CN108089567A - A kind of semiconductor dry and wet contact fault diagnosis circuit and diagnostic method - Google Patents
A kind of semiconductor dry and wet contact fault diagnosis circuit and diagnostic method Download PDFInfo
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- CN108089567A CN108089567A CN201711310024.7A CN201711310024A CN108089567A CN 108089567 A CN108089567 A CN 108089567A CN 201711310024 A CN201711310024 A CN 201711310024A CN 108089567 A CN108089567 A CN 108089567A
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- switch pipe
- semiconductor switch
- wet contact
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
Abstract
The invention discloses a kind of semiconductor dry and wet contact fault diagnosis circuits, including semiconductor switch pipe U2_1, dry and wet contact Q1_1, semiconductor switch pipe U3_1, the input terminal of the semiconductor switch pipe U2_1 is used to receive drive signal, the conducting and closing of the output terminal control dry and wet contact Q1_1 of the semiconductor switch pipe U2_1, the output terminal output feedback signal of input terminal connection dry and wet the contact Q1_1, the semiconductor switch pipe U3_1 of the semiconductor switch pipe U3_1；When dry and wet contact Q1_1 is turned on, the output terminal output effective Feedback signal of semiconductor switch pipe U3_1, when dry and wet contact Q1_1 is turned off, the output terminal of semiconductor switch pipe U3_1 exports invalid feedback signal.Dry and wet contact determination methods of the present invention are simple, and control chip judges whether the dry contact is normal by comparing the state of drive signal and feedback signal, if drive signal and feedback signal have or simultaneously simultaneously without can determine whether that the dry contact is normal；If drive signal and feedback signal effective status are inconsistent, stem grafting point failure can determine whether.
Description
Technical field
The present invention relates to rail transportation vehicle-mounted apparatus logic control fields, and in particular to a kind of semiconductor dry and wet contact failure
Diagnostic circuit and diagnostic method.
Background technology
Conventional dry wet contact generally use electromagnetic relay, but with the raising of reliability requirement, such as concerning personal safety
Rail transportation vehicle-mounted control device on, the defects of relay inherent failure rate is high, cannot meet the needs of high reliability,
New high-tech enterprise starts to replace traditional electromagnetic relay scheme using logic semiconductor control unit (LCU) one after another.
In existing LCU systems, output and input and all replace traditional time with reliability semiconductor devices with the obvious advantage
Relay and intermediate relay after input circuit inputs 110V progress Phototube Coupling sampling, are sent into control chip and are handled,
Drive signal is provided to the passage opened of needs, after Phototube Coupling, the pipe conducting of driving semiconductor switch, while by conducting state
Isolation feeds back to control chip and carries out fault self-diagnosis, and LCU systems have high and low voltage isolation, and fault diagnosis early warning is comprehensive in real time
The characteristics of covering, I/O channel flexibly configurable correspondence.
But the detection of the dry contact and wet contact in existing LCU systems can only separate detection, detect in the prior art wet
The voltage (+110V) that contact has to rely on wet contact front end could realize output feedback, and for dry contact, since front end can
Can be there is no voltage, therefore can not effectively borrow the detection circuit of wet contact；The failure of semiconductor dry contact is directed in the prior art
Diagnosis effective solution not yet, general compromise but this are set using the method for switching tube front end feedback
The defects of meter, which is to be diagnosed to be, drives front end failure, and for the failure that switching tube occurs in itself, such as breakdown, Wu Fajin
Row efficient diagnosis.
The content of the invention
The technical problems to be solved by the invention are the prior arts can only separate detection for dry and wet contact, it is therefore intended that carries
For a kind of semiconductor dry and wet contact fault diagnosis circuit and diagnostic method, can detect dry contact can also detect wet contact.
The present invention is achieved through the following technical solutions：
A kind of semiconductor dry and wet contact fault diagnosis circuit including semiconductor switch pipe U2_1, dry and wet contact Q1_1, is partly led
The input terminal of body switching tube U3_1, the semiconductor switch pipe U2_1 are used to receive drive signal, the semiconductor switch pipe U2_
The conducting and closing of 1 output terminal control dry and wet contact Q1_1, the input terminal connection dry and wet of the semiconductor switch pipe U3_1 connect
The output terminal output feedback signal of point Q1_1, the semiconductor switch pipe U3_1；When dry and wet contact Q1_1 is turned on, semiconductor is opened
Close the output terminal output effective Feedback signal of pipe U3_1, when dry and wet contact Q1_1 is turned off, the output of semiconductor switch pipe U3_1
End exports invalid feedback signal.
