CN108072572B - Low-temperature in-situ biaxial stretching mechanical property testing device - Google Patents
Low-temperature in-situ biaxial stretching mechanical property testing device Download PDFInfo
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- 230000006399 behavior Effects 0.000 description 6
- 238000001816 cooling Methods 0.000 description 5
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- 238000009864 tensile test Methods 0.000 description 3
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- 238000010168 coupling process Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
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- G—PHYSICS
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- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
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- G01N2203/0017—Tensile
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means
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- G—PHYSICS
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- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
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- G01N2203/022—Environment of the test
- G01N2203/0222—Temperature
- G01N2203/0228—Low temperature; Cooling means
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/025—Geometry of the test
- G01N2203/0254—Biaxial, the forces being applied along two normal axes of the specimen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0272—Cruciform specimens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/04—Chucks, fixtures, jaws, holders or anvils
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Abstract
The invention relates to a low-temperature in-situ biaxial stretching mechanical property testing device, and belongs to the field of mechanical property testing. By adopting a vertical structure, the stepping motor is connected with the precise ball screw through a coupler, and the rotation of the motor is converted into precise linear motion of the motion plate through screw nut transmission, so that synchronous biaxial stretching loading of an X axis and a Y axis is realized. The temperature loading module adopts a semiconductor refrigerating sheet for refrigeration, the temperature change range is 0-30 ℃, and the biaxial stretching mechanical property test of the material under the temperature change condition is realized. And matching with an optical microscope, and carrying out in-situ dynamic monitoring on the micromechanics behavior and damage mechanism of the test piece in the test process. The advantages are that: the real service state of the material can be simulated; the testing device has compact structure, small occupied area and convenient integration and control, and has important significance for the mechanical property test research of the material in the complex stress state in the low-temperature environment.
Description
Technical Field
The invention relates to the field of precise scientific instruments in the field of material micromechanics performance test, in particular to a low-temperature in-situ biaxial stretching mechanical performance test device. The mechanical behavior, damage mechanism and performance weakening rule of the material can be accurately tested when the material is subjected to synchronous biaxial stretching under the low-temperature condition.
Background
The mechanical property of the material is an important basis for evaluating main indexes of good quality and excellent performance of the material to carry out design calculation, and the traditional method for testing the mechanical property of the material is a simple stress state test such as stretching, compression and torsion. However, in actual service conditions, the material is typically not subjected to only a single load. However, the traditional material mechanical property testing technology is only measured under the action of a single load, so that the stress state of the component cannot be completely reflected, and the stress state is one of main reasons for the early failure of the part. Along with the proposal of the plate shell theory, the application of the plate is more and more extensive, and the stress state of the plate is typically two-way stress. Therefore, the traditional testing device cannot fully reflect the stress state of the testing device, and the measured mechanical parameters of the testing device have no absolute reference value. Because thinner sheets generally exhibit an anisotropy, uniaxial tensile testing has not been able to accurately describe the mechanical properties of the sheet.
The mechanical properties of the material are affected by a number of factors, the temperature being one of the important factors affecting the mechanical properties. In recent years, in order to cope with environmental deterioration and resource exhaustion, frequent searches have been made for low-temperature environments such as outer space, polar regions, and deep ocean. The mechanical property parameters of the material measured under the normal temperature condition are adopted to guide the design and the use of the material or the structure under the low temperature environment, and obviously, the material has no scientificity and practicality. Therefore, the study on whether the mechanical properties of the material are affected in the low-temperature working environment, especially the study on the mechanical behavior and damage influence mechanism of the material by temperature factors, is widely paid attention to domestic and foreign students. Therefore, if a mechanical testing instrument which can provide a real stress condition close to the material and simulate the real environment where the material is positioned is developed in the mechanical property test of the material, the mechanical property of the material under the actual service condition can be obtained more accurately.
At present, a mature biaxial stretching compression test system is large in mechanical structure, cannot be compatible with microscopic imaging equipment, is difficult to provide an in-situ monitoring means while carrying out load test, and lacks effective researches on microscopic mechanical behaviors and damage mechanisms of anisotropic materials under biaxial stretching compression load; the existing in-situ double-shaft testing device is also rarely provided with functions capable of providing different temperature environments.
