve the technical problem that the existing electrical equipment laboratory table can only test one type of electrical equipment and has single function.
In order to achieve the above object, the technical scheme adopted by the embodiment of the invention is as follows:
in a first aspect, an embodiment of the present invention provides a high-voltage electrical apparatus laboratory bench, including: an experiment main table and a shared column arranged in the center of the experiment main table; the experiment main table is provided with a plurality of subareas, and each subarea is provided with a test device of high-voltage electrical equipment; the common column is in a hollow form, and the outer wall of the common column is sequentially provided with an annular display layer, a high-voltage wiring layer and a data measuring layer from top to bottom; an external power supply, a plurality of transformers and a plurality of parameter detection devices are arranged in the hollow cavity of the common column; the external power supply is connected with at least one transformer, and each transformer is in butt joint with the high-voltage wiring layer or the low-voltage wiring layer; the multiple parameter detection devices are abutted to the data measurement layer; the high-voltage wiring layer is provided with a plurality of fixed high-voltage terminals and an adjustable high-voltage terminal, each fixed high-voltage terminal correspondingly outputs a fixed high-voltage value, and the voltage value output by the adjustable high-voltage terminal can be changed within a preset first range; the low-voltage wiring layer is provided with a plurality of fixed low-voltage wiring terminals and an adjustable low-voltage wiring terminal, each fixed low-voltage wiring terminal correspondingly outputs a fixed low-voltage value, and the voltage value output by the adjustable low-voltage wiring terminal can be changed within a preset second range; the data measurement layer is provided with a plurality of data measurement interfaces, each data measurement interface is correspondingly connected with a parameter detection device, and the parameter detection device is used for detecting parameters of the high-voltage electrical equipment through the data measurement interfaces; the annular display layer comprises an annular display screen, and the annular display screen is used for displaying preset experiment prompt information.
Further, the above-described parameter detecting device includes a voltage detecting device, a current detecting device, a power detecting device, or a resistance detecting device.
Further, a man-machine interaction panel is arranged on each partition, and is used for displaying preset information and recording data input by a user.
Further, a central processor is arranged in the hollow cavity of the shared column, and the central processor is connected with the annular display screen and the parameter detection equipment; the parameter detection device is used for sending the detected parameters of the high-voltage electrical equipment to the central processing unit; the central processing unit is used for displaying parameters of the high-voltage electrical equipment on the annular display screen.
Further, an alarm is further arranged on the outer wall of the shared column, the alarm is in communication connection with a central processing unit, and the central processing unit is further used for triggering the alarm to whistle when the abnormality of the parameters of the high-voltage electrical equipment is detected.
Further, the central processing unit is also connected with the wireless communication module and is used for sending the parameters of the high-voltage electrical equipment to the associated terminal.
Further, the annular display screen is formed by connecting a plurality of curved screens in a ring mode; the number of curved screens corresponds to the number of partitions.
Further, a partition plate is arranged between the two adjacent partitions.
Further, the experiment main table and the shared column are both made of insulating materials.
In a second aspect, an embodiment of the present invention further provides a high-voltage electrical equipment experiment system, including any one of the high-voltage electrical equipment experiment tables provided in the first aspect, and further including electrical equipment corresponding to a partition of the high-voltage electrical equipment experiment table.