Further, semiconductor switch pipe U2_1 use optocoupler, the dry and wet contact Q1_1 using metal-oxide-semiconductor, IGBT and
One kind in thyristor, the semiconductor switch pipe U3_1 use optocoupler.
Further, a kind of semiconductor dry and wet contact fault diagnosis circuit further includes dry and wet contact driving chip U1_1, institute
The input terminal for stating semiconductor switch pipe U2_1 receives drive signal, and drive signal passes through the opto-electronic conversion of semiconductor switch pipe U2_1
Driving electric signal transmission to dry and wet contact driving chip U1_1, dry and wet contact driving chip U1_1 is connected to dry and wet contact Q1_1
Control terminal, dry and wet contact driving chip U1_1 driving dry and wet contact Q1_1 conductings；The light-emitting diodes of semiconductor switch pipe U3_1
The anode of pipe is connected same driving power, the light emitting diode of semiconductor switch pipe U3_1 with dry and wet contact driving chip U1_1
Cathode connection dry and wet contact Q1_1 input terminal；Semiconductor switch pipe U3_1 is used for the state transition of dry and wet contact Q1_1
Feedback signal is exported to control chip.
Further, diode is also connected in turn on the circuit being connected in driving power with semiconductor switch pipe U3_1
D2_1, resistance R4_1, the anode connection driving power of diode D2_1, the cathode connection resistance R4_1 of diode D2_1, resistance
The anode of the light emitting diode of the other end connection semiconductor switch pipe U3_1 at R4_1 connection diode D2_1 ends.
Using a kind of diagnostic method of any semiconductor dry and wet contact fault diagnosis circuit of Claims 1-4, when
When the drive signal of semiconductor switch pipe U2_1 is effectively and the feedback signal of semiconductor switch pipe U3_1 is effective, dry and wet contact
Q1_1 states are normal；When the drive signal of semiconductor switch pipe U2_1 is invalid and the feedback signal of semiconductor switch pipe U3_1 without
During effect, dry and wet contact Q1_1 states are normal；When the drive signal of semiconductor switch pipe U2_1 is effective and semiconductor switch pipe U3_
When 1 feedback signal is invalid, dry and wet contact Q1_1 status faults；When the drive signal of semiconductor switch pipe U2_1 is invalid and half
When the feedback signal of conductor switching tube U3_1 is effective, dry and wet contact Q1_1 status faults.
Compared with prior art, the present invention it has the following advantages and advantages：
1st, the present invention carries out dry and wet contact independent fault self-diagnosis, most directly using dry and wet contact itself as return flow path
The fault condition of the feedback dry and wet contact connect；
2nd, dry and wet contact determination methods of the present invention are simple, and control chip is by comparing the shape of drive signal and feedback signal
State judges whether the dry contact is normal, if drive signal and feedback signal have or simultaneously simultaneously without can determine whether the dry contact just
Often；If drive signal and feedback signal effective status are inconsistent, stem grafting point failure can determine whether；
3rd, the present invention only needs this dry and wet contact itself, without with providing external inquiry voltage, inquiry power supply or other are any
Boost voltage or ground can be most succinct realization fault self-diagnosis；
4th, the present invention has the characteristics that simple in structure, reliable operation, economical and practical.
Description of the drawings
Attached drawing described herein is used for providing further understanding the embodiment of the present invention, forms one of the application
Point, do not form the restriction to the embodiment of the present invention.In the accompanying drawings：
Fig. 1 is schematic structural view of the invention；
Fig. 2 is the structure diagram of LCU system I/O channels；
Fig. 3 is the diagnosis scheme of semiconductor wet contact in the prior art；
Fig. 4 is the diagnosis scheme of dry contact in the prior art.
Specific embodiment
Understand to make the object, technical solutions and advantages of the present invention clearer, with reference to embodiment and attached drawing, to this
Invention is described in further detail, and exemplary embodiment of the invention and its explanation are only used for explaining the present invention, do not make
For limitation of the invention.
If Fig. 2 is the structure diagram of LCU system I/O channels, all use reliability with the obvious advantage half is output and input
Conductor device replaces the traditional time relay and intermediate relay, and input circuit inputs 110V and carries out Phototube Coupling sampling
Afterwards, it is sent into control chip to be handled, the passage for opening needs provides drive signal, after Phototube Coupling, drives semiconductor
Switching tube turn on, while by conducting state isolation feed back to control chip carry out fault self-diagnosis, LCU systems have high-low pressure every
The characteristics of from, the comprehensive real-time covering of fault diagnosis early warning, I/O channel flexibly configurable correspondence.