Disclosure of Invention
The invention aims to provide a low-temperature in-situ biaxial stretching mechanical property testing device, which solves the problems existing in the prior art. The device adopts a vertical structure, the whole height of the instrument is lower, and the low-temperature in-situ biaxial tensile test requirement under specific conditions is met. In the device, a stepping motor is connected with a precise ball screw through a coupler, and the rotation of the motor is converted into the precise linear motion of a motion plate through screw nut transmission, so that synchronous biaxial stretching loading of an X axis and a Y axis is realized. The temperature loading module adopts a semiconductor refrigerating sheet for refrigeration, the temperature change range is 0-30 ℃, and the biaxial stretching mechanical property test of the material under the temperature change condition is realized. And matching with an optical microscope, and carrying out in-situ dynamic monitoring on the micromechanics behavior and damage mechanism of the test piece in the test process. The invention can simulate the real service state of the material; the testing device has compact structure, small occupied area and convenient integration and control, and has important significance for the mechanical property test research of the material in the complex stress state in the low-temperature environment.
The invention effectively solves the problem that synchronous loading is difficult to realize by biaxial stretching through the novel structure provided by innovation, has compact structure, small occupied area, convenient integration and control and good application prospect, and has very important significance for testing and researching mechanical properties of materials under the condition of low temperature when the materials bear complex stress states.
The above object of the present invention is achieved by the following technical solutions:
the whole structure of the low-temperature in-situ biaxial stretching mechanical property testing device adopts vertical arrangement and comprises a driving unit, a transmission unit, a signal detection unit, a clamping unit and a temperature loading unit. Wherein the driving unit provides stretching loading power through the stepping motor 1; the transmission unit adopts a screw rod 9 and a movable guide rod 10 to realize bidirectional power transmission of an X axis and a Y axis under the drive of a single motor; the signal detection unit is connected with the transmission unit, adopts a tension sensor 18 and a linear grating displacement sensor to measure force and displacement, and is equipped with an optical microscope to dynamically observe the mechanical behavior and damage mechanism of a measured sample in situ; one end of the clamping unit is connected with the signal detection unit, the other end of the clamping unit is used for fixing the cross-shaped test piece 22, and the clamping unit is matched with the transmission unit so as to realize biaxial stretching of the cross-shaped test piece 22; the temperature loading unit is contacted with the cross-shaped test piece 22 for conducting cold, and finally low-temperature refrigeration in the biaxial stretching process is realized.
The driving unit is characterized in that a stepping motor 1 provides stretching loading power, the stepping motor 1 is fixed on a supporting table 2 and is connected with a coupler 4, two ends of a precise ball screw 5 are respectively connected with the coupler 4 and a screw nut 6, the screw nut 6 is connected with a moving plate 7, and the moving plate 7 outputs precise linear displacement; the support table 2 is fixed on the base 20 through the upright posts I, II, III, IV 3-1, 3-2, 3-3, 3-4.
The transmission unit adopts four mutually symmetrical screw rods I, II, III, IV 9-1, 9-2, 9-3, 9-4 and movable guide rods I, II, III, IV 10-1, 10-2, 10-3, 10-4 to transmit power, and the specific assembly relation is as follows: one end of each fixed support I, II, III, IV 8-1, 8-2, 8-3 and 8-4 is connected with one end I, II, III, IV 9-1, 9-2, 9-3 and 9-4 of the screw rod through a shaft sleeve I, II, III, IV 26-1, 26-2, 26-3 and 26-4 respectively, and is clamped through screws I, II, III, IV 27-1, 27-2, 27-3 and 27-4, so that the rotation of the connecting ends of the screw rods I, II, III, IV 9-1, 9-2, 9-3 and 9-4 is realized; the other ends of the screw rods I, II, III, IV 9-1, 9-2, 9-3 and 9-4 are respectively connected with the movable guide rods I, II, III, IV 10-1, 10-2, 10-3 and 10-4 to realize the transmission of motion; the other ends of the movable guide rods I, II, III, IV 10-1, 10-2, 10-3 and 10-4 are respectively connected with the triangular frames I, II, III, IV 11-1, 11-2, 11-3 and 11-4, and the rotation is realized through screws; the triangular supports I, II, III, IV 11-1, 11-2, 11-3 and 11-4 are fixedly connected to the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4 through the threads of angle steels I, II, III, IV 12-1, 12-2, 12-3 and 12-4 respectively, and are arranged on the linear guide rails I, II, III, IV 13-1, 13-2, 13-3 and 13-4, and the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4 are moved on the guide rails I, II, III, IV 13-1, 13-2, 13-3 and 13-4 by transmitting power.