The embodiment of the invention provides a high-voltage electrical equipment experiment table and an experiment system, comprising an experiment main table and a shared column arranged in the center of the experiment main table; the experiment main table is provided with a plurality of subareas, and each subarea is provided with a test device of one high-voltage electric device so as to facilitate an experimenter to test various high-voltage electric devices by utilizing different subareas of the experiment main table; the outer wall of the common column is sequentially provided with an annular display layer, a high-voltage wiring layer and a data measuring layer from top to bottom, and the common column can be used in the testing process of different high-voltage electrical equipment, so that the cost is saved well; the annular display layer can display preset experiment prompt information, so that experimenters can be effectively guided to take normal and reasonable operation, and further reliability of experimental results is improved; the high-voltage wiring layer is provided with a plurality of fixed high-voltage wiring terminals and an adjustable high-voltage wiring terminal, so that a plurality of required high-voltage values can be conveniently output in the test process of the high-voltage electrical equipment, the low-voltage wiring layer is provided with a plurality of fixed low-voltage wiring terminals and an adjustable low-voltage wiring terminal, so that a plurality of required low-voltage values can be conveniently output in the test process of the low-voltage electrical equipment, and the high-voltage wiring layer and the low-voltage wiring layer can better meet the voltage requirements required by the high-voltage electrical equipment in the test process; the data measurement layer is provided with a plurality of data measurement interfaces, and each data measurement interface is correspondingly connected with one parameter detection device, so that a larger convenient condition is provided for parameter detection of the high-voltage electrical equipment. Compared with the single function of the high-voltage electrical equipment experiment table in the prior art, the high-voltage electrical equipment experiment table and the experiment system provided by the embodiment can test various high-voltage electrical equipment and are rich in functions; and the test of multiple high-voltage electrical equipment can use the common post simultaneously, and this common post can have information suggestion, provide functions such as multiple voltage value and parameter detection, makes the experiment more convenient, because multiple high-voltage electrical equipment need not to dispose respectively moreover, use jointly a common post can, also effectively reduced the experiment cost.
Additional features and advantages of the disclosure will be set forth in the description which follows, or in part will be obvious from the description, or may be learned by practice of the techniques of the disclosure.
In order to make the above objects, features and advantages of the present invention more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
Fig. 1 is a front view showing the structure of a high-voltage electrical apparatus laboratory bench provided by an embodiment of the present invention;
fig. 2 is a top view showing a structure of a high-voltage electrical apparatus laboratory bench according to an embodiment of the present invention;
fig. 3 is a front view showing the structure of another high-voltage electric device experiment table provided by the embodiment of the invention;
fig. 4 shows a schematic circuit structure of a high-voltage electrical equipment laboratory bench according to an embodiment of the present invention.
Icon:
1-a central processing unit; 2-a ring display screen; 3-parameter detection means; 4-an alarm;
a 5-wireless communication module; 10-a common column; 11-a ring-shaped display layer; 12-a high voltage wiring layer;
13-a low voltage wiring layer; 14-a data measurement layer; 20-an experiment main stage; 21-partitioning;
21 a-human-computer interaction panel.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Considering that in the prior art, most of electric equipment experiment tables can only test one electric equipment, the function is single, if multiple electric equipment needs to be tested, the cost is high, and in order to solve the problem, the high-voltage electric equipment experiment table and the experiment system provided by the embodiment of the invention can be applied to the occasion of testing the high-voltage electric equipment, and the embodiment of the invention is described in detail below.
Embodiment one:
referring to a front view of a structure of a high-voltage electric device experiment table shown in fig. 1, and a top view of a structure of a high-voltage electric device experiment table shown in fig. 2, comprising: an experiment table 20 and a common column 10 provided at the center of the experiment table;
experiment table 20 is provided with a plurality of partitions 21, each partition 21 being configured with a test device (not shown in fig. 1) of a high-voltage electrical apparatus; the high-voltage electrical equipment can be a high-voltage transformer, a high-voltage fuse, a high-voltage transformer, a high-voltage isolating switch, a high-voltage capacitor, a motor and the like, and a certain partition is taken as a test transformer for illustration, and the test device configured in the partition can be used for testing the short-circuit impedance, the load loss, the transformer transformation ratio test, the wiring group test, the oil voltage withstand test, the alternating current voltage withstand test and the like of the transformer. The testing device for each high-voltage electrical apparatus may be implemented by using a related technology, which is not described herein. In addition, each partition is correspondingly provided with a device storage cabinet and the like, and can be used for storing test devices.