For the semiconductor wet contact in LCU systems, failure feedback solutions just like Fig. 3 in the prior art, but
The limitation of the program is, it is necessary to output feedback could be realized by relying on the voltage (+110V) of wet contact front end, and for stem grafting
Point since voltage may be not present in front end, therefore can not effectively borrow this circuit.
At present, for the fault diagnosis of semiconductor dry contact, there are no effective solution, general compromise uses
Be switching tube front end feedback method, as shown in Figure 4.But the defects of this design, is that the event of driving front end can only be diagnosed to be
Barrier, and for the failure that switching tube occurs in itself, such as breakdown, efficient diagnosis can not be carried out.
Embodiment
As shown in Figure 1, a kind of semiconductor dry and wet contact fault diagnosis circuit, connects including semiconductor switch pipe U2_1, dry and wet
Point Q1_1, the input terminal of semiconductor switch pipe U3_1, the semiconductor switch pipe U2_1 are described partly to lead for receiving drive signal
The conducting and closing of the output terminal control dry and wet contact Q1_1 of body switching tube U2_1, the input terminal of the semiconductor switch pipe U3_1
Connect the output terminal output feedback signal of dry and wet contact Q1_1, the semiconductor switch pipe U3_1；When dry and wet contact Q1_1 is turned on
When, the output terminal output effective Feedback signal of semiconductor switch pipe U3_1, when dry and wet contact Q1_1 is turned off, semiconductor switch pipe
The output terminal of U3_1 exports invalid feedback signal.
Semiconductor switch pipe U2_1 uses optocoupler, and the dry and wet contact Q1_1 is used in metal-oxide-semiconductor, IGBT and thyristor
One kind, dry and wet contact Q1_1 uses optocoupler using metal-oxide-semiconductor, the semiconductor switch pipe U3_1 in the present embodiment.
A kind of semiconductor dry and wet contact fault diagnosis circuit further includes dry and wet contact driving chip U1_1, the semiconductor
The input terminal of switching tube U2_1 receives drive signal, and drive signal will drive electricity by the opto-electronic conversion of semiconductor switch pipe U2_1
Signal transmission is connected to the control of dry and wet contact Q1_1 to dry and wet contact driving chip U1_1, dry and wet contact driving chip U1_1
End, dry and wet contact driving chip U1_1 driving dry and wet contact Q1_1 conductings；The sun of the light emitting diode of semiconductor switch pipe U3_1
Pole is connected same driving power, the cathode of the light emitting diode of semiconductor switch pipe U3_1 with dry and wet contact driving chip U1_1
Connect the input terminal of dry and wet contact Q1_1；It is feedback letter that semiconductor switch pipe U3_1, which is used for the state transition of dry and wet contact Q1_1,
Number output to control chip.
Diode D2_1, resistance are also connected in turn on the circuit being connected in driving power with semiconductor switch pipe U3_1
The anode connection driving power of R4_1, diode D2_1, the cathode connection resistance R4_1 of diode D2_1, resistance R4_1 connections two
The anode of the light emitting diode of the other end connection semiconductor switch pipe U3_1 at pole pipe D2_1 ends.
A kind of diagnostic method of semiconductor dry and wet contact fault diagnosis circuit, when the drive signal of semiconductor switch pipe U2_1
When effectively and the feedback signal of semiconductor switch pipe U3_1 is effective, dry and wet contact Q1_1 states are normal；When semiconductor switch pipe
When the drive signal of U2_1 is invalid and the feedback signal of semiconductor switch pipe U3_1 is invalid, dry and wet contact Q1_1 states are normal；
When the drive signal of semiconductor switch pipe U2_1 is effective and the feedback signal of semiconductor switch pipe U3_1 is invalid, dry and wet contact
Q1_1 status faults；When the drive signal of semiconductor switch pipe U2_1 is invalid and the feedback signal of semiconductor switch pipe U3_1 has
During effect, dry and wet contact Q1_1 status faults.