The signal detection unit comprises tension sensors I, II, III, IV 18-1, 18-2, 18-3, 18-4, linear grating displacement sensors I, II, III, IV and an optical microscope for in-situ observation, wherein two ends of the tension sensors I, II, III, IV 18-1, 18-2, 18-3, 18-4 are respectively and fixedly connected to tension connectors I, II, III, IV 17-1, 17-2, 17-3, 17-4 and clamp bodies I, II, III, IV 19-1, 19-2, 19-3, 19-4 through threads; one end of the stretching connecting piece I, II, III, IV 17-1, 17-2, 17-3 and 17-4 is connected with angle iron I, II, III, IV 12-1, 12-2, 12-3 and 12-4, and is arranged on the linear guide rail I, II, III, IV 13-1, 13-2, 13-3 and 13-4 through the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4, a pin hole is arranged above the other end, and the pin hole is connected with the central axes of the tension sensor I, II, III, IV 18-1, 18-2, 18-3 and 18-4 through the pins I, II, III, IV 21-1, 21-2, 21-3 and 21-4, so that the coincidence of the central axes of the testing tension, the clamp and the test piece is ensured; the linear grating displacement sensor is: the main scales I, II, III, IV 16-1, 16-2, 16-3 and 16-4 are fixed on the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4, the reading heads I, II, III, IV 15-1, 15-2, 15-3 and 15-4 are fixedly connected on the base 20 through threads, and the deformation of the cross-shaped test piece 22 is measured by measuring the movement displacement of the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4; an optical microscope is fitted under the cross-shaped test piece 22.
The clamping unit consists of four pairs of identical clamps I, II, III, IV 19-1, 19-2, 19-3 and 19-4, one end of each clamp is connected with the tension sensors I, II, III, IV 18-1, 18-2, 18-3 and 18-4 through threads, and the other end of each clamp is provided with a groove to realize the positioning of the cross-shaped test piece 22; the grooves of the clamp are subjected to chamfering treatment, stress concentration is avoided, the bottoms of the grooves of the clamp are arc-shaped, the curvature radius of the arc is consistent with that of the cross-shaped test piece, and the cross-shaped test piece 22 is tightly combined with the clamps I, II, III, IV 19-1, 19-2, 19-3 and 19-4.
The temperature loading unit adopts a semiconductor refrigeration sheet 23 for refrigeration, the cold end of the refrigeration sheet 23 is contacted with a cross-shaped test piece 22 through heat conduction grease for conducting cold, and the hot end is provided with a fan and a cooling fin on a refrigeration platform 24 for reducing the temperature of the hot end, so that the low-temperature refrigeration in the biaxial stretching process is finally realized.
When a biaxial stretching experiment is carried out on the cross-shaped test piece, the center gauge region of the cross-shaped test piece needs to bear bidirectional tensile stress or compressive stress, the material is assumed to be isotropic, and the stress meets a typical bidirectional stress state;
during unidirectional stretching, the stress-strain relationship in the elastic range of the wire is as follows:
σ＝Eε
for isotropic materials, when the amount of deformation is small and within the in-line elastic range, the relationship between the principal strain and principal stress can be demonstrated for the bi-directional stress state as:
thus the relationship between principal stress and principal strain:
the testing device has a mechanical self-locking function, so that the stability of a mechanical structure is ensured; when the force applied to the sliding blocks I, II, III, IV (14-1, 14-2, 14-3, 14-4) reaches a set value, the friction angle alpha satisfies the following formula:
sinα>μcosα
when the driving force is larger than the friction force, the sliding blocks I, II, III and IV (14-1, 14-2, 14-3 and 14-4) move, so that biaxial stretching of the cross-shaped test piece 22 is realized.
The invention has the beneficial effects that: simple structure, easy operation, the test accuracy is higher. Synchronous loading of the X, Y shaft is achieved by one stepper motor drive. Low temperature loading conditions of a minimum of 0 ℃ can be achieved. Can be integrated with an optical microscope for observing the microscopic fracture mechanism of the material in the actual service state. In a word, the invention provides an effective method for researching the fracture mechanism of the material under the condition of low temperature when the material bears complex stress state, and has strong practicability.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate and explain the invention and together with the description serve to explain the invention.