The common column 10 is hollow, and as can be seen from fig. 1, an annular display layer 11, a high-voltage wiring layer 12, a low-voltage wiring layer 13 and a data measurement layer 14 are sequentially arranged on the outer wall of the common column from top to bottom; an external power supply, a plurality of transformers and a plurality of parameter detection devices are arranged in the hollow cavity of the common column; the external power supply is connected with at least one transformer, and each transformer is in butt joint with the high-voltage wiring layer or the low-voltage wiring layer; the multiple parameter detection devices are abutted to the data measurement layer; the equipment within the hollow cavity of the common column is not shown in fig. 1. In practical applications, the parameter detecting device may include a voltage detecting device, a current detecting device, a power detecting device, a resistance detecting device, or the like. The mode of arranging the external power supply, the transformers and the multiple parameter detection devices in the hollow cavity of the shared column can enable the overall structure of the high-voltage electrical equipment experiment table to be simpler, avoid the disorder of the conventional experiment table, and the shared column of the annular display layer, the high-voltage wiring layer, the low-voltage wiring layer and the data measurement layer is sequentially arranged from top to bottom, so that convenience is provided for common experimental operation (such as various voltage values and conventional parameter tests needed in electrical equipment testing) of various high-voltage electrical equipment in the experimental process, the multiple high-voltage electrical equipment can be shared, the cost is effectively saved, and the space can be fully saved due to the fact that the functions are concentrated in the shared column.
The high voltage wiring layer 12 is provided with a plurality of fixed high voltage wiring terminals each outputting a fixed high voltage value and an adjustable high voltage wiring terminal, the voltage value outputted by the adjustable high voltage wiring terminal being changeable within a preset first range. One end of each fixed high-voltage wiring terminal and one end of each adjustable high-voltage wiring terminal are connected with an external power supply or a transformer on the inner side of the common column, and the other end of each fixed high-voltage wiring terminal and the other end of each adjustable high-voltage wiring terminal are arranged outside the common column and are used for being connected with high-voltage electric equipment to be tested, so that high-voltage values are provided for the high-voltage electric equipment.
The low voltage wiring layer 13 is provided with a plurality of fixed low voltage wiring terminals each outputting a fixed low voltage value and an adjustable low voltage wiring terminal, the voltage value outputted from the adjustable low voltage wiring terminal being changeable within a preset second range. One end of each fixed low-voltage wiring terminal and one end of each adjustable low-voltage wiring terminal are connected with an external power supply or a transformer on the inner side of the common column, and the other end of each fixed low-voltage wiring terminal and one end of each adjustable low-voltage wiring terminal are arranged outside the common column and are used for being connected with low-voltage electric equipment to be tested, so that a low-voltage value is provided for the low-voltage electric equipment.
The data measurement layer 14 is provided with a plurality of data measurement interfaces, each data measurement interface is correspondingly connected with a parameter detection device, and the parameter detection device is used for detecting parameters of the high-voltage electrical equipment through the data measurement interfaces; the parameter detecting device may include a voltage detecting device, a current detecting device, a power detecting device, a resistance detecting device, or the like. The data measurement interface is mainly used for connecting the parameter detection device and the high-voltage electrical device so that the parameter detection device can detect corresponding parameters of the high-voltage electrical device. The data measurement interface is also provided with a parameter display screen for displaying corresponding parameters. The parameter display screen can be arranged independently, and can also be embedded on a common column for the display screen of the parameter detection equipment.
The annular display layer 11 comprises an annular display screen, and the annular display screen is used for displaying preset experiment prompt information. In the conventional experimental operation, an experimenter needs to review an experimental course, an electrical equipment experimental procedure, a state maintenance procedure and the like, and various notes and experimental sequence steps may also need to be inscribed in the experimental process, so that the experimental process is very complicated. The annular display screen can directly display preset experiment prompt information, and can guide experimenters to conduct experiments according to specifications more conveniently. The display mode of the experiment prompt information can be set by an experimenter, such as rolling display, or timing replacement of content. The annular display screen may be provided with a communication interface, such as a bluetooth module, a USB module, etc., so that the experimenter transmits experimental prompt information to the annular display screen.