There is about 14V voltage differences in the driving power and power supply negative terminal of dry and wet contact driving chip.Driving power is through counterflow-preventing
Diode D2_1, current-limiting resistance R4_1, the light emitting diode of feedback isolation optocoupler, that is, semiconductor switch pipe U3_1, are connected to dry and wet and connect
The D ends of point Q1_1, then through, to S ends, forming return flow path inside switching tube.Feedback isolation optocoupler, that is, semiconductor switch pipe U3_1 leads to
It crosses 3 feet and feedback signal back is returned into control chip.After drive signal is effective, dry and wet contact driving chip driving dry contact Q1_1
Conducting, dry and wet contact Q1_1 turn on input terminal and output terminal, simultaneously as the DS conductings of Q1_1, electric current through driving power,
D2_1, R4_1, U3_1 input side, the drain-source DS ends of Q1_1 flow into ground, form access, feedback isolation optocoupler, that is, semiconductor switch pipe
U3_1 is driven, and feedback signal is driven high, and sends control chip back to.When drive signal is invalid, dry and wet contact driving chip control
Dry contact Q1_1 shut-offs processed, therefore dry and wet contact disconnects output terminal and output terminal, meanwhile, feedback isolation optocoupler, that is, semiconductor switch
Pipe U3_1 input sides do not form access, and outlet side is held off, and feedback signal is low, and sends control chip back to.
For semiconductor stem grafting dot circuit there are two kinds of identifiable fault modes, the diagnosis implementation method using the present invention is as follows
It is described：
Failure one, control chip drives signal are effective, and feedback signal is invalid, then dry and wet contact is remained open as failure shape
State.
Detection mode：Driving power is broken after D2_1, R4_1, U3_1 input stage to input terminal at dry contact Q1_1
It opens, electric current cannot be back to ground terminal, and there is no current path, feedback isolation optocoupler, that is, semiconductor switch pipe U3_1 can not be driven
Dynamic, feedback signal is low, at this point, controlling the drive signal transmitted by chip, for height, control chip judges this dry and wet contact failure.
Failure two, control chip drives invalidating signal, feedback signal is effective, then dry contact conducting is malfunction.
Detection mode：Driving power turns on after D2_1, R4_1, U3_1 input stage to input terminal in dry and wet contact, electricity
It flows back to and flows to ground terminal, drive feedback isolation optocoupler, that is, semiconductor switch pipe U3_1, feedback signal is height, at this point, control chip institute
The drive signal of transmission is low, and control chip judges this stem grafting point failure.
Whole process may be summarized to be, and when drive signal is effective, dry contact sends control back to conducting, conducting feedback signal " height "
Coremaking piece；When drive signal is invalid, dry contact sends control chip back to shut-off, shut-off feedback signal " low ".If dry contact occurs
Failure then can not achieve this drive signal and the correspondence of feedback signal, and main control chip is by comparing drive signal and feedback
The state of signal, judge dry contact whether failure.If table 1 is LCU system semiconductor dry contact drive signals and feedback signal pair
Answer relation table.
1 LCU system semiconductor dry contact drive signals of table and feedback signal correspondence figure
It is independent suitable for being carried out to dry and wet contact the invention discloses a kind of semiconductor dry and wet contact fault diagnosis circuit
Fault self-diagnosis.The diagnostic mode is directed to dry and wet contact construction itself fault diagnosis circuit, without by other dry and wet contacts
State without relying on accessory power supply, timely and effective can be diagnosed to be the failure of dry and wet contact, have simple in structure, reliable operation,
The features such as economical and practical is a kind of very high fault diagnosis means of feasibility.
Above-described specific embodiment has carried out the purpose of the present invention, technical solution and advantageous effect further
It is described in detail, it should be understood that the foregoing is merely the specific embodiments of the present invention, is not intended to limit the present invention
Protection domain, within the spirit and principles of the invention, any modification, equivalent substitution, improvement and etc. done should all include
Within protection scope of the present invention.
Claims (5)
1. a kind of semiconductor dry and wet contact fault diagnosis circuit, which is characterized in that including semiconductor switch pipe U2_1, dry and wet contact
Q1_1, the input terminal of semiconductor switch pipe U3_1, the semiconductor switch pipe U2_1 are used to receive drive signal, the semiconductor
The conducting and closing of the output terminal control dry and wet contact Q1_1 of switching tube U2_1, the input terminal of the semiconductor switch pipe U3_1 connect
Connect the output terminal output feedback signal of dry and wet contact Q1_1, the semiconductor switch pipe U3_1；When dry and wet contact Q1_1 is turned on,
The output terminal output effective Feedback signal of semiconductor switch pipe U3_1, when dry and wet contact Q1_1 is turned off, semiconductor switch pipe U3_
1 output terminal exports invalid feedback signal.