FIG. 1 is a schematic view of the overall appearance structure of the present invention;
FIG. 2 is a schematic diagram of a front view structure of the present invention;
FIG. 3 is a schematic top view of the present invention;
fig. 4 and 5 are schematic views of a transmission unit according to the present invention;
FIG. 6 is a schematic diagram of a clamping mode of the clamp according to the present invention;
FIG. 7 is a schematic diagram of a temperature loading unit according to the present invention;
FIG. 8 is a schematic diagram of the principle of mechanical self-locking of the present invention;
fig. 9 is a schematic diagram of the principle of biaxial stretching according to the present invention.
In the figure: 1. a stepping motor; 2. a support table; 3-1, upright posts I; 3-2, stand column II; 3-3, stand column III; 3-4, stand column IV; 4. a coupling; 5. a precision ball screw; 6. a lead screw nut; 7. a motion plate; 8-1, fixing a support I; 8-2, fixing a support II; 8-3, fixing a support III; 8-4, fixing the support IV; 9-1, a screw rod I; 9-2, a screw rod II; 9-3, a screw rod III; 9-4, a screw rod IV; 10-1, a movable guide rod I; 10-2, a movable guide rod II; 10-3, moving a guide rod III; 10-4, moving the guide rod IV; 11-1, tripod I; 11-2, tripod II; 11-3, tripod III; 11-4, tripod IV; 12-1, angle steel I; 12-2, angle steel II; 12-3, angle III; 12-4, angle IV; 13-1, a guide rail I; 13-2, a guide rail II; 13-3, a guide rail III; 13-4, a guide rail IV; 14-1, a sliding block I; 14-2, a sliding block II; 14-3, a sliding block III; 14-4, sliding block IV; 15-1, reading head I; 15-2, a reading head II; 15-3, reading head III; 15-4, reading head IV; 16-1, a main scale I; 16-2, a main scale II; 16-3, a main rule III; 16-4, a main rule IV; 17-1, a tensile connector I; 17-2, stretching the connecting piece II; 17-3, stretching the connecting piece III; 17-4, stretching the connecting piece IV; 18-1, a tension sensor I; 18-2, a tension sensor II; 18-3, a tension sensor III; 18-4, a tension sensor IV; 19-1, a clamp I; 19-2, a clamp II; 19-3, a clamp III; 19-4, a clamp IV; 20. a base; 21-1, pin I; 21-2, pin II; 21-3, pin III; 21-4, pin IV; 22. a cross-shaped test piece; 23. a cooling sheet; 24. a refrigeration platform; 25-1, groove I; 25-2, groove II; 25-3, groove III; 25-4, groove IV; 26-1, shaft sleeve I; 26-2, a shaft sleeve II; 26-3, shaft sleeve III; 26-4, shaft sleeve IV; 27-1, screw I; 27-2, screw II; 27-3, screw III; 27-4, screw IV.
Detailed Description
The details of the present invention and its specific embodiments are further described below with reference to the accompanying drawings.
Referring to fig. 1 to 9, the low-temperature in-situ biaxial stretching mechanical property testing device adopts a vertical arrangement in the whole structure, and comprises a driving unit, a transmission unit, a signal detection unit, a clamping unit and a temperature loading unit, wherein biaxial loading power in the driving unit is provided by a stepping motor; the transmission unit consists of four centrally symmetrical screw rods, a movable guide rod, a sliding block and a linear guide rail, and is used for transmitting power of the device. The signal detection unit comprises a tension sensor, a linear grating displacement sensor and an optical microscope for in-situ observation, wherein a sliding block assembled on the linear guide rail drives a tension connecting piece, the tension sensor and a clamp body to move, so that the measurement of the tension is realized; the linear grating displacement sensor measures the deformation of the test piece by measuring the displacement of the moving slide block; the optical microscope is assembled below the cross-shaped test piece, and in-situ observation is carried out on the variable-temperature biaxial stretching process. The clamping unit consists of four upper and lower clamp bodies connected to the tension sensor, and clamps the cross-shaped test piece. One end of the lower clamp body is connected with the tension sensor through threads, and a groove is formed in the other end of the lower clamp body, so that the positioning of the cross-shaped test piece is realized; the upper clamp body is of an outer convex structure, so that the clamping of a test piece is realized, and the phenomenon that the test piece and the clamp body slide each other in the stretching process is avoided. The temperature loading unit adopts a semiconductor refrigeration sheet for refrigeration, the cold end of the refrigeration sheet is in contact with the cross-shaped test piece through heat conduction grease for conducting cold, and the refrigeration platform is provided with a heat dissipation system for heat dissipation in cooperation with the hot end, so that low-temperature refrigeration in the biaxial stretching process is realized.