The high-voltage electrical equipment experiment table and the experiment system provided by the embodiment of the invention comprise an experiment main table and a shared column arranged in the center of the experiment main table; the experiment main table is provided with a plurality of subareas, and each subarea is provided with a test device of one high-voltage electric device so as to facilitate an experimenter to test various high-voltage electric devices by utilizing different subareas of the experiment main table; the outer wall of the common column is sequentially provided with an annular display layer, a high-voltage wiring layer and a data measuring layer from top to bottom, and the common column can be used in the testing process of different high-voltage electrical equipment, so that the cost is saved well; the annular display layer can display preset experiment prompt information, so that experimenters can be effectively guided to take normal and reasonable operation, and further reliability of experimental results is improved; the high-voltage wiring layer is provided with a plurality of fixed high-voltage wiring terminals and an adjustable high-voltage wiring terminal, so that a plurality of required high-voltage values can be conveniently output in the test process of the high-voltage electrical equipment, the low-voltage wiring layer is provided with a plurality of fixed low-voltage wiring terminals and an adjustable low-voltage wiring terminal, so that a plurality of required low-voltage values can be conveniently output in the test process of the low-voltage electrical equipment, and the high-voltage wiring layer and the low-voltage wiring layer can better meet the voltage requirements required by the high-voltage electrical equipment in the test process; the data measurement layer is provided with a plurality of data measurement interfaces, and each data measurement interface is correspondingly connected with one parameter detection device, so that a larger convenient condition is provided for parameter detection of the high-voltage electrical equipment. Compared with the single function of the high-voltage electrical equipment experiment table in the prior art, the high-voltage electrical equipment experiment table and the experiment system provided by the embodiment can test various high-voltage electrical equipment and are rich in functions; and the test of multiple high-voltage electrical equipment can use the common post simultaneously, and this common post can have information suggestion, provide functions such as multiple voltage value and parameter detection, makes the experiment more convenient, because multiple high-voltage electrical equipment need not to dispose respectively moreover, use jointly a common post can, also effectively reduced the experiment cost.
Further, in order to facilitate the experimenter to record data, or view experimental information during the experimental process, referring to the front view of the structure of another high-voltage electrical apparatus experiment table shown in fig. 3, on the basis of fig. 1, a man-machine interaction panel 21a is further illustrated on each partition 21, for displaying preset information, and further for recording data input by a user. The human-computer interaction panel can be a touch screen, and an experimenter can record information through the human-computer interaction panel and can also view preset information displayed on the human-computer interaction panel, such as experiment notes, time and the like.
Referring to a schematic circuit diagram of a high-voltage electrical equipment laboratory bench shown in fig. 4, a central processing unit 1 is shown, the central processing unit 1 is arranged in a hollow cavity of a common column, and the central processing unit 1 is connected with an annular display screen 2 and parameter detection equipment 3; the parameter detection device 3 is used for sending the detected parameters of the high-voltage electrical equipment to the central processing unit 1; the central processor 1 is used for displaying parameters of the high-voltage electrical equipment on the annular display screen 2.
Through the mode, the annular display screen can also directly display parameters of high-voltage electrical equipment, so that an experimenter can check conveniently, the trouble that the experimenter still needs to record paper in the experimental process is reduced, the experimental efficiency is better improved, the problems of recording errors and the like possibly occurring during the paper recording of the experimenter are also avoided, and the reliability of experimental data recording can be improved.
In order to timely remind experimenters of attention when the experiment is abnormal, an alarm can be further arranged on the outer wall of the common column, in fig. 3, the alarm 4 is further shown to be in communication connection with the central processing unit 1, and the central processing unit 1 is further used for triggering the alarm 4 to whistle when the parameter abnormality of the high-voltage electrical equipment is monitored. By the method, experimenters can find out abnormality and check reasons in time, countermeasures are taken at the first time, and experimental safety is improved. The central processor may be provided with parameter thresholds for each high voltage electrical device, and if the parameters of the high voltage electrical devices are not within the corresponding parameter thresholds, an alarm may be triggered.