A kind of 2. semiconductor dry and wet contact fault diagnosis circuit according to claim 1, which is characterized in that the semiconductor
Switching tube U2_1 uses optocoupler, and the dry and wet contact Q1_1 uses one kind in metal-oxide-semiconductor, IGBT and thyristor, described partly to lead
Body switching tube U3_1 uses optocoupler.
3. a kind of semiconductor dry and wet contact fault diagnosis circuit according to claim 2, which is characterized in that further include dry and wet
The input terminal of contact driving chip U1_1, the semiconductor switch pipe U2_1 receive drive signal, and drive signal passes through semiconductor
The opto-electronic conversion of switching tube U2_1 will drive electric signal transmission to dry and wet contact driving chip U1_1, dry and wet contact driving chip
U1_1 is connected to the control terminal of dry and wet contact Q1_1, dry and wet contact driving chip U1_1 driving dry and wet contact Q1_1 conductings；Partly lead
The anode of the light emitting diode of body switching tube U3_1 is connected same driving power, semiconductor with dry and wet contact driving chip U1_1
The input terminal of the cathode connection dry and wet contact Q1_1 of the light emitting diode of switching tube U3_1；Semiconductor switch pipe U3_1 is used to do
The state transition of wet contact Q1_1 is exported for feedback signal to control chip.
4. a kind of semiconductor dry and wet contact fault diagnosis circuit according to claim 3, which is characterized in that in driving power
Also it is connected with diode D2_1, resistance R4_1, the sun of diode D2_1 on the circuit being connected with semiconductor switch pipe U3_1 in turn
Pole connects driving power, the cathode connection resistance R4_1 of diode D2_1, the other end at resistance R4_1 connection diode D2_1 ends
Connect the anode of the light emitting diode of semiconductor switch pipe U3_1.
5. a kind of diagnostic method of any semiconductor dry and wet contact fault diagnosis circuit of application Claims 1-4, special
Sign is, when the drive signal of semiconductor switch pipe U2_1 is effective and the feedback signal of semiconductor switch pipe U3_1 is effective,
Dry and wet contact Q1_1 states are normal；When the drive signal of semiconductor switch pipe U2_1 is invalid and semiconductor switch pipe U3_1 it is anti-
When feedback signal is invalid, dry and wet contact Q1_1 states are normal；When the drive signal of semiconductor switch pipe U2_1 is effective and semiconductor
When the feedback signal of switching tube U3_1 is invalid, dry and wet contact Q1_1 status faults；When the drive signal of semiconductor switch pipe U2_1
When invalid and semiconductor switch pipe U3_1 feedback signal is effective, dry and wet contact Q1_1 status faults.
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| CN201711310024.7A CN108089567B (en) | 2017-12-11 | 2017-12-11 | Semiconductor dry-wet contact fault diagnosis circuit and diagnosis method |
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| CN201711310024.7A CN108089567B (en) | 2017-12-11 | 2017-12-11 | Semiconductor dry-wet contact fault diagnosis circuit and diagnosis method |
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| CN109406998A (en) * | 2018-12-11 | 2019-03-01 | 株洲田龙铁道电气股份有限公司 | A kind of test device and test method of nonpolarity stem grafting dot circuit |
| CN112098887A (en) * | 2020-08-17 | 2020-12-18 | 交控科技股份有限公司 | Rail transit dry contact point state judgment system and method |
| CN113410815A (en) * | 2021-06-30 | 2021-09-17 | 中车株洲电力机车研究所有限公司 | Dry contact control method, system and related assembly |
| CN113556119A (en) * | 2021-09-18 | 2021-10-26 | 成都万创科技股份有限公司 | Mis-connection prevention switchable isolated digital input circuit |
| CN116794504A (en) * | 2023-08-21 | 2023-09-22 | 深圳海辰储能控制技术有限公司 | Dry contact output detection circuit and method, energy storage system and storage medium |
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| CN109406998A (en) * | 2018-12-11 | 2019-03-01 | 株洲田龙铁道电气股份有限公司 | A kind of test device and test method of nonpolarity stem grafting dot circuit |
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| CN116794504A (en) * | 2023-08-21 | 2023-09-22 | 深圳海辰储能控制技术有限公司 | Dry contact output detection circuit and method, energy storage system and storage medium |
| CN116794504B (en) * | 2023-08-21 | 2024-01-02 | 深圳海辰储能科技有限公司 | Dry contact output detection circuit and method, energy storage system and storage medium |
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| Publication number | Publication date |
|---|---|
| CN108089567B (en) | 2019-12-10 |
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