Referring to fig. 1 to 3, the driving unit of the invention is provided with stretching loading power by a stepping motor 1, the stepping motor 1 is fixed on a supporting table 2 and is connected with a coupler 4, two ends of a precise ball screw 5 are respectively connected with the coupler 4 and a screw nut 6, the screw nut 6 is connected with a moving plate 7, and the moving plate 7 outputs precise linear displacement; the support table 2 is fixed on the base 20 through the upright posts I, II, III, IV 3-1, 3-2, 3-3, 3-4.
Referring to fig. 4 and 5, the transmission unit of the present invention adopts four symmetrical screw rods i, ii, iii, iv 9-1, 9-2, 9-3, 9-4 and moving guide rods i, ii, iii, iv 10-1, 10-2, 10-3, 10-4 to transmit power, and the specific assembly relationship is: one end of each fixed support I, II, III, IV 8-1, 8-2, 8-3 and 8-4 is connected with one end I, II, III, IV 9-1, 9-2, 9-3 and 9-4 of the screw rod through a shaft sleeve I, II, III, IV 26-1, 26-2, 26-3 and 26-4 respectively, and is clamped through screws I, II, III, IV 27-1, 27-2, 27-3 and 27-4, so that the rotation of the connecting ends of the screw rods I, II, III, IV 9-1, 9-2, 9-3 and 9-4 is realized; the other ends of the screw rods I, II, III, IV 9-1, 9-2, 9-3 and 9-4 are respectively connected with the movable guide rods I, II, III, IV 10-1, 10-2, 10-3 and 10-4 to realize the transmission of motion; the other ends of the movable guide rods I, II, III, IV 10-1, 10-2, 10-3 and 10-4 are respectively connected with the triangular frames I, II, III, IV 11-1, 11-2, 11-3 and 11-4, and the rotation is realized through screws; the triangular supports I, II, III, IV 11-1, 11-2, 11-3 and 11-4 are fixedly connected to the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4 through the threads of angle steels I, II, III, IV 12-1, 12-2, 12-3 and 12-4 respectively, and are arranged on the linear guide rails I, II, III, IV 13-1, 13-2, 13-3 and 13-4, and the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4 are moved on the guide rails I, II, III, IV 13-1, 13-2, 13-3 and 13-4 by transmitting power.
The signal detection unit comprises tension sensors I, II, III, IV 18-1, 18-2, 18-3, 18-4, a linear grating displacement sensor and an optical microscope for in-situ observation, wherein two ends of the tension sensors I, II, III, IV 18-1, 18-2, 18-3 and 18-4 are respectively and fixedly connected to tension connectors I, II, III, IV 17-1, 17-2, 17-3 and 17-4 and clamp bodies I, II, III, IV 19-1, 19-2, 19-3 and 19-4 through threads; one end of the stretching connecting piece I, II, III, IV 17-1, 17-2, 17-3 and 17-4 is connected with angle iron I, II, III, IV 12-1, 12-2, 12-3 and 12-4, and is arranged on the linear guide rail I, II, III, IV 13-1, 13-2, 13-3 and 13-4 through the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4, a pin hole is arranged above the other end, and the pin hole is connected with the central axes of the tension sensor I, II, III, IV 18-1, 18-2, 18-3 and 18-4 through the pins I, II, III, IV 21-1, 21-2, 21-3 and 21-4, so that the coincidence of the central axes of the testing tension, the clamp and the test piece is ensured; the linear grating displacement sensor is: the main scales I, II, III, IV 16-1, 16-2, 16-3 and 16-4 are fixed on the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4, the reading heads I, II, III, IV 15-1, 15-2, 15-3 and 15-4 are fixedly connected on the base 20 through threads, and the deformation of the cross-shaped test piece 22 is measured by measuring the movement displacement of the sliding blocks I, II, III, IV 14-1, 14-2, 14-3 and 14-4; an optical microscope is fitted under the cross-shaped test piece 22.