Further, fig. 3 also illustrates that the central processing unit 1 is further connected to a wireless communication module 5 for transmitting parameters of the high voltage electrical equipment to the associated terminal. The associated terminal can be a preset terminal such as a computer and a mobile phone, parameters of the high-voltage electrical equipment obtained in the experimental process can be sent to the terminal for storage, experimenters are not required to record and sort data in a tedious way, and related personnel on the associated terminal side can clearly know experimental conditions, so that the method is very convenient.
The cpu may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in a processor or by instructions in the form of software. The central processing unit may be implemented using a digital signal processor (Digital Signal Processing, DSP for short), application specific integrated circuit (Application Specific Integrated Circuit, ASIC for short), off-the-shelf programmable gate array (Field-Programmable Gate Array, FPGA for short), or other programmable logic device, discrete gate or transistor logic device, discrete hardware components. Of course, the central processor may be a microprocessor or any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present invention may be embodied directly in the execution of a hardware decoding processor, or in the execution of a combination of hardware and software modules in a decoding processor. The central processing unit may be configured with a storage medium, which may be a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc., as is well known in the art. The central processing unit can read the information in the storage medium, combine the hardware to complete the steps of the method, and can store the received parameters of the high-voltage electrical equipment in the storage medium.
In practical application, the annular display screen can be formed by connecting a plurality of curved screens in a ring mode; the number of curved screens corresponds to the number of partitions. For example, the high-voltage electrical equipment experiment table is divided into 4 partitions, and then the annular display screen can be formed by splicing 4 curved screens, wherein each curved screen corresponds to one partition, can be used for displaying parameters of the high-voltage electrical equipment corresponding to the partition, and displays experiment prompt information of the high-voltage electrical equipment corresponding to the partition.
In practical application, can be provided with the baffle between two adjacent subregions to make each subregion comparatively independent, the experimenter that carries out high-voltage electrical equipment experimental test at each subregion can not interfere with each other, can effectively reduce the influence degree of adjacent subregion in the testing process to experimental facilities through the baffle, highly can set up in a flexible way according to actual conditions, and the description is omitted here.
In order to ensure the safety of experiments, the experiment main table and the common column are both made of insulating materials.
Embodiment two:
for the high-voltage electrical equipment experiment table provided in the first embodiment, the embodiment of the invention provides a high-voltage electrical equipment experiment system, which comprises the high-voltage electrical equipment experiment table provided in the previous embodiment, and further comprises electrical equipment corresponding to the subareas of the high-voltage electrical equipment experiment table, in particular high-voltage electrical equipment. The high-voltage electrical equipment test stand can flexibly set the number of the partitions according to the electrical equipment to be tested, and the details are not repeated here.
It will be clear to those skilled in the art that, for convenience and brevity of description, the specific working process of the system described above may refer to the corresponding process in the foregoing embodiment, which is not described in detail herein.
In addition, in the description of embodiments of the present invention, unless explicitly stated and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Finally, it should be noted that: the above examples are only specific embodiments of the present invention, and are not intended to limit the scope of the present invention, but it should be understood by those skilled in the art that the present invention is not limited thereto, and that the present invention is described in detail with reference to the foregoing examples: any person skilled in the art may modify or easily conceive of the technical solution described in the foregoing embodiments, or perform equivalent substitution of some of the technical features, while remaining within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention, and are intended to be included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A high voltage electrical apparatus bench, comprising: an experiment main table and a shared column arranged in the center of the experiment main table;
the experiment main table is provided with a plurality of subareas, and each subarea is provided with a test device of high-voltage electric equipment;
the common column is in a hollow form, and an annular display layer, a high-voltage wiring layer, a low-voltage wiring layer and a data measurement layer are sequentially arranged on the outer wall of the common column from top to bottom; an external power supply, a plurality of transformers and a plurality of parameter detection devices are arranged in the hollow cavity of the common column; the external power supply is connected with at least one transformer, and each transformer is in butt joint with the high-voltage wiring layer or the low-voltage wiring layer; the plurality of parameter detection devices are abutted to the data measurement layer;
the high-voltage wiring layer is provided with a plurality of fixed high-voltage wiring terminals and an adjustable high-voltage wiring terminal, each fixed high-voltage wiring terminal correspondingly outputs a fixed high-voltage value, and the voltage value output by the adjustable high-voltage wiring terminal can be changed within a preset first range;
the low-voltage wiring layer is provided with a plurality of fixed low-voltage terminals and an adjustable low-voltage terminal, each fixed low-voltage terminal correspondingly outputs a fixed low-voltage value, and the voltage value output by the adjustable low-voltage terminal can be changed within a preset second range;
the data measuring layer is provided with a plurality of data measuring interfaces, each data measuring interface is correspondingly connected with a parameter detecting device, and the parameter detecting device is used for detecting parameters of the high-voltage electrical equipment through the data measuring interfaces;
the annular display layer comprises an annular display screen, and the annular display screen is used for displaying preset experiment prompt information.
2. The laboratory bench according to claim 1, wherein said parameter detection device comprises a voltage detection device, a current detection device, a power detection device or a resistance detection device.
3. The laboratory bench according to claim 1, wherein each of the partitions is provided with a human-computer interaction panel for displaying preset information and recording data input by a user.
4. The laboratory bench according to claim 1, wherein a central processor is arranged in the hollow cavity of the common column, and the central processor is connected with the annular display screen and the parameter detection device;
the parameter detection device is used for sending the detected parameters of the high-voltage electrical equipment to the central processing unit;
the central processing unit is used for displaying parameters of the high-voltage electrical equipment on the annular display screen.
5. The laboratory bench of claim 4, wherein an alarm is further provided on an outer wall of the common column, the alarm being in communication with the central processor, the central processor being further configured to trigger the alarm to sound a whistle when an abnormality in a parameter of the high voltage electrical apparatus is detected.
6. The laboratory bench according to claim 4, wherein said central processor is further connected to a wireless communication module for transmitting parameters of said high voltage electrical equipment to an associated terminal.
7. The laboratory bench of claim 1 wherein said annular display screen is formed of a plurality of curved screens in a looped relationship; the number of curved screens corresponds to the number of partitions.
8. A laboratory bench according to claim 1, characterized in that a partition is arranged between two adjacent partitions.
9. The laboratory bench according to any of claims 1 to 8, wherein the laboratory bench and the common column are both of an insulating material.
10. A high voltage electrical equipment experiment system comprising the high voltage electrical equipment experiment table of any one of claims 1 to 9, and further comprising electrical equipment corresponding to a partition of the high voltage electrical equipment experiment table.
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| CN201711455111.1A CN108152689B (en) | 2017-12-27 | 2017-12-27 | High-voltage electrical equipment experiment table and experiment system |
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| CN201711455111.1A CN108152689B (en) | 2017-12-27 | 2017-12-27 | High-voltage electrical equipment experiment table and experiment system |
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| CN108152689B true CN108152689B (en) | 2024-03-08 |
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| CN112540262A (en) * | 2020-11-18 | 2021-03-23 | 广西电网有限责任公司电力科学研究院 | Voltage time type feeder automation test system and test method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100904528B1 (en) * | 2008-07-09 | 2009-06-25 | 주식회사 대양일렉콤 | Withstanding voltage tester for extra high voltage device |
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| US9829522B2 (en) * | 2015-01-27 | 2017-11-28 | Qualcomm Incorporated | Method and apparatus for tuning a resistance and reactance of a wireless power transmitter testing unit |
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