Referring to FIG. 6, the clamping unit of the invention is composed of four pairs of identical clamps I, II, III, IV 19-1, 19-2, 19-3, 19-4, one end of the clamp is connected with tension sensors I, II, III, IV 18-1, 18-2, 18-3, 18-4 through threads, and the other end is provided with a groove to realize the positioning of a cross-shaped test piece 22; the grooves of the clamp are subjected to chamfering treatment, stress concentration is avoided, the bottoms of the grooves of the clamp are arc-shaped, the curvature radius of the arc is consistent with that of the cross-shaped test piece 22, the cross-shaped test piece 22 is tightly combined with the clamps I, II, III, IV 19-1, 19-2, 19-3 and 19-4, and the influence on the centering of the test piece caused by movement of the test piece in the locking process of the upper clamp body of the clamp is avoided; the upper clamp body is of an outer convex structure, the cross-shaped test piece 22 is pressed on the lower clamp body of the clamp through threaded connection, clamping of the test piece is achieved, and the phenomenon that the test piece and the clamp slide each other in the stretching process is avoided.
Referring to fig. 7, the temperature loading unit according to the present invention uses a semiconductor cooling plate 23 for cooling. In principle, a semiconductor cooling fin is a heat transfer tool. When a current flows in a thermocouple pair formed by connecting an N-type semiconductor material and a P-type semiconductor material, heat transfer is generated between the two ends, and the heat is transferred from one end to the other end, so that a temperature difference is generated to form a cold end and a hot end, and the heat between the two polar plates is reversely transferred through air and the semiconductor material. When the cold and hot ends reach a certain temperature difference, and the two heat transfer amounts are equal, a balance point is reached, and the forward and reverse heat transfer amounts are offset. At this time, the temperature of the cold and hot ends will not change continuously. In order to achieve the aim of experiments at the low temperature of 0-30 ℃, the device adopts the way that the cold end of the refrigerating sheet 23 is contacted with the cross-shaped test piece 22 through heat conduction grease to conduct cold conduction, and the hot end is provided with a fan and radiating fins on the refrigerating platform 24 to reduce the temperature of the hot end, so that the low-temperature refrigeration in the biaxial stretching process is finally achieved.
When a biaxial stretching experiment is carried out on the cross-shaped test piece, the center gauge region of the cross-shaped test piece needs to bear bidirectional tensile stress or compressive stress, the material is assumed to be isotropic, and the stress meets a typical bidirectional stress state;
during unidirectional stretching, the stress-strain relationship in the elastic range of the wire is as follows:
σ＝Eε
for isotropic materials, when the amount of deformation is small and within the in-line elastic range, the relationship between the principal strain and principal stress can be demonstrated for the bi-directional stress state as:
thus the relationship between principal stress and principal strain:
referring to FIG. 8, the test device structure of the invention has mechanical self-locking, so that the stability of the mechanical structure is ensured; when the force applied to the sliding blocks I, II, III, IV (14-1, 14-2, 14-3, 14-4) reaches a set value, the friction angle alpha satisfies the following formula:
sinα>μcosα
when the driving force is larger than the friction force, the sliding blocks I, II, III and IV (14-1, 14-2, 14-3 and 14-4) move, so that biaxial stretching of the cross-shaped test piece 22 is realized.
Referring to FIG. 9, the invention has the advantages of simple structure, easy operation and higher test precision. The synchronous loading of the X, Y shaft is realized by driving the stepping motor (1), and the synchronous stretching of four stretching ends is ensured, so that the central area of the cross-shaped test piece (22) is basically consistent along the horizontal direction, the in-situ observation with an optical microscope is facilitated, the microscopic fracture mechanism of the material in the actual service state is observed, and the method has important significance for researching the mechanical properties of the material under the exploration of force thermal coupling.
Referring to fig. 1 to 9, before the low-temperature in-situ biaxial stretching mechanical property testing device is installed, the calibration and the calibration of the tension sensors i, ii, iii, iv 18-1, 18-2, 18-3, 18-4 and the linear grating displacement sensor are needed first, and then the installation and the debugging of the instrument are carried out. After each experiment is finished, the clamp body needs to be returned to the original position, so that the next clamping of the experimental test piece is facilitated. The device adopts a vertical structure, the whole height of the instrument is lower, and the low-temperature in-situ biaxial tensile test requirement under specific conditions is met. In the device, a stepping motor is connected with a precise ball screw through a coupler, and the rotation of the motor is converted into the precise linear motion of a motion plate through screw nut transmission, so that synchronous biaxial stretching loading of an X axis and a Y axis is realized. The temperature loading module adopts a semiconductor refrigerating sheet for refrigeration, the temperature change range is 0-30 ℃, and the biaxial stretching mechanical property test of the material under the temperature change condition is realized. And matching with an optical microscope, and carrying out in-situ dynamic monitoring on the micromechanics behavior and damage mechanism of the test piece in the test process. The advantages are that: the real service state of the material can be simulated; the testing device has compact structure, small occupied area and convenient integration and control, and has important significance for the mechanical property test research of the material in the complex stress state in the low-temperature environment.
The above description is only a preferred example of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. The utility model provides a low temperature normal position biaxial stretching mechanical property testing arrangement which characterized in that: the whole structure adopts vertical arrangement and comprises a driving unit, a transmission unit, a signal detection unit, a clamping unit and a temperature loading unit, wherein the driving unit provides stretching loading power through a stepping motor (1); the transmission unit adopts a screw rod (9) and a movable guide rod (10) to realize bidirectional power transmission of an X axis and a Y axis under the drive of a single motor; the signal detection unit is connected with the transmission unit, adopts a tension sensor (18) and a linear grating displacement sensor to measure force and displacement, and is equipped with an optical microscope to dynamically observe the mechanical behavior and damage mechanism of a measured sample in situ; one end of the clamping unit is connected with the signal detection unit, the other end of the clamping unit is used for fixing the cross-shaped test piece (22), and the clamping unit is matched with the transmission unit so as to realize biaxial stretching of the cross-shaped test piece (22); the temperature loading unit is in contact with the cross-shaped test piece (22) for conducting cold, and finally low-temperature refrigeration in the biaxial stretching process is realized;
the signal detection unit comprises a tension sensor I (18-1), a tension sensor II (18-2), a tension sensor III (18-3), a tension sensor IV (18-4), a linear grating displacement sensor and an optical microscope for in-situ observation, wherein two ends of the tension sensor I (18-1), the tension sensor II (18-2), the tension sensor III (18-3) and the tension sensor IV (18-4) are respectively and fixedly connected to a tension connecting piece I (17-1), a tension connecting piece II (17-2), a tension connecting piece III (17-3), a tension connecting piece IV (17-4) and a clamp body I (19-1), a clamp body II (19-2), a clamp body III (19-3) and a clamp body IV (19-4) through threads; one end of a stretching connecting piece I (17-1), a stretching connecting piece II (17-2), a stretching connecting piece III (17-3) and a stretching connecting piece IV (17-4) is connected with angle steel I (12-1), angle steel II (12-2), angle steel III (12-3) and angle steel IV (12-4), and is arranged on a linear guide rail I (13-1), a linear guide rail II (13-2), a linear guide rail III (13-3) and a linear guide rail IV (13-4) through a sliding block I (14-1), a sliding block II (14-2), a sliding block III (14-3) and a sliding block IV (14-4), pin holes are formed above the other end of the stretching connecting piece IV, and the pin I (21-1), the pin II (21-2), the pin III (21-3) and the pin IV (21-4) are connected with a tension sensor I (18-1), a tension sensor II (18-2), a tension sensor III (18-3) and a tension sensor IV (18-4) so as to ensure the coincidence of the central axes of a test tensile force, a fixture and a test piece; the linear grating displacement sensor is: the main scale I (16-1), the main scale II (16-2), the main scale III (16-3) and the main scale IV (16-4) are fixed on the sliding block I (14-1), the sliding block II (14-2), the sliding block III (14-3) and the sliding block IV (14-4), the reading head I (15-1), the reading head II (15-2), the reading head III (15-3) and the reading head IV (15-4) are fixedly connected to the base (20) through threads, and the deformation of the cross-shaped test piece (22) is measured by measuring the movement displacement of the sliding block I (14-1), the sliding block II (14-2), the sliding block III (14-3) and the sliding block IV (14-4); the optical microscope is mounted under the cross-shaped test piece (22).
2. The low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: the driving unit is characterized in that a stepping motor (1) provides stretching loading power, the stepping motor (1) is fixed on a supporting table (2) and is connected with a coupler (4), two ends of a precise ball screw (5) are respectively connected with the coupler (4) and a screw nut (6), the screw nut (6) is connected with a moving plate (7), and the moving plate (7) outputs precise linear displacement; the supporting table (2) is fixed on the base (20) through the upright posts I (3-1), II (3-2), III (3-3) and IV (3-4).
3. The low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: the transmission unit adopts four mutually symmetrical screw rods I (9-1), screw rod II (9-2), screw rod III (9-3), screw rod IV (9-4), and the transmission of power is carried out by the moving guide rod I (10-1), the moving guide rod II (10-2), the moving guide rod III (10-3) and the moving guide rod IV (10-4), and the specific assembly relation is: one end of the fixed support I (8-1), one end of the fixed support II (8-2), one end of the fixed support III (8-3) and one end of the fixed support IV (8-4) are respectively connected with one end of the screw rod I (9-1), one end of the screw rod II (9-2), one end of the screw rod III (9-3) and one end of the screw rod IV (9-4) through the shaft sleeve I (26-1), one end of the shaft sleeve II (26-2), one end of the shaft sleeve III (26-3) and one end of the shaft sleeve IV (26-4), and the screw rod I (9-1), one end of the screw rod II (9-2), one end of the screw rod III (9-3) and one end of the screw rod IV (9-4) are clamped through the screw I (27-1), the screw II (27-2), the screw rod III (27-3) and the screw IV (27-4) so as to realize rotation of the connecting ends of the screw rod I (9-1), the screw rod II (9-2, the screw rod II and the screw II (9-3). The other ends of the screw rod I (9-1), the screw rod II (9-2), the screw rod III (9-3) and the screw rod IV (9-4) are respectively connected with the movable guide rods I, II, III and IV (10-1, 10-2, 10-3 and 10-4) to realize the transmission of motion; the other ends of the movable guide rod I (10-1), the movable guide rod II (10-2), the movable guide rod III (10-3) and the movable guide rod IV (10-4) are respectively connected with the tripod I (11-1), the tripod II (11-2), the tripod III (11-3) and the tripod IV (11-4) and realize rotation through screws; tripod I (11-1), tripod II (11-2), tripod III (11-3) and tripod IV (11-4) are respectively and fixedly connected to sliding block I (14-1), sliding block II (14-2), sliding block III (14-3) and sliding block IV (14-4) through angle iron I (12-1), angle iron II (12-2), angle iron III (12-3) and angle iron IV (12-4) threads, and are mounted on linear guide I (13-1), linear guide II (13-2), linear guide III (13-3) and linear guide IV (13-4), and power is transmitted to realize the movement of sliding block I (14-1), sliding block II (14-2), sliding block III (14-3), sliding block IV (14-4) on linear guide I (13-1), linear guide II (13-2), linear guide III (13-3) and linear guide IV (13-4).
4. The low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: the clamping unit consists of four pairs of identical (19-1), a clamp body II (19-2), a clamp body III (19-3) and a clamp body IV (19-4), one end of the clamp is connected with a tension sensor I (18-1), a tension sensor II (18-2), a tension sensor III (18-3) and a tension sensor IV (18-4) through threads, and a groove is formed in the other end of the clamp to realize positioning of a cross-shaped test piece (22); the groove of the clamp is subjected to chamfering treatment, stress concentration is avoided, the bottom of the groove of the clamp is arc-shaped, the curvature radius of the arc is consistent with that of the cross-shaped test piece, and the cross-shaped test piece (22) is tightly combined with the clamp body (19-1), the clamp body II (19-2), the clamp body III (19-3) and the clamp body IV (19-4).
5. The low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: the temperature loading unit adopts a semiconductor refrigerating sheet (23) for refrigerating, the cold end of the refrigerating sheet (23) is in contact with a cross-shaped test piece (22) through heat conduction grease for conducting cold, and the hot end is provided with a fan and radiating fins on a refrigerating platform (24) for reducing the temperature of the hot end, so that low-temperature refrigeration in the biaxial stretching process is finally realized.
6. The low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: when a biaxial stretching experiment is carried out on the cross-shaped test piece (22), the central gauge length area of the cross-shaped test piece (22) needs to bear bidirectional tensile stress or compressive stress, the material is assumed to be isotropic, and the stress meets a typical bidirectional stress state;
during unidirectional stretching, the stress-strain relationship in the elastic range of the wire is as follows:
σ＝Eε
for isotropic materials, when the amount of deformation is small and within the in-line elastic range, the relationship between the principal strain and principal stress can be demonstrated for the bi-directional stress state as:
thus the relationship between principal stress and principal strain:
7. the low temperature in situ biaxial stretching mechanical property testing device according to claim 1, wherein: the testing device has a mechanical self-locking function, so that the stability of a mechanical structure is ensured; when the forces borne by the sliding blocks I (14-1), II (14-2), III (14-3) and IV (14-4) reach the set values, the friction angle alpha meets the following formula:
sinα>μcosα
when the driving force is larger than the friction force, the sliding blocks I (14-1), II (14-2), III (14-3) and IV (14-4) move, so that biaxial stretching of the cross-shaped test piece (22) is realized.
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